JP2021148574A - Estimation device for thickness reduction amount of metallic member and estimation method for thickness reduction amount of metallic member employing the same - Google Patents

Abstract

To provide an estimation device for a thickness reduction amount of a metallic member and an estimation method for the thickness reduction amount of the metallic member, enabling accurate estimation of the thickness reduction amount of the metallic member which is composed of various materials and in which a gas flows on the surface thereof.SOLUTION: There is provided an estimation device for a thickness reduction amount of a metallic member in which a gas flows on a surface thereof. The estimation device for the thickness reduction amount of the metallic member comprises a probe disposed to be flush with the surface of the metallic member. The probe comprises: an insulation base portion constituted of an insulator; a test body for arrangement provided in the insulation base portion; a test body for reference provided in the insulation base portion; and a fixing member fixing the insulation base portion to the surface of the metallic member. The test body for reference and the test body for arrangement are electrically connected in series, and a surface of the insulation base portion, a surface of the test body for arrangement and a surface of the test body for reference are provided to be flush with a surface of the fixing member.SELECTED DRAWING: Figure 1

Description

The present invention relates to an apparatus for estimating the amount of thinning of a metal member and a method for estimating the amount of thinning of a metal member using the apparatus.

The metal conduits installed in the manufacturing plant accurately diagnose the state of corrosion and wear in the metal conduits and estimate the amount of wall loss in order to maintain the safety of the plant and the quality of the products. It is necessary. In particular, in a plant in the sinter manufacturing process in a steel mill, high-temperature gas and special gas are transported through a large number of metal conduits installed in blast furnace equipment, so that the state of corrosion and wear in the conduit is more accurate. It is important to accurately diagnose and estimate the amount of wall loss.

Usually, as a method of grasping the condition inside the metal conduit arranged in the plant, after stopping the plant, a part of the conduit is removed to grasp the condition, or a special camera for in-pipe investigation is introduced. And inspect the condition of the inner wall surface. However, in such a conventional inspection method, it is necessary to stop the operation of the plant every time the inspection is performed so that the inside of the metal conduit can be diagnosed, which causes a decrease in the operation rate of the plant. ..

On the other hand, various methods have been proposed so far as a method for measuring the amount of metal corrosion. Specifically, for example, there is a measurement method in which the amount of corrosion of iron constituting a steel structure such as a bridge, a harbor, or a building, or a structure such as an automobile or a train is measured using an electric resistance type corrosion sensor (). For example, see Patent Document 1).

Japanese Unexamined Patent Publication No. 2016-197102

According to this proposal, the amount of corrosion of the metal material to be evaluated can be measured by an electric resistance type corrosion sensor. However, since this proposal is intended to measure the amount of iron corrosion over a long period of time in an atmosphere at room temperature, it is made of various materials other than iron, and there is a possibility that gas may flow to the surface. It was not possible to accurately diagnose the state of corrosion and wear of metal members such as metal conduits in a certain factory, and it was not applicable to accurate measurement of the amount of wall loss.

The present invention has been made in view of the above circumstances, and it is possible to estimate the amount of wall thinning of a metal member made of various materials through which gas flows on the surface. An object of the present invention is to provide a method for estimating the amount of wall thinning of an apparatus and a metal member.

That is, the apparatus for estimating the wall thinning amount of the metal member and the method for estimating the wall thinning amount of the metal member of the present invention are characterized as follows.

First, it is an estimation device for the amount of wall thinning of a metal member through which gas flows on the surface, and the device for estimating the amount of wall loss of the metal member is a probe arranged flush with the surface of the metal member. The probe includes an insulating base portion made of an insulator, an arrangement test body provided on the insulating base portion, a reference test body provided on the insulating base portion, and the insulating base portion. A fixing member for fixing to the surface of the metal member is provided, and the disposition test piece is made of the same material as the metal member, and is provided so that at least a part thereof is exposed on the surface of the insulating base portion. The reference test piece is a metal material that is made of the same material as the metal member and is entirely sealed inside the insulating base portion. The disposition test pieces are electrically connected in series, and the surface of the insulating base portion, the surface of the disposition test piece, and the surface of the reference test body are surfaces with respect to the surface of the fixing member. It is an estimation device for the amount of wall thinning of a metal member, which is characterized by being provided so as to be one.

Secondly, in the device for estimating the wall thickness reduction of the metal member of the first invention, a power supply device capable of supplying an electric current to each of the disposition test body and the reference test body, and the said device. The arrangement test piece of the probe and the reference test piece are provided with a voltmeter connected so that the voltage of each of the reference test pieces can be measured, and the placement test piece of the probe is flush with the surface of the metal material. It is preferable to dispose of it.

