JP2605987B2 - Dielectric porcelain composition - Google Patents

Dielectric porcelain composition

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Publication number
JP2605987B2
JP2605987B2 JP3024552A JP2455291A JP2605987B2 JP 2605987 B2 JP2605987 B2 JP 2605987B2 JP 3024552 A JP3024552 A JP 3024552A JP 2455291 A JP2455291 A JP 2455291A JP 2605987 B2 JP2605987 B2 JP 2605987B2
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JP
Japan
Prior art keywords
weight
dielectric constant
parts
dielectric
temperature
Prior art date
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JP3024552A
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Japanese (ja)
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JPH04264306A (en
Inventor
卓也 宮川
哲也 土井
俊典 河原
康行 内藤
正士 森本
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Murata Manufacturing Co Ltd
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Murata Manufacturing Co Ltd
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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、磁器コンデンサ、特に
ニッケル等の卑金属から成る内部電極を有する積層型磁
器コンデンサに用いられる非還元性誘電体磁器組成物に
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a non-reducing dielectric ceramic composition for use in a ceramic capacitor, particularly a laminated ceramic capacitor having an internal electrode made of a base metal such as nickel.

【0002】[0002]

【従来の技術】従来、積層コンデンサ等の積層型電子部
品を得るにあたっては、内部電極を構成する電極材料と
誘電体セラミックスとを一体焼成して得られた焼結体が
用いられている。ところで積層コンデンサを製作する場
合、従来のBaTiO3 を主成分とする誘電体材料で
は、1300〜1500℃で焼成するため、内部電極材
料としては、このような温度で溶融しないPt,Pd等
の貴金属が使用されていた。しかしながら、これらの貴
金属は高価であるという問題があり、高容量化を図るた
めに、内部電極数を増加させた場合にはコストが著しく
高くなる。そこで安価なニッケル等の卑金属を内部電極
材料として用いることが試みられている。しかしながら
ニッケル等の卑金属から成る内部電極を用いた場合に
は、内部電極材料が酸化しやすいため還元雰囲気中で焼
成しなければならず、そのような雰囲気下で焼成すると
セラミックスが還元され絶縁性を失ってしまうという問
題があった。このような問題を解決するものとして、例
えばBaTiO3 にMgOやMnOを添加したり(特開
昭57−71866号)、さらにこの系にCaZrO3
を添加した物(特開昭62−157603号)が提案さ
れている。
2. Description of the Related Art Conventionally, when obtaining a multilayer electronic component such as a multilayer capacitor, a sintered body obtained by integrally firing an electrode material constituting an internal electrode and a dielectric ceramic has been used. When a multilayer capacitor is manufactured, a conventional dielectric material containing BaTiO 3 as a main component is fired at 1300 to 1500 ° C., so that noble metal such as Pt or Pd which does not melt at such a temperature is used as an internal electrode material. Was used. However, there is a problem that these noble metals are expensive, and when the number of internal electrodes is increased in order to increase the capacity, the cost is significantly increased. Accordingly, attempts have been made to use inexpensive base metals such as nickel as the internal electrode material. However, when an internal electrode made of a base metal such as nickel is used, the internal electrode material is easily oxidized and must be fired in a reducing atmosphere. There was a problem of losing. In order to solve such a problem, for example, MgO or MnO is added to BaTiO 3 (Japanese Patent Laid-Open No. 57-71866), and CaZrO 3 is added to this system.
(Japanese Patent Application Laid-Open No. 62-157603) has been proposed.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、上記先
行技術に示されている誘電体では、比誘電率が経時的に
低下し、初期の特性が維持できないという問題があっ
た。また、CR積を大きくすると誘電率の温度変化率
(但し、−55℃〜+125℃の範囲で+25℃を基準
とする。)が、E.I.A.規格(Electroni
c IndustryAssociation Sta
ndard)の値の±15%を外れやすくなるという問
題もあった。本発明の目的は、高い比誘電率及び小さい
誘電正接を維持しつつ、比誘電率のエージング特性に優
れCR積が大きくかつ静電容量の温度変化の小さい非還
元性誘電体磁器組成物を提供することにある。
However, the dielectric disclosed in the above prior art has a problem that the relative dielectric constant decreases with time and the initial characteristics cannot be maintained. When the CR product is increased, the temperature change rate of the dielectric constant (however, in the range of −55 ° C. to + 125 ° C., based on + 25 ° C.) becomes larger. I. A. Standards (Electroni
c IndustryAssociation Sta
There is also a problem that it tends to deviate from ± 15% of the value of (ndard). An object of the present invention is to provide a non-reducing dielectric ceramic composition having excellent relative dielectric constant aging characteristics, excellent CR product, and small capacitance temperature change while maintaining a high relative dielectric constant and a small dielectric tangent. Is to do.

