JP2022085474A - probe - Google Patents

Abstract

To provide a probe with which limitations on the layout of printed circuit boards hardly occur.SOLUTION: A probe 1 comprises: an inner housing 15 which is formed in a cylindrical shape and has one end 15a and other end 15b and into which a coaxial cable 11 is inserted; a probe pin 16 electrically connected to the coaxial cable 11 at the other end 15b and extending to the outside of the inner housing 15; a plunger 18 enclosing the periphery of the probe pin 16 and having an opening 18d formed therein that allows the tip of the probe pin 16 to be exposed; a flange 13 arranged at the one end 15a; a first spring 14 for biasing the inner housing 15 in a direction to separate from the flange 13; and an outer housing 19 which is formed in a cylindrical shape, accommodates the inner housing 15 and the first spring 14 and holds the plunger 18 such that a region of the plunger 18 where the opening 18d is formed is exposed to the outside.SELECTED DRAWING: Figure 2

Description

The present disclosure relates to probes used for character inspection of connectors.

Patent Document 1 describes a probe structure in which one end of a housing is fitted into a through hole of a flange by a spring and a plunger is attached to the other end of the housing to inspect the characteristics of a multipolar connector. It has been disclosed.

Japanese Patent No. 6597915

In the probe structure as exemplified in Patent Document 1, a spring is arranged on the outermost periphery of the side surface of the probe, and various parts are present inside the spring, so that the radial dimension of the entire probe is large. rice field. For this reason, in the conventional probe, the parts arranged around the connector to be inspected and the probe easily interfere with each other, and the layout of the printed circuit board may be restricted in order to prevent the interference.

Therefore, the present disclosure provides a probe in which the layout of the printed circuit board is less likely to be restricted.

The probe according to one aspect of the present disclosure is a probe used for inspecting the electrical characteristics of a connector, which is formed in a columnar shape, has one end and the other end, and has an inner housing through which a coaxial cable is inserted. At the other end of the inner housing, an opening is formed that is electrically connected to the coaxial cable and extends to the outside of the inner housing, surrounds the probe pin, and exposes the tip of the probe pin. A plunger, a flange located at one end of the inner housing, a first spring that urges the inner housing away from the flange, and a tubular inner housing and first spring. It comprises an outer housing for accommodating and holding the plunger so that the area of the plunger in which the opening is formed is exposed to the outside.

In the probe according to one aspect of the present disclosure, since the first spring is housed in the outer housing, the diameter of the first spring is reduced as compared with the conventional probe. By reducing the radial dimension of the entire probe, it is possible to suppress interference between the parts arranged around the connector to be inspected and the probe. This makes it possible to provide a probe in which the layout of the printed circuit board is less likely to be restricted.

According to the present disclosure, it is possible to provide a probe in which the layout of a printed circuit board is less likely to be restricted.

It is a figure which shows the appearance of the probe in 1st Embodiment. 1 (a) is a perspective view, FIG. 1 (b) is a plan view, FIG. 1 (c) is a side view, and FIG. 1 (d) is a bottom view. It is sectional drawing which shows the structure of a probe among the cross sections along the line AA of FIG. 1 (b). It is an exploded perspective view which shows the structure of an inner housing. It is an exploded perspective view which shows the structure of an inner housing. It is a schematic diagram which shows the connection point of a probe and a connector in an enlarged manner. It is an exploded perspective view which shows the structure of a probe. It is a figure which shows an example of the state change of a probe. FIG. 7A is a cross-sectional view in an initial state, and FIG. 7B is a cross-sectional view in a stroke state. It is a figure which shows the appearance of the probe in the 2nd Embodiment. 8 (a) is a perspective view, FIG. 8 (b) is a plan view, FIG. 8 (c) is a side view, and FIG. 8 (d) is a bottom view. It is sectional drawing which shows the cross section along the line BB of FIG. 8 (b). It is sectional drawing which shows the structure of a probe enlarged. It is an exploded perspective view which shows the structure of a probe. It is a figure which shows the structure of the probe in the modification. 12 (a) is a side view, and FIG. 12 (b) is a cross-sectional view showing a cross section taken along the line CC of FIG. 12 (a). It is a figure which shows the structure of the probe in the modification. 13 (a) is a side view, and FIG. 13 (b) is a cross-sectional view showing a cross section taken along the line DD of FIG. 13 (a).

Hereinafter, embodiments will be described in detail with reference to the drawings. In the description, the same elements or elements having the same function are designated by the same reference numerals, and duplicate description will be omitted.

[First Embodiment]
FIG. 1 is a diagram showing the appearance of the probe 1 in the first embodiment. 1 (a) is a perspective view, FIG. 1 (b) is a plan view, FIG. 1 (c) is a side view, and FIG. 1 (d) is a bottom view. As shown in FIG. 1, the probe 1 is an instrument used for characteristic inspection of the connector 100. The connector 100 is, for example, a multi-core connector having a plurality of connection terminals. The connector 100 is arranged on a printed circuit board (not shown) and is electrically connected to the probe 1. Various components other than the connector 100 are arranged on the printed circuit board.

Hereinafter, the direction in which the probe 1 and the connector 100 are connected is referred to as a Z-axis direction. Of the Z-axis directions, the direction in which the connector 100 (and the printed circuit board (not shown)) viewed from the probe 1 is located is "downward", and the probe 1 viewed from the connector 100 (and the printed circuit board (not shown)) is located. The direction is called "up". The probe 1 has a substantially columnar shape extending in the Z-axis direction as a whole. Both the shape of the probe 1 viewed in a plan view in the Z-axis direction (see FIG. 1 (b)) and the shape of the probe 1 in a bottom view in the Z-axis direction (see FIG. 1 (d)) are close to a rectangle. The direction along the long side of the rectangle is called the X-axis direction. The direction orthogonal to the X-axis and the Z-axis is called the Y-axis direction. The X-axis, Y-axis, and Z-axis are orthogonal to each other. Further, the surface of the probe 1 that is visually recognized when the probe 1 is viewed in a plan view is referred to as an upper surface, and the surface of the probe 1 that is visually recognized when the probe 1 is viewed from the bottom surface is referred to as a bottom surface. Further, the surface of the probe 1 parallel to the Z-axis direction is referred to as a side surface.

The probe 1 is arranged upward when viewed from the connector 100. When the probe 1 and the connector 100 are connected, an upward pressing force (hereinafter referred to as "external force") is applied to the probe 1 from the outside. The state in which no external force is applied to the probe 1 is called the initial state, and the state in which the external force is applied is called the stroke state. FIG. 1 is a diagram showing a probe 1 in an initial state.

FIG. 2 is a diagram showing the configuration of the probe 1. FIG. 2 is a cross-sectional view showing a cross section taken along the line AA of FIG. 1 (b). The probe 1 includes a metal cap 12, a flange 13, a first spring 14, an inner housing 15, a probe pin 16, a second spring 17, a plunger 18, and an outer housing 19. The probe 1 is connected to the inspection equipment by the coaxial cable 11.

The coaxial cable 11 is a conductor coated with an insulator extending in the Z-axis direction. The coaxial cable 11 is electrically connected to the probe pin 16. Here, "electrically connected" is only when the coaxial cable 11 and the probe pin 16 are electrically connected by physically directly connecting the coaxial cable 11 and the probe pin 16. Rather, the coaxial cable 11 and the probe pin 16 are indirectly connected via a conductive component (for example, a metal rod, wiring, etc.) arranged between the coaxial cable 11 and the probe pin 16 to be coaxial. This includes the case where the cable 11 and the probe pin 16 are electrically connected. The probe 1 is configured to include a plurality of (for example, 10) coaxial cables 11.

The flange 13 has a main body portion that is a substantially rectangular plate-shaped component for fixing the probe 1 to the inspection equipment. The main body portion of the flange 13 is arranged at the upper end portion 15a of the inner housing 15 described later. The main body portion of the flange 13 has a top surface 13a and a bottom surface 13b. A through hole 13c is formed in the flange 13 from the center of the upper surface 13a to the center of the bottom surface 13b. When the upper surface 13a is viewed in a plan view or the bottom surface 13b is viewed in a plan view, the region where the through hole 13c is formed is hollowed out in a circular shape. Further, in the main body portion of the flange 13, a pair of stupid holes 13d are formed from the upper surface 13a to the bottom surface 13b at both ends along the X-axis direction so as to sandwich the through hole 13c. The flange 13 fixes the probe 1 to the inspection equipment by screwing it through the stupid hole 13d. The stupid hole 13d may be a so-called screw hole.

The upper surface 13a of the flange 13 fixes a rod-shaped pin 132 formed separately from the above-mentioned substantially rectangular plate-shaped main body portion. The pin 132 has an upper end portion 132a which is an end portion extending upward and a lower end portion 132b fixed to the flange 13 (see FIG. 7A).

The flange 13 has an annular portion 131 formed separately from the substantially rectangular plate-shaped main body portion described above. The annulus portion 131 is an annulus plate-shaped component, and is composed of a highly slidable member such as a polyacetal resin. The annular portion 131 has an upper surface 131a and a lower surface 131b. The annular portion 131 is arranged so that the upper surface 131a of the annular portion 131 and the bottom surface 13b of the main body portion of the flange 13 are in contact with each other. Further, the annular portion 131 is arranged along the outer periphery of the through hole 13c of the main body portion of the flange 13 (so as to surround the through hole 13c).

The flange 13 is formed with a communication hole 13e from the upper surface 13a of the main body portion to the bottom surface 131b of the annular portion 131. A plurality (for example, four) communication holes 13e are formed at predetermined intervals along the circumferential direction of the annular portion 131. The rib 19d of the outer housing 19, which will be described later, is inserted into the communication hole 13e from the bottom surface 131b.

The first spring 14 is a coil spring. The first spring 14 is arranged between the annular portion 131 and the inner housing 15. The first spring 14 urges the inner housing 15 in a direction away from the flange 13. In the initial state, the first spring 14 applies a downward urging force to the inner housing 15 from the bottom surface 131b of the annular portion 131. The inner housing 15 is urged away from the flange 13 by the first spring 14, so that the inner housing 15 is kept in the initial position at a predetermined distance from the flange 13. In the stroke state, the first spring 14 is in a state of being contracted in the Z-axis direction. The first spring 14 surrounds the side surface 151d of the first body 151, which will be described later.

The inner housing 15 is formed in a columnar shape, has an upper end portion 15a and a lower end portion 15b, and inserts a coaxial cable 11. The upper end portion (one end portion) 15a includes not only the upper end portion but also the vicinity of the upper end portion (the region near the upper end portion). Similarly, the lower end portion (the other end portion) 15b includes not only the lower end portion but also the vicinity of the lower end portion (the region near the lower end portion).

3 and 4 are exploded perspective views showing the configuration of the inner housing 15. The inner housing 15 has a first body 151, a second body 152, a third body 153, a substrate 154, and an insulator 155.

The first body 151 is formed in the shape of a bottomed cylinder and accommodates the second body 152. The first body 151 has an upper surface 151a and a side surface 151d. The upper end of the first body 151 is closed by the upper surface 151a. A plurality of through holes 151c into which the coaxial cable 11 is inserted are formed on the upper surface 151a. A coaxial cable 11 is inserted into each through hole 151c. An opening 151b is formed at the lower end of the first body 151 (see FIG. 4). The first body 151 receives the second body 152 through the opening 151b and accommodates the second body 152. The side surface 151d faces the inner peripheral surface 19f of the outer housing 19 described later (see FIG. 2B).

The inner housing 15 further has a protrusion 1511. The protrusion 1511 is provided at the lower end of the first body 151, is arranged so as to surround the outer periphery of the first body 151, and fixes the first body 151 and the outer housing 19. The projecting portion 1511 surrounds the outer periphery of the side surface 151d, has the side surface 151d as a base end, and is formed so as to project outward in a circular plate shape. The protrusion 1511 has a top surface 1511a, a bottom surface 1511b, and a tip surface 1511c erected in the Z-axis direction from the top surface 1511a to the bottom surface 1511b. The upper surface 1511a faces the bottom surface 131b of the annular portion 131 and sandwiches the first spring 14 (see FIG. 2B). The tip surface 1511c is a surface formed on the protruding tip. The tip surface 1511c is in contact with and fixed to the inner peripheral surface 19f (see FIG. 2B).

The projecting portion 1511 is formed so as to project from the side surface 151d of the first body 151 toward the inner peripheral surface 19f of the outer housing 19. The inner housing 15 and the outer housing 19 are fixed by contacting and fixing the tip surface 1511c of the protruding portion 1511 and the inner peripheral surface 19f of the outer housing 19. The inner housing 15 is fixed to the outer housing 19 by press fitting, for example.

The first spring 14 urges the inner housing 15 in a direction away from the flange 13 by urging the protrusion 1511 in a direction away from the flange 13. In this way, by urging the protrusion 1511 by the first spring 14, the urging force of the first spring 14 can be applied to the inner housing 15 and the outer housing 19.

The second body 152 is formed in a columnar shape and is housed in the first body 151. The second body 152 has an upper surface 152a, a lower surface 152b, and a side surface 152d erected in the Z-axis direction from the upper surface 152a to the bottom surface 152b. A plurality of through holes 152c are formed in the second body 152 from the upper surface 152a to the bottom surface 152b. The plurality of through holes 152c communicate with the plurality of through holes 151c of the first body 151. In the second body 152, for example, an insulator containing a conductive component (metal rod or metal pin) is arranged in the through hole 152c, and the coaxial cable 11 and the substrate 154 are arranged via the conductive component. Relay electrical connections between. The side surface 152d is in contact with the inner peripheral surface of the first body 151. The second body 152 is fixed in the first body 151 by the side surface 152d in contact with the inner peripheral surface of the first body 151.

The third body 153 is formed in a columnar shape and holds the second body 152 with the first body 151. The third body 153 has an upper surface 153a, a bottom surface 153b, a support portion 153f, and a side surface 153g erected in the Z-axis direction from the upper surface 153a to the bottom surface 153b. The third body 153 is formed with a two-step stepped hole 153c from the upper surface 153a to the lower surface 153b. The third body 153 is provided with a first step 153d and a second step 153e by a two-step stepped hole 153c. The first step 153d is a surface formed in a region closer to the side surface of the third body 153. The second step 153e is a surface formed by recessing a region near the center of the first step 153d. The substrate 154 is arranged on the first stage 153d. In a state where the substrate 154 is arranged in the first stage 153d, a gap is generated between the substrate 154 and the second stage 153e. The central portion of the second step 153e is penetrated by the stepped hole 153c. The support portion 153f is formed in a square cylinder shape and holds the insulator 155. The support portion 153f extends downward with the outer periphery of the region where the stepped hole 153c is formed on the bottom surface 153b as a base end. An opening is formed at the tip of the support portion 153f (see FIG. 4). The cavity in the support portion 153f communicates with the stepped hole 153c in the bottom surface 153b. The side surface 153g faces the inner peripheral surface 19f of the outer housing 19 described later (see FIG. 2B). The support portion 153f surrounds the side surface of the insulator 155 and fixes the insulator 155.

The substrate 154 electrically connects the coaxial cable 11 and the probe pin 16 to each other. The substrate 154 is arranged so as to be sandwiched between the second body 152 and the third body 153. The substrate 154 has a top surface 154a and a bottom surface 154b. The upper surface 154a faces the bottom surface 152b of the second body. The substrate 154 electrically connects the coaxial cable 11 and the probe pin 16 to each other via the wiring provided on the upper surface 154a and the bottom surface 154b (see FIG. 2B). By such wiring, the substrate 154 can electrically connect the coaxial cable 11 and the probe pin 16 to each other even when the pitch of the coaxial cable 11 and the pitch of the probe pin 16 are different.

The insulator 155 is formed in a prismatic shape, and includes the probe pins 16 so that the probe pins 16 are exposed from both end faces. The upper end of the insulator 155 fits into the stepped hole 153c and faces the bottom surface 154b of the substrate 154. The lower end of the insulator 155 is exposed downward from the tip of the support portion 153f.

Returning to FIG. 2 (b), the probe pin 16 is a needle-shaped conductive component (for example, a pogo pin). The probe pin 16 is electrically connected to the coaxial cable 11 at the lower end portion 15b of the inner housing 15 and extends to the outside of the inner housing 15. The probe pin 16 is held by the inner housing 15 and is arranged so as to extend along the Z-axis direction. The probe pin 16 is electrically connected to the coaxial cable 11 by being connected to the substrate 154 at the lower end portion 15b of the inner housing 15. Further, the probe pin 16 extends to the outside of the inner housing 15 and is connected to the connector 100 (see FIG. 5).

The second spring 17 is a coil spring. The second spring 17 is arranged between the inner housing 15 and the plunger 18. The second spring 17 urges the plunger 18 in a direction away from the protrusion 1511 (see FIG. 3). In the initial state, the second spring 17 applies a downward urging force to the plunger 18 from the bottom surface 1511b (see FIG. 3) of the protrusion 1511. In the stroke state, the second spring 17 is in a state of being contracted in the Z-axis direction. The second spring 17 surrounds the side surface 153 g of the third body 153.

The plunger 18 positions the connector 100 when the probe 1 is connected to the connector 100. The plunger 18 has a shape in which a square tube is arranged in the center of one side of a disk. The plunger 18 has a top surface 18a, a bottom surface 18b, and a fitting portion 18c. Further, the plunger 18 is formed with an opening 18d capable of exposing the tip of the probe pin 16. The upper surface 18a faces the lower surface 153b of the third body 153. Further, the upper surface 18a faces the bottom surface 1511b (see FIG. 3) of the protruding portion 1511 and sandwiches the second spring 17. The bottom surface 18b faces the inner bottom 19g of the outer housing 19, which will be described later. The fitting portion 18c is formed in a square cylinder shape and is fitted with the connector 100. The fitting portion 18c is formed so as to project downward with the bottom surface 18b as a base end. An opening 18d is formed at the tip of the fitting portion 18c. The plunger 18 is formed with a cavity penetrating from the upper surface 18a to the opening 18d. The fitting portion 18c surrounds the periphery of the probe pin 16 by surrounding the support portion 153f (see FIG. 3). The tip (lower end) portion of the fitting portion 18c has a tapered shape (the tapered portion 18e is formed) so that the thickness becomes thinner (the opening shape becomes larger) toward the tip. The tapered portion 18e serves as a guide for aligning the probe 1 with respect to the connector 100.

FIG. 5 is an enlarged schematic view showing a connection portion between the probe 1 and the connector 100. As shown in FIG. 5, the tip of the probe pin 16 faces the connector 100 in the Z-axis direction. The probe pin 16 is surrounded by the fitting portion 18c. The tapered portions 18e are formed so as to be continuous with the tip of the fitting portion 18c, and are provided with, for example, a pair in the X-axis direction and a pair in the Y-axis direction. When the tapered portion 18e approaches the connector 100 in the Z-axis direction, the tapered portion 18e adjusts the position of the connector 100 along the inclination.

Returning to FIG. 2B, the plunger 18 is moved from the first position in the plunger 18 so as not to expose the tip of the probe pin 16 from the opening 18d in the plunger 18 and from the opening 18d in the plunger 18 according to the elastic force of the second spring 17. It is movable to and from a second position that exposes the tip of the probe pin 16. In the initial state, the upper surface 18a of the plunger 18 and the bottom surface 153b of the third body 153 are separated from each other. Further, the plunger 18 is arranged at a first position in which the tip of the probe pin 16 is not exposed from the opening 18d in the plunger 18. Specifically, the tip of the probe pin 16 extends downward, but does not reach the region where the opening 18d in the plunger 18 is formed. In the stroke state, the upper surface 18a and the bottom surface 153b are in contact with each other, so that the upward movement of the plunger 18 is restricted. In this state, the plunger 18 has moved from the opening 18d in the plunger 18 to a second position where the tip of the probe pin 16 is exposed. In other words, as the plunger 18 moves to the second position, the tip of the probe pin 16 reaches the region where the opening 18d in the plunger 18 is formed.

The outer housing 19 is formed in a cylindrical shape to accommodate the inner housing 15 and the first spring 14, and holds the plunger 18 so that the region of the plunger 18 in which the opening 18d is formed is exposed to the outside. The outer housing 19 has, for example, a bottomed cylindrical shape. An opening 19a is formed at the upper end of the outer housing 19. Further, the lower end of the outer housing 19 is closed by the bottom surface 19b. The outer housing 19 has a base 19c (see FIG. 6) and ribs 19d (see FIG. 6) formed so as to surround the outer periphery of the inner housing 15 in a region near the lower end of the outer housing 19. The rib 19d is a plate-shaped protrusion provided so as to extend upward with the base portion 19c as a base end. A plurality (for example, four) ribs 19d are provided at predetermined intervals along the circumferential direction of the base portion 19c. The rib 19d is inserted into the communication hole 13e of the flange 13 and the stepped hole 12c of the metal cap 12 described later.

The outer housing 19 is formed with an inner bottom 19g, which is a surface facing the bottom surface 18b of the plunger 18. In the outer housing 19, a through hole 19e is formed from the center of the inner bottom 19g to the center of the bottom surface 19b. The fitting portion 18c of the plunger 18 is inserted into the through hole 19e from the inner bottom 19g, so that the fitting portion 18c is exposed to the outside (downward).

The inner surface of the base 19c of the outer housing 19 and the inner peripheral surface 19f including the inner surface of the rib 19d continuous from the inner surface face the side surface 151d and the side surface 153g of the inner housing 15. In the initial state, the inner bottom 19g of the outer housing 19 and the bottom surface 18b of the plunger 18 are in contact with each other. In the stroke state, the inner bottom 19g and the bottom surface 18b are separated from each other.

The metal cap 12 is a substantially rectangular parallelepiped part. The metal cap 12 is arranged so as to surround the inner housing 15 at the upper end portion 15a of the inner housing. The metal cap 12 has a top surface 12a and a bottom surface 12b. The metal cap 12 is formed with a stepped hole 12c along the Z-axis direction from the center of the upper surface 12a to the center of the bottom surface 12b. The diameter of the stepped hole 12c on the upper surface 12a is smaller than the diameter of the stepped hole 12c on the bottom surface 12b. The stepped hole 12c on the bottom surface 12b communicates with the communication hole 13e on the top surface 13a of the flange 13. A step 12d is formed at the change in diameter of the stepped hole 12c. The tip of the rib 19d of the outer housing 19 is in contact with the step 12d. When the top surface 12a is viewed in a plan view or the bottom surface 12b is viewed in a bottom view, the region where the stepped hole 12c is formed is hollowed out in a circular shape.

A pin hole 12e is formed in the bottom surface 12b of the metal cap 12. The pin hole 12e is formed from the bottom surface 12b toward the top surface 12a (upward), but does not reach the top surface 12a (does not penetrate). A hole bottom 12g is formed in the deepest part of the pin hole 12e. A pin 132 is arranged in the pin hole 12e. In the initial state, the upper end 132a of the pin 132 abuts on the hole bottom 12g (see FIG. 7A). In the stroke state, the upper end 132a of the pin 132 is separated from the hole bottom 12g (see FIG. 7B).

FIG. 6 is an exploded perspective view showing the configuration of the probe 1. FIG. 6 shows an example of the appearance when each component constituting the probe 1 is disassembled along the Z-axis direction. As shown in FIG. 6, the coaxial cable 11, the metal cap 12, the flange 13, the first spring 14, the inner housing 15, the second spring 17, the plunger 18, and the outer housing 19 are sequentially arranged along the Z axis. line up.

The bottom surface 12b of the metal cap 12 faces the top surface 13a of the flange 13. The upper surface 131a of the annular portion 131 is in contact with the lower surface 13b of the flange 13. The bottom surface 131b of the annular portion 131 faces the upper surface 1511a of the protruding portion 1511 of the inner housing 15 with the first spring 14 interposed therebetween. The bottom surface 1511b of the protrusion 1511 faces the top surface 18a of the plunger 18 with the second spring 17 interposed therebetween. The bottom surface 18b of the plunger 18 faces the opening 19a of the outer housing 19.

The first spring 14 and the second spring 17 are arranged on concentric axes. Here, the concentric axis means that the radial center of the first spring 14 and the radial center of the second spring 17 are on the same axial line. The axial straight line is a straight line along the Z-axis direction.

Hereinafter, an example of assembling the probe 1 will be described. A coaxial cable 11 is inserted into the upper end portion 15a of the inner housing 15. The lower end portion 15b of the inner housing 15 holds the probe pin 16.

The outer housing 19 accommodates the plunger 18, the second spring 17, the inner housing 15, and the first spring 14 in order from the opening 19a along the Z-axis direction. The tip of the fitting portion 18c of the plunger 18 is inserted into the through hole 19e of the outer housing 19 so as to be exposed to the outside. The outer housing 19 holds the plunger 18 so that the region of the plunger 18 in which the opening 18d is formed is exposed to the outside. The bottom surface 18b of the plunger 18 is in contact with the inner bottom 19g of the outer housing 19 and is not exposed to the outside of the outer housing 19.

The support portion 153f of the inner housing 15 is inserted into the fitting portion 18c from the upper surface 18a of the plunger 18. The probe pin 16 is exposed outward from the opening 18d in the plunger 18 downward.

The rib 19d of the outer housing 19 is inserted into the communication hole 13e from the bottom surface 131b of the annular portion 131 and fitted to the flange 13. The outer housing 19 cooperates with the flange 13 to house the plunger 18, the second spring 17, the inner housing 15, and the first spring 14 inside. By accommodating each component in this way, the outer housing 19 can protect each component inside and suppress interference between the component and the component arranged around the connector 100 to be inspected. .. Further, the rib 19d is inserted into the stepped hole 12c from the bottom surface 12b of the metal cap 12 and comes into contact with the step 12d.

The upper end portion 15a of the inner housing 15 is inserted into the through hole 13c from the bottom surface 13b of the flange 13 and fitted to the flange 13. Further, the upper end portion 15a of the inner housing 15 is inserted into the stepped hole 12c from the bottom surface 12b of the metal cap 12.

[stroke]
FIG. 7 is a diagram showing an example of a state change of the probe 1. FIG. 7A is a cross-sectional view in an initial state, and FIG. 7B is a cross-sectional view in a stroke state.

As shown in FIG. 7A, in the initial state, the upper end portion 132a of the pin 132 abuts on the hole bottom 12g. By abutting in this way, the movement of the probe 1 in the X-axis, Y-axis, and Z-axis directions is fixed, so that the initial position of the probe 1 is determined. Specifically, at the initial position of the probe 1, the position of the metal cap 12 with respect to the flange 13 is determined. Further, since the movement of the rib 19d of the outer housing 19 in contact with the step 12d of the metal cap 12 is restricted, the initial position of the outer housing 19 is determined. Further, since the movement of the inner housing 15 press-fitted into the outer housing 19 is restricted, the initial position of the inner housing 15 is determined. Further, the plunger 18 is arranged at a first position in which the tip of the probe pin 16 is not exposed from the opening 18d in the plunger 18.

As shown in FIG. 7B, the outer housing 19 moves upward in the stroke state. Since the rib 19d of the outer housing 19 is in contact with the step 12d of the metal cap 12, the metal cap 12 is pushed by the rib 19d, and the metal cap 12 also moves upward. Further, the upper end portion 132a of the pin 132 is separated from the hole bottom 12g, and a gap is formed inside the pin hole 12e. As a result, the probe 1 becomes movable in the X-axis, Y-axis, and Z-axis directions. This makes it possible for the probe 1 to adjust the misalignment between the probe 1 and the connector 100. Further, the plunger 18 moves from the opening 18d in the plunger 18 to a second position where the tip of the probe pin 16 is exposed. At this time, the probe pin 16 is connected to the connector 100.

In one example, the spring constant of the first spring 14 is smaller than the spring constant of the second spring 17. When an external force is applied to the probe 1, the first spring 14 elastically deforms faster than the second spring 17. In other words, the first spring 14 contracts in the Z-axis direction faster than the second spring 17. When the first spring 14 is elastically deformed and the second spring 17 is not elastically deformed, the plunger 18 is in a first position that does not expose the tip of the probe pin 16 from the opening 18d in the plunger 18. The first spring 14 adjusts the misalignment between the probe 1 and the connector 100 in a state of being contracted in the Z-axis direction. After that, when an external force is further applied to the probe 1, the second spring 17 contracts in the Z-axis direction. At this time, the plunger 18 moves to the second position, and the tip of the probe pin 16 is exposed. By elastically deforming the first spring 14 and the second spring 17 in such an order, the axial deviation can be adjusted while the tip of the probe pin 16 is protected.

[Effect of this embodiment]
The probe 1 according to one aspect of the present embodiment is a probe 1 used for inspecting the electrical characteristics of the connector 100, is formed in a columnar shape, has one end portion 15a and the other end portion 15b, and is a coaxial cable. The inner housing 15 through which the 11 is inserted, the probe pin 16 that is electrically connected to the coaxial cable 11 at the other end 15b of the inner housing 15, and the probe pin 16 that extends to the outside of the inner housing 15, and the periphery of the probe pin 16. A plunger 18 having an opening 18d that allows the tip of the probe pin 16 to be exposed, a flange 13 arranged at one end 15a of the inner housing 15, and the inner housing 15 in a direction away from the flange 13. The plunger 18 is formed in a tubular shape and accommodates the first spring 14 to be urged and the inner housing 15 and the first spring 14, and the plunger 18 is exposed so that the region of the plunger 18 in which the opening 18d is formed is exposed to the outside. The outer housing 19 for holding is provided.

In the probe 1 according to one aspect of the present embodiment, the tip of the probe pin 16 is arranged so as to be exposed from the opening 18d formed in the plunger 18 at the other end portion 15b of the columnar inner housing 15. , The probe pin 16 and the connector 100 are in a connectable state. Further, the flange 13 is arranged at one end 15a of the inner housing 15, and the inner housing 15 is urged in the direction away from the flange 13 by the first spring 14, so that the inner housing 15 is flanged. It is kept in the initial position with a predetermined interval from 13. The inner housing 15 and the first spring 14 are housed in the tubular outer housing 19, and the plunger 18 that exposes the tip of the probe pin 16 from the opening 18d is held by the outer housing 19. While protecting each component inside the housing 19, interference between each component and components arranged around the connector 100 to be inspected can be suppressed. Further, since the first spring 14 is housed in the outer housing 19, the diameter of the first spring 14 is reduced as compared with the conventional probe. By reducing the radial dimension of the entire probe 1, it is possible to suppress interference between the component arranged around the connector 100 to be inspected and the probe 1. This makes it possible to provide the probe 1 in which the layout of the printed circuit board is less likely to be restricted.

In the probe 1, the probe 1 is further provided with a protrusion 1511 arranged so as to surround the outer periphery of the inner housing 15 and fixing the inner housing 15 and the outer housing 19, and the first spring 14 separates the protrusion 1511 from the flange 13. By urging in the direction, the inner housing 15 is urged away from the flange 13. The protrusion 1511 fixed so as to surround the outer periphery of the inner housing 15 is urged by the first spring 14 in a direction away from the flange 13, so that the inner housing 15 is indirectly urged. As a result, the urging force of the first spring 14 can be applied to the inner housing 15 while reducing the size of the inner housing 15.

In the probe 1, the projecting portion 1511 is formed so as to project from the side surface of the inner housing 15 toward the inner peripheral surface 19f of the outer housing 19, and the tip surface 1511c of the projecting portion 1511 and the inner peripheral surface 19f of the outer housing 19 are formed. The inner housing 15 and the outer housing 19 are fixed by being in contact with and fixed to each other. According to such a configuration, the urging force by the first spring 14 can be applied to the inner housing 15 and the outer housing 19.

In the probe 1, a second spring 17 for urging the plunger 18 in a direction away from the protrusion 1511 is further provided, and the plunger 18 is a probe from the opening 18d in the plunger 18 according to the elastic force of the second spring 17. It is movable between the first position where the tip of the pin 16 is not exposed and the second position where the tip of the probe pin 16 is exposed from the opening 18d in the plunger 18. According to such a configuration, the plunger 18 is urged by the second spring 17. The plunger 18 is made movable between the first position where the probe pin 16 is not exposed from the opening 18d and the second position where the probe pin 16 is exposed, depending on the elastic force of the second spring 17. As a result, since the probe pin 16 is not exposed from the opening 18d of the plunger 18 except when the connector 100 is inspected, the probe 1 that protects the probe pin 16 from impact can be provided.

In the probe 1, the first spring 14 and the second spring 17 are arranged on concentric axes. With such a configuration, the diameters of the first spring 14 and the second spring 17 are minimized. By further reducing the radial dimension of the entire probe 1, it is possible to suppress interference between the components arranged around the connector 100 to be inspected and the probe 1, which limits the layout of the printed circuit board. A difficult probe 1 can be provided.

In the probe 1, the spring constant of the first spring 14 is smaller than the spring constant of the second spring 17. According to such a configuration, when a stroke is performed during the inspection of the connector 100, the first spring 14 elastically deforms faster than the second spring 17. Specifically, after the axial deviation is adjusted by the first spring 14, the tip of the probe pin 16 is adjusted so as to be exposed by the second spring 17. This makes it possible to provide the probe 1 capable of adjusting the axial deviation while the tip of the probe pin 16 is protected.

In the probe 1, the inner housing 15 has a substrate 154 that electrically connects the coaxial cable 11 and the probe pin 16 to each other. According to such a configuration, even when the pitch of the coaxial cable 11 and the pitch of the probe pin 16 are different, it is possible to provide the probe 1 in which the difference in pitch can be easily adjusted by wiring the substrate 154. ..

[Second embodiment]
FIG. 8 is a diagram showing the appearance of the probe 2 in the second embodiment. 8 (a) is a perspective view, FIG. 8 (b) is a plan view, FIG. 8 (c) is a side view, and FIG. 8 (d) is a bottom view. The probe 2 is an instrument used for inspecting the electrical characteristics of the connector 100. Hereinafter, the difference between the probe 2 and the probe 1 (first embodiment) will be mainly described. The probe 2 does not include the outer housing 19, and its radial dimensions are further reduced than those of the probe 1.

FIG. 9 is a diagram showing the configuration of the probe 2. FIG. 9 is a cross-sectional view showing a cross section taken along the line BB of FIG. 8 (b). The probe 2 includes a metal cap 12, a flange 23, a first spring 14, an inner housing 25, a probe pin 16, a second spring 17, a plunger 18, and a holding portion 29. The probe 2 is connected to the inspection equipment by the coaxial cable 11.

The flange 23 is a plate-shaped component for fixing the probe 2 to the inspection equipment. The flange 23 is arranged at the upper end portion 25a of the inner housing 25, which will be described later. The flange 23 has a top surface 23a and a bottom surface 23b. The upper surface 23a faces the bottom surface 12b of the metal cap 12 and fixes the lower end portion 132b of the pin 132. In the initial state, the upper surface 23a is in contact with the bottom surface 12b. A through hole 23c is formed in the flange 23 from the upper surface 23a to the bottom surface 23b. When the upper surface 23a is viewed in a plan view or the bottom surface 23b is viewed in a plan view, the region where the through hole 23c is formed is hollowed out in a circular shape. Further, the flange 23 is formed with a plurality of stupid holes 23d from the upper surface 23a to the bottom surface 23b. The flange 23 fixes the probe 2 to the inspection equipment by screwing it through the stupid hole 23d.

The flange 23 has an annular portion 231 formed as a separate body. The annulus portion 231 is an annulus plate-shaped component, and is composed of a highly slidable member such as a polyacetal resin. The annular portion 231 has an upper surface 231a and a bottom surface 231b. The annular portion 231 is arranged so that the upper surface 231a of the annular portion 231 and the bottom surface 23b of the flange 23 are in contact with each other. Further, the annular portion 231 is arranged along the outer periphery of the through hole 23c (so as to surround the through hole 23c).

The first spring 14 is arranged between the annular portion 231 and the inner housing 25. The first spring 14 urges the inner housing 25 in a direction away from the flange 23. In the initial state, the first spring 14 applies a downward urging force to the inner housing 25 from the bottom surface 231b of the annular portion 231. The inner housing 25 is urged away from the flange 23 by the first spring 14, so that the inner housing 25 is kept in the initial position at a predetermined distance from the flange 23. In the stroke state, the first spring 14 is in a state of being contracted in the Z-axis direction.

The inner housing 25 is formed in a columnar shape, has an upper end portion 25a and a lower end portion 25b, and inserts the coaxial cable 11. The upper end portion (one end portion) 25a includes not only the upper end portion but also the vicinity of the upper end portion (the region near the upper end portion). Similarly, the lower end portion (the other end portion) 25b includes not only the lower end portion but also the vicinity of the lower end portion (the region near the lower end portion).

The inner housing 25 has a first body 151, a second body 152, a third body 153, a substrate 154, and an insulator 155.

FIG. 10 is an enlarged cross-sectional view showing the structure of the probe 2 with respect to the range E in FIG. 9B. The third body 153 further has a fixing portion 253h. The fixing portion 253h is in contact with the tip of the rib 29d of the holding portion 29, which will be described later, to fix the rib 29d. The fixed portion 253h is a recess provided in a region near the outer periphery of the bottom surface 153b at the lower end portion 25b.

The probe pin 16 is electrically connected to the coaxial cable 11 at the lower end portion 25b of the inner housing 25 and extends to the outside of the inner housing 25. The probe pin 16 is held by the inner housing 25 and is arranged along the Z-axis direction. The probe pin 16 is electrically connected to the coaxial cable 11 by being connected to the substrate 154 at the lower end portion 25b of the inner housing 25. Further, the probe pin 16 extends to the outside of the inner housing 25 and is connected to the connector 100.

As shown in FIG. 9, the second spring 17 is arranged between the inner housing 25 and the plunger 18. The second spring 17 is arranged concentrically with the first spring 14 and urges the plunger 18 in a direction away from the inner housing 25. In the initial state, the second spring 17 applies a downward urging force to the plunger 18 from the bottom surface 1511b of the protrusion 1511. In the stroke state, the second spring 17 is in a state of being contracted in the Z-axis direction. The second spring 17 surrounds the side surface 153 g of the third body 153.

A plurality of through holes 28f are formed in the plunger 18 from the upper surface 18a to the bottom surface 18b. The rib 29d of the holding portion 29, which will be described later, is inserted into the through hole 28f from the bottom surface 28b.

The holding portion 29 is fixed to the lower end portion 25b of the inner housing 25, and holds the plunger 18 with the inner housing 25 so that the region of the plunger 18 in which the opening 18d is formed is exposed to the outside. The holding portion 29 has, for example, a disk shape. As shown in FIG. 10, the holding portion 29 has a top surface 29a, a bottom surface 29b, and a rib 29d. The rib 29d is a plate-shaped protrusion provided so as to extend upward with the outer periphery of the upper surface 29a as the base end. A plurality (for example, four) ribs 29d are provided at predetermined intervals along the circumferential direction of the upper surface 29a. The rib 29d is inserted into the through hole 28f of the plunger 18. The tip of the rib 29d is in contact with and fixed to the fixing portion 253h of the third body 153. In one example, the rib 29d is provided so as to be continuous with the side surface 153g of the third body 153. A through hole 29c is formed in the holding portion 29 from the center of the upper surface 29a to the center of the bottom surface 29b. By inserting the fitting portion 18c of the plunger 18 into the through hole 29c from the upper surface 29a, the fitting portion 18c is exposed to the outside (downward). Since the plunger 18 is held between the inner housing 25 and the holding portion 29 fixed to the inner housing 25, the diameter of the holding portion 29 that holds the plunger 18 can be minimized.

The upper surface 29a of the holding portion 29 faces the bottom surface 18b of the plunger 18. In the initial state, the upper surface 29a of the holding portion 29 and the bottom surface 18b of the plunger 18 are in contact with each other. In the stroke state, the upper surface 29a and the bottom surface 18b are separated from each other.

FIG. 11 is an exploded perspective view showing the configuration of the probe 2. FIG. 11 shows an example of the appearance when each component constituting the probe 2 is disassembled along the Z-axis direction. As shown in FIG. 11, the coaxial cable 11, the metal cap 12, the flange 23, the first spring 14, the inner housing 25, the second spring 17, the plunger 18, and the holding portion 29 are sequentially arranged downward. line up.

The bottom surface 12b of the metal cap 12 faces the top surface 23a of the flange 23. The upper surface 231a of the annular portion 231 is in contact with the bottom surface 23b of the flange 23. The bottom surface 231b of the annular portion 231 faces the upper surface 1511a of the protruding portion 1511 of the inner housing 25 with the first spring 14 interposed therebetween. The bottom surface 1511b of the protrusion 1511 faces the top surface 18a of the plunger 18 with the second spring 17 interposed therebetween. The bottom surface 18b of the plunger 18 faces the top surface 29a of the holding portion 29.

[Effect of this embodiment]
The probe 2 according to one aspect of the present embodiment is a probe 2 used for inspecting the electrical characteristics of the connector 100, is formed in a columnar shape, has one end 25a and the other end 25b, and is a coaxial cable. The inner housing 25 through which the 11 is inserted, the probe pin 16 that is electrically connected to the coaxial cable 11 at the other end 25b of the inner housing 25, and the probe pin 16 that extends to the outside of the inner housing 25, and the periphery of the probe pin 16. A plunger 18 having an opening 18d that allows the tip of the probe pin 16 to be exposed, a flange 23 arranged at one end 25a of the inner housing 25, and the other end 25b of the inner housing 25. The holding portion 29 that holds the plunger 18 between the inner housing 25 and the holding portion 29 that is fixed and the region where the opening 18d is formed in the plunger 18 is exposed to the outside, and the inner housing 25 is urged in a direction away from the flange 23. The plunger 18 comprises a first spring 14 and a second spring 17, which is arranged concentrically with the first spring 14 and urges the plunger 18 away from the inner housing 25. The first position in which the tip of the probe pin 16 is not exposed from the opening 18d in the plunger 18 and the second position in which the tip of the probe pin 16 is exposed from the opening 18d in the flanger 18 according to the elastic force of the spring 17. It is possible to move between.

In the probe 2 according to one aspect of the present embodiment, the tip of the probe pin 16 is arranged so as to be exposed from the opening 18d formed in the plunger 18 at the other end portion 25b of the columnar inner housing 25. , The probe pin 16 and the connector 100 are in a connectable state. At the other end 25b, the plunger 18 is held between the holding portion 29 and the inner housing 25. Further, the flange 23 is arranged at one end 25a of the inner housing 25, and the inner housing 25 is urged in the direction away from the flange 23 by the first spring 14, so that the inner housing 25 is flanged. It is kept in the initial position with a predetermined interval from 23. Further, the plunger 18 is urged away from the inner housing 25 by the second spring 17 arranged concentrically with the first spring 14. Since the first spring 14 and the second spring 17 are arranged on the concentric axis, the diameters of the first spring 14 and the second spring 17 can be minimized. Further, the plunger 18 receives the urging force of the second spring 17, and depending on the elastic force of the second spring 17, the plunger 18 has a first position in which the probe 2 is not exposed from the opening 18d and a second position in which the probe 2 is exposed. It is considered to be movable between. Further, since the plunger 18 is held between the inner housing 25 and the holding portion 29 fixed to the inner housing 25, the diameter of the holding portion 29 for holding the plunger 18 can be minimized. From this, it is possible to suppress the interference between the probe 2 and the component arranged around the connector 100 to be inspected, and it is possible to provide the probe 2 in which the layout of the printed circuit board is less likely to be restricted.

[Modification example]
Although the embodiments have been described above, the present disclosure is not necessarily limited to the above-described embodiments, and various changes can be made without departing from the gist thereof.

The probe 1 does not have to include the second spring 17. The plunger 18 may be fixed at a second position that exposes the tip of the probe pin 16 from the opening 18d in the plunger 18.

It has been explained that the protruding portion 1511 has a side surface 151d as a base end and protrudes outward in a circular plate shape, but the present invention is not limited to this.

FIG. 12 is a diagram showing the structure of the probe 1 in the modified example. 12 (a) is a side view, and FIG. 12 (b) is a cross-sectional view showing a cross section taken along the line CC of FIG. 12 (a). The protruding portion 1511 is formed so as to project from the inner peripheral surface 19f of the outer housing 19 toward the side surface 151d of the inner housing 15, and the tip surface 1511c of the protruding portion 1511 and the side surface 151d of the inner housing 15 are in contact with each other and fixed. Thereby, the inner housing 15 and the outer housing 19 may be fixed. According to such a configuration, the urging force by the first spring 14 can be applied to the inner housing 15 and the outer housing 19.

FIG. 13 is a diagram showing the structure of the probe 1 in the modified example. 13 (a) is a side view, and FIG. 13 (b) is a cross-sectional view showing a cross section taken along the line DD of FIG. 13 (a). The protruding portion 1511 is formed so as to connect the inner peripheral surface 19f of the outer housing 19 and the side surface 151d of the inner housing 15, and the outer housing 19 and the inner housing 15 are integrally formed so that the inner housing 15 is formed. And the outer housing 19 may be fixed. According to such a configuration, the urging force by the first spring 14 can be applied to the inner housing 15 and the outer housing 19. Further, since the inner housing 15 and the outer housing 19 are integrally formed, the step of fixing the protruding portion 1511 to the inner housing 15 or the outer housing 19 becomes unnecessary.

1 ... probe, 2 ... probe, 11 ... coaxial cable, 12 ... metal cap, 13 ... flange, 14 ... first spring, 15 ... inner housing, 15a ... upper end (one end), 15b ... lower end (lower end) The other end), 151d ... side surface, 16 ... probe pin, 17 ... second spring, 18 ... plunger, 18d ... opening, 19 ... outer housing, 19f ... inner peripheral surface, 23 ... flange, 25 ... inner housing, 25a ... upper end (one end), 25b ... lower end (the other end), 29 ... holding, 100 ... connector, 154 ... board, 1511 ... protruding, 1511c ... tip surface.

Claims (10)

A probe used to inspect the characteristics of connectors.
An inner housing that is formed in a columnar shape and has one end and the other end through which a coaxial cable is inserted.
A probe pin that is electrically connected to the coaxial cable at the other end of the inner housing and extends to the outside of the inner housing.
A plunger having an opening that surrounds the probe pin and exposes the tip of the probe pin.
A flange arranged at the one end of the inner housing,
A first spring that urges the inner housing away from the flange,
An outer housing formed in a cylindrical shape to accommodate the inner housing and the first spring, and to hold the plunger so that the region of the plunger in which the opening is formed is exposed to the outside.
A probe equipped with. It is arranged so as to surround the outer periphery of the inner housing, and further includes a protrusion for fixing the inner housing and the outer housing.
The first spring urges the inner housing in a direction away from the flange by urging the protrusion in a direction away from the flange.
The probe according to claim 1. The protruding portion is formed so as to project from the side surface of the inner housing toward the inner peripheral surface of the outer housing, and the tip end surface of the protruding portion and the inner peripheral surface of the outer housing are in contact with each other and fixed. The probe according to claim 2, wherein the inner housing and the outer housing are fixed to the inner housing. The protruding portion is formed so as to project from the inner peripheral surface of the outer housing toward the side surface of the inner housing, and the tip surface of the protruding portion and the side surface of the inner housing are in contact with each other and fixed. The probe according to claim 2, wherein the inner housing and the outer housing are fixed. The protruding portion is formed so as to connect the inner peripheral surface of the outer housing and the side surface of the inner housing, and the outer housing and the inner housing are integrally formed so that the inner housing and the inner housing are integrally formed. The probe according to claim 2, which fixes the outer housing. Further provided with a second spring that urges the plunger away from the protrusion.
The plunger has a first position in which the tip of the probe pin is not exposed from the opening in the plunger and a second position in which the tip of the probe pin is exposed from the opening in the plunger according to the elastic force of the second spring. Movable to and from the position of,
The probe according to any one of claims 2 to 5. The probe according to claim 6, wherein the first spring and the second spring are arranged on a concentric axis. A probe used to inspect the characteristics of connectors.
An inner housing that is formed in a columnar shape and has one end and the other end through which a coaxial cable is inserted.
A probe pin that is electrically connected to the coaxial cable at the other end of the inner housing and extends to the outside of the inner housing.
A plunger having an opening that surrounds the probe pin and exposes the tip of the probe pin.
A flange arranged at the one end of the inner housing,
A holding portion that holds the plunger between the inner housing and the inner housing so that a region fixed to the other end of the inner housing and formed with the opening in the plunger is exposed to the outside.
A first spring that urges the inner housing away from the flange,
A second spring arranged concentrically with the first spring and urging the plunger in a direction away from the inner housing.
Equipped with
The plunger has a first position in which the tip of the probe pin is not exposed from the opening in the plunger and a second position in which the tip of the probe pin is exposed from the opening in the plunger according to the elastic force of the second spring. Movable to and from the position of,
probe. The probe according to any one of claims 6 to 8, wherein the spring constant of the first spring is smaller than the spring constant of the second spring. The probe according to any one of claims 1 to 9, wherein the inner housing has a substrate for electrically connecting the coaxial cable and the probe pin to each other.

Images