JP2793087B2 - SCSI_I / F test equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a SCSI_I / F test apparatus for testing a SCSI I / F.

[0002]

2. Description of the Related Art Conventionally, when testing the interface of a host device (initiator) having a SCSI interface, as shown in FIG.
D (hard disk device) is connected to perform a read / write test, or, as shown in FIG. 12 (b), a host device is simulated as a controller device (target), and the test is performed by opposing connection. .

[0003]

Therefore, in the former hard disk connection test, the hard disk drive is expensive. Since the hard disk drive has a mechanical part, there is a high possibility that a failure or an error occurs, and the installation environment (temperature, (Humidity, vibration, etc.) There is a problem that it is not possible to test for error processing such as parity error, which is too restrictive.

Further, in the latter facing test, there is a problem that a dedicated test program is required for each host device, which requires an extra circuit serving as a controller in the host device.

[0005] The present invention solves these problems,
Connect the pseudo I / O to the SCSI_I / F of the device under test,
A purpose is to transmit a state transition signal or test data and receive the result as data, or to further transmit test data and receive it to perform data reception check and perform a SCSI_I / F test with a simple configuration. And

[0006]

FIG. 1 is a diagram illustrating the principle of the present invention. In FIG. 1, a device under test 1 has a SCSI
_I / F (host device)

The test function 2 is provided in the device under test 1 and transmits a state transition signal and test data to the SCSI_I / F, and receives a result of receiving the state transition signal and the test data as data and makes a determination. Or pseudo I / O5
For example, it receives test data transmitted from the server and checks data reception.

The pseudo I / O 5 is for connecting to the SCSI_I / F to perform a test.

[0009]

According to the present invention, as shown in FIG. 1, the test function 2 of the device under test 1 transmits a state transition signal to the SCSI_I / F, and the pseudo I / O 5 receives and holds this and transmits it as data. Then, it is determined whether the test function 2 that has received the error has an error.

The test function 2 of the device under test 1 transmits the test data to the SCSI_I / F, the pseudo I / O 5 receives the data, checks for errors, holds the result, and sends it out as data. The test function 2 that receives this determines whether an error has occurred.

The pseudo I / O 5 transmits test data to the test function 2 of the device under test 1, and the test function 2 that receives the data determines whether an error has occurred. Therefore, the pseudo I / O 5 is connected to the SCSI_I / F of the device under test 1, the test function 2 of the device under test 1 transmits a state transition signal and test data, and the pseudo I / O 5 returns the result and returns an error. The SCSI_I / F test can be automatically performed with a simple configuration by making a determination, or by the pseudo I / O 5 transmitting test data and the test function 2 of the test function 1 making an error determination. .

[0012]

Next, the structure and operation of an embodiment of the present invention will be sequentially described in detail with reference to FIGS.

In FIG. 1, a device under test 1 is a computer system (host device) such as a workstation.
It has a SCSI_I / F, is connected to an I / O device such as a magnetic disk device, and transmits and receives data at high speed. The device under test 1 includes a test function (test program) 2, a driver / receiver 3, and a SCSI
It is composed of a controller 4 and the like.

The test function 2 performs a SCSI_I / F test. Here, the test function 2 is a function of loading a test program from a floppy disk and operating the test program. The test function 2 transmits the state transition signal and the test data to the SCSI_I / F, and determines the error of the data returned from the pseudo I / O 5 with respect to the reception result of the state transition signal and the test data. Or pseudo I /
It receives the test data transmitted from O5 and checks the data reception (FIGS. 5 to 1).
0).

The driver / receiver 3 exchanges signals and data with a SCSI interface (SCSI_I / F). The SCSI controller 4
It controls transmission and reception of signals and data with the pseudo I / O 5 via the CSI interface.

The pseudo I / O 5 is for connecting to the SCSI_I / F to perform a test. The pseudo I / O 5 holds the received state transition signal and transmits it as data, or checks the received test data to check it. The result is transmitted as data, or test data is transmitted.

