JP2019175279A - Measuring machine management device and method - Google Patents

Abstract

To provide a measuring machine management device and method capable of reducing the frequency of errors and failures and thereby reducing the frequency of maintenance in a drive part of a three-dimensional measuring machine and the like.SOLUTION: A measuring machine management device (100) comprises: an operation result acquisition part for acquiring operation results for each drive shaft of a plurality of measuring machines (10) each having a plurality of drive shafts; an estimated operation amount calculation part for calculating an estimated operation amount for each drive shaft of the measurement devices when measurement work is performed using the measurement devices; an average operation amount calculation part for calculating an average operation amount for each drive shaft of the measuring machines when measurement work is performed with each drive shaft of the measurement machines, based on the operation results and the estimated operation amount; and a selection part for selecting the measuring machine to which the measurement work is assigned from the plurality of measuring machines such that the operating results for each measuring machine and the operating results for each drive shaft of the measuring machines are equalized based on the operation results, estimated operation amount, and average operation amount for each drive shaft of the measuring machines.SELECTED DRAWING: Figure 3

Description

  The present invention relates to a measuring instrument management apparatus and method, and more particularly to a measuring instrument management apparatus and method for managing the operating status of a plurality of measuring instruments.

  A coordinate measuring machine (CMM) is provided with a probe at the tip of the stylus, and the shape (contour) and dimensions of the object to be measured are brought into contact with the object to be measured. Some of them can be measured. Such a three-dimensional measuring machine has an independent drive unit for each axial direction in order to relatively move the measuring element and the object to be measured along the respective three-dimensional axial directions.

  Patent Document 1 discloses a Y-axis drive unit for driving a beam support that supports a beam in the Y-axis direction, and an X-axis drive for driving a column supported by the beam in the X-axis direction along the beam. A coordinate measuring machine is disclosed that includes a portion and a Z-axis drive unit for driving a spindle on which a contact type probe is mounted along the column in the Z-axis direction.

JP 2002-328018 A

  In a measuring machine having an independent drive unit for each of the three-dimensional axial directions, the operation results differ for each drive unit. A drive unit having a larger operating amount (for example, a drive distance, a cumulative value of drive speed, the number of times of switching of the drive direction, etc.) is likely to cause errors and failures. Since the driving unit of the coordinate measuring machine is required to have high alignment accuracy, it is necessary to perform error calibration by performing maintenance for errors and failures.

  In order to perform error correction by performing such maintenance of the drive unit, it is necessary to secure an operator who is proficient in the calibration work, and much time is required. For this reason, it is desired to reduce the frequency of maintenance by reducing the frequency of errors and failures in the driving unit of the measuring machine.

  The present invention has been made in view of such circumstances, and a measuring instrument management apparatus and method capable of reducing the frequency of maintenance by reducing the occurrence frequency of errors and failures in a driving unit such as a measuring instrument. The purpose is to provide.

  In order to solve the above-described problem, the measuring machine management device according to the first aspect of the present invention includes an operation result acquisition unit that acquires an operation result for each drive shaft of a plurality of measurement machines each having a plurality of drive shafts. , An estimated operating amount calculation unit that calculates the estimated operating amount for each drive axis of the measuring machine when measurement work is performed using the measuring machine, and for each driving axis of the measuring machine based on the operating results and the estimated operating amount In addition, based on the average operation amount calculation unit that calculates the average operation amount for each drive shaft of the measuring machine when the measurement work is performed, the operation results for each drive axis of the measurement device, the estimated operation amount, and the average operation amount, A selection unit that selects a measuring machine to which a measuring operation is assigned from a plurality of measuring machines so that the operating results for each measuring machine and the operating results for each driving shaft of the measuring machine are equalized.

  According to the first aspect, it is possible to reduce the frequency of maintenance by reducing the occurrence frequency of errors and failures in the driving unit of the coordinate measuring machine. This makes it possible to reduce the cost required for maintenance of the coordinate measuring machine while maintaining the accuracy of the driving unit of the coordinate measuring machine.

  The measuring device management apparatus according to the second aspect of the present invention is the first aspect, wherein the selection unit is the absolute difference between the average operating amount and the value obtained by adding the estimated operating amount to the operating results of the plurality of measuring devices. The measuring machine to which the measurement work is assigned is selected so that the sum of the two is minimized.

  According to the second aspect, a plurality of measuring machines are evenly distributed by minimizing the sum of absolute differences between the average operating quantity and the value obtained by adding the estimated operating quantity to the operating results of the measuring machines. It becomes possible to operate.

  In the first or second aspect, the measuring machine management device according to the third aspect of the present invention acquires an upper limit operating amount for acquiring an upper limit operating amount until maintenance is required for the drive shafts of a plurality of measuring machines. The selection unit is configured to select a measuring machine to which the measurement work is assigned based on the operation results, the estimated operation amount, and the upper limit operation amount.

