JP2020012743A - Tool for calibrating survey meter - Google Patents

Tool for calibrating survey meter Download PDF

Info

Publication number
JP2020012743A
JP2020012743A JP2018135489A JP2018135489A JP2020012743A JP 2020012743 A JP2020012743 A JP 2020012743A JP 2018135489 A JP2018135489 A JP 2018135489A JP 2018135489 A JP2018135489 A JP 2018135489A JP 2020012743 A JP2020012743 A JP 2020012743A
Authority
JP
Japan
Prior art keywords
probe
holder
source
survey meter
radiation source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2018135489A
Other languages
Japanese (ja)
Other versions
JP6897975B2 (en
Inventor
芳紀 池澤
Yoshinori Ikezawa
芳紀 池澤
伸之 長谷川
Nobuyuki Hasegawa
伸之 長谷川
良穂 桧野
Yoshiho Hino
良穂 桧野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chiyoda Technol Corp
Original Assignee
Chiyoda Technol Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chiyoda Technol Corp filed Critical Chiyoda Technol Corp
Priority to JP2018135489A priority Critical patent/JP6897975B2/en
Publication of JP2020012743A publication Critical patent/JP2020012743A/en
Application granted granted Critical
Publication of JP6897975B2 publication Critical patent/JP6897975B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

To provide a tool for calibrating a survey meter, capable of setting a radiation detection surface of a probe so as to be parallel to a surface source and allowing anyone to set it at the same arrangement in a short time.SOLUTION: Used is a tool for calibrating a survey meter comprising: a source holder 30 having a source storage recessed part 32 in which a surface source 20 is arranged; and a probe holder 40 placed on the source holder 30 and arranged so that a radiation detection surface of the probe 12 of a survey meter to be calibrated faces the surface source 20 arranged in the source holder 30. The probe holder 40 comprises: a holder body 42 having a probe positioning opening 44 for passing and positioning the probe 12; and a probe receiving ring fixed to the holder body 42 and supporting the periphery of the radiation detection surface of the probe 12 by a claw at a lower end of the probe positioning opening 44.SELECTED DRAWING: Figure 3

Description

本発明は、サーベイメータの校正用治具に係り、特に、面線源を用いて表面汚染用サーベイメータを校正する際に用いるのに好適な、サーベイメータの校正用治具に関する。   The present invention relates to a survey meter calibration jig, and more particularly to a survey meter calibration jig suitable for use in calibrating a surface contamination survey meter using a surface ray source.

表面汚染などの測定に用いるサーベイメータは、定期的に校正する必要がある。サーベイメータの校正に関して出願人は、特許文献１や２で校正器や校正用治具を提案している。   Survey meters used for measuring surface contamination and the like need to be calibrated periodically. Regarding the calibration of the survey meter, the applicant has proposed a calibrator and a calibration jig in Patent Documents 1 and 2.

一方、面線源を用いてサーベイメータを校正する際には、様々なサーベイメータの形状に対応するため、図１に例示する如く、スタンド８を使用して、例えばＧＭ式サーベイメータ（以下、単にサーベイメータとも称する）１０のＧＭ計数管プローブ（以下、単にプローブとも称する）１２をスタンド８に挟み、面線源２０に対して平行になるようにプローブ１２の放射線検出面（図中の下面）（プローブ検出面とも称する）をセットし、該プローブ検出面と面線源２０表面との間隔を所定距離、例えば５ｍｍに合わせていた。図において、１４は、サーベイメータ１０の本体とプローブ１２を繋ぐケーブルである。   On the other hand, when a survey meter is calibrated using a surface ray source, in order to cope with various survey meter shapes, a stand 8 is used as shown in FIG. GM counter tube probe (hereinafter simply referred to as a probe) 12 of 10 is sandwiched between stands 8, and a radiation detection surface (lower surface in the figure) of the probe 12 (lower surface in FIG. The distance between the probe detection surface and the surface of the surface radiation source 20 was set to a predetermined distance, for example, 5 mm. In the figure, reference numeral 14 denotes a cable connecting the main body of the survey meter 10 and the probe 12.

