JP2019191009A - Structure of sensor of linear scale head - Google Patents

Structure of sensor of linear scale head Download PDF

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JP2019191009A
JP2019191009A JP2018084508A JP2018084508A JP2019191009A JP 2019191009 A JP2019191009 A JP 2019191009A JP 2018084508 A JP2018084508 A JP 2018084508A JP 2018084508 A JP2018084508 A JP 2018084508A JP 2019191009 A JP2019191009 A JP 2019191009A
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substrate
linear scale
layer
pin
conductive pad
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JP6580746B1 (en
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高清芬
Qing Fen Gao
張家栄
jia rong Zhang
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Taiwan Science & Tech Shares Co Ltd
Taiwan Science & Technology Shares Co Ltd
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Abstract

To provide a structure of a sensor of a linear scale head which can be downsized.SOLUTION: A structure of a sensor of a linear scale head has a substrate 1, a light-sensitive chip 2, and a code pattern layer 3 forming a reticle pattern. The substrate 1 includes at least one conductive pad 11. The light-sensitive chip 2 is provided on the substrate 1 and has at least one pin 21. Each pin 21 is connected to one conductive pad 11 by a conductor 23. The code pattern layer 3 is formed on one surface of the substrate 1 which faces the light-sensitive chip 2 and is covered with a translucent insulating layer 4. A transparent protective layer 5 is formed on the insulating layer 4. A protective layer 5 is made of polyimide epoxy resin and covers each pin 21. Each pin 21 has an expansion part 22 extending from the protective layer 5. The conductor 23 connects the expansion part 22 and the conductive pad 11 to each other.SELECTED DRAWING: Figure 1

Description

本発明は、リニアスケールに関し、特に、リニアスケールヘッドのセンサー構造に関する。   The present invention relates to a linear scale, and more particularly to a linear scale head sensor structure.

リニアスケールは、精密機械の分野において微小な距離を測定するのに重要な装置であり、図3に示すように、計量尺6(いわゆる主尺)及び光学ヘッド7を含むことが一般的である。計量尺6上には、コードパターン(一般にレチクルパターンである)が設けられる。光学ヘッド7の内部には、副尺71及び感光モジュール72が設けられる。副尺71は、レチクルパターンを有するガラスブロックである。光学ヘッド7と計量尺6とが相対的に駆動すると、計量尺6及び副尺71上のレチクルパターンが相対変位し、連続した光強度が変化し、これを感光モジュール72が受光して変換させ、変位距離の測定を行っていた。   The linear scale is an important device for measuring a minute distance in the field of precision machinery, and generally includes a measuring scale 6 (so-called main scale) and an optical head 7 as shown in FIG. . On the measuring scale 6, a code pattern (generally a reticle pattern) is provided. A vernier 71 and a photosensitive module 72 are provided inside the optical head 7. The vernier 71 is a glass block having a reticle pattern. When the optical head 7 and the measuring scale 6 are driven relatively, the reticle pattern on the measuring scale 6 and the vernier 71 is relatively displaced, and the continuous light intensity changes, and this is received and converted by the photosensitive module 72. The displacement distance was measured.

しかし、上述したような従来構造では、副尺71は、一定の体積を占める立体構造である上、間隔空間74により感光モジュール72と離間され、接続部材73で接続されていた。そのため、光学ヘッド7の全体の体積が大きくなり、精密機械の分野において装置の小型化が求められているニーズを満たすことは困難であった。   However, in the conventional structure as described above, the vernier 71 is a three-dimensional structure occupying a fixed volume, and is separated from the photosensitive module 72 by the interval space 74 and connected by the connecting member 73. For this reason, the entire volume of the optical head 7 becomes large, and it has been difficult to satisfy the needs for downsizing the apparatus in the field of precision machinery.

さらに、従来構造では、副尺71と感光モジュール72との間の間隔空間74に空気の分子がある上、埃、不純物などの浮遊粒子もあるため、光が透過する際に屈折又は回折が発生して測定結果に悪影響を与える虞があった。   Furthermore, in the conventional structure, there are air molecules in the space 74 between the vernier 71 and the photosensitive module 72, and there are also floating particles such as dust and impurities, so refraction or diffraction occurs when light passes through. As a result, the measurement result may be adversely affected.

上述の参考文献には、例えば特許文献1がある。   An example of the above-mentioned reference document is Patent Document 1.

台湾特許第I447357号公報Taiwan Patent No. I447357

本発明の主な目的は、感光チップ上にレチクルパターンを直接形成し、従来構造の副尺と感光チップとを結合してリニアスケールヘッドの体積を減らして装置を小型化させる、リニアスケールヘッドのセンサー構造を提供することである。   The main object of the present invention is to form a reticle pattern directly on a photosensitive chip, and combine a vernier of a conventional structure and a photosensitive chip to reduce the volume of the linear scale head and reduce the size of the apparatus. It is to provide a sensor structure.