  The measuring machine management apparatus according to the fourth aspect of the present invention is such that, in the third aspect, the selection unit minimizes the variance of the value obtained by dividing the sum of the operation results and the estimated operation amount by the upper limit operation amount. The measuring machine to which the measurement work is assigned is selected.

  According to the third and fourth aspects, it is possible to reduce the frequency of maintenance by using the upper limit operation amount until maintenance is required.

  The measuring machine management device according to the fifth aspect of the present invention is the measuring machine management device according to any one of the first to fourth aspects, in which the estimated operation amount calculation unit performs the measurement work by changing the arrangement of the objects to be measured in the measuring machine. The average operation amount calculation unit calculates the average operation amount when the measurement operation is performed by changing the arrangement of the measured object in the measuring machine. The measuring machine to which the measurement work is allocated is selected based on the operation results for each of the drive shafts, the estimated operation amount, and the average operation amount.

  According to the fifth aspect, it is possible to lower the maintenance frequency by changing the arrangement of the object to be measured.

  In the measuring instrument management method according to the sixth aspect of the present invention, the operation results for each driving shaft of a plurality of measuring machines each having a plurality of driving shafts are obtained, and the measurement work is performed using the measuring instrument. Calculate the estimated operation amount for each drive axis of the measuring machine in, and based on the operation results and estimated operation amount, the average operation amount for each drive axis of the measurement machine when measurement work is performed for each drive axis of the measurement machine Based on the operation results for each drive axis of the measuring machine, the estimated operation amount, and the average operation amount, so that the operation results for each measurement machine and the operation results for each drive axis of the measurement machine are equalized. Select the measuring device to which the measurement work is assigned from among the measuring devices.

  According to the present invention, it is possible to reduce the frequency of maintenance by reducing the frequency of occurrence of errors and failures in the drive unit of the measuring machine. Thereby, it becomes possible to reduce the cost required for maintenance of the measuring machine while maintaining the accuracy of the driving unit of the measuring machine.

FIG. 1 is a block diagram showing a measuring machine management system including a measuring machine management apparatus according to an embodiment of the present invention. FIG. 2 is a flowchart showing the operation of the measuring instrument management system according to one embodiment of the present invention. FIG. 3 is a block diagram showing a measuring machine management apparatus (measuring machine operation management server) according to an embodiment of the present invention. FIG. 4 is a perspective view showing a coordinate measuring machine according to an embodiment of the present invention. FIG. 5 is a block diagram showing a coordinate measuring machine according to an embodiment of the present invention. FIG. 6 is a flowchart showing a measuring instrument management method according to the first embodiment of the present invention. FIG. 7 is a flowchart showing a measuring instrument management method according to the second embodiment of the present invention. FIG. 8 is a flowchart showing a measuring instrument management method according to the third embodiment of the present invention.

  Embodiments of a measuring instrument management apparatus and method according to the present invention will be described below with reference to the accompanying drawings.

[Measurement equipment management system]
FIG. 1 is a block diagram showing a measuring machine management system including a measuring machine management apparatus according to an embodiment of the present invention. FIG. 2 is a flowchart showing the operation of the measuring instrument management system according to one embodiment of the present invention.

  The measuring machine management system 1 according to the present embodiment selects a measuring machine 10 to which work is assigned based on the operating results of a plurality of measuring machines (coordinate measuring machines) 10 and adjusts the operating results of each measuring machine 10. . According to the measuring machine management system 1, the frequency of maintenance can be suppressed by adjusting the operation results of the driving units of the measuring machines 10 to be equal.

  As shown in FIG. 1, the measuring machine management system 1 includes a measuring machine management apparatus (measuring machine operation management server) 100 and a work transporting apparatus 200.

  The measuring machine 10 is a device that measures a three-dimensional shape of an object to be measured (workpiece). The configuration of the measuring instrument 10 will be described later with reference to FIGS. 4 and 5.

  When the measurement of the workpiece is executed in the measuring machine 10 (step S10), the operation results of the respective drive units of the measuring machine 10 are transmitted from the measuring machine 10 to the measuring machine management apparatus 100. (Step S12).

  The measuring machine management apparatus 100 acquires and aggregates data related to operation results from a plurality of measuring machines 10 (step S14).

  When a workpiece to be measured is newly supplied and an input of a measurement start instruction is received, the workpiece carrying device 200 transmits workpiece information regarding the workpiece to be measured to the measuring machine management device 100 and is used for measurement. An inquiry about the measuring device 10 to be performed is made (step S16). Here, the workpiece information includes information on the estimated operation amount for each drive axis in the measuring instrument 10 when the workpiece is measured.

  The measuring machine management apparatus 100 selects the measuring machine 10 based on the operation results of each measuring machine 10 in response to the inquiry from the workpiece transporting apparatus 200 (step S18). And the measuring machine management apparatus 100 transmits the selection result of the measuring machine 10 to the workpiece conveyance apparatus 200 (step S20).

  The workpiece conveyance device 200 conveys and installs the workpiece on the measuring machine 10 selected by the measuring device management apparatus 100 (step S22). And in the measuring machine 10 in which the workpiece | work was installed, a measurement is performed (step S24) and transmission of an operation result is performed. In FIG. 2, the processes after step S24 are the same as steps S10 to S14, and thus the illustration is omitted.

[Measurement equipment management device (Measurement equipment operation management server)]
FIG. 3 is a block diagram showing a measuring machine management apparatus (measuring machine operation management server) according to an embodiment of the present invention.

  The measurement machine management apparatus 100 according to the present embodiment selects a measurement machine 10 that performs measurement when a new workpiece measurement is performed based on the operating status of a plurality of measurement machines 10, and transports the workpiece. Instruct the device 200. As shown in FIG. 3, the measuring instrument management apparatus 100 according to the present embodiment includes a processing unit 102, an operation unit 104, a storage unit 106, a display unit 108, and a communication interface (communication I / F) 110.

  The processing unit 102 includes a CPU (Central Processing Unit) that controls the operation of each unit of the measuring instrument management apparatus 100. The processing unit 102 receives an operation input from the operator via the operation unit 104, and transmits a control signal corresponding to the operation input to each unit of the measuring instrument management apparatus 100 to control the operation of each unit. The processing unit 102 can transmit control signals and data to the measuring machine 10 and the work transporting device 200 via the communication I / F 110. The processing unit 102 functions as an estimated operation amount calculation unit, an average operation amount calculation unit, and a selection unit.

  The operation unit 104 includes an operation member that receives an operation input from an operator. As the operation member, for example, a keyboard for inputting characters, a pointing device, a mouse, or the like can be used.

  The communication I / F 110 is a means for performing communication between the measuring machine 10 and the workpiece transport apparatus 200, and performs conversion processing of data transmitted and received between the measuring machine 10 and the workpiece transport apparatus 200. The communication I / F 110 is sent from a digital-to-analog (D / A) converter for converting a digital command transmitted to the measuring instrument 10 into an analog signal, and sent from the measuring instrument 10 to the measuring instrument management apparatus 100. An A / D (analog-to-digital) converter for converting data such as operating conditions into digital data may be included. The communication I / F 110 functions as an operation result acquisition unit that acquires operation result information (pX, pY, and pZ) from each measuring device 10. The communication I / F 110 is an upper limit operation related to an upper limit operation amount (mX, mY, and mZ) for each drive axis (hereinafter referred to as an axis) required when a new measurement operation (measurement job) is executed from each measuring device 10. It functions as an upper limit operating amount acquisition unit that acquires amount information.

  The operating status information and the upper limit operating amount information may be stored in a database different from the measuring device 10.

  The storage unit 106 stores a program used for calculation by the processing unit 102 and data such as an operation status acquired from the measuring device 10. As the storage unit 106, for example, a device including a magnetic disk such as an HDD (Hard Disk Drive), a device including a flash memory such as an eMMC (embedded Multi Media Card), an SSD (Solid State Drive), or the like is used. it can. In FIG. 3, an operation management program is illustrated as an example of a program stored in the storage unit 106, and an operation status is illustrated as an example of data stored in the storage unit 106. The operation management program is a program used by the processing unit 102 for performing the selection process of the measuring instrument 10 of FIGS.

  The display unit 108 is a device for displaying character information, images, GUI (Graphical User Interface), and the like. As the display unit 108, for example, a liquid crystal display can be used. The display unit 108 can display data such as operating status acquired from the measuring instrument 10.

[CMM]
4 and 5 are a perspective view and a block diagram, respectively, showing a coordinate measuring machine according to an embodiment of the present invention.

  As shown in FIG. 4, the measuring instrument 10 according to the present embodiment includes a base 20 and a surface plate 18 provided on the base 20. The surface of the surface plate 18 is formed in a plane shape parallel to the XY plane. The workpiece is conveyed to the surface of the surface plate by the workpiece conveying device 200. Then, the work is fixed to the surface of the surface plate 18. As a means for fixing the work to the surface of the surface plate 18, for example, a clamp mechanism can be used.

  A pair of columns (supports) 16 extending from the surface of the surface plate 18 to the upper side (+ Z direction) in the figure are attached to the surface plate 18. A beam 14 is bridged over the upper end portion (the end portion on the + Z side) of the column 16. The pair of columns 16 can move on the surface plate 18 in synchronization with the Y direction, and the beam 14 can move in the Y direction in a state parallel to the X direction. The pair of columns 16 may be connected on the lower surface side of the surface plate 18.