特開２００５−２６５７６５号公報JP 2005-265765 A 特開２０１２−５８０９７号公報JP 2012-58097 A

しかしながら、プローブ１２をスタンド８にセットする方法では、プローブ１２の放射線検出面を面線源２０の表面と所定間隔にセットするのに時間を要し、又、複雑な形状のプローブ１２では面線源２０と平行に合わせることが困難であるという問題点を有していた。   However, in the method of setting the probe 12 on the stand 8, it takes time to set the radiation detection surface of the probe 12 at a predetermined distance from the surface of the surface radiation source 20. There is a problem in that it is difficult to align it in parallel with the source 20.

本発明は、前記従来の問題点を解消するべくなされたもので、面線源に対してプローブの放射線検出面を平行に、且つ、誰でも同じ配置に短時間でセットできるようにすることを課題とする。   SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned conventional problems, and has an object to enable a radiation detection surface of a probe to be parallel to a surface radiation source and to be set in the same arrangement in a short time by anyone. Make it an issue.

本発明は、面線源が配置される線源収容用凹部が形成された線源ホルダと、該線源ホルダ上に載置され、校正すべきサーベイメータのプローブの放射線検出面が、前記線源ホルダに配置された面線源と対向するように配置されるプローブホルダと、を備えたことを特徴とするサーベイメータの校正用治具により前記課題を解決するものである。   The present invention provides a source holder having a source receiving recess in which a surface source is arranged, and a radiation detection surface of a probe of a survey meter to be calibrated which is mounted on the source holder and which is to be calibrated. A probe jig for calibrating a survey meter, comprising: a probe holder arranged so as to face a surface radiation source arranged on the holder.

ここで、前記プローブホルダが、前記プローブを通過させて位置決めするプローブ位置決め用開口が形成されたホルダ本体と、該ホルダ本体に固定され、前記プローブ位置決め用開口の下端で前記プローブの放射線検出面を支持するプローブ受けリングと、を備えることができる。   Here, the probe holder is provided with a holder main body in which a probe positioning opening for passing and positioning the probe is formed, and is fixed to the holder main body, and a radiation detection surface of the probe is fixed at a lower end of the probe positioning opening. And a supporting probe receiving ring.

又、前記プローブ受けリングに、前記プローブの放射線検出面の周囲を支持する爪を設けることができる。   Further, the probe receiving ring may be provided with a claw for supporting the periphery of the radiation detection surface of the probe.

又、前記線源ホルダに、前記プローブホルダを位置決めするための手段を形成することができる。   Further, means for positioning the probe holder can be formed in the source holder.

又、前記線源ホルダの線源収容用凹部に、前記面線源の厚みの変化に対応するためのスペーサを配置可能とすることができる。   In addition, a spacer for accommodating a change in the thickness of the surface radiation source can be arranged in the radiation source receiving recess of the radiation source holder.

本発明に係るサーベイメータの校正用治具を用いることにより、プローブを自立させ、面線源に対してプローブの放射線検出面を平行に、且つ、誰でも同じ配置に短時間でセットすることが可能となる。   By using the survey meter calibration jig according to the present invention, the probe can be made independent, the radiation detection surface of the probe can be set parallel to the surface radiation source, and anyone can quickly set the same arrangement. Becomes

サーベイメータの従来の校正方法を例示する斜視図A perspective view illustrating a conventional calibration method of a survey meter. 本発明の実施形態にサーベイメータのプローブを載せてセットした状態を示す斜視図The perspective view which shows the state which mounted the probe of the survey meter on embodiment of this invention. 同じく正面から見た断面図Cross-sectional view also seen from the front 前記実施形態の線源ホルダを示す斜視図Perspective view showing the source holder of the embodiment. 同じく線源ホルダの（Ａ）平面図及び（Ｂ）Ｂ−Ｂ線に沿う断面図(A) Plan view and (B) sectional view along line BB of the same source holder 同じくプローブホルダを示す斜視図Perspective view showing the same probe holder 同じくプローブホルダの（Ａ）平面図及び（Ｂ）Ｂ−Ｂ線に沿う断面図(A) Plan view and (B) sectional view along line BB of the same probe holder. 同じくプローブ受けリングを示す（Ａ）底面図及び（Ｂ）Ｂ−Ｂ線に沿う断面図(A) Bottom view and (B) sectional view along line BB showing the same probe receiving ring.

