JP2577926Y2 - Fluorescence measurement device - Google Patents
Fluorescence measurement deviceInfo
- Publication number
- JP2577926Y2 JP2577926Y2 JP1992056026U JP5602692U JP2577926Y2 JP 2577926 Y2 JP2577926 Y2 JP 2577926Y2 JP 1992056026 U JP1992056026 U JP 1992056026U JP 5602692 U JP5602692 U JP 5602692U JP 2577926 Y2 JP2577926 Y2 JP 2577926Y2
- Authority
- JP
- Japan
- Prior art keywords
- focal point
- mirror
- excitation light
- sample
- fluorescence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
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- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
【０００１】[0001]
【産業上の利用分野】本考案は、バイオテクノロジー産
業や半導体産業における蛍光分析を行う装置に関し、特
に回転楕円鏡で蛍光を集光する蛍光測定装置に関するも
のである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for performing fluorescence analysis in the biotechnology industry and the semiconductor industry, and more particularly to a fluorescence measurement apparatus for collecting fluorescence using a spheroid mirror.
【０００２】[0002]
【従来の技術】蛍光とは、或る物質に特定の波長の光を
あてると、それより長波長の光（蛍光）が、その物質か
ら発光される現象であり、この蛍光度を測定すること
は、吸光度を測定する装置に比較して、原理的に高感度
であり、近年、バイオテクノロジーでは、そのニーズが
高まっている。2. Description of the Related Art Fluorescence is a phenomenon in which, when light of a specific wavelength is applied to a certain substance, light (fluorescence) having a longer wavelength than that is emitted from the substance. Has a higher sensitivity in principle than a device for measuring absorbance, and in biotechnology in recent years, its needs are increasing.
【０００３】このような蛍光測定装置において、回転楕
円鏡を用いて、蛍光を効率良く集光するためには、図３
に示すように、回転楕円鏡１の第１焦点１ａに試料２
を、また、第２焦点１ｂに検出器３を設置して、試料２
から発光する蛍光を必ず検出器３に導く必要がある。ま
た、励起光を効率良く試料２に照射するためには、回転
楕円鏡１の一部に穴をあけて励起光を照射させたり、励
起光源にレーザを用いたり、回転楕円鏡を大きくして、
そのスペースに光学系を設置するなどの対策が取られて
いた。In such a fluorescence measuring apparatus, in order to efficiently collect fluorescence using a spheroidal mirror, FIG.
As shown in the figure, the sample 2 is placed at the first focal point 1a of the spheroidal mirror 1.
The detector 3 is set at the second focal point 1b, and the sample 2
It is necessary to guide the fluorescence emitted from the detector 3 to the detector 3 without fail. Further, in order to efficiently irradiate the sample 2 with the excitation light, a part of the spheroidal mirror 1 is pierced to irradiate the excitation light, a laser is used as an excitation light source, or the spheroidal mirror is enlarged. ,
Measures such as installing an optical system in the space were taken.
【０００４】しかしながら、励起光を効率良く試料に照
射させるため、励起光源にレーザを用いる場合について
は、励起波長にあったレーザがなく、高価な装置とな
る。また、回転楕円鏡を大きくして、そのスペースに光
学系を設置する場合については、蛍光の集光効率が悪く
なり、装置を小型化できないといった問題点があった。However, in order to efficiently irradiate the sample with the excitation light, when a laser is used as the excitation light source, there is no laser corresponding to the excitation wavelength, and the apparatus becomes expensive. Further, in the case where the spheroidal mirror is enlarged and an optical system is installed in the space, there has been a problem that the efficiency of condensing the fluorescent light deteriorates and the device cannot be miniaturized.
【０００５】[0005]
【考案が解決しようとする課題】本考案は、上記従来技
術の課題を踏まえて成されたものであり、回転楕円鏡の
第２焦点と励起光源が鏡像関係となる位置に平面鏡を設
置することにより、あたかも第２焦点に設置した検出器
から励起光が照射されたようにして、試料に励起光を効
率良く照射できると共に、回転楕円鏡と多層膜干渉フィ
ルタを組み合わせた測定セルで試料を囲むことにより、
励起効率が高く、迷光の少ない、小型で安価な蛍光測定
装置を提供することを目的としたものである。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems of the prior art, and is to provide a plane mirror at a position where the second focal point of the spheroidal mirror and the excitation light source have a mirror image relationship. As a result, the sample can be efficiently irradiated with the excitation light as if the excitation light was emitted from the detector installed at the second focal point, and the sample is surrounded by the measurement cell combining the spheroidal mirror and the multilayer interference filter. By doing
It is an object of the present invention to provide a small and inexpensive fluorescence measuring device having high excitation efficiency, little stray light, and low cost.
