JP2806053B2 - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

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Publication number
JP2806053B2
JP2806053B2 JP3019637A JP1963791A JP2806053B2 JP 2806053 B2 JP2806053 B2 JP 2806053B2 JP 3019637 A JP3019637 A JP 3019637A JP 1963791 A JP1963791 A JP 1963791A JP 2806053 B2 JP2806053 B2 JP 2806053B2
Authority
JP
Japan
Prior art keywords
potential
power supply
circuit
constant current
ecl
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP3019637A
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Japanese (ja)
Other versions
JPH05347380A (en
Inventor
保美 倉島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
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Filing date
Publication date
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Priority to JP3019637A priority Critical patent/JP2806053B2/en
Publication of JPH05347380A publication Critical patent/JPH05347380A/en
Application granted granted Critical
Publication of JP2806053B2 publication Critical patent/JP2806053B2/en
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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は半導体集積回路に関し、
特にバイポーラ型の半導体集積回路の同一の高電位側電
源バスラインに接続された複数のECL回路(Emit
ter Coupled Logic)およびCML回
路(Current Mode Logic)の出力レ
ベル均一化に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit,
In particular, a plurality of ECL circuits (Emit circuits) connected to the same high-potential-side power supply bus line of a bipolar semiconductor integrated circuit
ter Coupled Logic and output level equalization of a CML circuit (Current Mode Logic).

【0002】[0002]

【従来の技術】バイポーラ型の半導体集積回路では、図
3(a)に示すようなECL回路の定電流源の定電流制
御用電圧(以下VCSと称す)入力端子16に、図3
(b)に示すようなVCS発生回路により定電位側電源
12を基準として発生されるVCSを供給することで定
電流源回路の定電流(以下ICSと称す)を制御してい
る。即ち、ICSは定電位側電源12とVCSとの電位
差およびトランジスタQ4のベース・エミッタ間電圧お
よび抵抗R3により決定される。
2. Description of the Related Art In a bipolar semiconductor integrated circuit, a constant current control voltage (hereinafter referred to as VCS) input terminal 16 of a constant current source of an ECL circuit as shown in FIG.
A constant current (hereinafter referred to as ICS) of a constant current source circuit is controlled by supplying a VCS generated by a VCS generation circuit as shown in FIG. That is, ICS is determined by the potential difference between the constant potential power supply 12 and VCS, the base-emitter voltage of the transistor Q4, and the resistor R3.

【0003】一方出力端子13の出力レベルはICSと
抵抗R1とで決定される電圧,高電位側電源11の電
位,およびトランジスタQ1のベース・エミッタ間の電
圧(以下Vfと称す)によって決定される。この際、従
来のバイポーラ型半導体集積回路では複数のECL回路
の接続された高電位側電源11のバスラインの電位供給
位置と、ECL回路にVCSを供給するVCS発生回路
の配置位置とは相関なく決定されていた(例えば、ナシ
ョナルセミコンダクタ社におけるECLゲートアレイの
出力部:THE ASPECT GATE ARRAY
DESIGNMANUAL(8−3,8−12,8−
14,8−18)参照)。
On the other hand, the output level of the output terminal 13 is determined by the voltage determined by the ICS and the resistor R1, the potential of the high-potential power supply 11, and the voltage between the base and emitter of the transistor Q1 (hereinafter referred to as Vf). . At this time, in the conventional bipolar semiconductor integrated circuit, there is no correlation between the potential supply position of the bus line of the high potential side power supply 11 to which the plurality of ECL circuits are connected and the arrangement position of the VCS generation circuit that supplies VCS to the ECL circuit. (For example, the output part of the ECL gate array at National Semiconductor: THE ASPECT GATE ARRAY
DESIGNMANUAL (8-3, 8-12, 8-
14, 8-18)).

【0004】[0004]

【発明が解決しようとする課題】図3(a)に示した従
来のECL回路では、ICSが高電位側電源11から定
電位側電源12に向けてトランジスタQ4を通して流れ
るため、トランジスタQ4の電流増幅率をhとすると、
トランジスタQ4のベースにはICS/hの電流がVC
S発生回路の負荷電流として流れる。VCS発生回路が
複数のECL回路にVCSを供給する場合、負荷電流に
よる配線での電位降下によって、VCSの電位はVCS
発生回路に近いほど高く、遠いほど低くなる。
In the conventional ECL circuit shown in FIG. 3A, the ICS flows from the high potential side power supply 11 to the constant potential side power supply 12 through the transistor Q4. If the rate is h,
The current of ICS / h is VC at the base of the transistor Q4.
It flows as the load current of the S generation circuit. When the VCS generation circuit supplies the VCS to a plurality of ECL circuits, the potential of the VCS becomes VCS due to the potential drop in the wiring due to the load current.
The closer to the generating circuit, the higher and the farther away, the lower.

