JP2022025994A - Apparatus and method for growing single crystal - Google Patents

Apparatus and method for growing single crystal Download PDF

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JP2022025994A
JP2022025994A JP2020129237A JP2020129237A JP2022025994A JP 2022025994 A JP2022025994 A JP 2022025994A JP 2020129237 A JP2020129237 A JP 2020129237A JP 2020129237 A JP2020129237 A JP 2020129237A JP 2022025994 A JP2022025994 A JP 2022025994A
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crucible
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一樹 辰宮
Kazuki Tatsumiya
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Sumitomo Metal Mining Co Ltd
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Abstract

To provide an apparatus and method for growing a single crystal, capable of growing a single crystal having a diameter of 8 inches without cracks and bottoming at a low cost even when using a zirconia bubble (a thermal insulation material).SOLUTION: An apparatus for growing a single crystal includes a fire resistant crucible 10; a crystal growth crucible 1 arranged in the crucible 10; a zirconia bubble 30 charged in a space between the fire resistant crucible 10 and the crucible 1; an after heater 40 arranged through a reflector 41 in the upper end of the crucible 1; and a high frequency induction coil 2 arranged in outer peripheries thereof, in a chamber 100. When setting a length from the lower end of the coil to the upper end thereof to Y, a length from the lower end of the crucible 1 to the upper end thereof to X, a length between the upper end of the coil and the upper end of the crucible 1 to A, a length between the lower end of the coil and the lower end of the crucible 1 to B and Y/X to 2-3.5, A/B is set within 1.22-1.42. Since balance between heat generations on the sides of the after heater 40 and crucible 1 is appropriately controlled, a single crystal without cracks and bottoming can be grown.SELECTED DRAWING: Figure 1

Description

本発明は、チョクラルスキー法による単結晶育成装置と単結晶育成方法に係り、特に、高周波誘導コイルを用いた単結晶育成装置と単結晶育成方法の改良に関する。 The present invention relates to a single crystal growing apparatus and a single crystal growing method by the Czochralski method, and more particularly to an improvement of a single crystal growing apparatus and a single crystal growing method using a high frequency induction coil.

タンタル酸リチウムやニオブ酸リチウム等の酸化物単結晶の育成方法として、従来、酸化物単結晶となる原料が充填された結晶育成用坩堝(坩堝と略称する場合がある)を高温に加熱してこの原料を溶融し、該結晶育成用坩堝内の原料融液に上方から種結晶を接触させた後、上昇させることで種結晶と同一方位の酸化物単結晶を育成するチョクラルスキー法が広く利用されている。 As a method for growing an oxide single crystal such as lithium tantalate or lithium niobate, conventionally, a crystal growing pit (sometimes abbreviated as a pit) filled with a raw material to be an oxide single crystal is heated to a high temperature. The Czochralski method is widely used in which the raw material is melted, the seed crystal is brought into contact with the raw material melt in the crystal growing chamber from above, and then the seed crystal is raised to grow an oxide single crystal in the same direction as the seed crystal. It's being used.

チョクラルスキー法による単結晶の育成では、結晶育成用坩堝の周囲に誘導コイルが配置されており、誘導コイルに高周波電流を流すことによって坩堝に渦電流が生じ、これによって坩堝が発熱して原料が溶融する。また、引き上げが進むにつれて単結晶の上部はシード棒(結晶引き上げ軸)を伝わって冷却されるが、発熱体が坩堝のみである場合、育成中における単結晶内の温度分布が大きくなるため、坩堝上部を保温する工夫がなされている。例えば、特許文献1には、結晶内の温度差に伴う熱応力によるクラックの発生を抑制するため、金属製アフターヒーターを坩堝の上端部に配置した酸化物単結晶の育成方法が開示され、また、特許文献2には、リング状の金属製リフレクターを坩堝の開放端部に配置して坩堝上部を保温する酸化物単結晶の育成方法が開示されている。 In the growth of a single crystal by the Czochralski method, an induction coil is arranged around the crucible for crystal growth, and an eddy current is generated in the crucible by passing a high-frequency current through the induction coil, which causes the crucible to generate heat and become a raw material. Melts. In addition, as the pulling progresses, the upper part of the single crystal is cooled along the seed rod (crystal pulling shaft), but if the heating element is only a crucible, the temperature distribution in the single crystal during growth becomes large, so the crucible It has been devised to keep the upper part warm. For example, Patent Document 1 discloses a method for growing an oxide single crystal in which a metal afterheater is arranged at the upper end of a crucible in order to suppress the generation of cracks due to thermal stress due to a temperature difference in the crystal. Patent Document 2 discloses a method for growing an oxide single crystal in which a ring-shaped metal reflector is arranged at an open end of a crucible to keep the upper part of the crucible warm.

近年、タンタル酸リチウム単結晶やニオブ酸リチウム単結晶は表面弾性波デバイス材料として市場が拡大しており、生産量の確保のため単結晶の引き上げ長さが次第に長くなっている。しかし、長尺化に合わせて結晶育成用坩堝の寸法を高く(内容積を大きく)すると、その分、坩堝内の原料融液が増加するため以下のような問題が存在した。 In recent years, the market for lithium tantalate single crystal and lithium niobate single crystal has been expanding as surface acoustic wave device materials, and the pull-up length of the single crystal is gradually increasing in order to secure the production amount. However, if the size of the crucible for crystal growth is increased (internal volume is increased) in accordance with the lengthening of the crucible, the amount of the raw material melt in the crucible increases by that amount, which causes the following problems.

すなわち、結晶育成用坩堝は、通常、耐火性坩堝(アルミナ坩堝)内に配置され、その隙間空間にアルミナ製焼結体から成る断熱材が充填されている。しかし、同一の結晶育成用坩堝を用いてニオブ酸リチウム単結晶等の育成を繰り返した場合、増加した原料融液の荷重により結晶育成用坩堝が変形し、結晶育成用坩堝が断熱材を押圧して耐火性坩堝(アルミナ坩堝)にクラックを生じさせる問題が存在した。 That is, the crystal growing crucible is usually arranged in a refractory crucible (alumina crucible), and the gap space thereof is filled with a heat insulating material made of an alumina sintered body. However, when the growth of lithium niobate single crystal or the like is repeated using the same crystal growth crucible, the crystal growth crucible is deformed by the increased load of the raw material melt, and the crystal growth crucible presses the heat insulating material. There was a problem of causing cracks in the fire-resistant crucible (alumina crucible).

この問題に対し、特許文献3には、アルミナ製焼結体から成る断熱材に代えて顆粒状のジルコニア・バブル(断熱材)を用い、上記原料融液の荷重により結晶育成用坩堝が変形し、結晶育成用坩堝がジルコニア・バブル(断熱材)を押圧した場合でも、ジルコニア・バブル(断熱材)が押圧力を吸収して耐火性坩堝(アルミナ坩堝)にクラックを生じさせない方法を開示している。この方法を採ることで、増加した原料融液の荷重に伴う耐火性坩堝(アルミナ坩堝)の問題を回避することは確かに可能となった。 To solve this problem, Patent Document 3 uses a granular zirconia bubble (heat insulating material) instead of a heat insulating material made of an alumina sintered body, and the crucible for crystal growth is deformed by the load of the raw material melt. Disclosed a method in which the zirconia bubble (insulation material) absorbs the pressing force and does not cause cracks in the refractory crucible (alumina crucible) even when the crystal growth crucible presses the zirconia bubble (insulation material). There is. By adopting this method, it is certainly possible to avoid the problem of refractory crucible (alumina crucible) due to the increased load of the raw material melt.