【０００６】[0006]
【課題を解決するための手段】上記課題を解決するため
に本考案の構成は、長軸側の一部が欠如した回転楕円鏡
の欠如していない側の焦点（第１焦点）に試料を、ま
た、欠如している側の焦点（第２焦点）に検出器を配置
し、励起光を前記回転楕円鏡を介して前記第１焦点に設
置された前記試料に集光させた時にこの試料から四方に
発光する蛍光を前記回転楕円鏡を介して前記第２焦点に
設置された前記検出器で測定するようにした蛍光測定装
置において、前記検出器と前記励起光を出射する励起光
源が鏡像関係となる位置に平面鏡を設置した構成とした
ことを特徴とする。また、長軸側の一部が欠如した回転
楕円鏡の欠如していない側の焦点（第１焦点）に試料
を、また、欠如している側の焦点（第２焦点）に検出器
を設置し、励起光を前記試料に照射させた時にこの試料
から四方に発光する蛍光を前記回転楕円鏡を介して前記
第２焦点に設置された前記検出器で測定するようにした
蛍光測定装置において、前記回転楕円鏡の長軸の垂直２
等分面に蛍光は透過し励起光は反射する多層膜干渉フィ
ルタを設置すると共に、この多層膜干渉フィルタに励起
光導入用のピンホールまたはスリットを設けた構成とし
たことを特徴とする。In order to solve the above-mentioned problems, the configuration of the present invention is to arrange a sample at a focal point (first focal point) on a non-absent side of a spheroidal mirror having a part on the long axis side. In addition, a detector is arranged at the focal point (second focal point) on the missing side, and the excitation light is focused on the specimen placed at the first focal point via the spheroidal mirror. A fluorescence measurement device configured to measure fluorescence emitted in four directions through the spheroidal mirror with the detector provided at the second focal point, wherein the detector and the excitation light source that emits the excitation light are mirror images. It is characterized in that a plane mirror is installed at a relevant position. In addition, the sample is set at the focal point (first focal point) on the non-absent side of the spheroidal mirror where a part of the major axis is missing, and the detector is placed at the focal point on the missing side (second focal point). Then, in a fluorescence measurement apparatus that when the excitation light is irradiated on the sample, fluorescence emitted from the sample in all directions is measured by the detector installed at the second focus through the spheroid mirror. Vertical 2 of the major axis of the spheroid mirror
In addition to installing a multilayer interference filter that transmits fluorescence and reflects excitation light on the equal surface, excitation is performed on this multilayer interference filter.
It is characterized in that a pinhole or a slit for introducing light is provided .
【０００７】[0007]
【作用】本考案によれば、励起光源と回転楕円鏡の第２
焦点に設置した検出器とが鏡像関係となる位置に平面鏡
を設置している。したがって、試料から見ると、あたか
も励起光が回転楕円鏡の第２焦点に設置した検出器から
出射しているような構成とできるため、回転楕円鏡の第
１焦点に設置した試料へ励起光を効率良く照射できる。
また、試料を回転楕円鏡と多層膜干渉フィルタで囲むこ
とにより、試料に吸収されずに迷光となる励起光を繰り
返して試料に照射することができ、迷光を低減して励起
効率を向上できる。According to the present invention, the excitation light source and the second spheroidal mirror are used.
A plane mirror is installed at a position where the detector installed at the focal point has a mirror image relationship. Therefore, from the viewpoint of the sample, the excitation light can be configured to be emitted from the detector provided at the second focal point of the spheroidal mirror. Irradiation can be performed efficiently.
In addition, by surrounding the sample with the spheroid mirror and the multilayer interference filter, the sample can be repeatedly irradiated with the excitation light that is not absorbed by the sample and becomes stray light, and the stray light can be reduced and the excitation efficiency can be improved.
