JP2023135043A - Measuring device, measurement method, and program - Google Patents

Abstract

To provide a measuring device capable of precisely measuring behavior, such as deformation and deflection of a thin-walled structure.SOLUTION: A measuring device includes: a photographing part having a first camera that slants a light axis relative to a width direction and a vertical direction of a thin-walled structure, and photographs a first measurement object surface facing the vertical direction and the width direction of the thin-walled structure; a measurement part for measuring vertical displacement of a first end as an end on one side in a width direction or on one side in a vertical direction of the first measurement object surface and vertical displacement of a second end as an end on the other side in the width direction and on the other side in the vertical direction of the first measurement object surface from an image photographed by the first camera; and a correction part for correcting the vertical displacement of the first end and the vertical displacement of the second end on the basis of a distance between the first camera and the thin-walled structure.SELECTED DRAWING: Figure 3

Description

The present disclosure relates to a measuring device, a measuring method, and a program.

2. Description of the Related Art There is a known technique for measuring the shape of a thin-walled structure to monitor behavior such as deformation or deflection when manufacturing a thin-walled structure such as an iron plate (for example, Patent Document 1).

JP2016-65863A

Furthermore, in the prior art, a technique has been considered in which the shape of a thin-walled structure is measured and monitored using a laser displacement meter installed above the thin-walled structure. However, since the measurement range of laser displacement meter measurement is limited to the laser irradiation range, it is difficult to detect when deformation (for example, lifting of the edge of a thin structure) occurs outside the measurement range. This can be difficult.

The present disclosure has been made in view of such problems, and provides a measuring device, a measuring method, and a program that can accurately measure behaviors such as deformation and deflection of thin-walled structures.

According to one aspect of the present disclosure, the measurement device tilts the optical axis with respect to the width direction and the up-down direction of the thin-walled structure, and the first measurement device is a surface facing the up-down direction or the width direction of the thin-walled structure. a photographing unit having a first camera for photographing the target surface; and a photographing unit having a first camera for photographing the target surface; and from the image photographed by the first camera, the vertical direction or the width direction of the first end of the first measurement target surface on one side in the vertical direction or width direction. a distance between the first camera and the thin-walled structure, a measuring unit that measures the displacement and the displacement in the vertical direction or the width direction of the second end on the other side of the first measurement target surface in the vertical direction or width direction; a correction unit that corrects the displacement of the first end and the displacement of the second end based on the above.

According to one aspect of the present disclosure, the measurement method includes tilting the optical axis with respect to the width direction and the up-down direction of the thin-walled structure, and performing first measurement on a surface facing the up-down direction or the width direction of the thin-walled structure. a step of photographing the target surface with a first camera; and a step of determining a vertical or widthwise displacement of a first end of the first measurement target surface on one side in the vertical direction or width direction from the image photographed by the first camera; , measuring displacement in the vertical direction or width direction of the second end on the other side in the vertical direction or width direction of the first measurement surface, and based on the distance between the first camera and the thin structure, The method further includes the step of correcting the displacement of the first end and the displacement of the second end.

According to one aspect of the present disclosure, the program tilts the optical axis with respect to the width direction and the up-down direction of the thin-walled structure, and the first measurement target which is the surface facing the up-down direction or the width direction of the thin-walled structure. a step of photographing the surface with a first camera, and a displacement in the vertical direction or width direction of a first end portion of the first measurement target surface on one side in the vertical direction or width direction from the image photographed by the first camera; Measuring displacement in the vertical direction or width direction of the second end on the other side in the vertical direction or width direction of the first measurement target surface, and based on the distance between the first camera and the thin structure, A measuring device is caused to perform a step of correcting the displacement of the first end and the displacement of the second end.

According to the measuring device, measuring method, and program according to the present disclosure, behaviors such as deformation and deflection of a thin-walled structure can be measured with high accuracy.

1 is a diagram showing the overall configuration of a measuring device according to a first embodiment of the present disclosure. FIG. 1 is a diagram for explaining the arrangement of a measuring device according to a first embodiment of the present disclosure. FIG. 1 is a block diagram showing a functional configuration of a control device according to a first embodiment of the present disclosure. It is a flowchart which shows an example of processing of a measuring device concerning a 1st embodiment of this indication. FIG. 2 is a diagram for explaining functions of a measuring device according to a first embodiment of the present disclosure. FIG. 7 is a diagram for explaining the arrangement of a measuring device according to a second embodiment of the present disclosure. FIG. 7 is a diagram for explaining functions of a measuring device according to a second embodiment of the present disclosure. FIG. 7 is a diagram for explaining the arrangement of a measuring device according to a third embodiment of the present disclosure. FIG. 7 is a diagram for explaining functions of a measuring device according to a third embodiment of the present disclosure. FIG. 7 is a diagram for explaining the arrangement of a measuring device according to a fourth embodiment of the present disclosure. FIG. 7 is a first diagram for explaining the functions of a measuring device according to a fourth embodiment of the present disclosure. FIG. 7 is a second diagram for explaining the functions of a measuring device according to a fourth embodiment of the present disclosure. FIG. 3 is a diagram showing the overall configuration of a measuring device according to a fifth embodiment of the present disclosure. FIG. 12 is a diagram showing the overall configuration of a measuring device according to a sixth embodiment of the present disclosure. FIG. 7 is a diagram for explaining an example of a measuring device according to another embodiment.

<First embodiment>
A measuring device 1 according to a first embodiment of the present disclosure will be described below with reference to FIGS. 1 to 5.

