JP2021073380A - Metal film forming method - Google Patents

Abstract

To provide a metal film forming method capable of filming a metal film excellent in adhesion industrially advantageously, and a metal film formed by the method.SOLUTION: A metal film forming method for forming a metal film on a substrate, comprises: an atomizing step of atomizing a material solution, which is prepared by dissolving or dispersing a metal into an organic solvent containing an oxidizer, a chelate agent or a protonic acid, to generate a mist; a carrier gas supply step of supplying a carrier gas to the mist; a mist supply step of supplying the mist into the substrate by the carrier gasses; and a metal film forming step of causing the mist to thermally react thereby to laminate the metal film partially or wholly on the substrate surface.SELECTED DRAWING: Figure 1

Description

The present invention relates to a metal film forming method useful for forming electrodes of semiconductor devices and the like.

Conventionally, a thin film deposition method or a sputtering method has been used as a method for forming a metal film. For vapor deposition, a vacuum vapor deposition method using an electron beam or a high frequency is often used, and as a sputtering method, plasma is generated using a DC power source or an AC power source, and then plasma is used to generate an anode. A method of sputtering a metal and depositing the metal on the cathode is often used. However, the thin-film deposition and sputtering methods require a vacuum process, which is costly and has problems in increasing the size and mass production.

Further, as a method for forming a metal film, a coating method and the like are also well known. As a coating method, a method of coating a metal paste, drying it, and then firing it is used. However, such a coating method requires a high temperature of 650 ° C. or higher for firing, and is not always satisfactory as a method for forming a metal film. Although an organic metal vapor phase growth method is also known, a high temperature process is required as in the coating method, and sufficient adhesion is not always obtained.

On the other hand, in recent years, an attempt has been made to form a patterned metal film on a substrate by using a paste in which ultrafine particles are dispersed. For example, in Patent Document 1, composite metal ultrafine particles composed of a metal core portion and an organic material coating layer are dispersed in a solvent to prepare a metal paste, and the metal paste is adhered onto an electrode of a semiconductor element and fired at a low temperature. A method of forming an ultrafine particle electrode is known. However, a metal thin film using noble metal ultrafine particles such as Ag and Au does not easily react with a smooth inorganic oxide substrate, so that sufficient adhesion cannot be obtained, and particularly on a thin metal wiring due to an increase in conductivity. When forming the metal plating film, there is a problem that the metal wiring is peeled off from the inorganic oxide substrate by the plating pretreatment or the chemical treatment with the plating solution.

Further, in recent years, the formation of a metal film by the aerosol deposition method has been studied. Patent Document 2 describes a method of forming an electrode or a wiring pattern made of a metal thin film on the substrate by aerosolizing the metal particles and spraying the aerosolized metal particles onto the substrate. No. 3 describes a method of forming an auxiliary electrode made of a metal thin film on the surface of a transparent electrode by an aerosol deposition method. However, according to the aerosol deposition method, the adhesion between the electrode and the substrate is very poor, and it is not particularly suitable for forming a thick film required for the electrode, and a vacuum process is required at the time of film formation. It was not satisfactory because high temperature heat treatment was required after the film.

Japanese Unexamined Patent Publication No. 2001-168141 Japanese Unexamined Patent Publication No. 2011-153329 Japanese Unexamined Patent Publication No. 2013-1298887

An object of the present invention is to provide a method for forming a metal film capable of forming a metal film having excellent adhesion in an industrially advantageous manner, and a metal film formed by the method.

As a result of diligent studies to achieve the above object, the present inventors have obtained a metal oxide when a metal film is formed by a mist CVD method using an organic solvent containing an oxidizing agent, an amine compound or a protonic acid as a solvent. It has been found that a metal film having excellent adhesion can be easily formed, unlike the case where the film is formed.
In addition, after obtaining the above findings, the present inventors have further studied and completed the present invention.

That is, the present invention relates to the following invention.
[1] A metal film forming method for forming a metal film on a substrate.
An atomization step of atomizing a raw material solution in which a metal is dissolved or dispersed in an organic solvent containing an oxidizing agent, an amine compound or a protonic acid to generate mist.
The carrier gas supply process for supplying the carrier gas to the mist, and
A mist supply step of supplying the mist to the substrate by the carrier gas, and
A metal film forming method comprising a metal film forming step of laminating the metal film on a part or all of the surface of the substrate by thermally reacting the mist.
[2] The method for forming a metal film according to the above [1], wherein the organic solvent contains an oxidizing agent.
[3] The metal film forming method according to the above [2], wherein the volume ratio of the oxidizing agent to the organic solvent is in the range of 1:99 to 50:50.
[4] The method for forming a metal film according to the above [2] or [3], wherein the oxidizing agent is water or hydrogen peroxide.
[5] The method for forming a metal film according to the above [1], wherein the organic solvent contains an amine compound.
[6] The method for forming a metal film according to the above [5], wherein the amine compound is a diamine.
[7] The method for forming a metal film according to the above [1], wherein the organic solvent contains a protonic acid.
[8] The method for forming a metal film according to the above [7], wherein the protonic acid is a hydrohalic acid.
[9] The metal film forming method according to any one of [1] to [8], wherein the thermal reaction is carried out at a temperature of 200 ° C. to 650 ° C.
[10] The method for forming a metal film according to any one of [1] to [9], wherein the thermal reaction is carried out in an atmosphere of an inert gas or a reducing gas.
[11] The metal is gold (Au), silver (Ag), platinum (Pt), copper (Cu), iron (Fe), manganese (Mn), nickel (Ni), palladium (Pd), cobalt (Co). ), Rhodium (Rh), Ruthenium (Ru), Chromium (Cr), Molybdenum (Mo), Tungsten (W) and Aluminum (Al). 10] The metal film forming method according to any one of.
[12] The method for forming a metal film according to any one of the above [1] to [11], wherein the organic solvent is alcohol.
[13] Any of the above [1] to [12], wherein the raw material solution is a mixed solution of an organic solvent containing an oxidizing agent, an amine compound or a protonic acid and a metal complex solution or a metal salt solution containing the metal. The method for forming a metal film according to.
[14] A metal film formed by using the metal film forming method according to any one of [1] to [13].
[15] The metal film according to the above [14], which is an electrode.
[16] A semiconductor device comprising the metal film according to the above [15] as an electrode and further provided with at least a semiconductor layer.
[17] A precursor solution of a mist for forming a metal film, which comprises dissolving or dispersing a metal in an organic solvent containing an oxidizing agent, an amine compound or a protonic acid.
[18] The precursor solution of the metal film forming mist according to the above [17], wherein the organic solvent contains an oxidizing agent.
[19] The precursor solution of the metal film forming mist according to the above [18], wherein the volume ratio of the oxidizing agent to the organic solvent is in the range of 1:99 to 50:50.
[20] The precursor solution of the metal film forming mist according to the above [17], wherein the organic solvent contains an amine compound or a protonic acid.

According to the metal film forming method of the present invention, a metal film having excellent adhesion can be formed in an industrially advantageous manner. Further, the metal film of the present invention has excellent adhesion.

It is a block diagram of the mist epitaxy apparatus used in an Example. It is a figure which shows the cross-sectional SEM image in an Example. It is a figure which shows the SEM image of the metal film surface in an Example. It is a schematic block diagram of the mist epitaxy apparatus used in Example 4. FIG. It is a figure which shows the XRD measurement result in an Example. It is a figure which shows the XRD measurement result in an Example. It is a figure which shows the XRD measurement result in an Example. It is a figure which shows the photograph of the metal film surface in an Example.

The metal film forming method of the present invention is a metal film forming method for forming a metal film on a substrate, and is a raw material solution obtained by dissolving or dispersing a metal in an organic solvent containing an oxidizing agent, an amine compound or a protonic acid. The mist is thermally reacted with the atomization step of atomizing the mist to generate mist, the carrier gas supply step of supplying the carrier gas to the mist, the mist supply step of supplying the mist to the substrate by the carrier gas, and the mist. It is characterized by including a metal film forming step of laminating the metal film on a part or all of the surface of the substrate.

In the atomization step, a metal is dissolved or dispersed in an organic solvent containing an oxidizing agent, an amine compound or a protonic acid to prepare a raw material solution, and the raw material solution is atomized to generate mist.

The organic solvent containing an oxidizing agent used in this step (hereinafter, also referred to as “oxidizing agent-containing organic solvent”) is not particularly limited as long as the organic solvent contains an oxidizing agent, and for example, oxidation with a known organic solvent. Obtained by mixing with an agent. The volume ratio of the oxidizing agent to the organic solvent is preferably in the range of 1:99 to 50:50, more preferably in the range of 1:99 to 40:60, and is preferably in the range of 1:99 to 40:60. It is even more preferably in the range of 10:90, most preferably in the range of 1:99 to 5:95. By setting such a preferable range, the mist can be made more suitable for film formation and the film quality can be made better.

Examples of the oxidizing agent include water and known water-soluble or water-insoluble oxidizing agents. In the present invention, the oxidizing agent is preferably water or a water-soluble oxidizing agent, and water is preferable. Alternatively, hydrogen peroxide is more preferable, and water is most preferable. When a water-soluble oxidizing agent is used as the oxidizing agent, it is preferable to mix it with water and use it in the form of an aqueous solution (for example, hydrogen peroxide solution).

More specifically, the oxidizing agent includes, for example, water, hydrogen peroxide (H ₂ O ₂ ), sodium peroxide (Na ₂ O ₂ ), barium peroxide (BaO ₂ ), and benzoyl peroxide (C _6). Examples thereof include peroxides such as H ₅ CO) ₂ O ₂ and organic peroxides such as hypochlorous acid (HClO), perchloric acid, nitric acid, peracetic acid and nitrobenzene.

More specifically, the water includes pure water, ultra-pure water, tap water, well water, mineral spring water, mineral water, hot spring water, spring water, fresh water, seawater, and the like. Purified, heated, sterilized, filtered, ion exchange, electrolysis, osmotic pressure adjustment, buffered water (eg ozone water, purified water, hot water, ion exchange water, physiological saline, phosphate buffer) , Phosphorus buffered physiological saline, etc.) is also included as an example.

The organic solvent is not particularly limited as long as the object of the present invention is not impaired, and such a solvent includes, for example, alcohol (eg, methanol, ethanol, propanol, isopropanol, butanol, tert-butanol, etc.), ether (eg, methanol, ethanol, propanol, isopropanol, butanol, tert-butanol, etc.). Examples, dioxane, tetrahydrofuran, diethyl ether, tert-butyl methyl ether, diisopropyl ether, ethylene glycol-dimethyl ether, etc.), esters (eg, ethyl formate, ethyl acetate, n-butyl acetate, etc.), carboxylic acids (eg, formate, acetate). , Propionic acid, etc.), halogenated hydrocarbons (eg, dichloromethane, chloroform, carbon tetrachloride, trichloroethylene, 1,2-dichloroethane, chlorobenzene, etc.), hydrocarbons (eg, n-hexane, benzene, toluene, etc.), amides (Example, formamide, N, N-dimethylformamide, N, N-dimethylacetamide, etc.), ketones (eg, acetone, methyl ethyl ketone, methyl isobutyl ketone, etc.), nitriles (eg, acetonitrile, propionitrile, etc.), sulfolanes, Examples thereof include a single solvent such as hexamethylphosphoramide or a mixed solvent thereof. In the present invention, the organic solvent is preferably an alcohol, a ketone or a mixed solvent thereof, more preferably an alcohol, and most preferably a lower alcohol (preferably C1 to 3).

The organic solvent containing an amine compound used in this step (hereinafter, also referred to as "amine compound-containing organic solvent") is not particularly limited as long as the amine compound is contained in the organic solvent, and for example, known organic solvents and amines. Obtained by mixing with a compound. The blending ratio of the amine compound and the organic solvent is preferably in the range of 0.001 mol / L to 10 mol / L of the amine compound in the organic solvent, and 0.005 mol / L to 1 It is more preferably in the range of mol / L, and most preferably in the range of 0.01 mol / L to 0.1 mol / L. By setting such a preferable range, the mist can be made more suitable for film formation and the film quality can be made better.

The amine compound is not particularly limited as long as it does not interfere with the object of the present invention, and may be a compound containing an oxygen atom, a sulfur atom, a nitrogen atom and the like. Examples of the amine compound include methylamine, ethylamine, propylamine, isopropylamine, n-butylamine, isobutylamine, sec-butylamine, t-butylamine, hexylamine, 2-methoxyethylamine, 2-ethoxyethylamine and 3-methoxy. Propylamine, 3-methylthiopropylamine, ethylenediamine, propylenediamine, butylenediamine, hexamethylenediamine, diethylenetriamine, triethylenetetramine, tetraethylenepentamine, iminobispropylamine, methyliminobispropylamine, lauryliminobispropylamine, N , N'-bisaminopropyl-1,3-propylenediamine, N, N'-bisaminopropyl-1,3-butylenediamine, 1,2-diaminopropane, bis- (3-aminopropyl) ether, bis- (3-Aminopropoxy) ethane, 1,3 bis- (3-aminopropoxy) -2,2-dimethylpropane, N-laurylpropylenediamine, N, N'-di-t-butylethylenediamine, N-methylethylenediamine, An aliphatic compound having C1 to C16 carbon atoms such as N-ethylethylenediamine, N, N-dimethylethylenediamine, and allylamine; cyclopentylamine, cyclohexylamine, cycloheptylamine, cyclooctylamine, aminomethylcyclohexane, 4-methylcyclohexylamine. , 1-Cyclohexylethylamine, 3,3,5-trimethylcyclohexylamine, isophoronediamine, bisaminomethylcyclohexane and other alicyclic compounds having C1-C16 carbon atoms; benzylamine, phenethylamine, 4-methylbenzylamine , N-aminopropylaniline, 2-amino-1,2-diphenylethanol, 9-aminofluorene, benzhydrylamine, xylylene diamine, phenylenediamine, diaminodiphenylmethane, N-benzylethylenediamine, 2-aminopyridine, 3-amino Pyridine, 4-aminopyridine, 2,3-diaminopyridine, 2,5-diaminopyridine, 2,3,6-triaminopyridine, N-aminopropylaniline, 2-amino-3-methylpyridine, 2-amino- 4-Methylpyridine, 2-amino-6-methylpyridine, 2-amino-3-ethylpyridine, 2-amino-3-propylpyridine, 2-amino-4,6-dimethylpi Aromatic compounds having C1-C16 carbon atoms such as lysine, 2,6-diamino-4-methylpyridine, 3-amino-6-isopropylpyridine, 2,6-diaminopyridine; piperazine, N-aminopropyl piperazine, 2-Methylpiperazin, 2,6-dimethylpiperazin, 2,5-dimethylpiperazin, 3-methylaminopiperidin, 2-aminomethylpiperazine, 3-aminopyrrolidin, homopiperazin, N-aminopropylpiperazin, 1,4-( Bisaminopropyl) piperazine, N-aminoethyl piperidine, N-aminopropyl piperidine, 2-aminomethyl piperidine, 4-aminomethyl piperidine, furfurylamine, tetrahydrofurfurylamine, 3- (methylamino) pyrrolidine, 5-methylfurfurylamine , 2- (Fulfurylthio) ethylamine, 2-picorylamine, 3-picorylamine, 4-picorylamine and other heterocyclic compounds having C1-C16 carbon atoms; 2-hydroxyethylamine, methyl (2-hydroxyethyl) amine , 1-amino-2-propanol, 3-amino-1-propanol, 2-amino-1-propanol, 1-amino-2-propanol, diethanolamine, 3-amino-1,2-propanediol, 2- (2) Examples thereof include compounds having one or more hydroxyl groups such as −aminoethoxy) ethanol, N- (2-hydroxyethyl) ethylenediamine, and 2-amino-1,3-propanediol. In the present invention, the amine compound is preferably a polyamine, more preferably a diamine. Examples of the polyamine include aliphatic polyamines such as ethylenediamine, diethylenetriamine, triethylenetetramine, tetraethylenepentamine, polyoxypropylenediamine, and polyoxypropylenetriamine; isophoronediamine, mensendiamine, and bis (4-amino-). 3-Methyldicyclohexyl) methane, diaminodicyclohexylmethane, bis (aminomethyl) cyclohexane, N-aminoethylpiperazine, 3,9-bis (3-aminopropyl) -2,4,8,10-tetraoxaspiro (5. 5) Alicyclic polyamines such as undecane; m-phenylenediamine, p-phenylenediamine, trilen-2,4-diamine, trilen-2,6-diamine, mesitylen-2,4-diamine, mesitylen-2,6- Mononuclear polyamines such as diamine, 3,5-diethyltrilen-2,4-diamine, 3,5-diethyltrilen-2,6-diamine; biphenylenediamine, 4,4-diaminodiphenylmethane, 2,5-naphthic Aromatic polyamines such as diamines and 2,6-naphthylenediamines; imidazoles such as 2-aminopropyl imidazole and the like can be mentioned.