Thirdly, in the device for estimating the wall thickness reduction of the metal member of the first or second invention, the metal member is a metal material of the inner wall surface of the metal hollow body through which gas flows on the inner surface. preferable.

Fourth, in the apparatus for estimating the amount of wall thinning of the metal member of the first to third inventions, the reference test piece is arranged on the upstream side of the disposition test piece with respect to the gas flow. It is preferable that it is provided.

Fifth, in the apparatus for estimating the amount of wall thinning of the metal member of the first to fourth inventions, it is preferable that the heat resistant temperature of the surface of the disposition test piece is in the range of 40 to 400 ° C.

Sixth, in the apparatus for estimating the wall thickness reduction of the metal member of the first to fifth inventions, the surface temperature of the metal member and the temperature of the reference test piece and the arrangement test piece. Is preferably arranged so that the temperature is substantially the same.

Seventh, in the apparatus for estimating the amount of wall thinning of the metal member of the first to sixth inventions, it is preferable that each of the disposition test body and the reference test body is interchangeably provided. ..

Eighth, in the apparatus for estimating the wall thickness reduction of the metal member of the first to seventh inventions, the probe is provided on the insulating base portion together with the arrangement test body and the reference test body. The other disposition test body is provided with another disposition test body and another reference test body provided on the insulation base portion, and the other disposition test body is made of a material different from that of the metal member, and is described as described above. A metal material provided so that at least a part is exposed from the insulating base portion, and the other reference test body is made of a material different from the metal member, and the whole is inside the insulating base portion. The enclosed metal material, the other disposition test body and the other reference test body are made of the same material, and are substantially the same as the disposition test body and the reference test body. It is preferable that the components are arranged under the same conditions as above.

Ninth, in the apparatus for estimating the amount of wall thinning of the metal member of the eighth invention, a plurality of types of the other disposition test bodies having different materials from each other and a plurality of types of the other criteria having different materials from each other. It is preferable that a test piece for use is provided.

Tenth, in the apparatus for estimating the amount of wall thinning of the metal member of the eighth or ninth invention, each of the other disposition test piece and the other reference test piece is interchangeably provided. It is preferable to have.

Eleventh is a method for estimating the amount of wall thinning of a metal member using the apparatus for estimating the amount of wall loss of a metal member according to the first to seventh inventions, wherein the test piece for arrangement and the reference are used. The voltage of each of the disposition test body and the reference test body was measured under the conditions of substantially the same temperature and applied current, and the disposition test was performed from the obtained voltage data. This is a method for estimating the amount of wall thinning of a metal member, which comprises estimating the amount of wall thinning on the surface of the metal member by estimating the thickness of the body.

Twelvely, in the method for estimating the amount of wall thinning of the metal member of the eleventh invention, the arrangement test body and the reference test body, as well as other arrangements of different materials and the same materials, are used. The installation test body and the other reference test body are arranged under substantially the same conditions as the arrangement test body and the reference test body, and the other placement test body and the other reference are provided. The voltage of each test piece is measured, the thickness of the other test piece for arrangement is estimated from the obtained data of each voltage, and the amount of wall thinning on the surface of the other test piece for arrangement is estimated. Is preferable.

According to the present invention, an apparatus for estimating the thinning amount of a metal member and a metal member, which are made of various materials and can estimate the thinning amount of the metal member in which gas may flow to the surface. A method for estimating the amount of wall loss can be provided.

It is a schematic plan view which shows one Embodiment of the probe in the apparatus for estimating the wall thinning amount of the metal member of this invention. It is a schematic cross-sectional view which shows the state which the device for estimating the wall thinning amount of the metal member of this invention is arranged in a metal conduit. It is the schematic which shows one Embodiment of the system configuration by the apparatus for estimating the wall thinning amount of the metal member of this invention. It is a schematic principle diagram which shows one Embodiment of the switching box in the system configuration shown in FIG. It is a schematic plan view which shows the other embodiment of the probe in the apparatus for estimating the wall thinning amount of the metal member of this invention. It is the schematic cross-sectional view of the probe used for <verification 2> and <verification 3>. It is a graph which shows the measurement result of the probe inner wall surface side surface temperature and the probe outer surface side surface temperature when the thickness of a fixing member is changed in <verification 3>.

The estimation device and the estimation method for the wall thinning amount 2 of the metal member of the present invention will be described in detail below based on the drawings. FIG. 1 is a schematic plan view showing an embodiment of a probe in the device for estimating the amount of wall thinning of a metal member of the present invention, and FIG. 2 is a diagram showing a probe in the device for estimating the amount of wall loss of a metal member made of metal. It is a schematic cross-sectional view of the state arranged in a conduit. Further, FIG. 3 is a schematic view showing an embodiment of a system configuration using the device for estimating the amount of wall thinning of the metal member of the present invention.