【０００８】[0008]
【実施例】以下、本考案を図面に基づいて説明する。図
１は本考案の蛍光測定装置の第１の実施例を示す構成図
である。図１において、１は回転楕円鏡であり、長軸側
の一部（図では、向かって右側の長軸側の面）が欠如し
ている。２は回転楕円鏡１の欠如していない側の焦点位
置（第１焦点）１ａに設置された試料、３は回転楕円鏡
１の欠如している側の焦点位置（第２焦点）１ｂに設置
された検出器である。４は励起光源、５は励起波長の光
だけを通す光学フィルタ（または、プリズムや回折格子
などの分光器）、６は集光レンズである。６ａは集光レ
ンズ６の焦点、７は平面鏡であり、集光レンズ６の焦点
６ａは、平面鏡７に対して回転楕円鏡１の第２の焦点１
ｂに設置された検出器３と鏡像対称な位置にある。つま
り、試料２から見ると励起光源４が、あたかも回転楕円
鏡１の第２焦点に設置されているかのように見える。８
は励起光と蛍光を分離する光学フィルタ（または、プリ
ズムや回折格子などの分光器）であり、励起光は遮断し
て蛍光の波長のみを透過し、検出器３へ導く。なお、図
示はしないが、回転楕円鏡１内に設置された試料２はガ
ラスなどの無蛍光性の透明物体で保持されている。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the drawings. FIG. 1 is a block diagram showing a first embodiment of the fluorescence measuring device of the present invention. In FIG. 1, reference numeral 1 denotes a spheroid mirror, and a part on the long axis side (a surface on the long axis side on the right side in FIG. 1) is missing. Reference numeral 2 denotes a sample set at a focal position (first focus) 1a on the side where the spheroidal mirror 1 is not missing, and reference numeral 3 denotes a sample set at a focal position (second focus) 1b where the spheroidal mirror 1 is missing. Detector. 4 is an excitation light source, 5 is an optical filter (or a spectroscope such as a prism or a diffraction grating) that allows only light of the excitation wavelength, and 6 is a condenser lens. 6a is a focal point of the condenser lens 6, 7 is a plane mirror, and the focal point 6a of the condenser lens 6 is a second focal point 1 of the spheroid mirror 1 with respect to the plane mirror 7.
It is located at a mirror image position with respect to the detector 3 installed at the position b. That is, when viewed from the sample 2, the excitation light source 4 looks as if it is installed at the second focal point of the spheroidal mirror 1. 8
Denotes an optical filter (or a spectroscope such as a prism or a diffraction grating) for separating the excitation light and the fluorescence, and blocks the excitation light, transmits only the wavelength of the fluorescence, and guides it to the detector 3. Although not shown, the sample 2 installed in the spheroid mirror 1 is held by a non-fluorescent transparent object such as glass.
【０００９】このような構成において、励起光源４から
出射された光は、光学フィルタ５を通して励起波長の光
だけが通され、集光レンズ６により集光されて平面鏡７
に入射される。入射光は、平面鏡７で反射され、回転楕
円鏡１の鏡面で反射されて、その第１焦点１ａに置かれ
た試料２へ入射される。試料２は四方に蛍光を発する
が、この内、回転楕円鏡１の鏡面に当たって反射された
蛍光は、全て回転楕円鏡１の第２焦点１ｂに置かれた検
出器３に集光される。この場合、検出器３の前段に設置
された光学フィルタ８により、励起光は遮断されるた
め、検出器３へは蛍光だけが導かれる。ここで、回転楕
円鏡１の第２焦点と励起光源４の出射光を集光する集光
レンズ６の焦点とは、平面鏡７に対して対称な位置にあ
る。つまり、励起光源４から出射した励起光は、集光レ
ンズ６の焦点６ａと平面鏡７に対して対称位置である回
転楕円鏡１の第２焦点１ｂに置かれた検出器３から出射
したかのようになる。したがって、集光レンズ６によっ
て集光された励起光を全て試料２に照射することができ
る。In such a configuration, the light emitted from the excitation light source 4 passes only the light having the excitation wavelength through the optical filter 5, and is condensed by the condenser lens 6, and is converged by the plane mirror 7.
Is incident on. The incident light is reflected by the plane mirror 7, reflected by the mirror surface of the spheroidal mirror 1, and made incident on the sample 2 placed at the first focal point 1a. The sample 2 emits fluorescent light in all directions, and among them, all the fluorescent light reflected on the mirror surface of the spheroidal mirror 1 is collected on the detector 3 placed at the second focal point 1b of the spheroidal mirror 1. In this case, since the excitation light is cut off by the optical filter 8 installed in front of the detector 3, only the fluorescence is guided to the detector 3. Here, the second focal point of the spheroidal mirror 1 and the focal point of the condenser lens 6 for condensing the light emitted from the excitation light source 4 are located symmetrically with respect to the plane mirror 7. That is, whether the excitation light emitted from the excitation light source 4 is emitted from the detector 3 placed at the second focal point 1b of the spheroidal mirror 1 which is symmetrical with respect to the focal point 6a of the condenser lens 6 and the plane mirror 7. Become like Therefore, all of the excitation light condensed by the condenser lens 6 can be applied to the sample 2.