但し、顆粒状のジルコニア・バブル(断熱材)は、上記アルミナ製焼結体(断熱材)に較べて熱伝導率が小さいため、断熱材としてアルミナ製焼結体が適用された場合と同一レベルの高周波電圧を誘導コイルに印加した場合、結晶育成用坩堝内の融液温度が所望とする条件より高くなってしまい、単結晶の育成が困難となる。このため、熱伝導率の小さい顆粒状のジルコニア・バブル(断熱材)を適用した場合には、誘導コイルに印加する高周波電圧を相対的に小さくする必要があった。 However, since the granular zirconia bubble (heat insulating material) has a smaller thermal conductivity than the above alumina sintered body (heat insulating material), it is at the same level as when the alumina sintered body is applied as the heat insulating material. When the high frequency voltage of the above is applied to the induction coil, the temperature of the melt in the crucible for crystal growth becomes higher than the desired condition, which makes it difficult to grow a single crystal. Therefore, when a granular zirconia bubble (heat insulating material) having a low thermal conductivity is applied, it is necessary to make the high frequency voltage applied to the induction coil relatively small.

しかし、誘導コイルに印加する高周波電圧を小さくすると、坩堝の上端部に配置したアフターヒーターの発熱量が低下し、アフターヒーター内における結晶の上端と下端で温度勾配が大きくなるため、熱応力によりクラックを生ずる問題が存在した。特に、ニオブ酸リチウム単結晶は、熱歪に起因したクラックの発生は顕著であった。 However, if the high-frequency voltage applied to the induction coil is reduced, the calorific value of the afterheater placed at the upper end of the pit will decrease, and the temperature gradient will increase at the upper and lower ends of the crystal in the afterheater, resulting in cracks due to thermal stress. There was a problem that caused. In particular, in the lithium niobate single crystal, the generation of cracks due to thermal strain was remarkable.

このような場合、図1に示すように結晶育成用坩堝1の周囲に配置する高周波誘導コイル2を相対的に上方寄りに設定し、高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAが大きくなればアフターヒーターの発熱を促進させることが可能になる。しかし、高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAを大きくした場合、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBが相対的に小さくなるため、結晶育成用坩堝1の発熱量が低下し坩堝1底近傍の融液温度が低くなってしまう。この結果、結晶育成中に坩堝1底近傍の融液が固化し、育成した結晶と固化した結晶が衝突(底つきと称される)して単結晶の育成が強制終了し、所望とする長さの単結晶が得られなくなる原因となる。 In such a case, as shown in FIG. 1, the high frequency induction coil 2 arranged around the crystal growth crucible 1 is set relatively upward, and between the upper end of the high frequency induction coil 2 and the upper end of the crystal growth crucible 1. If the length A in the crystal pulling direction of the crucible becomes large, it becomes possible to promote the heat generation of the afterheater. However, when the length A in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing crucible 1 is increased, the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing crucible 1 Since the length B is relatively small, the calorific value of the crystal growing crucible 1 is reduced, and the melt temperature near the bottom of the crucible 1 is lowered. As a result, the melt near the bottom of the crucible solidifies during crystal growth, and the grown crystal collides with the solidified crystal (called bottoming), and the growth of the single crystal is forcibly terminated, and the desired length is obtained. It causes the crucible single crystal to not be obtained.

特許文献4には、結晶育成用坩堝の周囲に配置する第1誘導コイルとアフターヒーターの周囲に配置する第2誘導体コイルとを個別に配置し、それぞれの誘導体コイルに個別の高周波電源を用意すると共に、供給する高周波電流が互いに逆相になるように設定した結晶育成装置が開示されている。この育成装置によれば、アフターヒーターの発熱程度を結晶育成用坩堝とは独立して細かく制御できるため、引き上げ中における単結晶の温度を単結晶の成長に応じて制御よく調整することが可能となる。しかし、特許文献4に開示された育成装置においては、電源設備が2つ必要となるため設備コストが割高となり、設置場所も広くなる問題を有する。 In Patent Document 4, the first induction coil arranged around the crystal growing pit and the second derivative coil arranged around the afterheater are individually arranged, and a separate high frequency power supply is prepared for each derivative coil. At the same time, a crystal growth apparatus in which the high frequency currents to be supplied are set to be in opposite phase to each other is disclosed. According to this growing device, the degree of heat generation of the afterheater can be finely controlled independently of the crucible for growing crystals, so that the temperature of the single crystal during pulling can be adjusted in a well-controlled manner according to the growth of the single crystal. Become. However, the growing device disclosed in Patent Document 4 requires two power supply facilities, which causes a problem that the facility cost is high and the installation location is wide.

このような技術的背景の下、本発明者は、高周波誘導コイル2の長さYと高周波誘導コイル2内に配置される結晶育成用坩堝1の長さXの比率(Y/X)を通常の範囲(結晶引き上げ方向における坩堝の長さに対し高周波誘導コイルの長さは、通常、2倍~3.5倍に設定されている)に設定し、高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAと高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBの比率(A/B)を1.00~1.20の範囲に調整することでアフターヒーター側と結晶育成用坩堝側の発熱バランスが適正に制御され、断熱材としてジルコニア・バブルを適用した場合においてもクラックや底つき等が回避される単結晶の育成装置と育成方法を既に提案している(特許文献5参照)。 Against such a technical background, the present inventor usually sets the ratio (Y / X) of the length Y of the high frequency induction coil 2 to the length X of the crystal growing crucible 1 arranged in the high frequency induction coil 2. (The length of the high-frequency induction coil is usually set to 2 to 3.5 times the length of the crucible in the crystal pulling direction), and the upper end of the high-frequency induction coil 2 and the crucible for crystal growth are set. 1 The ratio (A / B) of the length A in the crystal pulling direction between the upper end and the length B in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing crucible 1 (A / B) is 1.00 to 1. By adjusting to the range of .20, the heat generation balance between the afterheater side and the crystal growth crucible side is properly controlled, and even when zirconia bubbles are applied as a heat insulating material, cracks and bottoming are avoided. We have already proposed a growing device and a growing method for the above (see Patent Document 5).

