JP2507580B2 - Insulator pollution amount measuring method and device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention mainly relates to pollutants such as salt, sulfide, sulfate, gypsum, or cement adhered to the surface of various insulators such as suspension insulators and long stem insulators. The present invention relates to a standard sample used for measurement.

[Prior Art] In order to prevent accidents such as salt damage to the insulator of a power transmission line, it is important to accurately grasp the contaminant attached to the insulator as the equivalent salt attachment density.

The so-called X-ray pollution degree measurement method is one in which the insulator is irradiated with a primary ray from an X-ray tube targeting chromium, titanium, etc., and the amount of contamination is obtained from the intensity of fluorescent X-rays generated from the attached contaminants. First, the amount of contamination can be measured without contacting the insulator, secondly, the rain washing effect of the insulator can be accurately grasped, and the accumulated amount of contamination can be measured. Thirdly, the measurement accuracy is high and the measurement time is long. It is an ideal insulator fouling amount measurement method for three reasons. It is conceivable that the pollution measurement by the X-ray method is performed using a plurality of standard sample groups and a linear calibration curve showing the correlation between the concentration of the element to be measured and the fluorescent X-ray intensity.

However, there was a problem in how to obtain the calibration curve, and it was found that accurate stain measurement could not be performed.

An object of the present invention is to provide an insulator pollution amount measuring method and an apparatus therefor capable of accurately measuring the pollution amount of an insulator.

[Means for Solving the Problem] In order to achieve the above object, the invention according to claim 1 applies X-rays to an element-containing standard sample group that contains an element to be measured and the element content of which differs stepwise. The first step of irradiating and measuring the fluorescent X-ray intensity of each sample, and irradiating the non-containing standard sample which is made of a base material of the same material as the element-containing standard sample and does not contain the element with X-rays, It was obtained by subtracting the fluorescent X-ray intensity obtained in the second step from the second step of measuring the fluorescent X-ray intensity and the plurality of fluorescent X-ray intensities obtained in the first step. The third step of obtaining the first calibration curve showing the correlation between the element content of the standard sample and the fluorescent X-ray degree from a plurality of fluorescent X-ray intensities, and the element is attached to the surface of the insulator to be measured, A second calibration curve showing the correlation between the fluorescent X-ray intensity and the element concentration is irradiated with X-rays. A fourth step to be obtained and a fifth step to obtain a third calibration curve showing the correlation between the element concentration on the surface of the insulator to be measured and the element content of the standard sample based on the first and second calibration curves And irradiate the measuring point of the insulator to be measured with X-rays, measure the fluorescent X-ray intensity at the measuring point, and calculate the element content of the standard sample from this X-ray intensity using the first calibration curve. A sixth step, and a seventh step of obtaining the element concentration at the measurement point of the insulator to be measured from the element content of the standard sample obtained in the sixth step based on the third calibration curve, It has.

Also, in the invention of claim 2, in place of the sixth step and the seventh step in claim 1, the X-ray intensity of only a standard sample of the same material as the insulator to be measured to which no element is attached is The sixth step to be obtained and the measurement point of the insulator to be measured are irradiated with X-rays, the fluorescent X-ray intensity at the measurement point is measured, and the X-ray intensity obtained in the sixth step is subtracted from this X-ray intensity. Then, the element content of the standard sample is calculated from the subtracted fluorescence X intensity using the first calibration curve.
And the eighth step of obtaining the element concentration at the measurement point of the insulator to be measured from the element content of the standard sample obtained in the seventh step based on the third calibration curve. There is.

Further, in the invention according to claim 3, in order to achieve the above object, a plurality of element-containing standard samples containing the element to be measured and the element contents of which are different stepwise, and the same material as the element-containing standard sample The standard sample which is made of the above base material and does not contain the above element, the standard sample which has the same material as the insulator to which the element is not attached, and the above standard samples are irradiated with X-rays to measure the fluorescent X-ray intensity. The fluorescent X-ray intensity measuring device, the fluorescent X-ray intensities detected from the standard samples and the insulators to be measured, and the concentration of the element to be measured in each standard sample. And a control device for calculating the element concentration at the measurement point of the insulator to be measured by a calibration curve.

