JP2021196261A5 - - Google Patents

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Publication number
JP2021196261A5
JP2021196261A5 JP2020102837A JP2020102837A JP2021196261A5 JP 2021196261 A5 JP2021196261 A5 JP 2021196261A5 JP 2020102837 A JP2020102837 A JP 2020102837A JP 2020102837 A JP2020102837 A JP 2020102837A JP 2021196261 A5 JP2021196261 A5 JP 2021196261A5
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JP
Japan
Prior art keywords
noise
noise detection
electric field
potential
unit
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JP2020102837A
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English (en)
Japanese (ja)
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JP7448422B2 (ja
JP2021196261A (ja
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Priority to JP2020102837A priority Critical patent/JP7448422B2/ja
Priority claimed from JP2020102837A external-priority patent/JP7448422B2/ja
Priority to PCT/JP2021/004486 priority patent/WO2021255992A1/ja
Publication of JP2021196261A publication Critical patent/JP2021196261A/ja
Publication of JP2021196261A5 publication Critical patent/JP2021196261A5/ja
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JP2020102837A 2020-06-15 2020-06-15 電解質測定装置 Active JP7448422B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2020102837A JP7448422B2 (ja) 2020-06-15 2020-06-15 電解質測定装置
PCT/JP2021/004486 WO2021255992A1 (ja) 2020-06-15 2021-02-08 電解質測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020102837A JP7448422B2 (ja) 2020-06-15 2020-06-15 電解質測定装置

Publications (3)

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JP2021196261A JP2021196261A (ja) 2021-12-27
JP2021196261A5 true JP2021196261A5 (enExample) 2023-02-14
JP7448422B2 JP7448422B2 (ja) 2024-03-12

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ID=79197644

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JP2020102837A Active JP7448422B2 (ja) 2020-06-15 2020-06-15 電解質測定装置

Country Status (2)

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JP (1) JP7448422B2 (enExample)
WO (1) WO2021255992A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025207965A1 (en) * 2024-03-29 2025-10-02 Beckman Coulter, Inc. Optimization of ion-selective electrode measurement

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63216533A (ja) * 1987-03-05 1988-09-08 テルモ株式会社 生体情報測定装置
JPH0726934B2 (ja) * 1988-02-17 1995-03-29 株式会社クラレ イオン濃度などの測定装置
JPH02236168A (ja) * 1989-03-09 1990-09-19 New Japan Radio Co Ltd 接触型試料採取装置と接触型分析装置
US5220920A (en) * 1991-11-08 1993-06-22 Via Medical Corporation Electrochemical measurement system having interference reduction circuit
JP2006170973A (ja) * 2004-11-18 2006-06-29 Shotaro Oka 測定器
US8673627B2 (en) * 2009-05-29 2014-03-18 Life Technologies Corporation Apparatus and methods for performing electrochemical reactions
JP2011102729A (ja) * 2009-11-10 2011-05-26 Sharp Corp 分析チップ装置、分析チップ装置に用いる化学センサチップ収納アダプター及び分析装置ならびに分析チップ装置を用いた分析方法
EP3035044B1 (en) * 2014-12-19 2018-02-21 Stichting IMEC Nederland A drift compensated ion sensor
JP3212682U (ja) * 2017-06-22 2017-09-28 味の素株式会社 体液受入れ構造体およびそれを有する体液分析装置
JP6890569B2 (ja) * 2018-09-28 2021-06-18 株式会社日立ハイテク 電解質測定装置

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