【0004】[0004]

【課題を解決するための手段】本発明の誘電体磁器組成
物は、下記の組成式で表される成分を主成分として含有
する。 (1−a−b−c−d−t)BaTiO3 +aCaTi
3 +b{(1−x)BaZrO3 +xSrZrO3
+cMgO+dMnO+tRe2 3 但し、式中ReはY,Gd,Dy,Ho,ErまたはY
bの少なくとも1種を示す。また、本発明の非還元性誘
電体磁器組成物は、上記主成分100重量部に対しSi
2 ,Li2 OまたはB2 3 の少なくとも1種からな
る添加剤を0.1〜5.0重量部含有する。
Means for Solving the Problems The dielectric ceramic composition of the present invention contains a component represented by the following composition formula as a main component. (1-abctd-t) BaTiO 3 + aCaTi
O 3 + b {(1-x) BaZrO 3 + xSrZrO 3 }
+ CMgO + dMnO + tRe 2 O 3 Where Re is Y, Gd, Dy, Ho, Er or Y
and at least one of b. In addition, the non-reducing dielectric ceramic composition of the present invention contains Si based on 100 parts by weight of the main component.
O 2, the Li 2 O or B 2 O additive consisting of at least one 3 containing 0.1 to 5.0 parts by weight.

【0005】[0005]