(overall structure)
FIG. 1 is a diagram showing the overall configuration of a measuring device according to a first embodiment of the present disclosure.
FIG. 2 is a diagram for explaining the arrangement of the measuring device according to the first embodiment of the present disclosure.
The measuring device 1 according to the present embodiment is, for example, a device for measuring the state (deformation, deflection, etc.) of a thin-walled structure 90 manufactured by a manufacturing machine 9. The thin structure 90 is, for example, an iron plate, paper, or the like. According to the operation of the manufacturing machine 9, the thin structure 90 moves in the advancing direction (+Z side). The measuring device 1 includes a photographing section 2 and a control device 10, as shown in FIG.

The photographing unit 2 includes a first camera 21 installed on the side of the thin structure 90. As shown in FIG. 2, the first camera 21 tilts its optical axis in the width direction (Y direction) and the vertical direction (Z direction) of the thin structure 90, and captures the top surface 90a, bottom surface 90d, and side surface of the thin structure 90. 90b or the side surface 90c (first measurement target surface) is photographed from an oblique direction. In this embodiment, as shown in FIG. 1, an example will be described in which the first camera 21 photographs the top surface 90a of the thin structure 90 from diagonally above. Further, for example, the angle that the optical axis of the first camera 21 makes with respect to the width direction is set to about 15 degrees to 45 degrees. Further, the photographing range of the first camera 21 is set to include both ends (first end P1, second end P2) of the thin structure 90 in the width direction. Note that in other embodiments, when the first camera 21 photographs the side surface 90b or the side surface 90c of the thin structure 90, the photographing range of the first camera 21 is set such that both ends of the thin structure 90 in the vertical direction are included. is set to

The control device 10 measures the state (deformation, deflection), etc. of the thin structure 90 based on the image D1 (video) of the thin structure 90 captured by the first camera 21.

(Functional configuration of control device)
FIG. 3 is a block diagram showing the functional configuration of the control device according to the first embodiment of the present disclosure.
As shown in FIG. 3, the control device 10 includes a processor 11, a memory 12, a storage 13, a communication interface 14, a display device 15, and an input device 16.

The processor 11 functions as an image acquisition section 110, a measurement section 111, and a correction section 112 by operating according to a predetermined program.

The image acquisition section 110 acquires an image of the first measurement target surface (upper surface 90a, lower surface 90d, side surface 90b, or side surface 90c) of the thin structure 90 photographed by the photographing section 2. In this embodiment, an example will be described in which the image acquisition unit 110 acquires the image D1 of the upper surface 90a of the thin structure 90 photographed by the first camera 21.

The measurement unit 111 determines, from the image D1 taken by the first camera 21, the displacement in the vertical direction or the width direction of the first end on one side in the vertical direction or one side in the width direction of the first measurement target surface, and the displacement in the vertical direction or the width direction of the first measurement target surface. The vertical or widthwise displacement of the second end on the other side in the vertical direction or the other side in the width direction of the surface is measured. In this embodiment, the measurement unit 111 measures the vertical displacement of the first end P1 on one side of the upper surface 90a in the width direction, and the vertical displacement of the second end P2 on the other side of the upper surface 90a in the width direction. An example will be explained below.

The correction unit 112 corrects the vertical displacement of the first end P1 and the vertical displacement of the second end P2 based on the distance between the first camera 21 and the thin structure 90.

Note that a predetermined program executed by the processor 11 is stored in a computer-readable recording medium. Further, the computer-readable recording medium refers to a magnetic disk, a magneto-optical disk, a CD-ROM, a DVD-ROM, a semiconductor memory, and the like. Alternatively, this computer program may be distributed to a computer via a communication line, and the computer receiving the distribution may execute the program. Furthermore, this program may be for realizing some of the functions described above. Furthermore, it may be a so-called difference file (difference program) that can realize the above-mentioned functions in combination with a program already recorded in the computer system.

The memory 12 has a memory area necessary for the operation of the processor 11.

The storage 13 is a so-called auxiliary storage device, and is, for example, an HDD (Hard Disk Drive), an SSD (Solid State Drive), or the like.

The communication interface 14 is an interface for transmitting and receiving various signals with an external device (imaging unit 2).

The display device 15 is a display device that displays measurement results and the like, and is, for example, a liquid crystal display or an organic EL display.

The input device 16 is an input device that receives operations from a user of the measuring device 1, and is, for example, a general mouse, keyboard, touch sensor, or the like.

(Processing flow of control device)
FIG. 4 is a flowchart illustrating an example of processing of the measuring device according to the first embodiment of the present disclosure.
FIG. 2 is a diagram for explaining functions of a measuring device according to a first embodiment of the present disclosure.
Here, the flow of processing in which the measuring device 1 measures the state of the thin-walled structure 90 will be described with reference to FIGS. 4 and 5.

First, the image acquisition unit 110 acquires an image D1 (video) captured by the first camera 21 (step S10). As shown in FIG. 5, the image D1 is an image of the upper surface 90a of the thin structure 90.

Next, the measurement unit 111 measures the vertical displacement of the first end P1 on one side in the width direction of the thin structure 90 (upper surface 90a) and the displacement of the second end P2 on the other side in the width direction on the image D1. The displacement in the vertical direction is measured (step S11).

For example, the assumed positions of the first end P1 and the second end P2 in the vertical direction of the image D1 are set in advance based on the design dimensions of the thin structure 90 and the like. The measuring unit 111 measures the vertical displacement of the first end P1 and the second end P2 on the image with respect to the assumed position (deviation amount from the assumed position).

Next, the correction unit 112 corrects the vertical displacement of the first end P1 and the second end P2 based on the distance between the first camera 21 and the thin structure 90 (Step S12).