The organic solvent used for the amine compound-containing organic solvent is not particularly limited as long as the object of the present invention is not impaired, and examples of such a solvent include alcohols (eg, methanol, ethanol, propanol, isopropanol, butanol, tert). -Butanol etc.), ethers (eg dioxane, tetrahydrofuran, diethyl ether, tert-butyl methyl ether, diisopropyl ether, ethylene glycol-dimethyl ether etc.), esters (eg ethyl formate, ethyl acetate, n-butyl acetate etc.), carboxylic Acids (eg, formic acid, acetic acid, propionic acid, etc.), halogenated hydrocarbons (eg, dichloromethane, chloroform, carbon tetrachloride, trichloroethylene, 1,2-dichloroethane, chlorobenzene, etc.), hydrocarbons (eg, n-hexane, etc.) Examples thereof include a single solvent such as benzene (benzene, toluene, etc.), a ketone (eg, acetone, methyl ethyl ketone, methyl isobutyl ketone, etc.) or a mixed solvent thereof. In the present invention, the organic solvent is preferably an alcohol, a ketone or a mixed solvent thereof, more preferably an alcohol, and most preferably a lower alcohol (preferably C1 to 3).

The organic solvent containing a protonic acid used in this step (hereinafter, also referred to as “proton acid-containing organic solvent”) is not particularly limited as long as the organic solvent contains a protonic acid, and for example, a known organic solvent and protons. Obtained by mixing with an acid. The blending ratio of the protonic acid and the organic solvent is preferably in the range of 0.001 mol / L to 10 mol / L of the protonic acid in the organic solvent, and 0.005 mol / L to 1 It is more preferably in the range of mol / L, and most preferably in the range of 0.01 mol / L to 0.1 mol / L. By setting such a preferable range, the mist can be made more suitable for film formation and the film quality can be made better.