  A head 12 extending in the Z direction is attached to the beam 14. The head 12 is movable along the length direction (X direction) of the beam 14.

  A probe 22 is attached to the lower end (end on the −Z side) of the head 12 so as to be movable in the vertical direction (Z direction) in the figure.

  The probe 22 includes a shaft-like member (stylus 24) having high rigidity. As a material of the stylus 24, for example, a super hard alloy, titanium, stainless steel, ceramic, carbon fiber, or the like can be used.

  A probe 26 is provided at the tip of the stylus 24 of the probe 22. The measuring element 26 is a spherical member having high hardness and excellent wear resistance. As a material of the measuring element 26, for example, ruby, silicon nitride, zirconia, ceramic or the like can be used. The diameter of the probe 26 (hereinafter referred to as a stylus diameter) is 4.0 mm as an example.

  When measuring a workpiece, the column 16, the head 12 and the probe 22 are moved in the XYZ directions to bring the measuring element 26 into contact with the workpiece. Then, the displacement amount of the measuring element 26 is measured while the measuring element 26 is scanned along the outer shape of the workpiece. Data such as a measured value of the displacement amount is transmitted to the measuring machine management apparatus 100. The measuring machine management apparatus 100 can determine the shape (contour) and dimensions of the workpiece by processing this data using a general-purpose measurement program.

  As shown in FIG. 5, the measuring instrument 10 according to the present embodiment includes a processor 50, an operation unit 52, a memory 54, and a communication interface (communication I / F) 56.

  The processor 50 includes a CPU (Central Processing Unit) that controls the operation of each unit of the measuring instrument 10. The processor 50 receives an operation input from the operator via the operation unit 52 and transmits a control signal corresponding to the operation input to each unit of the measuring instrument 10 to control the operation of each unit. The processor 50 can transmit a control signal and data to the measuring machine management device 100 and the work transport device 200 via the communication I / F 56.

  The operation unit 52 includes an operation member that receives an operation input from an operator.

  The memory 54 stores a program used for calculation by the processor 50 and data such as operating statuses of the respective drive units (X-axis drive unit 58X, Y-axis drive unit 58Y, and Z-axis drive unit 58Z).

  The communication I / F 56 is a means for performing communication between the measuring machine management apparatus 100 and the work transport apparatus 200, and performs conversion processing of data transmitted and received between the measuring machine management apparatus 100 and the work transport apparatus 200. Do.

  As shown in FIG. 5, the measuring instrument 10 includes an X-axis drive unit 58X, a Y-axis drive unit 58Y, and a Z-axis drive unit 58Z. The Y-axis drive unit 58Y is a drive unit for moving the column 16 with respect to the surface plate 18, and includes, for example, a motor. The X-axis drive unit 58X is a drive unit for moving the head 12 in the X direction along the beam 14, and includes, for example, a motor. The Z-axis drive unit 58Z is drive means for moving the probe 22 in the Z direction, and includes, for example, a motor.

  Further, the measuring instrument 10 includes an X-axis scale 60X, a Y-axis scale 60Y, and a Z-axis scale 60Z for measuring the movement amounts of the probe 22, the column 16, and the head 12, respectively. For example, linear encoders can be used as the X-axis scale 60X, the Y-axis scale 60Y, and the Z-axis scale 60Z.

[Measurement instrument management method]
(First embodiment)
Next, a measuring instrument management method according to the first embodiment of the present invention will be described with reference to FIG. Hereinafter, the i-th measuring machine 100 is referred to as a measuring machine i, and the number of measuring machines 100 is n.

  In the present embodiment, when the processing unit 102 receives a new inquiry about measurement of a workpiece from the workpiece conveyance device 200, the processing unit 102 uses the estimated operation amount of each driving unit of the measuring machine i when the workpiece arrangement j is changed. The variance s (i, j) (see equation (1)) is obtained. Next, the processing unit 102 selects a work placement j that minimizes the variance s (i, j) in each measuring device 100, and sets the parameter di (see Expression (2)) for the work placement j. calculate. Then, the processing unit 102 selects the measuring machine i that minimizes the parameter di, and sends an instruction to the measuring machine i and the work transporting device 200 so that the measurement is performed using the selected measuring machine i and the work arrangement j.

  First, the processing unit 102 uses the measuring machine i (i = 1) (step S30), and when the work placement j (j = 1) is selected (step S32), the variance s (i, j ) Is calculated (step S34). Then, the processing unit 102 sets j = j + 1 (step S38), and repeats the calculation of the distribution s (i, j) for all work arrangements (j = 1,..., 6) (steps S34 to S38).

