JP2019195032A - Electronic component mounting device - Google Patents

Electronic component mounting device Download PDF

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JP2019195032A
JP2019195032A JP2018088906A JP2018088906A JP2019195032A JP 2019195032 A JP2019195032 A JP 2019195032A JP 2018088906 A JP2018088906 A JP 2018088906A JP 2018088906 A JP2018088906 A JP 2018088906A JP 2019195032 A JP2019195032 A JP 2019195032A
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block
electronic component
sealing member
base
substrate
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JP6421266B1 (en
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純 柏木
Jun Kashiwagi
純 柏木
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Tech Make Co Ltd
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Tech Make Co Ltd
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Abstract

To provide an electronic component mounting device that can improve the mounting accuracy of electronic components such as semiconductor chips even on thin substrates.SOLUTION: An electronic component mounting device 10 includes: a first block 11 provided with a first surface 11A on which a substrate B on which electronic components are mounted is placed, and a second surface 11B different from the first surface 11A; a heating unit 12 raising the temperature of the first block 11; and a second block 13 provided with a third surface 13A facing the second surface 11B. A through hole 16 having one end 16a opened on the first surface 11A and the other end 16b opened on the second surface 11B is disposed in the first block 11, and a recess 18 is formed on the surface of the third surface 13A, a suction tube 15 communicated with the recess 18 is provided, and a space S formed by the recess 18 through the suction tube 15 is set to a negative pressure.SELECTED DRAWING: Figure 2

Description

本発明は、電子部品実装装置に関する。   The present invention relates to an electronic component mounting apparatus.

電子部品の実装工程として、例えば、半導体チップを配線基板やリードフレーム等(以下、単に基板という。)に搭載してパッケージを組み立てる工程がある。この工程では、はんだ、金メッキ、樹脂等を接合材料として、半導体チップを基板、又は、既にボンディング(搭載して接着)された半導体チップの上にボンディングするためのボンディング装置が使用される。   As an electronic component mounting step, for example, there is a step of assembling a package by mounting a semiconductor chip on a wiring board, a lead frame or the like (hereinafter simply referred to as a substrate). In this step, a bonding apparatus for bonding a semiconductor chip onto a substrate or a semiconductor chip that has already been bonded (mounted and bonded) using solder, gold plating, resin, or the like as a bonding material is used.

このようなボンディング装置は、ヒータが配され基板が載置される基板ステージを備えているものがある。そして、接着剤を介して半導体チップを基板に実装する際、載置された基板をヒータで加熱して接着剤を溶融させるとともに半導体チップを加圧して基板に装着させる構成となっている(例えば、特許文献1参照。)。   Such a bonding apparatus includes a substrate stage on which a heater is disposed and a substrate is placed. When the semiconductor chip is mounted on the substrate via the adhesive, the mounted substrate is heated with a heater to melt the adhesive and pressurize the semiconductor chip to be mounted on the substrate (for example, , See Patent Document 1).

特開2017−183378号公報JP 2017-183378 A

しかしながら、電子機器の小型化に伴う基板の薄型化だけでなく、さらには基板の実装密度の高まりによる電子部品の実装精度要求がますます厳しくなっており、上記従来のボンディング装置ではこのような要求を満たすことが難しくなってきている。   However, not only is the board thinner due to the downsizing of electronic equipment, but also the requirements for mounting accuracy of electronic components due to the increased mounting density of the board are becoming increasingly stringent. It is getting harder to meet.

本発明は上記事情に鑑みて成されたものであり、薄い基板であっても半導体チップ等の電子部品の実装精度を向上させることができる電子部品実装装置を提供することを目的とする。   The present invention has been made in view of the above circumstances, and an object thereof is to provide an electronic component mounting apparatus capable of improving the mounting accuracy of an electronic component such as a semiconductor chip even with a thin substrate.

本発明は、上記課題を解決するため、以下の手段を採用する。
本発明に係る電子部品実装装置は、電子部品が実装される基板が載置される第一面と、該第一面と異なる第二面と、が配された第一基体と、該第一基体を昇温させる加熱部と、 前記第二面と対向する第三面が配された第二基体と、を備え、一端が前記第一面に、他端が前記第二面にそれぞれ開口した貫通孔が前記第一基体に配され、前記第二面又は前記第三面の少なくとも一方の表面に凹部が形成され、前記凹部と連通された吸引管を備え、前記吸引管を介して前記凹部内の空間が負圧とされる。
The present invention employs the following means in order to solve the above problems.
An electronic component mounting apparatus according to the present invention includes a first base on which a first surface on which a substrate on which an electronic component is mounted is placed, and a second surface different from the first surface, and the first base A heating unit that raises the temperature of the substrate, and a second substrate on which a third surface opposite to the second surface is disposed, one end opened on the first surface and the other end opened on the second surface. A through-hole is disposed in the first base, and a recess is formed on at least one surface of the second surface or the third surface. The suction tube communicates with the recess, and the recess is interposed through the suction tube. The inner space is set to negative pressure.

また、本発明に係る電子部品実装装置は、前記凹部の周囲に位置された状態で前記空間内を負圧に維持する弾性の封止部材と、前記封止部材の配設位置よりも外側位置に互いに離間して、かつ、前記第二面又は前記第三面から突出して先端が前記第三面又は前記第二面と対向するよう配された複数の封止部材劣化防止部と、を備え、前記封止部材劣化防止部の頂部と前記第三面又は前記第二面との距離が、弾性変形前の前記封止部材の前記第二面又は前記第三面からの最大突出高さよりも短く形成される。   The electronic component mounting apparatus according to the present invention includes an elastic sealing member that maintains a negative pressure in the space in a state of being positioned around the recess, and an outer position than the arrangement position of the sealing member. A plurality of sealing member deterioration preventing portions that are spaced apart from each other and that protrude from the second surface or the third surface so that the tip faces the third surface or the second surface. The distance between the top of the sealing member deterioration preventing portion and the third surface or the second surface is greater than the maximum protruding height from the second surface or the third surface of the sealing member before elastic deformation. Formed short.

また、本発明に係る電子部品実装装置は、基準孔と複数の長孔とが前記第一基体又は前記第二基体の前記封止部材の外側位置に形成され、前記基準孔及び前記長孔にそれぞれ挿通される突出部が互いに離間して前記第二基体又は前記第一基体に配され、前記長孔の長手方向が前記基準孔の中心を通過するように前記長孔が形成されている。   In the electronic component mounting apparatus according to the present invention, a reference hole and a plurality of long holes are formed at positions outside the sealing member of the first base or the second base, and the reference hole and the long hole The long holes are formed such that projecting portions inserted through the second base or the first base are spaced apart from each other and the longitudinal direction of the long hole passes through the center of the reference hole.

また、本発明に係る電子部品実装装置は、前記第一基体の前記第一面に前記貫通孔の開口部分をつなぐ溝が配されている。   In the electronic component mounting apparatus according to the present invention, a groove connecting the opening portion of the through hole is disposed on the first surface of the first base.

本発明によれば、薄い基板であっても半導体チップ等の電子部品の実装精度を向上させることができる。   According to the present invention, it is possible to improve the mounting accuracy of an electronic component such as a semiconductor chip even with a thin substrate.

本発明の一実施形態に係る電子部品実装装置の概要を示す平面図である。It is a top view which shows the outline | summary of the electronic component mounting apparatus which concerns on one Embodiment of this invention. 本発明の一実施形態に係る電子部品実装装置の概要を示す側面図である。It is a side view which shows the outline | summary of the electronic component mounting apparatus which concerns on one Embodiment of this invention. 図2のC部拡大図である。It is the C section enlarged view of FIG.