For example, based on the design dimensions of the thin structure 90, etc., the distance L1 from the first camera 21 to the assumed position of the first end P1 of the thin structure 90, and the distance L1 from the first camera 21 to the second end of the thin structure 90 are determined. A distance L2 to the assumed position of P2 is set in advance. The correction unit 112 corrects the vertical displacement of the first end P1 on the image using a correction coefficient corresponding to the distance L1, and calculates the vertical displacement (deviation amount) of the first end P1 with respect to the design dimensions, etc. seek. Similarly, the correction unit 112 corrects the vertical displacement of the second end P2 on the image using a correction coefficient corresponding to the distance L2, and corrects the vertical displacement ( amount of deviation).

Further, the correction unit 112 displays the measurement results regarding the vertical displacement of the thin structure 90 on the display device 15 (step S13). For example, as shown in FIG. 5, the correction unit 112 displays a displacement graph G1 of the first end P1 after correction and a displacement graph G2 of the second end P2 after correction. At this time, the allowable range of displacement may be displayed on the graphs G1 and G2. Thereby, the user can easily understand whether the vertical displacement of the thin structure 90 is within the permissible range or exceeds the permissible range (an error has occurred).

In addition, although the example in which the measurement part 111 measures the displacement of the 1st end P1 and the 2nd end P2 in the up-down direction was demonstrated in this embodiment, it is not restricted to this. In other embodiments, the measurement unit 111 may measure the displacement of the first end P1 and the second end P2 in the width direction. Similar to the measurement of displacement in the vertical direction, the measurement unit 111 measures the assumed positions in the width direction of the first end P1 and the second end P2 that are set in advance based on design dimensions, etc., and the positions actually detected from the image D1. The displacement between the positions of the first end P1 and the second end P2 (deviation amount from the assumed position) is measured. Further, in this case, the correction unit 112 corrects the displacement of the first end P1 and the second end P2 in the width direction.

(action, effect)
As described above, the measuring device 1 according to the present embodiment includes the photographing unit 2 having the first camera 21 that photographs the first measurement target surface of the thin structure 90 from an oblique direction, and the image photographed by the first camera 21. D1, a measurement unit 111 that measures the vertical displacement of the first end P1 of the thin structure 90 and the vertical displacement of the second end P2, the first camera 21, and the thin structure 90. It includes a correction unit 112 that corrects vertical displacement of the first end P1 and the second end based on the distance.

By doing so, the measuring device 1 has a simple configuration in which the thin-walled structure 90 is photographed with one first camera 21, and both ends of the first measurement target surface of the thin-walled structure 90 (the first end The vertical displacements of P1 and the second end P2) can be measured simultaneously. As a result, the measuring device 1 can detect meandering, out-of-plane deformation, deflection, uplift, undulation, etc. of the thin-walled structure 90, compared to conventional techniques that measure only a part of the surface of the thin-walled structure 90. Behavior can be measured with high precision.

<Second embodiment>
Next, a measuring device 1 according to a second embodiment of the present disclosure will be described with reference to FIGS. 6 and 7.
Components common to those in the first embodiment are denoted by the same reference numerals, and detailed description thereof will be omitted.

FIG. 6 is a diagram for explaining the arrangement of the measuring device according to the second embodiment of the present disclosure.
As shown in FIG. 6, in the measuring device 1 according to this embodiment, the photographing section 2 includes a second camera 22. Note that the photographing unit 2 according to the present embodiment may have a configuration having only the second camera 22, or a configuration having both the first camera 21 and the second camera 22 according to the above-described embodiments. It's okay.

The second camera 22 photographs the top surface 90a or bottom surface 90d (second measurement target surface) of the thin structure 90. In this embodiment, as shown in FIG. 6, an example will be described in which the second camera 22 photographs the upper surface 90a of the thin structure 90 from above (+Z side) with the optical axis directed directly below. In the example of FIG. 6, the second camera 22 is arranged at approximately the center of the thin structure 90 in the width direction so that its optical axis is perpendicular to the width direction. Further, the photographing range of the second camera 22 is set to include both ends P1 and P2 of the thin structure 90 in the width direction.

FIG. 7 is a diagram for explaining the functions of the measuring device according to the second embodiment of the present disclosure.
Here, the functions of the measuring device 1 according to the present embodiment will be described with reference to the flowchart in FIG. 4 and FIG. 7.

First, the image acquisition unit 110 acquires the image D2 (video) captured by the second camera 22 (step S10 in FIG. 4). As shown in FIG. 7, the image D1 is an image of the upper surface 90a of the thin structure 90 taken from directly above.

Next, the measuring unit 111 measures the widthwise displacement of the first end P1 and the widthwise displacement of the second end P2 of the thin structure 90 (upper surface 90a) on the image D2 (Fig. 4 step S11). The method of measuring displacement is the same as in the first embodiment.

Next, the correction unit 112 corrects the displacement of the first end P1 and the second end P2 in the width direction based on the distance between the second camera 22 and the thin structure 90 (step S12 in FIG. 4). .

For example, based on the design dimensions of the thin structure 90, etc., the distance L3 from the second camera 22 to the assumed position of the first end P1 of the thin structure 90, and the distance L3 from the second camera 22 to the second end of the thin structure 90 are determined. A distance L4 to the assumed position of P2 is set in advance. The correction unit 112 corrects the displacement of the first end P1 in the width direction on the image using a correction coefficient corresponding to the distance L3, and obtains the actual displacement (deviation amount) of the first end P1 in the width direction. . Similarly, the correction unit 112 corrects the widthwise displacement of the second end P2 on the image using a correction coefficient corresponding to the distance L4, and corrects the actual widthwise displacement (displacement amount) of the second end P2. ).

Further, the correction unit 112 displays the measurement results regarding the displacement of the thin structure 90 in the width direction on the display device 15 (step S13 in FIG. 4). For example, as shown in FIG. 7, the correction unit 112 displays a displacement graph G3 of the first end P1 after correction and a displacement graph G4 of the second end P2 after correction.