  Estimated operation when measuring the work that has been newly queried with the actual operation amounts of the X-axis drive unit 58X, Y-axis drive unit 58Y, and Z-axis drive unit 58Z of the measuring machine i as pX, pY, and pZ, respectively. Let the quantities be X ′, Y ′ and Z ′, respectively. The operation amounts that serve as references until maintenance of the X-axis drive unit 58X, the Y-axis drive unit 58Y, and the Z-axis drive unit 58Z of the measuring instrument i are mX, mY, and mZ, respectively. The upper limit operating amounts mX, mY, and mZ may differ depending on the model of the measuring instrument i, the elapsed years, or the operating results of each axis (for example, the low durability model, the elapsed years, or the operating results are The upper limit operation amounts mX, mY, and mZ may be reduced as the value increases, and the operator may arbitrarily specify the operation amount. In this case, the calculation of the variance s (i, j) can be performed as follows.

  The processing unit 102 calculates estimated operation amount information related to the estimated operation amount for each axis required when a new measurement operation (measurement job) is executed for each workpiece arrangement j from the workpiece transporting apparatus 200. The work arrangement 1 (j = 1) is an arrangement in which the estimated operation amount (Xj, Yj, Zj) = (X ′, Y ′, Z ′).

  Parameters s (i, 1) X, s (i, 1) Y, and s (i, 1) Z are the upper limit of the sum of the actual operation amount of each axis and the estimated operation amount when a new measurement job is performed. This parameter is obtained by dividing by a quantity, and is a parameter indicating the necessity of performing maintenance on each axis. s (i, 1) X, s (i, 1) Y and s (i, 1) Z are obtained by the following equations.

s (i, 1) X = (pX + X ') / mX
s (i, 1) Y = (pY + Y ') / mY
s (i, 1) Z = (pZ + Z ') / mZ
The average value s (i, 1) _ave and variance s (i, 1) of the parameters s (i, 1) X, s (i, 1) Y and s (i, 1) Z are obtained by the following equations .

s (i, 1) _ave = {s (i, 1) X + s (i, 1) Y + s (i, 1) Z} / 3
s (i, 1) = [{s (i, 1) Xs (i, 1) _ave } ² + {s (i, 1) Ys (i, 1) _ave } ² + {s (i, 1) Zs (i, 1) _ave } ² ] / 3
Work arrangements 2 to 6 (j = 2,..., 6) are arrangements in which the estimated operation amounts (Xj, Yj, Zj) are as follows.
Work placement 2 (j = 2): (Xj, Yj, Zj) = (X ′, Z ′, Y ′)
Work placement 3 (j = 3): (Xj, Yj, Zj) = (Y ′, X ′, Z ′)
Work placement 4 (j = 4): (Xj, Yj, Zj) = (Y ′, Z ′, X ′)
Work placement 5 (j = 5): (Xj, Yj, Zj) = (Z ′, X ′, Y ′)
Work placement 6 (j = 6): (Xj, Yj, Zj) = (Z ′, Y ′, X ′)
The parameters s (i, j) X, s (i, j) Y and s (i, j) Z in the case of the workpiece arrangements 2 to 6 (j = 2,..., 6) are obtained by the following equations, respectively. Parameters s (i, j) X, s (i, j) Y and s (i, j) Z are parameters s (i, 1) X, s (i, 1) Y and s (i, 1) Z As with, this parameter indicates the necessity of performing maintenance on each axis.
・ Work placement 2 (j = 2)
s (i, 2) X = (pX + X ') / mX
s (i, 2) Y = (pY + Z ') / mY
s (i, 2) Z = (pZ + Y ') / mZ
・ Work placement 3 (j = 3)
s (i, 3) X = (pX + Y ') / mX
s (i, 3) Y = (pY + X ') / mY
s (i, 3) Z = (pZ + Z ') / mZ
・ Work placement 4 (j = 4)
s (i, 4) X = (pX + Y ') / mX
s (i, 4) Y = (pY + Z ') / mY
s (i, 4) Z = (pZ + X ') / mZ
・ Work placement 5 (j = 5)
s (i, 5) X = (pX + Z ') / mX
s (i, 5) Y = (pY + X ') / mY
s (i, 5) Z = (pZ + Y ') / mZ
・ Work placement 6 (j = 6)
s (i, 6) X = (pX + Z ') / mX
s (i, 6) Y = (pY + Y ') / mY
s (i, 6) Z = (pZ + X ') / mZ
The average value s (i, j) _ave and variance s (i, j) of the parameters in each work arrangement j are obtained by the following equations.

s (i, j) _ave = (s (i, j) X + s (i, j) Y + s (i, j) Z} / 3
s (i, j) = ({s (i, j) Xs (i, j) _ave } ² + {s (i, j) Ys (i, j) _ave } ² + {s (i, j) Zs (i, j) _ave } ² ] / 3 ... (1)
The variance s (i, j) increases as the variation in the ratio of the operation amount to the upper limit operation amount of the drive unit corresponding to each axis increases after measuring the workpiece i with respect to the measuring device i. Is a parameter having the following property. And it is estimated that the drive part corresponding to each axis | shaft of the measuring machine i is used equally, so that dispersion | distribution s (i, j) is small.

