JP2508608Y2 - Solid-state image sensor storage package - Google Patents

Solid-state image sensor storage package

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Publication number
JP2508608Y2
JP2508608Y2 JP1989136159U JP13615989U JP2508608Y2 JP 2508608 Y2 JP2508608 Y2 JP 2508608Y2 JP 1989136159 U JP1989136159 U JP 1989136159U JP 13615989 U JP13615989 U JP 13615989U JP 2508608 Y2 JP2508608 Y2 JP 2508608Y2
Authority
JP
Japan
Prior art keywords
solid
state image
image sensor
package
warp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1989136159U
Other languages
Japanese (ja)
Other versions
JPH0375552U (en
Inventor
倫生 小山
光司 土屋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP1989136159U priority Critical patent/JP2508608Y2/en
Publication of JPH0375552U publication Critical patent/JPH0375552U/ja
Application granted granted Critical
Publication of JP2508608Y2 publication Critical patent/JP2508608Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Semiconductor Integrated Circuits (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Description

【考案の詳細な説明】 以下の順序に従って本考案を説明する。DETAILED DESCRIPTION OF THE INVENTION The present invention will be described in the following order.

A.産業上の利用分野 B.考案の概要 C.従来技術[第4図] D.考案が解決しようとする問題点 E.問題点を解決するための手段 F.作用 G.実施例[第1図乃至第3図] H.考案の効果 (A.産業上の利用分野) 本考案は固体撮像素子収納パッケージ、特にラインセ
ンサーとして用いられる細長の固体撮像素子を収納する
固体撮像素子収納パッケージに関する。
A. Industrial field of use B. Overview of the device C. Prior art [Fig. 4] D. Problems to be solved by the device E. Means for solving the problem F. Action G. Example [first 1 to 3] H. Effect of the Invention (A. Field of Industrial Application) The present invention relates to a solid-state image sensor storage package, and more particularly to a solid-state image sensor storage package for storing a slender solid-state image sensor used as a line sensor. .

(B.考案の概要) 本考案は、上記の固体撮像素子収納パッケージにおい
て、 接着された固体撮像素子に反りが生じることを防止す
るため、 固体撮像素子支持領域の表面を内側に寄る程高くなる
部分を有しない凹状に形成したものである。
(B. Overview of the Invention) In the present invention, in the above solid-state image pickup device housing package, in order to prevent the bonded solid-state image pickup device from warping, the solid-state image pickup device support area becomes higher toward the inside. It is formed in a concave shape having no portion.

(C.従来技術)[第4図] ラインセンサーにはきわめて細長(例えば長さ40mm、
幅1mm)の固体撮像素子をセラミックパッケージに収納
し、ガラス封止したものが多い。
(C. Prior art) [Fig. 4] The line sensor is extremely slender (for example, 40 mm long,
In many cases, a solid-state image sensor with a width of 1 mm) is housed in a ceramic package and sealed with glass.

第4図(A)、(B)、(C)は固体撮像素子収納パ
ッケージを示すもので、同図(A)は平面図、同図
(B)は同図(A)のB−B線に沿う断面図、同図
(C)は同図(A)のC−C線に沿う断面図である。同
面において、1はセラミックパッケージで、複数枚のグ
リーンセラミックシートに適宜配線膜を印刷により形成
し、該複数のグリーンセラミックシートを積層した後焼
結してなるものであり、内底面が固体撮像素子を支持す
るダイパッド部分2とされており、3は該ダイパッド部
分2に熱硬化性の樹脂を介してダイボンデングされた固
体撮像素子である。4、4、…はセラミックパッケージ
1のダイパット形成面よりも一段高いところに形成され
た配線膜で、該配線膜4、4、…とそれに対応する固体
撮像素子3の電極パッドとの間が例えば金からなるコネ
クトワイヤ5、5、…によって接続されている。6はセ
ラミックパッケージ1の上端面に固着されて固体撮像素
子3をセラミックパッケージ1内に封止する透明板で、
例えばガラスからなる。
4 (A), (B), and (C) show a solid-state imaging device housing package, FIG. 4 (A) is a plan view, and FIG. 4 (B) is a line BB in FIG. 4 (A). Is a cross-sectional view taken along the line C-C of FIG. On the same side, 1 is a ceramic package, which is formed by appropriately printing wiring films on a plurality of green ceramic sheets, stacking the plurality of green ceramic sheets, and then sintering the same. A die pad portion 2 for supporting the element is provided, and 3 is a solid-state image pickup element die-bonded to the die pad portion 2 via a thermosetting resin. The wiring films 4, 4, ... Are formed higher than the die pad forming surface of the ceramic package 1, and the space between the wiring films 4, 4 ,. They are connected by gold connect wires 5, 5, .... Reference numeral 6 denotes a transparent plate which is fixed to the upper end surface of the ceramic package 1 and seals the solid-state image sensor 3 in the ceramic package 1.
For example, it is made of glass.

