CN114140372A - Sphere height measuring method, readable medium, computer program product and system - Google Patents

Sphere height measuring method, readable medium, computer program product and system Download PDF

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Publication number
CN114140372A
CN114140372A CN202110642042.5A CN202110642042A CN114140372A CN 114140372 A CN114140372 A CN 114140372A CN 202110642042 A CN202110642042 A CN 202110642042A CN 114140372 A CN114140372 A CN 114140372A
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Prior art keywords
sphere
view image
reference width
height
boundary
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Chinese (zh)
Inventor
邹嘉骏
林伯聪
黄冠勋
张勋豪
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Utechzone Co Ltd
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Utechzone Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Geometry (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention provides a sphere height measuring method, a readable medium, a computer program product and a system. The overlook camera device overlooks and shoots a sphere object to be measured so as to obtain an overlook image of the sphere. The side-looking camera device shoots the object to be measured of the sphere in a side-looking manner to obtain a side-looking image of the sphere. The processing device defines a top circle feature and a sphere projection boundary on the sphere top view image and the sphere side view image. The processing device defines a first reference width between the tip circle feature and the projection boundary of the sphere on the sphere top view image and defines a second reference width between the tip circle feature and the projection boundary of the sphere on the sphere side view image so as to obtain the sphere height of the sphere to be measured.

Description

Sphere height measuring method, readable medium, computer program product and system
Technical Field
The present invention relates to a system for measuring height of a sphere, and more particularly, to a method for measuring height of a sphere from a two-dimensional image, a readable medium and a measuring system.
Background
At present, four basic methods are mainly used in the market to measure the solder quality of solder balls in a solder Ball Array package (BGA), wherein the methods are a spectrum confocal sensor measurement method, an X-Ray measurement method, an infiltration red test and a slicing test respectively.
In the four measurement modes mentioned above, the spectroscopic confocal sensor measurement method and the X-Ray measurement method are non-destructive inspection methods, and when analyzing the solderability of the solder balls in the solder ball array package, the inspection can be completed without damaging the solder ball bodies. The spectral confocal sensor measuring method is mainly characterized in that the accurate distance from a measured object to a lens is obtained by measuring the wavelength of reflected light, and the structure and the weldability of a solder ball are analyzed; the X-Ray inspection machine actively irradiates the X-Ray on the object to be inspected, and the object to be inspected presents different gray scale degrees in the detector according to the energy difference of absorbing the X-Ray.
Both the penetration red test and the slicing method are destructive tests, and generally, a defective board which cannot be undone in a nondestructive test is used for final inspection of a defective product to improve the yield through the result of the inspection. The penetration dyeing test is mainly to fill the red lotion under the whole solder ball array packaging module, utilize the characteristic that the red lotion can penetrate into all tiny cracks, and then check the result of the red lotion distribution and solder balls after the solder ball array packaging module is pulled out from the circuit board. The slicing method mainly includes that the solder balls with problems are tested by an electric appliance, then the solder balls with problems are sliced independently, and the solder balls are inspected in detail through a section structure.
Disclosure of Invention
The main objective of the present invention is to provide a method for measuring the height of a sphere, which is used for measuring an object to be measured, and comprises: defining a vertex circle feature and a sphere projection boundary on a sphere top view image and a sphere side view image; defining a first reference width between the tip circle feature and the projection boundary of the sphere on the top view image of the sphere; defining a second reference width from the tip circle feature to the projection boundary of the sphere on the side view image of the sphere; and obtaining the sphere height of the sphere object to be measured through the first reference width and the second reference width.
The method for measuring a sphere height as described above, wherein optionally, the sphere height of the object to be measured is obtained according to a pythagorean theorem or a trigonometric function relationship among the first reference width, the second reference width and the sphere height.
The method for measuring a sphere height as described above, wherein optionally, the sphere height of the sphere object to be measured is obtained according to the first reference width, the capturing view angle of the side view image of the sphere, and the projection width from the top circle feature to the projection boundary of the sphere in the side view image of the sphere.
The method for measuring the height of the sphere as described above, optionally, includes illuminating the top of the spherical object to be measured with a light source to form the top circle feature.
The method for measuring the height of the sphere may optionally include generating the vertex feature in the top view image and the side view image of the sphere based on the visual feature of the object to be measured.
