JP2667691B2 - Low melting point Ag solder - Google Patents
Low melting point Ag solderInfo
- Publication number
- JP2667691B2 JP2667691B2 JP63334776A JP33477688A JP2667691B2 JP 2667691 B2 JP2667691 B2 JP 2667691B2 JP 63334776 A JP63334776 A JP 63334776A JP 33477688 A JP33477688 A JP 33477688A JP 2667691 B2 JP2667691 B2 JP 2667691B2
- Authority
- JP
- Japan
- Prior art keywords
- solder
- melting point
- low melting
- weight
- thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
- B23K35/262—Sn as the principal constituent
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Conductive Materials (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、Agを主成分とした低融点はんだに関する。The present invention relates to a low melting point solder containing Ag as a main component.
はんだは、一般にSn−Pb系合金であり、電子工業分野
での電気回路の接続や一部セラミックスと金属との接合
用として広く使用されている。Solder is generally a Sn-Pb alloy, and is widely used in the electronics industry for electrical circuit connection and partly for joining ceramics and metals.
しかしながら、Sn−Pb系はんだは、耐食性が低く、電
気・熱伝導性も低いという問題があり、さらに、技術者
に対してPbの蒸気や粉体が有害となる問題がある。However, Sn-Pb-based solder has problems that it has low corrosion resistance and low electrical and thermal conductivity, and that Pb vapor and powder are harmful to engineers.
また、セラミックスと金属との接合においては、セラ
ミックス側にMo−Mn等をメタライズしてはんだ（ろう
材）との適合性をはかり、Ag−Cu系のAgろうを用いるこ
ともあるが、薄板のセラミックス基板では、接合金属と
の熱膨張の差からセラミックス基板に割れを生じさせる
問題がある。In addition, when joining ceramics and metals, Ag-Cu based Ag brazing is used in some cases, in which Mo-Mn or the like is metallized on the ceramic side to ensure compatibility with solder (brazing material). In the case of a ceramic substrate, there is a problem that a crack is generated in the ceramic substrate due to a difference in thermal expansion with the joining metal.
本発明は、Agを重量比で10〜30％、Cu,In,Gaの一種以
上を重量比で0.05〜５％と残部がSnからなることを特徴
とするものであり、共晶型合金のAg−Snを基礎成分とす
ることにより溶融点を下げ、Agの存在により耐食性およ
び電気・熱伝導性の改善をはかり、Cu、In、Gaの一種以
上の存在によってはんだそのものの機械的強度の向上を
はかるものである。The present invention is characterized in that Ag is 10 to 30% by weight, and one or more of Cu, In and Ga is 0.05 to 5% by weight and the balance is Sn. Ag-Sn as the base component lowers the melting point, the presence of Ag improves corrosion resistance and electrical and thermal conductivity, and the presence of at least one of Cu, In, and Ga improves the mechanical strength of the solder itself To measure.
なお、本発明においてAgを重量比で10〜30％に限定し
た理由は、10％未満では耐食性および電気・熱伝導度が
希望する値に達しないためであり、30％を超えると製造
時の加工性が低下すると共に液相点が上昇してはんだと
は言い難くなる。In the present invention, the reason why Ag is limited to 10 to 30% by weight is that if less than 10%, corrosion resistance and electric / thermal conductivity do not reach desired values. As the processability decreases, the liquidus point increases, making it difficult to call it solder.
また、Cu、In、Gaの一種以上を重量比で0.05〜５％に
限定した理由は、0.05％未満では機械的強度の向上が期
待できないためであり、５％超えると固溶し難いことに
加えて偏析の原因になってむしろ諸特性の低下を招くこ
とになる。The reason why one or more of Cu, In, and Ga is limited to 0.05 to 5% by weight is that improvement of mechanical strength cannot be expected if the content is less than 0.05%. In addition, it causes segregation and rather causes deterioration of various characteristics.
第１実施例 Ag50g、Sn445g、Cu5gを合計した500gをタンマン炉で
溶解し、インゴットを鍛造・切削後、圧延と焼鈍を繰り
返し、厚さ0.1mmの薄板の加工した。First Example A total of 500 g of Ag 50 g, Sn 445 g, and Cu 5 g was melted in a tanman furnace, and the ingot was forged and cut, and rolling and annealing were repeated to process a thin plate having a thickness of 0.1 mm.
この薄板を幅5mm、長さ200mmに切断し、焼鈍を行って
引張強度と伸びおよび硬さの測定用試料とした。This thin plate was cut into a width of 5 mm and a length of 200 mm, and annealed to obtain a sample for measuring tensile strength, elongation and hardness.
剪断強度は図示する如く、厚さ0.5mm、幅6mm、長さ20
0mmの二枚のCu条材の間に、厚さ0.1mmで5mm角のろう材
を挟み、ろう付け後測定して表に示した。Shear strength is 0.5mm thick, 6mm wide, 20cm long as shown.
A 5 mm square brazing material having a thickness of 0.1 mm was sandwiched between two 0 mm Cu strips, measured after brazing, and shown in the table.
また、拡り性（ぬれ性）は、Ni板、Cu板を用いてN2＋
H2の混合ガス中で溶融点（液相）より40℃高い温度で５
分保持してその状態えを観察した。In addition, the spreadability (wetability) is determined by using N 2 +
5 at a temperature 40 ° C higher than the melting point (liquid phase) in a mixed gas of H 2
After holding for a minute, the condition was observed.
第２実施例 Ag50g、Sn425g、Cu24g、In0.25g、Ga0.75gを合計した
500gをタンマン炉で溶解し、インゴットを鍛造・切削
後、圧延と焼鈍を繰り返し、厚さ0.1mmの薄板の加工し
た。Second Example Ag50g, Sn425g, Cu24g, In0.25g, Ga0.75g were totaled.