特開平7-187880号公報Japanese Unexamined Patent Publication No. 7-187880 特開平7-033586号公報Japanese Unexamined Patent Publication No. 7-033586 特開2019-052067号公報Japanese Unexamined Patent Publication No. 2019-052067 特開2014-125404号公報Japanese Unexamined Patent Publication No. 2014-125404 特願2019-232872号明細書Japanese Patent Application No. 2019-232872

ところで、特許文献5の装置を用いて育成する単結晶は、直径6インチ程度の単結晶(例えばニオブ酸リチウム単結晶)が想定されている。このため、直径6インチを超える単結晶(例えば、直径8インチ程度のニオブ酸リチウム単結晶)を育成しようとした場合、高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAと高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBの比率(A/B)を上記1.00~1.20の範囲に調整しても、アフターヒーター側と結晶育成用坩堝側の発熱バランスが適正に制御されなくなり、依然として育成される単結晶にクラックを生じさせる問題が存在した。 By the way, the single crystal grown by using the apparatus of Patent Document 5 is assumed to be a single crystal having a diameter of about 6 inches (for example, a lithium niobate single crystal). Therefore, when trying to grow a single crystal having a diameter of more than 6 inches (for example, a lithium niobate single crystal having a diameter of about 8 inches), the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing pit 1 Adjust the ratio (A / B) of the length A and the length B in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing pit 1 to the above range of 1.00 to 1.20. However, there was a problem that the heat generation balance between the afterheater side and the crystal growth pit side was not properly controlled, and the single crystal to be grown still had cracks.

本発明はこのような問題点に着目してなされたもので、その課題とするところは、直径6インチを超える単結晶を育成でき、かつ、断熱材としてジルコニア・バブルを適用した場合においても上記クラックや底つき等が回避される単結晶育成装置と単結晶育成方法を提供することにある。 The present invention has been made by paying attention to such a problem, and the subject thereof is that a single crystal having a diameter of more than 6 inches can be grown and the above-mentioned is applied even when a zirconia bubble is applied as a heat insulating material. It is an object of the present invention to provide a single crystal growing apparatus and a single crystal growing method in which cracks and bottoming are avoided.

そこで、クラック発生の原因について本発明者が分析したところ、単結晶の直径が6インチから8インチに拡大したことに伴い結晶内の温度差が大きくなり、育成中における結晶内の熱歪が増大していることが考えられた。そして、上記熱歪を減少させるにはアフターヒーターの発熱量を促進させることが有効で、高周波誘導コイル2を相対的に上方寄りにして比率(A/B)範囲を1.00~1.20より大きくする必要がある。すなわち、高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAと高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBの比率(A/B)は、育成する単結晶の直径が6インチの場合と8インチの場合とで適正範囲が異なり、直径8インチの単結晶を育成する場合、アフターヒーター側と結晶育成用坩堝側の発熱バランスが適正に制御される新たな比率(A/B)範囲を見出す必要があった。本発明はこのような技術的知見から完成されたものである。 Therefore, when the present inventor analyzed the cause of the crack generation, the temperature difference in the crystal increased as the diameter of the single crystal increased from 6 inches to 8 inches, and the thermal strain in the crystal increased during the growth. It was thought that he was doing it. Then, in order to reduce the thermal strain, it is effective to promote the calorific value of the afterheater, and the high frequency induction coil 2 is relatively upward and the ratio (A / B) range is set to 1.00 to 1.20. Need to be bigger. That is, the length A in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing crucible 1 and the length B in the crystal pulling direction between the lower end of the high frequency guiding coil 2 and the lower end of the crystal growing crucible 1. The appropriate range of the ratio (A / B) differs depending on whether the diameter of the single crystal to be grown is 6 inches or 8 inches. When growing a single crystal with a diameter of 8 inches, the afterheater side and the crucible for crystal growth It was necessary to find a new ratio (A / B) range in which the heat generation balance on the side was properly controlled. The present invention has been completed from such technical knowledge.

すなわち、本発明に係る第1の発明は、
一端側が開放された耐火性坩堝と、
上記耐火性坩堝内に坩堝台を介し配置された金属製の結晶育成用坩堝と、
上記耐火性坩堝と結晶育成用坩堝の隙間空間に充填されかつジルコニア・バブルで構成された断熱材と、
上記結晶育成用坩堝の上端に金属製のリフレクターを介し配置された金属製のアフターヒーターと、
上記耐火性坩堝とアフターヒーターの外側周囲に配置された高周波誘導コイルをチャンバー内に備え、
結晶引上げ軸に取り付けられた種結晶を上記結晶育成用坩堝の原料融液に接触させて単結晶を育成する単結晶育成装置において、
上記高周波誘導コイルの下端側から上端までの結晶引き上げ方向における長さをY、上記結晶育成用坩堝の下端側から上端までの結晶引き上げ方向における長さをX、上記高周波誘導コイル上端と結晶育成用坩堝上端との間の結晶引き上げ方向における長さをA、上記高周波誘導コイル下端と結晶育成用坩堝下端との間の結晶引き上げ方向における長さをBとし、Y/Xを2~3.5とした場合、A/Bが、1.22~1.42の範囲内に設定されていることを特徴とし、
第2の発明は、
第1の発明に記載の単結晶育成装置において、
直径8インチ、長さ70mm以上のニオブ酸リチウム結晶を育成するために用いられることを特徴とするものである。
That is, the first invention according to the present invention is
A refractory crucible with one end open,
A metal crystal growing crucible placed in the refractory crucible via a crucible stand,
A heat insulating material filled in the gap space between the refractory crucible and the crystal growing crucible and composed of zirconia bubbles,
A metal afterheater placed at the upper end of the crystal growing crucible via a metal reflector,
The chamber is equipped with the above-mentioned refractory crucible and high-frequency induction coils arranged around the outside of the afterheater.
In the single crystal growing apparatus for growing a single crystal by contacting the seed crystal attached to the crystal pulling shaft with the raw material melt of the above-mentioned crucible for growing crystals.
The length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil is Y, the length in the crystal pulling direction from the lower end side to the upper end of the crystal growing pit is X, and the upper end of the high frequency induction coil and the crystal growing The length in the crystal pulling direction between the upper end of the pit is A, the length in the crystal pulling direction between the lower end of the high frequency induction coil and the lower end of the pit for crystal growth is B, and Y / X is 2 to 3.5. If so, the A / B is set in the range of 1.22 to 1.42.
The second invention is
In the single crystal growing apparatus according to the first invention,
It is characterized in that it is used for growing lithium niobate crystals having a diameter of 8 inches and a length of 70 mm or more.

