JP2584985B2 - Semiconductor porcelain composition - Google Patents
Semiconductor porcelain compositionInfo
- Publication number
- JP2584985B2 JP2584985B2 JP62040429A JP4042987A JP2584985B2 JP 2584985 B2 JP2584985 B2 JP 2584985B2 JP 62040429 A JP62040429 A JP 62040429A JP 4042987 A JP4042987 A JP 4042987A JP 2584985 B2 JP2584985 B2 JP 2584985B2
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- ceo
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Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は電子機械や機器中の受動電子部品として半導
体磁器コンデンサ、特に還元再酸化形半導体磁器コンデ
ンサに敵した磁器組成物に関する。Description: TECHNICAL FIELD The present invention relates to a porcelain composition suitable for a semiconductor porcelain capacitor as a passive electronic component in an electronic machine or a device, particularly a reduced reoxidation type semiconductor porcelain capacitor.
受動電子部品としての半導体磁器コンデンサは粒界層
形として粒界絶縁形があり、表面層形として堰層容量形
と還元再酸化形に大別される。Semiconductor ceramic capacitors as passive electronic components include a grain boundary insulating type as a grain boundary layer type, and are roughly classified into a surface layer type into a weir layer capacity type and a reduction / reoxidation type.
そして、一般に粒界絶縁形は堰層容量形に比べて容量
が小さく、還元再酸化形に比べて耐電圧が小さい。堰層
容量形は周波数特性が悪く、誘電体損失tanδが大きく
耐電圧が小さい。還元再酸化形は単位面積当りの容量
(μF/cm2)を大きくしようとすれば破壊電圧値が小さ
くなり、誘電体損失が大きくなるか、または容量の温度
特性が大きくなるという問題点が夫々あった。In general, the grain boundary insulating type has a smaller capacity than the weir layer capacity type, and has a smaller withstand voltage than the reduced reoxidation type. The weir layer capacitance type has poor frequency characteristics, a large dielectric loss tan δ, and a small withstand voltage. The reduction-reoxidation type has a problem in that if the capacitance per unit area (μF / cm 2 ) is increased, the breakdown voltage value becomes smaller, the dielectric loss becomes larger, or the temperature characteristic of the capacitor becomes larger. there were.
本発明は還元再酸化形半導体磁器コンデンサにおい
て、前記の欠点を除去して単位面積当りの容量C μF/cm
2が大きく、耐電圧も高く、しかも温度特性が良好な半
導体磁器組成物を得ようとするものである。The present invention is directed to a reduction-re-oxidation type semiconductor ceramic capacitor which eliminates the above-mentioned disadvantages and has a capacitance per unit area C μF / cm.
The object of the present invention is to obtain a semiconductor ceramic composition having a large value of 2 , a high withstand voltage, and a good temperature characteristic.
前記の目的を達成するために本発明は半導体磁器組成
物として、BaTiO3を主成分とし、副成分としてニオブを
Nb2O5に換算して0.2〜3.0モル%,セリウムをCeO2に換
算して0.2〜3.0モル%含有した成分に対してコルトをCo
3O4に換算して0.8重量%以下、マンガンをMnCO3に換算
して0.25重量%以下、酸化シリコンSiO2を0.25重量%以
下、およびSrTiO3を0.5〜20.0重量%夫々添加したこと
を特徴とする(100-x-y)BaTiO3+x・Nb2O5+y・CeO2系
半導体磁器組成物を用いる。In order to achieve the above object, the present invention provides a semiconductor ceramic composition containing BaTiO 3 as a main component and niobium as a subcomponent.
Colt is added to components containing 0.2 to 3.0 mol% in terms of Nb 2 O 5 and 0.2 to 3.0 mol% in terms of CeO 2 in terms of CeO 2.
0.8% by weight or less in terms of 3 O 4 , manganese in terms of MnCO 3 is 0.25% by weight or less, silicon oxide SiO 2 is 0.25% by weight or less, and SrTiO 3 is 0.5 to 20.0% by weight. (100-xy) BaTiO 3 + xNb 2 O 5 + yCeO 2 based semiconductor ceramic composition is used.
ただし、x,yはそれぞれ 0.2≦x≦3.0,0.2≦y≦3.0mol%である。 Here, x and y are respectively 0.2 ≦ x ≦ 3.0 and 0.2 ≦ y ≦ 3.0 mol%.
また、本発明は上記組成物にさらに、イットリウムを
Y2O3に換算して0.1〜3.0重量%添加した半導体磁器組成
物を用いることができる。Further, the present invention further comprises yttrium in the above composition.