そして、従来の固体撮像素子収納パッケージは、セラ
ミックパッケージ1の固体撮像素子を支持する内底面、
即ちダイパッド部分2の表面が平坦になるように形成さ
れていた。
The conventional solid-state image sensor housing package has an inner bottom surface that supports the solid-state image sensor of the ceramic package 1.
That is, the surface of the die pad portion 2 was formed to be flat.

(D.考案が解決しようとする問題点) ところが、上述した従来の固体撮像素子収納パッケー
ジには、固体撮像素子3をダイボンディングすると、固
体撮像素子3の表面に無視出来ない反りが生じるという
問題があった。このような反りは像面湾曲の原因となり
光学的特性に悪影響を及ぼす。
(D. Problems to be Solved by the Invention) However, when the solid-state image sensor 3 is die-bonded to the conventional solid-state image sensor housing package described above, a warp that cannot be ignored is generated on the surface of the solid-state image sensor 3. was there. Such warpage causes curvature of field and adversely affects optical characteristics.

そこで、本願考案者がそのような反りが生じる原因を
追求したところの次のことが判明した。
Then, the inventor of the present application has sought out the cause of such warpage, and found the following.

固体撮像素子3はセラミックパッケージ1に熱硬化性
の樹脂を介して接着されるので接着時には加熱される。
そして、セラミックと、固体撮像素子3を成すシリコン
とでは熱膨張係数が異なり、しかも固体撮像素子3はき
わめて細長い。従って、接着後の温度変化によってその
熱膨張係数の差に起因して固体撮像素子3に無視できな
い反りが生じるのである。そして、セラミックパッケー
ジのダイパッド部2の反りが0だと固体撮像素子3がプ
ラスに反り(ここでプラスの反りとは表面が凸曲する反
りをいい、逆にマイナスの反りとは表面が凹曲する反り
をいう。)、セラミックパッケージのダイパッド部分2
の反りがプラスになると固体撮像素子の反りがよりプラ
スになるという傾向があった。
Since the solid-state image pickup device 3 is adhered to the ceramic package 1 via the thermosetting resin, it is heated during the adhesion.
The coefficient of thermal expansion is different between the ceramic and the silicon forming the solid-state image sensor 3, and the solid-state image sensor 3 is extremely elongated. Therefore, due to the difference in the coefficient of thermal expansion, the solid-state imaging device 3 causes a warp that cannot be ignored due to a change in temperature after adhesion. When the warp of the die pad portion 2 of the ceramic package is 0, the solid-state imaging device 3 warps positively (here, the positive warp means a warp in which the surface is convexly curved, and conversely, the negative warp is a concavely curved surface. Warp), the die pad portion 2 of the ceramic package
If the warp of the solid-state image pickup device becomes positive, the warp of the solid-state imaging device tends to become more positive.

本考案はこのような問題点を解決すべく為されたもの
であり、固体撮像素子収納パッケージにおいて、収納さ
れる固体撮像素子に反りが生じることを防止することを
目的とする。
The present invention has been made to solve such a problem, and an object of the present invention is to prevent the solid-state imaging device housed in the package from being warped.

(E.問題点を解決するための手段) 本考案固体撮像素子収納パッケージは上記問題点を解
決するため、固体撮像素子が裏面全面にて接着剤を介し
て接着される固体撮像素子支持領域の表面を内側に寄る
程高くなる部分を有しない凹状に形成してなることを特
徴とする。
(E. Means for Solving Problems) In order to solve the above-mentioned problems, the solid-state image sensor housing package of the present invention has a solid-state image sensor support area to which the solid-state image sensor is adhered via an adhesive on the entire back surface. It is characterized in that the surface is formed in a concave shape having no portion that becomes higher toward the inside.