The wall thinning amount estimating device (hereinafter, abbreviated as the wall thinning amount estimating device 100) of the embodiment shown in FIGS. 2 and 3 is at least flush with the surface of the metal member to be measured. The probe 1 to be arranged is provided. The probe 1 includes an insulating base portion 12 made of an insulator, an arrangement test body 10 provided on the insulating base portion 12, a reference test body 11 provided on the insulating base portion 12, and an insulating base portion 12. A fixing member 16 for fixing to the surface of the metal member is provided. The disposition test body 10 is made of a material of the same quality as the metal member to be measured, and is provided so that at least a part thereof is exposed on the surface of the insulating base portion. The reference test piece 11 is a metal material made of the same material as the metal member to be measured, and the whole is sealed inside the insulating base portion. The reference test body 11 and the arrangement test body 10 are electrically connected in series. Further, the surface of the insulating base portion 12, the surface of the disposition test body 10, and the surface of the reference test body 11 are provided so as to be flush with the surface of the fixing member 16.

Further, the wall thinning amount estimation device 100 of the present embodiment includes a power supply device 3 and a voltmeter 4. Further, the placement test body 10 and the reference test body 11 of the probe 1 are arranged so that the current supplied from the power supply device 3 is applied to each of the placement test bodies 10 substantially in the same manner. And the reference test body 11 are connected in series, and the voltage of each of the arrangement test body 10 and the reference test body 11 is measurable and connected to the voltmeter 4.

Then, according to the method for estimating the amount of wall thinning of the metal member of the present invention (hereinafter, abbreviated as the method for estimating the amount of wall loss), the test body 10 for disposing the probe 1 and the test body 11 for reference are substantially used. Under the same temperature and applied current conditions, the voltage of each of the placement test piece 10 and the reference test piece 11 is measured, and the thickness of the placement test piece 10 is estimated from the obtained voltage data. By doing so, it is characterized in that the amount of wall thinning on the surface of the metal member is estimated.

Here, in the present invention, substantially the same temperature does not have to be exactly the same temperature, and a temperature difference within a range that does not affect the measured value of the voltage is allowed.

In the probe 1 of the present embodiment, in a circuit in which the disposition test body 10 and the reference test body 11 are connected in series, a cable for applying a current is connected to both ends, and the other end of the cable is a metal member 2. It is connected to a power supply device 3 capable of supplying a stable DC current such as a regulated power supply, and is equal to the disposition test body 10 and the reference test body 11 by applying a predetermined current. Is flowing. Further, a cable for voltage measurement is connected to each of the disposition test body 10 and the reference test body 11, and the other end of each cable is pulled out to the outside of the metal member 2 and the voltmeter 4 It is connected to the. As a result, the accurate voltage of each of the disposition test body 10 and the reference test body 11 can be sequentially measured in a state where the same temperature and the same current are applied. Since the cable itself is a resistor for the cable connected to the disposition test body 10 and the reference test body 11, the position to be connected to the voltmeter 4, the material, length, thickness, etc. of the cable are the same. It is desirable to set to.

The probe 1 of the present embodiment shown in FIG. 1 includes four disposition test bodies 10 and four reference test bodies 11 having the same shape, that is, having the same length, width, and thickness. A total of eight disposition test bodies 10 and reference test bodies 11 are connected in series on the back side. Then, one side of the disposition test body 10 is exposed on the surface of the insulating base portion 12 of the insulator, and the reference test body 11 is disposed on the surface of the insulating base portion 12 and is covered with the insulating member 13. It is enclosed so as to. In the present invention, the reference test body 11 is enclosed in the insulation base portion 12 in addition to the case where the entire reference test body 11 is enclosed in the insulation base portion 12, and as described above, the reference test body is sealed. 11 is arranged on the surface of the insulating base portion 12, and the entire surface thereof is covered with the insulating member 13.

Further, in the embodiment of the system configuration shown in FIG. 3, a switching box 5 is provided between the probe 1, the power supply device 3, and the voltmeter 4. The switching box 5 makes it possible to measure the resistance of each set of the disposition test bodies 10 and the reference test body 11 for a plurality of sets of the disposition test bodies 10 and the reference test body 11. Specifically, for example, the switching box 5 having the configuration of the embodiment shown in FIG. 4 can be exemplified. The switching box 5 of the present embodiment has four switches 50 and eight switches 50 for the probe 1 having a configuration in which four sets of the disposition test body 10 and the reference test body 11 are connected in series as shown in FIG. It is a specification of 8 channels by the relay 51, and a predetermined connection can be switched manually or automatically, and the resistance value can be calculated and totaled by the connected voltmeter 4.

