CN109490348A - XRF detector and standard specimen calibrating installation for XRF detector - Google Patents
XRF detector and standard specimen calibrating installation for XRF detector Download PDFInfo
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- CN109490348A CN109490348A CN201910053905.8A CN201910053905A CN109490348A CN 109490348 A CN109490348 A CN 109490348A CN 201910053905 A CN201910053905 A CN 201910053905A CN 109490348 A CN109490348 A CN 109490348A
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- driving device
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- support plate
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- standard specimen
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
- G01N2223/3037—Accessories, mechanical or electrical features calibrating, standardising standards (constitution)
Abstract
The invention discloses a kind of XRF detector and for the standard specimen calibrating installation of XRF detector.Standard specimen calibrating installation includes: first driving device, for connecting and detector body being driven to move；Support plate, support plate are equipped with several sample mounting structures for being used to be fixedly connected standard sample；It is connected to the second driving device of support plate, for driving support plate to move；The controller of signal connection first driving device and the second driving device, for controlling the start and stop of first driving device Yu the second driving device, the test position of selected standard sample alignment detector ontology is made with the driving by first driving device and the second driving device.Pass through the use of the standard specimen calibrating installation, standard sample can be arranged in support plate, the driving of first driving device and the second driving device can make selected standard sample move to test position, it is not necessary that the efficiency of calibration can be improved as manually placing standard sample one by one in test position in the prior art.
Description
Technical field
The present invention relates to the apparatus field of application XRF technology, in particular to a kind of XRF detector and for XRF detector
Standard specimen calibrating installation.
Background technique
XRF (X-ray fluorescence spectra analysis, X Ray Fluorescence) technology has been successfully applied multiple at present
Field, such as environment (soil element analysis, combustion ash elemental analysis), food (elemental analysis in various foods, element point in feed
Analysis), chemistry (coating elements analysis, petroleum elemental analysis), metal and nonmetal (various ores, noble metal constituent), electronics electricity
Gas product (analysis of multiple electric parts harmful substance) etc..
XRF technology is based on foundation of physics, the x-ray bombardment that the high-power electron beam excitation target generated using filament is generated
Sample generates secondary features X-ray, and the energy intensity of these characteristic X-rays is different, and intensity and element are one-to-one relationship,
And its intensity and the concentration of element are positively correlated, and therefore, can carry out qualitative and quantitative analysis to sample by XRF technology.
For the repeatability and accuracy obtained, need to establish the standard curve of the relationship of concentration and X-ray intensity.Mesh
Before, for the XRF detector of application XRF technology test sample element, usually built-in sample curves database.
However, over time, aging can occur for the electric element such as receiver in XRF detector, to instrument
Stability and the resolution capability of instrument can all generate drift, cause the test result obtained with built-in standard curve and true
As a result there is deviation, thus need after a period of use to calibrate standard curve in XRF detector.
A kind of typical calibrating mode is that manually sample is placed on one by one on XRF detector to carry out calibration at present, with
Generate calibration curve, calibration expend time is longer, efficiency is lower.
Therefore, how calibration efficiency is improved, be a technical problem that technical personnel in the field need to solve at present.
Summary of the invention
In view of this, the object of the present invention is to provide a kind of standard specimen calibrating installation for XRF detector, calibration
Efficiency is higher.It is a further object of the present invention to provide a kind of XRF detector including above-mentioned standard specimen calibrating installation, calibrations
Efficiency it is higher.
To achieve the above object, the invention provides the following technical scheme:
A kind of standard specimen calibrating installation for XRF detector, comprising:
First driving device, for connecting and detector body being driven to move；
Support plate, the support plate are equipped with several sample mounting structures for being used to be fixedly connected standard sample；
It is connected to the second driving device of the support plate, for driving the support plate to move；
Signal connects the controller of the first driving device Yu second driving device, drives for controlling described first
The start and stop of dynamic device and second driving device, to pass through the driving of the first driving device and second driving device
Make the test position of selected standard sample alignment detector ontology.