FIG. 2 shows a block diagram of the pseudo I / O 5 of the present invention. In FIG. 2, the receiver / driver 51 includes:
It transmits and receives signals and data to and from the SCSI_I / F. Here, BSY, C / D,
There are MSG, REQ, SEL, ATN, ACK, RST and the like. Data consists of DB0 to DB7 and DBP (parity bit).

The sequence controller 52 controls the entire system. Selection controller 53
Is for storing that the pseudo I / O 5 has been selected.

The face controller 54 holds the current phase. The increment data generator 55 generates incremented test data and comparison data. For example, the increment data generator 55 sequentially generates data 00 to FF.

The data comparator 56 has a SCSI_I
The test data received via the / F is compared with the comparison data generated by the increment data generator 55 to determine whether or not they match. When they do not match, an error is determined.

The parity check / generator 57
It performs a parity check of the received data, generates a parity bit when transmitting the data, and the like. The status register 58 holds the status. For example: ・ Status error ・ Parity error ・ Signal transition error (state transition signal error) ・ Data error ・ Other

FIG. 3 shows a state transition diagram of the present invention. This shows a state transition between the device under test 1 of FIG. 1 and the pseudo I / O 5 connected via the SCSI_I / F. As shown in the figure, the state transition includes a path free phase, a selection phase, a command phase, a data in phase, a data out phase, a message in phase, a message out phase, and a status phase. Here, the pass-free phase is the power ON (PO
This is a phase set by WER ON) or RST = "1" (reset condition), and all devices are in a state where SCSI_I / F can be used.
The selection phase is a state where a certain device connected to the SCSI_I / F is selected. The command phase is a phase in which a command is transmitted and a state transition is made to one of the phases described on the right side (data in phase, data out phase, etc.). The status phase is a phase that transitions when the data-in phase or the like ends.

FIG. 4 shows an example of a test procedure according to the present invention. This is an example of a basic procedure for performing a test according to the state transition of FIG. 2 under the configuration of FIG. In FIG.
Resets the present device (pseudo I / O5).

Selects this device (pseudo I / O5) in the selection phase (SCSI_ID = X
X). Sets ANT = "1" and sets a command phase.

Reads the status and confirms that it is normal (SPSR = X "C0"?). Transfer data. Data transfer is performed in one of the message in phase, message out phase, data in phase, and data out phase.

Reads the status and confirms that the data transfer is normally performed. Hereinafter, based on the basic procedure, the state transition check will be described in detail with reference to FIGS. 5 and 6, the transmission data check will be described with reference to FIGS.

First, the state transition check will be described in detail with reference to FIGS. Here, from ○ 11 to ○
21 represents a number with a circle. 5 corresponds to ○ 21 in FIG. 6, respectively. In this example, in order to check the state transition of the device under test 1 RST (reset) = "1" ATN (attention) = "1"
/ F, respectively, and the pseudo I / O 5 holds these in the status register 58 of FIG. 1 as the RST flag = “1” and the ATN flag = “1”. Transmit and the device under test 1
Check at 19 to determine NG or GOOD. This will be described sequentially below.

In FIG. 5, RST = "1" → "0" is transmitted to initialize the pseudo I / O (see FIG. 6, the same applies hereinafter). In this case, the pseudo I / O 5 is initialized, the pass free phase is set, and the RST flag is set to "1" and RST = "1" is stored in the status register 58 of FIG.

First, the device under test 1 checks BSY = "0" and confirms the pass free phase. Is a pseudo I / O
Issue ID for selecting No. 5 (DATA = "02H").

Is a selection signal (SEL) for selecting the data (DATA = "02H") sent to DB0 to DB7.
= “1”). Sends a response signal (BSY = "1") indicating that the pseudo I / O 5 has selected the data.

The selection is confirmed (SEL = “0”) in response to the response signal (BSY = “1”). Issues a command owner signal (ATN = "1").

The pseudo I / O 5 issues a command request (REQ = “1” is transmitted, and the ATN flag = “1” is stored). ○ 10 confirms the command request (ATN =
“0”).

The signal # 11 issues and responds to the command (DATA = "08H", ACK = "1" → "0").
Thus, a state transition is instructed from the command phase to the status phase).