The method for measuring a height of a sphere as described above, wherein optionally, the first reference width is a distance between a boundary of the tip circle feature in the top view image of the sphere and a projection boundary of the sphere; wherein the second reference width is a distance between a boundary of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
The method for measuring a height of a sphere as described above, wherein optionally, the first reference width is a distance between a center of the vertex feature in the top view image of the sphere and a projection boundary of the sphere; wherein the second reference width is a distance between a center of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
Another objective of the present invention is to provide a non-transitory computer readable medium storing a computer program, which is loaded and executed by a processing device or a computer to implement the above-mentioned sphere height measuring method.
Another objective of the present invention is to provide a computer program product, which is suitable for being stored on a computer readable medium, and when the computer program product is loaded and executed by a processing device or a computer, the method for measuring the height of a sphere as described above is implemented.
Another objective of the present invention is to provide a system for measuring height of a sphere, which includes a looking-down camera, a side-looking camera, and a processing device. The overlook camera device overlooks and shoots a sphere object to be measured so as to obtain an overlook image of the sphere. The side-looking camera device shoots the object to be measured of the ball body in a side-looking mode to obtain a side-looking image of the ball body. The processing device is coupled to the top view camera device and the side view camera device, and defines a top circle feature and a sphere projection boundary on the sphere top view image and the sphere side view image. The processing device defines a first reference width between the tip circle feature and the projection boundary of the sphere on the sphere top view image and defines a second reference width between the tip circle feature and the projection boundary of the sphere on the sphere side view image so as to obtain the sphere height of the sphere to be measured.
The system for measuring a sphere height as described above, wherein the processing device optionally obtains the sphere height of the sphere dut according to a pythagorean theorem or a trigonometric function relationship among the first reference width, the second reference width and the sphere height.
The system for measuring a sphere height as described above, optionally, the processing device obtains the sphere height of the sphere object according to the first reference width, the shooting angle of the side-view camera device, and the projection width from the vertex circle feature to the sphere projection boundary in the side-view image of the sphere.
The system for measuring a height of a sphere as described above, optionally, further includes a light source device, wherein the light source device illuminates the top of the object to be measured of the sphere to form the top circle feature.
The system for measuring a height of a sphere as described above, wherein the processing device optionally forms the tip circle feature in the top view image and the side view image of the sphere based on the visible feature of the object to be measured.
The system for measuring the height of a sphere as described above, wherein optionally the first reference width is a distance between a boundary of the tip circle feature in the top view image of the sphere and a projection boundary of the sphere; wherein the second reference width is a distance between a boundary of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
The system for measuring the height of a sphere as described above, wherein optionally the first reference width is a distance between a center of the tip circle feature in the top view image of the sphere and a projection boundary of the sphere; wherein the second reference width is a distance between a center of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
In summary, the present invention can simply detect the spherical object or the spherical component on the object to be detected by the camera of the existing automatic optical detection device, and measure the height of the spherical object and other reference data.
Drawings
FIG. 1 is a block diagram of a sphere height measuring system according to an embodiment of the present invention.
FIG. 2 is a simplified external view of a ball height measuring system according to an embodiment of the present invention.
FIG. 3 is a simplified external view of a ball height measuring system according to a further embodiment of the present invention.
FIG. 4 is a schematic diagram (I) of a top view of a sphere in accordance with the present invention.
FIG. 5 is a side view of a sphere in accordance with the present invention.
FIG. 6 is a cross-sectional view of a spherical analyte according to the present invention.
FIG. 7 is a schematic cross-sectional view of a spherical analyte in accordance with the present invention (II).
Fig. 8 is a schematic diagram of a top view of a sphere in the present invention (ii).
Fig. 9 is a schematic diagram of a side view of a sphere in the present invention (ii).
FIG. 10 is a schematic cross-sectional view of a spherical analyte in accordance with the present invention (III).
FIG. 11 is a flowchart illustrating a method for measuring a height of a sphere according to another embodiment of the present invention.