The protonic acid is not particularly limited as long as it does not interfere with the object of the present invention, and may be known. Examples of the protonic acid include inorganic acids such as hydrochloric acid, sulfuric acid, nitric acid, phosphoric acid, bohydrofluoric acid, hydrofluoric acid and perchloric acid, organic carboxylic acids, phenols and organic sulfonic acids. .. Further, examples of the organic carboxylic acid include formic acid, acetic acid, oxalic acid, benzoic acid, phthalic acid, maleic acid, fumaric acid, malonic acid, tartaric acid, citric acid, lactic acid, succinic acid, monochloroacetic acid, dichloroacetic acid and trichloroacetic acid. , Trifluoroacetic acid, nitroacetic acid, triphenylacetic acid and the like. Examples of the organic sulfonic acid include alkylbenzene sulfonic acid, alkylnaphthalene sulfonic acid, alkylnaphthalenedisulfonic acid, naphthalenesulfonic acid formarin polycondensate, melamine sulfonic acid formarin polycondensate, naphthalenedisulfonic acid, naphthalenetrisulfonic acid and dinaphthylmethane. Examples thereof include disulfonic acid, anthraquinone sulfonic acid, anthraquinone disulfonic acid, anthracene sulfonic acid and pyrene sulfonic acid. Moreover, these metal salts can also be used. In the present invention, the protonic acid is preferably an inorganic acid, more preferably a hydrohalic acid. Examples of the hydrohalic acid include hydrochloric acid, hydrobromic acid, hydroiodic acid, hydrofluoric acid and the like.

The organic solvent used for the protonic acid-containing organic solvent is not particularly limited as long as the object of the present invention is not impaired, and examples of such a solvent include alcohols (eg, methanol, ethanol, propanol, isopropanol, butanol, tert). -Butanol etc.), ethers (eg dioxane, tetrahydrofuran, diethyl ether, tert-butyl methyl ether, diisopropyl ether, ethylene glycol-dimethyl ether etc.), esters (eg ethyl formate, ethyl acetate, n-butyl acetate etc.), ketones (Example, acetone, methyl ethyl ketone, methyl isobutyl ketone, etc.) and the like alone or a mixed solvent thereof and the like can be mentioned. In the present invention, the organic solvent is preferably an alcohol, a ketone or a mixed solvent thereof, more preferably an alcohol, and most preferably a lower alcohol (preferably C1 to 3).

The metal used in this step is not particularly limited as long as it does not interfere with the object of the present invention, but is not limited to gold (Au), silver (Ag), platinum (Pt), copper (Cu), iron (Fe), and manganese (Mn). ), Nickel (Ni), Palladium (Pd), Cobalt (Co), Rhodium (Rh), Ruthenium (Ru), Chromium (Cr), Molybdenum (Mo), Tungsten (W) and Aluminum (Al) 1 It is preferably a seed or two or more metals.

In this step, the metal is dissolved or dispersed in the oxidizing agent-containing organic solvent, the amine compound-containing organic solvent, or the protonic acid-containing organic solvent to prepare a raw material solution. The raw material solution is not particularly limited as long as the metal is dissolved or dispersed in an oxidizing agent-containing organic solvent, an amine compound-containing organic solvent, or a protonic acid-containing organic solvent. It is preferably a mixed solution of an organic solvent containing an amine compound or a protonic acid and a metal complex solution or a metal salt solution containing the metal.
The mixing ratio of the metal is not particularly limited, but is preferably 0.01 to 70% by mass, more preferably 0.1 to 50% by mass, based on the entire raw material solution.

The raw material solution obtained by dissolving or dispersing a metal in an organic solvent containing an oxidizing agent, an amine compound or a protonic acid is particularly useful as a precursor solution of a mist for forming a metal film.

In this step, the raw material solution is atomized to generate mist. The atomizing means is not particularly limited as long as the raw material solution can be atomized, and may be a known atomizing means, but in the present invention, the atomizing means using ultrasonic waves is preferable.

In the carrier gas supply step, the carrier gas is supplied to the mist. The type of carrier gas is not particularly limited as long as the object of the present invention is not impaired, and for example, an inert gas such as oxygen, nitrogen or argon, or a reducing gas such as hydrogen gas or forming gas is a preferable example. Be done. Further, the type of the carrier gas may be one type, but may be two or more types, and a diluted gas having a changed carrier gas concentration (for example, a 10-fold diluted gas) or the like is used as the second carrier gas. It may be used further. Further, the carrier gas may be supplied not only at one location but also at two or more locations.

In the mist supply step, the mist is supplied to the substrate by the carrier gas. The flow rate of the carrier gas is not particularly limited, but is preferably 0.01 to 20 L / min, and more preferably 1 to 10 L / min.

The substrate is not particularly limited as long as it can support the metal film. The material of the substrate is not particularly limited as long as it does not impair the object of the present invention, and may be a known substrate, an organic compound, or an inorganic compound. Examples of the shape of the substrate include plate-like, fibrous, rod-like, columnar, prismatic, tubular, spiral, spherical, and ring-shaped, such as flat plates and disks. A substrate is preferred.