【0005】一方、ECL回路のICSは、該回路の接
続された高電位側電源11から定電位側電源12に流れ
込むため、複数のECL回路が同一の高電位側電源のバ
スラインに接続された場合、ICSによる配線の電位
により、前記高電位側電源11のバスラインの電位は
電位供給位置から近い程高く、遠いほど低くなる。
On the other hand, since the ICS of the ECL circuit flows from the high-potential power supply 11 connected to the circuit to the constant-potential power supply 12, a plurality of ECL circuits are connected to the same high-potential power supply bus line. In this case, the potential drop of the wiring by ICS
As a result, the potential of the bus line of the high-potential-side power supply 11 increases as the position is closer to the potential supply position and decreases as the position increases.

【0006】また、図3(a)において、ICSはVC
Sと定電位側電源12の電位との電位差および抵抗R3
によって決定されており、さらに該ECL回路の出力レ
ベルは、このICSと抵抗R1とで決定される電圧,高
電位側電源11の電位,およびトランジスタQ1のVf
によって決定される。
In FIG. 3A, ICS is VC
The potential difference between S and the potential of the constant potential side power supply 12 and the resistance R3
The output level of the ECL circuit is determined by the voltage determined by the ICS and the resistor R1, the potential of the high-potential-side power supply 11, and the Vf of the transistor Q1.
Is determined by

【0007】従来、多数のECL回路に接続されるVC
S発生回路の配置位置と高電位側電源のバスラインの電
位供給位置とは相関なく決定されていたため、VCSの
配線による電位降下と、前記電源バスラインの配線によ
る電位降下にも相関がない。したがって、高電位側電源
11の電位とICSが位置により異なるため出力レベル
も場所により異なることになり、回路の電気特性が位置
依存性を有し、LSI全体で揃わないという欠点があっ
た。
Conventionally, VC connected to a large number of ECL circuits
Since the arrangement position of the S generating circuit and the potential supply position of the bus line of the high potential side power supply are determined without correlation, there is no correlation between the potential drop due to the VCS wiring and the potential drop due to the power supply bus line. Therefore, since the potential of the high-potential-side power supply 11 and the ICS vary depending on the position, the output level also varies depending on the location, and there is a disadvantage that the electrical characteristics of the circuit have a position dependence and are not uniform in the entire LSI.

【0008】たとえば、ECLゲートアレイのように多
数のECL出力回路が同一の電源バスラインに接続され
るLSIにおいて、図4(a)に示すように、VCS発
生回路4bと該回路の接続される高電位側電源のバスラ
イン1の電位供給位置3とを配置し、VCSの配線によ
る電圧降下を約20mV、前記電源バスライン1の配線
による電圧降下を約30mVとし、説明上ECL回路の
接続された定電位側電源の電位上昇はないものとする。
For example, in an LSI such as an ECL gate array in which a large number of ECL output circuits are connected to the same power supply bus line, as shown in FIG. 4A, a VCS generation circuit 4b is connected to the circuit. The potential supply position 3 of the bus line 1 of the high-potential-side power supply is arranged, and the voltage drop due to the VCS wiring is set to about 20 mV, and the voltage drop due to the wiring of the power bus line 1 is set to about 30 mV. It is assumed that there is no rise in the potential of the constant potential side power supply.

【0009】このとき、VCSと前記各電源バスライン
の電位は位置により、図4(b)のようになり、配線に
よる電位降下及び電位上昇のないときのVCSと定電位
側電源12の電位差を1.2Vとし、ECS回路の電流
供給トランジスタのベース・エミッタ間の電圧を0.8
Vとすると、論理振幅は位置により約5%変動すること
になる。したがって高電位側電源のバスライン1が約3
0mV電圧降下することを考慮すると、該ECL回路の
出力振幅を約1Vとしたとき前記5%の変動が約50m
Vに相当するため、位置によりハイレベルで約30m
V、ローレベルで約80mVの変動が生じることにな
る。
At this time, the potential of the VCS and the potentials of the power supply bus lines depend on the position, as shown in FIG. 4B, and the potential difference between the VCS and the constant potential power supply 12 when there is no potential drop and potential rise due to wiring is shown. The voltage between the base and the emitter of the current supply transistor of the ECS circuit is 0.8 V.
Assuming V, the logic amplitude will vary by about 5% depending on the position. Therefore, the bus line 1 of the high potential side power supply is about 3
Considering the voltage drop of 0 mV, when the output amplitude of the ECL circuit is about 1 V, the 5% variation is about 50 m.
About 30m at high level depending on the position
A fluctuation of about 80 mV occurs at V and low levels.