Description of reference numerals:
100 sphere height measuring system
10 detection platform
20 overlook image pickup device
30 side-view camera device
40 treatment device
41 processor
42 storage unit
50 light source output device
BT sphere to be detected
A1 sphere overhead image
S1 tip circle feature
E1 sphere projection boundary
SH1 projection shadow zone
W1 first reference width
M1 central axis
SP1 sampling point
SP2 sampling point
W3 first reference width
SP5 sampling point
SP6 sampling point
A2 sphere side view image
S2 tip circle feature
E2 sphere projection boundary
SH2 projection shadow zone
W2 second reference width
M2 central axis
SP3 sampling point
SP4 sampling point
W4 second reference width
SP7 sampling point
SP8 sampling point
M3 central axis
Direction of optical axis of OX
CL online
Side view width of S-sphere
PW sphere side view width
Angle of view alpha
Angle of projection A
Height of H sphere
Detailed Description
The detailed description and technical contents of the present invention will be described below with reference to the accompanying drawings. Furthermore, for convenience of illustration, the drawings are not necessarily to scale, and the drawings and their proportions are not intended to limit the scope of the invention.
Fig. 1 and fig. 2 are a block diagram and an appearance simplified diagram of a sphere height measuring system according to an embodiment of the present invention.
The present embodiment discloses a sphere height measurement system 100 for measuring a sphere dut BT. The sphere height measuring system 100 may be configured as a single independent detection station, or in another feasible embodiment, configured directly on an Automatic Optical inspection apparatus (Automatic Optical inspection apparatus), so as to detect various data of a sphere component in an object to be detected through the acquired image of the object to be detected while optically detecting the object to be detected, which is not within the intended scope of the present invention.
The sphere height measuring system 100 mainly includes a testing platform 10, a top view camera 20, a side view camera 30, and a processing device 40 coupled to the top view camera 20 and the side view camera 30.
The inspection platform 10 is mainly used for disposing the ball dut BT and adjusting the relative position relationship among the ball dut BT, the overlook camera 20 and the side view camera 30. In a practical embodiment, the detection platform 10 may be a jig, and the spherical object to be measured BT is fixed on a fixed position of the platform through the jig, so that a specific angle of the object to be measured is aligned to the shooting position. In another possible embodiment, the testing platform 10 may be a vacuum device for absorbing the object to be tested and removing dust, debris, etc. on the surface of the object to be tested. In another possible embodiment, the detection platform 10 may also be a transfer device (e.g., a moving platform or a robot arm) that moves the spherical object BT from the collection station or the collection box to the shooting position. In addition to the above embodiments, the detection platform may also be any platform for disposing the spherical object to be measured BT, and is not limited in the present invention.
The spherical object BT is not limited to the shape of the object itself, but the spherical object BT may also be a component having a spherical shape on a structure or a part of the structure of the object, and it should be described first. In practical operation, the number of the spherical object to be detected BT or the number of the spherical objects on the spherical object to be detected BT can be plural, so that the detection of the plural spherical objects after one-time shooting is performed, and the arrangement of the spherical object to be detected BT and the number of the spherical objects is not limited in the present invention.
In a possible embodiment, the inspection platform 10 further includes a camera moving device 50 (e.g., an XY stage, a robot arm, etc.) for carrying and moving the top view camera 20 and/or the side view camera 30, or disposing the top view camera 20 and the side view camera 30 on the same platform, and adjusting the shooting directions of the top view camera 20 and the side view camera 30 on the platform so that the top view camera 20 and the side view camera 30 can be focused on the same position.
The overlook camera device 20 is disposed on an overlook azimuth side of the detection platform 10, and is configured to overlook the spherical object BT to obtain an overlook image of the spherical object. The overlooking azimuth side refers to a position near the top of the inspection platform, so that the shooting direction of the overlooking camera device 20 is orthogonal (error value + -5 degrees) to the plane where the inspection platform 10 or the spherical object to be inspected is located. The overhead camera 20 includes, but is not limited to, a color camera for photographing the spherical object BT on the inspection platform 10. In one embodiment, the image capturing device 10 can be a flat-Scan Camera (Area Scan Camera) or a Line Scan Camera (Line Scan Camera), but is not limited in the present invention.
The side-view camera device 30 is disposed on the side-view azimuth side of the detection platform 10, and is used for side-view shooting of the sphere object to be measured BT to obtain a sphere side-view image. The side-looking azimuth side refers to the position near the upper part of the detection platform, so that the side-looking camera device 30 can shoot the object to be measured of the sphere in an oblique direction to obtain the side-looking image of the sphere. The angle between the shooting direction of the side-looking camera device and the orthogonal direction of the detection platform or the orthogonal direction of the plane of the spherical object to be detected is between 0 and 180 degrees, which is not limited in the present invention. The side-view camera 30 includes, but is not limited to, a color camera for capturing a spherical object BT on the inspection platform 10. In one embodiment, the image capturing device 10 can be a flat-Scan Camera (Area Scan Camera) or a Line Scan Camera (Line Scan Camera), but is not limited in the present invention.