本発明に係る一実施形態について、図1から図3を参照して説明する。
本実施形態に係る電子部品実装装置10は、図1及び図2に示すように、不図示の電子部品供給部から供給される不図示の電子部品を基板Bに実装する際に使用されるものである。この電子部品実装装置10は、基板Bが載置される第一ブロック(第一基体)11と、第一ブロック11を昇温させる複数の加熱部12と、第一ブロック11を載置する第二ブロック(第二基体)13と、第二ブロック13と接続された吸引管15と、を備えている。
An embodiment according to the present invention will be described with reference to FIGS.
The electronic component mounting apparatus 10 according to the present embodiment is used when mounting an electronic component (not shown) supplied from an electronic component supply unit (not shown) on a board B as shown in FIGS. 1 and 2. It is. The electronic component mounting apparatus 10 includes a first block (first substrate) 11 on which the substrate B is placed, a plurality of heating units 12 that raise the temperature of the first block 11, and a first block 11 on which the first block 11 is placed. A two block (second base) 13 and a suction pipe 15 connected to the second block 13 are provided.

第一ブロック11は略直方体状に形成され、基板Bが載置される水平な第一面11Aと、第一面11Aの反対側にて第二ブロック13と対向する第二面11Bと、が配されている。また、第一ブロック11には、一端16aが第一面11Aに、他端16bが第二面11Bにそれぞれ開口した直線状の貫通孔16が複数配されている。第二面11Bには一部段差状となっているところがあるものの、全体として平面状に形成されている。なお、本実施形態では貫通孔16は重力方向に直線状に形成されているが、これに限らず曲線状でも構わない。   The first block 11 is formed in a substantially rectangular parallelepiped shape, and includes a horizontal first surface 11A on which the substrate B is placed and a second surface 11B facing the second block 13 on the opposite side of the first surface 11A. It is arranged. The first block 11 is provided with a plurality of linear through holes 16 having one end 16a opened on the first surface 11A and the other end 16b opened on the second surface 11B. Although the second surface 11B has a partly stepped shape, it is formed in a flat shape as a whole. In the present embodiment, the through hole 16 is linearly formed in the direction of gravity, but the present invention is not limited to this and may be curved.

第一ブロック11の第一面11Aには、第一面11Aの中心C1に対して点対称及び線対称となる位置に、貫通孔16の一端16a同士をつなぐ溝17が配されている。基板Bが第一面11Aに載置されたとき、基板Bと溝17とにより形成される挿通路を介して隣接する貫通孔16が連通される。   On the first surface 11A of the first block 11, a groove 17 that connects the ends 16a of the through holes 16 is disposed at a position that is point-symmetric and line-symmetric with respect to the center C1 of the first surface 11A. When the substrate B is placed on the first surface 11 </ b> A, the adjacent through holes 16 are communicated with each other through an insertion passage formed by the substrate B and the groove 17.

加熱部12の主な部分は、貫通孔16間に貫通孔16と略直交する方向に伸びて第一ブロック11内に埋設されている。   A main portion of the heating unit 12 extends between the through holes 16 in a direction substantially orthogonal to the through holes 16 and is embedded in the first block 11.

第二ブロック13は略直方体状に形成され、第二面11Bと対向する第三面13Aが配され、第三面13Aの中央部分には凹部18が形成され、凹部18内に空間Sが形成されている。凹部18の周囲には、弾性のOリング(封止部材)20と、複数のOリング劣化防止部(封止部材劣化防止部)21と、が配されている。これにより、空間Sは、第二面11BとOリング20とによって封止される。   The second block 13 is formed in a substantially rectangular parallelepiped shape, a third surface 13A facing the second surface 11B is arranged, a concave portion 18 is formed in the central portion of the third surface 13A, and a space S is formed in the concave portion 18. Has been. Around the recess 18, an elastic O-ring (sealing member) 20 and a plurality of O-ring deterioration preventing portions (sealing member deterioration preventing portions) 21 are arranged. Thereby, the space S is sealed by the second surface 11B and the O-ring 20.

