JP2022185919A - Measuring instrument and measuring method - Google Patents

Abstract

To provide a measuring instrument that is facilitated in adjusting a projection quantity of a blade of a counter sink relative to a micro-stopper, and to provide a measuring method.SOLUTION: A measuring instrument 1 includes: a measuring part 10 including a measuring probe 11 including a first abutment part 111 capable of abutting on a blade TT of a counter sink CS; and a base 20 including a second abutment part 201 capable of abutting on an abutment surface MC of a micro-stopper MS. The measuring probe is movable in an axial direction of the counter sink relative to the base.SELECTED DRAWING: Figure 2

Description

The present disclosure relates to a measuring device and a measuring method.

It is known that cutting tools are used for machining structural parts.

For example, Patent Literature 1 discloses a technique for adjusting the amount of protrusion of the tip of a cutting tool used in a machine tool.

JP-A-2002-166338

Structural components may require dishing.
A cutting tool called a countersink is used for processing such a dish shape. In order to machine a dish shape with an appropriate depth, it is necessary to adjust the amount of protrusion of the countersink blade with respect to the micro stopper.
However, the blade of the countersink is inclined with respect to the axial direction of the countersink.
Therefore, with the technique disclosed in Patent Document 1, it is difficult to adjust the amount of protrusion of the blade of the countersink with respect to the microstopper.

An object of the present disclosure is to provide a measuring device and a measuring method that facilitate adjustment of the amount of protrusion of a countersink blade with respect to a microstopper.

In order to solve the above problems, a measuring device according to the present disclosure includes a measuring unit including a measuring probe having a first contacting portion that can contact a blade of a countersink, and a contact surface of a microstopper. a base having a second contact portion, and the measurement probe is movable in the axial direction of the countersink with respect to the base.

In the measurement method according to the present disclosure, the blade of the countersink is brought into contact with the first contact portion of the measurement probe that is movable in the axial direction of the countersink with respect to the base, and the contact surface of the microstopper is aligned with the base. The measurement probe is pushed in until it contacts the second contact portion.

According to the measuring device and measuring method of the present disclosure, it is easy to adjust the protrusion amount of the blade of the countersink with respect to the microstopper.

1 is a perspective view of a measurement device according to certain embodiments of the present disclosure; FIG. FIG. 2 is a sectional view taken along the line II-II in FIG. 1; 4 is a flow chart of a measurement method according to an embodiment of the present disclosure; FIG. 10 is a cross-sectional view of a metrology device in the step of preparing a pre-aligned countersink according to an embodiment of the present disclosure; FIG. 10 is a cross-sectional view of a metrology device in a blade abutting step according to an embodiment of the present disclosure; FIG. 10 is a cross-sectional view of a measuring device in the step of pushing a countersink according to an embodiment of the present disclosure; FIG. 10 is a cross-sectional view of the measuring device in the step of contacting the contact surface according to an embodiment of the present disclosure;

Hereinafter, each embodiment of the present disclosure will be described with reference to the drawings. The same reference numerals are given to the same or corresponding configurations in all the drawings, and common explanations are omitted.

<Embodiment>
A measuring device according to an embodiment will be described with reference to FIGS. 1 to 7. FIG.

(Overall configuration of measuring device)
As shown in FIG. 1 , the measuring device 1 includes a measuring section 10 and a base 20 .
For example, the measuring device 1 may be equipment for adjusting a tool set for processing a structural part such as an aircraft into a dish shape.
For example, the measuring device 1 may be a facility for adjusting the position of the countersink blade with respect to the microstopper.
For example, the measuring device 1 may be equipment for measuring the amount of protrusion of the blade of the countersink with respect to the microstopper.

(Configuration of tool set)
As shown in FIG. 2, the tool set TS comprises a countersink CS and a microstopper MS.
The countersink CS is a cutting tool for processing a structural component into a dish shape.
The micro stopper MS is a support structure for supporting the countersink CS and a mechanism for stopping dish-shaped cutting at a predetermined depth.
For example, microstopper MS has a contact surface MC at one end.
For example, the contact surface MC may be the lower surface of the hollow columnar resin MP provided in the microstopper MS.
The micro stopper MS fixes and supports the countersink CS at a position where the protruding amount AP of the blade TT with respect to the contact surface MC is a predetermined value in the axial direction DA of the countersink CS.
If dish-shaped cutting is performed with such a tool set TS, cutting can be performed up to a position where the contact surface MC contacts one surface of the structural component.
Therefore, the depth of the dish-shaped structural part machined by the countersink CS matches the projection amount AP of the blade TT of the countersink CS with respect to the contact surface MC.
For example, the countersink CS may have a pilot portion PT for guiding the cutting direction.
For example, the pilot part PT may have a bar shape further extending from the tip of the blade TT in the axial direction DA of the countersink CS.

(Configuration of measurement unit)
The measurement unit 10 has a measurement probe 11 .
The measurement probe 11 has a first contact portion 111 that can contact the blade TT of the countersink CS.
The measurement probe 11 is movable with respect to the base 20 in the axial direction DA of the countersink CS.
For example, the measurement probe 11 may be movable with respect to the base 20 in the axial direction DA of the countersink CS.
For example, the axial direction DA may be the vertical direction.

For example, the measurement probe 11 may be fitted into the opening 202 of the base 20 from above the base 20 .
For example, the measurement probe 11 may be movable in the axial direction DA with respect to the opening 202 of the base 20 .
For example, the measurement probe 11 may have a central axis 112 coaxial with the opening 202 of the base 20 .
For example, the measurement probe 11 may have a cylindrical shape coaxial with the opening 202 of the base 20 .
For example, the measurement probe 11 may be configured to sink into the opening 202 of the base 20 by being pushed in the axial direction DA by the blade TT of the countersink CS.

For example, the first contact portion 111 may be dish-shaped and recessed.
For example, the first contact portion 111 may be recessed in the axial direction DA.
For example, the first contact portion 111 may have a dish shape that narrows and dents toward the inside of the measurement probe 11 from the side near the blade TT of the countersink CS.

For example, the measurement probe 11 may have an escape hole 113 extending from the first contact portion 111 in the axial direction DA.
For example, the escape hole 113 may communicate with the dish-shaped recess of the first contact portion 111 and further extend from the first contact portion 111 toward the inner side of the measurement probe 11 .
For example, the escape hole 113 is thicker and longer than the pilot portion PT so as to escape the measurement probe 11 from the pilot portion PT of the countersink CS when the blade TT of the countersink CS is in contact with the first contact portion 111. It may have a shape.

For example, the measuring section 10 may further include a micrometer 12, an extending section 13, and an elastic mechanism 14.

The micrometer 12 is a displacement gauge for measuring the relative position of the measurement probe 11 in the axial direction DA.
The micrometer 12 includes a measurement surface 121 , a display section 122 and a base section 123 .
In the micrometer 12, the measurement surface 121 can move forward and backward from the base 123 in the axial direction DA.
For example, the measurement surface 121 may have a circular shape whose center is located on the central axis 112 of the measurement probe 11 .
For example, the micrometer 12 may measure the relative position of the measurement surface 121 in the axial direction DA as the relative position of the measurement probe 11 in the axial direction DA.
For example, the micrometer 12 may measure the relative position of the measurement probe 11 in the axial direction DA by bringing the measurement surface 121 into contact with the lower end of the extending portion 13 .
For example, the micrometer 12 may measure the relative position of the measurement probe 11 in the axial direction DA with respect to the reference position stored in advance as a zero value.
For example, the micrometer 12 may display the measured relative position of the measurement probe 11 on the display unit 122 .

The extension part 13 has a cylindrical shape extending in the axial direction DA from the measurement probe 11 toward the measurement surface 121 .
For example, the extending portion 13 may advance and retreat in the axial direction DA in conjunction with the appearance and withdrawal of the measurement probe 11 with respect to the opening 202 .
For example, the upper end of extension 13 may be coupled with measurement probe 11 within opening 202 .
For example, the lower end of the extending portion 13 may face the measurement surface 121 .
For example, the extension 13 may be coaxial with the measurement probe 11 .

The elastic mechanism 14 biases the measurement probe 11 in the axial direction DA with respect to the base 20 .
The elastic mechanism 14 biases the measuring probe 11 in a direction opposite to the sinking direction of the measuring probe 11 into the opening 202 .
For example, the elastic mechanism 14 may bias the measurement probe 11 toward the blade TT of the countersink CS.
For example, the elastic mechanism 14 may bias the measurement probe 11 such that the upper end of the elastic mechanism 14 pushes up the lower surface of the measurement probe 11 .
For example, the elastic mechanism 14 may be a coil spring provided coaxially with the measurement probe 11 so that the extending portion 13 penetrates.
For example, the elastic mechanism 14 may be coaxial with the measurement probe 11 .

(Configuration of base)
As noted above, base 20 has opening 202 .
For example, the opening 202 may house the resilient mechanism 14 .
For example, the measurement probe 11 may be accommodated in the opening 202 so as to appear and disappear in the axial direction DA.
For example, the extension 13 may extend in the axial direction DA within the opening 202 .
For example, aperture 202 may have a cylindrical shape.

The base 20 further has a second contact portion 201 that can contact the contact surface MC of the microstopper MS.
For example, the second contact portion 201 may be a plane facing the contact surface MC.
For example, the second contact portion 201 may be a hollow circle whose center is located on the central axis 112 of the measurement probe 11 .

For example, the base 20 may further have a protruding portion 203 protruding from the outer periphery of the opening 202 toward the center of the opening 202 at the lower end of the opening 202 so that the lower end of the elastic mechanism 14 can be placed thereon.
For example, the base 20 may have a hollow portion 204 that can accommodate the micrometer 12 .
For example, the base 20 may have a fixture 206 that secures the base 123 of the micrometer 12 to the bottom 205 .
For example, the opening 202 may be a hole penetrating the base 20 in the axial direction DA from the surface having the second contact portion 201 to the hollow portion 204 .

For example, the base 20 may further include a pilot check hole 207 for checking the outer diameter of the pilot portion PT.

(motion)
The operation of the measuring device 1 of this embodiment will be described.
This operation corresponds to an embodiment of the measurement method.
The operator implements each step shown in FIG.

For example, the operator may first set the reference protrusion amount AP0 in advance (ST01: step of setting the reference protrusion amount).
For example, for a tool set (master) that has already been adjusted to machine a dish of appropriate depth by actually machining several countersinks, the operator can determine the position of the countersink blade against the microstopper. The amount of protrusion may be measured by the measuring device 1 and set as the reference amount of protrusion AP0.
For example, the operator may store the reference protrusion amount AP0 as a zero value in the micrometer 12 as the setting of the reference protrusion amount AP0.

Following the execution of ST01, the operator prepares the provisionally adjusted countersink CS as shown in FIG. 4 (ST02: step of preparing the provisionally adjusted countersink).
For example, in ST02, the operator may temporarily adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.
For example, in ST02, the operator may prepare the tool set TS in which the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS is temporarily adjusted.

After performing ST02, the operator places the countersink CS on the base 20 (ST03: step of placing).
For example, the operator may place on the base 20 the tool set TS in which the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS is temporarily adjusted.

Following the execution of ST03, the operator, as shown in FIG. The blade TT is applied (ST04: step of applying the blade).
For example, in ST<b>04 , the operator may bring the temporarily adjusted blade TT of the countersink CS into contact with the first contact portion 111 .

Following the execution of ST04, the operator pushes in the measurement probe 11 as shown in FIG. 6 (ST05: step of pushing in the measurement probe).
In ST05, the operator pushes the measurement probe 11 until the contact surface MC of the microstopper MS contacts the second contact portion 201 of the base 20, as shown in FIG.
For example, in ST05, the operator may push the measurement probe 11 in the axial direction DA while keeping the blade TT in contact with the first contact portion 111. As shown in FIG.

After performing ST05, the operator compares the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS with the reference protrusion amount AP0 (ST06: step of comparison).
For example, in ST06, the operator may measure the difference between the projection amount AP and the reference projection amount AP0 in the state shown in FIG.
For example, in ST06, the operator may read the measured value of the micrometer 12 in which the reference protrusion amount AP0 is stored as a zero value as the difference in the protrusion amount AP from the reference protrusion amount AP0.
For example, in ST06, the operator may determine whether or not the difference between the reference protrusion amount AP0 and the protrusion amount AP is within the allowable value. In this case, the allowable value may be a value that is allowed for the depth of the dish shape to be machined for the mechanical component.
For example, in ST06, the operator may determine whether or not the difference between the reference protrusion amount AP0 and the reference protrusion amount AP0 is zero to determine whether or not the difference is within the allowable value.

If the difference between the projection amount AP and the reference projection amount AP0 is within the allowable value (ST06: Yes), the adjustment of the projection amount AP of the blade TT of the countersink CS with respect to the microstopper MS is completed, and the measurement method ends.
If the difference in the protrusion amount AP from the reference protrusion amount AP0 is not within the allowable value (ST06: No), adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS (ST07: step of adjusting the protrusion amount), Return to ST03.

(Action and effect)
According to this embodiment, the relative position of the measurement probe 11 in the axial direction DA is related to the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.
Therefore, the operator can measure the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS by measuring the position of the measurement probe 11 in the axial direction DA.
Therefore, according to the measuring device 1, it is easy to adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.

Generally, bolts are sometimes used for fastening structural parts. At that time, the structural parts need processing for inserting the bolts.
For example, countersunk head bolt insertion holes require countersunk machining.
For example, it is necessary to provide a disc-shaped relief called a fillet relief in the insertion hole of the protruding head bolt.
A countersink fixed to a micro-stopper is used as a cutting tool to machine a plate shape with an appropriate depth in the structural part. The countersink cuts the surface of the structural component by rotating a blade that is inclined with respect to the axial direction of the countersink in the axial direction to machine a dish shape. When the surface of the structural component is cut so that the dish shape reaches a specified depth, the contact surface of the microstopper comes into contact with the surface of the structural component. Therefore, it is possible to process a shape with a prescribed depth.
Therefore, in order to machine a dish shape with a specified depth, it is necessary to appropriately adjust the protrusion amount of the countersink blade with respect to the micro stopper.

As Comparative Example 1, it is assumed that the worker adjusts the amount of protrusion of the countersink blade with respect to the microstopper by bringing the measurement surface of the micrometer into direct contact with the countersink blade.
However, since the blade of the countersink is inclined with respect to the axial direction of the countersink, in Comparative Example 1, it is difficult for the operator to uniquely identify the position of the blade of the countersink.
On the other hand, according to the present embodiment, the position of the countersink blade can be identified by measuring the position of the measurement probe 11. Therefore, the operator can determine the protrusion amount of the countersink CS blade TT with respect to the microstopper MS. Easy to measure AP.

As Comparative Example 2, it is assumed that the worker adjusted the protrusion amount of the countersink blade with respect to the microstopper by actually machining the structural part into a dish shape and measuring the depth of the machined dish shape. .
However, in Comparative Example 2, since at least cutting is required for actual dish-shaped processing, the operator is physically burdened to adjust the amount of protrusion of the countersink blade with respect to the microstopper.
In contrast, according to the present embodiment, the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS can be adjusted without actually processing the dish shape, thereby reducing the physical burden on the operator. be done.

According to one example of the present embodiment, the micrometer 12 allows the operator to numerically evaluate the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.
Therefore, the operator can adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS without relying on intuition or tricks.

According to one example of the present embodiment, since the measurement probe 11 can appear and disappear in the axial direction DA with respect to the opening 202 of the base 20, the measurement apparatus 1 presses the countersink CS against the measurement probe 11 in the axial direction DA. It has an easy structure.
Therefore, according to the measuring device 1, the operator can easily measure the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.

According to one example of the present embodiment, the first contact portion 111 is recessed in a dish shape, so that the first contact portion 111 has a structure capable of widely contacting the blade TT of the countersink CS.
Therefore, the measured protrusion amount AP tends to show a stable value.

According to one example of the present embodiment, since the escape hole 113 extending in the axial direction DA from the first contact portion 111 is provided, when the first contact portion 111 contacts the blade TT of the countersink CS, the measuring device 1 has a structure that allows the pilot part PT of the countersink CS to escape.
Therefore, the pilot part PT is less likely to interfere in the measurement of the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.

According to one example of the present embodiment, the reference protrusion amount AP0 is set in advance, and the protrusion amount AP of the blade TT with respect to the microstopper MS is compared with the reference protrusion amount AP0. , it is easy to adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.

According to one example of the present embodiment, in the comparison, in order to measure the difference in the protrusion amount AP with respect to the reference protrusion amount AP0, the operator determines whether or not the protrusion amount AP of the countersink CS should be adjusted with respect to the microstopper MS. It is easy to grasp how much adjustment should be made.

According to one example of this embodiment, in order to adjust the amount of protrusion AP so that the difference is within the allowable value, the operator follows the standard that has already been adjusted so that a plate shape with an appropriate depth can be processed. , the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS can be adjusted.

<Modification>
In the example of the embodiment described above, the measurement unit 10 includes the micrometer 12 as a displacement meter, but any displacement meter may be provided as long as it can measure the relative position of the measurement probe 11 in the axial direction DA.
As a modification, the measurement unit 10 may include a laser displacement gauge as the displacement gauge.

In one example of the embodiment described above, the base 123 of the micrometer 12 is fixed to the bottom 205 of the base 20 by the fixing base 206, but if the base 123 of the micrometer 12 were fixed to the base 20 , may be configured in any way.
Alternatively, the base 123 of the micrometer 12 may be fixed to the base 20 by being fixed to an arm hanging from the top of the base 20 .

In the example of the above-described embodiment, ST07 is performed and then ST03 is performed.
As a modification, if the protrusion amount AP of the blade TT can be adjusted in a state in which the measurement probe 11 is pushed in (for example, the state shown in FIG. 7), ST07 may be followed by returning to ST06.

Although embodiments of the present disclosure have been described above, these embodiments are presented as examples and are not intended to limit the scope of the disclosure. These embodiments can be implemented in various other forms, and various omissions, replacements, and modifications can be made without departing from the gist of the disclosure. These embodiments and variations thereof are included within the scope and spirit of the disclosure.

<Appendix>
For example, the measuring device 1 and the measuring method described in the above embodiments are understood as follows.

(1) A measuring device 1 according to a first aspect includes a measuring unit 10 including a measuring probe 11 having a first contact portion 111 capable of contacting a blade TT of a countersink CS, and a contact surface MC of a microstopper MS. and a base 20 having a second contact portion 201 capable of coming into contact with the base 20, and the measurement probe 11 is movable with respect to the base 20 in the axial direction DA of the countersink CS.

According to this aspect, the relative position of the measurement probe 11 in the axial direction DA is related to the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.
Therefore, the operator can measure the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS by measuring the position of the measurement probe 11 in the axial direction DA.
Therefore, according to the measuring device 1, the operator can easily adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.

(2) A measuring device 1 according to a second aspect is the measuring device 1 of (1), wherein the measuring unit 10 further includes a micrometer 12 .

According to this aspect, the operator can numerically evaluate the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.
Therefore, the operator can adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS without relying on intuition or tricks.

(3) The measuring device 1 according to the third aspect is the measuring device 1 according to (1) or (2), in which the measuring probe 11 can appear and disappear in the axial direction DA with respect to the opening 202 of the base 20. be.

According to this aspect, the measuring device 1 has a structure that facilitates pressing the countersink CS against the measuring probe 11 in the axial direction DA.
Therefore, according to the measuring device 1, the operator can easily measure the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.

(4) A measuring device 1 according to a fourth aspect is the measuring device 1 according to (1) or (3), in which the first contact portion 111 is dish-shaped and recessed.

According to this aspect, the first contact portion 111 has a structure capable of widely contacting the blade TT of the countersink CS.
Therefore, the measured protrusion amount AP tends to show a stable value.

(5) In the measuring device 1 according to the fifth aspect, the measuring probe 11 has an escape hole 113 extending in the axial direction DA from the first contact portion 111 (1) or (4). It is a measuring device 1 .

According to this aspect, the measuring device 1 has a structure that allows the pilot part PT of the countersink CS to escape when the first contact part 111 contacts the blade TT of the countersink CS.
Therefore, the pilot part PT is less likely to interfere in the measurement of the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.

(6) In the measurement method according to the sixth aspect, the blade TT of the countersink CS is attached to the first contact portion 111 of the measurement probe 11 that is movable in the axial direction DA of the countersink CS with respect to the base 20. Then, the measurement probe 11 is pushed in until the contact surface MC of the microstopper MS comes into contact with the second contact portion 201 of the base 20 .

According to this aspect, the relative position of the measurement probe 11 in the axial direction DA is related to the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.
Therefore, the operator can measure the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS by measuring the position of the measurement probe 11 in the axial direction DA.
Therefore, according to the measuring method, the operator can easily adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS.

(7) A measurement method according to a seventh aspect is the measurement method of (6), in which a reference protrusion amount AP0 is set in advance, and the protrusion amount AP of the blade TT with respect to the micro stopper MS is compared with the reference protrusion amount AP0. is.

According to this aspect, the operator can easily adjust the protrusion amount AP of the blade TT of the countersink CS with respect to the microstopper MS so as to approach the preset reference.

(8) A measuring method according to an eighth aspect is the measuring method of (7), wherein in the comparison, the difference between the protrusion amount AP and the reference protrusion amount AP0 is measured.

According to this aspect, the operator can easily grasp whether or not the countersink CS should be adjusted with respect to the microstopper MS, and to what extent.

(9) A measuring method according to a ninth aspect is the measuring method of (7) in which the protrusion amount AP is adjusted so that the difference is within the allowable value.

According to this aspect, the operator can adjust the protruding amount AP of the blade TT of the countersink CS with respect to the microstopper MS, following the reference that has already been adjusted so as to be able to machine a dish shape with an appropriate depth.

1 Measuring Device 10 Measuring Part 11 Measuring Probe 12 Micrometer 13 Extension Part 14 Elastic Mechanism 20 Base 111 First Contact Part 112 Central Axis 113 Escape Hole 121 Measurement Surface 122 Display Part 123 Base Part 201 Second Contact Part 202 Opening 203 Protruding part 204 Hollow part 205 Bottom 206 Fixing table 207 Pilot check hole AP Projection amount CS Countersink DA Axial direction MC Contact surface MP Resin MS Micro stopper PT Pilot part TS Tool set TT Blade

Claims (9)

a measurement unit including a measurement probe having a first contact portion capable of coming into contact with the blade of the countersink;
a base having a second contact portion capable of coming into contact with the contact surface of the micro stopper;
The measuring device, wherein the measuring probe is movable in the axial direction of the countersink with respect to the base. The measuring device according to claim 1, wherein the measuring section further includes a micrometer. 3. The measuring apparatus according to claim 1, wherein the measuring probe can be retracted in the axial direction with respect to the opening of the base. The measuring device according to any one of claims 1 to 3, wherein the first contact portion is dish-shaped and recessed. The measuring device according to any one of claims 1 to 4, wherein the measuring probe has an escape hole extending in the axial direction from the first contact portion. the blade of the countersink is brought into contact with the first contact portion of the measurement probe that is movable in the axial direction of the countersink with respect to the base;
A measurement method in which the measurement probe is pushed in until the contact surface of the micro stopper contacts the second contact portion of the base. Set the reference protrusion amount in advance,
7. The measuring method according to claim 6, wherein the amount of protrusion of said blade with respect to said microstopper is compared with said reference amount of protrusion. 8. The measuring method according to claim 7, wherein in the comparison, a difference in the amount of protrusion with respect to the reference amount of protrusion is measured. The measuring method according to claim 8, wherein the protrusion amount is adjusted so that the difference is within a permissible value.

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