By doing so, the measuring device 1 can simultaneously measure the displacement in the width direction (horizontal direction) of both ends (first end P1 and second end P2) of the thin structure 90 in the width direction. Thereby, the measuring device 1 can accurately measure behaviors such as meandering, out-of-plane deformation, deflection, uplift, and waviness of the thin-walled structure 90.

<Third embodiment>
Next, a measuring device 1 according to a third embodiment of the present disclosure will be described with reference to FIGS. 8 to 9.
Components common to each of the above-described embodiments are designated by the same reference numerals, and detailed description thereof will be omitted.

FIG. 8 is a diagram for explaining the arrangement of a measuring device according to a third embodiment of the present disclosure.
As shown in FIG. 8, in the measuring device 1 according to this embodiment, the photographing section 2 includes a third camera 23 and a fourth camera 24. Note that the photographing unit 2 according to the present embodiment may have a configuration having only the third camera 23 and the fourth camera 24, or may include one or more of the first camera 21 and the second camera 22 according to the above-described embodiment. A configuration combining both may be possible.

The third camera 23 tilts its optical axis with respect to the width direction and the vertical direction of the thin structure 90, and obliquely faces the first side surface 90b (third measurement target surface) facing one side in the width direction of the thin structure 90. Shoot from any direction. Further, the photographing range of the third camera 23 is set to include the upper end P1 and the lower end P1' of the first side surface 90b of the thin structure 90. In addition, in this embodiment, as shown in FIG. 8, an example will be described in which the third camera 23 photographs the first side surface 90b of the thin structure 90 from diagonally above. In other embodiments, the third camera 23 may photograph the first side surface 90b of the thin structure 90 from diagonally below.

The fourth camera 24 tilts its optical axis with respect to the width direction and the vertical direction of the thin structure 90, and obliquely faces a second side surface 90c (fourth measurement target surface) facing the other side in the width direction of the thin structure 90. Shoot from any direction. Further, the photographing range of the fourth camera 24 is set to include the upper end P2 and lower end P2' of the second side surface 90c of the thin structure 90. In addition, in this embodiment, as shown in FIG. 8, an example will be described in which the fourth camera 24 photographs the second side surface 90c of the thin structure 90 from diagonally above. In other embodiments, the fourth camera 24 may photograph the second side surface 90c of the thin structure 90 from diagonally below.

Furthermore, the measuring device 1 according to the present embodiment irradiates the thin structure 90 with light such that the first side surface 90b and second side surface 90c of the thin structure 90 have different brightness from the upper surface 90a or the lower surface 90d. It may further include a lighting section 3. For example, the illumination unit 3 irradiates the top surface 90a with light so that the brightness of the top surface 90a or the bottom surface 90d is higher than the brightness of the first side surface 90b and the second side surface 90c. In addition, in this embodiment, as shown in FIG. 8, an example will be described in which the illumination unit 3 irradiates light onto the upper surface 90a of the thin structure 90. In this way, by highlighting the contrast (brightness difference) between the top surface 90a of the thin structure 90 and the first side surface 90b and second side surface 90c, the boundary portion (top end P1) between the top surface 90a and the first side surface 90b is , it becomes easier to detect the position of the boundary portion (upper end P2) between the upper surface 90a and the second side surface 90c. Note that if the boundaries between the top surface 90a and the first side surface 90b and second side surface 90c can be easily detected due to the material or coating of the thin structure 90, the illumination section 3 may be omitted. Note that in other embodiments, the illumination unit 3 may irradiate the first side surface 90b and the second side surface 90c with light.

FIG. 9 is a diagram for explaining the functions of the measuring device according to the third embodiment of the present disclosure.
Here, the functions of the measuring device 1 according to this embodiment will be explained with reference to the flowchart of FIG. 4 and FIG. 9.

First, the image acquisition unit 110 acquires an image D3 and an image D4 (video) captured by the third camera 23 and the fourth camera 24, respectively (step S10 in FIG. 4).

Next, the measuring unit 111 measures the positions of the upper end P1 and the lower end P1' of the first side surface 90b in the vertical direction and the width direction on the image D3, and determines the displacement of the thickness of the first side surface 90b and the thickness orthogonal position of the first side surface 90b. The variation in direction (the inclination of the first side surface 90b with respect to the vertical direction) is determined. For example, the thickness of the first side surface 90b is expressed by the distance between the upper end P1 and the lower end P1' in the vertical direction. Moreover, the variation in the direction perpendicular to the plate thickness of the first side surface 90b is expressed by the distance in the width direction between the upper end P1 and the lower end P1'. Similarly, the measurement unit 111 measures the positions of the upper end P2 and lower end P2' of the second side surface 90c in the vertical direction and the width direction on the image D4, and measures the variations in the thickness of the second side surface 90c and the direction perpendicular to the thickness. (the inclination of the second side surface 90c with respect to the vertical direction) is determined (step S11 in FIG. 4).

Next, the correction unit 112 corrects the displacement of the thickness of the first side surface 90b and the variation in the direction perpendicular to the thickness, based on the distance between the third camera 23 and the thin structure 90. Further, the correction unit 112 corrects the displacement of the thickness of the second side surface 90c and the variation in the direction perpendicular to the thickness based on the distance between the fourth camera 24 and the thin structure 90 (Step S12 in FIG. 4).

For example, based on the design dimensions of the thin structure 90, the distance L5 from the third camera 23 to the assumed position of the upper end P1 of the first side surface 90b of the thin structure 90, and the distance L5 from the fourth camera 24 to the second A distance L6 to the assumed position of the upper end P2 of the side surface 90c is set in advance. The correction unit 112 corrects the displacement of the thickness of the first side surface 90b and the variation in the direction perpendicular to the thickness using a correction coefficient according to the distance L5. Similarly, the correction unit 112 corrects the displacement of the plate thickness of the second side surface 90c and the variation in the direction perpendicular to the plate thickness using a correction coefficient according to the distance L6.