次に、本発明に係る第3の発明は、
チャンバー内に、耐火性坩堝と、該耐火性坩堝内に坩堝台を介し配置された金属製の結晶育成用坩堝と、上記耐火性坩堝と結晶育成用坩堝の隙間空間に充填されかつジルコニア・バブルで構成された断熱材と、上記結晶育成用坩堝の上端に金属製のリフレクターを介し配置された金属製のアフターヒーターと、上記耐火性坩堝とアフターヒーターの外側周囲に配置された高周波誘導コイルを備え、結晶引上げ軸に取り付けられた種結晶を上記結晶育成用坩堝の原料融液に接触させて単結晶を育成する単結晶育成方法において、
上記高周波誘導コイルの下端側から上端までの結晶引き上げ方向における長さをY、上記結晶育成用坩堝の下端側から上端までの結晶引き上げ方向における長さをX、上記高周波誘導コイル上端と結晶育成用坩堝上端との間の結晶引き上げ方向における長さをA、上記高周波誘導コイル下端と結晶育成用坩堝下端との間の結晶引き上げ方向における長さをBとし、Y/Xを2~3.5とした場合、A/Bを、1.22~1.42の範囲内に設定することを特徴とする。
Next, the third invention according to the present invention is
The chamber is filled with a fire-resistant crucible, a metal crystal-growing crucible arranged in the fire-resistant crucible via a crucible, and a gap space between the fire-resistant crucible and the crystal growing crucible, and a zirconia bubble. A heat insulating material composed of, a metal afterheater arranged at the upper end of the crystal growing crucible via a metal reflector, and a high frequency induction coil arranged around the outside of the fire resistant crucible and the afterheater. In the single crystal growing method for growing a single crystal by contacting the seed crystal attached to the crystal pulling shaft with the raw material melt of the above-mentioned crucible for growing crystals.
The length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil is Y, the length in the crystal pulling direction from the lower end side to the upper end of the crystal growing pit is X, and the upper end of the high frequency induction coil and the crystal growing The length in the crystal pulling direction between the upper end of the pit is A, the length in the crystal pulling direction between the lower end of the high frequency induction coil and the lower end of the pit for crystal growth is B, and Y / X is 2 to 3.5. If so, the A / B is set in the range of 1.22 to 1.42.

本発明によれば、高周波誘導コイルの下端側から上端までの結晶引き上げ方向における長さをY、結晶育成用坩堝の下端側から上端までの結晶引き上げ方向における長さをX、高周波誘導コイル上端と結晶育成用坩堝上端との間の結晶引き上げ方向における長さをA、高周波誘導コイル下端と結晶育成用坩堝下端との間の結晶引き上げ方向における長さをBとし、Y/Xを2~3.5とした場合、A/Bが、1.22~1.42の範囲内に設定されているため、単結晶の直径が6インチを超えて8インチ程度であってもアフターヒーター側と結晶育成用坩堝側の発熱バランスを適正に制御できる。このため、直径6インチを超える単結晶の育成が可能になると共に、断熱材としてジルコニア・バブルを適用した場合においてもクラックや底つき等が回避される単結晶育成装置と単結晶育成方法を提供できる効果を有する。 According to the present invention, the length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil is Y, the length in the crystal pulling direction from the lower end side to the upper end of the crystal growth chamber is X, and the upper end of the high frequency induction coil. 2. The length in the crystal pulling direction between the upper end of the crystal growing pit is A, the length in the crystal pulling direction between the lower end of the high frequency induction coil and the lower end of the crystal growing pit is B, and Y / X is 2 to 3. When it is 5, since the A / B is set in the range of 1.22 to 1.42, even if the diameter of the single crystal exceeds 6 inches and is about 8 inches, the afterheater side and crystal growth The heat generation balance on the crystal side can be properly controlled. For this reason, it is possible to grow a single crystal having a diameter of more than 6 inches, and a single crystal growing device and a single crystal growing method that avoid cracks and bottoming even when a zirconia bubble is applied as a heat insulating material are provided. Has the effect that can be done.

単結晶育成装置における構成部品の長さ寸法を示す説明図で、図中、符号Yは高周波誘導コイルの下端側から上端までの結晶引き上げ方向における長さ、符号Xは結晶育成用坩堝の下端側から上端までの結晶引き上げ方向における長さ、符号Aは高周波誘導コイル上端と結晶育成用坩堝上端との間の結晶引き上げ方向における長さ、および、符号Bは高周波誘導コイル下端と結晶育成用坩堝下端との間の結晶引き上げ方向における長さをそれぞれ示す。In the explanatory view showing the length dimension of the component in the single crystal growing apparatus, the reference numeral Y is the length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil, and the reference numeral X is the lower end side of the crystal growing pit. The length from the upper end to the upper end in the crystal pulling direction, the reference numeral A is the length in the crystal pulling direction between the upper end of the high frequency induction coil and the upper end of the crystal growth chamber, and the reference numeral B is the lower end of the high frequency induction coil and the lower end of the crystal growth chamber. The length in the crystal pulling direction between and is shown respectively. 実施形態に係る単結晶育成装置の構成説明図。The configuration explanatory drawing of the single crystal growth apparatus which concerns on embodiment.

以下、本発明の実施形態について詳細に説明する。 Hereinafter, embodiments of the present invention will be described in detail.

図2は、本発明の実施形態に係る単結晶育成装置の構成説明図で、本実施形態に係る単結晶育成装置は、チャンバー100と、該チャンバー100内に配置されかつ一端側が開放された耐火性坩堝(アルミナ坩堝)10と、該耐火性坩堝10内に坩堝台11を介し配置された白金製の結晶育成用坩堝1と、上記耐火性坩堝10と結晶育成用坩堝1の隙間空間に充填されたジルコニア・バブル(断熱材)30と、上記結晶育成用坩堝1の上端に白金製のリフレクター41を介し配置された白金製のアフターヒーター40と、上記耐火性坩堝10とアフターヒーター40の外側周囲に配置された高周波誘導コイル2とでその主要部が構成されている。尚、図2中、符号12はアルミナから成る耐火物、符号31は断熱材、符号50はシード棒(結晶引き上げ軸)、符号51は種結晶、符号60は育成された結晶、符号61は結晶原料をそれぞれ示す。 FIG. 2 is a configuration explanatory view of the single crystal growing device according to the embodiment of the present invention. The single crystal growing device according to the present embodiment has a crucible and a fire resistance arranged in the chamber 100 and one end is open. Fill the gap space between the sex crucible (alumina crucible) 10, the platinum crystal growing crucible 1 arranged in the fire resistant crucible 10 via the crucible 11, and the fire resistant crucible 10 and the crystal growing crucible 1. The zirconia bubble (insulation material) 30 and the platinum afterheater 40 arranged at the upper end of the crystal growing crucible 1 via a platinum reflector 41, and the outside of the fire resistant crucible 10 and the afterheater 40. The main part thereof is composed of a high frequency induction coil 2 arranged around the crucible. In FIG. 2, reference numeral 12 is a refractory material made of alumina, reference numeral 31 is a heat insulating material, reference numeral 50 is a seed rod (crystal pulling shaft), reference numeral 51 is a seed crystal, reference numeral 60 is a grown crystal, and reference numeral 61 is a crystal. The raw materials are shown respectively.

そして、本実施形態に係る単結晶育成装置においては、図1に示すように、高周波誘導コイル2の下端側から上端までの結晶引き上げ方向における長さをY、結晶育成用坩堝1の下端側から上端までの結晶引き上げ方向における長さをX、高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さをA、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さをBとし、Y/Xを2~3.5とした場合、A/Bが、1.22~1.42の範囲内に設定されている。 Then, in the single crystal growing apparatus according to the present embodiment, as shown in FIG. 1, the length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil 2 is Y, and the length in the crystal pulling direction is from the lower end side of the crystal growing crucible 1. The length in the crystal pulling direction to the upper end is X, the length in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growth crucible 1 is A, the lower end of the high frequency induction coil 2 and the lower end of the crystal growth crucible 1. When the length in the crystal pulling direction is B and Y / X is 2 to 3.5, A / B is set in the range of 1.22 to 1.42.