以下、図面を参照して、本発明の実施の形態について詳細に説明する。なお、本発明は以下の実施形態及び実施例に記載した内容により限定されるものではない。又、以下に記載した実施形態及び実施例における構成要件には、当業者が容易に想定できるもの、実質的に同一のもの、いわゆる均等の範囲のものが含まれる。更に、以下に記載した実施形態及び実施例で開示した構成要素は適宜組み合わせてもよいし、適宜選択して用いてもよい。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. The present invention is not limited by the contents described in the following embodiments and examples. In addition, constituent elements in the embodiments and examples described below include those that can be easily assumed by those skilled in the art, those that are substantially the same, and those that are in the so-called equivalent range. Furthermore, the constituent elements disclosed in the embodiments and examples described below may be appropriately combined, or may be appropriately selected and used.

本発明に係るサーベイメータの校正用治具の実施形態は、図２（プローブを載せてセットした状態を示す斜視図）及び図３（同じく正面から見た断面図）に示す如く、面線源２０が配置される線源収容用凹部３２が形成された線源ホルダ３０と、該線源ホルダ３０上に載置され、校正すべきサーベイメータのプローブ１２の放射線検出面（図の下面）が、前記線源ホルダ３０に配置された面線源２０と対向するように配置されるプローブホルダ４０と、を主に備えている。   As shown in FIG. 2 (a perspective view showing a state in which a probe is mounted and set) and FIG. 3 (a cross-sectional view also viewed from the front), an embodiment of the survey meter calibration jig according to the present invention has The radiation detecting surface (the lower surface in the figure) of the probe 12 of the survey meter to be calibrated, which is mounted on the radiation source holder 30 in which the A probe holder 40 disposed so as to face the surface radiation source 20 disposed on the source holder 30.

前記線源ホルダ３０には、図４（斜視図）及び図５（Ａ）（平面図）、図５（Ｂ）（Ｂ−Ｂ線に沿う断面図）に示す如く、面線源２０を配置するための、図５中にハッチングで示す例えば正方形状の線源収容用凹部３２と、該線源収容用凹部３２の四隅に形成された、指を挿入可能として面線源２０の出し入れを容易とするための３／４円柱状の切欠き３４が形成されている。   As shown in FIG. 4 (perspective view), FIG. 5 (A) (plan view), and FIG. 5 (B) (cross-sectional view along line BB), the surface source 20 is disposed on the source holder 30. For example, a square-shaped source-receiving recess 32 shown by hatching in FIG. 5 and fingers formed at four corners of the source-receiving recess 32 are provided so that fingers can be inserted so that the surface source 20 can be easily taken in and out. A notch 34 in the form of a ／ column is formed.

更に、前記線源ホルダ３０の上面の周囲には、前記プローブホルダ４０を位置決めするための手段である位置決め壁３６が形成されている。   Further, a positioning wall 36 as a means for positioning the probe holder 40 is formed around the upper surface of the source holder 30.

図３に示す如く、前記線源収容用凹部３２の深さＤは、面線源２０の厚みＴの変化に対応するためのスペーサ３８を配置するのに十分な深さ、例えば１０ｍｍとされ、例えば面線源２０の厚みＴが３ｍｍであるときに、５ｍｍの厚みのスペーサ３８を配置して、線源ホルダ３０の上面からの間隔が２ｍｍとなるようにされている。   As shown in FIG. 3, the depth D of the radiation source accommodating recess 32 is set to a depth sufficient to dispose the spacer 38 for accommodating a change in the thickness T of the surface radiation source 20, for example, 10 mm. For example, when the thickness T of the surface radiation source 20 is 3 mm, a spacer 38 having a thickness of 5 mm is arranged so that the distance from the upper surface of the radiation source holder 30 is 2 mm.