In the case of ○ 12, the pseudo I / O 5 confirms the command response (REQ = “0”). # 13 makes a status phase transition (I / O = "1"). ○ 14 sends status (DATA = “C8H”, REQ =
“1”). Here, DATA = "C8H" indicates that the RST flag = "1" stored as shown by the arrow.
Both the ATN flag = "1" stored in and are represented by data.

In step # 15, the status is received, and a response to the effect is received (ACK = "1" → "0"). ○ 16
Indicates that the pseudo I / O 5 confirms the status response (REQ =
“0”).

In step # 17, a transition is made to the command phase (I / O = "0"). # 18 requests a command (R
EQ = "1"). In step 19, the device under test 1 checks the status (GOOD if status DATA = “C8H”, NG if not equal).

In the case of ○ 20, when it is determined as GOOD in ○ 19, the next command is issued and responded (DATA =
“XXX”, ACK = “1” → “0”). ○ 21 is ○
When it is determined as NG in 19, an error is determined and the process ends abnormally.

By the above procedure, on the pseudo I / O 5 side,
The RST flag is set to "1" at the time of (1) and stored in the status register 58 of FIG.
It is stored in the status register 58 of FIG. 1 as “1”,
These are collectively transmitted as data “C8H” (when normal) at １４14, and this data “C8H” is
H ”is received and determined to be GOOD (normal) in ○ 19,
○ Next, go to step 20. On the other hand, NG (error occurred) at ○ 19
Is determined, an error is determined at ○ 21, and the process ends abnormally.

With these procedures, a pseudo I / O 5 is provided,
As for the state transition, a state transition is instructed from the device under test 1 and the result is received as data from the pseudo I / O 5, and a test of the state transition of the SCSI_I / F of the device under test 1 can be performed.

Next, the data transmission check will be described in detail with reference to FIGS. Here, １１11 to ２０20 represent circled numbers. 7 from FIG.
Therefore, it corresponds to ○ 20. In this example, the device under test 1 sequentially transmits data X “00” to X “FF” in order to check data transmission, and the received pseudo I / O 5 generates reference data generated internally. If the result is an error, the ERR flag = "1" is held, and the held result is transmitted as data at １３13.
Check at 8 to determine NG or GOOD. This will be described sequentially below.

In FIG. 7, the pseudo I / O 5 requests a command (REQ = "1"). Corresponds to, the device under test 1 issues / responds a command (DATA
= “40H”, ACK = “1” → “0”).

The pseudo I / O 5 confirms the command (REQ = "0"). Transitions to the data out phase (C / D = "0"). Requests data (R
EQ = "1").

The device under test 1 sends increment data and responds (DATA = "00H to FF").
H, ACK = “1” → “0”) ends the data (DATA = “FFH”).

The pseudo I / O device 5 confirms data transmission (REQ = "0"). Confirms the data (DA
TA = increment data? That is, the received data is compared with the internally generated increment data,
Check if they match).

In the case of ○ 10, since the result was NG, an error flag is set (the ERR flag is set to “1” and stored). In the case of で 11, since the answer was OK, it is determined whether or not the data has been completed (it is determined whether or not DATA = "FFH"). YES
In the case of, the process proceeds to １２12. In the case of NO, the subsequent steps are repeated.

In the step # 12, the status is shifted to the status phase (I / O = "1"). # 13 sends a status (DATA = "C8H", REQ = "1").

In step O14, the device under test 1 receives and responds to the status (ACK = “1” → “0”). ○
In step 15, the pseudo I / O 5 confirms the status response (RE
Q = "0").

In the step # 16, the state transits to the command phase (I / O = "0"). # 17 requests a command (R
EQ = "1"). In step 18, the status is confirmed (status DATA = "01"?). This is to check whether the status received at ○ 14 is “01” and there is no error. In the case of GOOD, the process proceeds to the next command issuance and response in ○ 19 (DATA = “XXH”, ACK =
“1” → “0”).