It preferably, further include sliding block, the sliding block is slidably connected to linear guide, and the sliding block is equipped with to be connected for fixed
The detector connection structure of detector body is connect, the first driving device is connected to the sliding block, to drive the sliding block to exist
It is slided in the linear guide.
Preferably, the support plate is arranged in parallel with the linear guide, and second driving device is rotation driving dress
It sets, the rotation center position of the support plate is fixedly connected on the output shaft of second driving device, the second driving dress
The output shaft set is perpendicular to the support plate, to drive the support plate rotation come adjustment criteria by second driving device
The vertical range of sample and the linear guide.
Preferably, the support plate is equipped with the sample position sensing of the position for detecting the sample mounting structure
Device, the sample position sensor signal are connected to the controller.
Preferably, all sample mounting structures are divided into several mounting structure groups, in each mounting structure group
All sample mounting structures set gradually along by the circle track in the center of circle of the rotation center position, each peace
The radius of the corresponding circle track of assembling structure group is different, so that all sample mounting structures are with the rotation center position
Center is set to arrange in arachnoid.
Preferably, all sample position sensors are sequentially arranged in one using the rotation center position as the circle in the center of circle
It encloses on track；The sample mounting structure of each position is correspondingly provided with the sample position sensor in circumferential direction.
Preferably, the linear guide be equipped with for detector body on the extending direction of the linear guide
The detector position sensor that position is positioned, the detector position sensor signal are connected to the controller；It is described
Sample mounting structure and the radial distance of the rotation center position are mounting distance, the sample under each mounting distance
Product mounting structure is correspondingly provided with the detector position sensor.
Preferably, null pick-up is additionally provided in the support plate, the null pick-up signal is connected to the control
Device, the controller can determine whether the support plate rotates a circle according to the detection of the null pick-up.
Preferably, two linear guides are set to the two sides of the support plate in parallel, one of them described linear guide
On the sliding block be used to be fixedly connected one end of detector body, the sliding block in another described linear guide is for solid
Surely the other end of detector body is connected.
A kind of XRF detector, including detector body and test cabinet further include standard specimen calibration as described in any one of the above embodiments
Device, the standard specimen calibrating installation are set in the test cabinet, and the test cabinet is equipped with test window, so that the detector
Ontology tests product to be measured by the test window.
Provided by the present invention for the standard specimen calibrating installation of XRF detector, comprising: first driving device, for connecting simultaneously
Drive detector body movement；Support plate, support plate are equipped with several sample mounting structures for being used to be fixedly connected standard sample；
It is connected to the second driving device of support plate, for driving support plate to move；Signal connects first driving device and the second driving
The controller of device, for controlling the start and stop of first driving device Yu the second driving device, to pass through first driving device and the
The driving of two driving devices makes the test position of selected standard sample alignment detector ontology.
By the use of the standard specimen calibrating installation, standard sample can be arranged in support plate, first driving device with
The driving of second driving device can make selected standard sample move to test position, without as manually putting one by one in the prior art
Standard sample is set in test position, the efficiency of calibration can be greatly improved, especially in XRF detector due to using duration
After increase, frequency to be tested is needed also to will increase, the result for improving working efficiency with the standard specimen calibrating installation is also more obvious.
XRF detector provided by the invention including above-mentioned standard specimen calibrating installation, the efficiency of calibration are higher.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of invention for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is the top view (hiding controller) of standard specimen calibrating installation provided by the present invention in stand-by mode；
Fig. 2 be standard specimen calibrating installation provided by the present invention in the calibration mode top view (hide first driving device and
Controller)；
Fig. 3 be standard specimen calibrating installation provided by the present invention in test mode top view (hide first driving device and
Controller)；
Fig. 4 is that the rearview of standard specimen calibrating installation provided by the present invention (hides first driving device, controller and detector
Ontology)；
Fig. 5 is the side view of standard specimen calibrating installation provided by the present invention；
Fig. 6 is the top view of support plate in standard specimen calibrating installation provided by the present invention.