In the invention described in claim 3, the element-containing standard sample, the non-containing standard sample, and the standard sample of the same material as the insulator to be measured may be mounted on a rotatable mounting disk.

[Operation] In the invention according to claim 1, a plurality of fluorescences obtained by subtracting the fluorescence X-ray intensities obtained in the second step from the plurality of fluorescence X-ray intensities obtained in the first step, respectively. The first calibration curve is accurately created by the third step of obtaining the first calibration curve from the X-ray intensity. If this subtraction is not carried out, the slope of the calibration curve becomes gentle in the region where the element content is small, and the measurement accuracy decreases. Moreover, 0.
It becomes difficult to measure the amount of element at a low concentration of 1% by weight or less.

Further, in the invention according to claim 2, the measuring point of the insulator to be measured is irradiated with X-rays, the fluorescent X-ray intensity at the measuring point is measured, and the X-ray obtained from the X-ray intensity in the eighth step. Subtract the intensity,
Since the element content of the standard sample is calculated from the subtracted fluorescent X-ray intensity using the first calibration curve, the fluorescent X-ray intensity generated from the insulator to be measured can be accurately measured.

[Embodiment] An embodiment of the present invention will be described below with reference to FIGS. 1 to 5.

In this embodiment, lithium tetraborate (or sodium tetraborate may be used) is used as the main component of the alkali metal oxide, and the lithium tetraborate and sodium chloride are mixed in an amount of about 0.01-
Mix 14% by weight, heat and stir to melt them, then inject them into a specified mold and mold them into a disk shape as shown in Fig. 1 to mold an alkali borate glass molded product and chlorine. Standard samples 1 to 3 having different contents are used.

The lithium tetraborate or sodium tetraborate is commercially available as a compound, but instead of this, after mixing lithium carbonate or sodium carbonate with anhydrous boric acid, and then mixing sodium chloride in approximately 0.01 to 14% by weight, These may be heated and stirred and melted. Further, other chlorides such as potassium chloride may be added instead of sodium chloride.

The standard samples 1 to 3 produced in this way are used to create a calibration curve by irradiating X-rays from the X-ray irradiating tube of the X-ray generator when measuring the attached salt content of insulators installed in salt-damaged areas. However, since it is an alkali borate glass, its composition hardly changes due to weather conditions such as moisture and temperature changes, and the composition does not change even when irradiated with X-rays. It has stability.

Next, the standard sample 1 for measuring the amount of fouling of insulators
How to use ~ 3 will be described.

First, in addition to a plurality of standard samples 1 to 3 having different chlorine concentrations, a standard sample 4 containing no chlorine and a standard sample 5 made of the same porcelain as the insulator whose surface is not contaminated are prepared.

Each of these standard samples 1 to 5 is fitted and fixed to the mounting disk 6 as shown in FIG. 2, and supported by a rotation supporting device (not shown).

Next, for the standard samples 1 to 5, the X-ray irradiation tube 7 of the X-ray generator is used.
The primary X-rays are sequentially emitted from the detector and the fluorescent X-rays are detected by the detector 8
Fluorescence X-ray intensity M1 to M5 of each standard sample 1 to 5 detected by
To measure. Then, the fluorescent X-ray intensities M4 of the standard sample 4 not containing chlorine are subtracted from the fluorescent X-ray intensities M1 to M3, respectively, and the chlorine content and the fluorescence of the standard samples 1 to 3 are subtracted as shown in FIG. Plot each data with X-ray intensities M1 to M3 (Kcps), create a calibration curve H1 using the least squares method based on this, and use this calibration curve H1 as an equation in the memory (not shown) of the controller.
To memorize. In FIG. 3, data obtained from 6 standard samples are plotted. Further, in the calibration curve H1 showing the chlorine content of the standard sample shown in FIG. 3, if the measurement value of the standard sample 4 not containing chlorine is not subtracted, the chlorine content as shown by the chain double-dashed line in the figure is shown. In the region where the amount is small, the slope of the calibration curve H1 becomes gentle and the measurement accuracy decreases. Moreover, it becomes difficult to measure the chlorine content at a low concentration of 0.1% by weight or less.

