JP2019192925A - Semiconductor device - Google Patents

Abstract

To provide a transistor using an oxide semiconductor film which reduces contact resistance between an oxide semiconductor film and a metal film and has excellent on-state characteristics.SOLUTION: A semiconductor device has a pair of electrodes on an insulating surface, an oxide semiconductor film provided in contact with the pair of electrodes, a gate insulation film on the oxide semiconductor film and a gate electrode which overlaps the oxide semiconductor film via the gate insulation film, in which the pair of electrode contains a halogen element in a region contacting the oxide semiconductor film. In addition, a plasma treatment in a fluorine-containing atmosphere can be used as a method of impregnating the region of the pair of electrodes, which contacts the oxide semiconductor film with the halogen element.SELECTED DRAWING: Figure 1

Description

The present invention relates to a semiconductor device and a method for manufacturing the semiconductor device.

Note that in this specification, a semiconductor device refers to all devices that can function by utilizing semiconductor characteristics, and an electro-optical device, a semiconductor circuit, and an electronic device are all semiconductor devices.

A silicon-based semiconductor material is widely known as a material for a semiconductor thin film applicable to a transistor, but an oxide semiconductor has attracted attention as another material.

Transistors using amorphous silicon, which has established manufacturing technology, are often used for display devices. However, transistors using amorphous silicon have low field-effect mobility and high-definition display devices. In addition, there are problems in reducing power consumption.

In addition, a transistor using amorphous silicon also has a problem that electrical characteristics are significantly deteriorated (reliability is low) due to temperature change and repeated operation.

In addition, semiconductor devices (such as semiconductor memory devices) that use transistors using single crystal silicon having high field-effect mobility have increased power consumption due to high integration and circuit complexity in accordance with scaling rules. It is a problem.

A transistor using an oxide semiconductor is known to have higher field-effect mobility than a transistor using amorphous silicon. Further, since it is easy to form a film on a mother glass having a large area by sputtering or the like, application to a display device has been actively studied.

On the other hand, it is pointed out that when an oxide semiconductor and an aluminum-based alloy wiring are directly connected, a high-resistance aluminum oxide is generated and contact resistance is increased (see Patent Document 1).

In addition, when a metal that is relatively difficult to oxidize or a metal having an oxide conductivity is used, a high-resistance metal oxide is formed at the interface with the oxide semiconductor by heat treatment in a later step,
Not a little, contact resistance may increase.

As described above, there is a problem that the on-characteristics of the transistor are deteriorated due to the high contact resistance between the metal and the oxide semiconductor.

In addition, a technique is disclosed in which a low-resistance buffer layer is provided between an oxide semiconductor and a metal in order to reduce contact resistance. In addition, an oxide semiconductor containing nitrogen is disclosed as a buffer layer (see Patent Document 2).

JP 2011-49542 A JP 2011-9724 A

As described above, in a transistor including an oxide semiconductor film, the on-state characteristics of the transistor are deteriorated due to contact resistance between the metal film and the oxide semiconductor film. Therefore, the performance of the semiconductor device including the transistor is sufficiently extracted. May not be possible.

In other words, the on-characteristics of the transistor may be reduced to about 30% to 70%, or in some cases, 10% or less of the on-characteristic of the transistor that is supposed to be obtained due to factors that hinder carrier movement.

As described above, in a transistor including an oxide semiconductor film, it is desired to reduce the contact resistance between the oxide semiconductor film and the metal film, which is a factor that decreases the on-state characteristics.

An object of one embodiment of the present invention is to reduce contact resistance between an oxide semiconductor film and a metal film.

Another object of one embodiment of the present invention is to provide a transistor including an oxide semiconductor film with excellent on-state characteristics.

One embodiment of the present invention is a pair of electrodes over an insulating surface, an oxide semiconductor film provided in contact with the pair of electrodes, a gate insulating film over the oxide semiconductor film, and the oxide semiconductor with the gate insulating film interposed therebetween. The semiconductor device includes a gate electrode overlapping with the film, and a halogen element is included in a region in contact with the oxide semiconductor film in the pair of electrodes.

One embodiment of the present invention includes a gate electrode over an insulating surface, a gate insulating film over the gate electrode, a pair of electrodes over the gate insulating film, and an oxide semiconductor film provided in contact with the pair of electrodes. In the pair of electrodes, the semiconductor device is characterized by containing a halogen element in a region in contact with the oxide semiconductor film.

In one embodiment of the present invention, a pair of electrodes is formed over an insulating surface, a halogenation treatment is performed on the pair of electrodes, an oxide semiconductor film in contact with the pair of electrodes is formed, and the oxide semiconductor film is formed A method for manufacturing a semiconductor device is characterized in that a gate insulating film is formed and a gate electrode is formed so as to overlap with the oxide semiconductor film with the gate insulating film interposed therebetween.

In one embodiment of the present invention, a gate electrode is formed over an insulating surface, a gate insulating film is formed over the gate electrode, a pair of electrodes is formed over the gate insulating film, and the pair of electrodes are subjected to halogenation treatment. After the step, an oxide semiconductor film in contact with the pair of electrodes is formed.

One embodiment of the present invention is a method for manufacturing a semiconductor device, in which the halogenation treatment is plasma treatment in an atmosphere containing fluorine. As the atmosphere containing fluorine, for example, nitrogen trifluoride gas or the like can be used. The plasma treatment is performed using ICP (Inducti
For example, a very coupled plasma (inductively coupled plasma) apparatus may be used. In addition, it is preferable to use a high-density plasma apparatus because damage to the object to be processed due to plasma is reduced.

Further, the halogenation treatment does not need to be a plasma treatment, and can be performed by exposing an object to be treated to an atmosphere containing a halogen element. At that time, when the workpiece is heated,
This is preferable because the halogenation treatment is accelerated. Moreover, you may immerse in the liquid containing a halogen element.

The semiconductor device according to one embodiment of the present invention has a so-called bottom contact transistor structure in which an upper surface of a pair of electrodes functioning as a source electrode and a drain electrode is in contact with an oxide semiconductor film. By using such a structure, when the pair of electrodes is processed by dry etching or the like, there is no influence such as etching of the oxide semiconductor film, so that the thickness control of the oxide semiconductor film is easy. Also, there is no damage due to processing,
The reliability of the transistor is improved. The above effects are the same in both the top gate type and bottom gate type structures.