前記線源ホルダ３０は、例えば透明アクリル樹脂製とされ、前記スペーサ３８は、例えばアルミニウム板製とされている。   The source holder 30 is made of, for example, transparent acrylic resin, and the spacer 38 is made of, for example, an aluminum plate.

前記プローブホルダ４０は、図６（斜視図）及び図７（Ａ）（平面図）、図７（Ｂ）（Ｂ−Ｂ線に沿う断面図）に示す如く、プローブ１２を通過させて位置決めするプローブ位置決め用開口４４が形成されたホルダ本体４２と、該ホルダ本体４２の下面に例えばねじ５０を用いて固定され、前記プローブ位置決め用開口４４の下端に配設される爪４８で前記プローブ１２の放射線検出面を支持するプローブ受けリング４６とを備えている。図において、５２は、プローブ受けリング４６を収容するためのリング状凹部、５４は、プローブ受けリング４６をホルダ本体４２に固定するためのねじ５０が螺合する、例えばヘリサート入りのねじ穴、５６は、プローブ受けリング４６に形成されたねじ穴である。   As shown in FIG. 6 (perspective view), FIG. 7 (A) (plan view), and FIG. 7 (B) (cross-sectional view along line BB), the probe holder 40 is positioned by passing the probe 12. The probe main body 42 having the probe positioning opening 44 formed therein, and the claw 48 fixed to the lower surface of the holder main body 42 using, for example, a screw 50 and disposed at the lower end of the probe positioning opening 44, for the probe 12. A probe receiving ring 46 for supporting the radiation detection surface. In the figure, reference numeral 52 denotes a ring-shaped recess for accommodating the probe receiving ring 46, 54 denotes a screw hole into which a screw 50 for fixing the probe receiving ring 46 to the holder main body 42 is screwed, for example, a screw hole containing a helicert, 56 Is a screw hole formed in the probe receiving ring 46.

前記プローブホルダ４０のホルダ本体４２は、例えば透明アクリル樹脂製とされ、前記プローブ受けリング４６は、例えばステンレス製とされている。   The holder main body 42 of the probe holder 40 is made of, for example, transparent acrylic resin, and the probe receiving ring 46 is made of, for example, stainless steel.

前記プローブ受けリング４６は、図８（Ａ）（底面図）及び図８（Ｂ）（Ｂ−Ｂ線に沿う断面図）に示すような爪４８付きのリング形状とされ、その内周には、プローブ１２の外周を支持するための爪４８が例えば４箇所に設けられている。この爪４８の図８（Ｂ）に示す傾斜角θは、β線の入射を邪魔しないようにされている。   The probe receiving ring 46 has a ring shape with a claw 48 as shown in FIGS. 8A (bottom view) and FIG. 8B (cross-sectional view along the line BB). Claws 48 for supporting the outer periphery of the probe 12 are provided at, for example, four places. The inclination angle θ of the claw 48 shown in FIG. 8B is set so as not to hinder the incidence of β-rays.

プローブ受けリング４６の材質や形状、寸法を検討するため、発明者らが、まずプローブ受けリング４６をアクリル素材製とし、その全周に長さ４ｍｍ、角度θ＝６０°の爪を設けたところ、図３中に矢印Ａで示す如く回り込むβ線の成分をカットすることは無いはずであるが、図１に示したスタンド８を用いた場合に比べてデータは若干下回っていた。そこで、角度θを７０°としたが、アクリル素材による爪の加工に難があるため、爪の長さを４．３３ｍｍとしたところ、測定データはスタンド８を使用したときと比べ、やはり下回る結果となり、角度６０°と大差が無かった。そこで、全周の爪をやめ、実施例のように、１箇所の爪幅８ｍｍの爪４８を４箇所とし、耐久性・耐荷重を考慮して爪４８の素材をステンレス、長さを３．５ｍｍとしたところ、スタンド８の場合とほぼ同程度という好結果を得ることができ、治具による遮蔽や散乱の影響を軽減することができた。   In order to study the material, shape, and dimensions of the probe receiving ring 46, the inventors first made the probe receiving ring 46 made of an acrylic material, and provided a claw having a length of 4 mm and an angle θ = 60 ° around the entire circumference. The component of the beta ray which goes around as shown by the arrow A in FIG. 3 should not be cut, but the data is slightly lower than the case where the stand 8 shown in FIG. 1 is used. Therefore, although the angle θ was set to 70 °, it was difficult to process the nail using an acrylic material. When the length of the nail was set to 4.33 mm, the measurement data was still lower than when the stand 8 was used. And there was no great difference with the angle of 60 °. Therefore, the nails around the entire circumference are stopped, and four nails 48 each having a nail width of 8 mm are used as in the embodiment. The material of the nails 48 is made of stainless steel in consideration of durability and load resistance, and the length is set to 3. When the distance was set to 5 mm, the same good results as those of the stand 8 could be obtained, and the influence of the shielding and scattering by the jig could be reduced.

なお、プローブ受けリング４６の厚さは、プローブ１２の抜き差しの回数を考慮して、例えば３ｍｍとして強度を持たせることができる。   In addition, the thickness of the probe receiving ring 46 can be set to, for example, 3 mm in consideration of the number of times the probe 12 is inserted and removed, and can have strength.

図３に示した如く、線源ホルダ３０の線源収容用凹部３２にスペーサ３８と面線源２０を配置し、その上にプローブホルダ４０をセットし、プローブ位置決め用開口４４にプローブ１２を挿入し、プローブ受けリング４６の爪４８にプローブ１２が保持された状態とすれば、プローブ１２の放射線検出面と面線源２０表面間の距離を、スタンド８を用いた場合と同じ所定距離、例えば５ｍｍに容易に設定できる。   As shown in FIG. 3, the spacer 38 and the surface radiation source 20 are arranged in the radiation source accommodating recess 32 of the radiation source holder 30, the probe holder 40 is set thereon, and the probe 12 is inserted into the probe positioning opening 44. If the probe 12 is held by the claw 48 of the probe receiving ring 46, the distance between the radiation detection surface of the probe 12 and the surface of the surface source 20 is set to the same predetermined distance as when the stand 8 is used, for example, It can be easily set to 5 mm.

このようにして、誰でも確実に短時間で同じセットができ、且つセットの再現を容易にすることができた。   In this manner, anyone can surely make the same set in a short time and can easily reproduce the set.

なお、面線源２０の厚みが変わった場合には、スペーサ３８の厚みを例えば０．５ｍｍ刻みで調整することで容易に対応できる。   When the thickness of the surface radiation source 20 changes, it can be easily coped with by adjusting the thickness of the spacer 38 in, for example, 0.5 mm increments.

本実施形態においては、線源ホルダ３０の線源収容用凹部３２の四隅に切欠き３４を設けているので、面線源２０の取出しが容易である。なお、面線源２０の取出しを容易とするための構成はこれに限定されず、切欠き３４の形状も３／４円柱状に限定されない。爪４８の数や、各種部材の材質、寸法も前記実施形態に限定されない。   In the present embodiment, since the notches 34 are provided at the four corners of the concave portion 32 for accommodating the radiation source of the radiation source holder 30, the surface radiation source 20 can be easily taken out. The configuration for facilitating the extraction of the surface radiation source 20 is not limited to this, and the shape of the notch 34 is not limited to a ３ cylindrical shape. The number of claws 48 and the materials and dimensions of various members are not limited to those in the above-described embodiment.

又、前記実施形態においては、図１に示したＧＭ式サーベイメータ１０のプローブ１２のサイズに合わせてプローブホルダ４０のプローブ位置決め用開口４４の形状が決められていたが、プローブ１２の形状が変わった場合には、そのプローブ形状に合わせてプローブ位置決め用開口４４の形状を変えたプローブホルダ４０を備えることにより、容易に対応できる。   In the above embodiment, the shape of the probe positioning opening 44 of the probe holder 40 is determined according to the size of the probe 12 of the GM survey meter 10 shown in FIG. 1, but the shape of the probe 12 is changed. In this case, it is easy to cope with the problem by providing the probe holder 40 in which the shape of the probe positioning opening 44 is changed according to the probe shape.