In the case of ○ 20, since the result of ○ was NG in 判定 18, an error judgment is made and the processing is abnormally terminated. According to the above procedure, the pseudo I / O 5 checks the received data and stores an ERR flag = “1” in the status register 58 of FIG. The results are summarized and the data “C8
H ”(normal), the device under test 1 receives this data“ C8H ”, is determined to be GOOD (normal) at ○ 18, proceeds to １９19, and proceeds to １８18 at N.
If it is determined to be G (error occurrence), an error is determined at 、 20, and the process ends abnormally.

With these procedures, a pseudo I / O 5 is provided,
When the data is transmitted from the test apparatus 1, the pseudo I / O5
Receives and checks the data, receives the result as data, and determines an error.
A test of I_I / F data transmission can be performed.

Next, the data reception check will be described in detail with reference to FIGS. 9 and 10. Here, １１11 to １８18 represent numbers with circles. 9 correspond to ○ 18 in FIG. 10, respectively. In this example, the pseudo I / O 5 sequentially transmits data X “00” to X “FF” in order to check data reception, and receives the reference data generated internally by the device under test 1 that has been received. The comparison is made and the result is judged (error judgment, normal judgment). This will be described sequentially below.

In FIG. 9, the pseudo I / O 5 requests a command (REQ = "1"). Corresponds to, the device under test 1 issues / responds a command (DATA
= “80H”, ACK = “1” → “0”).

The pseudo I / O 5 confirms the command (REQ = "0"). Transitions to the data-in phase (C / D = "0", I / O = "1"). Sends increment data (DATA = “00H to FF”
H ", REQ =" 1 ").

The device under test 1 receives the increment data and responds (ACK = “1” → “0”).
Then, the received increment data is confirmed (it is confirmed whether DATA matches the increment data generated internally and is correct). ○ 1 for GOOD
If it is 0, it is determined whether the data is completed (DATA = “FFH”). If YES, the process proceeds to ○ 12, and if NO, the process proceeds to NO. On the other hand, in the case of NG, the process proceeds to １８18.

The pseudo I / O 5 confirms receipt of the increment data (REQ = "0"). Determines whether data is completed (determines whether DATA = "FFH"). YE
In the case of S, the process proceeds to １０10. In the case of NO, the subsequent steps are repeated.

In the step # 10, the status is shifted to the status phase (I / O = "1"). # 11 sends a status (DATA = "C8H", REQ = "1").

In the case of ○ 12, the device under test 1 receives and responds to the status (ACK = “1” → “0”). ○
13, the pseudo I / O 5 confirms the status response (R
EQ = "0").

○ 14: Command phase transition (I
/ O = "0"). ○ 15 requests a command (REQ
= "1"). In step S16, the device under test 1 checks the status (confirms that the status is normal with status DATA = "01"). In the case of GOOD, the next command is issued and responded with ○ 17 (DATA = “XXH”, ACK =
“1” → “0”). In the case of NG, the process proceeds to １８18.

○ 18 is NG in ○ or NG in ○ 16
In the case of, an error is determined and the processing ends abnormally. According to the above procedure, the device under test 1 receives and checks the data transmitted from the pseudo I / O 5 side.
Is used to determine an error.

According to these procedures, a pseudo I / O 5 is provided,
The test data is transmitted from the pseudo I / O 5 and received by the device under test 1 and checked to determine an error, thereby making it possible to test the data reception of the SCSI_I / F of the device under test 1.

FIG. 11 shows an example of command data / status data. FIG. 11A shows an example of command data. This command data is composed of one byte, each bit is allocated as shown in the figure, and the bit is set to control the pseudo I / O5.

PINV (bit 0): The parity bit of data is inverted. “0” indicates odd parity (normal), and “1” indicates even parity (parity error occurrence).

BFREE (bit 2): When "1", transition to the bus free phase. STAT (bit 3): When "1", transition to the status phase. MOUNT (bit 4): When "1", transition to the message out phase.

When MIN (bit 5) is “1”, the state transits to the message in phase. DOUT (bit 6): When "1", transition to the data out phase. DIN (bit 7): When "1", transition to the data in phase.

