JP2019536025A - 直流回路の故障を予測するための方法および装置 - Google Patents
直流回路の故障を予測するための方法および装置 Download PDFInfo
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- JP2019536025A JP2019536025A JP2019524884A JP2019524884A JP2019536025A JP 2019536025 A JP2019536025 A JP 2019536025A JP 2019524884 A JP2019524884 A JP 2019524884A JP 2019524884 A JP2019524884 A JP 2019524884A JP 2019536025 A JP2019536025 A JP 2019536025A
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- 238000000034 method Methods 0.000 title claims abstract description 18
- 238000012544 monitoring process Methods 0.000 claims abstract description 4
- 238000012360 testing method Methods 0.000 claims description 15
- 238000004458 analytical method Methods 0.000 claims description 11
- 238000012545 processing Methods 0.000 claims description 5
- 230000015556 catabolic process Effects 0.000 claims description 4
- 238000006731 degradation reaction Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 5
- 230000001788 irregular Effects 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 230000003449 preventive effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000013024 troubleshooting Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013211 curve analysis Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 230000005055 memory storage Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/153—Arrangements in which a pulse is delivered at the instant when a predetermined characteristic of an input signal is present or at a fixed time interval after this instant
- H03K5/1536—Zero-crossing detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2837—Characterising or performance testing, e.g. of frequency response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0283—Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
- G01R31/2858—Measuring of material aspects, e.g. electro-migration [EM], hot carrier injection
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Theoretical Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Relating To Insulation (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Emergency Protection Circuit Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Inverter Devices (AREA)
- Power Conversion In General (AREA)
Abstract
Description
縁部比=正弦(Sine)(T1 @N+−T1 @P1+)−正弦(L1 @N+−L1 @P1+)+正弦(T1 @N−−T1 @P1−)−正弦(L1 @N−−L1 @P1−)+正弦(T2 @N+−T2 @P1+)−正弦(L2 @N+−L2 @P1+)+正弦(T2 @N−−T2 @P1−)−正弦(L2 @N−−L2 @P1−)+…+正弦(T1+y @N+−T1+y @P1+)−正弦(L1+y @N+−L1+y @P1+)+正弦(T1+y @N−−T1+y @P1−)−正弦(L1+y @N−−L1+y @P1−)
周期比=(Tv1@N1−Tv1@P(x−1))/2+(Tv2P(x−1)−Tv2@P(x))/2+(Tv2@N1−Tv2@P(x−1))/2+(Tv2P(x−1)−Tv2@P(x))/2+…+(Tv(1+y)@N1−Tv(1+y)@P(x−1))/2+(Tv(1+y)P(x−1)−Tv(1+y)@P(x))/2
振幅比=(dV1 @N+[L1 @N+]−dV1 @N+[T1 @N+]+dV1 @N−[L1 @N−]−dV1 @N−[T1 @N−])/2+(dV2 @N+[L2 @N+]−dV2 @N+[T2 @N+]+dV2 @N−[L2 @N−]−dV2 @N−[T2 @N−])/2+…+(dV(1+y) @N+[L(1+y) @N+]−dV(1+y) @N+[T(1+y) @N+]+dV(1+y) @N−[L(1+y) @N−]−dV(1+y) @N−[T(1+y) @N−])/2
これらのデータ比に基づいて、アルゴリズムは、回路の推定故障点を予測することができる。典型的なアルゴリズムでは、検査中の回路に合わせて波形を調整した後、以下のように指定の比率を重み付けする。
出力(アルゴリズム)=縁部比+周期比×1.3+振幅比×0.7
これにより、検査中のDC回路に特有の、図5に示すような分析用の予測減衰曲線を作成するためにデータを正規化することができる。各回路には個別の共通しない構成要素があるため、各回路は別々に指定しなければならない。
Claims (5)
- DC回路のライフサイクルを予測する方法であって、
a)生成されたDCパルス列のゼロ交差点における振幅比歪み、周期比変動、および持続時間比変動の特性に関して特定の構成の特定のDC回路についてのベースラインを確立するステップと、
b)使用されていたDC回路について、ゼロ点交差領域で、ステップ(a)で使用されたDC回路の同一の対応する比率および係数を監視し求めるステップと、
c)減衰率分析曲線を確立するためにステップ(a)およびステップ(b)の対応する比率および係数を比較するステップであって、これにより、減衰率分析が、前記DC回路の予測寿命の最後を確立し、故障までの推定時間を予測するために使用され得る、ステップと
を含む方法。 - 個別の回路が、独立型であるか、またはシステム内の回路のネットワークの一部である、請求項1に記載の方法。