Fig. 1 is into Fig. 6:
1- first straight line guide rail, the first sliding block of 2-, 3- the first detector position sensor, the second detector position of 4- sensing
Device, 5- third detector position sensor, the 4th detector position sensor of 6-, the 5th detector position sensor of 7-, 8- branch
Support plate, 9- rotation center position, 10- standard sample, 11- test cabinet baffle, 12- test window, the second sliding block of 13-, 14- second
Linear guide, 15- detector body, the second driving device of 16-, 17- sample position sensor, 18- null pick-up, 19-
One driving device, 20- controller, 21- sample mounting structure.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
Core of the invention is to provide a kind of standard specimen calibrating installation for XRF detector, and the efficiency of calibration is higher.
Another core of the invention is to provide a kind of XRF detector including above-mentioned standard specimen calibrating installation, the efficiency of calibration compared with
It is high.
In a kind of specific embodiment of standard specimen calibrating installation provided by the present invention for XRF detector, Fig. 1 is please referred to extremely
Fig. 6, including first driving device 19, support plate 8, the second driving device 16 and controller 20.First driving device 19 is for connecting
It connects and detector body 15 is driven to move.Support plate 8 is equipped with several sample installations for being used to be fixedly connected standard sample 10
Structure 21, sample mounting structure 21 is for being fixedly connected with standard sample, by detector body to the Self -adaptive of standard sample
Calibration curve, to calibrate the corresponding standard curve of standard sample of the same race.Second driving device 16 is connected to support plate 8, and second drives
Dynamic device 16 is for driving support plate 8 to move.20 signal of controller connects first driving device 19 and the second driving device 16, control
Device 20 processed is used to control the start and stop of first driving device 19 and the second driving device 16, to pass through first driving device 19 and second
The driving of driving device 16 makes selected standard sample 10 move to the test position of alignment detector ontology 15.
Wherein, controller 20 can be connect with the control system signal in detector body 15, or integrate directly into spy
It surveys in the control system in device ontology 15, certainly, the control system in controller 20 and detector body 15 can also respectively solely
It is vertical to be controlled.Control of the controller 20 for first driving device 19 and the second driving device 16, specifically can be by the people that works
Member's on-line operation, or controlled by program prefabricated in controller 20.
In calibration, the standard sample 10 of test in need can be each attached in support plate 8, detector body
15 are connected in first driving device 19.Standard sample 10 may have one or at least two, the mark placed in support plate 8
Quasi- sample 10 may be different types of.
In the case where standard sample 10 has at least two, standard sample 10 can be one by one as selected standard sample 10
It is calibrated.Specifically, a standard sample 10 in support plate 8 is first selected as selected standard sample, first driving device
19 driving detector bodies 15 move, and the second driving device 16 drives support plate 8 to move, until selected standard sample moves to spy
Then the test position for surveying device ontology 15 starts detection calibration work.After the completion of this selectes the detection calibration work of standard sample,
Another standard sample 10 in selected support plate 8 repeats above operation, until completing the detection calibration of all standard samples 10
Work.In detection calibration work, test data generates best alignment curve after being handled by the control system of XRF detector.
By the use of the standard specimen calibrating installation, standard sample 10 can be arranged in support plate 8, first driving device
19 and second driving device 16 driving can make selected standard sample 10 move to test position, without as in the prior art by
The efficiency of calibration can be greatly improved in test position in one artificial standard sample 10 of placing, especially XRF detector with
After the increase of duration, frequency to be tested is needed also to will increase, the result of working efficiency is improved with the standard specimen calibrating installation
Also more obvious.
On the basis of the above embodiments, which can also include sliding block, and sliding block is slidably connected at straight line
Detector connection structure is provided on guide rail, on sliding block, detector connection structure is for being fixedly connected with detector body 15.It is optional
Ground, detector connection structure can be clamping structure, fixture or other connectors.First driving device 19 is connected to sliding block,
To drive sliding block to slide in linear guide.That is, the test position in detector body 15 is extended along linear guide
Rectilinear direction it is mobile, and then motion path convenient for determining standard sample 10.
Optionally, first driving device 19 can be motor, cylinder or other drivers.