【００１０】なお、上記実施例において、検出器３と励
起光源４と平面鏡７は複数個あっても良い。In the above embodiment, a plurality of detectors 3, excitation light sources 4, and plane mirrors 7 may be provided.
【００１１】次に、図２は本考案の蛍光測定装置の第２
の実施例を示す構成図である。なお、図２において図１
と同一要素には同一符号を付して重複する説明は省略す
る。図２において、９は蛍光は透過し、励起光を反射す
る多層膜干渉フィルタであり、回転楕円鏡１の長軸の垂
直２等分面に設置されている。また、この多層膜干渉フ
ィルタには励起光を回転楕円鏡１内に導入するためのピ
ンホール９ａが設けられている。なお、このピンホール
９ａは、回転楕円鏡１に設けてあっても良く、また、ピ
ンホールはスリットであっても良い。Next, FIG. 2 shows a second example of the fluorescence measuring device of the present invention.
FIG. 3 is a configuration diagram showing an example of the embodiment. In FIG. 2, FIG.
The same elements as those described above are denoted by the same reference numerals, and redundant description will be omitted. In FIG. 2, reference numeral 9 denotes a multilayer interference filter that transmits fluorescence and reflects excitation light, and is provided on a plane bisecting the major axis of the spheroidal mirror 1. The multilayer interference filter is provided with a pinhole 9a for introducing the excitation light into the spheroid mirror 1. Note that the pinhole 9a may be provided in the spheroid mirror 1, and the pinhole may be a slit.
【００１２】このような構成において、励起光は多層膜
干渉フィルタ９のピンホール９ａを通って、回転楕円鏡
１の第１焦点１ａに置かれた試料２へ入射される。試料
２は四方に蛍光を発するが、この内、回転楕円鏡１の鏡
面に当たって反射された蛍光は、多層膜干渉フィルタ９
を透過して、全て回転楕円鏡１の第２焦点１ｂに置かれ
た検出器３に集光される。この場合、試料２に吸収され
なかった励起光は、その一部はピンホール９ａを通って
外部への迷光となるが、殆どは回転楕円鏡１と励起光を
反射する多層膜干渉フィルタ９で反射されて、再び試料
２に照射され、吸収されて蛍光を発する。つまり、回転
楕円鏡１と多層膜干渉フィルタ９で囲まれた空間内で
は、試料２に吸収されなかった励起光が繰り返して試料
２に照射されている。この動作を繰り返して行うことに
より、入射した励起光子と試料の蛍光分子との衝突確立
が上昇するため、励起効率が上がり、外部への迷光は減
少する。In such a configuration, the excitation light passes through the pinhole 9a of the multilayer interference filter 9 and is incident on the sample 2 placed at the first focal point 1a of the spheroid mirror 1. The sample 2 emits fluorescence in all directions, and the fluorescence reflected on the mirror surface of the spheroidal mirror 1 is reflected by the multilayer interference filter 9.
, And are all collected on the detector 3 placed at the second focal point 1 b of the spheroid mirror 1. In this case, part of the excitation light not absorbed by the sample 2 becomes stray light to the outside through the pinhole 9a, but most of the light is generated by the spheroid mirror 1 and the multilayer interference filter 9 that reflects the excitation light. The light is reflected, irradiates the sample 2 again, is absorbed, and emits fluorescence. That is, in a space surrounded by the spheroid mirror 1 and the multilayer interference filter 9, the excitation light not absorbed by the sample 2 is repeatedly irradiated on the sample 2. By repeating this operation, the probability of collision between the incident excitation photons and the fluorescent molecules of the sample increases, so that the excitation efficiency increases and stray light to the outside decreases.
