JP2599531Y2 - Rock sample holder for polarizing microscope sample maker - Google Patents
Rock sample holder for polarizing microscope sample makerInfo
- Publication number
- JP2599531Y2 JP2599531Y2 JP1989036981U JP3698189U JP2599531Y2 JP 2599531 Y2 JP2599531 Y2 JP 2599531Y2 JP 1989036981 U JP1989036981 U JP 1989036981U JP 3698189 U JP3698189 U JP 3698189U JP 2599531 Y2 JP2599531 Y2 JP 2599531Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- holder
- rock
- polarizing microscope
- rock sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Sampling And Sample Adjustment (AREA)
Description
【考案の詳細な説明】 ［産業上の利用分野］ 本考案は、偏光顕微鏡試料作製機のための岩石試料の
基準面出しを容易にした岩石試料ホルダーに関するもの
である。DETAILED DESCRIPTION OF THE INVENTION [Industrial application field] The present invention relates to a rock sample holder that facilitates setting a reference surface of a rock sample for a polarizing microscope sample preparation machine.
［従来の技術］ 岩石試料を観察するための偏光顕微鏡の試料作製機で
は、非常に薄い岩石の薄片試料を研磨する必要があり、
この研磨のために、従来から基準面研磨治具が用いられ
ている。この研磨治具は、試料を金属プレート間に固定
するような構造になっており、研削を行う試料面に容易
に砥石の研削面に対して平行に装置することができない
という問題があった。[Prior art] In a sample machine of a polarizing microscope for observing a rock sample, it is necessary to polish a thin sample of a very thin rock.
Conventionally, a reference surface polishing jig has been used for this polishing. This polishing jig has a structure in which the sample is fixed between the metal plates, and there is a problem that the apparatus cannot be easily mounted on the surface of the sample to be ground in parallel with the grinding surface of the grindstone.
特に、岩石の研磨においては、野外においてハンマー
等を用いて採取した不定形の試料からダイヤモンドカッ
ターにより小ブロックを切り出すが、このとき、ダイヤ
モンドカッターによる切断での岩石試料の保持は、その
切断効率を考慮して保持治具を使用せず、手によって保
持するのが一般的である。そのため、観察しようとする
試料面だけは少なくとも平坦化されるが、全体の完全な
直方体状の岩石片試料とならず、その研磨には試料面を
所定の位置に保持できるようにした不定形試料の保持手
段が必要となる。また、小さな試料では直方体の６面全
てを切断するとができず、野外におけるハンマーによる
採集時の不規則面での試料保持が必要となる。In particular, in the polishing of rock, small blocks are cut out from an irregular-shaped sample taken with a hammer or the like in the field using a diamond cutter.At this time, holding the rock sample by cutting with a diamond cutter reduces the cutting efficiency. It is common to hold by hand without using a holding jig in consideration. For this reason, only the sample surface to be observed is at least flattened, but it is not a complete rectangular parallelepiped rock piece sample, and an irregular sample in which the sample surface can be held at a predetermined position for polishing. Holding means is required. In addition, with a small sample, it is not possible to cut all six surfaces of the rectangular parallelepiped, and it is necessary to hold the sample on an irregular surface when collecting with a hammer in the field.
そして、上記試料の研削による基準面出しには、通常
2000番のダイヤモンド砥石が用いられ、この砥石による
切り込み量は１回に10〜20μｍと非常に小さいものであ
る。したがって、試料面が研削面から少しでも傾いてい
ると、基準面出し以前に平行面を出す必要が生じ、その
研削には長時間を必要とする。すなわち、試料面と研削
面が平行でないと、研削量が著しく増大するために、効
率的に試料を作成することができない。Then, to set the reference surface by grinding the sample,
No. 2000 diamond grindstone is used, and the cut amount by this grindstone is very small, 10 to 20 μm at a time. Therefore, if the sample surface is slightly inclined from the ground surface, a parallel surface must be formed before the reference surface is formed, and the grinding requires a long time. That is, if the sample surface is not parallel to the ground surface, the amount of grinding is significantly increased, so that the sample cannot be efficiently prepared.
［考案が解決しようとする課題］ 本考案の技術的課題は、偏光顕微鏡試料作製機で岩石
試料の基準面出しを行う時、その試料が不定形であって
も、試料面を研削面に対して簡単且つ容易に平行にセッ
ト可能とし、それにより研削量を最少にして、効率の良
い作業を実施できるようにすることにある。[Problem to be solved by the present invention] The technical problem of the present invention is that when the reference surface of a rock sample is set by a polarizing microscope sample preparation machine, even if the sample is indefinite, the sample surface is set to a ground surface. It is possible to simply and easily set them in parallel, thereby minimizing the amount of grinding and performing efficient work.