なお、前記実施形態では、本発明がＧＭ式サーベイメータに適用されていたが、本発明の適用対象はこれに限定されず、プローブホルダ４０のプローブ位置決め用開口４４が対応できれば、他のサーベイメータにも同様に適用できる。   In the above-described embodiment, the present invention is applied to the GM-type survey meter. However, the application target of the present invention is not limited to this. The same applies.

１０…サーベイメータ
１２…プローブ
２０…面線源
３０…線源ホルダ
３２…線源収容用凹部
３４…切欠き
３６…位置決め壁
３８…スペーサ
４０…プローブホルダ
４２…ホルダ本体
４４…プローブ位置決め用開口
４６…プローブ受けリング
４８…爪 DESCRIPTION OF SYMBOLS 10 ... Survey meter 12 ... Probe 20 ... Surface radiation source 30 ... Source holder 32 ... Radiation source accommodation recess 34 ... Notch 36 ... Positioning wall 38 ... Spacer 40 ... Probe holder 42 ... Holder main body 44 ... Probe positioning opening 46 ... Probe receiving ring 48 ... claw

Claims (5)

面線源が配置される線源収容用凹部が形成された線源ホルダと、
該線源ホルダ上に載置され、校正すべきサーベイメータのプローブの放射線検出面が、前記線源ホルダに配置された面線源と対向するように配置されるプローブホルダと、
を備えたことを特徴とするサーベイメータの校正用治具。 A radiation source holder in which a radiation source accommodating recess in which a surface radiation source is arranged is formed,
A probe holder mounted on the source holder and arranged so that the radiation detection surface of the probe of the survey meter to be calibrated faces the surface source arranged on the source holder,
A survey meter calibration jig characterized by comprising: 前記プローブホルダが、
前記プローブを通過させて位置決めするプローブ位置決め用開口が形成されたホルダ本体と、
該ホルダ本体に固定され、前記プローブ位置決め用開口の下端で前記プローブの放射線検出面を支持するプローブ受けリングと、
を備えていることを特徴とする請求項１に記載のサーベイメータの校正用治具。 The probe holder,
A holder body having a probe positioning opening for positioning by passing the probe,
A probe receiving ring fixed to the holder body and supporting a radiation detection surface of the probe at a lower end of the probe positioning opening;
The jig for calibrating a survey meter according to claim 1, further comprising: 前記プローブ受けリングに、前記プローブの放射線検出面の周囲を支持する爪が設けられていることを特徴とする請求項２に記載のサーベイメータの校正用治具。   The survey meter calibration jig according to claim 2, wherein the probe receiving ring is provided with a claw that supports a periphery of the radiation detection surface of the probe. 前記線源ホルダに、前記プローブホルダを位置決めするための手段が形成されていることを特徴とする請求項１に記載のサーベイメータの校正用治具。   2. The survey meter calibration jig according to claim 1, wherein means for positioning the probe holder is formed in the radiation source holder. 前記線源ホルダの線源収容用凹部に、前記面線源の厚みの変化に対応するためのスペーサが配置可能とされていることを特徴とする請求項１に記載のサーベイメータの校正用治具。   The jig for calibrating a survey meter according to claim 1, wherein a spacer for accommodating a change in the thickness of the surface radiation source can be arranged in the radiation source receiving recess of the radiation source holder. .
JP2018135489A 2018-07-19 2018-07-19 Survey meter calibration jig Active JP6897975B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2018135489A JP6897975B2 (en) 2018-07-19 2018-07-19 Survey meter calibration jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018135489A JP6897975B2 (en) 2018-07-19 2018-07-19 Survey meter calibration jig

Publications (2)

Publication Number Publication Date
JP2020012743A true JP2020012743A (en) 2020-01-23
JP6897975B2 JP6897975B2 (en) 2021-07-07