The processing device 40 may be a computer, a server, an automation control device, or any other device or device with an image processing function, and is not limited in the present invention. In one possible embodiment, the processing device 40 mainly includes a processor 41 and a storage unit 42 disposed in cooperation with the processor 41. In one possible embodiment, the processor 41 and the storage unit 42 may together form a computer or a processor, such as a personal computer, a workstation, a mainframe computer, or other types of computers or processors, and are not limited in kind herein. The Processor 41 may be, for example, a Central Processing Unit (CPU), or other Programmable general purpose or special purpose Microprocessor (Microprocessor), Digital Signal Processor (DSP), Programmable controller, Application Specific Integrated Circuit (ASIC), Programmable Logic Device (PLD), or other similar Device or combination thereof.
The processing device 40 obtains a sphere top view image and a sphere side view image of the sphere object BT through the top view camera 20 and the side view camera 30, defines a vertex feature and a sphere projection boundary in the image features of the sphere top view image and the sphere side view image, obtains a sphere parameter through the vertex feature, and further calculates the sphere height of the sphere object BT.
In an embodiment, the processing device 40 may set the vertex feature according to the visual feature of the spherical object BT as a reference, for example, set the position, size and coverage of the vertex feature according to the coverage area ratio by using the projection boundary of the sphere as a reference, or directly set the print, ink mark and stripe on the sphere as the vertex feature, which is not limited in the present invention.
Fig. 3 is a simplified external view of a sphere height measuring system according to an embodiment of the present invention. In another possible embodiment, the present invention may further include a light source device 60, which illuminates the top of the object BT to be measured of the sphere through the light source output device 60, so as to form the top circle feature. The light source output device 60 is a coaxial light source provided in cooperation with the overhead view camera device in the present embodiment; besides being coaxial light sources, the light source output device 60 can also be point light sources or ring light sources, and the types of the light sources are not intended to limit the scope of the present invention. Understandably, the smaller the area of the top circle feature mapped to the spherical object to be measured BT by the light source, the more accurate the obtained spherical height becomes.
In this way, the top-circle feature S1 and the top-circle feature S2 can be formed in the sphere top-view image a1 and the sphere side-view image a2, respectively. Regarding the calculation of the height of the sphere, please refer to fig. 4 and 5, which are schematic diagrams of a top view image (i) and a side view image (i) of the sphere according to the present invention.
After obtaining the top circle feature from the top view image a1 and the side view image a2, the processing device 40 obtains the top circle feature width T and the width of the projection area B from the top view image a1, obtains the side view width S from the side view image a2, and obtains the sphere height H from these values.
With respect to the sphere top view image a1, as shown in fig. 4, after obtaining the sphere top view image a1, the processing device 40 defines a first reference width W1 between the top circle feature S1 and the sphere projection boundary E1 on the sphere top view image a 1. In one possible embodiment, the first reference width W1 may be obtained by setting a sampling point SP1 of the boundary of the top circle feature S1 and a sampling point SP2 of the boundary of the sphere projection E1 on the axis M1 crossing the boundary of the top circle feature S1 and the boundary of the sphere projection E1. Under the condition of inputting the coaxial light source, the bottom side of the spherical object to be measured BT forms a shadow projection zone SH1, and the sphere projection boundary E1 is the sphere edge.
Regarding the sphere side view image a2, as shown in fig. 5, after obtaining the sphere side view image a2, the processing device 40 defines a second reference width W2 (shown in fig. 6) between the top circle feature S2 and the sphere projection boundary E2 on the sphere side view image a 2. In one possible embodiment, the side view width S of the sphere can be obtained by setting the sampling point SP3 of the boundary of the top circle feature S2 and the sampling point SP4 of the boundary of the sphere projection E2 on the axis M2 crossing the boundary of the top circle feature S2 and the boundary of the sphere projection E2, and then obtaining the second reference width W2 through the side view width S of the sphere. In the embodiment, the sphere projection boundary E2 is mainly an image of the sphere BT including the projected shadow SH1, and the sampling point SP4 is sampled to the boundary with the projected shadow SH 1. Under the condition of reasonable optical arrangement, the error generated by the shadow areas SH1 can also be minimized and the edge of the object BT to be measured can be directly used as the projection boundary E2 of the sphere, which is not limited in the present invention.
It should be noted that the first reference width W1 and the second reference width W2 must be corrected by substituting the correction formula and the correction parameters according to the shooting angles and distances of the top view camera 20 and the side view camera 30, which are not intended to limit the scope of the present invention and are not described in detail herein. Since the overlooking camera device 20 may not be completely orthogonal to the surface of the inspection platform 10, it can be ignored or corrected by the correction formula and the correction parameters within a reasonable error range, and the description of the part that is not the intended limitation of the present invention is not repeated.
Referring to fig. 6, a cross-sectional view (a) of the object to be measured is shown. In one embodiment, the second reference width W2 can be calculated from the distance matching ratio of the side view width S (as shown in fig. 5) of the sphere when the optical axis direction OX of the side view camera device 30 is substantially orthogonal to the online CL of the projection boundary of the top circle feature of the sphere to the sphere. Subsequently, the sphere height H can be obtained through the first reference width W1 and the second reference width W2.
After the processing device 40 obtains the first reference width W1 and the second reference width W2 of the sphere dut BT in the sphere top view image and the sphere side view image, the sphere height H of the sphere dut BT can be further obtained. The processing device 40 obtains the sphere height H of the sphere dut BT according to the pythagorean theorem or trigonometric function relationship among the first reference width W1, the second reference width W2 and the sphere height H. Specifically, the processing device 40 obtains the sphere height of the spherical object according to the following formula: w22In the case where the area covered by region S3 of the tip circle feature is small enough, the resulting error is substantially negligible.
In another embodiment, please refer to fig. 7, which is a cross-sectional view of the ball dut according to the present invention (ii). In the case that the optical axis direction OX of the side-view camera 30 and the connection of the top circle feature of the sphere to be measured to the sphere projection boundary are not orthogonal, the side-view width PW of the sphere can be corrected according to the viewing angle of the side-view camera 30 to obtain the actual second reference width W2. Specifically, the processing device 40 can obtain the sphere height H of the sphere dut BT according to the first reference width, the shooting angle α of the side-view camera 30, and the projection width from the vertex feature to the sphere projection boundary in the sphere side-view image (i.e. the sphere side-view width PW). In the actual operation process, the projection angle a is obtained from the shooting angle α of the side view image of the sphere, the second reference height W2 is calculated and obtained by using the projection angle a, the side view width S of the sphere and the first reference width W1, and finally the sphere height H is obtained from the first reference height W1 and the second reference height W2. It should be noted that, since the spherical object BT may be symmetrical or asymmetrical, in order to obtain accurate values, the first reference width W1 and the second reference width W2 should be calculated based on two sets of parameters on the same side of the same cross-sectional position (for example, the sampling point SP2 and the sampling point SP4 are located on the same position of the spherical object BT), but the present invention does not exclude the implementation under the condition that the spherical object BT is close to symmetrical or acceptable with reasonable error, and the embodiments should still fall within the scope of the present invention without departing from the core technical features of the present invention, which must be described in advance herein.
In another possible embodiment, the center position of the top circle feature can be directly set as the sampling point to calculate the sphere height. Please refer to fig. 8 and fig. 9, which are schematic diagrams of a top view image (ii) and a side view image (ii) of a sphere according to the present invention.
As shown in fig. 8, after obtaining the top view image a1 of the sphere, the processing device 40 obtains a first reference width W3 from the center of the top circle feature S1 to the sphere boundary E1 in the top view image a1 of the sphere. The center of the top circle feature S1 is set with a sampling point SP5, and the sampling point SP6 on the sphere boundary E1 may be at any position where the sphere boundary E1 is closed to a line, and the first reference width W3 is obtained by calculating the distance between the sampling points SP5, SP 6. Under the condition of a coaxial light source, a projection shadow zone SH2 is formed on the bottom side of the spherical object to be measured BT, and the projection boundary E1 of the sphere is the edge of the sphere.