Here, in the probe 1 of the present invention, as shown in FIG. 2, the surface of the probe 1 is based on the surface of the insulating base portion 12, the surface of the disposition test body 10, and the surface of the reference test body 11. The surface of the insulating base portion 12, the surface of the disposition test body 10, and the surface of the reference test body 11 are flush with each other. Therefore, when the surface of the probe 1 is arranged so as to be flush with the surface of the metallic material 2, the surface of the insulating base portion 12, the surface of the disposition test body 10, and the surface of the reference test body 11 are arranged. It is flush with the surface of the metal member 2. Thereby, for example, even when the probe 1 is installed in the metal conduit in which the gas moves at high speed, the probe 1 maintains the same physical state as the inner wall surface of the metal conduit without hindering the movement of the gas. This enables more accurate measurement. The probe 1 of the present invention includes an insulating member 13. However, since the insulating member 13 is a thin film or sheet as described later, the insulating member 13 does not hinder the movement of gas and can maintain the same physical state as the inner wall surface of the metal conduit. can. Therefore, in the probe 1 of the present invention, the surface of the probe 1 is substantially flush with the surface of the metallic material 2.

When the probe 1 is arranged at a predetermined position with respect to the metal member 2 under the above conditions, the exposed surface of the arrangement test piece 10 comes into contact with the gas, and therefore, the surface of the metal member 2 with the passage of time. Similarly, wall thinning due to corrosion and wear progresses. On the other hand, since the reference test body 11 enclosed in the insulating base portion 12 by the insulating member 13 is in an environment shielded from the outside, wall thinning due to corrosion or wear does not proceed. The material of the insulating base portion 12 is not particularly limited as long as it can reliably insulate even with a high applied current and is not affected by the gas moving on the surface of the metal member 2. However, in consideration of the high temperature of the gas, those having high heat resistance are preferable. As a specific allowable temperature, a range of 40 to 400 ° C. is considered. As the material of the insulating base portion 12 that meets such conditions, for example, plastic, ceramic, glass, or the like can be used. Among these, heat-resistant plastics can be preferably used from the viewpoint of workability and the like. The insulating base portion 12 can be installed directly on the metal member 2, but as shown in FIG. 2, it can also be installed on the metal member 2 via a fixing member 16 made of metal or the like.

On the other hand, since the surface of the insulating member 13 that covers the reference test body 11 also comes into contact with the gas, it is necessary to select a member that is not affected by the gas moving on the surface of the metal member 2. Further, since it is desirable that the reference test body 11 coated on the insulating member 13 is kept at the same temperature as the disposition test body 10 as much as possible, it is thin and has insulation properties and heat resistance in the range of 40 to 400 ° C. It is considered that it has thermal conductivity as well as having. As the insulating member 13 made of such a material, a material having the same material as the insulating base portion 12 can be used, and a film or sheet made of polytetrafluoroethylene or mica can be preferably used.

Further, in the probe 1 of the wall thinning amount estimation device 100 of the present invention, the reference test body 11 is disposed upstream of the gas flow on the surface of the metal member 2, and the disposition test body 10 is made of metal. The probe 1 is arranged on the metal member 2 so as to be arranged on the downstream side with respect to the gas flow on the surface of the member 2. By arranging the reference test body 11 on the upstream side of the placement test body 10 in this way, even if the surface state of the placement test body 10 changes due to corrosion or wear, the reference test body is used. The temperature change of 11 is less affected. This is because, for example, when the reference test body 11 is arranged on the downstream side of the disposition test body 10, when the surface state of the disposition test body 10 changes due to corrosion or wear, the surface of the metal member 2 is changed. This is because the flow of the moving gas changes, which affects the temperature change of the reference test piece 11. As shown in FIG. 1, it is not necessary to consider the above conditions in the configuration in which the reference test body 11 and the placement test body 10 are arranged in parallel with the gas flow.

Regarding the timing of disposing the probe 1 of the present embodiment, it is desirable to dispose of the probe 1 at the same time as disposing the new metal member 2 from the viewpoint of accurately simulating the thinning of the metal member 2. Further, when the state of the metal member 2 at the start of measurement is good, it can be arranged at a predetermined position with respect to the existing metal member 2.

The principle of the method for estimating the amount of wall thinning using the wall thinning amount estimation device 100 of the present invention is that the electric resistance value changes due to the progress of corrosion and wear of the metal, and is constant as the electric resistance value changes. The basic principle is that the voltage value under the condition of the applied current of is also changed.