FIG. 11B shows an example of status data. This status data is composed of one byte, each bit is allocated as shown, and the bit is set to indicate the state of the pseudo I / O5.

END (bit 0): Indicates that transfer of 256-byte data has been completed in any of the message out phase, the message in phase, the data out phase, and the data in phase.

ERR (bit 1): Indicates that the increment data has an error in either the message out phase or the data out phase. PERR (bit 2): indicates that a Pity error has occurred in either the message out phase or the data out phase.

ATN (bit 6): ATN signal is "1"
Indicates that it has become. RST (bit 7): Indicates that the RST signal has become "1".

[0069]

As described above, according to the present invention,
The pseudo I / O 5 is connected to the SCSI_I / F of the device under test 1, the test function 2 of the device under test 1 transmits a state transition signal or test data, and the pseudo I / O 5 returns the result as data and returns an error. Since the pseudo I / O 5 transmits test data and the test function 2 of the test function 1 makes an error judgment, the SCSI_
An I / F test can be performed automatically. As a result, (1) a general-purpose SCSI_I / F test can be performed regardless of the model.

(2) The size of the pseudo I / O 5 used in the test can be reduced. (3) A low-cost test device (pseudo I / O5) is sufficient. (4) By simply connecting the pseudo I / O 5 to the SCSI_I / F, various tests can be easily performed by the loopback test.

[Brief description of the drawings]

FIG. 1 is a diagram illustrating the principle of the present invention.

FIG. 2 is a block diagram of a pseudo I / O according to the present invention.

FIG. 3 is a state transition diagram of the present invention.

FIG. 4 is an example of a test procedure of the present invention.

FIG. 5 is an example of a state transition check procedure according to the present invention.

FIG. 6 is a time chart at the time of a state transition check of the present invention.

FIG. 7 is an example of a data transmission check procedure according to the present invention.

FIG. 8 is a time chart at the time of data transmission according to the present invention.

FIG. 9 is an example of a data reception check procedure according to the present invention.

FIG. 10 is a time chart at the time of data reception according to the present invention.

FIG. 11 is an example of command data / status data of the present invention.

FIG. 12 is an explanatory diagram of a conventional technique.

[Explanation of symbols]

 1: Device under test 2: Test function 3, 51: Driver / receiver 4: SCSI controller 5: Pseudo I / O 52: Sequence controller 53: Selection controller 54: Phase controller 55: Increment data generator 56: Data comparator 57: Parity Check / Generator 58: Status register

Claims (3)

(57) [Claims] A SCSI_ for testing a SCSI I / F.
In the I / F test device, the device under test (1) storing the test function (2) is connected to the SCSI_I / F of the device under test (1), and the received state transition signal is held and transmitted as data. And a test function (2) of the device under test (1) transmits a state transition signal to the SCSI_I / F, and a state transition signal received by the pseudo I / O (5). A SCSI_I / F test apparatus characterized in that the test function (2) that receives the data and transmits the data as a data and determines whether the test function (2) receives the error is an error. 2. A SCSI_ for testing a SCSI I / F.
In the I / F test device, the device under test (1) storing the test function (2) and the SCSI_I / F of the device under test (1) are connected to check whether or not the received test data has an error. A pseudo I / O (5) for holding the result and transmitting the held result as data, wherein the test function (2) of the device under test (1) transmits test data to the SCSI_I / F, A SCSI_I / F test characterized in that the pseudo I / O (5) checks an error, holds the result, sends it out as data, and determines whether the test function (2) that has received the error is an error. apparatus. 3. A SCSI_ for testing a SCSI I / F.
In an I / F test apparatus, a device under test (1) storing a test function (2) and a pseudo I / F for transmitting test data to the device under test (1)
/ O (5), and the pseudo I / O (5) is provided for each predetermined value or for each predetermined ratio.
The test function (2) receives the test data sequentially generated and transmitted to the test function (2) of the device under test (1).
The test data generated sequentially by the specified value or by the specified ratio
A SCSI_I / F test apparatus configured to determine whether an error has occurred based on data.