On the basis of the above embodiments, support plate 8 can be arranged in parallel with linear guide, and the second driving device 16 is rotation
Rotary driving device, the rotation center position 9 of support plate 8 are fixedly connected on the output shaft of the second driving device 16, the second driving dress
16 output shaft is set perpendicular to support plate 8, to drive the rotation of support plate 8 come adjustment criteria sample 10 by the second driving device 16
With the vertical range of linear guide.Preferably, support plate 8 is disk, and rotation center position 9 is the center of circle of the support plate 8.
Since sliding block is that the rectilinear direction extended along linear guide is slided in linear guide, it is fixed on sliding block
Vertical range between test position and the linear guide of detector body 15 is constant.Wherein, for detector body 15, lead to
The standing region for setting transmitter and receiver is test position.After selected standard sample 10, the driving support of the second driving device 16
Disk 8 rotation with adjust the vertical range between selected standard sample 10 and linear guide to test both position and linear guide
Between vertical range it is equal, meanwhile, position of the adjusting slider in linear guide, make test position in the extension side of linear guide
It is identical as the selected position of standard sample 10 upwards.
Fig. 1 can be specifically referred to, in the figure, the center for testing position is located on the line A parallel with linear guide.It is testing
When the selected standard sample 10 ' that calibration is selected, the second driving device 16 driving support plate 8, which rotates clockwise, makes selected standard sample
10 ' center is fallen on line A, and the center of selected standard sample 10 ' can fall within the B point on line A, and the driving of first driving device 19 is visited
It surveys device ontology 15 and moves right to test position and be located at B point, to make the test of selected 10 ' alignment detector ontology 15 of standard sample
Position, can carry out calibration.
Using the linear slide of the rotatable engagement sliding block of support plate 8, different location in support plate 8 is realized with can be convenient
The position of standard sample 10 adjusts, while being conducive to save the occupied space of standard specimen calibrating installation.
On the basis of the above embodiments, the position for test sample mounting structure 21 can be set in support plate 8
Sample position sensor 17,17 signal of sample position sensor are connected to controller 20.
Optionally, sample position sensor 17 can be reflactor type photoelectric sensor, reflactor type photoelectric sensor packet
Include reflactor type photoelectric sensor ontology and barn door.A reflactor type can be correspondingly arranged at each sample mounting structure 21
Correspondingly screening can be set in the position of the vertical range same distance with linear guide to test position in photoelectric sensor ontology
Tabula rasa, reflactor type photoelectric sensor ontology can cooperate with corresponding barn door as switch.When reflactor type photoelectric sensing
When device ontology moves to corresponding shading Board position, it is out of service so that support plate 8 that controller 20 controls the second driving device 16
Stop motion is tested on position and has fallen standard sample 10.Wherein, barn door is fixed relative to linear guide position.In addition, with rotation
Center 9 can correspond to and the same barn door apart from identical sample mounting structure 21.Or above-mentioned sample position passes
Sensor 17 can be replaced with Hall sensor by reflactor type photoelectric sensor, and reflactor type photoelectric sensor ontology replaces with suddenly
That sensor body, correspondingly, barn door replaces with magnet, is equally able to detect the position of sample mounting structure 21, and then make
Controller 20 is out of service according to the second driving device 16 of the signal of Hall sensor control.Certainly, sample position sensor 17
It can also carry out other settings.
Optionally, sample position sensor 17 can be set in the first side of support plate 8, and sample mounting structure 21 is set
It sets in opposite with first side second side in support plate 8.In addition, sample mounting structure 21 and detector body 15 can be with
The two sides of support plate 8 are separately positioned on, and the material production that support plate 8 specifically can select X-ray to be transmissive to, or supporting
Through loophole is equipped on disk 8, so that the X-ray of detector body 15 can be irradiated on standard sample 10 through loophole.
On the basis of the above embodiments, all samples mounting structure 21 is divided into several mounting structure groups, often
All samples mounting structure 21 in a mounting structure group is successively set along with rotation center position 9 for the circle track in the center of circle
Set, the radius of the corresponding circle track of each mounting structure group is different, as shown in Fig. 2, all samples mounting structure 21 to rotate in
It arranges centered on heart position 9 in arachnoid.Wherein, one, two or more than two can be set in mounting structure group.
In the present embodiment, since the sample mounting structure 21 in same mounting structure group is at a distance from rotation center position 9
Be it is identical, support plate 8 rotation one circle, the position of detector body can be constant, can be to the mark in a mounting structure group
Quasi- sample 10 is successively tested, convenient for operation.
On the basis of the above embodiments, all sample position sensors 17 can be sequentially arranged in one with the rotation
Turn on the circle track that center 9 is the center of circle, the sample mounting structure 21 of each position is correspondingly provided with sample position in circumferential direction
Set sensor 17.Wherein, ray is radially done using rotation center position as starting point, the sample mounting structure 21 on same ray
Circumferential position it is identical.The identical sample mounting structure 21 of circumferential position can be determined by the same sample position sensor 17
Position, it is possible to reduce the setting quantity of sample position sensor 17, to save cost of manufacture.
On the basis of the above embodiments, prolonging in linear guide is can be set for detector body 15 in linear guide
The detector position sensor that the position on direction is positioned is stretched, detector position sensor signal is connected to controller 20.
Sample mounting structure 21 and the radial distance of rotation center position 9 are mounting distance, and the sample under each mounting distance installs knot
Structure 21 is respectively corresponded equipped with detector position sensor.
Wherein, mounting distance it is corresponding with detector position sensor refer to rise with rotation center position 9 to straight line lead
Rail is vertical line S, and in linear guide, detector position sensor is correspondingly provided under each mounting distance with vertical line S.Tool
Body can refer to Fig. 2, and the sample mounting structure 21 in first mounting structure group D is F, phase at a distance from rotation center position 9
The vertical range of Ying Di, first detector position sensor 3 and vertical line S corresponding with this first mounting structure group D are similarly
F；Sample mounting structure 21 in second mounting structure group C is G at a distance from rotation center position 9, correspondingly, with this second
The vertical range of the corresponding second detector position sensor 4 and vertical line S of mounting structure group C is similarly G.
Wherein, detector position sensor is specifically as follows reflactor type photoelectric sensor, reflactor type photoelectric sensor
Including reflactor type photoelectric sensor ontology and barn door, reflactor type photoelectric sensor ontology is arranged in linear guide, phase
Barn door can be set on sliding block in Ying Di, by the cooperation of barn door and reflactor type photoelectric sensor ontology to controller 20
Signal is transmitted, keeps the generation of controller 20 control instruction out of service to control first driving device 19, thus to detector body
15 are positioned along the extending direction of linear guide.Certainly, detector position sensor can also for Hall sensor or its
His sensing device.
Wherein, the quantity of detector position sensor can be set according to actual needs, be specifically as follows one, two or
Person at least two.The quantity of detector position sensor is preferably no less than the quantity of mounting structure group.Embodiment as shown in Figure 2
In, the mounting structure group of setting is two, the detector position sensor of setting be followed successively by the first detector position sensor 3,
Second detector position sensor 4, third detector position sensor 5.
Using detector position sensor is that controller 20 provides switching signal to control the operation of first driving device 19,
It is higher to control precision.
Based on any of the above embodiments, null pick-up 18 can also be set in support plate 8, the null pick-up
18 signals connect controller 20.Controller 20 can determine whether support plate 8 rotates a circle according to the detection of null pick-up 18.
Specifically, null pick-up 18 can be Hall sensor, including Hall sensor ontology and zero-bit magnet.It is propping up
Support plate 8 rotates initially, Hall sensor ontology and zero-bit magnet face, Hall sensor ontology again with zero-bit magnet phase
Clock synchronization, then support plate 8 has rotated one week, and controller 20 can further control first after the signal for receiving Hall sensor
Driving device 19 starts, to carry out the test of the standard sample 10 in next mounting structure group.Certainly, null pick-up 18 is gone back
It can be photoelectric sensor, fibre optical sensor etc..
Based on any of the above embodiments, two linear guides are set to the two sides of support plate 8 in parallel, as shown in Figure 1,
Respectively first straight line guide rail and second straight line guide rail.Sliding block in one of linear guide is for being fixedly connected with detector sheet
One end of body 15, the sliding block in another linear guide is used to be fixedly connected the other end of detector body 15, so as to mention
The stationarity that high detector body 15 is slided.
Specific use process is as follows for one kind of standard specimen calibrating installation provided by the present invention:
As shown in Figure 1, all components are waited under idle mode；
As shown in Fig. 2, controller 20 controls support plate 8 and rotates after entering calibration process, sample position sensor 17 is utilized
It is slided to determine that support plate 8 rotates selected standard sample to starting position, the control detector body 15 of controller 20 and first is calibrated
Block 2, the second sliding block 13 are moved to 3 position of the first detector position sensor.Detector body 15 starts detection calibration work.
After detection calibration starts, controller 20 is sensed using the first detector position sensor 3, the second detector position
The school of the successively standard sample 10 all in the complete support plate of calibration test such as device 4, sample position sensor 17, null pick-up 18
Standard, test data generate best alignment curve after being handled by the control system of detector body 15.
After detection calibration, controller 20 controls detector body 15, the first sliding block 2, the second sliding block 13 and returns to center
Standby position, controller 20 allow support plate 8 to return using the second driving device 16, null pick-up 18, sample position sensor 17 etc.
Enter standby mode to zero-bit.
Standard specimen calibrating installation in the present embodiment, first straight line guide rail 1, the first sliding block 2, second straight line guide rail 14, second
Sliding block 13, detector position sensor, first driving device 19 form linear guide positioning system, the driving dress of support plate 8, second
Set 16, sample position sensor 17, null pick-up 18 forms standard specimen calibration positioning system.Using mobile calibration test, lead to
Linear guide positioning system and standard specimen calibration positioning system combination are crossed, test can the successively complete all calibrations of follow-on test after starting
Sample realizes that multiple sample calibration tests are realized in lesser space, less electric component, ultimately produces optimal sample school
Directrix curve is to ensure accuracy when instrument and equipment test sample, reliability.
In addition to above-mentioned standard specimen calibrating installation, the present invention also provides a kind of XRF detectors, including detector body 15, mark
Sample calibrating installation and test cabinet, wherein standard specimen calibrating installation is specifically as follows the standard specimen calibration provided in any of the above embodiment
Device, beneficial effect can be corresponded to reference to the above various embodiments.Wherein, standard specimen calibrating installation is set in test cabinet, on test cabinet
Equipped with test window 12, so that detector body 15 tests product to be measured by test window 12.Standard specimen calibrating installation
It is set up directly on a part in XRF detector as XRF detector, calibration operation carries out that conveniently, equipment can be obtained in time
The parameters of element sensitivity decline etc., it is advantageously ensured that the accuracy and reliability of measurement result in actual use.
Refer to the prior art for the structure of other each sections of the XRF detector, and repeats no more herein.
Specifically, as shown in Fig. 2, test window 12 can successively be set with support plate 8 along the extending direction of linear guide
It sets, test window 12 and support plate 8 can be set between two linear guides.Test window 12 specifically can be set and test
On test cabinet baffle 11 on room.Sliding block is slided along the extending direction of linear guide, can test the standard sample in support plate 8
Product 10 test product to be measured to be calibrated, or through test window 12.In addition, can also be arranged in linear guide
The detector position sensor opposite with the position of test window 12, the 4th detector position sensor 6 as shown in Figure 2 and the
Five detector position sensors 7 are made with sending signal to controller 20 when detector body 15 moves at test window 12
Controller 20, which generates control instruction, makes 19 stop motion of first driving device, and the test position in detector body 15 stops at test
Window 12 is tested.
Each embodiment in this specification is described in a progressive manner, the highlights of each of the examples are with other
The difference of embodiment, the same or similar parts in each embodiment may refer to each other.
XRF detector provided by the present invention and standard specimen calibrating installation are described in detail above.It is used herein
A specific example illustrates the principle and implementation of the invention, and the above embodiments are only used to help understand
Method and its core concept of the invention.It should be pointed out that for those skilled in the art, not departing from this
, can be with several improvements and modifications are made to the present invention under the premise of inventive principle, these improvement and modification also fall into the present invention
In scope of protection of the claims.