【作用】上記組成式において、aが0.05以下とされ
ているのはCaTiO3 が5モル%を超えて配合される
と、−55℃〜+125℃の温度範囲で誘電率の温度に
よる変化率(以下、誘電率の温度変化率)が±15%を
超えてしまうからである。次に、bが0<b≦0.05
の間とされているのは、その範囲外では−55℃〜+1
25℃の温度範囲での誘電率の温度変化率が±15%を
超えたり、SrZrO3 やBaZrO3 の添加量が多い
と、CR積が1000以下に低下し、絶縁抵抗が不十分
となり積層コンデンサとして使用できなくなるからであ
る。また、cが0.005〜0.08の間とされている
のは、MgOの配合比がこの範囲外であると、CR積が
1000以下に低下し、絶縁抵抗が不十分となるからで
ある。また、dが0.005〜0.02の範囲とされて
いるのは、MnOの配合比が0.5モル%未満では、−
55℃〜+125℃の温度範囲での誘電率の温度変化率
が±15%を超えるからであり、他方2.0モル%を超
えるとCR積が低下するからである。さらに、tが0.
005〜0.02の範囲とされているのは、Re2 3
の配合比が0.5モル%より少ない場合には−55℃〜
+125℃の温度範囲における誘電率の温度変化率が±
15%を超えるからであり、2.0モル%を超えると焼
結性が低下し、1250℃以下の温度で焼結し難くなる
からである。本発明において、SiO2 ,LiO2 また
はB2 3 の少なくとも1種からなる添加剤を配合して
いるのは焼結性を高めるためである。もっとも、主成分
100重量部に対して添加剤の配合比が0.1重量部未
満では、1300℃の温度でも焼結しなくなり、また主
成分100重量部に対し添加剤が5.0重量部を超えて
添加された場合には、誘電率が大幅に低下する。従っ
て、主成分100重量部に対する添加剤の含有量は5.
0重量部が上限となる。本発明では、特にCaTiO
3 , BaZrO3 ,やSrZrO3 を添加することで誘
電率の経時変化が少なく、かつ上記特定の添加剤を配合
することで1250℃以下の温度で焼成することが可能
とされており、後述の実施例から明らかなように誘電率
の温度変化率が小さく、十分な大きさのCR積を示す非
還元性誘電体磁器組成物が得られる。
In the above composition formula, the reason why a is set to 0.05 or less is that when CaTiO 3 is added in excess of 5 mol%, the dielectric constant changes with temperature in the temperature range of -55 ° C. to + 125 ° C. This is because the rate (hereinafter, the temperature change rate of the dielectric constant) exceeds ± 15%. Next, b is 0 <b ≦ 0.05.
Is between -55 ° C and +1 outside that range.
If the temperature change rate of the dielectric constant in the temperature range of 25 ° C. exceeds ± 15%, or if the amount of SrZrO 3 or BaZrO 3 added is large, the CR product decreases to 1000 or less, the insulation resistance becomes insufficient, and the multilayer capacitor becomes insufficient. This is because it cannot be used. Further, the reason why c is set to be between 0.005 and 0.08 is that if the mixing ratio of MgO is out of this range, the CR product is reduced to 1000 or less, and the insulation resistance becomes insufficient. is there. Further, d is set in the range of 0.005 to 0.02 because, when the mixing ratio of MnO is less than 0.5 mol%, −
This is because the temperature change rate of the dielectric constant in the temperature range of 55 ° C. to + 125 ° C. exceeds ± 15%, and if it exceeds 2.0 mol%, the CR product decreases. Furthermore, when t is 0.
The range of 005 to 0.02 is that of Re 2 O 3
When the compounding ratio is less than 0.5 mol%,
The temperature change rate of the dielectric constant in the temperature range of + 125 ° C. is ±
This is because it exceeds 15%, and if it exceeds 2.0 mol%, the sinterability deteriorates and sintering becomes difficult at a temperature of 1250 ° C. or lower. In the present invention, the addition of an additive composed of at least one of SiO 2 , LiO 2 and B 2 O 3 is for enhancing sinterability. However, if the compounding ratio of the additive is less than 0.1 part by weight with respect to 100 parts by weight of the main component, sintering is not performed even at a temperature of 1300 ° C., and the additive is 5.0 parts by weight with respect to 100 parts by weight of the main component. When added in excess of the above, the dielectric constant is significantly reduced. Therefore, the content of the additive with respect to 100 parts by weight of the main component is 5.
0 parts by weight is the upper limit. In the present invention, in particular, CaTiO
3, by adding BaZrO 3 or SrZrO 3 , there is little change with time in the dielectric constant, and by adding the above-mentioned specific additive, it is possible to perform calcination at a temperature of 1250 ° C. or less. As is clear from the examples, a non-reducing dielectric ceramic composition having a small rate of change in dielectric constant with temperature and exhibiting a sufficiently large CR product can be obtained.

【0006】[0006]

