JP2022512302A5 - - Google Patents

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Publication number
JP2022512302A5
JP2022512302A5 JP2021529313A JP2021529313A JP2022512302A5 JP 2022512302 A5 JP2022512302 A5 JP 2022512302A5 JP 2021529313 A JP2021529313 A JP 2021529313A JP 2021529313 A JP2021529313 A JP 2021529313A JP 2022512302 A5 JP2022512302 A5 JP 2022512302A5
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JP
Japan
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JP2021529313A
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Japanese (ja)
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JPWO2020123063A5 (https=
JP7474255B2 (ja
JP2022512302A (ja
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JP2021529313A 2018-12-13 2019-11-06 イオン注入システムおよび方法 Active JP7474255B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16/218,884 2018-12-13
US16/218,884 US10553392B1 (en) 2018-12-13 2018-12-13 Scan and corrector magnet designs for high throughput scanned beam ion implanter
PCT/US2019/060084 WO2020123063A1 (en) 2018-12-13 2019-11-06 Scan and corrector magnet designs for high throughput scanned beam ion implanter

Publications (4)

Publication Number Publication Date
JP2022512302A JP2022512302A (ja) 2022-02-03
JPWO2020123063A5 JPWO2020123063A5 (https=) 2023-10-26
JP2022512302A5 true JP2022512302A5 (https=) 2023-10-26
JP7474255B2 JP7474255B2 (ja) 2024-04-24

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JP2021529313A Active JP7474255B2 (ja) 2018-12-13 2019-11-06 イオン注入システムおよび方法

Country Status (6)

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US (2) US10553392B1 (https=)
JP (1) JP7474255B2 (https=)
KR (1) KR102751449B1 (https=)
CN (1) CN113169011B (https=)
TW (1) TWI827743B (https=)
WO (1) WO2020123063A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170005013A1 (en) * 2015-06-30 2017-01-05 Varian Semiconductor Equipment Associates, Inc. Workpiece Processing Technique
US10553392B1 (en) * 2018-12-13 2020-02-04 Axcelis Technologies, Inc. Scan and corrector magnet designs for high throughput scanned beam ion implanter
US11217427B1 (en) * 2020-11-27 2022-01-04 Applied Materials, Inc. System, apparatus and method for bunched ribbon ion beam
US11560995B1 (en) 2021-07-28 2023-01-24 Hyundai Mobis Co., Ltd. Lamp for vehicle and vehicle including the same
CN117476431B (zh) * 2023-12-28 2024-04-12 杭州泽天春来科技股份有限公司 四极杆射频电源扫描控制方法、系统及可读存储介质

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US4922106A (en) 1986-04-09 1990-05-01 Varian Associates, Inc. Ion beam scanning method and apparatus
US5834786A (en) * 1996-07-15 1998-11-10 Diamond Semiconductor Group, Inc. High current ribbon beam ion implanter
JP3567749B2 (ja) 1998-07-22 2004-09-22 日新電機株式会社 荷電粒子ビームの分布測定方法およびそれに関連する方法
US7550751B2 (en) * 2006-04-10 2009-06-23 Axcelis Technologies, Inc. Ion beam scanning control methods and systems for ion implantation uniformity
US7615763B2 (en) * 2006-09-19 2009-11-10 Axcelis Technologies, Inc. System for magnetic scanning and correction of an ion beam
WO2009045722A1 (en) * 2007-09-28 2009-04-09 Varian Semiconductor Equipment Associates, Inc. Two-diemensional uniformity correction for ion beam assisted etching
US8138484B2 (en) 2010-04-28 2012-03-20 Axcelis Technologies Inc. Magnetic scanning system with improved efficiency
US20110272567A1 (en) * 2010-05-05 2011-11-10 Axcelis Technologies, Inc. Throughput Enhancement for Scanned Beam Ion Implanters
US8637838B2 (en) * 2011-12-13 2014-01-28 Axcelis Technologies, Inc. System and method for ion implantation with improved productivity and uniformity
CN102779711B (zh) * 2012-08-01 2014-11-05 西安工业大学 具有超大离子束发散角的离子源
US9029811B1 (en) 2013-10-22 2015-05-12 Varian Semiconductor Equipment Associates, Inc. Apparatus to control an ion beam
US9520204B2 (en) 2013-12-26 2016-12-13 Varian Semiconductor Equipment Associates, Inc. Cold stripper for high energy ion implanter with tandem accelerator
JP6195538B2 (ja) * 2014-04-25 2017-09-13 住友重機械イオンテクノロジー株式会社 イオン注入方法及びイオン注入装置
US9679739B2 (en) 2014-12-26 2017-06-13 Axcelis Technologies, Inc. Combined electrostatic lens system for ion implantation
TW201635326A (zh) 2014-12-26 2016-10-01 艾克塞利斯科技公司 在具有射束減速的離子植入器中用於射束角度調整的系統及方法
US9738968B2 (en) * 2015-04-23 2017-08-22 Varian Semiconductor Equipment Associates, Inc. Apparatus and method for controlling implant process
US9728371B2 (en) 2015-05-27 2017-08-08 Nissin Ion Equipment Co., Ltd. Ion beam scanner for an ion implanter
JP6517163B2 (ja) * 2016-03-18 2019-05-22 住友重機械イオンテクノロジー株式会社 イオン注入装置及びスキャン波形作成方法
US10553392B1 (en) * 2018-12-13 2020-02-04 Axcelis Technologies, Inc. Scan and corrector magnet designs for high throughput scanned beam ion implanter

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