The substrate is not particularly limited as long as it has a plate shape and serves as a support for the film. It may be an insulator substrate, a semiconductor substrate, or a conductive substrate, but the substrate is preferably an insulator substrate, and is a substrate having a metal film on the surface. It is also preferable to have it. In the present invention, it is also preferable that the substrate is a substrate containing a crystal having a corundum structure as a main component or a substrate containing a crystal having a β-gaul structure as a main component. The substrate containing a crystal having a corundum structure as a main component is not particularly limited as long as it contains 50% or more of a crystal having a corundum structure in terms of the composition ratio in the substrate, but in the present invention, it is 70% or more. It is preferably contained, and more preferably 90% or more. Examples of the substrate containing a crystal having a corundum structure as a main component include a sapphire substrate (eg, a c-plane sapphire substrate) and an α-type gallium oxide substrate. The substrate containing a crystal having a β-gaul structure as a main component is not particularly limited as long as it contains 50% or more of a crystal having a β-gaul structure in terms of the composition ratio in the substrate, but in the present invention, it is not particularly limited. , 70% or more is preferable, and 90% or more is more preferable. Examples of the substrate containing a crystal having a β-Gaul structure as a main component include a β-Ga ₂ O ₃ substrate or a Ga ₂ O ₃ and Al ₂ O ₃ and Al ₂ O ₃ is more than 0 wt% and 60 wt. % Or less, such as a mixed crystal substrate. Examples of other base substrates include substrates having a hexagonal structure (eg, SiC substrate, ZnO substrate, GaN substrate) and the like. It is preferable to form a film on the substrate having a hexagonal structure directly or via another layer (eg, a buffer layer). The thickness of the substrate is not particularly limited in the present invention, but is preferably 50 to 2000 μm, and more preferably 200 to 800 μm.

In the metal film forming step, the mist is thermally reacted to laminate the metal film on a part or all of the surface of the substrate. The thermal reaction may be such that the mist reacts with heat, and the reaction conditions and the like are not particularly limited as long as the object of the present invention is not impaired. In this step, the thermal reaction is preferably carried out at a temperature of 200 ° C. to 650 ° C., more preferably 300 ° C. to 600 ° C., and most preferably 400 ° C. to 550 ° C. .. Further, the thermal reaction is preferably carried out in a non-oxygenic atmosphere, more preferably in an atmosphere of an inert gas such as nitrogen gas or argon gas, or a reducing gas such as forming gas or hydrogen gas, and is inert. Most preferably, it is performed in a gas atmosphere. Further, the reaction may be carried out under any conditions of pressurization, reduced pressure, normal pressure and atmospheric pressure, but in the present invention, it is preferably carried out under normal pressure or atmospheric pressure. The film thickness can be set by adjusting the film formation time, but in the present invention, the film thickness is excellent even if the film is thickened, so it is preferable to set the film thickness longer. .. The film formation time is preferably 10 minutes or more, more preferably 30 minutes or more, and most preferably 1 hour or more.

According to the present invention, it is unclear whether or not the crystal can grow intermittently, but in any case, a metal film having excellent adhesion can be formed. Further, according to the present invention, a metal film having a film thickness of 200 nm or more (preferably a metal film having a film thickness of 300 nm or more, more preferably 500 nm or more, still more preferably 1 μm or more, and most preferably 10 μm or more, while maintaining excellent adhesion. The film) can be easily formed. Therefore, the metal film obtained by the metal film forming method of the present invention is useful for an electrode or a contact layer, and such a metal film is also included in the present invention, and the metal film of the present invention is used as an electrode or a contact layer. be able to. Further, the electrode made of the metal film of the present invention is useful for a semiconductor device, and is used in a semiconductor device together with at least a semiconductor layer.

Examples of the semiconductor layer include an oxide semiconductor layer, a nitride semiconductor layer, and a silicon-containing semiconductor layer. The oxide semiconductor layer is preferably a semiconductor layer containing an oxide semiconductor containing one or more elements selected from indium, aluminum and gallium as a main component. The nitride semiconductor layer is preferably a semiconductor layer containing a nitride semiconductor containing one or more elements selected from indium, aluminum and gallium as a main component. The silicon-containing semiconductor layer is preferably a semiconductor layer containing silicon or silicon carbide as a main component.

The metal film of the present invention can be used for various purposes like a conventional metal film, and is useful for various semiconductor devices as an electrode or a contact layer, and is particularly useful for a power device. Further, the semiconductor device is classified into a horizontal element (horizontal device) in which electrodes are formed on one side of the semiconductor layer and a vertical element (vertical device) in which electrodes are provided on both front and back sides of the semiconductor layer. However, the metal film of the present invention can be suitably used for both horizontal devices and vertical devices. In the present invention, it is preferable to use the metal film as an electrode in a vertical device.

Examples of the semiconductor device include a Schottky barrier diode (SBD), a metal semiconductor field effect transistor (MESFET), a high electron mobility transistor (HEMT), a metal oxide film semiconductor field effect transistor (MOSFET), and an electrostatic induction transistor (MSFET). SIT), junction field effect transistor (JFET), insulated gate bipolar transistor (IGBT), light emitting diode and the like. In the present invention, the semiconductor device is preferably an SBD, MOSFET, SIT, JFET or IGBT, and more preferably an SBD, MOSFET or SIT.

The semiconductor device may further include other layers (for example, an insulator layer, a semi-insulator layer, a conductor layer, a semiconductor layer, a buffer layer, or another intermediate layer).