(F.作用) 本考案固体撮像素子収納パッケージによれば、固体撮
像素子支持領域の表面を凹状に形成しておくので、固体
撮像素子の接着により生じる反りによって固体撮像素子
の表面が略平坦になるようにすることができる。即ち、
固体撮像素子接着により固体撮像素子はプラスの方向に
反ろうとするが、それを見越して固体撮像素子支持領域
の表面に予めマイナスの反りを与えておくので接着後に
おける固体撮像素子の反りをほとんどなくすことができ
るのである。
(F. Action) According to the solid-state image sensor housing package of the present invention, since the surface of the solid-state image sensor support area is formed in a concave shape, the surface of the solid-state image sensor is made substantially flat due to the warpage caused by the adhesion of the solid-state image sensor. Can be. That is,
The solid-state image sensor tends to warp in the positive direction due to adhesion, but in anticipation of this, the surface of the solid-state image sensor support area is given a negative warp in advance, so there is almost no warp of the solid-state image sensor after bonding. It is possible.

(G.実施例)[第1図乃至第3図] 以下、本考案固体撮像素子収納パッケージを図示実施
例に従って詳細に説明する。
(G. Embodiment) [FIGS. 1 to 3] Hereinafter, a solid-state image sensor housing package of the present invention will be described in detail with reference to illustrated embodiments.

第1図は本考案固体撮像素子収納パッケージの第1の
実施例を示す断面図である。
FIG. 1 is a sectional view showing a first embodiment of a package for housing a solid-state image sensor according to the present invention.

本固体撮像素子収納パッケージは、ダイパッド部2に
マイナスの反りを与えたものである。具体的には1mm幅
で長さ約40mm、厚さ0.4mmの固体撮像素子3を支持する
ダイパッド部2に40μm程度のマイナスの反りを与え
た。
The present solid-state imaging device storage package is one in which the die pad portion 2 is given a negative warp. Specifically, a negative warp of about 40 μm was given to the die pad portion 2 that supports the solid-state imaging device 3 having a width of 1 mm, a length of about 40 mm, and a thickness of 0.4 mm.

すると、セラミックパッケージ1のダイパッド部2に
固体撮像素子3を接着した後における固体撮像素子3の
表面が平坦に、即ち、反りが0になった。
Then, the surface of the solid-state image sensor 3 after the solid-state image sensor 3 was bonded to the die pad portion 2 of the ceramic package 1 was flat, that is, the warpage was zero.

即ち、前述の通り、固体撮像素子3をダイパッド部2
に熱硬化性樹脂7で接着した場合、セラミックパッケー
ジ1と固体撮像素子3との熱膨張係数の違いによって固
体撮像素子3にプラスの反りが生じようとするが、固体
撮像素子3の下地となるダイパッド部2表面に予めマイ
ナスの反りを与えておくことにより接着後の温度変化に
よるプラス方向の反りによって固体撮像素子3の表面の
反りを略0にすることができたのである。
That is, as described above, the solid-state image sensor 3 is mounted on the die pad unit 2.
When the thermosetting resin 7 is adhered to the solid-state image pickup device 3, the solid-state image pickup device 3 tends to warp due to the difference in the thermal expansion coefficient between the ceramic package 1 and the solid-state image pickup device 3, but it becomes the base of the solid-state image pickup device 3. By imparting a negative warp to the surface of the die pad portion 2 in advance, the warp in the positive direction due to the temperature change after the adhesion can make the warp on the surface of the solid-state image pickup device 3 substantially zero.

セラミックパッケージ1のダイパッド部2にこのよう
な反りを設ける方法としては金型のダイパッド部2を成
形する部分の形状に適宜の反りを設ける方法が良い。
As a method of providing such a warp on the die pad portion 2 of the ceramic package 1, a method of providing an appropriate warp on the shape of a portion of the die for molding the die pad portion 2 is preferable.

第2図は本考案固体撮像素子収納パッケージの第2の
実施例を示す断面図である。
FIG. 2 is a sectional view showing a second embodiment of the solid-state image pickup device accommodating package of the present invention.