【実施例の説明】次に本発明を実施例に基づき、詳細に
説明する。まず、表1〜4に示した出発原料を表中の割
合となるように秤量し、さらに有機バインダを添加しボ
ールミルにて24時間湿式混合することによってスラリ
ーを作製した。このスラリーを用いてドクターブレード
法などのシート成形法によって厚み30〜40μmのグ
リーンシートを作製した。また、ニッケル粉末と有機ビ
ヒクルとからなる内部電極ペーストを準備した。このぺ
ーストをグリーンシート上にスクリーン印刷し、積層し
たのち熱圧着して積層体を作製した。得られた積層体を
適当な大きさに切断し、300℃で2時間空気雰囲気中
に維持してバインダを除去した後、N2 /H2 /H2
雰囲気中で表3〜4に示す各焼成温度で2時間焼成し
た。焼成されたチップの端面に銀とパラジウムの合金の
粉末からなるペーストを塗布し、700℃〜900℃で
焼き付けることによって端面電極を成形し、積層セラミ
ックコンデンサを得た。上記セラミックコンデンサにつ
いて、誘電率ε,tanδ,誘電率の温度変化率TC、
絶縁抵抗IR及び静電容量のエージング率を測定した。
測定条件は以下の通りである。 誘電率ε … 25℃、交流1kHz,1.0Vr m s
にて行った。 tanδ … 25℃、交流1kHz,1.0Vr m s
にて行った。 誘電率の温度変化率TC …−55℃〜+125℃の範
囲で測定。交流1kHz,1.0Vr m s にて行った。 絶縁抵抗IR … 50Vの電圧を印加し、2分経過し
た後の値、またCR積は、そのIRと静電容量とを掛け
合わせた値である。 静電容量のエージング率 … 150℃,1時間の熱も
どし後、24時間と240時間後の静電容量の変化率 測定結果を、表5,6に示す。またCR積についても表
5,6に併せて示す。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described in detail based on embodiments. First, the starting materials shown in Tables 1 to 4 were weighed so as to have the ratios in the table, and an organic binder was further added thereto and wet-mixed in a ball mill for 24 hours to prepare a slurry. Using this slurry, a green sheet having a thickness of 30 to 40 μm was prepared by a sheet forming method such as a doctor blade method. Further, an internal electrode paste composed of nickel powder and an organic vehicle was prepared. The paste was screen-printed on a green sheet, laminated, and then thermocompression bonded to produce a laminate. The obtained laminate was cut into a suitable size, and kept in an air atmosphere at 300 ° C. for 2 hours to remove the binder, and then N 2 / H 2 / H 2 O
It baked for 2 hours at each calcination temperature shown in Tables 3-4 in an atmosphere. A paste made of an alloy powder of silver and palladium was applied to the end face of the fired chip, and baked at 700 ° C. to 900 ° C. to form an end face electrode, thereby obtaining a multilayer ceramic capacitor. For the above ceramic capacitor, the permittivity ε, tan δ, the temperature change rate TC of the permittivity,
The insulation resistance IR and the aging rate of the capacitance were measured.
The measurement conditions are as follows. Dielectric constant ε: 25 ° C, AC 1 kHz, 1.0 V rms
I went in. tan δ: 25 ° C, AC 1 kHz, 1.0 V rms
I went in. Temperature change rate TC of dielectric constant: measured in a range of -55 ° C to + 125 ° C. The test was performed at an alternating current of 1 kHz and 1.0 V rms . Insulation resistance IR: A value obtained by applying a voltage of 50 V and elapse of 2 minutes, and the CR product is a value obtained by multiplying the IR by the capacitance. Aging rate of capacitance: Change rate of capacitance after heating at 150 ° C. for 1 hour, and after 24 hours and 240 hours. Tables 5 and 6 show measurement results. Tables 5 and 6 also show the CR product.

【0007】[0007]

【表1】 [Table 1]

【0008】[0008]

【表2】 [Table 2]

【0009】[0009]

【表3】 [Table 3]

【0010】[0010]

【表4】 [Table 4]

【0011】但し、表3及び表4における添加剤の組成
A及びBは、以下の通りである。 組成A:SiO2 …50重量部,Li2 O…20重量
部,BaO…10重量部,CaO…10重量部,SrO
…10重量部。 組成B:B2 3 …20重量部,BaO…40重量部,
SiO2 …30重量部,Li2 O…10重量部。
However, the compositions A and B of the additives in Tables 3 and 4 are as follows. Composition A: 50 parts by weight of SiO 2, 20 parts by weight of Li 2 O, 10 parts by weight of BaO, 10 parts by weight of CaO, SrO
... 10 parts by weight. Composition B: B 2 O 3 20 parts by weight, BaO 40 parts by weight,
SiO 2 ... 30 parts by weight, Li 2 O ... 10 parts by weight.

