JP2574019Y2 - IC test equipment handler - Google Patents

Description

[Detailed description of the invention]

[0001]

BACKGROUND OF THE INVENTION The present invention relates to an IC testing device hand.
In particular, the present invention relates to an IC test apparatus handler for recognizing a transfer tray or a board by an optical sensor in a process of transferring the IC transfer tray by the handler .

[0002]

2. Description of the Related Art When conducting a high / low temperature test on an IC, the IC placed on a user tray inside the handler is transferred and placed again on a dedicated tray in the handler, and the dedicated tray is sent to a thermostat. Performs a high / low temperature test on the IC. After conducting the high / low temperature test, the IC
Is transferred again to the previous user tray or user board. However, in these transfer steps, it is necessary to recognize the current position of the transfer tray or board and manage the presence or absence thereof.

[0003]

The presence or absence of an IC transfer tray or board can be recognized by providing a sensor. However, in the transport process, if the transport tray or board is replaced for any reason, the true transport tray or board must be recognized only by the sensor that recognizes the presence or absence. Can not.

Attempts have also been made to attach a bar code to an IC transport tray or board and recognize and manage the bar code. But,
Since the handler handles a high and low temperature range from -55 ° C to + 150 ° C, the attached barcode cannot withstand this temperature range. Further, the distance between the bar code reader and the bar code attached to the IC transport tray or board in the handler is not suitable for reading the bar code, and the shape and dimensions of the bar code reader are also recognized. Was unsuitable for

[0005] This invention provides an IC test equipment handler which solves the above-mentioned problems.

[0006]

An IC transport tray or board is provided with a data hole for recognition code data and a strobe hole for generating a pulse for taking in the recognition code data. the strobe detection optical sensor 30 that generates a strobe signal corresponding to the data detection optical sensor 40 and strobe hole 11 to generate a data signal corresponding to the 12 patterns of the set <br/> provided, the detection of these signals Is the tray or board 10
It has a shift register 52 which is sequentially executed according to the transport and is sequentially shifted by a data signal in synchronization with a strobe signal.
Comprises an up / down counter 54 for generating an interrupt signal to the CPU upon reaching, this tray or baud read the data content of the shift register 52
Thus , an IC test apparatus handler used as a recognition code of the code 10 was constructed.

[0007]

DESCRIPTION OF THE PREFERRED EMBODIMENTS In conducting a high / low temperature test on an IC, an IC placed on a user tray inside the handler is transferred and placed on a dedicated tray inside the handler,
The exclusive tray is sent to a thermostat to perform a high / low temperature test on the IC. After performing the high / low temperature test, the IC is transferred and placed again on the previous user tray. In these transport processes, the identification (ID) code is attached to the dedicated tray to recognize the current position of the tray and to recognize the current position of the tray. Implement presence / absence management.

An embodiment of the present invention will be described with reference to FIG. In FIG. 1, reference numeral 10 denotes a dedicated tray or a dedicated board in the handler. Two kinds of holes are formed in the tray 10 in advance. One of them is a data hole 12 for data of a recognition code, and is formed in a different pattern for each tray. The other is a strobe hole 11 for generating a pulse for taking in the data of the recognition code, which is common to each tray.

When the tray 10 travels in the direction of the arrow, the light emitted from a light source (not shown) is intermittently transmitted through the holes 11 and 12 to generate low-level and high-level signals, respectively. Input to the comparator 53. Data hole 1
The data signal obtained by the pattern 2 shifts the data of the latch and shift register 52 sequentially in synchronization with the strobe signal obtained by the strobe hole 11. The strobe signal counts down the count data set in the up / down counter 54 in advance, and generates an interrupt signal to the CPU when the count reaches 0. After the occurrence of the interrupt signal, the shift register 52 latched by checking for a data error and
Is read out, and this is used as the identification code of the tray 10.