【００１３】ここで、第１の実施例では、一度照射した
励起光は、光学フィルタ８に吸収されるか、試料２で散
乱されて迷光となっていたが、第２の実施例では試料２
に照射後、散乱・透過した励起光を再び多層膜干渉フィ
ルタ９により反射して試料２に照射している。１回の反
射で損失する励起光の割合をΔとすると、ｎ回の反射
で、試料２に照射される励起光の総量は、 Ａn＝１＋（１−Δ）＋（１−Δ）2＋───＋（１−Δ）n となり、 Σ（１−Δ）n＝１／Δ となる。回転楕円鏡や多層膜干渉フィルタの反射率は通
常９０％以上はあるので、Δ＝１０％と考えると、Ａn
＝１０、つまり励起光を１０倍強める効果がある。ま
た、セルの外部にあらわれる励起光と蛍光の比は、蛍光
の光量は１／Δ倍に増加するが、励起光量は１／Δ倍、
多層膜干渉フィルタの励起光成分透過率は略Δと見做す
と、励起光の光量は略等しくなるので、蛍光／励起光は
１／Δ倍になる。したがって、第１の実施例より更に励
起効率が上がると共に、蛍光測定のＳ／Ｎが向上する。Here, in the first embodiment, the excitation light once irradiated is absorbed by the optical filter 8 or scattered by the sample 2 to become stray light, but in the second embodiment, the excitation light is
After that, the scattered and transmitted excitation light is reflected again by the multilayer interference filter 9 and irradiates the sample 2. Assuming that the ratio of the excitation light lost in one reflection is Δ, the total amount of the excitation light irradiated on the sample 2 in the n reflections is: An = 1 + (1−Δ) + (1−Δ) 2 + ─── + (1−Δ) n , and Σ (1−Δ) n = 1 / Δ. Since the reflectance of a spheroidal mirror or a multilayer interference filter is usually 90% or more, if Δ = 10%, A n
= 10, that is, an effect of increasing the excitation light by 10 times. In addition, the ratio of the excitation light and the fluorescence appearing outside the cell is such that the amount of the fluorescence is increased by a factor of 1 / Δ,
Assuming that the transmittance of the excitation light component of the multilayer interference filter is substantially Δ, the amount of the excitation light becomes substantially equal, so that the fluorescence / excitation light becomes 1 / Δ times. Therefore, the excitation efficiency is further increased as compared with the first embodiment, and the S / N of the fluorescence measurement is improved.
【００１４】また、図示にての説明は省略するが、上記
第２の実施例において、検出器の受光面が多層膜干渉フ
ィルタの全面を覆うような検出器を用いても良く、この
場合、検出器を回転楕円鏡の第２焦点に設置する必要は
なく、調整を容易とし、装置を小型にできる効果があ
る。Although not shown in the drawings, in the second embodiment, a detector in which the light receiving surface of the detector covers the entire surface of the multilayer interference filter may be used. There is no need to dispose the detector at the second focal point of the spheroid mirror, which has the effect of facilitating adjustment and reducing the size of the device.
【００１５】なお、上記実施例において、光学フィルタ
５は、励起光源４としてレーザ光源を使用する場合は必
要なく、ＸｅランプやＨｇランプなどの連続なスペクト
ルを持つ光源においては、励起波長のみを通す。In the above-mentioned embodiment, the optical filter 5 is not necessary when a laser light source is used as the excitation light source 4. In a light source having a continuous spectrum, such as a Xe lamp or an Hg lamp, only the excitation wavelength passes. .
【００１６】[0016]
【考案の効果】以上、実施例と共に具体的に説明したよ
うに、本考案によれば、励起光源と焦点を鏡像対称とな
るように平面鏡を設置したため、励起光の照射効率が改
善され、機器の感度を向上できる。また、励起光を照射
するために、平面鏡１枚を用いるという簡単な構成とし
たために、装置を小型、安価に製作することができる。
また、回転楕円鏡と多層膜干渉フィルタで試料を囲むこ
とにより、より励起効率が高く、迷光の少なくできるな
どの効果を有する蛍光測定装置を実現できる。As described above in detail with the embodiments, according to the present invention, since the plane mirror is installed so that the focal point of the excitation light source and the focal point are mirror-image symmetric, the irradiation efficiency of the excitation light is improved, Sensitivity can be improved. In addition, since a single plane mirror is used to irradiate the excitation light, the apparatus can be manufactured small and inexpensively.
Further, by surrounding the sample with the spheroidal mirror and the multilayer interference filter, it is possible to realize a fluorescence measurement device having higher excitation efficiency and an effect of reducing stray light.
【図１】本考案の蛍光測定装置の第１の実施例を示す構
成図である。FIG. 1 is a configuration diagram showing a first embodiment of a fluorescence measurement device of the present invention.
【図２】本考案の蛍光測定装置の第２の実施例を示す構
成図である。FIG. 2 is a configuration diagram showing a second embodiment of the fluorescence measurement device of the present invention.