The mist epitaxy apparatus 19 used in this embodiment will be described with reference to FIG. The mist epitaxy device 19 of FIG. 1 has a susceptor 21 on which the substrate 20 is placed, a carrier gas supply means 22a for supplying the carrier gas, and a flow rate adjustment for adjusting the flow rate of the carrier gas sent out from the carrier gas supply means 22a. A valve 23a, a carrier gas (diluted) supply means 22b for supplying a carrier gas (diluted), a flow control valve 23b for adjusting the flow rate of the carrier gas sent out from the carrier gas (diluted) supply means 22b, and a raw material solution. A supply pipe 27 composed of a mist generation source 24 in which 24a is housed, a container 25 in which water 25a is stored, an ultrasonic vibrator 26 attached to the bottom surface of the container 25, and a quartz tube having an inner diameter of 40 mm, and a supply pipe 27. It is provided with a heater 28 installed in the peripheral portion of the. The susceptor 21 is made of quartz, and the surface on which the substrate 20 is placed is inclined from the horizontal plane. By making both the supply tube 27 and the susceptor 21 serving as the film forming chamber from quartz, it is possible to prevent impurities derived from the apparatus from being mixed into the film formed on the substrate 20.

As a raw material solution, a solution in which rhodium acetylacetonate (0.01 mol / L) was put in a mixed solvent of methanol and water (methanol: water = 9.5: 0.5) and dispersed was used. A c-plane sapphire was used as the substrate. Nitrogen was used as the carrier gas. The flow rate of the carrier gas was set to 5 L / min, and the flow rate of the carrier gas (dilution) was set to 0.5 L / min. The film formation was carried out at 500 ° C. under a nitrogen atmosphere.
It was confirmed by using an X-ray diffractometer that a rhodium metal film was formed on the obtained metal film. In addition, the film thickness of the obtained rhodium film was measured with a cross-sectional SEM. As a result, it was about 11.7 μm. The cross-sectional SEM image is shown in FIG.
In addition, the surface of the metal film was observed using SEM. As a result, it had a clean surface with few irregularities. The SEM image of the surface of the metal film is shown in FIG.
Further, regarding the adhesion, stress was applied and the peeling state was visually observed, but peeling and the like did not occur at all, and the adhesion was also excellent.

A metal film was formed in the same manner as in Example 1 except that the mixing ratio (volume ratio) of water and methanol was set to the ratio shown in Table 1, the film formation state was observed, and the adhesion was further evaluated. The results are shown in Table 1.

A metal film was formed in the same manner as in Example 1 except that aluminum acetylacetonate was used instead of rhodium acetylacetonate. It was found that aluminum can also form a film in the same manner as rhodium.

1. 1. In the film forming apparatus Example 4, the mist epitaxy apparatus 1 shown in FIG. 4 was used instead of the mist epitaxy apparatus 19 used in Example 1. Hereinafter, the mist CVD apparatus 1 used in the fourth embodiment will be described with reference to FIG. The mist CVD apparatus 1 includes a carrier gas source 2a for supplying a carrier gas, a flow control valve 3a for adjusting the flow rate of the carrier gas sent out from the carrier gas source 2a, and a carrier gas (diluted) for supplying the carrier gas (diluted). The diluting) source 2b, the flow control valve 3b for adjusting the flow rate of the carrier gas (diluting) sent out from the carrier gas (diluting) source 2b, the mist generation source 4 containing the raw material solution 4a, and the water 5a In the container 5, the ultrasonic vibrator 6 attached to the bottom surface of the container 5, the film forming chamber 7, the supply pipe 9 connecting the mist generation source 4 to the film forming chamber 7, and the film forming chamber 7. It includes an installed hot plate 8 and an exhaust port 11 for discharging mist, droplets, and exhaust gas after a thermal reaction. The substrate 10 is installed on the hot plate 8.

2. Preparation of raw material solution Copper acetylacetonate is mixed with methanol so that the amount of copper acetylacetonate is 0.05 mol / L, and ethylenediamine as a chelating agent is added to 0.5% by volume in the mixed solution. Addition was made to prepare a raw material solution 4a.

3. 3. Preparation for film formation 2. The raw material solution 4a obtained in 1 above was housed in the mist source 4. Next, using a glass substrate as the substrate 10, the glass substrate was placed on the hot plate 8 and the hot plate 8 was operated to raise the temperature in the film forming chamber 7 to 500 ° C. Next, the flow control valves 3a and 3b are opened, the carrier gas is supplied into the film forming chamber 7 from the carrier gas supply means 2a and 2b which are the carrier gas sources, and the atmosphere of the film forming chamber 7 is sufficiently filled with the carrier gas. After the replacement, the flow rate of the carrier gas was adjusted to 5.0 L / min, and the flow rate of the carrier gas (dilution) was adjusted to 0.5 L / min. Nitrogen was used as the carrier gas.

