JP2021176168A - 処理システム - Google Patents
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- 238000012545 processing Methods 0.000 title claims abstract description 92
- 238000012546 transfer Methods 0.000 claims abstract description 146
- 239000000758 substrate Substances 0.000 claims abstract description 58
- 238000000034 method Methods 0.000 claims abstract description 10
- 230000032258 transport Effects 0.000 claims description 83
- 238000012423 maintenance Methods 0.000 description 13
- 230000006870 function Effects 0.000 description 3
- 238000009434 installation Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000009545 invasion Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67184—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the presence of more than one transfer chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67167—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers surrounding a central transfer chamber
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67196—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67775—Docking arrangements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Programme-controlled manipulators
- B25J9/02—Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type
- B25J9/04—Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type by rotating at least one arm, excluding the head movement itself, e.g. cylindrical coordinate type or polar coordinate type
- B25J9/041—Cylindrical coordinate type
- B25J9/042—Cylindrical coordinate type comprising an articulated arm
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- Condensed Matter Physics & Semiconductors (AREA)
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- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
[処理システム1の構成]
図1は、第1の実施形態における処理システム1の構成の一例を示す平面図である。図1では、便宜的に一部の装置の内部の構成要素が透過するように図示されている。処理システム1は、本体10と、本体10を制御する制御装置100とを備える。
図2は、第2の実施形態における処理システム1の構成の一例を示す平面図である。第1の実施形態における真空搬送モジュール11は、平面視において長方形の外形を有するが、本実施形態における真空搬送モジュール11は、平面視において長方形以外の多角形の形状を有する点が第1の実施形態と異なる。なお、以下に説明する点を除き、図2において、図1と同じ符号が付された構成要素は、図1に例示された構成要素と同一または同様の機能を有するため説明を省略する。
図3は、第3の実施形態における処理システム1の構成の一例を示す平面図である。図4は、図3に例示された処理システム1のA−A断面の一例を示す部分断面図である。本実施形態における処理システム1では、複数の大気搬送モジュール14のそれぞれが複数のロードロックモジュール13のそれぞれに接続されている。それぞれの大気搬送モジュール14は、それぞれのロードロックモジュール13との間で基板Wの搬送が可能である。これにより、大気搬送モジュール14およびロードロックモジュール13のメンテナンスが必要になった場合であっても、残りの大気搬送モジュール14およびロードロックモジュール13を用いて基板Wの搬送を継続することができる。なお、以下に説明する点を除き、図3および図4において、図1と同じ符号が付された構成要素は、図1に例示された構成要素と同一または同様の機能を有するため説明を省略する。
図5は、第4の実施形態における処理システム1の構成の一例を示す平面図である。本実施形態における処理システム1は、それぞれの大気搬送モジュール14内に独立して動作する複数の搬送ロボット140aおよび搬送ロボット140bが設けられる点が第1の実施形態における処理システム1とは異なる。これにより、それぞれの大気搬送モジュール14は、搬送ロボット140aおよび搬送ロボット140bの中の1つにメンテナンスが必要になった場合でも、他の1つを用いて基板Wの搬送を継続することができる。なお、以下に説明する点を除き、図5において、図1と同じ符号が付された構成要素は、図1に例示された構成要素と同一または同様の機能を有するため説明を省略する。
なお、本願に開示された技術は、上記した実施形態に限定されるものではなく、その要旨の範囲内で数々の変形が可能である。
G1 ゲートバルブ
G2 ゲートバルブ
G3 ゲートバルブ
W 基板
1 処理システム
10 本体
100 制御装置
110 搬送ロボット
111 ガイドレール
112 側壁
113 側壁
114 側壁
115 側壁
11 真空搬送モジュール
12 処理モジュール
13 ロードロックモジュール
130 リフトピン
131 駆動装置
132 開口部
14 大気搬送モジュール
140 搬送ロボット
141 ガイドレール
15 ロードポート
Claims (7)
- 大気圧よりも低い圧力雰囲気において基板を搬送する真空搬送モジュールと、
前記真空搬送モジュールに接続され、前記基板を処理する複数の処理モジュールと、
前記真空搬送モジュールに接続された複数のロードロックモジュールと、
大気圧雰囲気において前記基板を搬送する複数の大気搬送モジュールであって、それぞれの前記大気搬送モジュールが複数の前記ロードロックモジュールの少なくとも1つに接続された複数の前記大気搬送モジュールと
を備える処理システム。 - 前記真空搬送モジュールは、平面視において多角形の外形を有し、
複数の前記ロードロックモジュールの少なくとも1つは、前記多角形における1つの辺に対応する前記真空搬送モジュールの側壁に接続されており、
