JP2020089445A5 - - Google Patents

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Publication number
JP2020089445A5
JP2020089445A5 JP2018226848A JP2018226848A JP2020089445A5 JP 2020089445 A5 JP2020089445 A5 JP 2020089445A5 JP 2018226848 A JP2018226848 A JP 2018226848A JP 2018226848 A JP2018226848 A JP 2018226848A JP 2020089445 A5 JP2020089445 A5 JP 2020089445A5
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JP
Japan
Prior art keywords
optotype
control means
correction
eye
inspected
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JP2018226848A
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English (en)
Japanese (ja)
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JP2020089445A (ja
JP7298144B2 (ja
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Publication of JP2020089445A5 publication Critical patent/JP2020089445A5/ja
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JP2018226848A 2018-12-03 2018-12-03 自覚式検眼装置及び自覚式検眼プログラム Active JP7298144B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2018226848A JP7298144B2 (ja) 2018-12-03 2018-12-03 自覚式検眼装置及び自覚式検眼プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018226848A JP7298144B2 (ja) 2018-12-03 2018-12-03 自覚式検眼装置及び自覚式検眼プログラム

Publications (3)

Publication Number Publication Date
JP2020089445A JP2020089445A (ja) 2020-06-11
JP2020089445A5 true JP2020089445A5 (enrdf_load_stackoverflow) 2021-12-23
JP7298144B2 JP7298144B2 (ja) 2023-06-27

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ID=71013358

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JP2018226848A Active JP7298144B2 (ja) 2018-12-03 2018-12-03 自覚式検眼装置及び自覚式検眼プログラム

Country Status (1)

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JP (1) JP7298144B2 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7623567B2 (ja) * 2020-10-30 2025-01-29 株式会社ニデック 検眼装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05253186A (ja) * 1992-03-11 1993-10-05 Topcon Corp 検眼システム
WO2015162098A1 (en) 2014-04-24 2015-10-29 Carl Zeiss Meditec, Inc. Functional vision testing using light field displays
US10548473B2 (en) 2015-06-23 2020-02-04 Essilor International Optometry measuring scale
JP6992046B2 (ja) 2016-07-25 2022-01-13 マジック リープ， インコーポレイテッド ライトフィールドプロセッサシステム

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