As shown in fig. 9, after obtaining the sphere side view image a2, the processing device 40 obtains a second reference width W4 from the center of the top circle feature S2 to the sphere boundary E2 from the sphere side view image a 2. In a possible embodiment, the center of the top circle feature S2 is provided with a sampling point SP7, a sampling point SP8 at the boundary position with the sphere boundary E2 can be obtained by setting a central axis M3 passing through the center of the sphere and the center of the top circle feature S2 in the side view image a2 of the sphere, the side view width S 'of the sphere is obtained by calculating the distance between the sampling points SP7 and SP8, and the second reference width W4 is obtained by the side view width S' of the sphere. In the embodiment, the sphere projection boundary E2 is an image of the sphere BT including the projected shadow SH2, and the sampling point SP8 is sampled to the boundary with the projected shadow SH 2. Under the condition of reasonable optical arrangement, the error generated by the shadow areas SH2 can also be minimized and the edge of the object BT to be measured can be directly used as the projection boundary E2 of the sphere, which is not limited in the present invention.
Referring to fig. 10, a schematic cross-sectional view (two) of the object to be measured is shown. After the processing device 40 obtains the first reference width W3 and the second reference width W4 of the sphere dut BT in the sphere top view image and the sphere side view image, the sphere height H of the sphere dut BT can be further obtained. The processing device 40 obtains the height of the ball test object BT according to the following formula: w42Wherein W3 is the first reference width, W4 is the second reference width, and H is the sphere height.
As in the previous embodiment, since the spherical object BT is not necessarily completely symmetrical, in order to obtain accurate values, the first reference width W3 and the second reference width W4 should be calculated based on two sets of parameters on the same side of the same cross-sectional position (for example, the sampling point SP6 and the sampling point SP8 are located on the same position of the spherical object BT), but the present invention does not exclude the case where the spherical object BT is close to symmetry or is implemented with reasonable error, and the embodiments should still fall within the scope of the present invention without departing from the core technical features of the present invention, which must be described in advance herein.
In another embodiment of the present invention, a method for measuring a height of a sphere is further provided, referring to fig. 11, which is a schematic flow chart of another embodiment of the method for measuring a height of a sphere according to the present invention, the method includes the following steps:
the processing device receives the input top view image and the input side view image of the sphere, and defines a top circle feature and a sphere projection boundary on the top view image and the side view image of the sphere (step S21). In one embodiment, step S21 may further include illuminating the top of the spherical dut with a light source to form the tip circle feature. In another embodiment, step S21 may further include generating the tip circle feature in the top view image and the side view image of the sphere based on the visual feature of the object to be measured.
Next, the processing device defines a first reference width between the tip circle feature and the projection boundary of the sphere on the top view image of the sphere (step S22). On the other hand, the processing device defines a second reference width between the tip circle feature and the projection boundary of the sphere on the side view image of the sphere (step S23). In one possible embodiment, the first reference width is a distance between a boundary of the tip circle feature in the top view image of the sphere and a projected boundary of the sphere; the second reference width is a distance between a boundary of the tip circle feature in the side view image of the sphere and a projected boundary of the sphere. In another possible embodiment, the first reference width is a distance between a center of the dome feature in the top view image of the sphere and a projection boundary of the sphere; the second reference width is a distance between a center of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
The above steps S22 and S23 are not necessarily in order, and step S22 may be executed first, and step S23 may be executed later, or step S22 and step S23 may be executed simultaneously, which is not limited in the present invention.
Finally, the processing device obtains the sphere height of the spherical object to be measured through the first reference width and the second reference width (step S24); in one embodiment, the processing device obtains the sphere height of the sphere object according to the first reference width, the shooting angle of the side view image of the sphere, and the projection width from the top circle feature to the projection boundary of the sphere in the side view image of the sphere; wherein the height of the sphere of the object to be measured is obtained according to the Pythagorean theorem or trigonometric function relationship among the first reference width, the second reference width and the height of the sphere. Specifically, the height of the spherical object is obtained according to the following formula: w22＝W12+H2(ii) a Wherein W1 is the first reference width, W2 is the second reference width, and H is the sphere height. In one possible embodiment, the second reference width W2 is based on the projection width of the tip circle feature to the projection boundary of the sphere in the side view image of the sphereAnd the angle is obtained by correcting the visual angle of the spherical side view image and the first reference width W1.
The above method steps can be implemented by way of computer readable recording medium, such as read only memory, flash memory, floppy disk, hard disk, optical disk, flash disk, magnetic tape, database accessible by network, or storage medium with the same functions as those easily understood by those skilled in the art. After the processing device or the computer loads and executes the program, the method for measuring the height of the sphere in steps S21-S24 can be completed.
In addition to computer readable media, the above method steps can also be implemented as a computer program product stored on a hard disk of a network server, a memory device, such as app store, google play, windows market, or other similar application online distribution platform, and can be executed by a processing device or a computer by uploading the computer program product to the server for a user to pay for downloading.
