JP2024021996A - ひずみゲージ - Google Patents

ひずみゲージ Download PDF

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Publication number
JP2024021996A
JP2024021996A JP2022125250A JP2022125250A JP2024021996A JP 2024021996 A JP2024021996 A JP 2024021996A JP 2022125250 A JP2022125250 A JP 2022125250A JP 2022125250 A JP2022125250 A JP 2022125250A JP 2024021996 A JP2024021996 A JP 2024021996A
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JP
Japan
Prior art keywords
resistor
strain
gauge
strain gauge
less
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022125250A
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English (en)
Japanese (ja)
Other versions
JP2024021996A5 (cg-RX-API-DMAC7.html
Inventor
慎也 戸田
Shinya Toda
寿昭 浅川
Toshiaki Asakawa
厚 北村
Atsushi Kitamura
真一 丹羽
Shinichi Niwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MinebeaMitsumi Inc
Original Assignee
MinebeaMitsumi Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MinebeaMitsumi Inc filed Critical MinebeaMitsumi Inc
Priority to JP2022125250A priority Critical patent/JP2024021996A/ja
Priority to CN202380056014.2A priority patent/CN119604738A/zh
Priority to PCT/JP2023/028168 priority patent/WO2024029538A1/ja
Priority to US19/099,904 priority patent/US20260036474A1/en
Priority to EP23850092.0A priority patent/EP4567370A1/en
Publication of JP2024021996A publication Critical patent/JP2024021996A/ja
Publication of JP2024021996A5 publication Critical patent/JP2024021996A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/18—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance
    • G01B7/20—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance formed by printed-circuit technique
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP2022125250A 2022-08-05 2022-08-05 ひずみゲージ Pending JP2024021996A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2022125250A JP2024021996A (ja) 2022-08-05 2022-08-05 ひずみゲージ
CN202380056014.2A CN119604738A (zh) 2022-08-05 2023-08-01 应变计
PCT/JP2023/028168 WO2024029538A1 (ja) 2022-08-05 2023-08-01 ひずみゲージ
US19/099,904 US20260036474A1 (en) 2022-08-05 2023-08-01 Strain gauge
EP23850092.0A EP4567370A1 (en) 2022-08-05 2023-08-01 Strain gauge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022125250A JP2024021996A (ja) 2022-08-05 2022-08-05 ひずみゲージ

Publications (2)

Publication Number Publication Date
JP2024021996A true JP2024021996A (ja) 2024-02-16
JP2024021996A5 JP2024021996A5 (cg-RX-API-DMAC7.html) 2025-07-16

Family

ID=89849390

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022125250A Pending JP2024021996A (ja) 2022-08-05 2022-08-05 ひずみゲージ

Country Status (5)

Country Link
US (1) US20260036474A1 (cg-RX-API-DMAC7.html)
EP (1) EP4567370A1 (cg-RX-API-DMAC7.html)
JP (1) JP2024021996A (cg-RX-API-DMAC7.html)
CN (1) CN119604738A (cg-RX-API-DMAC7.html)
WO (1) WO2024029538A1 (cg-RX-API-DMAC7.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4272426A4 (en) 2021-06-30 2024-07-03 Samsung Electronics Co., Ltd. METHOD AND ELECTRONIC DEVICE FOR SLOW-MOTION VIDEO

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003035506A (ja) * 2001-07-19 2003-02-07 Honda Motor Co Ltd 圧力感度及び温度感度を低減したひずみゲージ及びその設計方法
JP2019523061A (ja) * 2016-07-28 2019-08-22 ライプニッツ−インスティトゥート フィア ノイエ マテリアーリエン ゲマインニュッツィゲ ゲゼルシャフト ミット ベシュレンクタ ハフトゥンク インプラントとしての使用のための、鼓膜穿孔の治療のための、また細胞培養のための構造化コーティングを有するデバイス
CN113644414A (zh) * 2021-07-08 2021-11-12 大连理工大学 天线装置及其制备方法、以及通信装置
JP2022110230A (ja) * 2021-01-18 2022-07-29 ミネベアミツミ株式会社 ひずみゲージ

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6084393B2 (ja) 2012-08-08 2017-02-22 公益財団法人電磁材料研究所 歪センサおよび歪の測定方法
US11339775B2 (en) 2016-07-25 2022-05-24 Repligen Corporation Alternating tangential flow rapid harvesting

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003035506A (ja) * 2001-07-19 2003-02-07 Honda Motor Co Ltd 圧力感度及び温度感度を低減したひずみゲージ及びその設計方法
JP2019523061A (ja) * 2016-07-28 2019-08-22 ライプニッツ−インスティトゥート フィア ノイエ マテリアーリエン ゲマインニュッツィゲ ゲゼルシャフト ミット ベシュレンクタ ハフトゥンク インプラントとしての使用のための、鼓膜穿孔の治療のための、また細胞培養のための構造化コーティングを有するデバイス
JP2022110230A (ja) * 2021-01-18 2022-07-29 ミネベアミツミ株式会社 ひずみゲージ
CN113644414A (zh) * 2021-07-08 2021-11-12 大连理工大学 天线装置及其制备方法、以及通信装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
小島之夫: "はくひずみゲージの横感度（はくひずみゲージの形状について、第２報）", 日本機械学曾論文集, vol. 第44巻第379号, JPN6023039921, 25 March 1978 (1978-03-25), JP, pages 865 - 873, ISSN: 0005817366 *

Also Published As

Publication number Publication date
CN119604738A (zh) 2025-03-11
WO2024029538A1 (ja) 2024-02-08
US20260036474A1 (en) 2026-02-05
EP4567370A1 (en) 2025-06-11

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