JP2020089445A5 - - Google Patents

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Publication number
JP2020089445A5
JP2020089445A5 JP2018226848A JP2018226848A JP2020089445A5 JP 2020089445 A5 JP2020089445 A5 JP 2020089445A5 JP 2018226848 A JP2018226848 A JP 2018226848A JP 2018226848 A JP2018226848 A JP 2018226848A JP 2020089445 A5 JP2020089445 A5 JP 2020089445A5
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JP
Japan
Prior art keywords
optotype
control means
correction
eye
inspected
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JP2018226848A
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English (en)
Japanese (ja)
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JP7298144B2 (ja
JP2020089445A (ja
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Publication of JP2020089445A5 publication Critical patent/JP2020089445A5/ja
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JP2018226848A 2018-12-03 2018-12-03 自覚式検眼装置及び自覚式検眼プログラム Active JP7298144B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2018226848A JP7298144B2 (ja) 2018-12-03 2018-12-03 自覚式検眼装置及び自覚式検眼プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018226848A JP7298144B2 (ja) 2018-12-03 2018-12-03 自覚式検眼装置及び自覚式検眼プログラム

Publications (3)

Publication Number Publication Date
JP2020089445A JP2020089445A (ja) 2020-06-11
JP2020089445A5 true JP2020089445A5 (https=) 2021-12-23
JP7298144B2 JP7298144B2 (ja) 2023-06-27

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ID=71013358

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JP2018226848A Active JP7298144B2 (ja) 2018-12-03 2018-12-03 自覚式検眼装置及び自覚式検眼プログラム

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JP (1) JP7298144B2 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7623567B2 (ja) * 2020-10-30 2025-01-29 株式会社ニデック 検眼装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05253186A (ja) * 1992-03-11 1993-10-05 Topcon Corp 検眼システム
US9895057B2 (en) * 2014-04-24 2018-02-20 Carl Zeiss Meditec, Inc. Functional vision testing using light field displays
US10548473B2 (en) * 2015-06-23 2020-02-04 Essilor International Optometry measuring scale
KR102723374B1 (ko) * 2016-07-25 2024-10-29 매직 립, 인코포레이티드 광 필드 프로세서 시스템

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