During the formation of the oxide semiconductor film over the metal film or by heat treatment in a state where the metal film and the oxide semiconductor film are in contact with each other, the metal film is oxidized by oxygen from the oxide semiconductor film, whereby the metal film and the oxide film are oxidized. A metal oxide film is formed at the interface of the physical semiconductor film. Therefore, contact resistance between the metal film and the oxide semiconductor film increases.

Therefore, before forming the oxide semiconductor film, the reaction between the metal film and the oxide semiconductor film is suppressed by forming a bond with a halogen element (termination with a halogen element) on the surface of the metal film, thereby reducing the metal oxide film. It is possible to suppress the formation of. Thereby, an increase in contact resistance in the metal film and the oxide semiconductor film can be suppressed. At the same time, diffusion of oxygen from the oxide semiconductor to the metal film can be prevented. Therefore, formation of oxygen vacancies in the oxide semiconductor film can be suppressed.

According to one embodiment of the present invention, contact resistance between an oxide semiconductor film and a metal film can be reduced.

According to one embodiment of the present invention, a transistor including an oxide semiconductor film with excellent on-state characteristics can be provided.

4A and 4B are a top view and cross-sectional views illustrating an example of a transistor according to one embodiment of the present invention. FIG. 10 is a cross-sectional view illustrating an example of a transistor of one embodiment of the present invention. 6A and 6B are cross-sectional views illustrating an example of a manufacturing process of a transistor according to one embodiment of the present invention. 6A and 6B are cross-sectional views illustrating an example of a manufacturing process of a transistor according to one embodiment of the present invention. 4A and 4B are a top view and cross-sectional views illustrating an example of a transistor according to one embodiment of the present invention. 6A and 6B are cross-sectional views illustrating an example of a manufacturing process of a transistor according to one embodiment of the present invention. 4A and 4B are a circuit diagram and an electrical characteristic diagram illustrating an example of a semiconductor memory device including a transistor according to one embodiment of the present invention. 4A and 4B are a circuit diagram and an electrical characteristic diagram illustrating an example of a semiconductor memory device including a transistor according to one embodiment of the present invention. 4A and 4B are a block diagram and a circuit diagram of a part of a specific example of a CPU including a transistor according to one embodiment of the present invention. FIG. 10 is a perspective view illustrating an example of an electronic device including a transistor according to one embodiment of the present invention.

(Embodiment 1)
In this embodiment, a transistor which is a semiconductor device according to one embodiment of the present invention and a manufacturing method thereof will be described with reference to FIGS.

1A to 1C are a top view and cross-sectional views of a transistor which is a semiconductor device according to one embodiment of the present invention. FIG. 1B illustrates a cross section taken along a dashed line AB in the top view of the transistor illustrated in FIG. Note that FIG. 1A illustrates an interlayer insulating film 112 in order to prevent complication.
In addition, the gate insulating film 108 and the like are omitted.

The transistor illustrated in FIG. 1B is provided in contact with the substrate 100, the base insulating film 102 provided over the substrate 100, the pair of electrodes 104 provided over the base insulating film 102, and the pair of electrodes 104. Oxide semiconductor film 106 to be formed and a gate insulating film 108 over the oxide semiconductor film 106
A gate electrode 110 overlapping with the oxide semiconductor film 106 with the gate insulating film 108 interposed therebetween,
An interlayer insulating film 112 provided over the gate electrode 110 and the gate insulating film 108. Note that a structure without the base insulating film 102 may be employed.

The pair of electrodes 104 includes Si, Ge, Al, Ti, Cr, Co, Ni, Cu, Y, Zr, M
One or more of o, Ag, Ru, Ta, Sn or W, their nitrides, oxides, and alloys may be selected and used in a single layer or a stacked layer. Alternatively, an oxide or oxynitride containing at least In and Zn may be used. For example, an In—Ga—Zn—O—N-based material or the like may be used. Note that the pair of electrodes 104 functions as a source electrode and a drain electrode of the transistor and can also be used as a wiring.

In the pair of electrodes 104, a region in contact with the oxide semiconductor film 106 contains a halogen element. For example, fluorine or chlorine is contained. In this manner, by forming a bond with a halogen element (termination with a halogen element) on the surface of the pair of electrodes 104, a reaction between the pair of electrodes 104 and the oxide semiconductor film 106 is suppressed, and formation of a metal oxide film is performed. It becomes possible to suppress. Therefore, generation of a resistance component due to formation of the metal oxide film can be suppressed, and contact resistance between the pair of electrodes 104 and the oxide semiconductor film 106 can be reduced. At the same time, the oxide semiconductor film 1
Oxygen diffusion from 06 to the pair of electrodes 104 can also be prevented. Therefore, formation of oxygen vacancies in the oxide semiconductor film 106 can be suppressed.

The oxide semiconductor film 106 includes a low resistance region 106b and a high resistance region 106a.

The low resistance region 106b is a region including an impurity that reduces the resistance of the oxide semiconductor film. For example, the low resistance region 106b is a region including one or more selected from hydrogen, helium, boron, nitrogen, fluorine, neon, aluminum, phosphorus, argon, arsenic, krypton, indium, tin, antimony, and xenon.

By forming the low-resistance region 106b, deterioration in on-state characteristics of the transistor including the oxide semiconductor film 106 can be suppressed. The low resistance region 106b has a sheet resistance of 30 kΩ / sq.
Hereinafter, it is preferably 10 kΩ / sq or less, more preferably 1 kΩ / sq or less, and further preferably 0.7 kΩ / sq or less.

The high-resistance region 106a is a region where the concentration of components other than the main component of the oxide semiconductor film, that is, the impurity concentration is low. For example, the high resistance region 106a has an impurity concentration of 1 × 10 ²⁰ atoms / cm.
³ or less, preferably 5 × 10 ¹⁹ atoms / cm ³ or less, more preferably 1 × 10 ^1
This is an area of ⁹ atoms / cm ³ or less. However, since it is difficult to strictly separate the main component and the impurity, in this specification, an element contained in an amount of 1 atomic% or more is a main component.

The high resistance region 106a is a region having a low impurity concentration and a low defect density, and FIG.
Since the channel region is formed in the high resistance region 106a, the transistor shown in FIG. In addition, the off-state current value of the transistor is low. For example, a transistor having an off-current value per channel width of 1 μm of 1 × 10 ⁻¹⁸ A or less, preferably 1 × 10 ⁻²¹ A or less, and more preferably 1 × 10 ⁻²⁴ A or less can be used.

A material used for the oxide semiconductor film 106 preferably contains at least indium (In) or zinc (Zn). In particular, In and Zn are preferably included. In addition, it is preferable that gallium (Ga) be included in addition to the stabilizer for reducing variation in electrical characteristics of the transistor including the oxide semiconductor. The stabilizer preferably includes tin (Sn), hafnium (Hf), aluminum (Al), titanium (Ti), or zirconium (Zr).

In addition, as other stabilizers, lanthanoids such as lanthanum (La), cerium (
Ce), praseodymium (Pr), neodymium (Nd), samarium (Sm), europium (Eu), gadolinium (Gd), terbium (Tb), dysprosium (Dy), holmium (Ho), erbium (Er), thulium ( Tm), ytterbium (Yb), or lutetium (Lu) may be used alone or in combination.

For example, as an oxide semiconductor, indium oxide, tin oxide, zinc oxide, In—Zn oxide, Sn—Zn oxide, Al—Zn oxide, Zn—Mg oxide that is an oxide of a binary metal Oxides, Sn—Mg oxides, In—Mg oxides, In—Ga oxides, In—Ga—Zn oxides (also referred to as IGZO) which are oxides of ternary metals, In— Al-Zn oxide, In-Sn-Zn oxide, Sn-Ga-Zn oxide, Al-Ga-Zn oxide, Sn-Al-Zn oxide, In-Hf-Zn oxide In-La-Zn-based oxide, In-Ce-Zn-based oxide, In-Pr-Zn-based oxide, In-Nd-Zn-based oxide, In-Sm-Zn-based oxide, In-Eu -Zn-based oxide, In-Gd-Zn-based oxide,
In-Tb-Zn-based oxide, In-Dy-Zn-based oxide, In-Ho-Zn-based oxide, I
n-Er-Zn-based oxide, In-Tm-Zn-based oxide, In-Yb-Zn-based oxide, In
-Lu-Zn-based oxide, In-Sn-Ga-Zn-based oxide which is an oxide of a quaternary metal, I
n-Hf-Ga-Zn-based oxide, In-Al-Ga-Zn-based oxide, In-Sn-Al-
A Zn-based oxide, an In-Sn-Hf-Zn-based oxide, or an In-Hf-Al-Zn-based oxide can be used.

The oxide semiconductor film 106 is in a single crystal state, a polycrystalline (also referred to as polycrystal) state, an amorphous state, or the like.

The oxide semiconductor film 106 is preferably a CAAC-OS (C Axis Aligned).
A Crystalline Oxide Semiconductor) film.

The CAAC-OS film is not completely single crystal nor completely amorphous. The CAAC-OS film is an oxide semiconductor film with a crystal-amorphous mixed phase structure where crystal parts are included in an amorphous phase. Note that the crystal part is often large enough to fit in a cube whose one side is less than 100 nm. Also,
Transmission Electron Microscope (TEM: Transmission Electron Micro)
In the observation image by (scope), the boundary between the amorphous part and the crystal part included in the CAAC-OS film is not clear. Further, a grain boundary (also referred to as a grain boundary) cannot be confirmed in the CAAC-OS film by TEM. Therefore, in the CAAC-OS film, reduction in electron mobility due to grain boundaries is suppressed.

In the crystal part included in the CAAC-OS film, the c-axis is aligned in a direction parallel to the normal vector of the formation surface of the CAAC-OS film or the normal vector of the surface, and triangular when viewed from the direction perpendicular to the ab plane. It has a shape or hexagonal atomic arrangement, and metal atoms are arranged in layers or metal atoms and oxygen atoms are arranged in layers as viewed from the direction perpendicular to the c-axis. Note that the directions of the a-axis and the b-axis may be different between different crystal parts. In the present specification, when simply described as vertical, 8
The range of 5 ° to 95 ° is also included. In addition, when simply described as parallel, −5
A range of not less than 5 ° and not more than 5 ° is also included.

Note that the distribution of crystal parts in the CAAC-OS film is not necessarily uniform. For example, CAA
In the formation process of the C-OS film, when crystal growth is performed from the surface side of the oxide semiconductor film, the ratio of crystal parts in the vicinity of the surface of the oxide semiconductor film may be higher in the vicinity of the surface. CA
When an impurity is added to the AC-OS film, the crystal part in a region to which the impurity is added becomes amorphous in some cases.

Since the c-axis of the crystal part included in the CAAC-OS film is aligned in a direction parallel to the normal vector of the formation surface of the CAAC-OS film or the normal vector of the surface, the shape of the CAAC-OS film (formation surface) Depending on the cross-sectional shape of the surface or the cross-sectional shape of the surface). Note that the c-axis direction of the crystal part is parallel to the normal vector of the surface where the CAAC-OS film is formed or the normal vector of the surface. The crystal part is formed by film formation or by performing crystallization treatment such as heat treatment after film formation.

A transistor including a CAAC-OS film can reduce variation in electrical characteristics due to irradiation with visible light or ultraviolet light. Therefore, the transistor has high reliability.

There is no particular limitation on the substrate 100, but it is necessary to have at least heat resistance enough to withstand heat treatment performed later. For example, a glass substrate, a ceramic substrate, a quartz substrate, a sapphire substrate, or the like may be used as the substrate 100. In addition, single crystal semiconductor substrates such as silicon and silicon carbide, polycrystalline semiconductor substrates, compound semiconductor substrates such as silicon germanium, SOI (
A silicon on insulator) substrate or the like can also be applied, and a substrate in which a semiconductor element is provided over these substrates is preferably used.

Further, a flexible substrate may be used as the substrate 100. Note that as a method for providing a transistor over a flexible substrate, there is a method in which after a transistor is manufactured over a non-flexible substrate, the transistor is peeled off and transferred to the substrate 100 which is a flexible substrate. In that case,
A separation layer may be provided between the non-flexible substrate and the transistor.

The base insulating film 102 is formed using silicon oxide, silicon oxynitride, silicon nitride oxide, silicon nitride, aluminum oxide, aluminum nitride, hafnium oxide, zirconium oxide, yttrium oxide, gallium oxide, lanthanum oxide, cesium oxide, tantalum oxide, and magnesium oxide. One or more may be selected and used in a single layer or a stacked layer.

The base insulating film 102 preferably has sufficient flatness. Specifically, a film serving as a base is provided so that the average surface roughness (Ra) is 1 nm or less, preferably 0.3 nm or less, and more preferably 0.1 nm or less. When Ra is less than or equal to the above numerical value, a crystal region is easily formed in the oxide semiconductor film 106. Ra is a three-dimensional extension of the centerline average roughness defined in JIS B0601 so that it can be applied to a surface. “A value obtained by averaging the absolute values of deviations from a reference surface to a specified surface” And is defined by Equation 1.

In Equation 1, S ₀ is the measurement surface (coordinates (x1, y1) (x1, y2) (x2, y
1) indicates the area of (rectangular region surrounded by four points represented by (x2, y2)), and Z ₀
Indicates the average height of the measurement surface. Ra is an atomic force microscope (AFM).
Evaluation can be made at Microscope).

Silicon oxynitride means that the composition contains more oxygen than nitrogen,
For example, oxygen ranges from 50 atomic% to 70 atomic%, nitrogen ranges from 0.5 atomic% to 15 atomic%, silicon ranges from 25 atomic% to 35 atomic%, and hydrogen ranges from 0 atomic% to 10 atomic%. It means what is included. Silicon nitride oxide refers to a composition having a nitrogen content higher than that of oxygen. For example, oxygen is 5 atomic% to 30 atomic% and nitrogen is 20%.
It includes those in a range of from atomic percent to 55 atomic percent, silicon from 25 atomic percent to 35 atomic percent, and hydrogen from 10 atomic percent to 25 atomic percent. However, the above range is Rutherford Backscattering Spectroscopy (RBS).
rommetry) and hydrogen forward scattering (HFS)
It is a thing at the time of measuring using catalysis Spectrometry).
Further, the composition of the constituent elements takes a value that the total does not exceed 100 atomic%.

The base insulating film 102 is preferably an insulating film from which oxygen is released by heat treatment.

“Oxygen is released by heat treatment” means that the amount of released oxygen converted to oxygen atoms is 1.0 × 10 ¹⁸ atoms / cm ³ or more, preferably 3.0 × 10 ²⁰ atoms in TDS analysis.
It means ms / cm ³ or more.

Here, a method for measuring the amount of released oxygen converted into oxygen atoms in TDS analysis will be described below.

The amount of gas released when TDS analysis is performed is proportional to the integral value of the spectrum. For this reason, the amount of gas emission can be calculated from the ratio between the measured integral value of the spectrum and the reference value of the standard sample. The reference value of the standard sample is a ratio of the density of atoms to the integral value of the spectrum of a sample containing a predetermined atom.

For example, the release amount (N _O2 ) of oxygen molecules in the insulating film can be obtained from Equation 2 from the TDS analysis result of a silicon wafer containing hydrogen of a predetermined density as a standard sample and the TDS analysis result of the insulating film. . Here, it is assumed that all the spectra detected by the mass number 32 obtained by the TDS analysis are derived from oxygen molecules. There is CH ₃ OH in addition to those having a mass number of 32, but these are not considered here because they are unlikely to exist. In addition, oxygen molecules containing oxygen atoms with a mass number of 17 and oxygen atoms with a mass number of 18 which are isotopes of oxygen atoms are not considered because the existence ratio in nature is extremely small.

N _H2 is a value obtained by converting hydrogen molecules desorbed from the standard sample by density. _SH2 is an integral value of a spectrum when a standard sample is subjected to TDS analysis. Here, the reference value of the standard sample is N
Let _H2 / _SH2 . S _O2 is an integral value of a spectrum when the insulating film is subjected to TDS analysis. α is a coefficient that affects the spectral intensity in the TDS analysis. For details of Equation 2, refer to Japanese Patent Laid-Open No. Hei 6-275697. The amount of oxygen released from the insulating film is
Using a temperature programmed desorption analyzer EMD-WA1000S / W manufactured by Electronic Science Co., Ltd., measurement is performed using a silicon wafer containing 1 × 10 ¹⁶ atoms / cm ³ hydrogen atoms as a standard sample.

In TDS analysis, part of oxygen is detected as oxygen atoms. The ratio of oxygen molecules to oxygen atoms can be calculated from the ionization rate of oxygen molecules. Note that since the above α includes the ionization rate of oxygen molecules, the amount of released oxygen atoms can be estimated by evaluating the amount of released oxygen molecules.

Note that N _{2 O 2} is the amount of released oxygen molecules. The amount of release when converted to oxygen atoms is twice the amount of release of oxygen molecules.

By supplying oxygen from the base insulating film 102 to the oxide semiconductor film 106, the interface state density between the oxide semiconductor film 106 and the base insulating film 102 can be reduced. As a result, carriers can be prevented from being trapped at the interface between the oxide semiconductor film 106 and the base insulating film 102 due to the operation of the transistor, and a highly reliable transistor can be obtained.

Further, charge may be generated due to oxygen vacancies in the oxide semiconductor film 106. In general, oxygen vacancies in the oxide semiconductor film 106 partly serve as donors and emit electrons as carriers.
As a result, the threshold voltage of the transistor shifts in the negative direction. Therefore, a factor in which the threshold voltage is shifted in the negative direction because oxygen is sufficiently supplied from the base insulating film 102 to the oxide semiconductor film 106, and preferably, the oxide semiconductor film 106 contains excessive oxygen. Thus, the oxygen deficiency density of the oxide semiconductor film 106 can be reduced.

The gate insulating film 108 may be formed using a method and a material similar to those of the base insulating film 102.

The gate electrode 110 may be formed using a method and a material similar to those of the pair of electrodes 104.

1 illustrates a structure in which the gate electrode 110 and the pair of electrodes 104 do not overlap with each other and an offset region is formed in the oxide semiconductor film 106; however, the present invention is not limited to this. For example, a structure in which the gate electrode 110 and one electrode 104 overlap with each other may be employed.

The interlayer insulating film 112 is formed using a method and a material similar to those of the base insulating film 102.

The interlayer insulating film 112 preferably has a small relative dielectric constant and a sufficient thickness. For example,
A silicon oxide film having a relative dielectric constant of about 3.8 may be used and the thickness may be greater than or equal to 300 nm and less than or equal to 1000 nm. The surface of the interlayer insulating film 112 has a slight fixed charge due to the influence of atmospheric components and the like, and the threshold voltage of the transistor may vary due to the influence. Therefore, it is preferable that the interlayer insulating film 112 has a relative dielectric constant and thickness in a range in which the influence of charges generated on the surface is sufficiently reduced. For the same reason, the influence of electric charges generated on the surface may be reduced by forming a resin film on the interlayer insulating film 112.

In the transistor structure shown in FIG. 1, the surfaces of the pair of electrodes and the base insulating film are approximately the same and are flat. Therefore, it has a planar structure in which the oxide semiconductor film is formed flat. However, it is not limited to such a structure, and a structure as shown in FIG. 2 may be used. In the transistor structure illustrated in FIG. 2, a pair of electrodes 204 is formed over a flat base insulating film 202, and an oxide semiconductor film 206 is formed thereover. 2, the oxide semiconductor film 206 includes a low-resistance region 20 as in the oxide semiconductor film 106 illustrated in FIG. 1.
6b shows a structure including 6b and a high resistance region 206a. However, the structure is not limited to such a structure, and the low resistance region and the high resistance region may not be formed in the oxide semiconductor film. The structure shown in FIG. 1 is a chemical mechanical polishing (CMP).
Although a planarization process such as (Anal Polishing) is necessary, the structure shown in FIG. 2 does not require a planarization process, and thus the process becomes easy.

Next, a method for manufacturing the transistor illustrated in FIG. 1B will be described with reference to FIGS.

First, the base insulating film 102 is formed over the substrate 100. The base insulating film 102 is formed by a chemical vapor deposition (CVD) method, a sputtering method, a molecular beam epitaxy (MBE) method, or a pulsed laser deposition (PLD).
The film may be formed by a method, and a sputtering method is preferably used. Note that the base insulating film 102 is not necessarily provided depending on the substrate 100.

Next, a conductive film is formed over the base insulating film 102. The conductive film is preferably formed by a sputtering method.

Next, the conductive film is processed to form the pair of electrodes 104 (see FIG. 3A). Note that “processing” means that a film having a desired shape is obtained by performing etching using a resist mask formed by a photolithography method, unless otherwise specified.

Next, an insulating film is formed so as to cover the pair of electrodes 104. The insulating film is formed using the same material and method as the base insulating film.

After that, planarization treatment such as CMP treatment is performed, and the insulating film is polished until the pair of electrodes 104 are exposed. (See FIG. 3B.)

Next, a halogenation process is performed on the exposed pair of electrodes 104. Halogenation treatment
It can be performed by plasma treatment in an atmosphere containing a halogen element. For example, plasma treatment may be performed using a dry etching apparatus or a plasma CVD apparatus in an atmosphere containing nitrogen trifluoride gas. Further, the halogenation treatment does not need to be a plasma treatment, and can be performed by exposing an object to be treated to an atmosphere containing a halogen element. At that time, it is preferable to heat the object to be processed because the halogenation treatment is accelerated. Also,
You may immerse in the liquid containing a halogen element.

After the halogenation treatment is performed on the pair of electrodes 104, an oxide semiconductor film is formed. The oxide semiconductor film may be formed by a CVD method, a sputtering method, an MBE method, or a PLD method, and a sputtering method is preferably used.

Heat treatment may be performed after the oxide semiconductor film is formed. When the heat treatment is performed, the degree of crystallinity of the oxide semiconductor film is increased. In addition, the concentration of impurities (such as hydrogen and moisture) in the oxide semiconductor film can be reduced and the defect density can be reduced.

The heat treatment may be performed by combining one or two or more oxidizing atmospheres, inert atmospheres, reduced pressure atmospheres, and dry air atmospheres. Preferably, heat treatment is performed in an inert atmosphere or a reduced pressure atmosphere, and then heat treatment is performed in an oxidizing atmosphere or a dry air atmosphere. The temperature of the heat treatment may be 150 ° C. or higher and 650 ° C. or lower, preferably 250 ° C. or higher and 500 ° C. or lower, more preferably 300 ° C. or higher and 450 ° C. or lower. Heat treatment is resistance heating method,
A lamp heater method, a heating gas method, or the like may be applied.

An oxidizing atmosphere refers to an atmosphere containing an oxidizing gas. The oxidizing gas is oxygen, ozone, nitrous oxide, or the like, and preferably does not contain water, hydrogen, or the like. For example, the purity of oxygen, ozone, and nitrous oxide introduced into the heat treatment apparatus is 8N (99.99999999%) or higher, preferably 9N (99.9999999%) or higher. An oxidizing gas and an inert gas may be mixed in the oxidizing atmosphere. In that case, the oxidizing gas is at least 10 ppm.
The atmosphere is as described above. By performing heat treatment in an oxidizing atmosphere, the density of oxygen vacancies in the oxide semiconductor film can be reduced.

The inert atmosphere refers to an atmosphere containing an inert gas such as nitrogen or a rare gas as a main component. Specifically, an atmosphere in which a reactive gas such as an oxidizing gas is less than 10 ppm is used. By performing heat treatment in an inert atmosphere, the concentration of impurities contained in the oxide semiconductor film can be reduced.

The reduced pressure atmosphere refers to an atmosphere in which the pressure in the processing chamber is 10 Pa or less. By performing heat treatment in a reduced-pressure atmosphere, the concentration of impurities contained in the oxide semiconductor film can be further reduced than in an inert atmosphere.

The dry air atmosphere refers to an atmosphere containing about 20% oxygen and about 80% nitrogen with a dew point of −40 ° C. or lower, preferably a dew point of −50 ° C. or lower. Although it is a kind of oxidizing atmosphere, it is suitable for mass production because of its relatively low cost.

Next, the oxide semiconductor film is processed to form the oxide semiconductor film 106 (see FIG. 3C).
.

Next, a gate insulating film 108 is formed. The gate insulating film 108 may be formed by a CVD method, a sputtering method, an MBE method, or a PLD method, and it is particularly preferable to use a sputtering method.

Next, a conductive film is formed. The conductive film is formed by CVD, sputtering, MBE or PL
The film may be formed by the D method, and it is particularly preferable to use the sputtering method.

Next, the conductive film is processed to form the gate electrode 110 (see FIG. 4A).

Next, using the gate electrode 110 as a mask, an impurity that reduces the resistance of the oxide semiconductor film is added to the oxide semiconductor film 106, so that the low-resistance region 106b is formed (see FIG. 4B). In addition,
A region to which an impurity for reducing the resistance of the oxide semiconductor film is not added becomes a high-resistance region 106a.

As impurities for reducing the resistance of the oxide semiconductor film, hydrogen, helium, boron, nitrogen, fluorine,
One or more selected from neon, aluminum, phosphorus, argon, arsenic, krypton, indium, tin, antimony and xenon may be added. Note that this method may be performed by an ion implantation method or an ion doping method. Alternatively, plasma treatment or heat treatment may be performed in an atmosphere containing an impurity that reduces resistance of the oxide semiconductor film. An ion implantation method is preferably used. Note that heat treatment may be performed in an inert atmosphere or a reduced-pressure atmosphere after an impurity that reduces resistance of the oxide semiconductor film is added by an ion implantation method.

Next, an interlayer insulating film 112 is formed (see FIG. 4C). The interlayer insulating film 112 is formed by CVD.
The film may be formed by the method, sputtering method, MBE method, PLD method or spin coating method.
It is preferable to use a VD method or a sputtering method.

Although not particularly illustrated, the interlayer insulating film 112 and the gate insulating film 108 may be processed to expose the pair of electrodes 104 and to provide wirings connected to the pair of electrodes 104. Further, a resin film may be provided over the interlayer insulating film 112.

Through the above steps, the contact resistance between the oxide semiconductor film and the pair of electrodes can be reduced. Accordingly, a transistor with excellent on characteristics can be provided.

(Embodiment 2)
In this embodiment, a transistor having a structure different from that of the transistor described in Embodiment 1 and a manufacturing method thereof will be described with reference to FIGS.

5A and 5B are a top view and a cross-sectional view of a transistor which is a semiconductor device according to one embodiment of the present invention. FIG. 5B illustrates a cross section taken along a dashed line AB in the top view of the transistor illustrated in FIG. Note that FIG. 5A illustrates an interlayer insulating film 212 in order to prevent complexity.
In addition, the gate insulating film 208 and the like are omitted.

A transistor illustrated in FIG. 5B includes a substrate 100, a base insulating film 202 provided over the substrate 100, a gate electrode 210 provided over the base insulating film 202, and a gate provided over the gate electrode 210. The insulating film 208 and the pair of electrodes 204 provided over the gate insulating film 208
An oxide semiconductor film 206 overlapping with the gate electrode 210 with the gate insulating film 208 interposed therebetween,
An oxide semiconductor film 206 and an interlayer insulating film 212 provided over the pair of electrodes.
Note that a structure without the base insulating film 202 may be employed.

In the pair of electrodes 204, a halogen element is included in the vicinity of the interface between the pair of electrodes 204 and the oxide semiconductor film 206. For example, fluorine or chlorine is contained. Thus, the pair of electrodes 204
By using a strong bond (such as a metal-fluorine bond), the reaction between the pair of electrodes 204 and the oxide semiconductor film 206 can be suppressed, and formation of a different layer can be suppressed. Therefore, generation of a resistance component due to formation of a different layer can be suppressed, and the pair of electrodes 204 and the oxide semiconductor film 20
The contact resistance with 6 can be reduced. At the same time, diffusion of oxygen from the oxide semiconductor film 206 to the pair of electrodes 204 can be prevented. Therefore, formation of oxygen vacancies in the oxide semiconductor film 206 can be suppressed.

Note that the material of each layer can be the same as that in the first embodiment.

Next, a method for manufacturing the transistor illustrated in FIG. 5B will be described with reference to FIGS.

First, the base insulating film 202 is formed over the substrate 100. Note that the base insulating film 202 is not necessarily provided depending on the substrate 100.

Next, a conductive film is formed over the base insulating film 202. The conductive film is preferably formed by a sputtering method.

Next, the conductive film is processed to form the gate electrode 210. Note that “processing” means that a film having a desired shape is obtained by performing etching using a resist mask formed by a photolithography method, unless otherwise specified.

Next, a gate insulating film 208 is formed. The gate insulating film 208 may be formed by a CVD method, a sputtering method, an MBE method, or a PLD method, and a sputtering method is particularly preferable (see FIG. 6A).

Next, a conductive film is formed over the gate insulating film 208. The conductive film may be formed by a CVD method, a sputtering method, an MBE method, or a PLD method, and it is particularly preferable to use a sputtering method.

Next, the conductive film is processed to form a pair of electrodes 204 (see FIG. 6B).

Next, halogenation treatment is performed on the pair of electrodes 204. The halogenation treatment can be performed by plasma treatment in an atmosphere containing a halogen element. For example, plasma treatment may be performed using a dry etching apparatus or a plasma CVD apparatus in an atmosphere containing nitrogen trifluoride gas. Further, the halogenation treatment does not need to be a plasma treatment, and can be performed by exposing an object to be treated to an atmosphere containing a halogen element. At that time, it is preferable to heat the object to be processed because the halogenation treatment is accelerated.

After the halogenation treatment is performed on the pair of electrodes 204, an oxide semiconductor film is formed. The oxide semiconductor film may be formed by a CVD method, a sputtering method, an MBE method, or a PLD method, and a sputtering method is preferably used.

Heat treatment may be performed after the oxide semiconductor film is formed. When the heat treatment is performed, the degree of crystallinity of the oxide semiconductor film is increased. In addition, the concentration of impurities (such as hydrogen and moisture) in the oxide semiconductor film can be reduced and the defect density can be reduced. The heat treatment can be performed in a manner similar to that in Embodiment 1.

Next, the oxide semiconductor film is processed to form the oxide semiconductor film 206.

Next, an interlayer insulating film 212 is formed (see FIG. 6C). The interlayer insulating film 212 is formed by CVD.
The film may be formed by the method, sputtering method, MBE method, PLD method or spin coating method.
It is preferable to use a VD method or a sputtering method.

Although not particularly illustrated, the interlayer insulating film 212 may be processed so that the pair of electrodes 204 is exposed and wirings connected to the pair of electrodes 204 may be provided. Further, a resin film may be provided over the interlayer insulating film 212.

Through the above steps, the contact resistance between the oxide semiconductor film and the pair of electrodes can be reduced. Accordingly, a transistor with excellent on characteristics can be provided.

(Embodiment 3)
In this embodiment, an example of manufacturing a semiconductor memory device using the transistor described in Embodiment 1 or 2 will be described.

As a typical example of a volatile semiconductor memory device, a DRAM (Dynamic Ra) that stores information by selecting a transistor constituting a memory element and accumulating electric charge in a capacitor.
There is an SRAM (Static Random Access Memory) that holds stored contents using a circuit such as an ndom access memory) or a flip-flop.

As a typical example of a nonvolatile semiconductor memory device, there is a flash memory which has a node between a gate and a channel region of a transistor and stores data by holding electric charge in the node.

The transistor described in Embodiment 1 or 2 can be applied to part of the transistors included in the semiconductor memory device described above.

First, a volatile memory to which the transistor described in Embodiment 1 or 2 is applied is described with reference to FIGS.

The memory cell includes a bit line BL, a word line WL, a sense amplifier SAmp, a transistor Tr, and a capacitor C (see FIG. 7A).

The time change of the voltage held in the capacitor C is caused by the off current of the transistor Tr.
It is known to gradually reduce as shown in (B). The voltage initially charged from V0 to V1 is reduced to VA, which is a limit point for reading data1 over time.
This period is a holding period T_1. That is, in the case of a binary memory cell, it is necessary to refresh during the holding period T_1.

Here, when the transistor described in Embodiment 1 or 2 is applied to the transistor Tr, the off-state current is small, so that the holding period T_1 can be extended. In other words, since the refresh period can be extended, power consumption can be reduced. For example, when a transistor including an oxide semiconductor film with an off-state current of 1 × 10 ⁻²¹ A or less, preferably 1 × 10 ⁻²⁴ A or less is applied to a DRAM, power is not supplied for several days to several tens of days. Data can be retained for a year.

As described above, according to one embodiment of the present invention, a volatile memory with high reliability and low power consumption can be obtained.

In addition, by applying the transistor having excellent on-state characteristics described in Embodiment 1 or Embodiment 2, charge accumulation in the capacitor C is quickly performed, and a semiconductor memory device capable of high-speed operation is obtained. Can do.

Next, a nonvolatile memory to which the transistor described in Embodiment 1 or 2 is applied is described with reference to FIGS.

FIG. 8A is a circuit diagram of a nonvolatile memory. The nonvolatile memory is a transistor Tr_
1, a word line WL_1 connected to the gate of the transistor Tr_1, and a transistor Tr
_1, the source wiring SL_1 connected to the source of the transistor Tr_2, the source wiring SL_2 connected to the source of the transistor Tr_2, the drain wiring DL_2 connected to the drain of the transistor Tr_2, the capacitor C, and one end of the capacitor C. The capacitor wiring CL has a node N connected to the other end of the capacitor C, the drain of the transistor Tr_1, and the gate of the transistor Tr_2.

Note that the nonvolatile memory described in this embodiment includes the transistor T in accordance with the potential of the node N.
This is based on the fact that the threshold voltage of r_2 fluctuates. For example, FIG. 8B illustrates a relationship between the voltage V _CL of the capacitor wiring CL and the drain current I _d _2 flowing through the transistor Tr_2.

Here, the voltage of the node N can be adjusted through the transistor Tr_1. For example, the potential of SL_1 is set to VDD. At this time, by setting the potential of WL_1 to be equal to or higher than the potential obtained by adding VDD to the threshold voltage Vth of Tr_1, the voltage of the node N can be HIGH. In addition, by setting the potential of WL_1 to be equal to or lower than the threshold voltage Vth of Tr_1, the potential of the node N can be set to LOW.

Therefore, N = and _V CL _-I d _2 curve indicated by LOW, _V indicated by N = HIGH _CL
Either of the −I _{d —} 2 curves can be obtained. That is, when N = LOW, V _CL = 0V
Since I _{d —} 2 is small, data 0 is obtained. Further, when N = HIGH, I _{d —} 2 is large when V _CL = 0V, and therefore, data 1 is obtained. In this way, data can be stored.

Here, when the transistor described in Embodiment 1 or 2 is applied to the transistor Tr_1, the off-state current of the transistor can be extremely small; thus, the charge accumulated in the node N is supplied to the source of the transistor Tr_1 and It is possible to suppress unintentional leakage between the drains. Therefore, data can be held for a long time. In addition, since the threshold voltage of the transistor Tr_1 is adjusted by using one embodiment of the present invention, the voltage necessary for writing can be reduced and power consumption can be reduced compared to a flash memory or the like. Can do.

Note that the transistor described in Embodiment 1 or 2 may be used as the transistor Tr_2. The transistor has excellent on characteristics. Therefore, a semiconductor memory device using the transistor can operate at high speed.

As described above, according to one embodiment of the present invention, a semiconductor memory device with high long-term reliability, low power consumption, and high-speed operation can be obtained.

This embodiment can be combined with any of the other embodiments as appropriate.

(Embodiment 4)
A CPU (Central Processing) using at least part of the transistor described in Embodiment 1 or 2 or the semiconductor memory device in Embodiment 3 is used.
Unit) can be configured.

FIG. 9A is a block diagram illustrating a specific structure of the CPU. CPU shown in FIG.
Are arranged on a substrate 1190 with an arithmetic circuit (ALU: Arithmetic logic uni).
t) 1191, ALU controller 1192, instruction decoder 1193, interrupt controller 1194, timing controller 1195, register 1196
, Register controller 1197, bus interface (Bus I / F) 1198,
A rewritable ROM 1199 and a ROM interface (ROM I / F) 11
89. As the substrate 1190, a semiconductor substrate, an SOI substrate, a glass substrate, or the like is used. The ROM 1199 and the ROM interface 1189 may be provided in separate chips.
Needless to say, the CPU illustrated in FIG. 9A is just an example in which the configuration is simplified, and an actual CPU may have various configurations depending on the application.

Instructions input to the CPU via the bus interface 1198 are input to the instruction decoder 1193, decoded, and then input to the ALU controller 1192, interrupt controller 1194, register controller 1197, and timing controller 1195.

The ALU controller 1192, interrupt controller 1194, register controller 1197, and timing controller 1195 perform various controls based on the decoded instructions. Specifically, the ALU controller 1192 generates a signal for controlling the operation of the ALU 1191. The interrupt controller 1194 determines and processes an interrupt request from an external input / output device or a peripheral circuit from the priority or mask state during execution of the CPU program. The register controller 1197 generates an address of the register 1196, and reads and writes the register 1196 according to the state of the CPU.

The timing controller 1195 includes an ALU 1191 and an ALU controller 119.
2. Generates a signal for controlling the operation timing of the instruction decoder 1193, the interrupt controller 1194, and the register controller 1197. For example, the timing controller 1195 includes an internal clock generation unit that generates an internal clock signal CLK2 based on the reference clock signal CLK1, and supplies the clock signal CLK2 to the various circuits.

In the CPU illustrated in FIG. 9A, a memory element is provided in the register 1196. As the memory element of the register 1196, the semiconductor memory device described in Embodiment 3 can be used.

In the CPU illustrated in FIG. 9A, the register controller 1197 performs a holding operation in the register 1196 in accordance with an instruction from the ALU 1191. That is, in the memory element included in the register 1196, data is held by a phase inversion element or data is held by a capacitor. When data is held by the phase inverting element, the register 11
The power supply voltage is supplied to the memory elements in 96. When data is held by the capacitor, data is rewritten to the capacitor and supply of power supply voltage to the memory element in the register 1196 can be stopped.

The power supply is stopped by providing a switching element between the memory element group and the node to which the power supply potential VDD or the power supply potential VSS is applied, as shown in FIG. 9B or 9C. Can do. The circuits in FIGS. 9B and 9C will be described below.

9B and 9C illustrate an example of a structure in which the transistor described in Embodiment 1 or 2 is used for a switching element that controls supply of a power supply potential to a memory element.

A memory device illustrated in FIG. 9B includes a switching element 1141 and a memory element group 1143 including a plurality of memory elements 1142. Specifically, each storage element 1142 includes
The memory element described in Embodiment 3 can be used. A high-level power supply potential VDD is supplied to each memory element 1142 included in the memory element group 1143 through the switching element 1141. Further, each storage element 11 included in the storage element group 1143.
42 is supplied with the potential of the signal IN and the potential of the low-level power supply potential VSS.

In FIG. 9B, a transistor having a semiconductor with a large band gap such as an oxide semiconductor in an active layer is used as the switching element 1141, and the switching of the transistor is controlled by a signal SigA applied to the gate of the transistor. .

Note that FIG. 9B illustrates a structure in which the switching element 1141 includes only one transistor; however, the present invention is not limited to this, and a plurality of transistors may be included. In the case where the switching element 1141 includes a plurality of transistors functioning as switching elements, the plurality of transistors may be connected in parallel, may be connected in series, or may be combined in series and parallel. May be connected.

FIG. 9C illustrates an example of a memory device in which a low-level power supply potential VSS is supplied to each memory element 1142 included in the memory element group 1143 through the switching element 1141. The switching element 1141 can control supply of the low-level power supply potential VSS to each memory element 1142 included in the memory element group 1143.

A switching element is provided between the memory element group and a node to which the power supply potential VDD or the power supply potential VSS is applied, temporarily stopping the operation of the CPU and retaining data even when the supply of the power supply voltage is stopped. It is possible to reduce power consumption. For example, even when the user of the personal computer stops inputting information to an input device such as a keyboard, the operation of the CPU can be stopped, thereby reducing power consumption.

Here, the CPU has been described as an example, but DSP (Digital Signal P)
processor, custom LSI, FPGA (Field Programmable)
e Gate Array).

This embodiment can be implemented in combination with any of the above embodiments as appropriate.

(Embodiment 5)
In this embodiment, examples of electronic devices including one or more of the transistors, semiconductor memory devices, and CPUs described in Embodiments 1 to 4 will be described.

FIG. 10A illustrates a portable information terminal. A portable information terminal illustrated in FIG.
00, button 9301, microphone 9302, display portion 9303, speaker 9
304 and a camera 9305, and has a function as a mobile phone.

FIG. 10B shows a display. A display illustrated in FIG. 10B includes a housing 931.
0 and a display portion 9311.

FIG. 10C illustrates a digital still camera. A digital still camera illustrated in FIG. 10C includes a housing 9320, a button 9321, a microphone 9322, and a display portion 9323.
And.

FIG. 10D illustrates a portable information terminal that can be folded. A portable information terminal that can be folded in FIG. 10D includes a housing 9630, a display portion 9631a, a display portion 9631b, and a fastener 9633.
And an operation switch 9638.

Part or all of the display portion 9631a and / or the display portion 9631b can be a touch panel, and data can be input by touching operation keys that are displayed.

By using one embodiment of the present invention, the performance of an electronic device can be improved.

This embodiment can be combined with any of the other embodiments as appropriate.

100 substrate 102 base insulating film 104 pair of electrodes 106 oxide semiconductor film 106a high resistance region 106b low resistance region 108 gate insulating film 110 gate electrode 112 interlayer insulating film 202 base insulating film 204 pair of electrodes 206 oxide semiconductor film 206a high resistance Region 206b Low resistance region 208 Gate insulating film 210 Gate electrode 212 Interlayer insulating film 1141 Switching element 1142 Memory element 1143 Memory element group 1189 ROM interface 1190 Substrate 1191 ALU
1192 ALU Controller 1193 Instruction Decoder 1194 Interrupt Controller 1195 Timing Controller 1196 Register 1197 Register Controller 1198 Bus Interface 1199 ROM
9300 Case 9301 Button 9302 Microphone 9303 Display unit 9304 Speaker 9305 Camera 9310 Case 9311 Display unit 9320 Case 9321 Button 9322 Microphone 9323 Display unit 9630 Case 9631a Display unit 9631b Display unit 9633 Fastener 9638 Operation switch

Claims (3)

A first conductive film, a second conductive film, an oxide semiconductor film, a gate insulating film, and a gate electrode;
The oxide semiconductor film is located on the first conductive film and the second conductive film,
The oxide semiconductor film has a first region, a second region, and a third region,
The oxide semiconductor film contains at least In and Zn as main components,
The first region has a region overlapping the gate electrode through the gate insulating film,
The second region has a region that does not overlap the gate electrode;
The third region has a region that does not overlap the gate electrode;
The second region has a region in contact with the first conductive film and a region not in contact with the first conductive film,
The third region has a region in contact with the second conductive film and a region not in contact with the second conductive film,
The second region has a region having a sheet resistance lower than that of the first region,
The third region has a region having a sheet resistance lower than that of the first region,
The gate electrode does not overlap the first conductive film;
The gate electrode does not overlap the second conductive film;
The semiconductor device, wherein the first conductive film and the second conductive film contain a halogen element. A first conductive film, a second conductive film, an oxide semiconductor film, a gate insulating film, and a gate electrode;
The oxide semiconductor film is located on the first conductive film and the second conductive film,
The oxide semiconductor film has a first region, a second region, and a third region,
The oxide semiconductor film contains at least In and Zn as main components,
The first region has a region overlapping the gate electrode through the gate insulating film,
The second region has a region that does not overlap the gate electrode;
The third region has a region that does not overlap the gate electrode;
The second region has a region in contact with the first conductive film and a region not in contact with the first conductive film,
The third region has a region in contact with the second conductive film and a region not in contact with the second conductive film,
The second region has a region containing impurities,
The third region has a region containing impurities,
The gate electrode does not overlap the first conductive film,
The gate electrode does not overlap the second conductive film,
The semiconductor device, wherein the first conductive film and the second conductive film contain a halogen element. In claim 1 or claim 2,
The second region or the third region includes at least one selected from hydrogen, helium, boron, nitrogen, fluorine, neon, aluminum, phosphorus, argon, arsenic, krypton, indium, tin, antimony, and xenon. A semiconductor device including the semiconductor device.

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