By arranging the surface of the probe 1 flush with the surface of the metal material 2, the disposition test body 10 made of substantially the same material as the surface of the metal member 2 is surfaced with respect to the surface of the metal member 2. Arranged in one. Therefore, on the premise that the wall thinning due to the corrosion and wear of the surface of the disposition test body 10 coincides with the wall thinning due to the corrosion and wear of the surface of the metal member 2, the disposition test body 10 is periodically or continuously. In addition to measuring the electrical resistance, that is, the voltage, the electrical resistance, that is, the voltage of the reference test piece 11 having the same material and shape as the disposition test piece 10 placed in a state where it is not corroded or worn, that is, thinned. The thickness of the disposition test piece 10 is estimated from each voltage by measuring under the same conditions as the setting test piece 10. As a result, the thickness reduction amount (thickness reduction amount) of the disposition test piece 10 is estimated as the corrosion amount and the wear amount, and the progress of the wall thinning due to the corrosion and wear of the surface of the metal member 2 from the change with time. Can be estimated. Therefore, it is possible to estimate the amount of wall thinning due to corrosion and wear on the surface of the metal member 2 based on the data on the amount of thickness reduction, and to estimate the progress of wall thinning due to corrosion and wear.

The method for estimating the amount of wall thinning of the present invention can be applied without limitation as long as it is a metal member 2 in which gas flows on the surface. As a metal material in which gas flows on the surface, there is generally a metal member 2 or the like in which a base material arranged in a factory or the like has conductivity, and specifically, high-temperature gas moves on an inner wall surface. , Metal conduits with a circular or square cross section, metal tanks, metal hollow bodies such as melting furnaces, and the like. Applicable materials include, for example, steel, cast iron, copper, zinc, aluminum and alloys containing these, a polyethylene sleeve is provided on the exterior of the metal member 2, and a surface treatment such as coating is applied to the base material. It can also be applied to a metal member 2 made of a metal or alloy, a composite material, or the like. Among these, cast iron structures and carbon steel structures can be mentioned as suitable evaluation targets.

In the method for estimating the amount of wall thinning of the present embodiment, first, the probe 1 is arranged at a predetermined position with respect to the metal member 2 so that the surface of the probe 1 is flush with the surface of the metal member 2. .. Further, the arrangement test body 10 and the reference test body 11 of the probe 1 are substantially the same as the material of the inner wall surface of the metal member 2. If the surface of the metal member 2 is coated with paint or surface-treated, or if the metal member 2 is a composite material made of a plurality of materials, the material composition is the same as that of the metal member 2. The setting test body 10 and the reference test body 11 are used.

For example, when the metal member 2 is a metal conduit, the placement test body 10 is placed in a place where the metal conduit is arranged in a straight line, a curved portion through which gas flows in a complicated manner, or a curved portion. , It can be installed in any place such as a flange part where the diameter of a metal conduit changes.

Further, it is preferable that the metal member 2 is electrically connected to the disposition test body 10 and the reference test body 11. As a result, each has the same potential, and the amount of wall thinning of the metal member 2 can be estimated more accurately. For example, when the metal member 2 is provided with anticorrosion protection, the effectiveness of the electrocorrosion protection can be determined if the disposition test body 10 and the reference test body 11 are electrically connected. ..

The voltage measurement of the disposition test body 10 and the reference test body 11 is not particularly limited as long as each can be performed under the same conditions, but the disposition test body 10 and the reference test body 11 are not particularly limited. It is necessary to measure the voltage at each predetermined interval with the same value of current applied to each.

The magnitude of the current applied to the disposition test body 10 and the reference test body 11 can be appropriately determined according to the size, material, and measurement environment of the disposition test body 10 and the reference test body 11. , Usually 1-10A, preferably 2-5A, more preferably 3A. By setting the applied current as the above condition, the voltage can be measured safely and accurately. The voltage to be measured with the current applied should be measured at the same predetermined intervals for each of the disposition test piece 10 and the reference test piece 11, and the voltage, that is, the temperature at which the electric resistance value is measured. It is important to measure under the same temperature conditions as described above because it changes depending on the temperature.

Further, in the probe 1 of the wall thinning amount estimation device 100 of the present invention, as shown in FIG. 5, the disposition test body 10 and the reference test body 11 are combined with another disposition test body 14 and another reference. The test piece 15 can be arranged under the same conditions as the test piece 10 for placement and the test piece 11 for reference. The other disposition test piece 14 is a metal material that is made of a material different from the metal member to be measured and has at least a part exposed from the insulating base portion. Further, the other reference test body 15 is a metal material that is made of a material different from the metal member to be measured and is entirely enclosed inside the insulating base portion. Further, the other disposition test body 14 and the other reference test body 15 are made of the same material.