［課題を解決するための手段］ 上記課題を解決するための本考案の偏光顕微鏡試料作
製機用岩石試料試料ホルダーは、ホルダー本体上の中央
の凹部に岩石試料を保持する試料台を配設して、この試
料台をホルダー本体の下方に螺挿した昇降ねじにより昇
降可能に支持させると共に、その試料台を上記昇降ねじ
の先端に傾動自在に取付け、上記試料台の周囲において
ホルダー本体にその岩石試料を固定的に保持する多数の
固定ねじを設け、上記ホルダー本体と別体で、このホル
ダー本体の周囲上面に当接するホルダー当接面を備えた
基準面合せ板に、その当接時に試料表面を密接させる基
準面を設けたことを特徴とするものである。[Means for Solving the Problems] A rock sample holder for a polarizing microscope sample maker according to the present invention for solving the above problems is provided with a sample stage for holding a rock sample in a central recess on a holder body. The sample stage is supported so as to be able to move up and down by an elevating screw screwed below the holder body, and the sample stage is tiltably attached to the tip of the elevating screw, and the rock is attached to the holder body around the sample stage. A large number of fixing screws for holding the sample in a fixed manner are provided, and the surface of the sample is brought into contact with a reference surface matching plate provided separately from the holder main body and having a holder abutting surface that abuts on the upper peripheral surface of the holder main body. Is provided with a reference surface for bringing the into close contact with each other.
［作用］ 試料ホルダーに岩石試料を取付けるに際しては、試料
台上に採取切断した岩石試料を適宜固定し、その状態で
基準面合せ板のホルダー当接面をホルダー本体の表面に
当接し、試料台の試料を昇降ねじによってその基準面合
せ板における基準面に押し当てる。試料台は、昇降ねじ
の先端に傾動自在に取付けられているので、試料の表面
が基準面合せ板の基準面に沿うように密接し、それによ
って研削面に平行にセットされる。従って、この状態
で、岩石試料を周囲から多数の固定ねじにより強固に固
定すると、岩石試料が不定形であっても、試料の表面が
研削面に平行になった状態に保持される。[Operation] When mounting a rock sample on the sample holder, the rock sample that has been sampled and cut is appropriately fixed on the sample table, and in this state, the holder contact surface of the reference surface mating plate is brought into contact with the surface of the holder body. Is pressed against the reference surface of the reference surface mating plate by the lifting screw. Since the sample stage is tiltably attached to the tip of the elevating screw, the surface of the sample comes into close contact with the reference surface of the reference surface matching plate, and is thereby set parallel to the ground surface. Therefore, in this state, if the rock sample is firmly fixed from the periphery by a large number of fixing screws, the surface of the sample is kept parallel to the ground surface even if the rock sample is irregular.
［実施例］ 本考案の偏光顕微鏡試料作製機用岩石試料ホルダーの
実施例を、図面に基づいて以下に説明する。[Example] An example of a rock sample holder for a polarizing microscope sample maker of the present invention will be described below with reference to the drawings.
第１図及び第２図において、ホルダー本体１は、マグ
ネットチャックにより偏光顕微鏡試料作製機に装着され
るもので、このホルダー本体１の中央には、試料台２を
収容するための凹部４を設けている。試料台２は、その
表面に岩石試料３を保持させるためのもので、ホルダー
本体１の凹部４内底に螺挿された昇降ねじ６により昇降
可能に支持され、また、試料台２は昇降ねじ６の先端に
自在継手７を介して保持され、それによって昇降ねじ６
に対して傾動自在に取付けられている。上記昇降ねじ６
は、ホルダー本体１′を試料作製機に装着する場合等の
障害にならないように、その底部側に設けた凹部５内に
おいて回転可能にしたものである。1 and 2, a holder main body 1 is mounted on a polarizing microscope sample preparation machine by a magnet chuck, and a concave portion 4 for accommodating a sample table 2 is provided at the center of the holder main body 1. ing. The sample table 2 is for holding a rock sample 3 on the surface thereof, and is supported by a lifting screw 6 screwed into the inner bottom of the concave portion 4 of the holder main body 1 so as to be able to move up and down. 6 is held at the tip of a universal joint 7 by a lifting joint 6
It is mounted so that it can tilt with respect to. The lifting screw 6
Is designed to be rotatable in a recess 5 provided on the bottom side of the holder main body 1 'so as not to be an obstacle when the holder main body 1' is mounted on the sample preparing machine.