In summary, the present invention can simply detect the spherical object or the spherical component on the object to be detected by the camera of the existing automatic optical detection device, and measure the height of the spherical object and other reference data.
The present invention has been described in detail, but the above description is only a preferred embodiment of the present invention, and the scope of the present invention should not be limited thereby, and all equivalent changes and modifications made according to the claims of the present invention should still fall within the scope of the present invention.

Claims (16)

1. A sphere height measuring method is used for measuring a sphere object to be measured, and is characterized by comprising the following steps:
defining a vertex circle feature and a sphere projection boundary on a sphere top view image and a sphere side view image;
defining a first reference width between the tip circle feature and the projection boundary of the sphere on the top view image of the sphere;
defining a second reference width from the tip circle feature to the projection boundary of the sphere on the side view image of the sphere; and
and obtaining the sphere height of the sphere object to be measured through the first reference width and the second reference width.
2. The method of claim 1, wherein the height of the ball is obtained according to a Pythagorean theorem or trigonometric function relationship among the first reference width, the second reference width and the height of the ball.
3. The method of claim 1, wherein the sphere height of the object is obtained according to the first reference width, the capturing view angle of the side view image of the sphere, and the projection width from the top circle feature to the projection boundary of the sphere in the side view image of the sphere.
4. The method of claim 1, comprising illuminating the top of the spherical dut with a light source to form the top circle feature.
5. The method of claim 1, comprising generating the tip circle feature in the top view image and the side view image of the sphere based on the visual feature of the object.
6. The method of claim 1, wherein the first reference width is a distance between a boundary of the vertex feature in the top view image of the sphere and a projected boundary of the sphere; wherein the second reference width is a distance between a boundary of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
7. The method of claim 1, wherein the first reference width is a distance between a center of the vertex feature in the top view image of the sphere and a projection boundary of the sphere; wherein the second reference width is a distance between a center of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
8. A non-transitory computer readable medium storing a computer program, wherein the computer program is loaded and executed by a processing device or a computer to implement the method of measuring a sphere height according to any one of claims 1 to 7.
9. A computer program product adapted to be stored on a computer readable medium, wherein the computer program product when loaded and executed by a processing device or a computer implements the method of any one of claims 1 to 7.
10. A system for measuring the height of a sphere, comprising:
a overlook camera device for overlook shooting a sphere object to be measured so as to obtain an overlook image of the sphere;
a side-view camera device for shooting the object to be measured of the sphere in a side-view manner so as to obtain a side-view image of the sphere; and
a processing device coupled to the top view camera device and the side view camera device, defining a top circle feature and a sphere projection boundary on the sphere top view image and the sphere side view image;
the processing device defines a first reference width between the tip circle feature and the projection boundary of the sphere on the sphere top view image and defines a second reference width between the tip circle feature and the projection boundary of the sphere on the sphere side view image so as to obtain the sphere height of the sphere to be measured.
11. The system of claim 10, wherein the processing device obtains the height of the ball according to the Pythagorean theorem or trigonometric function relationship among the first reference width, the second reference width and the height of the ball.
12. The system of claim 10, wherein the processing device obtains the sphere height of the sphere dut according to the first reference width, the capturing angle of view of the side-view camera, and the projection width from the top circle feature to the sphere projection boundary in the side-view image of the sphere.
13. The system of claim 10, further comprising a light source device for illuminating the top of the spherical dut to form the tip circle feature.
14. The system of claim 10, wherein the processing device forms the tip circle feature in the top view image and the side view image of the sphere based on the visual feature of the object.
15. The sphere height measurement system of claim 10, wherein the first reference width is a distance between a boundary of the top circle feature in the top view image of the sphere and a projected boundary of the sphere; wherein the second reference width is a distance between a boundary of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
16. The sphere height measurement system of claim 10, wherein the first reference width is a distance between a center of the top circle feature in the top view image of the sphere and a projection boundary of the sphere; wherein the second reference width is a distance between a center of the tip circle feature in the side view image of the sphere and a projection boundary of the sphere.
CN202110642042.5A 2020-09-03 2021-06-09 Sphere height measuring method, readable medium, computer program product and system Pending CN114140372A (en)

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JPH09304030A (en) * 1996-05-20 1997-11-28 Komatsu Ltd Instrument for inspecting terminal of semiconductor package
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