Next, the flowchart of FIG. 2 and the timing chart of FIG. 3 will be described. First, the counter and the shift register are cleared (counter and various statuses are cleared). The count number of the up / down counter 54 is set. The number of the sets is the same as the number of the strobe holes 11, but this is the number of the last strobe holes 1 while the tray 10 is running.
This is because an interrupt signal is generated when 1 is detected.

By operating an actuator (not shown), the tray 1
Run 0. When an interrupt signal is generated, a Ready check is performed to determine whether an ID code has been generated. IDINT is the regular ID COU
Occurs when the number of strobes set in NT is input. Check for overflow (ID
Since RDY changes at the same timing as IDIDT, IDRDY of any channel always stands after an interrupt occurs.)

The ID code is read. * Data input (IDD) When a large number of data are input: The overflow status always appears. * When many strobe inputs (IDE) are input ...
The last 16 bits of data remain.

[0013]

[Effect of the Invention] As described above, the IC test of the present invention is performed.
Since test device handler is one that recognizes the tray or board itself, even if the tray or board by something like of reasons in the transport process has gone interchanged, and your judgment of existence of the tray or the board It is easy to recognize. Since the attached recognition code is a hole formed in the tray itself which can sufficiently withstand a high and low temperature range, the handler can be used from -55 ° C to + 15 ° C.
Needless to say, even in a high / low temperature range of 0 ° C., the material can sufficiently withstand this temperature range. The data detection optical sensor 40 and the strobe hole 11 detection sensor 30 for generating a data signal corresponding to the pattern of the data hole 12 of the present invention are optical type and are specially called IC test equipment handler. It is suitable for reading and recognition in. In addition, the number of pieces processed per hour
Count the number and stop this for tray or board detection.
IC test that wants to reduce extra time as much as possible
In equipment handler, tray or board stops once
The simultaneous detection device that performs sensor detection after
Use a set of sensors to identify a tray or board
The IC test equipment of the present invention which detects signals sequentially.
Dora is very effective. Also, one set of sensors
Data holes and strikes in the recognition device
Regardless of the number of lobe holes, each set of sensors
Data holes like simultaneous detection,
The number of sensors corresponding to the number of strobe holes is not required.
As a result, a low-cost and highly reliable IC test equipment hand
Can be realized. Here, the specification of this application
As described in the above, the tray or board of this invention is approved.
The sensing device can be used not only at normal temperature but also at low temperature and high temperature.
However, it is also possible to use them. Especially at low temperatures
IC test that realizes a wide range of temperature and ambient conditions from temperature to high temperature
Tray or board in the chamber of the test equipment handler.
The use of optical fibers when recognizing
The sensor section can be installed outside the chamber,
This is convenient for design and signal recognition.

[Brief description of the drawings]

FIG. 1 is a diagram illustrating an embodiment of the present invention.

FIG. 2 is a flowchart of the present invention.

FIG. 3 is a timing chart of the present invention.

[Explanation of symbols]

 Reference Signs List 10 IC transport tray 11 Strobe hole 12 Data hole 30 Strobe detection optical sensor 40 Data detection optical sensor 52 Shift register 54 Up / down counter

──────────────────────────────────────────────────続 き Continued on front page (51) Int.Cl. ⁶ Identification code FI H05K 13/02 G01R 31/28 X

Claims (1)

(57) [Scope of request for utility model registration] An IC transport tray or board having a data hole for recognition code data and a strobe hole for generating a pulse for taking in the recognition code data, and a data signal corresponding to the data hole pattern. and a set including a strobe detection optical sensor for generating a strobe signal corresponding to the data detection optical sensor and strobe holes generates, detection of these signals tray or baud
A shift register that is sequentially executed in response to the transfer of data, and sequentially shifted by a data signal in synchronization with a strobe signal, and counts down preset count data by the strobe signal to the CPU. An IC test apparatus handler comprising an up / down counter for generating an interrupt signal, reading data contents of a shift register, and using the read data as a tray or board recognition code .