JP2520796Y2 - Ｉｃハンドラ - Google Patents

Ｉｃハンドラ

Info

Publication number
JP2520796Y2
JP2520796Y2 JP1990106682U JP10668290U JP2520796Y2 JP 2520796 Y2 JP2520796 Y2 JP 2520796Y2 JP 1990106682 U JP1990106682 U JP 1990106682U JP 10668290 U JP10668290 U JP 10668290U JP 2520796 Y2 JP2520796 Y2 JP 2520796Y2
Authority
JP
Japan
Prior art keywords
cover
handler
transfer arm
opened
state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP1990106682U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0463642U (cg-RX-API-DMAC10.html
Inventor
徳幸 五十嵐
克己 小島
昭雄 小島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP1990106682U priority Critical patent/JP2520796Y2/ja
Priority to KR1019910017602A priority patent/KR960007507B1/ko
Priority to US07/774,811 priority patent/US5177469A/en
Publication of JPH0463642U publication Critical patent/JPH0463642U/ja
Priority to KR1019960000786A priority patent/KR960007506B1/ko
Application granted granted Critical
Publication of JP2520796Y2 publication Critical patent/JP2520796Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H10P72/3306—
    • H10P72/0604—
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00—Material or article handling
    • Y10S414/135—Associated with semiconductor wafer handling

Landscapes

  • Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
JP1990106682U 1990-10-08 1990-10-11 Ｉｃハンドラ Expired - Fee Related JP2520796Y2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP1990106682U JP2520796Y2 (ja) 1990-10-11 1990-10-11 Ｉｃハンドラ
KR1019910017602A KR960007507B1 (ko) 1990-10-08 1991-10-08 Ic시험장치
US07/774,811 US5177469A (en) 1990-10-11 1991-10-11 Safety device for an IC handler and method for its operation
KR1019960000786A KR960007506B1 (ko) 1990-10-11 1996-01-17 Ic핸들러용 안전장치 및 그의 동작방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990106682U JP2520796Y2 (ja) 1990-10-11 1990-10-11 Ｉｃハンドラ

Publications (2)

Publication Number Publication Date
JPH0463642U JPH0463642U (cg-RX-API-DMAC10.html) 1992-05-29
JP2520796Y2 true JP2520796Y2 (ja) 1996-12-18

Family

ID=14439838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990106682U Expired - Fee Related JP2520796Y2 (ja) 1990-10-08 1990-10-11 Ｉｃハンドラ

Country Status (2)

Country Link
US (1) US5177469A (cg-RX-API-DMAC10.html)
JP (1) JP2520796Y2 (cg-RX-API-DMAC10.html)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4011151B2 (ja) * 1997-03-31 2007-11-21 株式会社ニデック レンズ研削加工装置
US5982285A (en) * 1998-05-14 1999-11-09 Bueche; Kenneth M. Compliance monitoring system
US6206073B1 (en) 1999-10-12 2001-03-27 John Jacob Lay Safety system for use with a grain bin
KR100951608B1 (ko) * 2007-06-13 2010-04-09 이명진 시그널 타워 및 그 통합시스템
US20100045458A1 (en) * 2008-08-19 2010-02-25 Silverbrook Research Pty Ltd Safety system for an integrated circuit alignment testing apparatus
US7880900B2 (en) * 2008-08-19 2011-02-01 Silverbrook Research Pty Ltd Measuring apparatus for performing positional analysis on an integrated circuit carrier
US20100045729A1 (en) * 2008-08-19 2010-02-25 Silverbrook Research Pty Ltd Method for testing alignment of a test bed with a plurality of integrated circuits thereon
US7924440B2 (en) * 2008-08-19 2011-04-12 Silverbrook Research Pty Ltd Imaging apparatus for imaging integrated circuits on an integrated circuit carrier
US8915368B2 (en) * 2012-09-20 2014-12-23 Shenzhen China Star Optoelectronics Technology Co., Ltd LCD glass substrate storage tray

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3631447A (en) * 1969-07-11 1971-12-28 Hudson Tool & Die Co Inc Safety alarm
KR0177589B1 (en) * 1987-02-13 1999-04-15 Tokyo Electron Ltd Wafer accounting and processing system
US4987407A (en) * 1988-04-22 1991-01-22 Asq. Boats, Inc. Wafer interleaving with electro-optical safety features

Also Published As

Publication number Publication date
US5177469A (en) 1993-01-05
JPH0463642U (cg-RX-API-DMAC10.html) 1992-05-29

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Legal Events

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