500 g was melted in a Tamman furnace, and after forging and cutting the ingot, rolling and annealing were repeated to process a thin plate having a thickness of 0.1 mm.
この薄板を幅5mm、長さ200mmに切断し、焼鈍を行って
引張強度と伸びおよび硬さの測定用試料とした。This thin plate was cut into a width of 5 mm and a length of 200 mm, and annealed to obtain a sample for measuring tensile strength, elongation and hardness.
剪断強度も上記第１実施例と同様に図示する如く、厚
さ0.5mm、幅6mm、長さ200mmの二枚のCu条材の間に、厚
さ0.1mmで5mm角のろう材を挟み、ろう付け後測定して表
に示した。Shear strength is also shown in the same manner as in the first embodiment, as shown in the drawing, a 0.5 mm thick, 5 mm square brazing material having a thickness of 0.1 mm is sandwiched between two Cu strips having a thickness of 0.5 mm, a width of 6 mm, and a length of 200 mm. Measurements were made after brazing and are shown in the table.
また、拡り性（ぬれ性）も上記第１実施例と同様に、
Ni板、Cu板を用いてN2＋H2の混合ガス中で溶融点（液
相）より40℃高い温度で５分保持してその状態を観察し
た。The spreadability (wetability) is also the same as in the first embodiment,
Using a Ni plate and a Cu plate, the mixture was kept at a temperature higher than the melting point (liquid phase) by 40 ° C. for 5 minutes in a mixed gas of N 2 + H 2 and the state was observed.
以下同様に第３実施例〜第８実施例を行ない、その結
果は表に示す通りである。Hereinafter, the third to eighth embodiments are similarly performed, and the results are as shown in the table.
なお、比較のために従来例として、60wt％Sn−Pb合金
と、40wt％Sn−Pb合金とを実施例と同寸法に加工して同
様の測定を行った。For comparison, as a conventional example, a 60 wt% Sn-Pb alloy and a 40 wt% Sn-Pb alloy were processed to have the same dimensions as in the example, and the same measurement was performed.
〔発明の効果〕 以上説明した本発明によると、Ag、Snを基礎成分と
し、Cu、In、Gaの一種以上を加えたことにより、耐食性
に優れ、しかも電気・熱伝導度は改善される効果を有
し、さらにPb等の有害成分がない効果を有する。 [Effects of the Invention] According to the present invention described above, Ag and Sn are used as basic components, and by adding one or more of Cu, In, and Ga, the corrosion resistance is excellent, and the electric and thermal conductivity is improved. It also has the effect of being free of harmful components such as Pb.
また、従来のSn−Pb系のはんだに比べて引張強度、剪
断強度、硬さ等の機械的特性においては約２倍以上の値
を示し、それらにおいて顕著な効果が認められる。Further, as compared with the conventional Sn-Pb-based solder, mechanical properties such as tensile strength, shear strength, and hardness are about twice or more, and a remarkable effect is recognized in these.
第１図は剪断強度試験を行うための測定用試料の斜視図
である。FIG. 1 is a perspective view of a measurement sample for performing a shear strength test.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭50−50250（ＪＰ，Ａ) 特開 昭49−38858（ＪＰ，Ａ) 特開 昭56−165588（ＪＰ，Ａ) 特開 昭61−14096（ＪＰ，Ａ) 特開 昭58−55194（ＪＰ，Ａ) 特開 昭63−13689（ＪＰ，Ａ) 特公 昭35−18562（ＪＰ，Ｂ１) 特公 昭53−25302（ＪＰ，Ｂ２) ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-50-50250 (JP, A) JP-A-49-38858 (JP, A) JP-A-56-165588 (JP, A) 14096 (JP, A) JP-A-58-55194 (JP, A) JP-A-63-13689 (JP, A) JP-B-35-18562 (JP, B1) JP-B-53-25302 (JP, B2)
Claims (1)
上を重量比で0.05〜５％と残部がSnからなることを特徴
とする低融点Agはんだ。1. A low-melting-point Ag solder characterized in that Ag is 10 to 30% by weight, and one or more of Cu, In and Ga is 0.05 to 5% by weight and the balance is Sn.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63334776A JP2667691B2 (en) | 1988-12-29 | 1988-12-29 | Low melting point Ag solder |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63334776A JP2667691B2 (en) | 1988-12-29 | 1988-12-29 | Low melting point Ag solder |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02179387A JPH02179387A (en) | 1990-07-12 |
| JP2667691B2 true JP2667691B2 (en) | 1997-10-27 |
Family
ID=18281107
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63334776A Expired - Lifetime JP2667691B2 (en) | 1988-12-29 | 1988-12-29 | Low melting point Ag solder |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2667691B2 (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9701819D0 (en) * | 1997-01-29 | 1997-03-19 | Alpha Fry Ltd | Lead-free tin alloy |
| JP2007044701A (en) * | 2005-08-05 | 2007-02-22 | Fuji Electric Device Technology Co Ltd | Lead-free solder material |
| JP5751572B2 (en) * | 2010-03-31 | 2015-07-22 | Jx日鉱日石金属株式会社 | Indium with low alpha dose or alloys containing indium |
| JP5759037B2 (en) * | 2014-03-28 | 2015-08-05 | Jx日鉱日石金属株式会社 | Indium with low alpha dose or alloys containing indium |
| CN107470795B (en) * | 2017-08-20 | 2019-10-25 | 东北石油大学 | Active solder and its welding application method for SiC ceramic low temperature brazing |
-
1988
- 1988-12-29 JP JP63334776A patent/JP2667691B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02179387A (en) | 1990-07-12 |
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