上記課題を解決するために、本発明の第1の形態によれば、基板と、感光チップと、レチクルパターンを形成するコードパターン層と、を備えたリニアスケールヘッドのセンサー構造であって、前記基板は、少なくとも1つの導電パッドを有し、前記感光チップは、前記基板上に設けられるとともに、少なくとも1つのピンを有し、各前記ピンは、導線を介して1つの導電パッドに接続され、前記コードパターン層は、前記感光チップの相対する前記基板の一側表面上に形成されるとともに、透光性を有する絶縁層により覆われることを特徴とするリニアスケールヘッドのセンサー構造が提供される。 In order to solve the above problems, according to a first aspect of the present invention, there is provided a linear scale head sensor structure comprising a substrate, a photosensitive chip, and a code pattern layer for forming a reticle pattern, The substrate has at least one conductive pad, the photosensitive chip is provided on the substrate and has at least one pin, and each of the pins is connected to one conductive pad through a conductive wire, A sensor structure of a linear scale head is provided, wherein the code pattern layer is formed on one surface of the substrate facing the photosensitive chip and is covered with a light-transmitting insulating layer. .

前記絶縁層上には、透明な保護層が形成され、前記保護層は、ポリイミドエポキシ樹脂からなるとともに、各前記ピンを覆い、各前記ピンは、前記保護層から延びる延伸部を有し、前記導線により前記延伸部と前記導電パッドとが接続されることが好ましい。   A transparent protective layer is formed on the insulating layer, and the protective layer is made of polyimide epoxy resin and covers each of the pins, and each of the pins has an extending portion extending from the protective layer, It is preferable that the extending portion and the conductive pad are connected by a conducting wire.

図1は、本発明の一実施形態に係るリニアスケールヘッドのセンサー構造を示す断面図である。FIG. 1 is a sectional view showing a sensor structure of a linear scale head according to an embodiment of the present invention. 図2は、本発明の一実施形態に係るリニアスケールヘッドのセンサー構造のコードパターン層のパターンを示す模式図である。FIG. 2 is a schematic diagram showing the pattern of the code pattern layer of the sensor structure of the linear scale head according to the embodiment of the present invention. 図3は、従来構造の模式図である。FIG. 3 is a schematic diagram of a conventional structure.

図1を参照する。図1に示すように、本発明の一実施形態に係るリニアスケールヘッドのセンサー構造は、PCB基板1を含む。基板1上には、少なくとも1つの導電パッド11が設けられる。本実施形態の基板1の両側には、導電パッド11がそれぞれ設けられる。   Please refer to FIG. As shown in FIG. 1, the sensor structure of a linear scale head according to an embodiment of the present invention includes a PCB substrate 1. On the substrate 1, at least one conductive pad 11 is provided. Conductive pads 11 are provided on both sides of the substrate 1 of the present embodiment.

基板1上には、光に感応して光を信号に変換させて判読する感光チップ2が設けられている。感光チップ2には、少なくとも1つのピン21が設けられる。本実施形態では、感光チップ2の両側にピン21がそれぞれ設けられ、再配線(RDL)工程により各ピン21から延伸部22が延びている。各延伸部22は、導線23を介して1つの導電パッド11に接続される。感光チップ2の相対する基板1の一側表面上には、リニアスケールの計量尺と相互に作用するコードパターン層3が形成され、それは僅か一パターンのみであり、感光チップ2上に印刷されてもよい。本実施形態のコードパターン層3は、図2に示すようなレチクルパターンに形成される。   On the substrate 1, there is provided a photosensitive chip 2 that reads light in response to light and converts it into a signal. The photosensitive chip 2 is provided with at least one pin 21. In the present embodiment, pins 21 are provided on both sides of the photosensitive chip 2, and extending portions 22 extend from the pins 21 by a rewiring (RDL) process. Each extending portion 22 is connected to one conductive pad 11 via a conductive wire 23. A code pattern layer 3 that interacts with a linear scale measuring scale is formed on one surface of the opposite substrate 1 of the photosensitive chip 2, and only one pattern is printed on the photosensitive chip 2. Also good. The code pattern layer 3 of this embodiment is formed in a reticle pattern as shown in FIG.