  When the calculation of the variance s (i, j) is completed for all the work arrangements j (j = 1,..., 6) (Yes in step S36), the processing unit 102 determines that the variance s (i, j) is the minimum. A workpiece placement j is selected (step S40). And the process part 102 calculates the difference di about the selected workpiece | work arrangement | positioning j (step S42).

  Let the operating amount of each axis of the measuring machine i before performing a new measurement job be (Xi, Yi, Zi). Since the estimated operating amount when a new measurement job is performed with the workpiece placement j is (Xj, Yj, Zj), the average operating amount aX of each axis of all measuring machines i after the new measurement job is performed , AY and aZ are obtained by the following equations.

X-axis average working volume: aX = (X1 + X2 + ... + Xn + Xj) / n
Y-axis average working amount: aY = (Y1 + Y2 + ... + Yn + Yj) / n
Z-axis average working amount: aZ = (Z1 + Z2 + ... + Zn + Zj) / n
In the measuring machine 1, the difference d1 when the measurement is performed with the workpiece arrangement j is obtained by the following equation.

d1X = | (X1 + Xj) -aX | + | X2-aX | + ... + | Xn-aX |
d1Y = | (Y1 + Yj) -aY | + | Y2-aY | + ... + | Yn-aY |
d1Z = | (Z1 + Zj) -aZ | + | Z2-aZ | + ... + | Zn-aZ |
d1 = d1X + d1Y + d1Z
The processing unit 102 obtains a work placement j that minimizes the variance s (i, j) in all the measuring machines i (step S40). And the process part 102 calculates | requires the difference di by the following formula about the workpiece | work arrangement | positioning j calculated | required about each measuring machine i (step S42). The processing unit 102 sets i = i + 1 (step S46), and repeats the calculation of the difference di for all the measuring machines i (steps S32 to S46).

diX = | X1-aX | + ... + | (Xi + Xj) -aX | + ... + | Xn-aX |
diY = | Y1-aY | + ... + | (Yi + Yj) -aY | + ... + | Yn-aY |
diZ = | Z1-aZ | + ... + | (Zi + Zj) -aZ | + ... + | Zn-aZ |
di = diX + diY + diZ (2)
The difference di is a parameter having a property that the value increases as the difference absolute value between the operation amount and the average operation amount increases for the measuring device i. It is estimated that the measuring instrument i is used evenly as the difference di is smaller.

  Note that, as the difference di, the sum of absolute differences between the operation amount after execution of the measurement job and the average operation amount is calculated, but the present invention is not limited to this. For example, a sum of squares may be used instead of the sum of absolute differences.

  When the calculation of the difference di is completed for all the measuring machines i (i = 1,..., N) (Yes in step S44), the processing unit 102 selects the measuring machine i that minimizes the difference di (step S48). Then, the workpiece conveying device 200 and the measuring device i are instructed to perform measurement using the selected measuring device i and the workpiece arrangement j (step S50).

  According to the present embodiment, when there are a plurality of measuring instruments i, the measuring instruments i can be used evenly, so that jobs concentrate on a specific measuring instrument i and the frequency of maintenance increases. Can be prevented. Furthermore, according to the present embodiment, the frequency of maintenance can be suppressed by selecting the work placement j based on the operation amount until maintenance is required.

(Second Embodiment)
Next, a measuring instrument management method according to the second embodiment of the present invention will be described with reference to FIG.

  In this embodiment, the difference d (i, j) is calculated for each measuring machine i and each workpiece placement j, and the measuring machine i and the workpiece placement j that minimize the difference d (i, j) are selected. The measuring machine i is used evenly while taking the workpiece arrangement j into consideration.

  First, the processing unit 102 calculates the difference d (i, j) when the workpiece placement j (j = 1) is selected (step S62) in the measuring machine i (i = 1) (step S60) (step S62). S64). Then, the processing unit 102 sets j = j + 1 (step S68), and repeats the calculation of the difference d (i, j) for all work arrangements (j = 1,..., 6) (steps S64 to S68). Next, the processing unit 102 sets i = i + 1 (step S72), and repeats the calculation of the difference d (i, j) for all the measuring machines i (steps S62 to S72).

  The difference d (i, j) when the measurement is performed with the workpiece arrangement j in the measuring machine i can be obtained as follows.

