|
US5214581A
(en)
*
|
1990-01-17 |
1993-05-25 |
Rhodes Charles K |
Method for object reconstruction from x-ray holograms
|
|
IL119875A
(en)
*
|
1996-12-20 |
1999-12-31 |
Israel State |
Technique for obtaining sub-pixel spatial resolution and corrected energy determinsation from room temperature solid state gamma and x-ray detectors with segmented readout
|
|
EP1795918B1
(en)
*
|
2004-07-06 |
2013-02-27 |
Oy Ajat Ltd. |
High energy, real time capable, direct radiation conversion x-ray imaging system for CD-TE and CD-ZN-TE based cameras
|
|
US8063380B2
(en)
*
|
2004-09-30 |
2011-11-22 |
The Board Of Trustees Of The Leland Stanford Junior University |
Semiconductor crystal high resolution imager
|
|
US7208739B1
(en)
*
|
2005-11-30 |
2007-04-24 |
General Electric Company |
Method and apparatus for correction of pileup and charge sharing in x-ray images with energy resolution
|
|
US20110210262A1
(en)
*
|
2006-06-12 |
2011-09-01 |
Radiation Watch Limited |
Apparatus and method for detecting high-energy radiation
|
|
EP2028509A1
(en)
*
|
2007-08-09 |
2009-02-25 |
European Organisation for Nuclear Research CERN |
Radiation monitoring device
|
|
US7916836B2
(en)
*
|
2007-09-26 |
2011-03-29 |
General Electric Company |
Method and apparatus for flexibly binning energy discriminating data
|
|
CN101750621A
(zh)
*
|
2008-12-08 |
2010-06-23 |
皇家飞利浦电子股份有限公司 |
对来自像素化探测器的测量的评估
|
|
US8466420B2
(en)
*
|
2010-06-04 |
2013-06-18 |
General Electric Company |
Charge loss correction
|
|
ITPI20120060A1
(it)
*
|
2012-05-15 |
2013-11-16 |
Ronaldo Bellazzini |
Sensore radiologico digitale
|
|
JP5914381B2
(ja)
*
|
2013-02-19 |
2016-05-11 |
株式会社リガク |
Ｘ線データ処理装置、ｘ線データ処理方法およびｘ線データ処理プログラム
|
|
WO2014173812A1
(en)
*
|
2013-04-24 |
2014-10-30 |
Koninklijke Philips N.V. |
Pulse processing circuit with correction means
|
|
US9897707B2
(en)
*
|
2014-06-20 |
2018-02-20 |
Bruker Axs, Inc. |
X-ray detector operable in a mixed photon-counting/analog output mode
|
|
CN106796298B
(zh)
*
|
2014-10-24 |
2020-01-21 |
株式会社理学 |
数据处理装置、求取各像素的特性的方法以及数据处理的方法及程序
|
|
WO2016091981A1
(en)
*
|
2014-12-11 |
2016-06-16 |
Koninklijke Philips N.V. |
X-ray detector, imaging apparatus and calibration method
|
|
EP3234649A1
(en)
*
|
2014-12-17 |
2017-10-25 |
Koninklijke Philips N.V. |
Detector and method for detecting ionizing radiation
|
|
US9632186B2
(en)
*
|
2015-05-28 |
2017-04-25 |
General Electric Company |
Systems and methods for sub-pixel location determination
|
|
US9482764B1
(en)
*
|
2015-05-28 |
2016-11-01 |
General Electric Company |
Systems and methods for charge-sharing identification and correction using a single pixel
|
|
JP6454612B2
(ja)
*
|
2015-06-24 |
2019-01-16 |
株式会社リガク |
Ｘ線データ処理装置、その方法およびプログラム
|
|
JP6355598B2
(ja)
*
|
2015-06-24 |
2018-07-11 |
株式会社リガク |
Ｘ線データ処理装置、その方法およびプログラム
|
|
US10809396B2
(en)
|
2015-07-13 |
2020-10-20 |
Koninklijke Philips N.V. |
High energy resolution/high x-ray flux photon counting detector
|
|
JP6644872B2
(ja)
|
2015-08-27 |
2020-02-12 |
コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． |
光子計数装置及び方法
|
|
US11002865B2
(en)
|
2015-11-20 |
2021-05-11 |
Koninklijke Philips N.V. |
Detection values determination system
|
|
US10393891B2
(en)
*
|
2016-05-03 |
2019-08-27 |
Redlen Technologies, Inc. |
Sub-pixel segmentation for semiconductor radiation detectors and methods of fabricating thereof
|
|
US10398394B2
(en)
*
|
2017-01-06 |
2019-09-03 |
General Electric Company |
Energy-discriminating photon-counting detector and the use thereof
|
|
US10162066B2
(en)
*
|
2017-02-06 |
2018-12-25 |
General Electric Company |
Coincidence-enabling photon-counting detector
|
|
US10067240B1
(en)
*
|
2017-03-06 |
2018-09-04 |
Prismatic Sensors Ab |
X-ray detector system based on photon counting
|
|
US10222489B2
(en)
*
|
2017-03-13 |
2019-03-05 |
General Electric Company |
Pixel-design for use in a radiation detector
|
|
US10779778B2
(en)
*
|
2017-05-08 |
2020-09-22 |
General Electric Company |
Reference detector elements in conjunction with an anti-scatter collimator
|
|
US10473798B2
(en)
*
|
2017-06-16 |
2019-11-12 |
Varex Imaging Corporation |
Counting and integrating pixels, detectors, and methods
|
|
TWI661812B
(zh)
*
|
2017-10-24 |
2019-06-11 |
行政院原子能委員會核能硏究所 |
造影系統與造影方法
|
|
US11099141B2
(en)
*
|
2017-10-26 |
2021-08-24 |
Job Corporation |
Method and apparatus for processing photon counting-type X-ray detection data and X-ray apparatus
|
|
US10481285B1
(en)
*
|
2018-08-13 |
2019-11-19 |
General Electric Company |
Systems and methods for determination of depth of interaction
|