- ステップ(c)が、分析中の回路の劣化率、および故障までの回路の予測寿命を示す減衰曲線を作成する、請求項1に記載の方法。
- ステップ(c)から得られるデータが、完全な故障の後に回路をトラブルシューティングするために利用され得る方法1。
- 請求項1に記載の方法を実施するために適合された装置であって、
a)必要な場合に、必要な電力を生成するDC電源と、
b)パルス列を生成するパルス発生器と、
c)負パルス列を生成するパルスインバータと、
d)検査中の回路に特有のパルス波を生成する中央処理装置と、
e)パルス波が前記中央処理装置に送り返されるまで前記パルス波を記憶するためのメモリモジュールと、
f)減衰率分析曲線を作成するために比率、係数を求め、アルゴリズムを生成するための手段であって、前記減衰率分析曲線が、検査されているDC回路の予測寿命の最後を確立するために使用される、手段と
を備える装置。
Priority Applications (1)
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JP2022178021A JP2023022051A (ja) | 2016-11-16 | 2022-11-07 | 直流回路の故障を予測するための方法および装置 |
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US201662422762P | 2016-11-16 | 2016-11-16 | |
US62/422,762 | 2016-11-16 | ||
PCT/US2017/061957 WO2018094006A1 (en) | 2016-11-16 | 2017-11-16 | Method and apparatus for predicting failures in direct current circuits |
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JP2022178021A Division JP2023022051A (ja) | 2016-11-16 | 2022-11-07 | 直流回路の故障を予測するための方法および装置 |
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JP2019536025A true JP2019536025A (ja) | 2019-12-12 |
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JP2019524884A Pending JP2019536025A (ja) | 2016-11-16 | 2017-11-16 | 直流回路の故障を予測するための方法および装置 |
JP2022178021A Pending JP2023022051A (ja) | 2016-11-16 | 2022-11-07 | 直流回路の故障を予測するための方法および装置 |
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Country Status (12)
Country | Link |
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US (1) | US10848139B2 (ja) |
EP (1) | EP3542172B1 (ja) |
JP (2) | JP2019536025A (ja) |
KR (1) | KR20190087454A (ja) |
CN (1) | CN110249232B (ja) |
AU (1) | AU2017362981B2 (ja) |
BR (1) | BR112019009926B1 (ja) |
CA (1) | CA3043876A1 (ja) |
IL (1) | IL266656B (ja) |
MX (1) | MX2019005537A (ja) |
SA (1) | SA519401796B1 (ja) |
WO (1) | WO2018094006A1 (ja) |
Families Citing this family (3)
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EP3542172B1 (en) * | 2016-11-16 | 2023-06-21 | Smartkable, LLC | Method and apparatus for predicting failures in direct current circuits |
US11837863B2 (en) * | 2019-01-07 | 2023-12-05 | Smartkable Llc | Apparatus and method for monitoring a circuit under load using a circuit breaker |
CN112406572B (zh) * | 2020-11-06 | 2022-05-13 | 广州小鹏自动驾驶科技有限公司 | 一种车辆充电口磨损检测方法及检测装置 |
Citations (3)
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- 2017-11-16 CN CN201780071022.9A patent/CN110249232B/zh active Active
- 2017-11-16 JP JP2019524884A patent/JP2019536025A/ja active Pending
- 2017-11-16 CA CA3043876A patent/CA3043876A1/en active Pending
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- 2017-11-16 KR KR1020197016475A patent/KR20190087454A/ko active IP Right Grant
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US20200059225A1 (en) | 2020-02-20 |
EP3542172A4 (en) | 2020-01-08 |
RU2019117814A (ru) | 2020-12-17 |
CN110249232B (zh) | 2021-10-22 |
KR20190087454A (ko) | 2019-07-24 |
EP3542172A1 (en) | 2019-09-25 |
EP3542172B1 (en) | 2023-06-21 |
AU2017362981B2 (en) | 2023-11-09 |
IL266656A (en) | 2019-07-31 |
IL266656B (en) | 2022-06-01 |
CA3043876A1 (en) | 2018-05-24 |
BR112019009926A2 (pt) | 2019-08-20 |
CN110249232A (zh) | 2019-09-17 |
RU2019117814A3 (ja) | 2021-03-29 |
MX2019005537A (es) | 2019-08-29 |
SA519401796B1 (ar) | 2022-08-09 |
EP3542172C0 (en) | 2023-06-21 |
BR112019009926B1 (pt) | 2021-07-20 |
WO2018094006A1 (en) | 2018-05-24 |
US10848139B2 (en) | 2020-11-24 |
JP2023022051A (ja) | 2023-02-14 |
AU2017362981A1 (en) | 2019-07-11 |
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