本実施例は、グリーンセラミックシート形成用金型の
形状によってダイパッド部2に反りを与えるのではな
く、印刷によりダイパッド部2に選択的に例えば厚さ40
μmのメタライズ膜8、8を形成することにより段階状
の凹状部を設けたものである。これによれば、ダイパッ
ド部2表面は凹曲面にはならず、段階状に真ん中の部分
が凹んだ形状になるが、接着後において固体撮像素子3
の表面が平坦になるという効果を第1の実施例の場合と
同様に奏することができる。そして、ダイパッド部対応
箇所に反り(プラスの反り)のあるグリーンセラミック
シート形成用金型を用いなくでも、単に印刷工程を1回
増すだけで、固体撮像素子3の表面を平坦にするという
目的を達成することができる。
In this embodiment, the die pad portion 2 is not warped by the shape of the die for forming the green ceramic sheet, but the die pad portion 2 is selectively printed to have a thickness of, for example, 40 mm.
By forming the metallized films 8 having a thickness of 8 μm, stepwise concave portions are provided. According to this, the surface of the die pad portion 2 does not have a concave curved surface, but has a shape in which the middle portion is depressed stepwise, but after the bonding, the solid-state imaging device 3
The effect of flattening the surface can be obtained as in the case of the first embodiment. The purpose of flattening the surface of the solid-state image sensor 3 is to simply increase the number of printing steps once without using a green ceramic sheet forming die having a warp (plus warp) at a portion corresponding to the die pad portion. Can be achieved.

第3図は本考案固体撮像素子収納パッケージの第3の
実施例を示す断面図である。
FIG. 3 is a sectional view showing a third embodiment of the solid-state image sensor storage package of the present invention.

本実施例は、第2の実施例のようにメタライズ膜8に
よって段階状の凹状部を設けるのではなく、セラミック
パッケージ1の内定面にそれと一体に突起部9、9を形
成することにより段階状の凹状部を設けたものである。
このようにしても第1及び第2の実施例の場合と同様に
固体撮像素子3の表面が平坦になるという効果を奏す
る。
In the present embodiment, unlike the second embodiment, the stepwise concave portions are not formed by the metallized film 8, but the stepwise portions 9 and 9 are formed integrally with the inner surface of the ceramic package 1 so as to form the stepwise concave portions. The concave portion is provided.
Even in this case, the effect that the surface of the solid-state image sensor 3 becomes flat is obtained as in the case of the first and second embodiments.

本固体撮像素子収納パッケージの段階状の凹状部の形
成には、グリーンセラミックシート形成用の金型の形状
により形成する方法と、セラミックパッケージ1の台と
なる第1層目のシートの表面に突起部形成用ペーストを
印刷する方法と、突起部形成用グリーンセラミックシー
トを積層する方法のいずれかを採ることができる。
For forming the stepwise concave portion of the present solid-state image pickup device housing package, a method of forming by a shape of a mold for forming a green ceramic sheet and a projection on a surface of a first layer sheet which is a base of the ceramic package 1 are formed. Either a method of printing a paste for forming a portion or a method of laminating a green ceramic sheet for forming a protrusion can be adopted.

このように、本考案は種々の態様で実施することがで
きる。そして、本考案は複数の固体撮像素子をペアリン
グするラインセンサー用パッケージにもきわめて有効で
ある。というのは、多色コピー等には複数の固体撮像素
子をペアリングして用いるが、その場合、互いにペアリ
ングされた固体撮像素子間に反り量のずれがあると、再
生像の品位が低下することになる。しかるに、本考案に
よれば各固体撮像素子の表面の反りを略0にできるの
で、このような品位低下を防止できるのである。
Thus, the present invention can be implemented in various ways. The present invention is also extremely effective for a line sensor package that pairs a plurality of solid-state image pickup devices. This is because multiple solid-state image sensors are paired and used for multicolor copying, but in that case, if there is a deviation in the amount of warpage between the paired solid-state image sensors, the quality of the reproduced image will deteriorate. Will be done. However, according to the present invention, since the warp of the surface of each solid-state image pickup device can be made substantially zero, such deterioration of quality can be prevented.