【0012】[0012]

【表5】 [Table 5]

【0013】[0013]

【表6】 [Table 6]

【0014】表5,6から明らかなように、CaTiO
3 の配合比を増量する(試料番号8〜11)と、エージ
ング率が小さくなる。また、試料番号11の焼結体では
主成分中の配合比が本発明の範囲外であるため、誘電率
の温度変化率が大きい。試料番号1の焼結体では、Ba
ZrO3 及びSrZrO3 がともに添加されてないため
エージング率が大きくなっている。また、試料番号5〜
7は、BaZrO3 及びSrZrO3 の配合比が範囲外
であるため、誘電率の温度変化率が大きくなったり、S
rZrO3 の添加量が多い試料番号7ではCR積が90
0と小さくなっている。また、試料番号12の焼結体で
は添加剤が添加されてないため、1300℃でも焼結が
不十分であり上記各測定を行い得なかった。試料番号1
4の焼結体では、添加剤の含有量が6.0重量%と高い
ため誘電率が2200と低い。試料番号18,19の焼
結体では、主成分中のMgOの配合比が本発明の範囲外
であるため、CR積が1000以下と低い。試料番号2
0の焼結体では、MnOが含有されてないため−55℃
における誘電率の温度変化率が−19.5%と大きいこ
とが分かる。また、試料番号22の焼結体ではMnOの
配合比が2.5モル%と高く、そのためCR積が700
と低下している。
As is apparent from Tables 5 and 6, CaTiO
When the compounding ratio of 3 is increased (sample numbers 8 to 11), the aging rate decreases. Further, in the sintered body of sample No. 11, the mixing ratio of the main component is out of the range of the present invention, so that the temperature change rate of the dielectric constant is large. In the sintered body of sample No. 1, Ba
Since both ZrO 3 and SrZrO 3 are not added, the aging rate is large. Sample No. 5
In No. 7, since the mixing ratio of BaZrO 3 and SrZrO 3 is out of the range, the temperature change rate of the dielectric constant becomes large,
In sample No. 7 in which the amount of added rZrO 3 was large, the CR product was 90.
It is as small as 0. In addition, since no additive was added to the sintered body of Sample No. 12, sintering was insufficient even at 1300 ° C., and the above measurements could not be performed. Sample number 1
The sintered body of No. 4 has a low dielectric constant of 2200 because the content of the additive is as high as 6.0% by weight. In the sintered bodies of Sample Nos. 18 and 19, the CR product was as low as 1000 or less because the mixing ratio of MgO in the main component was out of the range of the present invention. Sample number 2
No. 0-55 ° C.
It can be seen that the temperature change rate of the dielectric constant at -19.5% is as large as -19.5%. Further, in the sintered body of sample No. 22, the compounding ratio of MnO was as high as 2.5 mol%, so that the CR product was 700%.
And has declined.

【0015】試料番号23の焼結体では、希土類酸化物
が含まれていないため誘電率の温度変化率が、+125
℃で−16.0%とかなり大きかった。また、試料番号
25の焼結体は、希土類酸化物の主成分中の配合比が
2.5モル%と高く1300℃でも焼結しなかった。試
料番号26,27の焼結体では、希土類酸化物が範囲外
であるため、いずれも誘電率の温度変化率が大きい。こ
れらに対して、本発明の範囲内に入る残りの試料番号の
焼結体はいずれも誘電率が比較的高く、tanδも1.
8%以下と低く、絶縁抵抗を示すCR積も2000以上
と高く、かつ−55℃〜+125℃の温度範囲で誘電率
の温度変化率も±15%未満でありエージング率も−
2.0%/decade未満となっていることが分か
る。すなわち、本発明の範囲内の焼結体では、優れた誘
電特性を示している。上記組成のうちMgOやMnO等
の酸化物はこれに限るものでなく、例えばMgCO3
MnCO3 等の炭酸物等を使用しても差し支えない。
In the sintered body of sample No. 23, since the rare earth oxide is not contained, the temperature change rate of the dielectric constant is +125.
It was considerably large at -16.0% at ° C. In addition, the sintered body of Sample No. 25 was as high as 2.5 mol% in the main component of the rare earth oxide, and did not sinter even at 1300 ° C. In the sintered bodies of Sample Nos. 26 and 27, since the rare earth oxide is out of the range, the temperature change rate of the dielectric constant is large in each case. On the other hand, the sintered bodies of the remaining sample numbers falling within the scope of the present invention all have a relatively high dielectric constant and a tan δ of 1.
It is as low as 8% or less, the CR product indicating the insulation resistance is as high as 2000 or more, and the temperature change rate of the dielectric constant is less than ± 15% in the temperature range of -55 ° C. to + 125 ° C. and the aging rate is −.
It turns out that it is less than 2.0% / decade. That is, the sintered body within the scope of the present invention shows excellent dielectric properties. Of the above compositions, oxides such as MgO and MnO are not limited to these, and for example, MgCO 3 ,
Carbonate such as MnCO 3 may be used.