A semiconductor porcelain composition added with 0.1 to 3.0% by weight in terms of Y 2 O 3 can be used.
出発原料として工業用原料のBaCO3,TiO2,Nb2O5,CeO2,
Co3O4,MnCO3,SiO2,SrCO3,Y2O3を用い、第1表に示した
配合比になるように秤量し、これら原料配合物を合成樹
脂ボールミルで20時間湿式混合攪拌した後、脱水乾燥
し、1200℃で2時間仮焼成し、これを合成樹脂ボールミ
ルで20時間回転粉砕する。これを脱水乾燥して2重量%
の有機結合剤ポリビニルアルコール(PVA)を加え、造
粒整粒を行なって顆粒粉末としこの粉末を約3ton/cm2の
成形圧力で直径10mm,厚さ0.5mmの円板状成形物を作成す
る。この成形物を800℃で1時間脱バインダ処理を行な
い、その後1300℃で2時間本焼成する。これを還元雰囲
気(H2ガス雰囲気)中で800℃で約2時間還元して還元
形半導体磁器を作り、これを酸化性雰囲気中(大気中)
で800℃で2時間熱処理して半導体磁器表面のみを再酸
化し、その後この磁器素子の両面にAgペーストを印刷塗
布して800℃で焼付けて電極を形成して還元再酸化形半
導体磁器コンデンサを得た。BaCO 3 , TiO 2 , Nb 2 O 5 , CeO 2 ,
Using Co 3 O 4 , MnCO 3 , SiO 2 , SrCO 3 , and Y 2 O 3 , weigh them so as to have the compounding ratio shown in Table 1, and wet-mix and stir these raw materials for 20 hours with a synthetic resin ball mill. After that, it is dehydrated and dried, and temporarily calcined at 1200 ° C. for 2 hours, and this is rotationally pulverized with a synthetic resin ball mill for 20 hours. 2% by weight
The organic binder polyvinyl alcohol (PVA) is added and granulation and sizing is performed to obtain a granular powder, and a powder having a diameter of 10 mm and a thickness of 0.5 mm is formed from the powder at a molding pressure of about 3 ton / cm 2. . The molded article is subjected to a binder removal treatment at 800 ° C. for 1 hour, and thereafter, is calcined at 1300 ° C. for 2 hours. This is reduced in a reducing atmosphere (H 2 gas atmosphere) at 800 ° C. for about 2 hours to produce a reduced semiconductor porcelain, which is then placed in an oxidizing atmosphere (in air).
Heat treatment at 800 ° C for 2 hours to re-oxidize only the surface of the semiconductor porcelain, then print and apply Ag paste on both sides of this porcelain element and bake at 800 ° C to form electrodes to form a reduced reoxidized semiconductor porcelain capacitor Obtained.
このようにして得た試料について、それぞれ電気特性
を測定した結果を第1表に示す。Table 1 shows the results of measuring the electrical characteristics of the samples thus obtained.
ここで、容量Cおよび誘導体損失tanδは周波数1kHz,
1Vで測定した。絶縁抵抗IRは直流25Vを印加して室温20
℃で測定した。Here, the capacitance C and the dielectric loss tan δ are frequency 1 kHz,
Measured at 1V. Insulation resistance IR is 20 V at room temperature by applying DC 25 V
Measured in ° C.
第1表において、本発明に係るものは容量C,直流破壊
電圧Vb,絶縁抵抗IRが大きく、温度特性が良好な素子が
得られた。 In Table 1, the device according to the present invention has a large capacitance C, a high DC breakdown voltage Vb , and a large insulation resistance IR, and has an excellent temperature characteristic.
次に本発明における組成比の限定理由を述べると、 Nb2O5が0.2mol%未満であるか又は3.0mol%を超えた
場合は、単位面積当りの容量C(μF/cm2)が小さく、
誘電体損失tanδが大きい。またIR、Vbも低くなる(試
料No.1,2,3,17,18,19)。Next, the reasons for limiting the composition ratio in the present invention will be described. When Nb 2 O 5 is less than 0.2 mol% or more than 3.0 mol%, the capacity C per unit area (μF / cm 2 ) is small. ,
The dielectric loss tanδ is large. In addition, IR and Vb also become lower (Sample Nos. 1, 2, 3, 17, 18, and 19).
CeO2が0.2mol%未満ではCが小さく、かつtanδが大
きくなり、3.0mol%を超えると、tanδが大きい。また
温度特性T.C.がD特性規格から外れる(試料No.1,3,8,1
3,17,19)。If CeO 2 is less than 0.2 mol%, C is small and tan δ is large, and if it exceeds 3.0 mol%, tan δ is large. Also, the temperature characteristic TC deviates from the D characteristic standard (Sample Nos. 1, 3, 8, 1
3,17,19).