【0010】[0010]

【課題を解決するための手段】本発明の半導体集積回路
は、半導体チップの一主面に配置された複数のECL回
路と、このECL回路が接続された複数の高電位側電源
バスラインと、前記複数のECL回路の定電流源の定電
流を駆動する定電流制御用定電位を発生する電流制御用
定電圧発生回路と、前記定電流制御用電位を供給する定
電流制御用定電位供給ラインとを有するバイポーラの半
導体集積回路において、前記高電位側電源バスラインの
電位低下による前記ECL回路の出力レベルの低下を前
記定電流制御用定電位供給ラインの電位低下により相殺
するよう前記ECL回路の定電流源の定電流制御用定電
圧発生回路の配置位置を前記高電位側電源バスラインの
電位供給位置の近傍とし、さらに前記定電流制御用定電
圧発生回路は、前記ECL回路が両側を挟む位置に配置
されている構成である。
According to the present invention, there is provided a semiconductor integrated circuit comprising: a plurality of ECL circuits disposed on one main surface of a semiconductor chip; a plurality of high potential side power supply bus lines to which the ECL circuits are connected; A current control constant voltage generating circuit for generating a constant current control constant potential for driving a constant current of a constant current source of the plurality of ECL circuits; and a constant current control constant potential supply line for supplying the constant current control potential In the bipolar semiconductor integrated circuit having the above, a decrease in the output level of the ECL circuit due to a decrease in the potential of the high potential side power supply bus line is offset by a decrease in the potential of the constant current supply constant potential supply line. The arrangement position of the constant current generating constant voltage generating circuit of the constant current source is set near the potential supply position of the high potential side power supply bus line, and the constant current controlling constant voltage
The pressure generating circuit is arranged at a position where the ECL circuit sandwiches both sides.
A configuration that is.

【0011】[0011]

【実施例】次に、本発明について図面を参照して説明す
る。図1(a)は本発明の第1の実施例であり、多数の
ECL出力回路が同一の電源バスラインに接続されたL
SIの出力部における、VCS発生回路とECL回路の
接続される高電位側電源のバスラインの電位供給位置の
関係を示し、図1(b)は、この際のVCS,前記バス
ラインの電位,ECL回路の出力レベル,定電位側電源
電圧の位置依存性を示す。
Next, the present invention will be described with reference to the drawings. FIG. 1A shows a first embodiment of the present invention, in which a plurality of ECL output circuits are connected to the same power supply bus line.
FIG. 1B shows the relationship between the potential supply positions of the bus lines of the high-potential-side power supply connected to the VCS generation circuit and the ECL circuit in the output section of the SI, and FIG. 3 shows the position dependence of the output level of the ECL circuit and the constant potential side power supply voltage.

【0012】VCS発生回路4を高電位側電源のバスラ
イン1の両端に位置し、かつ前記バスラインも同一の位
置3にて電源電位給電を行っている。このため、配線に
よる電位降下によりVCSの電位はVCS発生回路4の
近傍にて最も高く、その中央で最も低くなる。一方、高
電位側電源のバスライン1の電位は、同様に配線の電位
降下のためバスラインの両端で最も高く、その中央でも
低くなる。VCSの配線による電圧降下を約20mV、
前記電源バスライン1の配線による電圧降下を約30m
Vとし、説明上ECL回路の接続された定電位側電源の
電位上昇はないものとすると、論理振幅は高電位側電源
のバスライン1の両端に比べて中央は約5%減少し、そ
の分出力のローレベルは上昇することになる。
The VCS generating circuit 4 is located at both ends of the bus line 1 of the high-potential-side power supply, and the bus line also supplies power at the same position 3. For this reason, the potential of VCS becomes highest near the VCS generation circuit 4 and becomes lowest at the center due to the potential drop due to the wiring. On the other hand, the potential of the bus line 1 of the high-potential-side power supply is similarly highest at both ends of the bus line due to the potential drop of the wiring, and is also low at the center. The voltage drop due to the VCS wiring is about 20 mV,
The voltage drop caused by the wiring of the power supply bus line 1 is about 30 m
Assuming that the potential of the constant-potential-side power supply connected to the ECL circuit does not increase for the sake of explanation, the logical amplitude is reduced by about 5% at the center compared to both ends of the bus line 1 of the high-potential-side power supply. The low level of the output will rise.