Family

ID=69170878

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018135489A Active JP6897975B2 (en) 2018-07-19 2018-07-19 Survey meter calibration jig

Country Status (1)

Country Link
JP (1) JP6897975B2 (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3064130A (en) * 1959-12-02 1962-11-13 Ianni Elmo J Di Gamma instrument calibration
JPH0587585U (en) * 1992-04-28 1993-11-26 株式会社アトックス Standard radiation source holding cover
JP2005049137A (en) * 2003-07-30 2005-02-24 Toshiba Corp Radioactivity inspection device
JP2012058097A (en) * 2010-09-09 2012-03-22 Chiyoda Technol Corp Confirmation and calibration method of radiation dose (rate) measuring instrument, and confirmation and calibration jig
JP2012159517A (en) * 2012-05-15 2012-08-23 Japan Shield Technical Research Co Ltd Radiation shielding body
JP2015169455A (en) * 2014-03-05 2015-09-28 エヌ・エム・ピイビジネスサポート株式会社 Radiation measurement method, collimator and radiation measurement device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3064130A (en) * 1959-12-02 1962-11-13 Ianni Elmo J Di Gamma instrument calibration
JPH0587585U (en) * 1992-04-28 1993-11-26 株式会社アトックス Standard radiation source holding cover
JP2005049137A (en) * 2003-07-30 2005-02-24 Toshiba Corp Radioactivity inspection device
JP2012058097A (en) * 2010-09-09 2012-03-22 Chiyoda Technol Corp Confirmation and calibration method of radiation dose (rate) measuring instrument, and confirmation and calibration jig
JP2012159517A (en) * 2012-05-15 2012-08-23 Japan Shield Technical Research Co Ltd Radiation shielding body
JP2015169455A (en) * 2014-03-05 2015-09-28 エヌ・エム・ピイビジネスサポート株式会社 Radiation measurement method, collimator and radiation measurement device

Also Published As

Publication number Publication date
JP6897975B2 (en) 2021-07-07

Similar Documents

Publication Publication Date Title
EP3070447B1 (en) Residual stress measuring method
EP2954286B1 (en) Artefact for evaluating the performance of an x-ray computed tomography system
US9239305B2 (en) Sample holder
JP5702762B2 (en) Radioactivity measuring device
JP2020012743A (en) Tool for calibrating survey meter
US11118889B2 (en) Method and system for measuring at least one geometrical characteristic of a gauge
TW201200895A (en) Metal volume source calibration phantom and calibrating method thereof
KR102033471B1 (en) A measuring device for cracking width of construction for safety diagnosis
EP3327466A1 (en) Marinelli beaker correction container for stable radionuclide analysis
KR200450453Y1 (en) Spring scales for laboratory equipment with measurement everywhere
CN110132710B (en) Method for detecting corrugated pipe flexibility test device
CN103453814B (en) Auxiliary calibration device
KR101528036B1 (en) vernier calipers
JP2012058097A (en) Confirmation and calibration method of radiation dose (rate) measuring instrument, and confirmation and calibration jig
US10466374B2 (en) Method for quantifying the intrinsic dimensions of radiation sensors, particularly ionizing radiation sensors, and device for implementing same
CN216049730U (en) Calibration piece for calibrating geometric dimension of digital ray detection
CN205844538U (en) A kind of gamma energy spectrum method measures the fixed support of environmental sample
US9841516B1 (en) Measurement system, calibration and measurement method for bulk radiation wastes
CN210833326U (en) Checking fixture
CN215064203U (en) Measuring clamp
US4669104A (en) Indicator for determining the sensitivity of a radiological defect testing device
CN211669373U (en) Surface pollution measuring instrument support
CN209166273U (en) A kind of form factor detection device and detection system
CN218674607U (en) Calibrating device of free expansion rate tester
KR20120017894A (en) Jig for calibration of measuring instrument and measuring instrument calibration system using the same jig

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180723

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20200319

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20200319

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20210325

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20210330

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20210414

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20210511

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20210603

R150 Certificate of patent or registration of utility model

Ref document number: 6897975

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150