複数の前記ロードロックモジュールの少なくとも他の1つは、前記多角形における前記1つの辺とは異なる他の辺に対応する前記真空搬送モジュールの側壁に接続されており、
複数の前記大気搬送モジュールの少なくとも1つは、前記1つの辺に対応する前記真空搬送モジュールの側壁に接続されている前記ロードロックモジュールに接続されており、
複数の前記大気搬送モジュールの少なくとも他の1つは、前記他の辺に対応する前記真空搬送モジュールの側壁に接続されている前記ロードロックモジュールに接続されている請求項1に記載の処理システム。 - 前記真空搬送モジュールは、平面視において長方形の外形を有し、
複数の前記ロードロックモジュールの少なくとも1つは、前記長方形における1つの短辺に対応する前記真空搬送モジュールの側壁に接続されており、
複数の前記ロードロックモジュールの少なくとも他の1つは、前記長方形における前記1つの短辺に対向する他の短辺に対応する前記真空搬送モジュールの側壁に接続されており、
複数の前記大気搬送モジュールの少なくとも1つは、前記1つの短辺に対応する前記真空搬送モジュールの側壁に接続されている前記ロードロックモジュールに接続されており、
複数の前記大気搬送モジュールの少なくとも他の1つは、前記他の短辺に対応する前記真空搬送モジュールの側壁に接続されている前記ロードロックモジュールに接続されている請求項1に記載の処理システム。 - それぞれの前記大気搬送モジュールには、複数の前記基板を収容する容器が接続され、
それぞれの前記大気搬送モジュールは、前記容器内に収容された基板を前記ロードロックモジュール内に搬送し、前記真空搬送モジュールから前記ロードロック内に搬送された前記基板を前記容器内に搬送する請求項1から3のいずれか一項に記載の処理システム。 - それぞれの前記ロードロックモジュールには、複数の前記大気搬送モジュールが接続され、
それぞれの前記大気搬送モジュールは、それぞれの前記ロードロックモジュールとの間で前記基板を搬送可能である請求項1から4のいずれか一項に記載の処理システム。 - 前記大気搬送モジュール内には、前記基板を搬送し、互いに独立して動作する複数の第2の搬送ロボットが配置されている請求項1から5のいずれか一項に記載の処理システム。
- 前記真空搬送モジュール内には、前記基板を搬送し、互いに独立して動作する複数の第1の搬送ロボットが配置されている請求項1から6のいずれか一項に記載の処理システム。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020081331A JP2021176168A (ja) | 2020-05-01 | 2020-05-01 | 処理システム |
CN202110429613.7A CN113594060A (zh) | 2020-05-01 | 2021-04-21 | 处理系统 |
KR1020210054128A KR20210134510A (ko) | 2020-05-01 | 2021-04-27 | 처리 시스템 |
US17/242,736 US20210343559A1 (en) | 2020-05-01 | 2021-04-28 | Processing system |
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JP2020081331A JP2021176168A (ja) | 2020-05-01 | 2020-05-01 | 処理システム |
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US (1) | US20210343559A1 (ja) |
JP (1) | JP2021176168A (ja) |
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US6841006B2 (en) * | 2001-08-23 | 2005-01-11 | Applied Materials, Inc. | Atmospheric substrate processing apparatus for depositing multiple layers on a substrate |
US20070269297A1 (en) * | 2003-11-10 | 2007-11-22 | Meulen Peter V D | Semiconductor wafer handling and transport |
US7431795B2 (en) * | 2004-07-29 | 2008-10-07 | Applied Materials, Inc. | Cluster tool and method for process integration in manufacture of a gate structure of a field effect transistor |
US20140271097A1 (en) * | 2013-03-15 | 2014-09-18 | Applied Materials, Inc. | Processing systems and methods for halide scavenging |
US10328580B2 (en) * | 2013-08-09 | 2019-06-25 | Persimmon Technologies Corporation | Reduced footprint substrate transport vacuum platform |
JP6594304B2 (ja) * | 2013-10-18 | 2019-10-23 | ブルックス オートメーション インコーポレイテッド | 処理装置 |
KR20180075702A (ko) * | 2015-11-23 | 2018-07-04 | 어플라이드 머티어리얼스, 인코포레이티드 | 프로세스 툴에서의 온-보드 메트롤로지(obm) 설계 및 그 영향 |
KR102637922B1 (ko) * | 2016-03-10 | 2024-02-16 | 에이에스엠 아이피 홀딩 비.브이. | 플라즈마 안정화 방법 및 이를 이용한 증착 방법 |
JP2019026465A (ja) | 2017-08-03 | 2019-02-21 | 東京エレクトロン株式会社 | 搬送システム及び基板処理システム |
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- 2020-05-01 JP JP2020081331A patent/JP2021176168A/ja active Pending
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2021
- 2021-04-21 CN CN202110429613.7A patent/CN113594060A/zh active Pending
- 2021-04-27 KR KR1020210054128A patent/KR20210134510A/ko active Search and Examination
- 2021-04-28 US US17/242,736 patent/US20210343559A1/en active Pending
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US20210343559A1 (en) | 2021-11-04 |
CN113594060A (zh) | 2021-11-02 |
KR20210134510A (ko) | 2021-11-10 |
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