Oリング劣化防止部21は、Oリング20の配設位置よりもさらに外側位置に互いに離間して、かつ、第三面13Aから突出して配されている。ここで、図3に示すように、Oリング劣化防止部21の頂部21Aと第二面11Bとの距離H1が、弾性変形前のOリング20の第三面13Aからの最大突出高さH2よりも短く形成されている。   The O-ring deterioration preventing portions 21 are arranged so as to be spaced apart from each other further outside the position where the O-ring 20 is disposed and project from the third surface 13A. Here, as shown in FIG. 3, the distance H1 between the top portion 21A of the O-ring deterioration preventing portion 21 and the second surface 11B is greater than the maximum protruding height H2 from the third surface 13A of the O-ring 20 before elastic deformation. Is also formed short.

Oリング20の外側位置にて第二ブロック13と対向する第一ブロック11の四隅には、基準孔22と3つの長孔23A,23B,23Cとがそれぞれ形成されている。各長孔23A,23B,23Cは、それぞれ長手方向中心線L1,L2,L3を有し、それぞれが基準孔22の中心C2を通るように形成されている。また、基準孔22及び長孔23A,23B,23Cにそれぞれ挿通されるショルダーボルト(突出部)25が互いに離間してOリング20の外側位置の第二ブロック13の四隅にそれぞれ立設されている。基準孔22の孔径はショルダーボルト25の直径に対応しているが、長孔23A,23B,23Cは、通常の孔径よりも長手方向L1,L2,L3に長く形成されている。   Reference holes 22 and three long holes 23A, 23B, and 23C are formed at the four corners of the first block 11 facing the second block 13 at the outer position of the O-ring 20, respectively. Each of the long holes 23A, 23B, and 23C has a longitudinal center line L1, L2, and L3, respectively, and is formed so as to pass through the center C2 of the reference hole 22. In addition, shoulder bolts (projections) 25 inserted through the reference hole 22 and the long holes 23A, 23B, and 23C are spaced from each other and are erected at the four corners of the second block 13 outside the O-ring 20, respectively. . The hole diameter of the reference hole 22 corresponds to the diameter of the shoulder bolt 25, but the long holes 23A, 23B, and 23C are formed longer in the longitudinal directions L1, L2, and L3 than the normal hole diameter.

吸引管15は一端が凹部18に開口して凹部18と連通されている。吸引管15の他端側は真空ポンプP等と接続されており、真空ポンプPを駆動することによりOリング20で封止された空間S内を負圧にする。   One end of the suction pipe 15 opens into the recess 18 and communicates with the recess 18. The other end of the suction pipe 15 is connected to a vacuum pump P or the like, and the vacuum pump P is driven to make the inside of the space S sealed with the O-ring 20 a negative pressure.

第一ブロック11の第一面11Aを除く第一ブロック11及び第二ブロック13の周囲には断熱部26が配されている。また、基板Bの帯電防止部27が第一ブロック11と接続されている。   A heat insulating portion 26 is disposed around the first block 11 and the second block 13 excluding the first surface 11A of the first block 11. Further, the antistatic portion 27 of the substrate B is connected to the first block 11.

次に、本実施形態の作用及び効果について説明する。
まず、不図示の電子部品を載置する前の基板Bを第一ブロック11の第一面11Aに載置する。そして、真空ポンプPを駆動して凹部18内を所定の圧力まで負圧にする。このとき、第一ブロック11と第二ブロック13とがより密着してOリング20がさらに弾性変形して収縮する。しかし、第一面11AとOリング劣化防止部21とが当接するまで収縮すると、それ以上の収縮が規制される。こうして凹部18と連通された貫通孔16内も負圧となって基板Bの裏面が第一面11Aに吸着される。
Next, the operation and effect of this embodiment will be described.
First, the substrate B before placing an electronic component (not shown) is placed on the first surface 11 </ b> A of the first block 11. And the vacuum pump P is driven and the inside of the recessed part 18 is made into a negative pressure to a predetermined pressure. At this time, the first block 11 and the second block 13 are more closely attached, and the O-ring 20 is further elastically deformed and contracts. However, if the first surface 11A contracts until the O-ring deterioration preventing portion 21 comes into contact, further contraction is restricted. In this way, the inside of the through hole 16 communicated with the recess 18 also becomes negative pressure, and the back surface of the substrate B is adsorbed to the first surface 11A.

このとき、第一面11Aに溝17が配されているので、溝17がない場合よりも第一面11Aと密着する基板Bの面積が小さい状態で基板Bが第一面11Aに密着する。   At this time, since the groove 17 is arranged on the first surface 11A, the substrate B is in close contact with the first surface 11A in a state where the area of the substrate B in close contact with the first surface 11A is smaller than in the case where there is no groove 17.

電子部品を基板Bに実装する際には、加熱部12を加熱して第一ブロック11を所定の温度まで加熱する。このとき、第一ブロック11が第二ブロック13に対して熱膨張しようとする。ここで、基準孔22の穴径はショルダーボルト25の穴径に対応しているため、第一ブロック11と第二ブロック13とは基準孔22位置にて固定された状態となっている。すなわち、基準孔22を起点として第一ブロック11が熱膨張する。   When the electronic component is mounted on the board B, the heating unit 12 is heated to heat the first block 11 to a predetermined temperature. At this time, the first block 11 tends to thermally expand with respect to the second block 13. Here, since the hole diameter of the reference hole 22 corresponds to the hole diameter of the shoulder bolt 25, the first block 11 and the second block 13 are fixed at the position of the reference hole 22. That is, the first block 11 is thermally expanded starting from the reference hole 22.

このとき、第一ブロック11の長孔23A,23B,23Cが、それぞれの長手方向にしかショルダーボルト25に対する余裕がないため、第一ブロック11は長孔23A,23B,23Cの長手方向に熱膨張する。この間、基板Bが昇温するのにともない電子部品に付着した接着剤が溶融して基板Bと接着される。   At this time, since the long holes 23A, 23B, and 23C of the first block 11 have room for the shoulder bolt 25 only in the longitudinal direction, the first block 11 is thermally expanded in the longitudinal direction of the long holes 23A, 23B, and 23C. To do. During this time, as the temperature of the substrate B rises, the adhesive adhering to the electronic component is melted and bonded to the substrate B.

この電子部品実装装置10によれば、負圧にされる凹部18が設けられているので、貫通孔16を介して基板Bを第一面11Aに吸着して第一ブロック11に対して固定させることができる。また、凹部18が負圧とされるので、凹部18の断熱性を向上させることができ、加熱部12による加熱時に第一ブロック11の熱が第二ブロック13へ逃げてしまうのを抑えることができる。   According to this electronic component mounting apparatus 10, since the concave portion 18 that is made negative pressure is provided, the substrate B is attracted to the first surface 11 </ b> A through the through hole 16 and fixed to the first block 11. be able to. Moreover, since the recessed part 18 is made into a negative pressure, the heat insulation of the recessed part 18 can be improved, and it can suppress that the heat | fever of the 1st block 11 escapes to the 2nd block 13 at the time of the heating by the heating part 12. it can.

さらに、複数のOリング劣化防止部21が配され、その突出高さH1の何れもが、弾性変形前のOリング20の第三面13Aからの最大突出高さH2よりも低い。そのため、凹部18を負圧にする際、第一ブロック11と第二ブロック13との間の接触圧が高まりOリング20が変形してつぶれてしまう前にOリング劣化防止部21の先端を第一ブロック11の第二面11Bに当接させることができ、Oリング20がつぶれてしまうのを抑えることができ、Oリング20の劣化スピードを規制することができる。   Further, a plurality of O-ring deterioration preventing portions 21 are arranged, and any of the protruding heights H1 is lower than the maximum protruding height H2 from the third surface 13A of the O-ring 20 before elastic deformation. Therefore, when the concave portion 18 is set to a negative pressure, the contact pressure between the first block 11 and the second block 13 is increased and the O ring 20 is deformed and crushed before the tip of the O ring deterioration preventing portion 21 is The O-ring 20 can be prevented from being crushed and the deterioration speed of the O-ring 20 can be regulated.

また、第一ブロック11に長孔23A,23B,23Cが配され、各長孔23A,23B,23Cの長手方向中心線L1,L2,L3が基準孔22を通るように形成されている。このため、第一ブロック11が加熱されて第二ブロック13に対して熱変形する際、各長孔23A,23B,23Cがショルダーボルト25に対して自由に移動することができ、第一ブロック11内の熱応力の発生が規制され、第一面11Aの平面度を維持させることができる。   Further, the long holes 23A, 23B, and 23C are arranged in the first block 11, and the longitudinal center lines L1, L2, and L3 of the long holes 23A, 23B, and 23C are formed so as to pass through the reference hole 22. Therefore, when the first block 11 is heated and thermally deformed with respect to the second block 13, the long holes 23 </ b> A, 23 </ b> B, and 23 </ b> C can freely move with respect to the shoulder bolt 25. The generation of the internal thermal stress is restricted, and the flatness of the first surface 11A can be maintained.

また、第一面11Aに溝17が形成されているので、基板Bと第一面11Aとの接触面積を減らすことができ、基板Bと第一面11Aとの間における気泡の発生や基板Bと第一ブロック11との熱膨張率の差による位置ずれを規制して基板Bにおける皺の発生を規制することができる。   In addition, since the groove 17 is formed on the first surface 11A, the contact area between the substrate B and the first surface 11A can be reduced, the generation of bubbles between the substrate B and the first surface 11A, and the substrate B It is possible to regulate the occurrence of wrinkles on the substrate B by regulating the displacement due to the difference in thermal expansion coefficient between the first block 11 and the first block 11.

なお、本発明の技術範囲は上記実施の形態に限定されるものではなく、本発明の趣旨を逸脱しない範囲において種々の変更を加えることが可能である。
例えば、上記実施形態では、第一ブロック11及び第二ブロック13とも略直方体状に形成されているとしているが、形状はこれに限らず、第一面11A、第二面11B、第三面13A等が形成可能な形状のものであれば構わない。
The technical scope of the present invention is not limited to the above embodiment, and various modifications can be made without departing from the spirit of the present invention.
For example, in the above embodiment, the first block 11 and the second block 13 are both formed in a substantially rectangular parallelepiped shape, but the shape is not limited to this, and the first surface 11A, the second surface 11B, and the third surface 13A. Any shape that can be formed is acceptable.

また、凹部18が第二ブロック13の第三面13Aに形成されているとしているが、第一ブロックの第二面に形成されていても構わない。さらに、第二面及び第三面の双方に凹部が形成されていても構わない。   Further, although the recess 18 is formed on the third surface 13A of the second block 13, it may be formed on the second surface of the first block. Furthermore, you may form the recessed part in both the 2nd surface and the 3rd surface.

また、Oリング劣化防止部21は第三面13A側から突出して配されているとしているが、これに限らず、第二面11B側から突出して第三面13Aに当接するように配されていても構わない。そして、Oリング20は第三面13A側でなく、第二面側に配されていても構わない。   In addition, the O-ring deterioration preventing portion 21 is arranged to protrude from the third surface 13A side, but is not limited thereto, and is arranged to protrude from the second surface 11B side and contact the third surface 13A. It doesn't matter. The O-ring 20 may be arranged not on the third surface 13A side but on the second surface side.

また、基準孔22と複数の長孔23A,23B,23Cとが第一ブロック11に形成され、ショルダーボルト25が第一ブロック11に配されているとしているが、基準孔22と複数の長孔23A,23B,23Cとが第二ブロック側に形成され、ショルダーボルト25が第一ブロックに配されていても構わない。さらに、第一面11Aに形成される溝17の位置、すなわち溝17により連通される貫通孔16はどの貫通孔16でもよく、第一面11A上の溝17の配置パターンは本実施形態のものに限らない。   In addition, the reference hole 22 and the plurality of long holes 23A, 23B, and 23C are formed in the first block 11, and the shoulder bolt 25 is arranged in the first block 11, but the reference hole 22 and the plurality of long holes 23A, 23B, and 23C may be formed on the second block side, and the shoulder bolt 25 may be disposed on the first block. Further, the position of the groove 17 formed on the first surface 11A, that is, the through hole 16 communicated by the groove 17 may be any through hole 16, and the arrangement pattern of the groove 17 on the first surface 11A is that of this embodiment. Not limited to.

また、第二ブロック13には、第三面13Aと反対側の面13Bに凹部18とは異なる別の凹みが形成されていてもよい。この場合、吸引管15により空間S内が負圧になった際に第二ブロック13の反りを規制することができる。   The second block 13 may be formed with another recess different from the recess 18 on the surface 13B opposite to the third surface 13A. In this case, the warp of the second block 13 can be restricted when the inside of the space S becomes negative pressure by the suction pipe 15.

10 電子部品実装装置
11 第一ブロック(第一基体)
11A 第一面
11B 第二面
12 加熱部
13 第二ブロック(第二基体)
13A 第三面
15 吸引管
16 貫通孔
16a 一端
16b 他端
17 溝
18 凹部
20 Oリング(封止部材)
21 Oリング劣化防止部(封止部材劣化防止部)
21A 頂部
22 基準孔
23A,23B,23C 長孔
25 ショルダーボルト
S 空間
10 Electronic Component Mounting Device 11 First Block (First Base)
11A 1st surface 11B 2nd surface 12 Heating part 13 2nd block (2nd base | substrate)
13A Third surface 15 Suction tube 16 Through hole 16a One end 16b The other end 17 Groove 18 Recess 20 O-ring (sealing member)
21 O-ring deterioration prevention part (sealing member deterioration prevention part)
21A Top 22 Reference hole 23A, 23B, 23C Long hole 25 Shoulder bolt S Space

本発明は、上記課題を解決するため、以下の手段を採用する。
本発明に係る電子部品実装装置は、電子部品が実装される基板が載置される第一面と、該第一面と異なる第二面と、が配された第一基体と、該第一基体を昇温させる加熱部と、 前記第二面と対向する第三面が配された第二基体と、を備え、一端が前記第一面に、他端が前記第二面にそれぞれ開口した貫通孔が前記第一基体に配され、前記第二面又は前記第三面の少なくとも一方の表面に凹部が形成され、前記凹部と連通された吸引管を備え、前記吸引管を介して前記凹部内の空間が負圧とされ、前記凹部の周囲に位置された状態で前記空間内を負圧に維持する弾性の封止部材と、前記封止部材の配設位置よりも外側位置に互いに離間して、かつ、前記第二面又は前記第三面から突出して先端が前記第三面又は前記第二面と対向するよう配された複数の封止部材劣化防止部と、を備え、前記封止部材劣化防止部の頂部と前記第三面又は前記第二面との距離が、弾性変形前の前記封止部材の前記第二面又は前記第三面からの最大突出高さよりも短く形成される。
The present invention employs the following means in order to solve the above problems.
An electronic component mounting apparatus according to the present invention includes a first base on which a first surface on which a substrate on which an electronic component is mounted is placed, and a second surface different from the first surface, and the first base A heating unit that raises the temperature of the substrate, and a second substrate on which a third surface opposite to the second surface is disposed, one end opened on the first surface and the other end opened on the second surface. A through-hole is disposed in the first base, and a recess is formed on at least one surface of the second surface or the third surface. The suction tube communicates with the recess, and the recess is interposed through the suction tube. An elastic sealing member that maintains a negative pressure in the space in a state in which the inner space is set to a negative pressure and is positioned around the recess, and is spaced apart from the position where the sealing member is disposed. And a tip projecting from the second surface or the third surface is arranged to face the third surface or the second surface. A plurality of sealing member deterioration preventing portions, and the distance between the top of the sealing member deterioration preventing portion and the third surface or the second surface is the second of the sealing member before elastic deformation. than the maximum protrusion height from the surface or the third surface Ru is shorter.