Co3O4が0.8wt%を超えるとCが小さくなる(試料No.2
4)。When Co 3 O 4 exceeds 0.8 wt%, C becomes smaller (Sample No. 2
Four).
MnCO3が0.25wt%を超えるとVbが低くなる(試料No.2
7)。When MnCO 3 exceeds 0.25 wt%, Vb decreases (Sample No. 2
7).
SiO2が0.25wt%を超えるとCが小さくIR、Vbが低くな
る(試料No.30)。When SiO 2 exceeds 0.25 wt%, C is small and IR and Vb are low (Sample No. 30).
SrTiO3が0.5wt%未満ではtanδが顕著に小さくならな
い。また、20.0wt%を超えるとT.C.が大きくD特性から
外れ、Vb,IRが小さくなる(試料No.31,36,38,39,40,43,
44,47,49)。If SrTiO 3 is less than 0.5% by weight, tan δ does not decrease significantly. On the other hand, when the content exceeds 20.0 wt%, TC largely deviates from the D characteristic, and V b and IR become small (samples No. 31, 36, 38, 39, 40, 43,
44,47,49).
Y2O3が0.1wt%未満ではVbが低く、3.0wt%を超えると
Cが低下する(試料No.37,48)。When Y 2 O 3 is less than 0.1% by weight, Vb is low, and when Y 2 O 3 is more than 3.0% by weight, C decreases (Sample Nos. 37 and 48).
本発明はBaTiO3+Nb2O5+CeO2系半導体磁器組成物に
おいて、BaTiO3を主成分とし、Nb2O5、CeO2、Co3O4、MnC
O3、SiO2及びSrTiO3を副成分として含有させることによ
り、これを還元再酸化形半導体磁器コンデンサに使用し
た場合容量Cが大きく、耐電圧も高く、しかも温度特性
が良好なものが得られたものである。これにさらにY2O3
を添加することによって、絶縁抵抗、直流破壊電圧が向
上し、温度特性も良好なものが得られ、従来の還元再酸
化形半導体磁器コンデンサの性能を向上させることがで
きたものである。The present invention relates to a BaTiO 3 + Nb 2 O 5 + CeO 2 based semiconductor porcelain composition comprising BaTiO 3 as a main component, Nb 2 O 5 , CeO 2 , Co 3 O 4 , MnC
By containing O 3 , SiO 2 and SrTiO 3 as sub-components, when this is used for a reduction-re-oxidation type semiconductor ceramic capacitor, a capacitor having a large capacity, a high withstand voltage, and a good temperature characteristic can be obtained. It is a thing. In addition, Y 2 O 3
By adding, the insulation resistance and the DC breakdown voltage are improved, and a good temperature characteristic is obtained, so that the performance of the conventional reduced re-oxidation type semiconductor ceramic capacitor can be improved.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 菊地 信明 東京都中央区日本橋1丁目13番1号 テ ィーディーケイ株式会社内 (56)参考文献 特開 昭61−193419(JP,A) 特開 昭51−10814(JP,A) 特開 昭52−92399(JP,A) ────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Nobuaki Kikuchi 1-1-13 Nihonbashi, Chuo-ku, Tokyo Inside TDK Corporation (56) References JP-A-61-193419 (JP, A) JP-A-51 -10814 (JP, A) JP-A-52-92399 (JP, A)
Claims (4)
をNb2O5に換算して0.2〜3.0モル%,セリウムをCeO2に
換算して0.2〜3.0モル%含有した成分に対してコバルト
をCo3O4に換算して0.8重量%以下、マンガンをMnCO3に
換算して0.25重量%以下、酸化シリコンSiO2を0.25重量
%以下、およびSrTiO3を0.5〜20.0重量%夫々添加した
ことを特徴とする(100-x-y)BaTiO3+x・Nb2O5+y・Ce
O2系半導体磁器組成物。 ただし、x,yはそれぞれ 0.2≦x≦3.0,0.2≦y≦3.0モル%である。1. A component containing BaTiO 3 as a main component, niobium as a sub component in an amount of 0.2 to 3.0 mol% in terms of Nb 2 O 5 , and cerium in an amount of 0.2 to 3.0 mol% in terms of CeO 2 . 0.8% by weight or less of cobalt in terms of Co 3 O 4 , 0.25% by weight or less of manganese in terms of MnCO 3 , 0.25% by weight or less of silicon oxide SiO 2 , and 0.5 to 20.0% by weight of SrTiO 3 (100-xy) BaTiO 3 + x · Nb 2 O 5 + y · Ce
O 2 based semiconductor porcelain composition. However, x and y are respectively 0.2 ≦ x ≦ 3.0 and 0.2 ≦ y ≦ 3.0 mol%.