Further, the correction unit 112 displays the corrected measurement results on the display device 15 (step S13 in FIG. 4). For example, as shown in FIG. 9, the correction unit 112 displays a graph G5a indicating the displacement of the plate thickness on the first side surface 90b of the thin structure 90, and a graph G5b indicating the variation in the direction perpendicular to the plate thickness. Similarly, the correction unit 112 displays a graph G6a showing the thickness of the thin structure 90 at the second side surface 90c, and a graph G6b showing variations in the direction orthogonal to the thickness.

By doing so, the measuring device 1 can further measure the thickness of the thin structure 90 on both sides in the width direction and the variation in the direction perpendicular to the thickness. Thereby, the measuring device 1 can measure the behavior of the thin structure 90 in more detail.

Note that the measurement unit 111 according to the present embodiment may further measure the displacement in the width direction of the first end P1 of the thin structure 90 based on the image D3 captured by the third camera 23. Similarly, the measurement unit may further measure the displacement of the second end P2 of the thin structure 90 in the width direction based on the image D4 captured by the fourth camera 24. In this case, the second camera 22 of the second embodiment can be omitted.

<Fourth embodiment>
Next, a measuring device 1 according to a fourth embodiment of the present disclosure will be described with reference to FIGS. 10 to 12.
Components common to each of the above-described embodiments are designated by the same reference numerals, and detailed description thereof will be omitted.

FIG. 10 is a diagram for explaining the arrangement of a measuring device according to a fourth embodiment of the present disclosure.
As shown in FIG. 10, in the measuring device 1 according to this embodiment, the photographing section 2 includes a first camera 21 and a fifth camera 25. Note that the photographing unit 2 according to the present embodiment may have a configuration including only the first camera 21 and the fifth camera 25, or may include the second camera 22 according to the above-described embodiment, the third camera 23, and the fifth camera 25. It may be configured in combination with one or both of the four cameras 24.

The fifth camera 25 photographs the side surface (fifth measurement target surface; in the example of FIG. 10, the second side surface 90c) of the thin structure 90. The fifth camera 25 according to the present embodiment is arranged so that the direction of the optical axis and the width direction are parallel to each other.

FIG. 11 is a first diagram for explaining the functions of the measuring device according to the fourth embodiment of the present disclosure.
FIG. 12 is a second diagram for explaining the functions of the measuring device according to the fourth embodiment of the present disclosure.
Here, the functions of the measuring device 1 according to this embodiment will be described with reference to the flowchart in FIG. 4 and FIGS. 11 and 12.

First, the image acquisition unit 110 acquires an image D1 and an image D5 (video) taken by the first camera 21 and the fifth camera 25, respectively (step S10 in FIG. 4).

Next, the measurement unit 111 measures the vertical displacement of the first end P1 and the second end P2 of the thin structure 90 on the image D1. The measuring unit 111 also measures the displacement of the upper end P2 and lower end P2' of the second side surface 90c on the image D5 (step S11 in FIG. 4).

Note that the thin structure 90 may have a case in which the upper surface 90a bends upward as in the example in FIG. 11, or a case in which the upper surface 90a inclines in the width direction as in the example in FIG. In these cases, the image D5 taken by the fifth camera 25 includes the vertex of the bending portion of the upper surface 90a (FIG. 11) or the first end P1 above the upper end P2 and lower end P2' of the second side surface 90c. A third end P3 shown in FIG. 12 is included. In this case, the measurement unit 111 further measures the displacement of the third end P3 in step S11 of FIG. In addition, from only the image D5 of the fifth camera, it is clear whether the third end P3 measured by the measurement unit 111 is the apex of the bending part of the upper surface 90a (FIG. 11) or the first end P1 (FIG. 12). I can't know if it's there.

Therefore, the measuring unit 111 calculates the image D1 of the first camera 21 based on the distance L1 from the first camera 21 to the first end P1 and the distance L7 from the fifth camera 25 to the first end P1. The vertical position of the first end P1 measured from is converted into the vertical position of the image D5 photographed by the fifth camera 25 (estimated position P1_e). 11 and 12 show an example in which the estimated position P1_e after conversion is placed on the image D5 of the fifth camera 25.

Then, when the estimated position P1_e of the first end P1 is located lower than the third end P3 detected from the image D5 of the fifth camera 25, the measuring unit 111 determines that the third end P3 is It is determined that this is the apex of the bending portion of the upper surface 90a. In this case, the displacement of the third end P3 represents the vertical displacement of the upper surface 90a due to the deflection of the thin structure 90. On the other hand, the measurement unit 111 determines that the third end P3 detected from the image D5 of the fifth camera 25 and the estimated position P1_e of the first end P1 are approximately the same position (a position within a predetermined error range). In this case, it is determined that the third end P3 is the first end P1. In this case, the displacement of the third end P3 represents the relative displacement of the first end P1 and the second end P2 in the vertical direction due to the inclination of the thin structure 90.

Next, the correction unit 112 corrects the displacement of each part measured from the image D1 of the first camera 21 based on the distances L1 and L2 between the first camera 21 and the thin structure 90. Furthermore, the displacement of each part measured from the image D5 of the fifth camera 25 is corrected based on the distances L7 and L8 between the fifth camera 25 and the first end P1 and the second end P2 of the thin structure 90, respectively. (Step S12 in FIG. 4).