According to the probe 1 having the above configuration, the disposition test body 10 and the reference test body 11 and the other disposition test body 14 and the other reference test body 15 are respectively under the same temperature and applied current conditions. The thickness of the disposition test body 10 and the other disposition test bodies 14 can be estimated from the obtained voltage data. As a result, the amount of wall thinning on the surface of the metal member 2 can be estimated, and the conformity of the material of the metal member 2 to the gas can be evaluated. That is, it is possible to evaluate what kind of material is preferable with respect to the characteristics of the gas flowing on the surface of the metal member 2. In the present invention, the conformity evaluation means evaluating whether or not the material of the metal member 2 has resistance to the gas flowing on the surface of the metal member 2.

From the above viewpoint, in the probe 1 of the above embodiment, it is also possible to dispose another disposition test body 14 and another reference test body 15 made of a plurality of types of materials. Thereby, the optimum material can be evaluated and determined from the materials of the plurality of types of the metal member 2. Also in the probe 1 of the present embodiment, the surface of the probe 1 is arranged flush with the surface of the metal member 2, and a reference test is performed on the gas flow on the surface of the metal member 2. The body 11 is arranged on the upstream side of the disposition test body 10, and the other reference test body 15 is arranged on the upstream side of the other disposition test body 14, and further, the metal member 2 From the viewpoint of measurement accuracy, it is also preferable to dispose so that the surface temperature and the temperature of the other reference test body 15 and the other disposition test body 14 are the same.

Further, in the probe 1 of the wall thinning amount estimation device 100 of the present invention, each of the disposition test body 10, the reference test body 11, the other disposition test body 14, and the other reference test body 15 is replaced. It can also be provided if possible. For example, the reference test body 11 and another reference test body 15 can be replaced for maintenance or the like.

Further, with respect to the other disposition test body 14 and the other reference test body 15, when the wall thinning due to corrosion or wear of the other disposition test body 14 progresses rapidly during the measurement, or, etc. When you want to test the material of the above, the disposition test body 10 and the reference test body 11 remain as they are, and only the other disposition test body 14 and the other disposition test body 14 The other reference test piece 15 can be replaced with another material at the same time. This makes it possible to flexibly perform conformity evaluation tests on various materials.

Further, in the method for estimating the amount of wall thinning using the probe 1 of the present embodiment, the voltage data obtained for the disposition test body 10 and the reference test body 11 are wirelessly transmitted by a data transmission device, and the data is transmitted. The voltage data received by the receiving device is accumulated, and the thickness of the estimated disposition test body 10 and the reference test body 11 obtained from the accumulated voltage data can be compared.

Specifically, for example, the other end of the voltage measurement cable connected to each of the disposition test body 10 and the reference test body 11 is connected to a voltmeter 4 having a built-in transmitter capable of transmitting data. , It can be realized by transmitting the measured voltage data and receiving, accumulating, and analyzing the data by a receivable receiving device. Examples of the transmission device include short-range data communication devices such as Bluetooth (registered trademark) and communication devices for wireless LAN. Further, as the receiving device, a mobile device such as a personal computer, a smartphone, or a tablet can be exemplified. By making it possible to transmit the measured voltage data in this way, it is possible to collectively receive the data of a plurality of measurement points at remote locations and analyze them efficiently. Further, by providing the power supply device 3 and the transmission device with a timer function, it is possible to automatically transmit and store data, and it is possible to analyze more efficiently.

In the method for estimating the amount of wall thinning using the wall thinning amount estimation device 100 of the present embodiment, the estimated thickness of the virtual placement test piece 10 is calculated from the voltage data obtained by using the probe 1 and used as a reference. Compare with the thickness of the test piece 11. Then, the estimated thickness reduction amount of the disposition test piece 10 is estimated as the wall thickness reduction amount due to corrosion or wear. Specifically, by substituting the measurement voltage of the placement test body 10 and the reference test body 11 and the initial thickness of the placement test body 10 in the probe 1 for each time into the following equation (1), The thickness of the disposition test piece 10 can be estimated after each time has elapsed.

時間t=0における配設用試験体の測定電圧：V₁(t=0)
時間tにおける配設用試験体の測定電圧：V₁(t)
時間t=0における基準用試験体の測定電圧：V_r(t=0)
時間tにおける基準用試験体の測定電圧：V_r(t)
時間t=0における配設用試験体の厚み：δ(t=0)
時間tにおける配設用試験体の厚み：δ(t)

Measurement voltage of disposition test piece at time t = 0: V ₁ (t = 0)
Measured voltage of the specimen for placement at time t: V ₁ (t)
Measurement voltage of reference specimen at time t = 0: V _r (t = 0)
Measured voltage of reference specimen at time t: V _r (t)
Thickness of specimen for placement at time t = 0: δ (t = 0)
Thickness of specimen for placement at time t: δ (t)

<Verification>
When installing the wall thinning amount estimation device 100 of the present invention, there is a concern about the installation temperature environment of the metal member 2 to be measured. For example, the gas inside the metal conduit as the metal member 2 has a high temperature, but since the outer surface side is an atmospheric environment, it is expected that the temperature will be extremely low depending on the time. In that case, due to the influence of the material characteristics of the insulating base portion 12 of the probe 1 and the fixing member 16 for fixing them, a difference occurs between the temperature of the probe 1 and the temperature on the inner wall surface side of the metal conduit, and an appropriate evaluation cannot be performed. There is concern about the possibility. Therefore, the material characteristics of the insulating base portion 12 and the fixing member 16 in the probe 1 of the present embodiment have been verified below.

<Verification 1>
First, the heat conduction in the case of only the metal member 2 was verified. In the verification, as the assumed metal member 2, a metal conduit having a material of carbon steel and a thickness of 12 mm was used for verification. Table 1 shows the verification conditions and verification results. The heat flux q was calculated using the following equation (1), the outer surface side surface temperature T ₂ was calculated using the following equation (2), and the inner wall surface temperature T ₁ was calculated using the following equation (3). In addition, each symbol of the following formulas (1) to (3) means the symbol of the item shown in Table 1.

As a result of verification 1, it was confirmed that the inner wall surface side surface temperature T ₁ and the outer surface side surface temperature T ₂ were both 90 ° C., and that there was almost no temperature difference.

<Verification 2>
Next, the heat transfer of the insulating base portion 12 in the probe 1 of the embodiment having the cross-sectional structure shown in FIG. 6 was verified. The verification conditions are shown in Table 2 and the results are shown in Table 3. For verification, the material of the insulating base portion 12 was a polytetrafluoroethylene sheet, and the thickness of the probe 1 was the same as the thickness of the metal conduit of 12 mm. Here, the thickness of the probe 1 means the thickness of the probe 1 at the position where the disposition test body 10 is arranged, and specifically, the thickness L ₁ of the disposition test body 10 and the disposition test body 10 are arranged. the thickness L ₂ of the insulating base 12 in a position where use specimen 10 is disposed, the thickness L ₃ of the fixing member 16, is a value obtained by adding. Further, the formula (4) was used for the calculation of the heat flux q, the formula (5) was used for the calculation of _{the outer surface side surface temperature T 2} , and the formula (6) was used for the calculation of _{the inner wall surface side surface temperature T 1.}

(In the formula, L _{1 to} L ₃ mean the thickness of the disposition test piece, the thickness of the insulating base, and the thickness of the fixing member, _{respectively, and κ 1 to κ 3} mean the heat of the disposition test body, respectively. It means the thermal conductivity, the thermal conductivity of the insulating base, and the thermal conductivity of the fixing member.)

As a result of the verification, it was confirmed that the inner wall surface side surface temperature T ₁ was 91 ° C. and the outer surface side surface temperature T ₂ was 89 ° C., and that there was almost no temperature difference.

<Verification 3>
From the results of <Verification 1> and <Verification 2> confirmed above, it was confirmed that the thickness of the probe 1 is almost the same as the surface temperature of the inner wall surface regardless of the thickness of the metal conduit. On the other hand, when the thickness of the fixing member 16 for fixing the insulating base portion 12 changes, the surface temperature of the arrangement test piece 10 may be different from the case where only the metal conduit 2 is used. Therefore, in verification 3, the surface temperature when the thickness of the fixing member 16 was changed was verified.

The thickness of the fixing member 16 was set as the thickness shown in Table 2, and the surface temperature on the inner wall surface side of the probe 1 and the surface temperature on the outer surface side of the probe 1 when the thickness of the fixing member 16 was changed were measured. The measurement result is shown in the graph of FIG. From this graph, it was found that the thickness of any fixing member 16 does not significantly affect the surface temperature in the range where the thickness of the fixing member 16 is up to 20 mm.

From the above verification, according to the probe of the wall thinning amount estimation device 100 of the present invention installed in the metal conduit to be inspected, the surface temperature of the placement test piece is maintained at substantially the same temperature as the surface temperature of the metal conduit. can do. Therefore, it was confirmed that the state of corrosion and wear on the inner surface of the metal conduit was accurately diagnosed, and the amount of wall loss was accurately estimated.