Claims (10)
1. a kind of standard specimen calibrating installation for XRF detector characterized by comprising
First driving device (19), for connecting and driving detector body (15) to move；
Support plate (8), the support plate (8) are equipped with several sample mounting structures for being used to be fixedly connected standard sample (10)
(21)；
It is connected to the second driving device (16) of the support plate (8), for driving the support plate (8) to move；
Signal connects the controller (20) of the first driving device (19) and second driving device (16), for controlling
The start and stop of first driving device (19) Yu second driving device (16) are stated, to pass through the first driving device (19) and institute
The driving for stating the second driving device (16) makes the test position of selected standard sample (10) alignment detector ontology (15).
2. standard specimen calibrating installation according to claim 1, which is characterized in that further include sliding block, the sliding block is slidably connected
In linear guide, the sliding block is equipped with the detector connection structure for being fixedly connected with detector body (15), and described first
Driving device (19) is connected to the sliding block, to drive the sliding block to slide in the linear guide.
3. standard specimen calibrating installation according to claim 2, which is characterized in that the support plate (8) and the linear guide
It is arranged in parallel, second driving device (16) is rotation drive device, and the rotation center position (9) of the support plate (8) is solid
Surely it is connected to the output shaft of second driving device (16), the output shaft of second driving device (16) is perpendicular to the branch
Support plate (8), to drive support plate (8) rotation come adjustment criteria sample (10) and institute by second driving device (16)
State the vertical range of linear guide.
4. standard specimen calibrating installation according to claim 3, which is characterized in that the support plate (8) is equipped with for detecting
The sample position sensor (17) of the position of the sample mounting structure (21), sample position sensor (17) the signal connection
In the controller (20).
5. standard specimen calibrating installation according to claim 4, which is characterized in that all sample mounting structures (21) are divided into
Several mounting structure groups, all sample mounting structures (21) in each mounting structure group are along with the rotation
Center (9) is that the circle track in the center of circle is set gradually, the radius of the corresponding circle track of each mounting structure group
Difference, so that all sample mounting structures (21) are arranged centered on the rotation center position (9) in arachnoid.
6. standard specimen calibrating installation according to claim 5, which is characterized in that all sample position sensors (17) according to
It is secondary to be set to one with the rotation center position (9) as on the circle track in the center of circle；The sample peace of each position in circumferential direction
Assembling structure (21) is correspondingly provided with the sample position sensor (17).
7. standard specimen calibrating installation according to claim 5, which is characterized in that the linear guide is equipped with for detection
The detector position sensor that position of the device ontology (15) on the extending direction of the linear guide is positioned, the detection
Device position sensor signal is connected to the controller (20)；The sample mounting structure (21) and the rotation center position
(9) radial distance is mounting distance, and the sample mounting structure (21) under each mounting distance is correspondingly provided with institute
State detector position sensor.
8. according to the described in any item standard specimen calibrating installations of claim 3 to 7, which is characterized in that also set on the support plate (8)
Have null pick-up (18), null pick-up (18) signal is connected to the controller (20), controller (20) energy
It is enough to determine whether the support plate (8) rotates a circle according to the detection of the null pick-up (18).
9. according to the described in any item standard specimen calibrating installations of claim 3 to 7, which is characterized in that two linear guides are flat
Row is set to the two sides of the support plate (8), and the sliding block in one of them described linear guide is for being fixedly connected with detector
One end of ontology (15), the sliding block in another described linear guide is for being fixedly connected with the another of detector body (15)
End.
10. a kind of XRF detector, including detector body (15) and test cabinet, which is characterized in that further include claim 1 to 9
Described in any item standard specimen calibrating installations, the standard specimen calibrating installation are set in the test cabinet, and the test cabinet, which is equipped with, to be surveyed
It tries window (12), so that the detector body (15) tests product to be measured by the test window (12).
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Cited By (1)
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|---|---|---|---|---|
| DE102022119877A1 (en) | 2022-08-08 | 2024-02-08 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Calibration device for a measuring device and method for calibrating a measuring device |
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