4. Formation of metal film Next, the ultrasonic vibrator 6 was vibrated at 2.4 MHz, and the vibration was propagated to the raw material solution 4a through water 5a to atomize the raw material solution 4a and generate mist 4b. .. The mist 4b is introduced into the film forming chamber 7 by the carrier gas through the supply pipe 9, and the mist thermally reacts in the film forming chamber 7 at 400 ° C. under atmospheric pressure to cause the substrate 10 to react. A copper film was formed on top. The film formation time was 30 minutes. The copper film was confirmed using an X-ray measuring device. The XRD measurement result is shown in FIG. The film thickness was 200 nm. Moreover, when the adhesion was evaluated in the same manner as in Example 1, it was good.

A copper film was obtained in the same manner as in Example 4 except that the film formation temperature was set to 500 ° C. instead of 400 ° C. The copper film was confirmed using an X-ray measuring device. The XRD measurement result is shown in FIG. The film thickness was 925 nm. Moreover, when the adhesion was evaluated in the same manner as in Example 1, it was good.

Copper acetylacetonate is mixed with methanol so that the amount of copper acetylacetonate is 0.05 mol / L, and hydrochloric acid is added as a protonic acid so as to be 0.25% by volume in the mixed solution. A solution was prepared. A copper film was obtained in the same manner as in Example 4 except that this raw material solution was used in place of the raw material solution 4a of Example 4. The copper film was confirmed using an X-ray measuring device. The XRD measurement result is shown in FIG. The film thickness was 799 nm. Moreover, when the adhesion was evaluated in the same manner as in Example 1, it was good.

When the chelating agent was used as in Examples 4 and 5, the gloss of the metal film was better. For reference, a surface photograph of the copper film obtained in Example 5 is shown in FIG. Further, when the protonic acid was used as in Example 6, the film formation rate was better.

The metal film forming method of the present invention can be used in all fields such as semiconductors (for example, compound semiconductor electronic devices, etc.), electronic parts / electrical equipment parts, optical / electrophotographic related devices, industrial parts, etc., but forms excellent electrodes. Therefore, it is particularly useful for manufacturing semiconductor devices.

1 Mist epitaxy device 2a Carrier gas source 2b Carrier gas (dilution) source 3a Flow control valve 3b Flow control valve 4 Mist generation source 4a Raw material solution 4b Mist 5 Container 5a Water 6 Ultrasonic transducer 7 Formation chamber 8 Hot plate 9 Supply Tube 10 Board 11 Exhaust port 19 Mist epitaxy device 20 Board 21 Suceptor 22a Carrier gas supply means 22b Carrier gas (dilution) supply means 23a Flow control valve 23b Flow control valve 24 Mist source 24a Raw material solution 25 Container 25a Water 26 Ultrasonic vibration Child 27 Supply pipe 28 Heater 29 Exhaust port

Claims (14)

A metal film forming method for forming a metal film on a substrate.
And an organic solvent containing at least amine compound, and a metal is dissolved or dispersed in the organic solvent, and this raw material solution was atomized to generate a mist comprising,
By supplying a carrier gas to the mist, and this supplies the mist to the substrate,
The mist by thermal reaction, including and a forming child said metal film on at least part of the substrate surface, gold Shokumaku forming method. The metal film forming method according to claim 1, wherein the organic solvent contains an oxidizing agent. The metal film forming method according to claim 1 or 2, wherein the amine compound is a polyamine. The metal film forming method according to any one of claims 1 to 3 , wherein the thermal reaction is carried out at a temperature of 200 ° C. to 650 ° C. The metal film forming method according to any one of claims 1 to 4 , wherein the thermal reaction is carried out in an atmosphere of an inert gas or a reducing gas. The metals are gold (Au), silver (Ag), platinum (Pt), copper (Cu), iron (Fe), manganese (Mn), nickel (Ni), palladium (Pd), cobalt (Co), rhodium. (Rh), ruthenium (Ru), chromium (Cr), molybdenum (Mo), to any one of claims 1 to 5 which is one or more metals selected from tungsten (W) and aluminum (Al) The method for forming a metal film according to the above method. The raw material solution, the metal film forming method according to any one of claims 1 to 6, which is a mixed solution of the metal complex solution or metal salt solution containing the metal. The blending ratio of the amine compound and the organic solvent is according to any one of claims 1 to 7, wherein the amine compound is in the range of 0.001 mol / L to 10 mol / L in the organic solvent. Metal film forming method. The metal film forming method according to claim 8, wherein the amine compound is in the range of 0.005 mol / L to 1 mol / L. The method for forming a metal film according to any one of claims 1 to 4, wherein the amine compound is a diamine. The method for forming a metal film according to any one of claims 1 to 10, wherein the organic solvent contains at least one solvent selected from alcohol, ether, ester, carboxylic acid, halogenated hydrocarbon, hydrocarbon, and ketone. The metal film forming method according to any one of claims 1 to 12, wherein the organic solvent is a mixed solvent containing an alcohol and / or a ketone. A method for manufacturing an electronic component, including the method for forming a metal film according to claim 1. A method for manufacturing a semiconductor device, including the method for forming a metal film according to claim 1.

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