【0016】[0016]

【発明の効果】以上のように、本発明によれば、上記特
定の組成の主成分100重量部に対し、上記特定の添加
剤が0.1〜5.0重量部含有されているため、125
0〜1300℃の温度で焼成することができ、かつ十分
な誘電特性を示す誘電体磁器を提供することが可能とな
る。従って、本発明の誘電体磁器組成物を用いれば、N
iのような卑金属を内部電極材料として用いることがで
き、それによって安価な積層セラミック電子部品を提供
することが可能となる。
As described above, according to the present invention, the specific additive is contained in an amount of 0.1 to 5.0 parts by weight based on 100 parts by weight of the main component of the specific composition. 125
It is possible to provide a dielectric porcelain that can be fired at a temperature of 0 to 1300 ° C. and that has sufficient dielectric properties. Therefore, when the dielectric porcelain composition of the present invention is used, N
A base metal such as i can be used as an internal electrode material, which makes it possible to provide an inexpensive multilayer ceramic electronic component.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 内藤 康行 京都府長岡京市天神二丁目26番10号 株 式会社村田製作所内 (72)発明者 森本 正士 京都府長岡京市天神二丁目26番10号 株 式会社村田製作所内 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Yasuyuki Naito 2-26-10 Tenjin, Nagaokakyo-shi, Kyoto Co., Ltd. Inside Murata Manufacturing Co., Ltd. Murata Manufacturing Co., Ltd.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 組成式が、 (1−a−b−c−d−t)BaTiO3 +aCaTi
3 +b{(1−x)BaZrO3 +xSrZrO3
+cMgO+dMnO+tRe2 3 (式中、ReはY,Gd,Dy,Ho,ErまたはY
bの少なくとも1種を示す)で示される主成分100重
量部に対して、SiO2 ,Li2OまたはB2 3 の少
なくとも1種類からなる添加剤を0.1〜5.0重量部
含むことを特徴とする誘電体磁器組成物。
1. The composition formula is: (1-a-b-c-dt) BaTiO 3 + aCaTi
O 3 + b {(1-x) BaZrO 3 + xSrZrO 3 }
+ CMgO + dMnO + tRe 2 O 3 (Where Re is Y, Gd, Dy, Ho, Er or Y
b) and 0.1 to 5.0 parts by weight of an additive composed of at least one kind of SiO 2 , Li 2 O or B 2 O 3 with respect to 100 parts by weight of the main component represented by (b). A dielectric porcelain composition comprising:
JP3024552A 1991-02-19 1991-02-19 Dielectric porcelain composition Expired - Lifetime JP2605987B2 (en)

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Application Number Priority Date Filing Date Title
JP3024552A JP2605987B2 (en) 1991-02-19 1991-02-19 Dielectric porcelain composition

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JPH04264306A JPH04264306A (en) 1992-09-21
JP2605987B2 true JP2605987B2 (en) 1997-04-30

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3227859B2 (en) * 1993-01-08 2001-11-12 株式会社村田製作所 Non-reducing dielectric ceramic composition
JP4188488B2 (en) * 1999-03-30 2008-11-26 Tdk株式会社 Dielectric porcelain composition
JP2003048774A (en) * 2001-08-01 2003-02-21 Kyocera Corp Dielectric porcelain, method of producing the same, and multilayer-type electronic parts
JP5488118B2 (en) * 2010-03-30 2014-05-14 Tdk株式会社 Dielectric porcelain composition and electronic component
TWI634092B (en) * 2015-07-23 2018-09-01 菲洛公司 Cog dielectric composition for use with nickel electrodes and method of forming electronic components
CN112142465A (en) * 2020-09-25 2020-12-29 西华大学 Rare earth ion modified filter ceramic for 5G base station and preparation method thereof

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