First, as in the first embodiment, the work arrangement j is defined as follows.
Work placement 1 (j = 1): (Xj, Yj, Zj) = (X ′, Y ′, Z ′)
Work placement 2 (j = 2): (Xj, Yj, Zj) = (X ′, Z ′, Y ′)
Work placement 3 (j = 3): (Xj, Yj, Zj) = (Y ′, X ′, Z ′)
Work placement 4 (j = 4): (Xj, Yj, Zj) = (Y ′, Z ′, X ′)
Work placement 5 (j = 5): (Xj, Yj, Zj) = (Z ′, X ′, Y ′)
Work placement 6 (j = 6): (Xj, Yj, Zj) = (Z ′, Y ′, X ′)
Next, average working amounts aX, aY, and aZ of each axis are calculated by the following formula for each workpiece arrangement j.

X-axis average working volume: aX = (X1 + X2 + ... + Xn + Xj) / n
Y-axis average working amount: aY = (Y1 + Y2 + ... + Yn + Yj) / n
Z-axis average working amount: aZ = (Z1 + Z2 + ... + Zn + Zj) / n
Next, using the average operating amounts aX, aY, and aZ of each axis calculated for each workpiece arrangement j, the differences d (i, j) X, d (i, j) Y and d (i, j) of each axis ) Calculate Z and calculate the difference d (i, j). By repeating this calculation for each work arrangement j and each measuring machine i, d (i, j) (i = 1,..., N, j = 1,..., 6) is obtained.

d (i, j) X = | X1-aX | + ... + | (Xi + Xj) -aX | + ... + | Xn-aX |
d (i, j) Y = | Y1-aY | + ... + | (Yi + Yj) -aY | + ... + | Yn-aY |
d (i, j) Z = | Z1-aZ | + ... + | (Zi + Zj) -aZ | + ... + | Zn-aZ |
d (i, j) = d (i, j) X + d (i, j) Y + d (i, j) Z
The difference d (i, j) is greater for a specific measuring instrument i, and the larger the absolute value of the difference between the operating amount and the average operating amount, and the operating amount of the drive unit corresponding to the specific axis. This is a parameter having the property that the value increases as becomes larger. And it is estimated that the drive part corresponding to each axis | shaft of the measuring machine i is used equally, so that the difference d (i, j) is small.

  When the calculation of the difference d (i, j) is completed for all measuring instruments i (i = 1,..., N) (Yes in step S70), the processing unit 102 determines that the difference d (i, j) is the minimum. The measuring machine i and the workpiece arrangement j are selected (step S74). And the process part 102 instruct | indicates to the workpiece conveyance apparatus 200 and the measuring machine i so that it may measure with the selected measuring machine i and the workpiece | work arrangement | positioning j (step S76).

  According to the present embodiment, when there are a plurality of measuring instruments i, the driving unit of each measuring instrument i can be used evenly, so that jobs are concentrated on a specific measuring instrument i and the frequency of maintenance is increased. It can be prevented from becoming high.

(Third embodiment)
Next, a measuring instrument management method according to the third embodiment of the present invention will be described with reference to FIG.

  In the present embodiment, the variance s (i, j) is calculated for each measuring machine i and each workpiece arrangement j, and the measuring machine i and the workpiece arrangement j that minimize the variance s (i, j) are selected. The measuring machine i is used evenly while taking the workpiece arrangement j into consideration.

  First, the processing unit 102 calculates the variance s (i, j) when the workpiece placement j (j = 1) is selected (step S82) in the measuring machine i (i = 1) (step S80) (step S82). S84). Then, the processing unit 102 sets j = j + 1 (step S88), and repeats the calculation of the distribution s (i, j) for all work arrangements (j = 1,..., 6) (steps S84 to S88). Next, the processing unit 102 sets i = i + 1 (step S92), and repeats the calculation of the variance s (i, j) for all measuring instruments i (steps S82 to S92).

  The dispersion s (i, j) when the measurement is performed with the workpiece arrangement j in the measuring machine i can be obtained as follows.

  First, the workpiece arrangement j is defined in the same manner as in the first and second embodiments. Next, parameters s (i, j) X, s (i, j) Y, and s (i, j) Z are obtained by the following equations. Parameters s (i, j) X, s (i, j) Y and s (i, j) Z are the upper limit of the sum of the actual operation amount of each axis and the estimated operation amount when a new measurement job is performed. This parameter is obtained by dividing by a quantity, and is a parameter indicating the necessity of performing maintenance on each axis.

s (i, j) X = (pX + Xj) / mX
s (i, j) Y = (pY + Yj) / mY
s (i, j) Z = (pZ + Zj) / mZ
Next, the average value s (i, j) _ave and variance s (i, j) of the parameters in each work arrangement j are obtained by the following equations.

s (i, j) _ave = (s (i, j) X + s (i, j) Y + s (i, j) Z} / 3
s (i, j) = ({s (i, j) Xs (i, j) _ave } ² + {s (i, j) Ys (i, j) _ave } ² + {s (i, j) Zs (i, j) _ave } ² ] / 3
The variance s (i, j) increases as the variation in the ratio of the operation amount to the upper limit operation amount of the drive unit corresponding to each axis increases after measuring the workpiece i with respect to the measuring device i. Is a parameter having the following property. And it is estimated that the drive part corresponding to each axis | shaft of the measuring machine i is used equally, so that dispersion | distribution s (i, j) is small.