On the other hand, as shown in FIG. 4, the relationship between the chlorine concentration on the porcelain surface and the fluorescence X-ray intensity was determined by preparing a sample with salt attached to the porcelain surface, and measuring the fluorescence X-ray intensity of this sample using the above-mentioned calibration. Line H1
Measurement can be made at the same time as the preparation time, and this can be prepared as a calibration curve H2.

Therefore, the calibration curve H1 shown in FIG. 3 and the calibration curve shown in FIG.
H2 and H2 are combined into a single calibration curve H3 as shown in Fig. 5 using the fluorescent X-ray intensity as a parameter, and the calibration curve H3 showing the relationship between the chlorine concentration on the porcelain surface and the chlorine content of the standard sample is controlled using an equation. Store in device memory.

When a predetermined period has elapsed from the time when the calibration curve H3 was created and the contamination amount of the insulator to be measured was measured, first, the standard samples 1 to 5 were irradiated again with X-rays to create the calibration curve H1. A calibration curve H1 is created in the same manner as above, and this is stored as an equation in the memory of the control device. The reason why this operation is performed is that the X-ray measuring apparatus itself changes with time,
Fluorescent X-ray intensity M1 'even if the chlorine content of
~ M3 'decreases as shown by the one-dot chain line in Fig. 3 and the calibration curve
This is because it becomes H1 '.

Further, in synchronization with the preparation of the calibration curve H1 ′, the surface of the insulator to be measured is irradiated with X-rays, and the fluorescent X-ray intensities M1 to Mn at the respective measurement points P1 to Pn are measured. The X-ray intensity M5 of the standard sample 5 containing only porcelain without chlorine is subtracted from Mn, and the fluorescent X-ray intensities M1 ′ to Mn ′ thus subtracted are used to obtain the calibration curve H1 ′ shown in FIG. Chlorine content of standard sample by control device
Calculate R1 to Rn. The purpose of preparing the standard sample 5 is to
X-ray intensity of the standard sample 5 from the actual X-ray intensity M1 to Mn so that the fluorescence X-ray intensity generated from the measured insulator becomes more accurate.
This is because the measurement accuracy is improved by subtracting M5 from each.

Further, based on the equation of the calibration curve H3 shown in FIG. 5 stored in advance in the memory by the control device, the control device measures the chlorine content R1 to Rn from each measurement point of the insulator.
The chlorine concentrations T1 to Tn in P1 to Pn are calculated.

When the chlorine concentrations T1 to Tn are calculated, the salinity amounts W1 to Wn are calculated from this value by the control device. Let E be the atomic weight of sodium chloride (NaCl) and F be the atomic weight of chlorine.
Then, the salinity amounts W1 to Wn are calculated by the following equations stored in the memory of the control device.

W1 ~ Wn = T1 ~ Tn × (E / F) Since the salt adhesion density per unit area can be obtained from the salt content W1 ~ Wn of the measured insulator thus obtained, how much the measured insulator is It is possible to know if it is soiled.

The present invention can also be embodied as follows.

(1) In the above example, only the chlorine concentration content was measured with the standard samples 1 to 3, but for example, as shown in FIG. 6, a calibration curve of the sulfur content and the fluorescence X-ray intensity is created. A standard sample for sulfur analysis may be prepared.

Further, as shown in FIG. 7, it may be used as a standard sample for quantitative fluorine analysis for preparing a calibration curve showing the relationship between the fluorescent X-ray intensity and the fluorine content.

Further, although not shown, a standard sample for preparing a calibration curve showing the relationship between the fluorescent X-ray intensity and the calcium content is prepared, and further, at least two kinds of chlorine, sulfur, fluorine and calcium are uniformly prepared. The composition may be arbitrarily modified and embodied, for example, by mixing them to form a standard sample without departing from the spirit of the present invention.

(2) In the above embodiment, the disk-shaped standard samples 1 to 4 were molded, but the shape should be an arbitrary shape such as a triangle or a quadrangle whose measurement surface is flat.

(3) In the above-mentioned embodiment, the standard sample for measuring the amount of fouling of the insulator was explained, but in addition to this, a standard sample for measuring chlorine content, sulfur content, etc. of concrete, rock, polymer film, resin glass, etc. May be used as.

