JP2538678Y2 - 半導体装置のノイズ検査装置 - Google Patents
半導体装置のノイズ検査装置Info
- Publication number
- JP2538678Y2 JP2538678Y2 JP6615590U JP6615590U JP2538678Y2 JP 2538678 Y2 JP2538678 Y2 JP 2538678Y2 JP 6615590 U JP6615590 U JP 6615590U JP 6615590 U JP6615590 U JP 6615590U JP 2538678 Y2 JP2538678 Y2 JP 2538678Y2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- voltage
- noise
- output
- operational amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6615590U JP2538678Y2 (ja) | 1990-06-22 | 1990-06-22 | 半導体装置のノイズ検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6615590U JP2538678Y2 (ja) | 1990-06-22 | 1990-06-22 | 半導体装置のノイズ検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0424078U JPH0424078U (enrdf_load_stackoverflow) | 1992-02-27 |
| JP2538678Y2 true JP2538678Y2 (ja) | 1997-06-18 |
Family
ID=31598624
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6615590U Expired - Lifetime JP2538678Y2 (ja) | 1990-06-22 | 1990-06-22 | 半導体装置のノイズ検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2538678Y2 (enrdf_load_stackoverflow) |
-
1990
- 1990-06-22 JP JP6615590U patent/JP2538678Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0424078U (enrdf_load_stackoverflow) | 1992-02-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4719428A (en) | Storage battery condition tester utilizing low load current | |
| US5959463A (en) | Semiconductor test apparatus for measuring power supply current of semiconductor device | |
| JPS5936512B2 (ja) | A・c・電圧をd・c・電圧に変換するための回路 | |
| US4985672A (en) | Test equipment for a low current IC | |
| US6222375B1 (en) | Synchronous calibration test circuit for use in recording systems | |
| US6348816B1 (en) | Tracking percent overload signal as indicator of output signal magnitude | |
| CN100403044C (zh) | 迟滞比较器迟滞窗口自动调节与测量的一种电路结构 | |
| JP2538678Y2 (ja) | 半導体装置のノイズ検査装置 | |
| KR0137088B1 (ko) | 전력연산장치 | |
| JP2960200B2 (ja) | ピーク検出回路 | |
| JP4704641B2 (ja) | 変化の符号を含む電気信号の緩慢で微小な変化の検出方法及び装置、並びに交流電圧のピーク値の正確な検出のための回路配置 | |
| US6891354B2 (en) | Method for detecting slow and small changes of electrical signals | |
| JP3842140B2 (ja) | 変圧器の残留磁束測定装置 | |
| JPS59171869A (ja) | 電気素子の直線性及び非直線性の検出方法 | |
| JPH0325182Y2 (enrdf_load_stackoverflow) | ||
| EP0437785A2 (en) | AC signal generating apparatus for generating a voltage or current standard | |
| US5745062A (en) | Pulse width modulation analog to digital converter | |
| US4719408A (en) | Apparatus for indicating proper compensation of an adjustable frequency compensation network | |
| JP3323121B2 (ja) | 半導体装置の測定方法及び測定装置 | |
| JPH0136141Y2 (enrdf_load_stackoverflow) | ||
| JPS6016638B2 (ja) | 周波数―電圧変換回路 | |
| JP3945389B2 (ja) | 時間電圧変換器及び方法 | |
| JPS6153800B2 (enrdf_load_stackoverflow) | ||
| JP3239338B2 (ja) | リップルノイズ電圧測定装置 | |
| JPH0560806A (ja) | 周波数/周期測定装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |