JP2024048184A - Inspection method of hole defect detection device for metal band, and hole defect detection device for metal band - Google Patents

Inspection method of hole defect detection device for metal band, and hole defect detection device for metal band Download PDF

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JP2024048184A
JP2024048184A JP2022154086A JP2022154086A JP2024048184A JP 2024048184 A JP2024048184 A JP 2024048184A JP 2022154086 A JP2022154086 A JP 2022154086A JP 2022154086 A JP2022154086 A JP 2022154086A JP 2024048184 A JP2024048184 A JP 2024048184A
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metal strip
photodetector
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昂史 浮田
Takafumi Ukida
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JFE Steel Corp
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Abstract

PROBLEM TO BE SOLVED: To provide an inspection method of a hole defect detection device for a metal band, and a hole defect detection device for a metal band.
SOLUTION: An inspection method of a hole defect detection device for a metal band which optically detects a hole defect of a metal band, includes: irradiating over the whole width of the metal band with light from a first light source; detecting passing light that has passed through a hole of the metal band by an optical detector arranged on the opposite side to the first light source with the metal band held therebetween in a thickness direction to detect a hole defect; detecting diffuse reflection light reflected by the metal band by the optical detector by irradiating over the whole width of the metal band with light from a second light source arranged on the opposite side to the first light source with the metal band held therebetween in the thickness direction; and determining whether the optical detector is normal or abnormal on the basis of a characteristic value of the light detected by the optical detector.
SELECTED DRAWING: Figure 2
COPYRIGHT: (C)2024,JPO&INPIT

Description

本発明は、金属帯の穴あき欠陥検出装置の検査方法、及び、金属帯の穴あき欠陥検出装置に関する。 The present invention relates to an inspection method for a metal strip hole defect detection device and a metal strip hole defect detection device.

従来、鋼帯などの金属帯の連続製造ラインでは、連続的に搬送される金属帯を挟んだ上下に光源と検出器とを配置し、光源から照射されて金属帯の穴を通過した通過光を検出器で検出することによって、金属帯の穴あき欠陥を検出する穴あき欠陥検出装置を設けることが知られている。このような光学式の穴あき欠陥検出装置においては、検出器が通過光を検出していない状態が続いた場合に、実際に穴あき欠陥が無いことによるものなのか、検出器の異常によって通過光を検出できていないことによるものなのかの判断が困難である。 Conventionally, in continuous production lines for metal strips such as steel strips, a hole defect detection device is known in which a light source and a detector are arranged above and below the continuously transported metal strip, and the detector detects the light emitted from the light source that passes through holes in the metal strip. In such optical hole defect detection devices, when the detector continues to not detect the passing light, it is difficult to determine whether this is because there is actually no hole defect or because an abnormality in the detector is preventing it from detecting the passing light.

特許文献1には、鋼帯のコイル間の溶接部に対する穴欠陥検出が行われている間に、受光器の光検出器に診断光を入射して、受光器の光検出器からの光検出信号に基づいて受光器を診断する技術が開示されている。 Patent Document 1 discloses a technology in which diagnostic light is incident on the photodetector of the receiver while hole defect detection is being performed on the welded portion between coils of steel strip, and the receiver is diagnosed based on the light detection signal from the photodetector of the receiver.

特許文献2には、金属帯または受光部に向けて穴あき部分を模擬したスポット光を照射し、スポット光を穴あき部分として検出できた場合は、検出装置が正常と判定し、スポット光を穴あき部分として検出できなかった場合は、検出装置が異常と判定する技術が開示されている。 Patent document 2 discloses a technology in which a spot light simulating a perforated portion is irradiated onto a metal strip or a light receiving portion, and if the spot light can be detected as a perforated portion, the detection device determines that it is normal, and if the spot light cannot be detected as a perforated portion, the detection device determines that it is abnormal.

特許文献3には、受光部としてのカメラを点検する際に、小型の点検用シャッターを閉じてカメラの視野を遮るとともに、点検用小型照明から透過ガラスに向かって光を照射し、透過ガラスで反射した光をカメラが受光感知した場合は、カメラは良好であることをオペレータに知らせ、透過ガラスで反射した光をカメラが受光感知しなかった場合は、カメラは不良であることをオペレータに知らせる技術が開示されている。 Patent document 3 discloses a technology in which, when inspecting a camera acting as a light receiving unit, a small inspection shutter is closed to block the camera's field of view, and light is irradiated from a small inspection light toward a transparent glass; if the camera detects the light reflected by the transparent glass, the operator is informed that the camera is in good condition, and if the camera does not detect the light reflected by the transparent glass, the operator is informed that the camera is defective.

特開2013-11561号公報JP 2013-11561 A 特開2010-185679号公報JP 2010-185679 A 特開2017-3269号公報JP 2017-3269 A

しかしながら、特許文献1に開示された技術においては、受光器の診断時に、光検出器による光検出が、診断光の受光のみによるものなのか、穴欠陥の存在に伴う投光器からの受光を含むものなのかを区別できず、正確な穴欠陥検出を行うことができなくなる。そのため、鋼帯の溶接部以外では受光器の診断を行うことができない。 However, in the technology disclosed in Patent Document 1, when diagnosing the receiver, it is not possible to distinguish whether the light detection by the photodetector is due only to reception of diagnostic light or includes reception of light from the projector associated with the presence of a hole defect, making it impossible to perform accurate hole defect detection. As a result, it is not possible to diagnose the receiver other than at the welded parts of the steel strip.

特許文献2に開示された技術では、同一の検出器における金属帯幅方向の視野内でスポット光が当たらない部分の異常を確認することができない。 The technology disclosed in Patent Document 2 makes it impossible to check for abnormalities in areas not hit by the spot light within the field of view in the metal strip width direction of the same detector.

特許文献3に開示された技術では、カメラを点検する際に、金属帯の穴を検出するための光を点検用シャッターによって遮ってしまうため、カメラの点検中に金属帯の穴の有無を検査することができない。 In the technology disclosed in Patent Document 3, when inspecting the camera, the light used to detect holes in the metal band is blocked by the inspection shutter, making it impossible to check for holes in the metal band during camera inspection.

本発明は、上記課題に鑑みてなされたものであって、その目的は、金属帯の穴あき欠陥の検出を行いつつ、光検出器の異常を検出することができる金属帯の穴あき欠陥検出装置の検査方法、及び、金属帯の穴あき欠陥検出装置を提供することである。 The present invention has been made in consideration of the above problems, and its purpose is to provide an inspection method for a metal strip perforation defect detection device that can detect abnormalities in a photodetector while detecting perforation defects in the metal strip, and a metal strip perforation defect detection device.

上述した課題を解決し、目的を達成するために、本発明に係る金属帯の穴あき欠陥検出装置の検査方法は、金属帯の穴あき欠陥を光学的に検出する金属帯の穴あき欠陥検出装置の検査方法であって、第1の光源から前記金属帯の全幅にわたって光を照射し、前記金属帯を厚み方向で挟んで前記第1の光源とは反対側に配置された光検出器によって、前記金属帯の穴を通過した通過光を検出して、穴あき欠陥の検出を行うとともに、前記金属帯を厚み方向で挟んで前記第1の光源とは反対側に配置された第2の光源から前記金属帯の全幅にわたって光を照射して前記金属帯で反射された拡散反射光を前記光検出器によって検出し、前記光検出器が検出した光の特性値に基づいて、前記光検出器が正常であるか異常であるかを判定することを特徴とするものである。 In order to solve the above-mentioned problems and achieve the object, the inspection method for a metal strip perforation defect detection device according to the present invention is a method for optically detecting perforation defects in a metal strip, which is characterized in that light is irradiated from a first light source across the entire width of the metal strip, and a photodetector arranged on the opposite side of the metal strip from the first light source across the thickness of the metal strip detects the light that passes through the holes in the metal strip to detect the perforation defects, and light is irradiated from a second light source arranged on the opposite side of the metal strip from the first light source across the thickness of the metal strip to detect the diffuse reflected light reflected by the metal strip with the photodetector, and whether the photodetector is normal or abnormal is determined based on the characteristic value of the light detected by the photodetector.

また、本発明に係る金属帯の穴あき欠陥検出装置の検査方法は、上記の発明において、前記光の特性値は、光の強度であり、前記光検出器で検出された光の強度が、予め設定された前記光検出器の異常検出用の光の強度の閾値である異常閾値以上の場合には前記光検出器が正常であると判定し、前記異常閾値未満の場合には前記光検出器が異常であると判定することを特徴とするものである。 The inspection method for the metal strip hole defect detection device according to the present invention is characterized in that, in the above invention, the characteristic value of the light is the intensity of the light, and when the intensity of the light detected by the photodetector is equal to or greater than an abnormality threshold, which is a preset threshold value of the light intensity for detecting an abnormality of the photodetector, the photodetector is determined to be normal, and when the intensity of the light detected by the photodetector is less than the abnormality threshold, the photodetector is determined to be abnormal.

また、本発明に係る金属帯の穴あき欠陥検出装置は、金属帯の穴あき欠陥を光学的に検出する金属帯の穴あき欠陥検出装置であって、前記金属帯の全幅にわたって光を照射する第1の光源と、前記金属帯を厚み方向で挟んで前記第1の光源とは反対側に配置された光検出器と、前記金属帯を厚み方向で挟んで前記第1の光源とは反対側に配置され、前記金属帯の全幅にわたって光を照射する第2の光源と、前記光検出器が検出した光の特性値に基づいて、前記光検出器が正常であるか異常であるかを判定する判定装置と、を備えることを特徴とするものである。 The metal strip perforation defect detection device according to the present invention is a metal strip perforation defect detection device that optically detects perforation defects in a metal strip, and is characterized by comprising: a first light source that irradiates light across the entire width of the metal strip; a photodetector that is arranged on the opposite side of the metal strip from the first light source across the thickness of the metal strip; a second light source that is arranged on the opposite side of the metal strip from the first light source across the thickness of the metal strip and irradiates light across the entire width of the metal strip; and a determination device that determines whether the photodetector is normal or abnormal based on the characteristic values of the light detected by the photodetector.

また、本発明に係る金属帯の穴あき欠陥検出装置は、上記の発明において、前記光の特性値は、光の強度であり、前記判定装置は、前記光検出器で検出された光の強度が、予め設定された前記光検出器の異常検出用の光の強度の閾値である異常閾値以上の場合には前記光検出器が正常であると判定し、前記異常閾値未満の場合には前記光検出器が異常であると判定することを特徴とするものである。 The metal strip hole defect detection device according to the present invention is characterized in that, in the above invention, the characteristic value of the light is the intensity of the light, and the determination device determines that the light detector is normal when the intensity of the light detected by the light detector is equal to or greater than an abnormality threshold, which is a preset threshold value of the light intensity for detecting an abnormality of the light detector, and determines that the light detector is abnormal when the intensity of the light detected by the light detector is less than the abnormality threshold.

本発明に係る金属帯の穴あき欠陥検出装置の検査方法、及び、金属帯の穴あき欠陥検出装置は、金属帯の穴あき欠陥の検出を行いつつ、光検出器の異常を検出することができるという効果を奏する。 The inspection method and the metal strip perforation defect detection device according to the present invention have the advantage of being able to detect abnormalities in the photodetector while detecting perforation defects in the metal strip.

図1は、実施形態に係る連続製造ラインについて説明するための図である。FIG. 1 is a diagram for explaining a continuous production line according to an embodiment. 図2は、実施形態に係る穴あき欠陥検出装置を鋼帯搬送方向の下流側から見た概略図である。FIG. 2 is a schematic diagram of the perforation defect detection device according to the embodiment, as viewed from the downstream side in the steel strip transport direction. 図3は、実施形態に係る穴あき欠陥検出装置の概略構成を鋼帯幅方向から見た概略図である。FIG. 3 is a schematic diagram showing a schematic configuration of a perforation defect detection device according to an embodiment, as viewed in the width direction of a steel strip. 図4は、第2の光源からの点検光の照射が無い場合に、光検出器で検出された光の強度の一例を示す図である。FIG. 4 is a diagram showing an example of the intensity of light detected by the photodetector in the absence of irradiation of the inspection light from the second light source. 図5は、第2の光源からの点検光の照射が有る場合に、光検出器で検出された光の強度の一例を示す図である。FIG. 5 is a diagram showing an example of the intensity of light detected by the photodetector when the inspection light is irradiated from the second light source. 図6は、光検出器の異常時に、光検出器で検出された光の強度の一例を示す図である。FIG. 6 is a diagram showing an example of the intensity of light detected by the photodetector when the photodetector is abnormal.

以下に、本発明に係る金属帯の穴あき欠陥検出装置の検査方法、及び、金属帯の穴あき欠陥検出装置の実施形態について説明する。なお、本実施形態により本発明が限定されるものではない。 The following describes an embodiment of the inspection method for the metal strip perforation defect detection device according to the present invention, and the metal strip perforation defect detection device. Note that the present invention is not limited to this embodiment.

図1は、実施形態に係る連続製造ライン1について説明するための図である。 Figure 1 is a diagram for explaining the continuous production line 1 according to the embodiment.

図1に示すように、連続製造ライン1は、ペイオフリール2、テンションリール3、溶接機4、及び、穴あき欠陥検出装置5などを備えている。連続製造ライン1では、ペイオフリール2からコイル状に巻き取られた金属帯である鋼帯Sが巻き出され、所定の処理が施された後、テンションリール3でコイル状に巻き取られる。溶接機4は、先行する鋼帯Sと後行する鋼帯Sとを溶接する。穴あき欠陥検出装置5は、鋼帯Sの搬送に従って連続的に鋼帯Sの穴あき欠陥を検出する。なお、図1中の判定装置54は、穴あき欠陥検出装置5を構成する制御装置であり、鋼帯Sの穴あき欠陥の有無などを判定する。 As shown in FIG. 1, the continuous manufacturing line 1 includes a payoff reel 2, a tension reel 3, a welding machine 4, and a hole defect detection device 5. In the continuous manufacturing line 1, a steel strip S, which is a metal strip wound into a coil shape, is unwound from the payoff reel 2, and after a predetermined process is performed, it is wound into a coil shape by the tension reel 3. The welding machine 4 welds the preceding steel strip S to the following steel strip S. The hole defect detection device 5 continuously detects hole defects in the steel strip S as the steel strip S is transported. The judgment device 54 in FIG. 1 is a control device that constitutes the hole defect detection device 5, and judges the presence or absence of hole defects in the steel strip S.

図2は、実施形態に係る穴あき欠陥検出装置5を鋼帯搬送方向の下流側から見た概略図である。図3は、実施形態に係る穴あき欠陥検出装置5の概略構成を鋼帯幅方向から見た概略図である。 Figure 2 is a schematic diagram of the perforation defect detection device 5 according to the embodiment, as viewed from the downstream side in the steel strip conveying direction. Figure 3 is a schematic diagram of the general configuration of the perforation defect detection device 5 according to the embodiment, as viewed from the steel strip width direction.

図2及び図3に示すように、実施形態に係る穴あき欠陥検出装置5は、第1の光源51、第2の光源52、複数の光検出器53a,53b,53c,53d、及び、判定装置54などを備えている。なお、以下の説明において、複数の光検出器53a,53b,53c,53dを特に区別しない場合には、単に光検出器53とも記す。 2 and 3, the hole defect detection device 5 according to the embodiment includes a first light source 51, a second light source 52, a plurality of photodetectors 53a, 53b, 53c, and 53d, and a determination device 54. In the following description, when the plurality of photodetectors 53a, 53b, 53c, and 53d are not particularly distinguished from each other, they are also simply referred to as photodetectors 53.

第1の光源51は、鋼帯Sの表裏を貫通した穴あき欠陥の検出に用いる照明であり、鋼帯Sの下方から鋼帯Sの裏面に向けて、鋼帯Sの全幅(鋼帯幅方向全域)にわたって、穴あき欠陥を検出するための検出光L1を照射する。 The first light source 51 is an illumination source used to detect perforation defects that penetrate the front and back of the steel strip S, and irradiates detection light L1 from below the steel strip S toward the back of the steel strip S over the entire width of the steel strip S (entire area in the width direction of the steel strip) to detect perforation defects.

第2の光源52は、複数の光検出器53a,53b,53c,53dの異常(故障)の点検に用いる照明であり、鋼帯Sを厚み方向で挟んで第1の光源51とは反対側に配置されており、鋼帯Sの上方から鋼帯Sのおもて面に向けて、鋼帯Sの全幅にわたって、複数の光検出器53a,53b,53c,53dを点検するための点検光L3を照射する。 The second light source 52 is a light source used to inspect the multiple photodetectors 53a, 53b, 53c, and 53d for abnormalities (failures). It is positioned on the opposite side of the steel strip S from the first light source 51, sandwiching the steel strip S in the thickness direction, and irradiates inspection light L3 from above the steel strip S toward the front surface of the steel strip S, across the entire width of the steel strip S, for inspecting the multiple photodetectors 53a, 53b, 53c, and 53d.

複数の光検出器53a,53b,53c,53dは、鋼帯Sの全幅で穴あき欠陥を検出できるように、鋼帯Sを厚み方向で挟んで第1の光源51とは反対側に、鋼帯幅方向に沿って並んで配置されている。複数の光検出器53a,53b,53c,53dは、例えば、CCDイメージセンサを有するラインセンサカメラなどによって構成されており、それぞれの光軸が鋼帯Sのおもて面に直交するように配置され、鋼帯Sの幅方向における複数の光検出器53a,53b,53c,53dのそれぞれの受光範囲(視野範囲)が、隣り合う光検出器53同士で一部が重なり合うように設定されている。なお、鋼帯Sの幅方向全域で穴あき欠陥を検出することができれば、隣り合う光検出器53同士で受光範囲(視野範囲)の一部が必ずしも重なっている必要はない。 The multiple photodetectors 53a, 53b, 53c, and 53d are arranged side by side along the width direction of the steel strip S on the opposite side of the first light source 51, sandwiching the steel strip S in the thickness direction, so that perforation defects can be detected over the entire width of the steel strip S. The multiple photodetectors 53a, 53b, 53c, and 53d are, for example, composed of line sensor cameras having CCD image sensors, and are arranged so that their respective optical axes are perpendicular to the front surface of the steel strip S, and the light receiving ranges (field of view) of the multiple photodetectors 53a, 53b, 53c, and 53d in the width direction of the steel strip S are set so that adjacent photodetectors 53 partially overlap each other. Note that, as long as perforation defects can be detected over the entire width direction of the steel strip S, it is not necessary that adjacent photodetectors 53 have a portion of the light receiving range (field of view) overlap each other.

鋼帯Sに穴あき欠陥が存在しないときには、第1の光源51から鋼帯Sの裏面に向けて照射した検出光L1が、鋼帯Sの全幅にわたって鋼帯Sの裏面で反射されて、複数の53a,53b,53c,53dのいずれにも到達せず検出されない。一方、鋼帯Sに穴あき欠陥が存在する場合には、第1の光源51から鋼帯Sの裏面に向けて照射した検出光L1のうち、鋼帯Sの穴を通過した通過光L2が、複数の光検出器53a,53b,53c,53dの少なくとも1つに到達して検出される。 When there is no hole defect in the steel strip S, the detection light L1 irradiated from the first light source 51 toward the back surface of the steel strip S is reflected by the back surface of the steel strip S over the entire width of the steel strip S, and does not reach any of the multiple 53a, 53b, 53c, 53d and is not detected. On the other hand, when there is a hole defect in the steel strip S, the transmitted light L2, which is part of the detection light L1 irradiated from the first light source 51 toward the back surface of the steel strip S and passes through the hole in the steel strip S, reaches at least one of the multiple photodetectors 53a, 53b, 53c, 53d and is detected.

また、第2の光源52から鋼帯Sのおもて面に向けて照射した点検光L3が、鋼帯Sの全幅にわたって鋼帯Sのおもて面で反射された反射光のうち、拡散反射光L4が複数の光検出器53a,53b,53c,53dに到達して検出される。 In addition, the inspection light L3 irradiated from the second light source 52 toward the front surface of the steel strip S is reflected by the front surface of the steel strip S over the entire width of the steel strip S, and diffuse reflected light L4 reaches and is detected by multiple photodetectors 53a, 53b, 53c, and 53d.

なお、実施形態に係る穴あき欠陥検出装置5においては、図3に示すように、光検出器53に対して第2の光源52を鋼帯搬送方向で上流側に配置しており、鋼帯Sのおもて面に向けて点検光L3を照射し、鋼帯Sのおもて面で反射した反射光のうち拡散反射光L4が、光検出器53に到達して検出されるような光学系として構成している。また、第2の光源52は、光検出器53に対して鋼帯搬送方向で下流側に配置してもよい。 In the hole defect detection device 5 according to the embodiment, as shown in FIG. 3, the second light source 52 is arranged upstream of the light detector 53 in the steel strip transport direction, and the optical system is configured such that inspection light L3 is irradiated toward the front surface of the steel strip S, and diffuse reflected light L4 of the light reflected by the front surface of the steel strip S reaches the light detector 53 and is detected. The second light source 52 may also be arranged downstream of the light detector 53 in the steel strip transport direction.

判定装置54は、複数の光検出器53a,53b,53c,53dの検出結果、具体的には、複数の光検出器53a,53b,53c,53dで検出された光の特徴値である光の強度に基づいて、穴あき欠陥の有無の判定と、複数の光検出器53a,53b,53c,53dの異常(故障)の有無の判定とを行う。なお、前記光の特徴値としては、光の強度に限らず、例えば、光量などであってもよい。 The determination device 54 determines whether or not there is a hole defect and whether or not there is an abnormality (failure) in the multiple photodetectors 53a, 53b, 53c, and 53d based on the detection results of the multiple photodetectors 53a, 53b, 53c, and 53d, specifically, based on the light intensity, which is a characteristic value of the light detected by the multiple photodetectors 53a, 53b, 53c, and 53d. Note that the characteristic value of the light is not limited to the light intensity, and may be, for example, the amount of light.

実施形態に係る穴あき欠陥検出装置5においては、鋼帯Sの搬送中に、第1の光源51から鋼帯Sの裏面に向けて鋼帯Sの全幅にわたって検出光L1を常時照射して、鋼帯Sの穴あき欠陥の検出を行うとともに、第2の光源52から鋼帯Sのおもて面に向けて鋼帯Sの全幅にわたって点検光L3を常時照射して、複数の光検出器53a,53b,53c,53dの異常の検出を行う。 In the perforation defect detection device 5 according to the embodiment, while the steel strip S is being transported, a detection light L1 is constantly irradiated from the first light source 51 onto the back surface of the steel strip S across the entire width of the steel strip S to detect perforation defects in the steel strip S, and an inspection light L3 is constantly irradiated from the second light source 52 onto the front surface of the steel strip S across the entire width of the steel strip S to detect abnormalities in the multiple photodetectors 53a, 53b, 53c, and 53d.

図4は、第2の光源52からの点検光L3の照射が無い場合に、光検出器53で検出された光の強度の一例を示す図である。 Figure 4 shows an example of the light intensity detected by the photodetector 53 when the inspection light L3 is not irradiated from the second light source 52.

実施形態に係る穴あき欠陥検出装置5においては、第1の光源51から鋼帯Sの裏面に向けて検出光L1を照射し、第2の光源52から点検光L3の照射を行わなかった場合、複数の光検出器53a,53b,53c,53dで検出される光は、一部の環境光が含まれる可能性はあるものの、ほぼ鋼帯Sの穴を通過した通過光L2が占める。そのため、複数の光検出器53a,53b,53c,53dで検出された光の強度は、図4に示すように、鋼帯Sの穴あき欠陥が存在しない部分である鋼帯部が、光の強度の小さい暗部となるのに対して、鋼帯Sの穴あき欠陥が存在する部分である穴あき欠陥部が、光の強度の大きい明部となる。 In the hole defect detection device 5 according to the embodiment, when the first light source 51 irradiates the detection light L1 toward the back surface of the steel strip S and the second light source 52 does not irradiate the inspection light L3, the light detected by the multiple photodetectors 53a, 53b, 53c, and 53d may include some ambient light, but is mostly composed of the transmitted light L2 that has passed through the holes in the steel strip S. Therefore, as shown in FIG. 4, the intensity of the light detected by the multiple photodetectors 53a, 53b, 53c, and 53d is such that the steel strip portion, which is the portion of the steel strip S where the hole defect does not exist, is a dark portion with low light intensity, while the hole defect portion, which is the portion of the steel strip S where the hole defect exists, is a bright portion with high light intensity.

図5は、第2の光源52からの点検光L3の照射が有る場合に、光検出器53で検出された光の強度の一例を示す図である。 Figure 5 shows an example of the light intensity detected by the photodetector 53 when the inspection light L3 is irradiated from the second light source 52.

実施形態に係る穴あき欠陥検出装置5においては、第1の光源51から鋼帯Sの裏面に向けて検出光L1を照射し、第2の光源52から鋼帯Sのおもて面に向けて点検光L3を照射した場合、複数の光検出器53a,53b,53c,53dで検出される光は、鋼帯Sの穴を通過した通過光L2と、鋼帯Sのおもて面で反射した拡散反射光L4とが占める。そのため、複数の光検出器53a,53b,53c,53dで検出された光の強度は、図5に示すように、穴あき欠陥部が光の強度の大きい明部となり、鋼帯部が図4に示した鋼帯部の光の強度よりも拡散反射光L4の強度の分だけ大きな光の強度の明部となる。 In the hole defect detection device 5 according to the embodiment, when the first light source 51 irradiates the detection light L1 toward the back surface of the steel strip S and the second light source 52 irradiates the inspection light L3 toward the front surface of the steel strip S, the light detected by the multiple photodetectors 53a, 53b, 53c, and 53d is dominated by the transmitted light L2 that passes through the holes in the steel strip S and the diffuse reflected light L4 that is reflected by the front surface of the steel strip S. Therefore, as shown in FIG. 5, the light intensity detected by the multiple photodetectors 53a, 53b, 53c, and 53d is such that the hole defect portion is a bright portion with a high light intensity, and the steel strip portion is a bright portion with a light intensity that is higher than the light intensity of the steel strip portion shown in FIG. 4 by the intensity of the diffuse reflected light L4.

ここで、実施形態に係る穴あき欠陥検出装置5においては、第2の光源52から照射する点検光L3の強度を、第1の光源51から照射する検出光L1の強度よりも小さくし、複数の光検出器53a,53b,53c,53dが検出する拡散反射光L4の強度を、複数の光検出器53a,53b,53c,53dが検出する通過光L2の強度よりも小さくなるように設定している。これにより、複数の光検出器53a,53b,53c,53dが、拡散反射光L4を検出しても、通過光L2を検出することによってなされる穴あき欠陥の検出に与える影響を小さくしたり、当該影響を与えないようにしたりすることができる。 Here, in the hole defect detection device 5 according to the embodiment, the intensity of the inspection light L3 emitted from the second light source 52 is set to be smaller than the intensity of the detection light L1 emitted from the first light source 51, and the intensity of the diffuse reflected light L4 detected by the multiple photodetectors 53a, 53b, 53c, and 53d is set to be smaller than the intensity of the transmitted light L2 detected by the multiple photodetectors 53a, 53b, 53c, and 53d. As a result, even if the multiple photodetectors 53a, 53b, 53c, and 53d detect the diffuse reflected light L4, it is possible to reduce or eliminate the influence on the detection of hole defects performed by detecting the transmitted light L2.

実施形態に係る穴あき欠陥検出装置5では、第2の光源52から鋼帯Sのおもて面に向けて点検光L3を照射し、鋼帯Sのおもて面で反射した拡散反射光L4を複数の光検出器53a,53b,53c,53dで検出することによって、一定の光の強度が検出される状態となる。そのため、この状態において、複数の光検出器53a,53b,53c,53dで検出された光の強度に基づいて、複数の光検出器53a,53b,53c,53dの異常(故障)を検出することができる。 In the hole defect detection device 5 according to the embodiment, inspection light L3 is irradiated from the second light source 52 toward the front surface of the steel strip S, and the diffuse reflected light L4 reflected by the front surface of the steel strip S is detected by the multiple photodetectors 53a, 53b, 53c, and 53d, resulting in a state in which a certain light intensity is detected. Therefore, in this state, it is possible to detect abnormalities (failures) in the multiple photodetectors 53a, 53b, 53c, and 53d based on the light intensity detected by the multiple photodetectors 53a, 53b, 53c, and 53d.

図6は、光検出器53の異常時に、光検出器53で検出された光の強度の一例を示す図である。 Figure 6 shows an example of the intensity of light detected by the photodetector 53 when the photodetector 53 is abnormal.

実施形態に係る穴あき欠陥検出装置5では、複数の光検出器53a,53b,53c,53dの少なくとも1つに異常が生じると、その異常が生じた光検出器53では光を適切に検出することができなくなる。そのため、例えば、異常が生じた光検出器53によって光を全く検出することができないときには、図6に示すように、異常が生じた光検出器53の検出結果として出力される光の強度が、図4に示した鋼帯部のように小さくなる。よって、実施形態に係る穴あき欠陥検出装置5においては、光検出器53の異常を光の強度が非常に小さい異常部として検出することができる。 In the hole defect detection device 5 according to the embodiment, when an abnormality occurs in at least one of the multiple photodetectors 53a, 53b, 53c, and 53d, the photodetector 53 in which the abnormality occurred is unable to properly detect light. Therefore, for example, when the photodetector 53 in which the abnormality occurred is unable to detect any light at all, as shown in FIG. 6, the intensity of the light output as the detection result of the photodetector 53 in which the abnormality occurred becomes small, like the steel strip portion shown in FIG. 4. Therefore, in the hole defect detection device 5 according to the embodiment, the abnormality in the photodetector 53 can be detected as an abnormal portion with a very small light intensity.

実施形態に係る穴あき欠陥検出装置5においては、図6に示すように、鋼帯Sの穴あき欠陥を検出するための光の強度の閾値である穴あき欠陥閾値と、光検出器53の異常を検出するための光の強度の閾値である異常閾値とを設定している。穴あき欠陥閾値は、正常な光検出器53が検出した拡散反射光L4の強度よりも大きな値であり、異常閾値は、正常な光検出器53が検出した拡散反射光L4の強度よりも小さな値である。 As shown in FIG. 6, in the perforation defect detection device 5 according to the embodiment, a perforation defect threshold, which is a threshold value of the light intensity for detecting perforation defects in the steel strip S, and an abnormality threshold, which is a threshold value of the light intensity for detecting an abnormality in the light detector 53, are set. The perforation defect threshold is a value greater than the intensity of the diffuse reflected light L4 detected by a normal light detector 53, and the abnormality threshold is a value less than the intensity of the diffuse reflected light L4 detected by a normal light detector 53.

そして、判定装置54は、複数の光検出器53a,53b,53c,53dが検出した光の強度が、穴あき欠陥閾値以上の場合に穴あき欠陥が有ると判定し、穴あき欠陥閾値未満の場合に穴あき欠陥が無いと判定する。また、判定装置54は、複数の光検出器53a,53b,53c,53dが検出した光の強度が、異常閾値以上の場合に光検出器53が正常であると判定し、異常閾値未満の場合に光検出器53が異常であると判定する。なお、複数の光検出器53a,53b,53c,53dのどれが異常であるのかは、例えば、判定装置54によって、異常閾値未満の光の強度を検出した光検出器53を特定することで把握することができる。 Then, the determination device 54 determines that there is a hole defect when the light intensity detected by the multiple photodetectors 53a, 53b, 53c, and 53d is equal to or greater than the hole defect threshold, and determines that there is no hole defect when the light intensity is less than the hole defect threshold. The determination device 54 also determines that the photodetector 53 is normal when the light intensity detected by the multiple photodetectors 53a, 53b, 53c, and 53d is equal to or greater than the abnormality threshold, and determines that the photodetector 53 is abnormal when the light intensity is less than the abnormality threshold. Note that which of the multiple photodetectors 53a, 53b, 53c, and 53d is abnormal can be identified, for example, by the determination device 54 identifying the photodetector 53 that detected a light intensity less than the abnormality threshold.

なお、実施形態に係る穴あき欠陥検出装置5では、検出された光検出器53の異常を、穴あき欠陥とは別の欠陥として検出し、例えば、判定装置54の記憶部に登録して、それぞれを区別できるようにしてもよい。 In addition, in the hole defect detection device 5 according to the embodiment, the detected abnormality of the optical detector 53 may be detected as a defect separate from the hole defect, and may be registered, for example, in a memory unit of the determination device 54 so that they can be distinguished from each other.

このように、実施形態に係る穴あき欠陥検出装置5においては、複数の光検出器53a,53b,53c,53dの少なくとも1つに異常が生じて光を適切に検出できなくなった場合に、複数の光検出器53a,53b,53c,53dがそれぞれ検出した光の強度に基づいて、異常が生じた光検出器53を検出することができる。 In this way, in the hole defect detection device 5 according to the embodiment, when an abnormality occurs in at least one of the multiple photodetectors 53a, 53b, 53c, and 53d and light cannot be detected properly, the photodetector 53 in which the abnormality occurred can be detected based on the intensity of light detected by each of the multiple photodetectors 53a, 53b, 53c, and 53d.

そして、光検出器53の異常が検出された際には、例えば、光検出器53の異常に関する信号を、判定装置54から上位システムなどに出力する。これにより、上位システムが備える表示装置に光検出器53の異常に関する情報を表示し、オペレータなどに報知することによって、異常が検出された光検出器53の点検や補修などの処置を、オペレータなどが実施可能になる。また、前記処置と共に、光検出器53の異常が検出されたときに穴あき欠陥検出装置5によって穴あき欠陥の検出を行っていた鋼帯Sのコイルを、光検出器53の異常により穴あき欠陥の検出が適切に行われなかった不合格コイルとする措置を、オペレータなどが実施可能となる。 When an abnormality in the photodetector 53 is detected, for example, a signal related to the abnormality in the photodetector 53 is output from the judgment device 54 to a higher-level system or the like. This allows information related to the abnormality in the photodetector 53 to be displayed on a display device provided in the higher-level system, and an operator or the like is notified, allowing the operator or the like to take measures such as inspection or repair of the photodetector 53 in which the abnormality was detected. In addition to the above measures, the operator or the like can take measures to classify the coil of steel strip S in which the perforation defect detection device 5 was used to detect the perforation defect when the abnormality in the photodetector 53 was detected as a rejected coil in which the perforation defect was not properly detected due to the abnormality in the photodetector 53.

以上説明したことより、実施形態に係る穴あき欠陥検出装置5は、連続製造ライン1内に設置されることによって、連続製造ライン1の運転を停止しなくても、鋼帯Sの搬送に従って連続的に鋼帯Sの穴あき欠陥を検出しつつ、穴あき欠陥検出装置5を検査して光検出器53の異常を検出することができる。また、実施形態に係る穴あき欠陥検出装置5において、穴あき欠陥を検出する対象の金属帯としては、鋼帯に限らず、例えば、アルミニウム帯であってもよい。 As described above, the perforation defect detection device 5 according to the embodiment is installed in the continuous production line 1, and can continuously detect perforation defects in the steel strip S as the steel strip S is transported without stopping the operation of the continuous production line 1, while inspecting the perforation defect detection device 5 to detect abnormalities in the optical detector 53. Furthermore, in the perforation defect detection device 5 according to the embodiment, the metal strip for which perforation defects are detected is not limited to a steel strip, and may be, for example, an aluminum strip.

1 連続製造ライン
2 ペイオフリール
3 テンションリール
4 溶接機
5 穴あき欠陥検出装置
51 第1の光源
52 第2の光源
53 光検出器
54 判定装置
Reference Signs List 1 Continuous manufacturing line 2 Payoff reel 3 Tension reel 4 Welding machine 5 Hole defect detection device 51 First light source 52 Second light source 53 Light detector 54 Judgment device

Claims (4)

金属帯の穴あき欠陥を光学的に検出する金属帯の穴あき欠陥検出装置の検査方法であって、
第1の光源から前記金属帯の全幅にわたって光を照射し、前記金属帯を厚み方向で挟んで前記第1の光源とは反対側に配置された光検出器によって、前記金属帯の穴を通過した通過光を検出して、穴あき欠陥の検出を行うとともに、前記金属帯を厚み方向で挟んで前記第1の光源とは反対側に配置された第2の光源から前記金属帯の全幅にわたって光を照射して前記金属帯で反射された拡散反射光を前記光検出器によって検出し、前記光検出器が検出した光の特性値に基づいて、前記光検出器が正常であるか異常であるかを判定することを特徴とする金属帯の穴あき欠陥検出装置の検査方法。
1. An inspection method for a metal strip perforation defect detection device that optically detects perforation defects in a metal strip, comprising:
A method for inspecting a metal strip perforation defect detection device, comprising the steps of: irradiating light from a first light source across the entire width of the metal strip; detecting perforation defects by detecting light that passes through holes in the metal strip using a photodetector that is positioned on the opposite side of the metal strip from the first light source, sandwiching the metal strip in the thickness direction; irradiating light from a second light source that is positioned on the opposite side of the metal strip from the first light source, sandwiching the metal strip in the thickness direction, across the entire width of the metal strip; detecting diffuse reflected light from the metal strip using the photodetector; and determining whether the photodetector is normal or abnormal based on a characteristic value of the light detected by the photodetector.
前記光の特性値は、光の強度であり、
前記光検出器で検出された光の強度が、予め設定された前記光検出器の異常検出用の光の強度の閾値である異常閾値以上の場合には前記光検出器が正常であると判定し、前記異常閾値未満の場合には前記光検出器が異常であると判定することを特徴とする請求項1に記載の金属帯の穴あき欠陥検出装置の検査方法。
the characteristic value of the light is the intensity of the light;
2. An inspection method for a metal strip perforation defect detection device as described in claim 1, characterized in that when the intensity of light detected by the photodetector is equal to or greater than an abnormality threshold, which is a preset threshold value of the light intensity for detecting abnormalities in the photodetector, the photodetector is determined to be normal, and when the intensity of light detected by the photodetector is less than the abnormality threshold, the photodetector is determined to be abnormal.
金属帯の穴あき欠陥を光学的に検出する金属帯の穴あき欠陥検出装置であって、
前記金属帯の全幅にわたって光を照射する第1の光源と、
前記金属帯を厚み方向で挟んで前記第1の光源とは反対側に配置された光検出器と、
前記金属帯を厚み方向で挟んで前記第1の光源とは反対側に配置され、前記金属帯の全幅にわたって光を照射する第2の光源と、
前記光検出器が検出した光の特性値に基づいて、前記光検出器が正常であるか異常であるかを判定する判定装置と、
を備えることを特徴とする金属帯の穴あき欠陥検出装置。
A metal strip perforation defect detection device for optically detecting a perforation defect in a metal strip, comprising:
a first light source that irradiates light across the entire width of the metal strip;
a photodetector disposed on an opposite side of the metal strip from the first light source in a thickness direction;
a second light source disposed on the opposite side of the metal strip from the first light source across the thickness direction of the metal strip and configured to irradiate light across the entire width of the metal strip;
a determination device that determines whether the photodetector is normal or abnormal based on a characteristic value of the light detected by the photodetector;
A metal strip hole defect detection device comprising:
前記光の特性値は、光の強度であり、
前記判定装置は、前記光検出器で検出された光の強度が、予め設定された前記光検出器の異常検出用の光の強度の閾値である異常閾値以上の場合には前記光検出器が正常であると判定し、前記異常閾値未満の場合には前記光検出器が異常であると判定することを特徴とする請求項3に記載の金属帯の穴あき欠陥検出装置。
the characteristic value of the light is the intensity of the light;
The metal strip perforation defect detection device according to claim 3, characterized in that the judgment device judges that the photodetector is normal when the intensity of light detected by the photodetector is equal to or greater than an abnormality threshold, which is a preset threshold value of the light intensity for detecting abnormalities in the photodetector, and judges that the photodetector is abnormal when the intensity of light detected by the photodetector is less than the abnormality threshold.
JP2022154086A 2022-09-27 2022-09-27 Inspection method of hole defect detection device for metal band, and hole defect detection device for metal band Pending JP2024048184A (en)

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