【0013】一方高電位側電源電位は同バスライン1の
両端に比べて中央は約30mV降下する。したがって論
理振幅を1Vとすると、ハイレベルは高電位側電源のバ
スライン1の両端に比べて中央は約30mV降下する
が、ローレベルでは、高電位電源の電源降下と論理振幅
減少の相殺により、高電位側電源のバスライン1の両端
より中央部が約20mV上昇するにとどまる。よって、
ハイレベルの位置による変動は従来と変化ないが、ロー
レベルに関しては80mVから20mVへ大幅な減少が
可能である。
On the other hand, the high-potential power supply potential drops by about 30 mV at the center as compared with both ends of the bus line 1. Therefore, if the logic amplitude is 1 V, the high level drops by about 30 mV at the center compared with both ends of the bus line 1 of the high-potential power supply. The central portion only rises by about 20 mV from both ends of the bus line 1 of the high potential side power supply. Therefore,
Although the fluctuation due to the position of the high level does not change from the conventional case, the low level can be greatly reduced from 80 mV to 20 mV.

【0014】図2(a)は本発明の第2の実施例のVC
S発生回路とECL回路の接続される高電位側電源のバ
スラインの電位供給位置の関係を示し、図2(b)は、
この際のVCS,前記バスラインの電位,ECL回路の
出力レベル,定電位側電源電位の位置依存性を示す(第
1の実施例と同じく多数のECL出力回路が同一の電源
バスラインに接続されたLSIの出力部を想定してい
る)。高電位側電源のバスライン1aの電位は、バスラ
イン上の2箇所で供給され、VCS発生回路4aは前記
電位供給位置3aと同一の位置に配置している。
FIG. 2A shows a VC according to a second embodiment of the present invention.
FIG. 2B shows the relationship between the potential supply positions of the bus lines of the high potential side power supply connected to the S generation circuit and the ECL circuit.
This shows the VCS, the potential of the bus line, the output level of the ECL circuit, and the position dependence of the constant potential side power supply potential at this time (similar to the first embodiment, many ECL output circuits are connected to the same power supply bus line. LSI output unit is assumed). The potential of the bus line 1a of the high-potential-side power supply is supplied at two locations on the bus line, and the VCS generation circuit 4a is arranged at the same position as the potential supply position 3a.

【0015】したがって、VCSと高電位側電源のバス
ラインの電位がいずれも、前記バスライン電位供給位置
3aにいて最も高く、その間およびバスライン1a両端
で最も低くなる。このため出力ローレベルにおいてVC
Sの配線による電位降下のため論理振幅が減少するの
と、前記バスライン1aの電位上昇が互いに打ち消し合
い、従来に較べてECL回路の出力ローレベルの位置依
存性を減少させることが可能であり、前記第1の実施例
と同様の降下が期待できる。本実施例では、第1の実施
例と比べて、電源電位供給位置とECL回路が近いた
め、電位降下が小さく出力レベルの位置依存性がより小
さくなる。
Therefore, both the potential of the VCS and the potential of the bus line of the high potential side power supply are the highest at the bus line potential supply position 3a, and the lowest between them and at both ends of the bus line 1a. Therefore, when the output is at the low level, VC
The decrease in the logic amplitude due to the potential drop due to the S wiring and the rise in the potential of the bus line 1a cancel each other out, making it possible to reduce the position dependence of the output low level of the ECL circuit as compared with the related art. The same descent as in the first embodiment can be expected. In this embodiment, since the power supply potential supply position is closer to the ECL circuit than in the first embodiment, the potential drop is small and the position dependency of the output level is smaller.

【0016】[0016]

【発明の効果】以上説明したように本発明は、複数のE
CL回路が接続された高電位側電源のバスラインの電位
供給位置と前記ECL回路に接続されるVCS発生回路
の接続位置を、同一箇所とすることにより、ECL回路
の出力ローレベルの位置依存性を減少させることができ
る効果がある。
As described above, according to the present invention, a plurality of Es
By setting the potential supply position of the bus line of the high-potential-side power supply to which the CL circuit is connected and the connection position of the VCS generation circuit connected to the ECL circuit to the same position, the position dependence of the output low level of the ECL circuit There is an effect that can be reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)は本発明の第1の実施例の高電位側電源
の電位供給位置とVCS発生回路のレイアウト図であ
り、(b)はそれぞれの電位の位置依存性を示した図で
ある。
FIG. 1A is a layout diagram of a potential supply position of a high-potential-side power supply and a VCS generation circuit according to a first embodiment of the present invention, and FIG. 1B is a diagram showing position dependence of each potential. It is.