Claims (4)

電子部品が実装される基板が載置される第一面と、該第一面と異なる第二面と、が配された第一基体と、
該第一基体を昇温させる加熱部と、
前記第二面と対向する第三面が配された第二基体と、
を備え、
一端が前記第一面に、他端が前記第二面にそれぞれ開口した貫通孔が前記第一基体に配され、
前記第二面又は前記第三面の少なくとも一方の表面に凹部が形成され、
前記凹部と連通された吸引管を備え、
前記吸引管を介して前記凹部内の空間が負圧とされる電子部品実装装置。
A first base on which a first surface on which a substrate on which electronic components are mounted is placed and a second surface different from the first surface are arranged;
A heating section for raising the temperature of the first substrate;
A second substrate on which a third surface facing the second surface is disposed;
With
A through hole having one end opened on the first surface and the other end opened on the second surface is arranged in the first base,
A recess is formed on at least one surface of the second surface or the third surface,
A suction tube communicated with the recess,
An electronic component mounting apparatus in which a space in the concave portion is set to a negative pressure through the suction pipe.
前記凹部の周囲に位置された状態で前記空間内を負圧に維持する弾性の封止部材と、
前記封止部材の配設位置よりも外側位置に互いに離間して、かつ、前記第二面又は前記第三面から突出して先端が前記第三面又は前記第二面と対向するよう配された複数の封止部材劣化防止部と、
を備え、
前記封止部材劣化防止部の頂部と前記第三面又は前記第二面との距離が、弾性変形前の前記封止部材の前記第二面又は前記第三面からの最大突出高さよりも短く形成される請求項1に記載の電子部品実装装置。
An elastic sealing member that maintains a negative pressure in the space in a state of being located around the recess;
The sealing member is arranged so as to be separated from each other at a position outside the arrangement position of the sealing member, and protrudes from the second surface or the third surface so that the tip faces the third surface or the second surface. A plurality of sealing member deterioration preventing portions;
With
The distance between the top of the sealing member deterioration preventing portion and the third surface or the second surface is shorter than the maximum protruding height from the second surface or the third surface of the sealing member before elastic deformation. The electronic component mounting apparatus according to claim 1, which is formed.
基準孔と複数の長孔とが前記第一基体又は前記第二基体の前記封止部材の外側位置に形成され、
前記基準孔及び前記長孔にそれぞれ挿通される突出部が互いに離間して前記第二基体又は前記第一基体に配され、
前記長孔の長手方向が前記基準孔の中心を通過するように前記長孔が形成されている請求項1又は2に記載の電子部品実装装置。
A reference hole and a plurality of long holes are formed at positions outside the sealing member of the first base or the second base,
Protrusions respectively inserted into the reference hole and the long hole are spaced apart from each other and arranged on the second base or the first base,
The electronic component mounting apparatus according to claim 1, wherein the long hole is formed so that a longitudinal direction of the long hole passes through a center of the reference hole.
前記第一基体の前記第一面に前記貫通孔の開口部分をつなぐ溝が配されている請求項1から3の何れか一つに記載の電子部品実装装置。

The electronic component mounting apparatus according to any one of claims 1 to 3, wherein a groove that connects an opening portion of the through hole is disposed on the first surface of the first base.

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000349430A (en) * 1999-06-02 2000-12-15 Nec Tohoku Ltd Device for sucking and heating substrate
JP2001251099A (en) * 2000-03-07 2001-09-14 Matsushita Electric Ind Co Ltd Jig for holding board for electronic component mounting device
JP2011218643A (en) * 2010-04-08 2011-11-04 Suzuki Motor Corp Seal structure
JP2014214778A (en) * 2013-04-24 2014-11-17 三菱電線工業株式会社 Seal material

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000349430A (en) * 1999-06-02 2000-12-15 Nec Tohoku Ltd Device for sucking and heating substrate
JP2001251099A (en) * 2000-03-07 2001-09-14 Matsushita Electric Ind Co Ltd Jig for holding board for electronic component mounting device
JP2011218643A (en) * 2010-04-08 2011-11-04 Suzuki Motor Corp Seal structure
JP2014214778A (en) * 2013-04-24 2014-11-17 三菱電線工業株式会社 Seal material

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