  When the calculation of the variance s (i, j) is completed for all measuring instruments i (i = 1,..., N) (Yes in step S90), the processing unit 102 determines that the variance s (i, j) is the minimum. The measuring machine i and the workpiece arrangement j are selected (step S94). Then, the processing unit 102 instructs the workpiece conveying device 200 and the measuring device i to perform measurement using the selected measuring device i and the workpiece arrangement j (step S96).

  According to the present embodiment, when there are a plurality of measuring machines i, the frequency of maintenance can be suppressed by selecting the work placement j based on the operation amount until maintenance is required. .

  In the first to third embodiments, the work placement j can also be selected. However, for example, the work placement may be fixed. Further, for example, when measurement at a specific workpiece arrangement is difficult due to the shape of the workpiece, the variance s (i, j) or the difference d (i, j) is only applied to a part of the workpiece arrangements 1 to 6. ) May be calculated.

  DESCRIPTION OF SYMBOLS 1 ... Measuring machine management system, 10 ... Measuring machine, 12 ... Head, 14 ... Beam (beam), 16 ... Column (support), 18 ... Surface plate, 20 ... Base, 22 ... Probe, 24 ... Stylus, 26 ... Measuring element, 50 ... processor, 52 ... operation unit, 54 ... memory, 56 ... communication interface (communication I / F), 58X ... X-axis drive unit, 58Y ... Y-axis drive unit, 58Z ... Z-axis drive unit, 60X ... X axis scale, 60Y ... Y axis scale, 60Z ... Z axis scale, 100 ... measuring machine management device, 102 ... processing unit, 104 ... operation unit, 106 ... storage unit, 108 ... display unit, 110 ... communication interface (communication I) / F), 200 ... Workpiece conveying device

Claims (6)

An operation results acquisition unit for acquiring operation results for each of the drive shafts of a plurality of measuring machines each having a plurality of drive shafts;
An estimated operating amount calculation unit that calculates an estimated operating amount for each of the drive shafts of the measuring machine when performing measurement using the measuring machine;
Based on the operation results and the estimated operation amount, an average operation amount calculation unit that calculates an average operation amount for each drive shaft of the measuring machine when the measurement operation is performed for each drive shaft of the measuring machine When,
Based on the operation results for each drive shaft of the measuring machine, the estimated operation amount, and the average operation amount, so that the operation results for each measurement device and the operation results for each drive shaft of the measurement device are equalized. A selection unit for selecting a measuring machine to which the measurement work is assigned from the plurality of measuring machines;
A measuring machine management device.   The selection unit assigns the measurement work so that a sum of absolute differences between a value obtained by adding the estimated operation amount to the operation results of the plurality of measurement devices and the average operation amount is minimized. The measuring machine management device according to claim 1, wherein For the drive shafts of the plurality of measuring machines, further comprising an upper limit operating amount acquisition unit for acquiring an upper limit operating amount until maintenance is required,
The measuring device management device according to claim 1, wherein the selection unit selects a measuring device to which the measurement work is assigned based on the operation result, the estimated operation amount, and the upper limit operation amount.   The measurement according to claim 3, wherein the selection unit selects a measuring machine to which the measurement work is assigned so that a variance of a value obtained by dividing the sum of the operation results and the estimated operation amount by the upper limit operation amount is minimized. Machine management device. The estimated operation amount calculation unit calculates the estimated operation amount when the measurement work is performed by changing the arrangement of the object to be measured in the measuring machine,
The average operation amount calculation unit calculates the average operation amount when the measurement work is performed by changing the arrangement of the measurement object in the measuring machine,
The said selection part selects the measuring machine which allocates the said measurement operation | work based on the said operation performance for every said drive shaft of the said several measuring machine, the said estimated operation amount, and the said average operation amount. The measuring machine management device according to any one of the above. Acquire operation results for each of the drive shafts of a plurality of measuring machines each having a plurality of drive shafts,
Calculate the estimated operating amount for each of the drive shafts of the measuring machine when performing the measurement work using the measuring machine,
Based on the operation results and the estimated operation amount, for each of the drive shafts of the measuring machine, to calculate an average operation amount for each of the drive shafts of the measurement machine when performing the measurement work,
Based on the operation results for each drive shaft of the measuring machine, the estimated operation amount, and the average operation amount, so that the operation results for each measurement device and the operation results for each drive shaft of the measurement device are equalized. A measuring instrument management method of selecting a measuring instrument to which the measurement work is assigned from the plurality of measuring instruments.

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