このため、育成する単結晶の直径が6インチを超えて8インチ程度であっても高周波誘導コイル2によるアフターヒーター40側と結晶育成用坩堝1側の発熱バランスが適正に制御され、断熱材としてジルコニア・バブルが適用された場合においても上述したクラックや底つき等の不具合を防止することが可能となる。 Therefore, even if the diameter of the single crystal to be grown exceeds 6 inches and is about 8 inches, the heat generation balance between the afterheater 40 side and the crystal growing crucible 1 side by the high frequency induction coil 2 is properly controlled, and as a heat insulating material. Even when the zirconia bubble is applied, it is possible to prevent the above-mentioned problems such as cracks and bottoming.

上記A/Bが1.22未満の場合(高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAが小さく設定された場合)、高周波誘導コイル2によるアフターヒーター40側の発熱量を十分に確保できなくなるため、アフターヒーター40内における結晶60内の温度差が大きくなり、結晶60内の熱歪等により引き上げ中にクラックの不具合を生ずる。他方、上記A/Bが1.42を超えた場合(高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAが大きく設定され、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBが相対的に小さく設定された場合)、高周波誘導コイル2による結晶育成用坩堝1の発熱量が低下して坩堝1底近傍の融液温度が低くなり、結晶育成中に坩堝1底近傍の融液が固化して底つき等の不具合を生ずる。 When the above A / B is less than 1.22 (when the length A in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing pit 1 is set small), the afterheater by the high frequency induction coil 2 is used. Since the amount of heat generated on the 40 side cannot be sufficiently secured, the temperature difference in the crystal 60 in the afterheater 40 becomes large, and a defect of crack occurs during pulling due to thermal strain in the crystal 60 or the like. On the other hand, when the above A / B exceeds 1.42 (the length A between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing crucible 1 in the crystal pulling direction is set large, and the lower end of the high frequency induction coil 2 and the crystal When the length B in the crystal pulling direction between the lower end of the growing crucible 1 is set to be relatively small), the calorific value of the crystal growing crucible 1 by the high frequency induction coil 2 decreases and melting near the bottom of the crucible 1 The liquid temperature becomes low, and the melt near the bottom of the crucible solidifies during crystal growth, causing problems such as bottoming.

これに対し、A/Bが上記1.22~1.42の範囲内に設定された場合、単結晶の直径が6インチを超えて8インチ程度であっても高周波誘導コイル2によるアフターヒーター40側と結晶育成用坩堝1側の発熱バランスを適正に制御できる。このため、直径6インチを超える単結晶の育成が可能になると共に、断熱材としてジルコニア・バブルが適用された場合においてもクラックや底つき等の不具合を防止することが可能となる。 On the other hand, when the A / B is set within the range of 1.22 to 1.42, the afterheater 40 by the high frequency induction coil 2 even if the diameter of the single crystal exceeds 6 inches and is about 8 inches. The heat generation balance between the side and the crystal growing crucible 1 side can be appropriately controlled. Therefore, it is possible to grow a single crystal having a diameter of more than 6 inches, and it is possible to prevent problems such as cracks and bottoming even when a zirconia bubble is applied as a heat insulating material.

以下、本実施形態に係る単結晶育成装置を構成する部材について説明する。 Hereinafter, the members constituting the single crystal growing apparatus according to the present embodiment will be described.

結晶育成用坩堝1は、結晶原料の融液を貯留保持するための容器であり、円筒形状の側面と円形の底面を有する。また、結晶育成用坩堝1は、耐熱性に優れたイリジウムや白金で構成され、育成される単結晶がニオブ酸リチウム結晶である場合、白金製の坩堝が適用される。 The crystal growing crucible 1 is a container for storing and holding a melt of a crystal raw material, and has a cylindrical side surface and a circular bottom surface. Further, the crystal growing crucible 1 is made of iridium or platinum having excellent heat resistance, and when the single crystal to be grown is a lithium niobate crystal, a platinum crucible is applied.

坩堝台11は、結晶育成用坩堝1を支持するための支持台であり、結晶育成用坩堝1の下方に配置される。 The crucible stand 11 is a support stand for supporting the crystal growing crucible 1, and is arranged below the crystal growing crucible 1.

上記結晶育成用坩堝1の上端(開放端)に配置されるリフレクター41は、坩堝1内の熱を反射して坩堝1内に戻すための熱反射手段で、坩堝1側面の上端周縁部を覆うように坩堝1側面の上端に設けられており、円環形状を有する。また、リフレクター41は、耐熱性に優れたイリジウムや白金で構成され、育成される単結晶がニオブ酸リチウム結晶である場合、白金製のリフレクターが適用される。 The reflector 41 arranged at the upper end (open end) of the crystal growing crucible 1 is a heat reflecting means for reflecting the heat in the crucible 1 and returning it to the crucible 1, and covers the upper end peripheral portion of the side surface of the crucible 1. As described above, it is provided at the upper end of the side surface of the crucible 1 and has an annular shape. Further, the reflector 41 is made of iridium or platinum having excellent heat resistance, and when the single crystal to be grown is a lithium niobate crystal, a platinum reflector is applied.

アフターヒーター40は、結晶育成用坩堝1から引き上げられた単結晶を加熱するための加熱手段である。アフターヒーター40は、リフレクター41上に設けられ、円筒形状を有する。また、アフターヒーター40は、耐熱性に優れたイリジウムや白金で構成され、育成される単結晶がニオブ酸リチウム結晶である場合、白金製のアフターヒーターが適用される。 The afterheater 40 is a heating means for heating the single crystal pulled up from the crystal growth crucible 1. The afterheater 40 is provided on the reflector 41 and has a cylindrical shape. Further, the afterheater 40 is made of iridium or platinum having excellent heat resistance, and when the single crystal to be grown is a lithium niobate crystal, a platinum afterheater is applied.

シード棒(結晶引き上げ軸)50は、下端に種結晶51を保持し、結晶育成用坩堝1に保持された原料融液に種結晶51を接触させ、単結晶の引き上げを行うための単結晶引き上げ手段である。シード棒(結晶引き上げ軸)50は、図示しないモータ等に接続され、回転しながら単結晶を引き上げ可能に構成される。 The seed rod (crystal pulling shaft) 50 holds the seed crystal 51 at the lower end, and the seed crystal 51 is brought into contact with the raw material melt held in the crystal growth chamber 1 to pull the single crystal. It is a means. The seed rod (crystal pulling shaft) 50 is connected to a motor or the like (not shown) and is configured to be able to pull a single crystal while rotating.

耐火性坩堝(アルミナ坩堝)10と耐火物12は、結晶育成用坩堝1およびアフターヒーター40のホットゾーンを外側から覆うための手段である。 The refractory crucible (alumina crucible) 10 and the refractory material 12 are means for covering the hot zone of the crystal growing crucible 1 and the afterheater 40 from the outside.

