JP2019219345A5 - - Google Patents

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Publication number
JP2019219345A5
JP2019219345A5 JP2018118821A JP2018118821A JP2019219345A5 JP 2019219345 A5 JP2019219345 A5 JP 2019219345A5 JP 2018118821 A JP2018118821 A JP 2018118821A JP 2018118821 A JP2018118821 A JP 2018118821A JP 2019219345 A5 JP2019219345 A5 JP 2019219345A5
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JP
Japan
Prior art keywords
spad
potential
detection
monitor
unit
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JP2018118821A
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English (en)
Japanese (ja)
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JP2019219345A (ja
JP6835042B2 (ja
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Priority to JP2018118821A priority Critical patent/JP6835042B2/ja
Priority claimed from JP2018118821A external-priority patent/JP6835042B2/ja
Priority to PCT/JP2019/024745 priority patent/WO2019245034A1/ja
Publication of JP2019219345A publication Critical patent/JP2019219345A/ja
Publication of JP2019219345A5 publication Critical patent/JP2019219345A5/ja
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JP2018118821A 2018-06-22 2018-06-22 測距装置 Active JP6835042B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2018118821A JP6835042B2 (ja) 2018-06-22 2018-06-22 測距装置
PCT/JP2019/024745 WO2019245034A1 (ja) 2018-06-22 2019-06-21 測距装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018118821A JP6835042B2 (ja) 2018-06-22 2018-06-22 測距装置

Publications (3)

Publication Number Publication Date
JP2019219345A JP2019219345A (ja) 2019-12-26
JP2019219345A5 true JP2019219345A5 (cg-RX-API-DMAC10.html) 2020-05-21
JP6835042B2 JP6835042B2 (ja) 2021-02-24

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ID=68984067

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JP2018118821A Active JP6835042B2 (ja) 2018-06-22 2018-06-22 測距装置

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JP (1) JP6835042B2 (cg-RX-API-DMAC10.html)
WO (1) WO2019245034A1 (cg-RX-API-DMAC10.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025263207A1 (ja) * 2024-06-18 2025-12-26 ソニーセミコンダクタソリューションズ株式会社 電圧検出回路および光検出装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010100574A2 (en) * 2009-03-06 2010-09-10 Koninklijke Philips Electronics N.V. Advanced temperature compensation and control circuit for single photon counters
JP5872197B2 (ja) * 2011-07-04 2016-03-01 浜松ホトニクス株式会社 フォトダイオードアレイモジュール
GB2510890A (en) * 2013-02-18 2014-08-20 St Microelectronics Res & Dev Method and apparatus
JP6257916B2 (ja) * 2013-04-26 2018-01-10 東芝メディカルシステムズ株式会社 光検出装置、放射線検出装置、放射線分析装置及び光検出方法
JP6314418B2 (ja) * 2013-10-18 2018-04-25 株式会社デンソー レーダ装置
JP2016061729A (ja) * 2014-09-19 2016-04-25 株式会社東芝 光子検出素子、光子検出装置、及び放射線分析装置
TWI544303B (zh) * 2015-01-30 2016-08-01 財團法人工業技術研究院 單光子雪崩光電二極體的超額偏壓控制系統與方法
US9985071B2 (en) * 2016-04-15 2018-05-29 Qualcomm Incorporated Active area selection for LIDAR receivers

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