【図３】回転楕円鏡を用いて蛍光を集光する蛍光測定装
置を説明する図である。FIG. 3 is a diagram illustrating a fluorescence measurement device that collects fluorescence using a spheroidal mirror.
１ 回転楕円鏡 １ａ 第１焦点 １ｂ 第２焦点 ２ 試料 ３ 検出器 ４ 励起光源 ５、８ 光学フィルタ ６ 集光レンズ ６ａ 集光レンズ６の焦点 ７ 平面鏡 ９ 多層膜干渉フィルタ ９ａ ピンホール DESCRIPTION OF SYMBOLS 1 Spheroid mirror 1a 1st focus 1b 2nd focus 2 Sample 3 Detector 4 Excitation light source 5,8 Optical filter 6 Condensing lens 6a Focus of condensing lens 6 7 Plane mirror 9 Multilayer interference filter 9a Pinhole
───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6，ＤＢ名) G01N 21/64 G01J 3/443──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 6 , DB name) G01N 21/64 G01J 3/443
Claims (2)
如していない側の焦点（第１焦点）に試料を、また、欠
如している側の焦点（第２焦点）に検出器を配置し、励
起光を前記回転楕円鏡を介して前記第１焦点に設置され
た前記試料に集光させた時にこの試料から四方に発光す
る蛍光を前記回転楕円鏡を介して前記第２焦点に設置さ
れた前記検出器で測定するようにした蛍光測定装置にお
いて、 前記検出器と前記励起光を出射する励起光源が鏡像関係
となる位置に平面鏡を設置した構成としたことを特徴と
する蛍光測定装置。1. A sample is detected at a focal point (first focal point) on a non-absent side of a spheroidal mirror having a part on the long axis side, and at a focal point (second focal point) on a missing side. A fluorescent lamp that emits light in all directions from the sample when the excitation light is focused on the sample placed at the first focal point via the spheroid mirror via the spheroid mirror. In a fluorescence measurement device configured to measure with the detector provided at a focal point, a flat mirror is provided at a position where the detector and an excitation light source that emits the excitation light have a mirror image relationship. Fluorescence measurement device.
如していない側の焦点（第１焦点）に試料を、また、欠
如している側の焦点（第２焦点）に検出器を設置し、励
起光を前記試料に照射させた時にこの試料から四方に発
光する蛍光を前記回転楕円鏡を介して前記第２焦点に設
置された前記検出器で測定するようにした蛍光測定装置
において、 前記回転楕円鏡の長軸の垂直２等分面に蛍光は透過し励
起光は反射する多層膜干渉フィルタを設置すると共に、
この多層膜干渉フィルタに励起光導入用のピンホールま
たはスリットを設けた構成としたことを特徴とする蛍光
測定装置。2. A sample is detected at a focal point (first focal point) on the non-absent side of the spheroidal mirror having a part on the long axis side, and at a focal point (second focal point) on the missing side. Set up and encourage
A fluorescence measuring device configured to measure fluorescence emitted from the sample in all directions when the sample is irradiated with light by the detector provided at the second focal point via the spheroid mirror; A multilayer interference filter that transmits fluorescence and reflects excitation light is set on the perpendicular bisector of the major axis of the elliptical mirror.
The multilayer interference filter has a pinhole for introducing excitation light.
Or a fluorescence measuring device characterized by having a slit .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1992056026U JP2577926Y2 (en) | 1991-12-04 | 1992-08-10 | Fluorescence measurement device |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9994591 | 1991-12-04 | ||
| JP3-99945 | 1991-12-04 | ||
| JP1992056026U JP2577926Y2 (en) | 1991-12-04 | 1992-08-10 | Fluorescence measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0562850U JPH0562850U (en) | 1993-08-20 |
| JP2577926Y2 true JP2577926Y2 (en) | 1998-08-06 |
Family
ID=26396941
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1992056026U Expired - Fee Related JP2577926Y2 (en) | 1991-12-04 | 1992-08-10 | Fluorescence measurement device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2577926Y2 (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1127867A (en) * | 1978-03-20 | 1982-07-20 | Albert Brunsting | Ellipsoid radiation collector and method |
| JPS56137302A (en) * | 1980-03-28 | 1981-10-27 | Mitsubishi Electric Corp | Optical wavelength branching device |
| US5026159A (en) * | 1989-05-19 | 1991-06-25 | Acrogen, Inc. | Area-modulated luminescence (AML) |
-
1992
- 1992-08-10 JP JP1992056026U patent/JP2577926Y2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0562850U (en) | 1993-08-20 |
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