ジルコニア・バブル(断熱材)30と断熱材31は、結晶育成用坩堝1の周囲を覆い、熱が外部に放出されるのを抑制するための手段であり、上記断熱材31としては、例えば、アルミナ(酸化アルミニウム)やジルコニア等の耐熱材料が用いられる。 The zirconia bubble (heat insulating material) 30 and the heat insulating material 31 are means for covering the periphery of the crystal growing crucible 1 and suppressing heat from being released to the outside. Examples of the heat insulating material 31 include, for example. Heat resistant materials such as alumina (aluminum oxide) and zirconia are used.

高周波誘導コイル2は、高周波誘導加熱方式により結晶育成用坩堝1、アフターヒーター40やリフレクター41等を加熱する手段である。高周波誘導コイル2は、図2に示すように銅等の導体をコイル状に形成し、耐火性坩堝(アルミナ坩堝)10、耐火物12とは非接触の状態でこれ等外周を囲むように配置されている。すなわち、高周波誘導コイル2は、耐火性坩堝(アルミナ坩堝)10、耐火物12の径方向外方に設けられている。また、高周波誘導コイル2の巻き数、コイル間隔(巻きピッチ)、高周波誘導コイル2と結晶育成用坩堝1の相対位置等は、結晶育成用坩堝1の材質、大きさ(坩堝1の結晶引き上げ方向における長さ)、育成する結晶の種類、長さ、直径等によって適宜設定される。例えば、育成される単結晶が、直径8インチ、直胴部長60mm~80mm程度のニオブ酸リチウム結晶である場合、高周波誘導コイル2の巻き数は8巻~16巻程度、コイル間隔(巻きピッチ)は30mm前後である。また、高周波誘導コイル2を作動させるとき、該コイル2には外部の電源(図示せず)から高周波電圧が印加され高周波の電流が流される。これにより、高周波誘導コイル2の周辺に磁界が生じて、高周波誘導コイル2に囲まれる結晶育成用坩堝1、アフターヒーター40、リフレクター41等が発熱する。また、所望とする直径の結晶を育成するため、育成中の結晶重量をロードセルにより検出し、結晶重量から結晶の直径を算出すると共に、ADC(Automatic Diameter Control)により高周波誘導コイル2へ印加する高周波電圧(例えば、165V~175V)を制御するよう構成されている。 The high-frequency induction coil 2 is a means for heating the crystal growing crucible 1, the afterheater 40, the reflector 41, and the like by a high-frequency induction heating method. As shown in FIG. 2, the high-frequency induction coil 2 is formed by forming a conductor such as copper in a coil shape, and is arranged so as to surround the outer periphery of the refractory crucible (alumina crucible) 10 and the refractory material 12 in a non-contact state. Has been done. That is, the high-frequency induction coil 2 is provided outside the radial direction of the refractory crucible (alumina crucible) 10 and the refractory material 12. Further, the number of turns of the high-frequency induction coil 2, the coil interval (winding pitch), the relative position between the high-frequency induction coil 2 and the crystal growing crucible 1, etc. are the material and size of the crystal growing crucible 1 (the crystal pulling direction of the crucible 1). The length in the crucible), the type of crystal to be grown, the length, the diameter, etc. are appropriately set. For example, when the single crystal to be grown is a lithium niobate crystal having a diameter of 8 inches and a straight body length of about 60 mm to 80 mm, the number of turns of the high frequency induction coil 2 is about 8 to 16 turns, and the coil spacing (winding pitch). Is around 30 mm. Further, when the high frequency induction coil 2 is operated, a high frequency voltage is applied to the coil 2 from an external power source (not shown) and a high frequency current is passed through the coil 2. As a result, a magnetic field is generated around the high frequency induction coil 2, and the crystal growing pit 1, the afterheater 40, the reflector 41, etc. surrounded by the high frequency induction coil 2 generate heat. Further, in order to grow a crystal having a desired diameter, the weight of the crystal being grown is detected by a load cell, the diameter of the crystal is calculated from the crystal weight, and the high frequency applied to the high frequency induction coil 2 by ADC (Automatic Diameter Control). It is configured to control the voltage (eg, 165V to 175V).

チャンバー100は、結晶育成用坩堝1、耐火性坩堝(アルミナ坩堝)10、アフターヒーター40、高周波誘導コイル2、耐火物12、坩堝台11等を含めた全体を覆うための手段で、結晶育成雰囲気の保持や熱が外部に漏れるのを抑制する役割を果たす。 The chamber 100 is a means for covering the whole including a crystal growing crucible 1, a refractory crucible (alumina crucible) 10, an afterheater 40, a high frequency induction coil 2, a refractory material 12, a crucible stand 11, and the like, and has a crystal growing atmosphere. It plays a role in holding the crucible and suppressing heat from leaking to the outside.

制御手段(図示せず)は、単結晶育成装置全体の制御を行うための手段であり、単結晶育成プロセスを含めて単結晶育成装置全体の動作を制御する。制御手段は、例えば、CPU(Central Processing Unit、中央処理装置)、および、ROM(Read Only Memory)、RAM(Random Access Memory)等のメモリを備え、プログラムにより動作するマイクロコンピュータにより構成されてもよいし、特定用途のために開発されたASIC(Application Specified Integra Circuit)等の電子回路により構成されてもよい。 The control means (not shown) is a means for controlling the entire single crystal growth apparatus, and controls the operation of the entire single crystal growth apparatus including the single crystal growth process. The control means may be configured by, for example, a microcomputer including a CPU (Central Processing Unit) and a memory such as a ROM (Read Only Memory) and a RAM (Random Access Memory) and operated by a program. However, it may be configured by an electronic circuit such as an ASIC (Application Specified Integra Circuit) developed for a specific application.

そして、単結晶の育成は、結晶原料61が充填された結晶育成用坩堝1を高周波誘導加熱により加熱させて原料融液を得る。その後、シード棒(結晶引き上げ軸)50に連結された種結晶51を原料融液表面に接触させ、上方に引き上げて単結晶の育成を行う。チョクラルスキー法による育成方法は特に限定されず、公知の技術を利用できる。 Then, in the growth of the single crystal, the crucible 1 for crystal growth filled with the crystal raw material 61 is heated by high frequency induction heating to obtain a raw material melt. After that, the seed crystal 51 connected to the seed rod (crystal pulling shaft) 50 is brought into contact with the surface of the raw material melt and pulled upward to grow a single crystal. The growing method by the Czochralski method is not particularly limited, and known techniques can be used.

以下、本発明に係る実施例を比較例も挙げて具体的に説明する。 Hereinafter, examples of the present invention will be specifically described with reference to comparative examples.

すなわち、図2に示す単結晶育成装置を用いて直径8インチで直胴部長70mmのニオブ酸リチウム単結晶を育成した。尚、ニオブ酸リチウム単結晶の肩部育成時におけるシード棒(結晶引き上げ軸)50の回転速度を10.0rpm、引き上げ速度を0.5mm/hrとし、ニオブ酸リチウム単結晶の直胴部育成時におけるシード棒(結晶引き上げ軸)50の回転速度を5.0rpm、引き上げ速度を1.0mm/hrとしている。 That is, a lithium niobate single crystal having a diameter of 8 inches and a straight body length of 70 mm was grown using the single crystal growing device shown in FIG. When growing the shoulder of the lithium niobate single crystal, the rotation speed of the seed rod (crystal pulling shaft) 50 is 10.0 rpm, and the pulling speed is 0.5 mm / hr. The rotation speed of the seed rod (crystal pulling shaft) 50 in the above is 5.0 rpm, and the pulling speed is 1.0 mm / hr.