1 Probe 10 Disposition test body 11 Reference test body 12 Insulation base part 13 Insulation member 14 Other disposition test body 15 Other reference test body 16 Fixing member 2 Metal member 3 Power supply device 4 Voltmeter 5 Switching Box 50 Switch 51 Relay 100 Wall thinning amount estimation device

Claims (12)

It is an estimation device for the amount of wall thinning of metal members in which gas flows on the surface.
The device for estimating the wall thinning amount of the metal member includes a probe arranged flush with the surface of the metal member.
The probe has an insulating base portion made of an insulator, an arrangement test body provided on the insulating base portion, a reference test body provided on the insulating base portion, and the insulating base portion made of the metal. It is equipped with a fixing member that is fixed to the surface of the member.
The disposition test piece is a metal material made of the same material as the metal member and provided so that at least a part thereof is exposed on the surface of the insulating base portion.
The reference test piece is a metal material that is made of the same material as the metal member and is entirely sealed inside the insulating base portion.
The reference test piece and the disposition test piece are electrically connected in series.
The surface of the insulating base portion, the surface of the disposition test body, and the surface of the reference test body are made of metal so as to be flush with the surface of the fixing member. A device for estimating the amount of wall thinning of parts. A power supply device capable of supplying an electric current to each of the disposition test piece and the reference test piece,
A voltmeter in which the voltage of each of the disposition test piece and the reference test piece of the probe is measurable is provided.
The apparatus for estimating the amount of wall thinning of a metal member according to claim 1, wherein the disposition test piece of the probe is disposed flush with the surface of the metal material. The apparatus for estimating the amount of wall thinning of a metal member according to claim 1 or 2, wherein the metal member is a metal material for the inner wall surface of a metal hollow body through which gas flows on the inner surface. The metal member according to any one of claims 1 to 3, wherein the reference test body is arranged on the upstream side of the disposition test body with respect to the gas flow. A device for estimating the amount of wall loss. The apparatus for estimating the amount of wall thinning of a metal member according to any one of claims 1 to 4, wherein the heat resistant temperature of the surface of the disposition test piece is in the range of 40 to 400 ° C. Claims 1 to 5, wherein the surface temperature of the metal member and the temperature of the reference test body and the disposition test body are arranged so as to be substantially the same. The apparatus for estimating the amount of wall thinning of a metal member according to any one of the items. The apparatus for estimating the wall thickness reduction of a metal member according to any one of claims 1 to 6, wherein each of the disposition test body and the reference test body is provided interchangeably. .. The probe
Along with the disposition test body and the reference test body, another disposition test body provided on the insulation base portion and another reference test body provided on the insulation base portion are provided.
The other disposition test piece is a metal material made of a material different from the metal member and provided so that at least a part thereof is exposed from the insulating base portion.
The other reference test piece is a metal material that is made of a material different from that of the metal member and is entirely enclosed inside the insulating base portion.
The other disposition test body and the other reference test body are made of the same material, and are arranged under substantially the same conditions as the disposition test body and the reference test body. The apparatus for estimating the amount of wall thinning of a metal member according to any one of claims 1 to 7, wherein the thickness is reduced. The metal product according to claim 8, wherein a plurality of types of the other disposition test bodies having different materials and a plurality of types of the other reference test bodies having different materials are arranged. A device for estimating the amount of wall thinning of parts. The apparatus for estimating the amount of wall thinning of a metal member according to claim 8 or 9, wherein each of the other disposition test piece and the other reference test piece is interchangeably provided. A method for estimating the amount of wall thinning of a metal member using the device for estimating the amount of wall loss of a metal member according to any one of claims 1 to 7.
The voltage of each of the disposition test body and the reference test body was measured under the conditions of substantially the same temperature and applied current for the disposition test body and the reference test body, and each obtained. A method for estimating the amount of wall thinning of a metal member, which comprises estimating the amount of wall thinning on the surface of the metal member by estimating the thickness of the disposition test piece from the voltage data of the above. Along with the disposition test body and the reference test body, another disposition test body and another reference test body having a material different from these and the same material can be used as the disposition test body and the reference. Arranged under substantially the same conditions as the test piece for placement, the voltage of each of the other test piece for arrangement and the other reference test piece was measured, and the other test pieces were obtained from the obtained voltage data. The method for estimating the wall thickness reduction of a metal member according to claim 11, wherein the thickness of the placement test body is estimated, and the wall thickness reduction amount on the surface of the other placement test body is estimated.

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