また、感光チップ2は、保護作用のために、透光性を備えてコードパターン層3を覆う絶縁層4を有する。さらに絶縁層4上には、ポリイミドエポキシ樹脂からなる透明な保護層5が形成されている。上述した保護層5は、延びて各ピン21を覆うが、各ピン21の延伸部22が保護層5から延び、導線23を介して導電パッド11に接続される。   In addition, the photosensitive chip 2 has an insulating layer 4 that is translucent and covers the code pattern layer 3 for protection. Further, a transparent protective layer 5 made of polyimide epoxy resin is formed on the insulating layer 4. The protective layer 5 described above extends to cover each pin 21, but the extending portion 22 of each pin 21 extends from the protective layer 5 and is connected to the conductive pad 11 through the conductive wire 23.

上述したことから分かるように、本発明は、コードパターン層3が感光チップ2上に直接取付けられ、計量尺上のコードパターンと組み合わせて作用し、透過する光の強度を変化させ、上述した強度変化を感光チップ2により計測して変位距離を得ることができる。本発明は、コードパターン層がガラスブロックの構造に取り付けられていた従来構造と異なり、コードパターン層3が感光チップ2上に直接取り付けられているため、構造を簡素化して装置の全体の体積を減らすことができるため、精密機械の分野において求められている装置に対する小型化のニーズを満たすことができる。   As can be seen from the above, the present invention has the code pattern layer 3 mounted directly on the photosensitive chip 2 and works in combination with the code pattern on the measuring scale to change the intensity of the transmitted light. The change can be measured by the photosensitive chip 2 to obtain the displacement distance. In the present invention, unlike the conventional structure in which the code pattern layer is attached to the structure of the glass block, the code pattern layer 3 is directly attached on the photosensitive chip 2, so that the structure is simplified and the entire volume of the apparatus is increased. Since it can be reduced, it is possible to meet the need for miniaturization of devices required in the field of precision machinery.

また、コードパターン層3が感光チップ2上に直接取付けられ、両者間には間隔空間が無いため、コードパターン層3を透過した光は感光チップ2により受光される。そのため、空気、埃、不純物などの外的要因による影響を受けず、測定結果がより正確となる。   Further, since the code pattern layer 3 is directly mounted on the photosensitive chip 2 and there is no space between them, the light transmitted through the code pattern layer 3 is received by the photosensitive chip 2. Therefore, the measurement result is more accurate without being affected by external factors such as air, dust, and impurities.

1 基板
2 感光チップ
3 コードパターン層
4 絶縁層
5 保護層
6 計量尺
7 光学ヘッド
11 導電パッド
21 ピン
22 延伸部
23 導線
71 副尺
72 感光モジュール
73 接続部材
74 間隔空間
DESCRIPTION OF SYMBOLS 1 Substrate 2 Photosensitive chip 3 Code pattern layer 4 Insulating layer 5 Protective layer 6 Measuring scale 7 Optical head 11 Conductive pad 21 Pin 22 Extending part 23 Conductive wire 71 Subscale 72 Photosensitive module 73 Connection member 74 Spacing space

Claims (2)

基板と、感光チップと、レチクルパターンを形成するコードパターン層と、を備えたリニアスケールヘッドのセンサーチップ構造であって、
前記基板は、少なくとも1つの導電パッドを有し、
前記感光チップは、前記基板上に設けられるとともに、少なくとも1つのピンを有し、各前記ピンは、導線を介して1つの導電パッドに接続され、
前記コードパターン層は、前記感光チップの相対する前記基板の一側表面上に形成されるとともに、透光性を有する絶縁層により覆われることを特徴とするリニアスケールヘッドのセンサー構造。
A linear scale head sensor chip structure comprising a substrate, a photosensitive chip, and a code pattern layer for forming a reticle pattern,
The substrate has at least one conductive pad;
The photosensitive chip is provided on the substrate and has at least one pin, and each of the pins is connected to one conductive pad via a conductor,
The sensor structure of a linear scale head, wherein the code pattern layer is formed on one surface of the substrate facing the photosensitive chip and is covered with a light-transmitting insulating layer.
前記絶縁層上には、透明な保護層が形成され、
前記保護層は、ポリイミドエポキシ樹脂からなるとともに、各前記ピンを覆い、
各前記ピンは、前記保護層から延びる延伸部を有し、
前記導線により前記延伸部と前記導電パッドとが接続されることを特徴とする請求項1に記載のリニアスケールヘッドのセンサー構造。
On the insulating layer, a transparent protective layer is formed,
The protective layer is made of polyimide epoxy resin and covers each pin.
Each of the pins has an extending portion extending from the protective layer,
2. The linear scale head sensor structure according to claim 1, wherein the extending portion and the conductive pad are connected by the conductive wire.
JP2018084508A 2018-04-25 2018-04-25 Linear scale head sensor structure Active JP6580746B1 (en)

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