(4) When measuring the amount of contamination of the insulator to be measured, the number of standard samples containing the element to be measured used may be one or more, and the greater the number, the better the measurement accuracy. However, when there is only one standard sample containing the element to be measured, the calibration curve H1 'is created using the measured value obtained by the above method and the slope of H1.

[Effects of the Invention] As described in detail above, the present invention has the effect of accurately measuring the amount of contamination on the surface of the insulator to be measured.

[Brief description of drawings]

1 is a perspective view of a standard sample, FIG. 2 is a perspective view showing a state in which the standard sample is fitted to a mounting disk, and FIG. 3 shows the relationship between the fluorescence X-ray intensity and the chlorine content of the standard sample. Calibration curve graph, FIG. 4 is a calibration curve graph showing the relationship between the fluorescence X-ray intensity and the chlorine concentration on the porcelain surface, and FIG. 5 is the chlorine content created based on the calibration curves of FIGS. 3 and 4. Calibration curve graph showing the relationship between chlorine concentration and chlorine concentration, FIG. 6 is a calibration curve graph showing the relationship between fluorescent X-ray intensity and sulfur content, and FIG. 7 is the relationship between fluorescent X-ray intensity and fluorine content. It is a calibration curve graph which shows. 1-5 ... Standard sample, 6 ... Mounting disk, 7 ... X-ray irradiation tube, 8 ... Detector, H1 to H3 ... Calibration curve.

Claims (4)

(57) [Claims] 1. A first step of measuring the fluorescent X-ray intensity of each sample by irradiating an element-containing standard sample group containing an element to be measured and the element content of which varies stepwise with X-rays. A second step of irradiating an X-ray to a non-containing standard sample made of a base material of the same material as the element-containing standard sample and not containing the element, and measuring the fluorescent X-ray intensity, the first step From the multiple X-ray fluorescence intensities obtained in
A first calibration curve showing the correlation between the elemental content of the standard sample and the fluorescent X-ray intensity is obtained from a plurality of fluorescent X-ray intensities obtained by subtracting the fluorescent X-ray intensities obtained in And the step of attaching an element to the surface of the insulator to be measured, irradiating the surface with X-rays, and showing the correlation between the fluorescent X-ray intensity and the element concentration.
And a third step of obtaining a correlation between the element concentration on the surface of the insulator to be measured and the element content of the standard sample based on the first and second calibration curves.
5th step of obtaining the calibration curve of X, and the measurement point of the insulator to be measured is irradiated with X-rays, and fluorescence X of the measurement point is measured.
A sixth step of measuring the line intensity and calculating the element content of the standard sample from the fluorescent X-ray intensity using the first calibration curve, and the sixth step based on the third calibration curve. A seventh step of obtaining the element concentration at the measuring point of the insulator to be measured from the element content of the standard sample obtained in (4), 2. The sixth step of obtaining the X-ray intensity of only a standard sample made of the same material as the insulator to be measured, which does not adhere to the element, in place of the sixth step and the seventh step. And irradiate the measurement point of the insulator to be measured with X-rays, and measure the fluorescence X of the measurement point.
The line intensity is measured, the X-ray intensity obtained in the sixth step is subtracted from this X-ray intensity, and the element content of the standard sample is calculated from this subtracted fluorescence X intensity using the first calibration curve. A seventh step, and an eighth step of obtaining the element concentration at the measurement point of the insulator to be measured from the element content of the standard sample obtained in the seventh step based on the third calibration curve, A method for measuring the amount of insulator fouling provided. 3. A plurality of element-containing standard samples that contain an element to be measured and whose element contents differ stepwise, and a base material made of the same material as the element-containing standard sample, which does not contain the element. A standard sample, a standard sample of the same material as the insulator to be measured which is not attached with an element, a fluorescent X-ray intensity measuring device for irradiating each of the standard samples with X-rays to measure the fluorescent X-ray intensity, and each of the standards. Each fluorescence X detected from the sample and the insulator to be measured
An insulator fouling comprising: a controller that calculates the element concentration at the measurement point of the insulator to be measured by the first to third calibration curves created based on the line strength and the concentration of the element to be measured in each standard sample. Quantity measuring device. 4. The insulator pollution amount measuring device according to claim 3, wherein the element-containing standard sample, non-containing standard sample and standard sample made of the same material as the insulator to be measured are mounted on a rotatable mounting disk.