JP2020193920A5 - - Google Patents

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JP2020193920A5
JP2020193920A5 JP2019100828A JP2019100828A JP2020193920A5 JP 2020193920 A5 JP2020193920 A5 JP 2020193920A5 JP 2019100828 A JP2019100828 A JP 2019100828A JP 2019100828 A JP2019100828 A JP 2019100828A JP 2020193920 A5 JP2020193920 A5 JP 2020193920A5
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JP2019100828A
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JP2020193920A (ja
JP6999908B2 (ja
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Priority claimed from JP2019100828A external-priority patent/JP6999908B2/ja
Priority to JP2019100828A priority Critical patent/JP6999908B2/ja
Priority to CN202080037306.8A priority patent/CN113853507B/zh
Priority to EP20813021.1A priority patent/EP3978864A4/en
Priority to US17/615,065 priority patent/US20220221266A1/en
Priority to PCT/JP2020/020586 priority patent/WO2020241584A1/ja
Publication of JP2020193920A publication Critical patent/JP2020193920A/ja
Publication of JP2020193920A5 publication Critical patent/JP2020193920A5/ja
Publication of JP6999908B2 publication Critical patent/JP6999908B2/ja
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JP2019100828A 2019-05-30 2019-05-30 光干渉測定装置および光干渉測定方法 Active JP6999908B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2019100828A JP6999908B2 (ja) 2019-05-30 2019-05-30 光干渉測定装置および光干渉測定方法
PCT/JP2020/020586 WO2020241584A1 (ja) 2019-05-30 2020-05-25 光干渉測定装置および光干渉測定方法
EP20813021.1A EP3978864A4 (en) 2019-05-30 2020-05-25 Optical interferometer and optical interferometry method
US17/615,065 US20220221266A1 (en) 2019-05-30 2020-05-25 Optical interference measuring apparatus and optical interference measuring method
CN202080037306.8A CN113853507B (zh) 2019-05-30 2020-05-25 光干涉测定装置及光干涉测定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019100828A JP6999908B2 (ja) 2019-05-30 2019-05-30 光干渉測定装置および光干渉測定方法

Publications (3)

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JP2020193920A JP2020193920A (ja) 2020-12-03
JP2020193920A5 true JP2020193920A5 (https=) 2021-02-04
JP6999908B2 JP6999908B2 (ja) 2022-01-19

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JP2019100828A Active JP6999908B2 (ja) 2019-05-30 2019-05-30 光干渉測定装置および光干渉測定方法

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US (1) US20220221266A1 (https=)
EP (1) EP3978864A4 (https=)
JP (1) JP6999908B2 (https=)
CN (1) CN113853507B (https=)
WO (1) WO2020241584A1 (https=)

Families Citing this family (4)

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Publication number Priority date Publication date Assignee Title
JP7381827B2 (ja) 2019-05-30 2023-11-16 株式会社トプコン 光干渉測定装置および光干渉測定方法
CN114235745B (zh) * 2021-04-08 2022-11-15 中山大学中山眼科中心 基于平面干涉仪的信号处理的成像装置及成像方法
CN114894793B (zh) * 2021-04-08 2024-01-16 中山大学中山眼科中心 基于消除伪影的成像方法、成像系统及服务器
KR102924984B1 (ko) * 2023-06-13 2026-02-10 주식회사 퓨쳐디자인시스템 광 간섭 단층 촬영 시스템의 대용량 데이터 실시간 처리 장치 및 방법

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3541083B2 (ja) * 1995-05-16 2004-07-07 日本分光株式会社 スペクトルデータからのノイズ除去方法
JP4563130B2 (ja) * 2004-10-04 2010-10-13 株式会社トプコン 光画像計測装置
ATE484727T1 (de) * 2005-08-09 2010-10-15 Gen Hospital Corp Gerät und verfahren zur durchführung von polarisationsbasierter quadraturdemodulation bei optischer kohärenztomographie
JP4389032B2 (ja) 2007-01-18 2009-12-24 国立大学法人 筑波大学 光コヒーレンストモグラフィーの画像処理装置
US8340455B2 (en) 2008-03-31 2012-12-25 University Of Central Florida Research Foundation, Inc. Systems and methods for performing Gabor-domain optical coherence microscopy
US9400172B2 (en) * 2011-10-26 2016-07-26 Mitsubishi Electric Corporation Film thickness measurement method
US9251604B2 (en) 2012-07-20 2016-02-02 Samsung Electronics Co., Ltd. Apparatus and method for generating tomography image
JP2016176689A (ja) 2013-07-04 2016-10-06 株式会社日立ハイテクノロジーズ 干渉測定方法、及びその装置
NL2016121A (en) * 2015-02-06 2016-09-29 Asml Netherlands Bv A method and apparatus for improving measurement accuracy
JP6702851B2 (ja) * 2016-12-26 2020-06-03 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置および撮像方法
WO2019222616A1 (en) * 2018-05-18 2019-11-21 Northwestern University Spectral contrast optical coherence tomography angiography

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