JP2023168250A - 偏光異方に基づく測定による解析方法及び解析装置 - Google Patents

偏光異方に基づく測定による解析方法及び解析装置 Download PDF

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Publication number
JP2023168250A
JP2023168250A JP2023071430A JP2023071430A JP2023168250A JP 2023168250 A JP2023168250 A JP 2023168250A JP 2023071430 A JP2023071430 A JP 2023071430A JP 2023071430 A JP2023071430 A JP 2023071430A JP 2023168250 A JP2023168250 A JP 2023168250A
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JP
Japan
Prior art keywords
target substance
luminescent
luminescent reagent
analysis method
reaction
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Pending
Application number
JP2023071430A
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English (en)
Japanese (ja)
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JP2023168250A5 (https=
Inventor
法重 掛川
Norishige Kakegawa
考洋 増村
Takahiro Masumura
文生 山内
Fumio Yamauchi
健吾 金崎
Kengo Kanezaki
智広 中村
Tomohiro Nakamura
生朗 中嶋
Ikuo Nakajima
悌互 榊原
Teigo Sakakibara
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Canon Inc
Canon Medical Systems Corp
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Canon Inc
Canon Medical Systems Corp
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Application filed by Canon Inc, Canon Medical Systems Corp filed Critical Canon Inc
Priority to US18/310,615 priority Critical patent/US12566139B2/en
Priority to EP23172752.0A priority patent/EP4276446A1/en
Publication of JP2023168250A publication Critical patent/JP2023168250A/ja
Publication of JP2023168250A5 publication Critical patent/JP2023168250A5/ja
Pending legal-status Critical Current

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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2023071430A 2022-05-13 2023-04-25 偏光異方に基づく測定による解析方法及び解析装置 Pending JP2023168250A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US18/310,615 US12566139B2 (en) 2022-05-13 2023-05-02 Method analysis employing measurement based on polarization anisotropy
EP23172752.0A EP4276446A1 (en) 2022-05-13 2023-05-11 Analysis method and analysis apparatus each employing measurement based on polarization anisotropy

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022079531 2022-05-13
JP2022079531 2022-05-13

Publications (2)

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JP2023168250A true JP2023168250A (ja) 2023-11-24
JP2023168250A5 JP2023168250A5 (https=) 2026-05-01

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ID=88838200

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JP2023071430A Pending JP2023168250A (ja) 2022-05-13 2023-04-25 偏光異方に基づく測定による解析方法及び解析装置

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JP (1) JP2023168250A (https=)

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