(H.考案の効果) 以上に述べたように、本考案固体撮像素子収納パッケ
ージは、固体撮像素子が裏面全面にて接着剤を介して接
着される固体撮像素子支持領域の表面を内側に寄る程高
くなる部分を有しない凹状に形成してなることを特徴と
するものである。
(H. Effect of the Invention) As described above, in the solid-state image pickup device housing package of the present invention, the surface of the solid-state image pickup device support region where the solid-state image pickup device is adhered via the adhesive on the entire back surface is moved inward. It is characterized in that it is formed in a concave shape having no moderately high portion.

従って、本考案固体撮像素子収納パッケージによれ
ば、固体撮像素子支持領域の表面を凹状に形成しておく
ので、固体撮像素子接着後に生じた反りによって固体撮
像素子の表面が略平坦になるようにすることができる。
Therefore, according to the solid-state image sensor housing package of the present invention, the surface of the solid-state image sensor support area is formed in a concave shape so that the surface of the solid-state image sensor becomes substantially flat due to the warpage that occurs after the solid-state image sensor is bonded. can do.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案固体撮像素子収納パッケージの第1の実
施例を示す断面図、第2図は本考案固体撮像素子収納パ
ッケージの第2の実施例を示す断面図、第3図は本考案
固体撮像素子収納パッケージの第3の実施例を示す断面
図、第4図(A)乃至(C)は固体撮像素子収納パッケ
ージの従来例を示すもので、同図(A)は平面図、同図
(B)は同図(A)のB−B線に沿う断面図、同図
(C)は同図(A)のC−C線に沿う断面図である。 符号の説明 1……固体撮像素子収納パッケージ、2……固体撮像素
子支持領域(ダイパッド部)、3……固体撮像素子。
FIG. 1 is a sectional view showing a first embodiment of a solid-state image sensor housing package of the present invention, FIG. 2 is a sectional view showing a second embodiment of a solid-state image sensor housing package of the present invention, and FIG. Sectional drawing which shows the 3rd Example of a solid-state image sensor storage package, FIGS. 4 (A) to 4 (C) show a conventional example of a solid-state image sensor storage package, and FIG. FIG. 6B is a sectional view taken along the line BB of FIG. 7A, and FIG. 7C is a sectional view taken along the line C-C of FIG. Explanation of reference numerals 1 ... Solid-state image sensor housing package, 2 ... Solid-state image sensor support area (die pad part), 3 ... Solid-state image sensor.

Claims (1)

(57)【実用新案登録請求の範囲】(57) [Scope of utility model registration request] 【請求項1】固体撮像素子が裏面全面にて接着剤を介し
て接着される固体撮像素子支持領域の表面を内側に寄る
程高くなる部分を有しない凹状に形成してなる ことを特徴とする固体撮像素子収納パッケージ
1. A solid-state image pickup device is formed by forming a concave shape having no portion which becomes higher toward an inner side of a surface of a solid-state image pickup device supporting region which is adhered via an adhesive on the entire back surface. Solid-state image sensor storage package
JP1989136159U 1989-11-22 1989-11-22 Solid-state image sensor storage package Expired - Lifetime JP2508608Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989136159U JP2508608Y2 (en) 1989-11-22 1989-11-22 Solid-state image sensor storage package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989136159U JP2508608Y2 (en) 1989-11-22 1989-11-22 Solid-state image sensor storage package

Publications (2)

Publication Number Publication Date
JPH0375552U JPH0375552U (en) 1991-07-29
JP2508608Y2 true JP2508608Y2 (en) 1996-08-28

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989136159U Expired - Lifetime JP2508608Y2 (en) 1989-11-22 1989-11-22 Solid-state image sensor storage package

Country Status (1)

Country Link
JP (1) JP2508608Y2 (en)

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Publication number Priority date Publication date Assignee Title
JP4620515B2 (en) * 2005-04-11 2011-01-26 ルネサスエレクトロニクス株式会社 Interposer, semiconductor device using the same, and method for manufacturing semiconductor device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55127029A (en) * 1979-03-26 1980-10-01 Hitachi Ltd Semiconductor device

Also Published As

Publication number Publication date
JPH0375552U (en) 1991-07-29

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