JP2022042975A - Height measurement system and method for sphere - Google Patents

Abstract

To provide a height measuring system for a sphere.SOLUTION: A height measurement system for a sphere comprises a bird's eye view imaging device, a side face imaging device, and a processing device. The bird's eye view imaging device images a bird's eye view image of a sphere inspection object to obtain the bird's eye view image of the sphere. The side face imaging device images a side face image of the sphere inspection object to obtain the side face image of the sphere. The processing device is electrically connected to the bird's eye view imaging device and the side face imaging device, and defines a sphere top feature and a sphere projection borderline on the bird's eye view image of the sphere and on the side face image of the sphere. In this step, the processing device defines, as a first reference width, a distance between the sphere top feature and the sphere projection borderline on the bird's eye view image of the sphere, and defines, as second reference width, a distance between the sphere top feature and the sphere projection borderline on the side face image of the sphere, thereby height of the sphere inspection object is obtained.SELECTED DRAWING: Figure 1

Description

The present invention relates to a sphere height measurement system, and more particularly to a sphere height measurement system that acquires the height of a sphere from a two-dimensional image.

In the current market, the solder quality of solder balls in a ball grid array is inspected mainly by four basic methods. The four methods are measurement with a confocal chromatic sensor, X-ray inspection, penetrant inspection, and cross-section polisher method.

Of the above four measurement methods, measurement with a confocal chromatic sensor and X-ray inspection are non-destructive inspections, and when analyzing the solder of solder balls in a ball grid array, the inspection is performed without destroying the solder balls. Can be completed. The measurement by the confocal chromatic sensor measures the distance from the inspection object to the lens precisely by the wavelength of the reflected light, and analyzes the structure of the solder ball and the quality of the solder. The X-ray inspection machine irradiates the inspection object with X-rays, and the inspection machine displays a different gray scale based on the difference in the capacity of the X-rays absorbed by the inspection object.

The penetrant inspection test and the cross-section polisher method are destructive and are usually used for defective substrates that cannot be solved by non-destructive inspection. The final inspection is performed on defective products, and the yield rate is improved based on the inspection results. In the penetrant inspection, the test liquid is poured into the bottom of the module equipped with the ball grid array, and after removing the module equipped with the ball grid array from the board by utilizing the characteristic that the test liquid penetrates into small cracks. , Inspect the distribution of penetrants on the solder. In the cross-section polisher method, first, an electric appliance is used to check if there is a problem with the solder balls, and then only the problematic solder balls are sliced and a detailed inspection of the cross-sectional structure is performed.

A main object of the present invention is to provide a method for measuring the height of a sphere for measuring a sphere inspection object. The height measurement method of the sphere is to determine the boundary line between the sphere top feature and the sphere projection on the sphere bird's-eye view image and the sphere side image, and the boundary line between the sphere top feature and the sphere projection on the sphere bird's-eye view image. The first reference width and the second reference width are defined by defining the space between the first reference width and the boundary line between the sphere top feature on the sphere side image and the sphere projection as the second reference width. Includes obtaining the height of the sphere of the sphere inspection object from.

Another object of the present invention is to provide a computer-readable recording medium containing a computer program in which the above-mentioned method for measuring the height of a sphere is completed after being read and executed by a processing device or a computer. ..

Another object of the present invention is a computer program product that can be stored in a computer-readable recording medium, and after being read and executed by a processing device or a computer, the above-mentioned method for measuring the height of a sphere is completed. Is to provide.

Another object of the present invention is to provide a height measuring system for a sphere. The height measurement system for the sphere includes a bird's-eye view image pickup device, a side view image pickup device, and a processing device. The bird's-eye view image pickup device captures a bird's-eye view image of a sphere inspection object and acquires a bird's-eye view image of the sphere. The side image pickup device captures a side image of the object to be inspected by the sphere and acquires a side image of the sphere. The processing device is electrically connected to the bird's-eye view image pickup device and the side image pickup device, and defines a sphere top feature and a boundary line of sphere projection on the bird's-eye view image of the sphere and the side image of the sphere. Among them, the processing device defines the distance between the sphere top feature on the sphere bird's-eye view image and the boundary line of the sphere projection as the first reference width, and also defines the sphere top feature on the sphere top image. By defining the space between the boundaries of the sphere projection as the second reference width, the height of the sphere inspection object is obtained.

As described above, the present invention uses a camera of an existing automatic optical inspection facility to inspect a sphere inspection object or a sphere component on the inspection object, and the height of the sphere and other reference data. Can be measured.

It is explanatory drawing which shows the Example of the height measuring system of the sphere of this invention. It is a figure which shows the simple appearance of the Example of the height measuring system of the sphere of this invention. It is a figure which shows the simple appearance of the other embodiment of the height measuring system of the sphere of this invention. It is a figure (1) which shows the sphere bird's-eye view image of this invention. It is a figure (1) which shows the side image of a sphere of this invention. It is a figure (1) which shows the cross section of the sphere inspection object of this invention. It is a figure (2) which shows the cross section of the sphere inspection object of this invention. It is a figure (2) which shows the sphere bird's-eye view image of this invention. It is a figure (2) which shows the side image of a sphere of this invention. It is a figure (3) which shows the cross section of the sphere inspection object of this invention. It is a flowchart which shows the Example of the height measuring method of the sphere of this invention.

The detailed technical contents of the present invention will be described with reference to the drawings. Since these drawings are for illustration purposes, they are not drawn according to actual ratios and do not limit the technical scope of the present invention.

FIG. 1 is an explanatory diagram showing an embodiment of the height measurement system for a sphere of the present invention. FIG. 2 is a diagram showing a simplified appearance of an embodiment of the height measuring system for a sphere of the present invention.

This embodiment is a sphere height measurement system 100 for measuring a sphere inspection object BT. The height measurement system 100 of the sphere is installed as an independent inspection table or directly on an optical automatic visual inspection device (Automatic Optical Injection Apparatus) to perform optical inspection on the inspection target, and at the same time, from the image of the inspection target. Although it is possible to acquire each data of the spherical component, the present invention does not limit the arrangement method thereof.

The height measurement system 100 for a sphere includes an inspection table 10, a bird's-eye view image pickup device 20, a side view image pickup device 30, and a processing device 40 electrically connected to the bird's-eye view image pickup device 20 and the side view image pickup device 30.

The inspection table 10 is mainly used for installing the sphere inspection object BT and adjusting the relative positional relationship between the sphere inspection object BT, the bird's-eye view image pickup device 20, and the side view image pickup device 30. In the embodiment of the present invention, the inspection table 10 may be a jig, and the spherical inspection object BT is fixed on the table with the jig, and a specific angle of the inspection object is adjusted to the imaging position. In another embodiment, the inspection table 10 may use a vacuum pump device that adsorbs the inspection target object, whereby dust, debris, etc. on the surface of the inspection target object can be removed. In another embodiment, the inspection table 10 may be a mobile device (for example, a mobile loading platform or a robot arm), and the moving device may move the sphere inspection object BT from the collection point or the collection pallet to the photographing position. In addition to these examples, the inspection table may be any table on which the sphere inspection object BT can be installed, and the present invention is not limited to these.

The sphere inspection object BT is not limited to the spherical shape of the inspection object body. The sphere inspection object BT has a spherical portion on the structure or a partial structure of the object. In practice, there may be a plurality of spheres on the sphere inspection object BT or the sphere inspection object BT, and measurement is performed on a plurality of spheres after taking a picture once. The present invention does not limit the arrangement of the quantity of these sphere inspection objects BT and spheres.

In the embodiment of the present invention, the inspection table 10 further includes a camera moving device 50 (for example, an XY stage, a robot arm, etc.). In addition to being used to install and move the bird's-eye view image pickup device 20 and / or the side view image pickup device 30, the bird's-eye view image pickup device 20 and the side view image pickup device 30 are installed on the same table, and the bird's-eye view image pickup device 20 and the side view image pickup device 30 are installed on the table. By adjusting the shooting direction of, the focus of the bird's-eye view image pickup device 20 and the side view image pickup device 30 is adjusted to the same position.

The bird's-eye view image pickup device 20 is installed on the bird's-eye view direction side of the inspection table 10 and acquires a bird's-eye view image of the sphere by taking a bird's-eye view of the sphere inspection target BT. The bird's-eye view direction side is a position near directly above the inspection table, and the shooting direction of the bird's-eye view image pickup device 20 is perpendicular to the plane on which the inspection table 10 or the inspection object of the sphere is located (error ± 5 degrees). ). The bird's-eye view image pickup device 20 photographs the BT of the spherical inspection object on the inspection table 10. The bird's-eye view image pickup device 20 includes, but is not limited to, a color camera and the like. In the embodiment of the present invention, the bird's-eye view image pickup device 20 is a plane scan camera or a line scan camera, but the present invention is not limited to these.

The side image pickup device 30 is installed on the side surface direction side of the inspection table 10 and acquires a side image of the sphere by taking a side image of the sphere inspection object BT. The side surface direction side is a position diagonally upper side of the inspection table, and the side image pickup device 30 acquires a side surface image of the sphere by photographing the sphere inspection object from the oblique direction. The imaging direction of the side image pickup device and the vertical direction of the inspection table or the vertical angle of the plane on which the spherical inspection object is located are between 0 degrees and 180 degrees, and the present invention does not limit this. The side image pickup device 30 photographs the BT of the spherical inspection object on the inspection table 10. The side image pickup device 30 includes, but is not limited to, a color camera and the like. In the embodiment of the present invention, the side image pickup device 30 is a plane scan camera or a line scan camera, but the present invention is not limited to these.

The processing device 40 may be a computer, a server, an automatic control device, or other device or equipment having an image processing function, and is not limited thereto in the present invention. In the embodiment of the present invention, the processing device 40 includes a CPU 41 and a storage 42 installed in accordance with the CPU 41. In the embodiment of the present invention, the CPU 41 and the storage 42 can be jointly configured as a computer or a processing machine, and may be, for example, a personal computer, a workstation, or other type of computer or CPU, and the types thereof are not limited here. The CPU 41 is, for example, a CPU (Central Processing Unit, CPU), or other programmed general or special purpose microprocessor (Microprocessor), digital signal processor (Digital Signal Processor, DSP), programmable controller, integrated circuit for special use (SP). It may be an Application Special Integrated Circuits (ASIC), a programmable logic device (Programmable Logic Device, PLD), a device similar thereto, or a combination thereof.

The processing device 40 acquires a sphere bird's-eye view image and a sphere side surface image of the sphere inspection object BT from the bird's-eye view image pickup device 20 and the side image pickup device 30, and obtains a sphere top top feature and a sphere projection from the image features of the sphere bird's-eye view image and the sphere side image. Set boundaries. Then, the data of the sphere is acquired from the feature of the upper part of the sphere, and the height of the sphere of the sphere inspection object BT is calculated from the data.

In the embodiment of the present invention, the processing device 40 sets the sphere top feature on the basis of the visual feature of the sphere inspection object BT. For example, set the position, size, and coverage range of the sphere top feature based on the ratio of the coverage area based on the boundary line of the sphere projection, or print, ink marks, stripes, etc. directly on the sphere. However, the present invention is not limited to these.

FIG. 3 is a diagram showing a simplified appearance of another embodiment of the height measuring system for a sphere of the present invention. In this embodiment, the present invention further comprises a light source output device 60. The light source output device 60 irradiates the top of the sphere inspection object BT to form the sphere top feature. The light source output device 60 described here is a coaxial light source installed in accordance with the bird's-eye view image pickup device in this embodiment. In addition to the coaxial light source, the light source output device 60 may be a point light source or a ring-shaped light source, and the form of the light source is not limited to these in the present invention. Further, the smaller the area of the feature on the top of the sphere that the light source irradiates on the BT of the sphere inspection object, the more accurately the height of the sphere can be obtained.

By the method described above, the sphere top feature S1 and the sphere top feature S2 can be formed on the sphere bird's-eye view image A1 and the sphere side image A2, respectively. For the calculation method for determining the height of the sphere, refer to FIG. 4 and FIG. 5 showing a bird's-eye view image of the sphere and FIG. 5 showing a side image of the sphere of the present invention.

The processing device 40 acquires the sphere top feature from the sphere bird's-eye view image A1 and the sphere side image A2, and then acquires the width T of the sphere top feature and the width of the sphere projection area B from the sphere bird's-eye view image A1. The side width S of the sphere is acquired from A2, and the height H of the sphere is calculated from these numerical values.

As for the sphere bird's-eye view image A1, as shown in FIG. 4, after the processing device 40 acquires the sphere bird's-eye view image A1, the first reference is between the sphere top top feature S1 on the sphere bird's-eye view image A1 and the boundary line E1 of the sphere projection. The width is defined as W1. In the embodiment of the present invention, the sampling point of the sphere top feature S1 boundary line sampling point SP1 and the sampling point of the sphere projection boundary E1 on the line M1 passing through the boundary line E1 of the sphere top feature S1 and the sphere projection boundary line E1. Set SP2 and acquire the first reference width W1. In the situation where the coaxial light source is output, the projection shadow area SH1 is formed at the bottom of the sphere inspection object BT, and the boundary line E1 of the sphere projection becomes the edge of the sphere.

As for the sphere side image A2, as shown in FIG. 5, after the processing device 40 acquires the sphere side image A2, the second reference is between the sphere top feature S2 on the sphere side image A2 and the boundary line E2 of the sphere projection. The width is defined as W2 (shown in FIG. 6). In the embodiment of the present invention, the sampling point SP3 of the sphere top feature S2 boundary line and the sampling point SP4 of the sphere projection boundary line E2 are set on the line M2 passing through the sphere top feature S2 and the sphere projection boundary line E2. Then, the sphere side surface width S is acquired, and the second reference width W2 is further acquired from the sphere side surface width S. In this embodiment, the boundary line E2 of the sphere projection is an image of the sphere inspection object BT including the projection shadow area SH1, and the sampling point SP4 takes a sample on the boundary line of the projection shadow area SH1. In the situation of rational optical arrangement, the error generated in the projection shadow area SH1 can be made extremely small, or the edge of the direct sphere inspection object BT can be set as the boundary line E2 of the sphere projection, but this is used in the present invention. Not limited.

It should be particularly explained here that the first reference width W1 and the second reference width W2 should be modified by applying them to formulas and variables based on the shooting angles and distances of the bird's-eye view image pickup device 20 and the side view image pickup device 30. However, this part is not limited by the present invention and is not described in detail here. The bird's-eye view imager 20 cannot always be completely perpendicular to the surface of the inspection table 10, and this may be ignored or corrected by formulas and variables within a reasonable error, and this part may be corrected. The present invention is not limited to this and will not be described in detail here.

For the calculation method of the height of the sphere, also refer to FIG. 6 (1) showing a cross section of the sphere inspection object of the present invention. In this embodiment, the sphere is in a situation where the optical axis direction OX of the side image pickup device 30 and the line CL connecting the boundary line of the sphere projection from the feature of the top of the sphere of the sphere inspection object on the cross-sectional view are substantially vertical. The second reference width W2 can be calculated by multiplying the distance and the ratio of the side width S (shown in FIG. 5). Subsequently, the height H of the sphere can be obtained from the first reference width W1 and the second reference width W2.

The processing device 40 acquires the first reference width W1 and the second reference width W2 of the sphere inspection object BT from the sphere bird's-eye view image and the sphere side view image, and then acquires the height H of the sphere of the sphere inspection object BT from here. be able to. The processing device 40 obtains the height H of the sphere of the sphere inspection object BT based on the Pythagorean theorem or trigonometric function between the first reference width W1, the second reference width W2, and the height H of the sphere. Specifically, the processing device 40 can obtain the height of the sphere inspection object from the following formula.

W2 ² = W1 ² + H ²

In the situation where the covering area of the feature area S3 on the top of the sphere is sufficiently small, the error that appears can be ignored.

FIG. 7 is a diagram (2) showing a cross section of the sphere inspection object of the present invention. In another embodiment, in a situation where the optical axis direction OX of the side image pickup device 30 and the line connecting the boundary line of the sphere projection from the feature of the top of the sphere of the sphere inspection object on the cross-sectional view are not vertical, the side image pickup is performed. The actual second reference width W2 can be obtained by modifying the width PW of the side surface of the sphere based on the angle of the device 30. Specifically, the processing device 40 has a projection width of the boundary line of the sphere projection (that is, the width of the side surface of the sphere) from the first reference width, the shooting angle α of the side image pickup device 30, and the feature of the top of the sphere in the side image of the sphere. Based on PW), the height H of the sphere of the sphere inspection object BT is acquired. In the actual calculation process, the projection angle A is obtained from the shooting angle α of the side image of the sphere, the second reference width W2 is calculated using the projection angle A, the width S of the side surface of the sphere, and the first reference width W1, and finally. The height H of the sphere is obtained from the first reference width W1 and the second reference width W2. It should be noted that since the sphere inspection object BT has a symmetrical or asymmetrical shape, the first reference width W1 and the second reference width W2 are used for two data on the same side on the same cross section in order to obtain accurate numerical values. Calculation is performed based on (for example, sampling point SP2 and sampling point SP4 are on the same position of the sphere inspection object BT). It is noted here that the present invention does not rule out situations where the sphere test object BT is approximately symmetric or within acceptable error, and these examples are also within the scope of the present invention.

In another embodiment of the invention, the height of the sphere can be calculated by directly setting the center of the sphere top feature at the sampling point. Please also refer to FIGS. 8 and 9, a diagram (2) showing a bird's-eye view of the sphere of the present invention, and a diagram (2) showing a side image of the sphere of the present invention.

As shown in FIG. 8, after acquiring the sphere bird's-eye view image A1, the processing device 40 obtains the first reference width W3 between the center of the sphere top top feature S1 on the sphere bird's-eye view image A1 and the boundary line E1 of the sphere projection. get. A sampling point SP5 is installed at the center of the feature S1 at the top of the sphere, a sampling point SP6 on the boundary line E1 of the sphere projection is installed at an arbitrary position on the boundary line E1 of the sphere projection, and a distance between the sampling points SP5 and SP6. The first reference width W3 is obtained by calculating. In the presence of a coaxial light source, a projection shadow area SH2 is formed at the bottom of the sphere inspection object BT, and the boundary line E1 of the sphere projection becomes the edge of the sphere.

As shown in FIG. 9, after the processing device 40 acquires the sphere bird's-eye view image A2, the processing device 40 obtains the second reference width W4 between the center of the sphere top top feature S2 on the sphere bird's-eye view image A2 and the boundary line E2 of the sphere projection. get. In the embodiment of the present invention, the sampling point SP7 is installed at the center of the sphere top feature S2, and the line M3 passing through the center of the sphere and the center of the sphere top feature S2 of the sphere bird's-eye view image A2 and the boundary line E2 of the sphere projection. The intersection of the two is set as the sampling point SP8, and the width S'of the side surface of the sphere is obtained by calculating the distance between the sampling points SP7 and SP8. Further, the second reference width W4 is obtained from the width S'of the side surface of the sphere. In this embodiment, the boundary line E2 of the sphere projection is an image of the sphere inspection object BT including the projection shadow area SH2, and the sampling point SP8 takes a sample on the boundary line of the projection shadow area SH2. In the situation of rational optical arrangement, the error generated in the projection shadow area SH2 can be made extremely small, or the edge of the direct sphere inspection object BT can be set as the boundary line E2 of the sphere projection, but this is used in the present invention. Not limited.

For the method of calculating the height of the sphere, also refer to FIG. 10 (3) showing a cross section of the sphere inspection object of the present invention. After the processing device 40 acquires the first reference width W3 and the second reference width W4 of the sphere inspection object BT from the sphere bird's-eye view image and the sphere side view image, the height H of the sphere of the sphere inspection object BT is acquired from here. be able to. The processing device 40 can obtain the height of the sphere of the sphere inspection object BT from the following formula.

W4 ² = W3 ² + H ²

In this equation, W3 indicates the first reference width, W4 indicates the second reference width, and H indicates the height of the sphere.

As in the previous example, the sphere inspection object BT does not always have a perfectly symmetrical shape, so in order to obtain accurate values, the first reference width W3 and the second reference width W4 are on the same side on the same cross section. Calculation is performed based on the two data in (for example, sampling point SP6 and sampling point SP8 are on the same position of the sphere inspection object BT). It is noted here that the present invention does not rule out situations where the sphere test object BT is approximately symmetric or within acceptable error, and these examples are also within the scope of the present invention.

Other embodiments of the present invention further provide a method for measuring the height of a sphere. FIG. 11 is a flowchart showing an embodiment of the height measuring method for a sphere of the present invention. The measurement method includes the following steps.

After the processing device receives the sphere bird's-eye view image and the sphere side view image, the boundary line between the sphere top top feature and the sphere projection is determined on the sphere bird's-eye view image and the sphere side view image (step S21). In this embodiment, in step S21, the sphere top feature can be formed by irradiating the top of the sphere inspection object with a light source. In another embodiment, step S21 can further generate the sphere top feature in the sphere bird's-eye view image and the sphere side image based on the visual feature of the sphere inspection object.

Subsequently, the processing device determines a first reference width between the feature on the top of the sphere and the boundary line of the projection of the sphere on the bird's-eye view image of the sphere (step S22). On the other hand, the processing apparatus determines a second reference width between the feature on the top of the sphere and the boundary line of the projection of the sphere on the side image of the sphere (step S23). In the embodiment of the present invention, the first reference width is the distance from the boundary line of the top feature of the sphere to the boundary line of the projection of the sphere in the bird's-eye view image of the sphere, and the second reference width is in the side image of the sphere. Is the distance from the boundary line of the sphere top feature in the above to the boundary line of the sphere projection. In another embodiment, the first reference width is the distance from the center of the sphere top feature in the sphere bird's-eye view image to the boundary line of the sphere projection, and the second reference width is the sphere side image. It is the distance from the center of the sphere top feature in the inside to the boundary line of the sphere projection.

The order of steps S22 and S23 described above is not determined before and after, and step S22 may be executed first and then step S23 may be executed, or steps S22 and S23 may be executed at the same time. The present invention does not limit this.

Finally, the processing apparatus acquires the height of the sphere of the sphere inspection object from the first reference width and the second reference width (step S24). In this embodiment, the processing apparatus inspects the sphere based on the first reference width, the shooting angle of the side image of the sphere, and the projection width of the boundary line of the projection of the sphere from the feature of the top of the sphere in the side image of the sphere. Get the height of the sphere of the object. Among them, the height of the sphere of the object to be inspected by the sphere is obtained by the Pythagorean theorem or trigonometric function between the first reference width, the second reference width and the height of the sphere. Specifically, the height of the sphere inspection object can be calculated from the following formula.

W2 ² = W1 ² + H ²

In this formula, W1 is the first reference width, W2 is the second reference width, and H is the height of the sphere. In the embodiment of the present invention, the second reference width W2 is the width from the feature of the sphere top in the sphere side image to the projection of the boundary line of the sphere projection based on the angle of the sphere side image and the first reference width W1. It can be obtained by modifying it.

The above method can be carried out using a computer-readable recording medium. The computer-readable recording medium described here includes, for example, read-only memory (read-only memory, ROM), flash memory, hard disk drive (HDD), floppy disk, optical disk, USB memory, magnetic tape, and network access. It is a database or a storage medium with equivalent functions that can be easily conceived by those skilled in the art. After the processing device or the computer reads and executes the program, the method of measuring the height of the sphere can be completed from step S21 to step S24 described above.

In addition to computer-readable recording media, the methods described above can also be implemented as computer program products published to HDDs and storage devices on network servers, such as appstore, group play, windows stores or other similar program release platforms. It is possible, and after the computer program is uploaded to the server, it can be executed by the user purchasing it and downloading it to the processing device or computer.

As described above, the present invention uses a camera in an existing automatic optical measurement facility to inspect a sphere to be inspected or a sphere on the inspected object, and obtains the height of the sphere and other reference data. Can be measured.

The above is a detailed description of the present invention. What is described herein is a preferred embodiment of the invention, which does not limit the scope of the invention, and any changes or additions made to the claims of the invention are also claims of the invention. It is within the range.

100 Sphere height measurement system 10 Inspection table 20 Overlooking image pickup device 30 Side view image pickup device 40 Processing device 41 CPU
42 Storage 50 Camera moving device 60 Light source output device BT Sphere inspection object A1 Sphere bird's-eye view image S1 Sphere top feature E1 Sphere projection boundary line SH1 Projection shadow area W1 First reference width M1 Line SP1 Sampling point SP2 Sampling point W3 1 Reference width SP5 Sampling point SP6 Sampling point A2 Sphere side image S2 Sphere top feature E2 Sphere projection boundary SH2 Projection shadow area W2 Second reference width M2 Line SP3 Sampling point SP4 Sampling point W4 Second reference width SP7 Sampling point SP8 Sampling point M3 line OX Optical axis direction CL line S Sphere side width PW Sphere side width α Shooting angle A Projection angle H Sphere height S11-S16 Step S21-S24 Step

Claims (15)

Sphere inspection A method for measuring the height of a sphere for measuring an object.
To define the boundary line between the sphere top feature and the sphere projection on the sphere bird's-eye view image and the sphere side image,
The first reference width is defined between the feature of the top of the sphere on the bird's-eye view image of the sphere and the boundary line of the projection of the sphere.
The second reference width is defined between the feature of the top of the sphere on the side image of the sphere and the boundary line of the projection of the sphere.
A method for measuring a height of a sphere, which comprises acquiring the height of the sphere of the sphere inspection object from the first reference width and the second reference width. The height of the sphere of the object to be inspected by the sphere is obtained based on the Pythagorean theorem or trigonometric function between the first reference width, the second reference width and the height of the sphere. The method for measuring the height of a sphere described in. The height of the sphere of the sphere inspection object is acquired based on the projection width of the boundary line of the sphere projection from the first reference width, the shooting angle of the sphere side image, and the feature of the top of the sphere in the sphere side image. The method for measuring the height of a sphere according to claim 1. The height measuring method for a sphere according to claim 1, wherein a light source irradiates the top of the sphere inspection object to form the top feature of the sphere. The height of the sphere according to claim 1, wherein the sphere top feature is set on the sphere bird's-eye view image and the sphere side image based on the visual characteristics of the sphere inspection object. Measurement method. The first reference width is the distance from the boundary line of the sphere top feature in the sphere bird's-eye view image to the boundary line of the sphere projection, and the second reference width is the boundary of the sphere top feature in the sphere side image. The method for measuring the height of a sphere according to claim 1, wherein the distance is from the line to the boundary line of the sphere projection. The first reference width is the distance from the center of the sphere top feature in the sphere bird's-eye view image to the boundary line of the sphere projection, and the second reference width is the distance of the sphere top feature in the sphere side image. The method for measuring the height of a sphere according to claim 1, wherein the distance is from the center to the boundary line of the sphere projection. A method for measuring the height of any sphere according to any one of claims 1 to 7, after the computer program is stored in a computer-readable recording medium, and the computer program is read and executed by a processing device or a computer. A computer-readable recording medium characterized by its realization. It is a height measurement system for spheres.
A bird's-eye view imager that takes a bird's-eye view of an object to be inspected and acquires a bird's-eye view of the sphere.
A side imager that takes a side image of an object to be inspected and acquires a side image of the sphere,
It is electrically connected to the bird's-eye view image pickup device and the side view image pickup device, and is provided with a processing device that defines a boundary line between a sphere top feature and a sphere projection on the bird's-eye view image of the sphere and the side view image of the sphere.
The processing device defines a first reference width between the sphere top feature on the sphere bird's-eye view image and the boundary line of the sphere projection, and the sphere top feature and the sphere projection on the sphere side image. A sphere height measurement system characterized by acquiring the height of a sphere inspection object by defining the space between the boundary lines as the second reference width. The processing apparatus is characterized in that the height of the sphere of the sphere inspection object is acquired based on the Pythagorean theorem or trigonometric function between the first reference width, the second reference width and the height of the sphere. The height measuring system for a sphere according to claim 9. The processing apparatus determines that the sphere of the sphere inspection object is based on the first reference width, the shooting angle of the sphere side image, and the projection width of the boundary line of the sphere projection from the feature of the top of the sphere in the sphere side image. The height measuring system for a sphere according to claim 9, wherein the height is acquired. 9. The sphere height measuring system further comprises a light source output device, wherein the light source output device forms the sphere top feature by irradiating the top of the sphere inspection object. The described sphere height measurement system. 9. The processing apparatus according to claim 9, wherein the processing apparatus includes setting the sphere top top feature on the sphere bird's-eye view image and the sphere side image based on the visual feature of the sphere inspection object. Sphere height measurement system. The first reference width is the distance from the boundary line of the sphere top feature in the sphere bird's-eye view image to the boundary line of the sphere projection, and the second reference width is the boundary of the sphere top feature in the sphere side image. The height measuring system for a sphere according to claim 9, wherein the distance is from the line to the boundary line of the sphere projection. The first reference width is the distance from the center of the sphere top feature in the sphere bird's-eye view image to the boundary line of the sphere projection, and the second reference width is the distance of the sphere top feature in the sphere side image. The height measuring system for a sphere according to claim 9, wherein the distance is from the center to the boundary line of the sphere projection.

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