JP2019537482A5 - - Google Patents

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Publication number
JP2019537482A5
JP2019537482A5 JP2019525869A JP2019525869A JP2019537482A5 JP 2019537482 A5 JP2019537482 A5 JP 2019537482A5 JP 2019525869 A JP2019525869 A JP 2019525869A JP 2019525869 A JP2019525869 A JP 2019525869A JP 2019537482 A5 JP2019537482 A5 JP 2019537482A5
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JP
Japan
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data
ray image
image data
attenuated
basic
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JP2019525869A
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Japanese (ja)
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JP2019537482A (ja
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Priority claimed from PCT/EP2017/078709 external-priority patent/WO2018091344A1/en
Publication of JP2019537482A publication Critical patent/JP2019537482A/ja
Publication of JP2019537482A5 publication Critical patent/JP2019537482A5/ja
Ceased legal-status Critical Current

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JP2019525869A 2016-11-16 2017-11-09 位相コントラスト像形成データから多エネルギーデータを生成するための装置 Ceased JP2019537482A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16199050 2016-11-16
EP16199050.2 2016-11-16
PCT/EP2017/078709 WO2018091344A1 (en) 2016-11-16 2017-11-09 Apparatus for generating multi energy data from phase contrast imaging data

Publications (2)

Publication Number Publication Date
JP2019537482A JP2019537482A (ja) 2019-12-26
JP2019537482A5 true JP2019537482A5 (https=) 2020-12-17

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ID=57442446

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JP2019525869A Ceased JP2019537482A (ja) 2016-11-16 2017-11-09 位相コントラスト像形成データから多エネルギーデータを生成するための装置

Country Status (5)

Country Link
US (1) US11234663B2 (https=)
EP (1) EP3541285B1 (https=)
JP (1) JP2019537482A (https=)
CN (1) CN109982640A (https=)
WO (1) WO2018091344A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020103571A (ja) * 2018-12-27 2020-07-09 キヤノンメディカルシステムズ株式会社 医用処理装置及びｘ線診断システム
EP3832690A1 (en) * 2019-12-05 2021-06-09 Koninklijke Philips N.V. Estimation of full-field scattering for dax imaging
EP3838154A1 (en) * 2019-12-16 2021-06-23 Koninklijke Philips N.V. Apparatus for generating photon counting spectral image data
EP3845891B1 (en) * 2019-12-30 2022-02-09 Xenocs SAS X-ray scattering apparatus
US11389124B2 (en) * 2020-02-12 2022-07-19 General Electric Company X-ray phase contrast detector

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US7627080B2 (en) * 2005-09-22 2009-12-01 Koninklijke Philips Electronics N.V. Quantitative material decomposition for spectral CT
US7734076B2 (en) * 2006-12-11 2010-06-08 General Electric Company Material decomposition image noise reduction
CN102395877B (zh) * 2009-04-17 2014-04-09 西门子公司 用于进行相衬测量的检测装置和x射线断层摄影仪以及进行相衬测量的方法
CN101900695B (zh) * 2009-05-27 2011-11-23 清华大学 伪双能欠采样物质识别系统和方法
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JP6197790B2 (ja) * 2012-06-11 2017-09-20 コニカミノルタ株式会社 医用画像システム及び医用画像処理装置
DE102012211146A1 (de) * 2012-06-28 2014-01-02 Siemens Aktiengesellschaft Verfahren und Röntgensystem zur Erzeugung einer Phasenkontrastdarstellung
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JP2016536032A (ja) 2013-09-26 2016-11-24 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 電子密度画像の連結再構成
US9155510B2 (en) 2013-10-12 2015-10-13 Wisconsin Alumni Research Foundation Systems and methods for generating x-ray phase contrast images using a conventional x-ray imaging system
JP6524617B2 (ja) 2014-06-26 2019-06-05 ソニー株式会社 撮像装置および方法
WO2016008956A1 (en) * 2014-07-17 2016-01-21 Koninklijke Philips N.V. Iterative reconstruction method for spectral, phase-contrast imaging
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JP6413950B2 (ja) * 2015-06-26 2018-10-31 コニカミノルタ株式会社 放射線撮影システム及び画像処理装置
US10332281B2 (en) * 2016-01-29 2019-06-25 Wisconsin Alumni Research Foundation System and method for denoising medical images by enforcing low rank spatial-temporal or spatial-spectral image matrices
US10466183B2 (en) * 2016-10-31 2019-11-05 Lawrence Livermore National Security, Llc System-independent characterization of materials using dual-energy computed tomography

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