JP2019520659A5 - - Google Patents

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JP2019520659A5
JP2019520659A5 JP2019500310A JP2019500310A JP2019520659A5 JP 2019520659 A5 JP2019520659 A5 JP 2019520659A5 JP 2019500310 A JP2019500310 A JP 2019500310A JP 2019500310 A JP2019500310 A JP 2019500310A JP 2019520659 A5 JP2019520659 A5 JP 2019520659A5
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time series
pattern
kpi
signature
distance score
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JP2019500310A
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JP7009438B2 (ja
JP2019520659A (ja
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Priority claimed from PCT/US2017/041003 external-priority patent/WO2018009733A1/en
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JP2019500310A 2016-07-07 2017-07-07 時系列パターンモデルを用いて主要パフォーマンス指標（ｋｐｉ）を監視するコンピュータシステム及び方法 Active JP7009438B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662359575P 2016-07-07 2016-07-07
US62/359,575 2016-07-07
PCT/US2017/041003 WO2018009733A1 (en) 2016-07-07 2017-07-07 Computer system and method for monitoring key performance indicators (kpis) online using time series pattern model

Publications (3)

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JP2019520659A JP2019520659A (ja) 2019-07-18
JP2019520659A5 true JP2019520659A5 (enExample) 2020-08-13
JP7009438B2 JP7009438B2 (ja) 2022-01-25

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JP2019500310A Active JP7009438B2 (ja) 2016-07-07 2017-07-07 時系列パターンモデルを用いて主要パフォーマンス指標（ｋｐｉ）を監視するコンピュータシステム及び方法

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US (1) US10921759B2 (enExample)
EP (1) EP3482266A1 (enExample)
JP (1) JP7009438B2 (enExample)
WO (1) WO2018009733A1 (enExample)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11396002B2 (en) * 2017-03-28 2022-07-26 Uop Llc Detecting and correcting problems in liquid lifting in heat exchangers
US11130111B2 (en) * 2017-03-28 2021-09-28 Uop Llc Air-cooled heat exchangers
US10809704B2 (en) * 2017-11-01 2020-10-20 Honeywell International Inc. Process performance issues and alarm notification using data analytics
US11017008B2 (en) * 2018-03-14 2021-05-25 Honeywell International Inc. Method and system for contextualizing process data
US20200073891A1 (en) * 2018-08-28 2020-03-05 New Relic, Inc. Systems and methods for classifying data in high volume data streams
US20200202280A1 (en) * 2018-12-24 2020-06-25 Level35 Pty Ltd System and method for using natural language processing in data analytics
US11972382B2 (en) 2019-02-22 2024-04-30 International Business Machines Corporation Root cause identification and analysis
US11353859B2 (en) * 2019-03-19 2022-06-07 Mitsubishi Electric Research Laboratories, Inc. System and method for anomaly detection in time-varying system operations
FR3096475B1 (fr) * 2019-05-21 2021-05-21 Cartesiam Procede d’apprentissage pour la detection d’anomalies implemente sur un microcontroleur et procede de detection d’anomalies associe
CN114096927A (zh) * 2019-07-15 2022-02-25 Abb瑞士股份有限公司 用于控制工业厂房中批处理的性能的方法和系统
US11256673B2 (en) * 2019-09-11 2022-02-22 Commvault Systems, Inc. Anomaly detection in deduplication pruning operations
JP7222939B2 (ja) * 2020-02-03 2023-02-15 株式会社日立製作所 時系列パターンの説明情報生成装置
EP3905062A1 (en) * 2020-04-27 2021-11-03 Permutable Technologies Limited Method and apparatus for searching for a data pattern
EP3961338B1 (en) * 2020-08-28 2024-01-03 Tata Consultancy Services Limited Detection of abnormal behaviour of devices from associated unlabeled sensor observations
US11495114B2 (en) * 2020-10-19 2022-11-08 SparkCognition, Inc. Alert similarity and label transfer
US12079070B2 (en) 2020-10-19 2024-09-03 SparkCognition, Inc. Alert similarity and label transfer
US20240027304A1 (en) * 2020-12-08 2024-01-25 Jfe Steel Corporation Trigger condition determination method for time series signal, abnormality diagnosis method for equipment to be monitored, and trigger condition determination device for time series signal
EP4016220A1 (en) 2020-12-16 2022-06-22 Siemens Aktiengesellschaft Assistance apparatus and method for automatically identifying failure types of a technical system
US12189377B2 (en) 2021-02-17 2025-01-07 International Business Machines Corporation Continous monitoring, advance alerts, and control of key performance indicator variables
US11936542B2 (en) 2021-04-02 2024-03-19 Samsung Electronics Co., Ltd. Method of solving problem of network and apparatus for performing the same
WO2022260906A1 (en) * 2021-06-07 2022-12-15 Visa International Service Association Error-bounded approximate time series join using compact dictionary representation of time series
CN113763707B (zh) * 2021-08-19 2022-08-16 东南大学 一种基于号牌数据的路段溢流和车道阻挡状态辨识方法
FR3130960B1 (fr) * 2021-12-16 2024-01-26 Commissariat Energie Atomique Procédé et système de détection et de caractérisation de signaux faibles d’exposition à un risque dans un système industriel
US12363564B2 (en) 2022-10-13 2025-07-15 T-Mobile Usa, Inc. Determining a cause of an issue associated with a wireless telecommunication network
WO2025024213A1 (en) * 2023-07-21 2025-01-30 Eli Lilly And Company Root cause analysis for machines in manufacturing network
CN118396363B (zh) * 2024-06-27 2024-09-24 山东东阿东方阿胶股份有限公司 一种阿胶羹的生产监测方法及系统

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5764509A (en) * 1996-06-19 1998-06-09 The University Of Chicago Industrial process surveillance system
JP2002521201A (ja) * 1998-07-21 2002-07-16 ドファスコ インコーポレイテッド 連続鋳造機の動作を監視して切迫したブレークアウトの発生を検出する多変量（ｍｕｌｔｉｖａｒｉａｔｅ）統計的モデルベースのシステム
JP2000259222A (ja) * 1999-03-04 2000-09-22 Hitachi Ltd 機器監視・予防保全システム
US7103222B2 (en) * 2002-11-01 2006-09-05 Mitsubishi Electric Research Laboratories, Inc. Pattern discovery in multi-dimensional time series using multi-resolution matching
US6885977B2 (en) * 2002-12-20 2005-04-26 Applied Materials, Inc. System to identify a wafer manufacturing problem and method therefor
US7062411B2 (en) * 2003-06-11 2006-06-13 Scientific Systems Research Limited Method for process control of semiconductor manufacturing equipment
JP2006155404A (ja) 2004-11-30 2006-06-15 Toshiba Corp 時間情報抽出装置、時間情報抽出方法、及び時間情報抽出プログラム
US7477960B2 (en) * 2005-02-16 2009-01-13 Tokyo Electron Limited Fault detection and classification (FDC) using a run-to-run controller
KR20080040694A (ko) * 2005-07-07 2008-05-08 엠케이에스 인스트루먼츠, 인코포레이티드 공정 환경에서 동적 파라미터를 모니터하기 위한 자기 보정다변량 분석
US20080010531A1 (en) * 2006-06-12 2008-01-10 Mks Instruments, Inc. Classifying faults associated with a manufacturing process
JP2010537282A (ja) * 2007-08-14 2010-12-02 シエル・インターナシヨナル・リサーチ・マートスハツペイ・ベー・ヴエー 化学プラントや精製所の連続オンラインモニタリング用のシステムおよび方法
US8494798B2 (en) * 2008-09-02 2013-07-23 Mks Instruments, Inc. Automated model building and batch model building for a manufacturing process, process monitoring, and fault detection
US8055375B2 (en) * 2008-09-30 2011-11-08 Rockwell Automation Technologies, Inc. Analytical generator of key performance indicators for pivoting on metrics for comprehensive visualizations
JP5148457B2 (ja) * 2008-11-19 2013-02-20 株式会社東芝 異常判定装置、方法、及びプログラム
US9069345B2 (en) * 2009-01-23 2015-06-30 Mks Instruments, Inc. Controlling a manufacturing process with a multivariate model
EP2284769B1 (en) * 2009-07-16 2013-01-02 European Space Agency Method and apparatus for analyzing time series data
JP5364530B2 (ja) * 2009-10-09 2013-12-11 株式会社日立製作所 設備状態監視方法、監視システム及び監視プログラム
JP2012099071A (ja) * 2010-11-05 2012-05-24 Yokogawa Electric Corp プラント解析システム
WO2013051101A1 (ja) * 2011-10-04 2013-04-11 株式会社日立製作所 時系列データ管理システム，および方法
US9075713B2 (en) * 2012-05-24 2015-07-07 Mitsubishi Electric Research Laboratories, Inc. Method for detecting anomalies in multivariate time series data
JP5996384B2 (ja) * 2012-11-09 2016-09-21 株式会社東芝 プロセス監視診断装置、プロセス監視診断プログラム
US9535808B2 (en) * 2013-03-15 2017-01-03 Mtelligence Corporation System and methods for automated plant asset failure detection
US20160239756A1 (en) * 2013-10-10 2016-08-18 Ge Intelligent Platforms, Inc. Correlation and annotation of time series data sequences to extracted or existing discrete data
US9848007B2 (en) 2014-08-29 2017-12-19 Microsoft Technology Licensing, Llc Anomalous event detection based on metrics pertaining to a production system
US10031510B2 (en) 2015-05-01 2018-07-24 Aspen Technology, Inc. Computer system and method for causality analysis using hybrid first-principles and inferential model
EP3258333A1 (en) * 2016-06-17 2017-12-20 Siemens Aktiengesellschaft Method and system for monitoring sensor data of rotating equipment

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