高周波誘導コイル2には、コイル間隔(巻きピッチ)が30mm、巻き数が16巻の銅製ワークコイル(全長Y:480mm)を適用し、結晶育成用坩堝1には、内径270mm、高さ(すなわちX)が202mmの白金製坩堝を適用した。すなわち、上記高周波誘導コイル2の長さYと結晶育成用坩堝1の長さXの比率(Y/X)は、480/202=2.4(すなわち、2~3.5の通常範囲)に設定されている。耐火性坩堝(アルミナ坩堝)10と結晶育成用坩堝1の隙間空間に充填される断熱材30にはジルコニア・バブルを適用し、断熱材31にはアルミナ(酸化アルミニウム)を用いた。また、アフターヒーター40には、長さ140mmの白金製アフターヒーターを適用した。尚、高周波誘導コイル2へ印加する電圧は165V~175Vに設定した。 A copper work coil (total length Y: 480 mm) having a coil spacing (winding pitch) of 30 mm and 16 turns is applied to the high-frequency induction coil 2, and the crystal growing crucible 1 has an inner diameter of 270 mm and a height (that is, that is). A platinum crucible with an X) of 202 mm was applied. That is, the ratio (Y / X) of the length Y of the high frequency induction coil 2 to the length X of the crystal growing crucible 1 is 480/202 = 2.4 (that is, a normal range of 2 to 3.5). It is set. Zirconia bubbles were applied to the heat insulating material 30 filled in the gap space between the refractory crucible (alumina crucible) 10 and the crystal growing crucible 1, and alumina (aluminum oxide) was used for the heat insulating material 31. Further, a platinum afterheater having a length of 140 mm was applied to the afterheater 40. The voltage applied to the high frequency induction coil 2 was set to 165V to 175V.

また、図1に示す高周波誘導コイル2の下端側から上端までの結晶引き上げ方向における長さをY(480mm)、結晶育成用坩堝1の下端側から上端までの結晶引き上げ方向における長さをX(202mm)、高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さをA、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さをBとする。 Further, the length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil 2 shown in FIG. 1 is Y (480 mm), and the length in the crystal pulling direction from the lower end side to the upper end of the crystal growth chamber 1 is X (X). 202 mm), the length in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing pit 1 is A, and the length in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing pit 1 Let B.

[実施例1]
高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAを153mm、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBを125mmに設定してニオブ酸リチウム単結晶の育成を7回実施したところ、クラックや底つき等の不具合は皆無であった。
[Example 1]
The length A in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing crucible 1 is 153 mm, and the length B in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing crucible 1 is set. When the lithium niobate single crystal was grown 7 times with the setting set to 125 mm, there were no problems such as cracks and bottoming.

尚、A/B=153/125=1.22となる。 In addition, A / B = 153/125 = 1.22.

育成条件と結果を以下の表1に記載する。 The growing conditions and results are shown in Table 1 below.

[実施例2]
高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAを158mm、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBを120mmに設定して、実施例1と同様、ニオブ酸リチウム単結晶の育成を7回実施したところ、クラックや底つき等の不具合は皆無であった。
[Example 2]
The length A in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing crucible 1 is 158 mm, and the length B in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing crucible 1 is set. When the lithium niobate single crystal was grown 7 times with the setting set to 120 mm as in Example 1, there were no problems such as cracks and bottoming.

尚、A/B=158/120=1.32となる。 In addition, A / B = 158/120 = 1.32.

育成条件と結果を以下の表1に記載する。 The growing conditions and results are shown in Table 1 below.

[実施例3]
高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAを163mm、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBを115mmに設定して、実施例1と同様、ニオブ酸リチウム単結晶の育成を7回実施したところ、クラックや底つき等の不具合は皆無であった。
[Example 3]
The length A in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing crucible 1 is 163 mm, and the length B in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing crucible 1 is set. When the lithium niobate single crystal was grown 7 times with the setting set to 115 mm as in Example 1, there were no problems such as cracks and bottoming.

尚、A/B=163/115=1.42となる。 In addition, A / B = 163/115 = 1.42.

育成条件と結果を以下の表1に記載する。 The growing conditions and results are shown in Table 1 below.

[比較例1]
高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAを148mm、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBを130mmに設定してニオブ酸リチウム単結晶の育成を実施したところ、底つきは起こらなかったがクラックが発生した。
[Comparative Example 1]
The length A in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing crucible 1 is 148 mm, and the length B in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing crucible 1 is set. When the lithium niobate single crystal was grown at a setting of 130 mm, no bottoming occurred, but cracks occurred.

高周波誘導コイル2が相対的に下方寄りに設定されてしまい、高周波誘導コイル2によるアフターヒーター40側の発熱量を十分確保できなくなってアフターヒーター40内における結晶60内の温度差が大きくなり、結晶60内の熱歪等によりクラックが発生したものと推定される。 The high-frequency induction coil 2 is set relatively downward, and the amount of heat generated on the after-heater 40 side by the high-frequency induction coil 2 cannot be sufficiently secured, and the temperature difference in the crystal 60 in the after-heater 40 becomes large, resulting in a crystal. It is presumed that cracks were generated due to thermal strain or the like in 60.

尚、A/B=148/130=1.14となる。 In addition, A / B = 148/130 = 1.14.

育成条件と結果を以下の表1に記載する。 The growing conditions and results are shown in Table 1 below.

[比較例2]
高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さAを168mm、高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さBを110mmに設定してニオブ酸リチウム単結晶の育成を実施したところ、育成途中で底つきが起こったため強制的に中止した。但し、育成途中の結晶にクラックは確認されなかった。
[Comparative Example 2]
The length A in the crystal pulling direction between the upper end of the high frequency induction coil 2 and the upper end of the crystal growing crucible 1 is 168 mm, and the length B in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing crucible 1 is set. When the growth of the lithium niobate single crystal was set to 110 mm, it was forcibly stopped because the bottoming occurred during the growth. However, no cracks were found in the crystals during growth.

高周波誘導コイル2が相対的に上方寄りに設定されてしまい、高周波誘導コイル2による結晶育成用坩堝1の発熱量が低下して坩堝1底近傍の融液温度が低くなり、その結果、結晶育成中に坩堝1底近傍の融液が固化したものと推定される。 The high-frequency induction coil 2 is set relatively upward, the calorific value of the crystal growing crucible 1 by the high-frequency induction coil 2 decreases, and the melt temperature near the bottom of the crucible 1 decreases, resulting in crystal growth. It is presumed that the melt near the bottom of the crucible 1 solidified inside.

尚、A/B=168/110=1.53となる。 In addition, A / B = 168/110 = 1.53.

育成条件と結果を以下の表1に記載する。 The growing conditions and results are shown in Table 1 below.