Further, the correction unit 112 displays the corrected measurement results on the display device 15 (step S13 in FIG. 4). In addition to the displacement graphs G1 and G2 (FIG. 5) of the first end P1 and second end P2 based on the image D1 of the first camera 21, the correction unit 112 according to the present embodiment further calculates the displacement graphs of the fifth camera 25. A graph showing the displacement due to deflection or inclination of the thin structure 90 based on the image D5 is further displayed. For example, the correction unit 112 displays a graph G7 indicating the maximum displacement of the upper surface 90a due to the deflection (bulge) of the thin structure 90, as shown in FIG. Further, as shown in FIG. 12, the correction unit 112 displays a graph G8 showing the relative displacement of the first end P1 and the second end P2 due to the inclination of the thin structure 90.

By doing so, the measuring device 1 can further measure the displacement due to the deflection or inclination of the thin structure 90. Thereby, the measuring device 1 can measure the behavior of the thin structure 90 in more detail.

In the example of this embodiment, the measurement unit 111 determines whether the third end P3 included in the image D5 is the apex of the bending portion of the upper surface 90a (FIG. 11) or the first end P1 (FIG. 12). However, it is not limited to this. In other embodiments, the measurement unit 111 determines whether the third end P3 included in the image D5 is the apex of the flexure of the lower surface 90d when the thin structure 90 is flexed downward, or the first end It may be determined whether it is P1.

<Fifth embodiment>
Next, a measuring device 1 according to a fifth embodiment of the present disclosure will be described with reference to FIG. 13.
Components common to each of the above-described embodiments are designated by the same reference numerals, and detailed description thereof will be omitted.

FIG. 13 is a diagram showing the overall configuration of a measuring device according to a fifth embodiment of the present disclosure.
As shown in FIG. 13, in the measuring device 1 according to this embodiment, the photographing section 2 includes an adjustment mechanism 26 that changes the position and angle of the camera. Although FIG. 13 shows an example in which the first camera 21 is provided with the adjustment mechanism 26, the invention is not limited to this. In other embodiments, the second camera 22, the third camera 23, the fourth camera 24, and the fifth camera 25 may be provided with the adjustment mechanism 26.

The adjustment mechanism 26 includes, for example, a vertical position adjustment mechanism 26A (slider) that can change the position of the first camera 21 in the vertical direction (Z direction), and a horizontal position adjustment mechanism 26A (slider) that can change the position of the first camera 21 in the horizontal direction (progressing direction; It has a position adjustment mechanism 26B (slider) and an angle adjustment mechanism 26C that can adjust the angle of the optical axis of the first camera 21. Although not shown, the horizontal position adjustment mechanism 26B may be able to change its position in the width direction (Y direction).

The adjustment mechanism 26 adjusts the position and angle of the first camera 21 by direct operation by the user or by remote operation by the user through the input device 16 of the control device 10. Further, the adjustment mechanism 26 may automatically adjust the position and angle at which the first end P1, the second end P2, etc. to be measured, based on the image D1 taken by the first camera 21, can be detected. good.

By doing so, the measuring device 1 can accurately detect the first end P1, the second end P2, etc. to be measured.

<Sixth embodiment>
Next, a measuring device 1 according to a sixth embodiment of the present disclosure will be described with reference to FIG. 14.
Components common to each of the above-described embodiments are designated by the same reference numerals, and detailed description thereof will be omitted.

FIG. 14 is a diagram showing the overall configuration of a measuring device according to a sixth embodiment of the present disclosure.
As shown in FIG. 14, the measuring device 1 according to this embodiment further includes an air blower 4. The air blower 4 blows air to a region of the upper surface 90a of the thin structure 90 that corresponds to the imaging range of the imager 2, thereby suppressing fluctuations due to heat around the thin structure 90.

By doing so, even when fluctuations due to high temperature (temperature fluctuations) occur around the thin-walled structure 90, the measuring device 1 can use the air blowing from the air blowing section 4 to maintain the photographing range of the photographing section 2. It becomes possible to suppress temperature fluctuations within the interior.

As described above, several embodiments according to the present disclosure have been described, but all these embodiments are presented as examples and are not intended to limit the scope of the invention. These embodiments can be implemented in various other forms, and various omissions, substitutions, and changes can be made without departing from the gist of the invention. These embodiments and their modifications are included within the scope and gist of the invention as well as within the scope of the invention described in the claims and its equivalents.

FIG. 15 is a diagram for explaining an example of a measuring device according to another embodiment.
For example, in the above-described embodiment, the measurement unit 111 determines, from the image D1, the first end P1, which is a point on one side in the width direction of the upper surface 90a of the thin structure 90, and the second end, which is a point on the other side in the width direction. Although an example has been described in which the portion P2 is detected and the displacement in the vertical direction is measured, the present invention is not limited to this. In another embodiment, as shown in FIG. 15, the measuring unit 111 measures the plurality of first ends P1, P1', and P1'' on one side in the width direction of the upper surface 90a from the image D1, and on the other side in the width direction. The displacement in the vertical direction may be measured by detecting the plurality of second ends P2, P2', and P2''. Further, the correction unit 112 corrects the displacement of each end measured by the measurement unit 111. The specific processing of the measuring section 111 and the correcting section 112 is the same as in the first embodiment. Although FIG. 15 shows an example in which the measurement unit 111 measures three first ends and three second ends, the measurement is not limited to this. The measurement unit 111 may measure a larger number of first ends and second ends.

By measuring the displacements of the plurality of first ends P1, P1', and P1'' in this way, the measuring device 1 can determine how far one side in the width direction of the upper surface 90a is vertically relative to the horizontal direction. It becomes possible to detect whether it is tilted. Similarly, by measuring the displacements of the plurality of second ends P2, P2', and P2'', the measuring device 1 determines how much the other side in the width direction of the upper surface 90a is tilted vertically with respect to the horizontal direction. It becomes possible to detect whether the

Furthermore, by adjusting the shooting timing of the first camera 21 according to the advancing speed of the thin-walled structure 90, it is possible to obtain fine data at approximately equal intervals on one side and the other side in the width direction of the upper surface 90a. becomes. Thereby, the measuring device 1 can measure the state of the thin structure 90 in more detail even if, for example, a camera other than a high-speed camera is used as the first camera 21.

In yet another embodiment, the measurement unit 111 measures the displacement of a plurality of first ends on one side in the width direction and a plurality of second ends on the other side in the width direction of the lower surface 90d of the thin structure 90. Alternatively, the displacements of the plurality of first ends on one side in the vertical direction and the plurality of second ends on the other side in the vertical direction of the side surfaces 90b and 90c of the thin structure 90 may be measured. Furthermore, the measurement unit 111 may measure the displacement in the width direction of each of the plurality of first ends and second ends.

<Additional notes>
The measuring device, measuring method, and program described in the above-described embodiments can be understood, for example, as follows.

(1) According to the first aspect of the present disclosure, the measuring device (1) tilts the optical axis with respect to the width direction and the vertical direction of the thin-walled structure (90), and A photographing section (2) having a first camera that photographs a first measurement target surface, which is a surface facing in the vertical direction or width direction, and an image taken by the first camera (21), detect the vertical direction of the first measurement target surface. Displacement in the vertical direction or width direction of the first end on one side or one side in the width direction, and displacement in the vertical direction or width direction of the second end on the other side in the vertical direction or the other side in the width direction of the first measurement target surface and a measurement unit (111) that measures the distance between the first camera (21) and the thin structure (90), and a correction that corrects the displacement of the first end and the displacement of the second end based on the distance between the first camera (21) and the thin structure (90). (112).

By doing so, the measurement device has a simple configuration in which the thin-walled structure is photographed using one first camera, and can simultaneously measure the vertical or widthwise displacement of both ends of the thin-walled structure. can do. This allows the measurement device to accurately measure behaviors such as meandering, out-of-plane deformation, deflection, uplift, and waviness of thin-walled structures, compared to conventional technology that measures only a portion of the surface of thin-walled structures. Can be measured well.

(2) According to the second aspect of the present disclosure, in the measuring device (1) according to the first aspect, the imaging unit (2) is configured to provide a second measurement target that is the upper surface or the lower surface of the thin structure (90). The measurement unit (111) further includes a second camera (22) that photographs the surface, and the measurement unit (111) determines the width direction of one end in the width direction of the second measurement target surface from the image photographed by the second camera (22). and the displacement in the width direction of the other end in the width direction of the second measurement target surface.

By doing so, the measuring device can simultaneously measure the displacement in the width direction (horizontal direction) at both ends of the thin structure in the width direction. This allows the measuring device to accurately measure behaviors such as meandering, out-of-plane deformation, deflection, uplift, and waviness of the thin-walled structure.

(3) According to the third aspect of the present disclosure, in the measuring device (1) according to the first or second aspect, the imaging unit (2) is arranged in the width direction and the vertical direction of the thin structure (90). A third camera (23) that photographs a third measurement target surface, which is a side surface facing one side in the width direction of the thin-walled structure (90), with its optical axis tilted relative to the width direction of the thin-walled structure (90); and a fourth camera (24) that tilts the optical axis with respect to the vertical direction and photographs a fourth measurement target surface that is a side surface facing the other side in the width direction of the thin structure (90), The measurement unit (111) measures the positions in the vertical direction of the upper end and the lower end of the third measurement target surface from the image taken by the third camera (23), and measures the position in the vertical direction of the upper end and the lower end of the third measurement target surface from the image taken by the fourth camera (24). Measure the positions of the upper and lower ends of the target surface in the vertical direction.

By doing so, the measuring device can further measure the plate thickness on both sides in the width direction of the thin structure and the variation in the direction perpendicular to the plate thickness. Thereby, the measuring device can measure the behavior of the thin-walled structure in more detail.

(4) According to the fourth aspect of the present disclosure, the measuring device (1) according to the third aspect measures the brightness of the third measurement target surface and the fourth measurement target surface, and the top surface of the thin structure (90). Alternatively, the apparatus further includes an illumination unit that irradiates light onto one of the upper surface and the lower surface, or the third measurement target surface and the fourth measurement target surface so that the brightness of the lower surface is different.

By doing so, the measurement device highlights the brightness difference between the upper surface or the lower surface and the third measurement target surface and the fourth measurement target surface, and the third measurement target, which is the boundary between the upper surface or the lower surface, The upper end or lower end of the surface and the upper end or lower end of the fourth measurement target surface can be detected with high accuracy.

(5) According to the fifth aspect of the present disclosure, in the measuring device (1) according to any one of the first to fourth aspects, the imaging section (2) is arranged in the width direction of the thin structure (90). The first camera (21) further includes a fifth camera (25) for photographing a fifth measurement target surface, which is a side surface facing toward The portion (111) is based on the image taken by the first camera (21) and the image taken by the fifth camera (25) to determine the vertex of the top or bottom surface formed by the deflection of the thin structure (90). Measure the vertical position of the part.

By doing so, the measuring device can further measure the displacement associated with the deflection or inclination of the thin-walled structure. Thereby, the measuring device can measure the behavior of the thin-walled structure in more detail.

(6) According to the sixth aspect of the present disclosure, in the measuring device (1) according to any one of the first to fifth aspects, the imaging unit (2) performs adjustment to change the position and angle of the camera. It further includes a mechanism (26).

By doing so, the measuring device can accurately detect the first end, the second end, etc. to be measured.

(7) According to the seventh aspect of the present disclosure, the measuring device (1) according to any one of the first to sixth aspects further includes Be prepared.

In this way, even if fluctuations due to high temperatures (temperature fluctuations) occur around a thin-walled structure, the measurement device can detect temperature fluctuations within the imaging range of the imaging section by the air blowing from the ventilation section. It becomes possible to suppress the

(8) According to the eighth aspect of the present disclosure, the measurement method includes tilting the optical axis with respect to the width direction and the vertical direction of the thin-walled structure (90), and A step of photographing the first measurement target surface, which is a surface facing the width direction, with the first camera (21), and from the image photographed by the first camera (21), one side in the vertical direction or the width direction of the first measurement target surface. Measuring the vertical or widthwise displacement of the first end on one side and the vertical or widthwise displacement of the second end on the other side in the vertical direction or the other side in the width direction of the first measurement target surface and correcting the displacement of the first end and the displacement of the second end based on the distance between the first camera (21) and the thin structure (90).

(9) According to the ninth aspect of the present disclosure, the program tilts the optical axis with respect to the width direction and the up-down direction of the thin-walled structure (90), and A step of photographing the first measurement target surface, which is a surface facing the direction, with the first camera (21), and from the image photographed by the first camera (21), one side in the vertical direction or one side in the width direction of the first measurement target surface. measuring the displacement in the vertical direction or the width direction of the first end of the side, and the displacement in the vertical direction or the width direction of the second end of the other side in the vertical direction or the other side in the width direction of the first measurement target surface; , causing the measuring device to execute the steps of correcting the displacement of the first end and the displacement of the second end based on the distance between the first camera (21) and the thin structure (90).

1 Measuring device 2 Photographing section 21 First camera 22 Second camera 23 Third camera 24 Fourth camera 25 Fifth camera 26 Adjustment mechanism 26A Vertical position adjustment mechanism 26B Horizontal position adjustment mechanism 26C Angle adjustment mechanism 3 Lighting section 4 Air blowing section 10 Control device 11 Processor 110 Image acquisition section 111 Measurement section 112 Correction section 12 Memory 13 Storage 14 Communication interface 15 Display device 16 Input device

Claims (9)

a first camera having an optical axis tilted with respect to the width direction and the vertical direction of the thin-walled structure to photograph a first measurement target surface that is a surface facing the vertical direction or the width direction of the thin-walled structure; ,
From the image taken by the first camera, the displacement in the vertical direction or the width direction of the first end on one side in the vertical direction or one side in the width direction of the first measurement target surface, and the vertical direction of the first measurement target surface a measurement unit that measures vertical displacement of the second end on the other side or the other side in the width direction;
a correction unit that corrects displacement of the first end and displacement of the second end based on a distance between the first camera and the thin structure;
A measuring device comprising: The photographing unit further includes a second camera that photographs a second measurement target surface that is an upper surface or a lower surface of the thin structure,
The measurement unit calculates, from the image taken by the second camera, a displacement in the width direction of an end on one side in the width direction of the second measurement target surface and an end on the other side in the width direction of the second measurement target surface. Measure the displacement in the width direction of
The measuring device according to claim 1. The photographing unit includes a third camera that photographs a third measurement target surface, which is a side surface facing one side in the width direction of the thin structure, with its optical axis tilted with respect to the width direction and the vertical direction of the thin structure. and a fourth camera that tilts its optical axis with respect to the width direction and the vertical direction of the thin-walled structure and photographs a fourth measurement target surface that is a side surface facing the other side in the width direction of the thin-walled structure. Furthermore, it has
The measuring unit measures the positions in the vertical direction of the upper end and the lower end of the third measurement target surface from the image taken by the third camera, and the upper end of the fourth measurement target surface from the image taken by the fourth camera. and measuring the position of the bottom edge in the vertical direction,
The measuring device according to claim 1 or 2. One of the upper surface and the lower surface, or the third measurement target surface and further comprising an illumination unit that irradiates light to the fourth measurement target surface;
The measuring device according to claim 3. The photographing unit further includes a fifth camera that photographs a fifth measurement target surface that is a side surface facing in the width direction of the thin structure,
The first camera photographs an upper surface or a lower surface of the thin structure as the first measurement target surface,
The measuring unit is configured to measure the vertical direction of the top surface or the bottom surface formed by the deflection of the thin structure based on the image taken by the first camera and the image taken by the fifth camera. measure position,
The measuring device according to any one of claims 1 to 4. The photographing unit further includes an adjustment mechanism that changes the position and angle of the camera.
The measuring device according to any one of claims 1 to 5. further comprising an air blowing unit that blows air to the thin structure;
The measuring device according to any one of claims 1 to 6. tilting the optical axis with respect to the width direction and the vertical direction of the thin-walled structure, and photographing a first measurement target surface, which is a surface facing the vertical direction or the width direction of the thin-walled structure, with a first camera;
From the image taken by the first camera, the displacement in the vertical direction or the width direction of the first end on one side in the vertical direction or one side in the width direction of the first measurement target surface, and the vertical direction of the first measurement target surface Measuring vertical or widthwise displacement of the second end on the other side or the other side in the width direction;
correcting the displacement of the first end and the displacement of the second end based on the distance between the first camera and the thin structure;
A measurement method having tilting the optical axis with respect to the width direction and the vertical direction of the thin-walled structure, and photographing a first measurement target surface, which is a surface facing the vertical direction or the width direction of the thin-walled structure, with a first camera;
From the image taken by the first camera, the displacement in the vertical direction or the width direction of the first end on one side in the vertical direction or one side in the width direction of the first measurement target surface, and the vertical direction of the first measurement target surface Measuring vertical or widthwise displacement of the second end on the other side or the other side in the width direction;
correcting the displacement of the first end and the displacement of the second end based on the distance between the first camera and the thin structure;
A program that causes the measurement device to execute.

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