【図2】(a)は本発明の第2の実施例の高電位側電源
の電位供給位置とVCS発生回路のレイアウト図であ
り、(b)はそれぞれの電位の位置依存性を示した図で
ある。
FIG. 2A is a layout diagram of a potential supply position of a high-potential-side power supply and a VCS generation circuit according to a second embodiment of the present invention, and FIG. 2B is a diagram showing position dependence of each potential. It is.

【図3】(a)はバイポーラ型半導体集積回路において
一般的に使用されているECL回路の回路図であり、
(b)は同じく一般的に使用されているVCS発生回路
の回路図である。
FIG. 3A is a circuit diagram of an ECL circuit generally used in a bipolar semiconductor integrated circuit;
FIG. 2B is a circuit diagram of a commonly used VCS generation circuit.

【図4】(a)は従来の高電位側電源の電位供給位置と
VCS発生回路のレイアウト図であり、(b)はそれぞ
れの電位の位置依存性を示した図である。
FIG. 4A is a layout diagram of a potential supply position of a conventional high-potential-side power supply and a VCS generation circuit, and FIG. 4B is a diagram showing position dependence of each potential.

【符号の説明】[Explanation of symbols]

1,1a 高電位側電源バスライン 2,2a ECL回路郡 3,3a 高電位側電源電位供給位置 4,4a VCS発生回路 5 チップ外周 6,6a 高電位側電源バスライン電位 7,7a ECL回路出力ハイレベル 8,8a ECL回路出力ローレベル 9,9a VCS電位 10 定電位側電源バスライン電位 1, 1a High-potential-side power supply bus line 2, 2a ECL circuit group 3, 3a High-potential-side power supply potential supply position 4, 4a VCS generation circuit 5 Chip outer periphery 6, 6a High-potential-side power supply bus line potential 7, 7a ECL circuit output High level 8, 8a ECL circuit output low level 9, 9a VCS potential 10 Constant potential side power supply bus line potential

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 半導体チップの一主面に配置された複数
のECL回路と、このECL回路が接続された複数の高
電位側電源バスラインと、前記複数のECL回路の定電
流源の定電流を駆動する定電流制御用定電位を発生する
電流制御用定電圧発生回路と、前記定電流制御用電位を
供給する定電流制御用定電位供給ラインとを有するバイ
ポーラの半導体集積回路において、前記高電位側電源バ
スラインの電位低下による前記ECL回路の出力レベル
の低下を前記定電流制御用定電位供給ラインの電位低下
により相殺するよう前記ECL回路の定電流源の定電流
制御用定電圧発生回路の配置位置を前記高電位側電源バ
スラインの電位供給位置の近傍とし、さらに前記定電流
制御用定電圧発生回路は、前記ECL回路が両側を挟む
位置に配置されていることを特徴とする半導体集積回
路。
1. A plurality of ECL circuits disposed on one main surface of a semiconductor chip, a plurality of high-potential-side power supply bus lines to which the ECL circuits are connected, and a constant current of a constant current source of the plurality of ECL circuits. A bipolar semiconductor integrated circuit having a constant voltage generating circuit for generating a constant current for generating a constant current for controlling the constant current, and a constant potential supply line for supplying a constant current for supplying the constant current controlling potential. A constant current generating constant voltage generating circuit for the constant current source of the ECL circuit so that a decrease in the output level of the ECL circuit due to a decrease in the potential of the potential side power supply bus line is offset by a decrease in the potential of the constant current controlling constant potential supply line. Is located near the potential supply position of the high potential side power supply bus line , and the constant current
In the control constant voltage generation circuit, the ECL circuit sandwiches both sides
A semiconductor integrated circuit which is arranged at a position .
JP3019637A 1991-02-13 1991-02-13 Semiconductor integrated circuit Expired - Fee Related JP2806053B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3019637A JP2806053B2 (en) 1991-02-13 1991-02-13 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3019637A JP2806053B2 (en) 1991-02-13 1991-02-13 Semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPH05347380A JPH05347380A (en) 1993-12-27
JP2806053B2 true JP2806053B2 (en) 1998-09-30

Family

ID=12004734

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3019637A Expired - Fee Related JP2806053B2 (en) 1991-02-13 1991-02-13 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JP2806053B2 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5858751A (en) * 1981-10-05 1983-04-07 Hitachi Ltd Integrated circuit device
JPS58142559A (en) * 1982-02-19 1983-08-24 Hitachi Ltd Semiconductor integrated circuit device
JPS63306642A (en) * 1987-06-08 1988-12-14 Nec Corp Integrated circuit device

Also Published As

Publication number Publication date
JPH05347380A (en) 1993-12-27

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