る半導体磁器の表面層が絶縁化していることを特徴とす
る特許請求の範囲第1項記載の(100-x-y)BaTiO3+x・N
b2O5+y・CeO2系半導体磁器組成物。2. The (100-xy) BaTiO 3 + x according to claim 1, wherein the surface layer of the semiconductor porcelain obtained by molding and sintering the composition comprising said components is insulated.・ N
b 2 O 5 + y · CeO 2 based semiconductor ceramic composition.
をNb2O5に換算して0.2〜3.0モル%,セリウムをCeO2に
換算して0.2〜3.0モル%含有した成分に対してコバルト
をCo3O4に換算して0.8重量%以下、マンガンをMnCO3に
換算して0.25重量%以下、酸化シリコンSiO2を0.25重量
%以下、SrTiO3を0.5〜20.0重量%、及びイットリウム
をY2O3に換算して0.1〜3.0重量%夫々添加したことを特
徴とする(100-x-y)BaTiO3+x・Nb2O5+y・CeO2系半導
体磁器組成物。 ただし、x,yはそれぞれ 0.2≦x≦3.0,0.2≦y≦3.0モル%である。 3. A composition containing BaTiO 3 as a main component, niobium as an auxiliary component in an amount of 0.2 to 3.0 mol% in terms of Nb 2 O 5 , and cerium in an amount of 0.2 to 3.0 mol% in terms of CeO 2 . Cobalt is converted to Co 3 O 4 at 0.8% by weight or less, manganese is converted to MnCO 3 at 0.25% by weight or less, silicon oxide SiO 2 is 0.25% by weight or less, SrTiO 3 is 0.5 to 20.0% by weight, and yttrium is Y 2 O 3 in terms of and wherein 0.1 to 3.0 that have wt% respectively added (100-xy) BaTiO 3 + x · Nb 2 O 5 + y · CeO 2 based semiconductor ceramic composition. However, x and y are respectively 0.2 ≦ x ≦ 3.0 and 0.2 ≦ y ≦ 3.0 mol%.
る半導体磁器の表面層が絶縁化していることを特徴とす
る特許請求の範囲第3項記載の(100-x-y)BaTiO3+x・N
b2O5+y・CeO2系半導体磁器組成物。4. The (100-xy) BaTiO 3 + x according to claim 3, wherein the surface layer of the semiconductor porcelain obtained by molding and sintering the composition comprising the components is insulated.・ N
b 2 O 5 + y · CeO 2 based semiconductor ceramic composition.
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62040429A JP2584985B2 (en) | 1987-02-25 | 1987-02-25 | Semiconductor porcelain composition |
DE8787111158T DE3775855D1 (en) | 1986-08-11 | 1987-08-01 | CERAMIC SEMICONDUCTOR COMPOSITION. |
EP87111158A EP0256405B1 (en) | 1986-08-11 | 1987-08-01 | Semiconductive ceramic composition |
US07/082,688 US4861736A (en) | 1986-08-11 | 1987-08-04 | Semiconductive ceramic composition |
KR1019870008754A KR940001654B1 (en) | 1986-08-11 | 1987-08-10 | Semiconductive ceramic composition |
CN87105843A CN1009873B (en) | 1986-08-11 | 1987-08-11 | Semiconductive ceramic composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62040429A JP2584985B2 (en) | 1987-02-25 | 1987-02-25 | Semiconductor porcelain composition |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63211510A JPS63211510A (en) | 1988-09-02 |
JP2584985B2 true JP2584985B2 (en) | 1997-02-26 |
Family
ID=12580401
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62040429A Expired - Lifetime JP2584985B2 (en) | 1986-08-11 | 1987-02-25 | Semiconductor porcelain composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2584985B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108558391A (en) * | 2018-06-26 | 2018-09-21 | 桂林电子科技大学 | A kind of leadless piezoelectric ceramics and preparation method thereof with huge piezoelectric response |
-
1987
- 1987-02-25 JP JP62040429A patent/JP2584985B2/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108558391A (en) * | 2018-06-26 | 2018-09-21 | 桂林电子科技大学 | A kind of leadless piezoelectric ceramics and preparation method thereof with huge piezoelectric response |
Also Published As
Publication number | Publication date |
---|---|
JPS63211510A (en) | 1988-09-02 |
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