Figure 2022025994000002
Figure 2022025994000002

本発明によれば、断熱材としてジルコニア・バブルを適用した場合においても低コストでクラックや底つきのない直径6インチを超える単結晶を育成できるため、表面弾性波デバイス材料として用いられるニオブ酸リチウム単結晶の育成装置として利用される産業上の利用可能性を有している。 According to the present invention, even when a zirconia bubble is applied as a heat insulating material, a single crystal having a diameter of more than 6 inches without cracks or bottoming can be grown at low cost. Therefore, a single lithium niobate used as a surface acoustic wave device material can be grown. It has industrial applicability to be used as a crystal growing device.

1 結晶育成用坩堝
2 高周波誘導コイル
10 耐火性坩堝(アルミナ坩堝)
11 坩堝台
30 ジルコニア・バブル(断熱材)
31 断熱材
40 アフターヒーター
41 リフレクター
50 シード棒(結晶引き上げ軸)
51 種結晶
60 結晶
61 結晶原料
100 チャンバー
Y 高周波誘導コイル2の下端側から上端までの結晶引き上げ方向における長さ
X 結晶育成用坩堝1の下端側から上端までの結晶引き上げ方向における長さ
A 高周波誘導コイル2上端と結晶育成用坩堝1上端との間の結晶引き上げ方向における長さ
B 高周波誘導コイル2下端と結晶育成用坩堝1下端との間の結晶引き上げ方向における長さ
1 Crucible for crystal growth 2 High frequency induction coil 10 Refractory crucible (alumina crucible)
11 Crucible stand 30 Zirconia bubble (insulation material)
31 Insulation material 40 After heater 41 Reflector 50 Seed rod (crystal pulling shaft)
51 Seed crystal 60 Crystal 61 Crystal raw material 100 Chamber Y Length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil 2 X Length in the crystal pulling direction from the lower end side to the upper end of the crystal growing yard 1 A High frequency induction Length in the crystal pulling direction between the upper end of the coil 2 and the upper end of the crystal growing pit 1 B Length in the crystal pulling direction between the lower end of the high frequency induction coil 2 and the lower end of the crystal growing pit 1.

Claims (3)

一端側が開放された耐火性坩堝と、
上記耐火性坩堝内に坩堝台を介し配置された金属製の結晶育成用坩堝と、
上記耐火性坩堝と結晶育成用坩堝の隙間空間に充填されかつジルコニア・バブルで構成された断熱材と、
上記結晶育成用坩堝の上端に金属製のリフレクターを介し配置された金属製のアフターヒーターと、
上記耐火性坩堝とアフターヒーターの外側周囲に配置された高周波誘導コイルをチャンバー内に備え、
結晶引上げ軸に取り付けられた種結晶を上記結晶育成用坩堝の原料融液に接触させて単結晶を育成する単結晶育成装置において、
上記高周波誘導コイルの下端側から上端までの結晶引き上げ方向における長さをY、上記結晶育成用坩堝の下端側から上端までの結晶引き上げ方向における長さをX、上記高周波誘導コイル上端と結晶育成用坩堝上端との間の結晶引き上げ方向における長さをA、上記高周波誘導コイル下端と結晶育成用坩堝下端との間の結晶引き上げ方向における長さをBとし、Y/Xを2~3.5とした場合、A/Bが、1.22~1.42の範囲内に設定されていることを特徴とする単結晶育成装置。
A refractory crucible with one end open,
A metal crystal growing crucible placed in the refractory crucible via a crucible stand,
A heat insulating material filled in the gap space between the refractory crucible and the crystal growing crucible and composed of zirconia bubbles,
A metal afterheater placed at the upper end of the crystal growing crucible via a metal reflector,
The chamber is equipped with the above-mentioned refractory crucible and high-frequency induction coils arranged around the outside of the afterheater.
In the single crystal growing apparatus for growing a single crystal by contacting the seed crystal attached to the crystal pulling shaft with the raw material melt of the above-mentioned crucible for growing crystals.
The length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil is Y, the length in the crystal pulling direction from the lower end side to the upper end of the crystal growth crucible is X, and the upper end of the high frequency induction coil and the crystal growth The length in the crystal pulling direction between the upper end of the crucible is A, the length in the crystal pulling direction between the lower end of the high frequency induction coil and the lower end of the crystal growing crucible is B, and Y / X is 2 to 3.5. If so, the single crystal growing apparatus is characterized in that the A / B is set in the range of 1.22 to 1.42.
直径8インチ、長さ70mm以上のニオブ酸リチウム結晶を育成するために用いられることを特徴とする請求項1に記載の単結晶育成装置。 The single crystal growing apparatus according to claim 1, wherein the single crystal growing apparatus is used for growing lithium niobate crystals having a diameter of 8 inches and a length of 70 mm or more. チャンバー内に、耐火性坩堝と、該耐火性坩堝内に坩堝台を介し配置された金属製の結晶育成用坩堝と、上記耐火性坩堝と結晶育成用坩堝の隙間空間に充填されかつジルコニア・バブルで構成された断熱材と、上記結晶育成用坩堝の上端に金属製のリフレクターを介し配置された金属製のアフターヒーターと、上記耐火性坩堝とアフターヒーターの外側周囲に配置された高周波誘導コイルを備え、結晶引上げ軸に取り付けられた種結晶を上記結晶育成用坩堝の原料融液に接触させて単結晶を育成する単結晶育成方法において、
上記高周波誘導コイルの下端側から上端までの結晶引き上げ方向における長さをY、上記結晶育成用坩堝の下端側から上端までの結晶引き上げ方向における長さをX、上記高周波誘導コイル上端と結晶育成用坩堝上端との間の結晶引き上げ方向における長さをA、上記高周波誘導コイル下端と結晶育成用坩堝下端との間の結晶引き上げ方向における長さをBとし、Y/Xを2~3.5とした場合、A/Bを、1.22~1.42の範囲内に設定することを特徴とする単結晶育成方法。
The chamber is filled with a fire-resistant crucible, a metal crystal-growing crucible arranged in the fire-resistant crucible via a crucible, and a gap space between the fire-resistant crucible and the crystal growing crucible, and a zirconia bubble. A heat insulating material composed of, a metal afterheater arranged at the upper end of the crystal growing crucible via a metal reflector, and a high frequency induction coil arranged around the outside of the fire resistant crucible and the afterheater. In the single crystal growing method for growing a single crystal by contacting the seed crystal attached to the crystal pulling shaft with the raw material melt of the above-mentioned crucible for growing crystals.
The length in the crystal pulling direction from the lower end side to the upper end of the high frequency induction coil is Y, the length in the crystal pulling direction from the lower end side to the upper end of the crystal growth crucible is X, and the upper end of the high frequency induction coil and the crystal growth The length in the crystal pulling direction between the upper end of the crucible is A, the length in the crystal pulling direction between the lower end of the high frequency induction coil and the lower end of the crystal growing crucible is B, and Y / X is 2 to 3.5. If so, the single crystal growing method is characterized in that A / B is set in the range of 1.22 to 1.42.
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