上記試料台２を収容する凹部４の周囲において、ホル
ダー本体１の外側面には、岩石試料３の周面を押圧して
その試料３を固定的に保持するための多数の固定ねじ8,
8……を螺挿している。これらの固定ねじ８は、所定の
位置に保持された岩石試料３の周面を多数の方向から押
圧することにより、その岩石試料３が不定形であっても
それを所要の位置に安定的に保持できるものである。On the outer surface of the holder body 1 around the concave portion 4 accommodating the sample table 2, a number of fixing screws 8, which press the peripheral surface of the rock sample 3 to hold the sample 3 fixedly,
8 ... is screwed. These fixing screws 8 press the peripheral surface of the rock sample 3 held at a predetermined position from a number of directions so that the rock sample 3 can be stably moved to a required position even if the rock sample 3 is irregular. It can be held.
第３図に示す透明アクリル樹脂製の基準面合せ板10
は、中央に試料３を当接する基準面11を設けると共に、
その周囲にホルダー当接面12を設けたもので、第２図に
鎖線で示すように、そのホルダー当接面12をホルダー本
体１の表面に当接した状態で、ホルダー本体１の試料台
２にのせた試料３を昇降ねじ６によって基準面11に押し
当て、それによって試料３の表面が研削面に平行になる
ようにセットするのに用いるものである。A reference plate 10 made of transparent acrylic resin shown in FIG.
Is provided with a reference surface 11 in contact with the sample 3 in the center,
A holder abutment surface 12 is provided around the periphery of the sample table, as shown by a chain line in FIG. 2, with the holder abutment surface 12 abutting on the surface of the holder body 1. The sample 3 placed on the sample 3 is pressed against the reference surface 11 by the lifting screw 6, thereby setting the surface of the sample 3 so as to be parallel to the ground surface.
上記構成を有する偏光顕微鏡試料作製機用岩石試料ホ
ルダーに岩石試料３を取付ける際しては、試料台２上に
試料３をのせ、その状態で基準面合せ板10のホルダー当
接面12をホルダー本体１の表面に当接し、試料台２上の
試料３を昇降ねじ６によって基準面11に押し当てる。こ
の場合に、試料台２は昇降ねじ６の先端に自在継手７に
より取付けているので、試料３の表面が基準面合せ板10
の基準面11に沿うように密接し、それによって研削面に
平行にセットされる。なお、この密接状態は透明な基準
面合せ板10を通して確認できる。When mounting the rock sample 3 on the rock sample holder for the polarizing microscope sample preparation machine having the above-described configuration, the sample 3 is placed on the sample table 2 and the holder contact surface 12 of the reference surface matching plate 10 is held in that state. The sample 3 on the sample stage 2 is pressed against the reference surface 11 by the lifting screw 6 while being in contact with the surface of the main body 1. In this case, since the sample stage 2 is attached to the tip of the lifting screw 6 by the universal joint 7, the surface of the sample 3
Are set closely along the reference plane 11 of the base plate, thereby being set parallel to the ground plane. This close state can be confirmed through the transparent reference surface matching plate 10.
この状態で、岩石試料３を周囲からの固定ねじ８によ
り基準面合せ板を通して目視しながら強固に固定する
と、試料３の表面が研削面に平行になった状態で固定さ
れるので、基準面合せ板を取り外し、偏光顕微鏡試料作
製機にセットして試料３を研磨すればよい。In this state, when the rock sample 3 is firmly fixed with the fixing screw 8 from the periphery through the reference surface aligning plate and firmly fixed, the surface of the sample 3 is fixed in a state parallel to the ground surface. The plate may be removed and the sample 3 may be polished by setting it on a polarizing microscope sample preparing machine.
偏光顕微鏡試料作製機では、先に説明したように、研
磨する試料表面が傾斜した状態で取付けられると、基準
面出し以前に平行面を出す必要が生じ、その研削には長
時間を必要とするが、上述したようにして試料表面を研
削面に平行に取付けると、効率的に試料を作成すること
ができる。With a polarizing microscope sample preparation machine, as described above, if the sample surface to be polished is mounted in an inclined state, it is necessary to project a parallel surface before setting the reference surface, and the grinding requires a long time However, when the sample surface is attached parallel to the ground surface as described above, the sample can be efficiently prepared.
［考案の効果］ 以上に詳述した本考案の偏光顕微鏡試料作製機用岩石
試料ホルダーによれば、偏光顕微鏡試料作製機で岩石試
料の基準面出しを行う時、その岩石試料が不定形であっ
ても、試料面を研削面に対して簡単且つ容易に平行にセ
ットすることができ、それにより研削量を最少にして、
効率の良い作業を実施することができる。[Effects of the Invention] According to the rock sample holder for the polarizing microscope sample maker of the present invention described in detail above, when the rock sample is set to the reference plane by the polarizing microscope sample maker, the rock sample is irregular. However, the sample surface can be easily and easily set parallel to the ground surface, thereby minimizing the amount of grinding,
Efficient work can be performed.
【図面の簡単な説明】 第１図は本考案の偏光顕微鏡試料作製機用岩石試料ホル
ダーの実施例を示す平面図、第２図は第１図の中央縦断
側面図、第３図は基準面合せ板の斜視図である。 １……ホルダー本体、２……試料台、３……岩石試料、
４……凹部、６……昇降ねじ、８……固定ねじ、10……
基準面合せ板、11……基準面、12……ホルダー当接面。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a plan view showing an embodiment of a rock sample holder for a polarizing microscope sample maker according to the present invention, FIG. 2 is a central longitudinal sectional side view of FIG. 1, and FIG. It is a perspective view of a joining plate. 1 ... Holder body, 2 ... Sample table, 3 ... Rock sample,
4 ... recess, 6 ... lifting screw, 8 ... fixing screw, 10 ...
Reference surface mating plate, 11 ... Reference surface, 12 ... Holder contact surface.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭63−312060（ＪＰ，Ａ) 特開 昭62−142254（ＪＰ，Ａ) 実開 昭62−201656（ＪＰ，Ｕ) 実開 昭58−196056（ＪＰ，Ｕ) 実開 昭63−147258（ＪＰ，Ｕ) 実開 昭62−198054（ＪＰ，Ｕ) 特公 昭60−51992（ＪＰ，Ｂ２) ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-63-312060 (JP, A) JP-A-62-142254 (JP, A) Fully open 1987-201656 (JP, U) Really open 1983 196056 (JP, U) JP-A 63-147258 (JP, U) JP-A 62-198054 (JP, U) JP-B 60-51992 (JP, B2)
Claims (1)
石試料を対象とする試料ホルダーであって、 ホルダー本体上の中央の凹部に岩石試料を保持する試料
台を配設して、この試料台をホルダー本体の下方に螺挿
した昇降ねじにより昇降可能に支持させると共に、その
試料台を上記昇降ねじの先端に傾動自在に取付け、 上記試料台の周囲においてホルダー本体にその岩石試料
を固定的に保持する多数の固定ねじを設け、 上記ホルダー本体と別体で、このホルダー本体の周囲上
面に当接するホルダー当接面を備えた基準面合せ板に、
その当接時に試料表面を密接させる基準面を設けた、 ことを特徴とする偏光顕微鏡試料作製機用岩石試料ホル
ダー。1. A sample holder for a rock sample to be mounted on a polarizing microscope sample preparation machine, wherein a sample table for holding a rock sample is disposed in a central concave portion on a holder body, and the sample table is provided. The table is supported so as to be able to ascend and descend by an elevating screw screwed under the holder body, and the sample table is tiltably attached to the tip of the elevating screw, and the rock sample is fixed to the holder body around the sample table. A large number of fixing screws are provided for the reference surface mating plate having a holder abutting surface that abuts on the upper peripheral surface of the holder body separately from the holder body,
A rock sample holder for a polarizing microscope sample preparation machine, wherein a reference surface is provided for bringing the sample surface into close contact with the sample when the contact is made.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989036981U JP2599531Y2 (en) | 1989-03-30 | 1989-03-30 | Rock sample holder for polarizing microscope sample maker |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989036981U JP2599531Y2 (en) | 1989-03-30 | 1989-03-30 | Rock sample holder for polarizing microscope sample maker |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02128940U JPH02128940U (en) | 1990-10-24 |
| JP2599531Y2 true JP2599531Y2 (en) | 1999-09-13 |
Family
ID=31543689
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989036981U Expired - Lifetime JP2599531Y2 (en) | 1989-03-30 | 1989-03-30 | Rock sample holder for polarizing microscope sample maker |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2599531Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101349177B1 (en) * | 2011-12-13 | 2014-01-08 | 한국기계연구원 | A height adjustable sample holder |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102177152B1 (en) * | 2020-07-30 | 2020-11-10 | 한국세라믹기술원 | General purpose construction material photocatalyst performance evaluation device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58196056U (en) * | 1982-06-23 | 1983-12-27 | 富士通株式会社 | Angle polishing jig |
| JPS62201656U (en) * | 1986-06-12 | 1987-12-22 | ||
| JPH0825140B2 (en) * | 1987-06-12 | 1996-03-13 | シャープ株式会社 | Polishing equipment |
-
1989
- 1989-03-30 JP JP1989036981U patent/JP2599531Y2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101349177B1 (en) * | 2011-12-13 | 2014-01-08 | 한국기계연구원 | A height adjustable sample holder |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02128940U (en) | 1990-10-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |