JP2019159475A - Failure detection device and failure analysis method - Google Patents

Abstract

To provide a failure detection device which, in response to the occurrence of a failure, can exclude modules where only secondary failures occur, to detect the failure.SOLUTION: The failure detection device is configured to comprise failure-related information table storage means 1, failure detection means 2, failure information identification means 3, failure-related information storage means 4, failure identification means 5, and secondary failure determination means 6. The failure-related information table storage means 1 stores therein failure associating information associating failures which may occur, with modules being factors of the failures. The failure detection means 2 detects a module where a failure has occurred. The failure information identification means 3 identifies failure associating information corresponding to the detected failure. The failure-related information storage means 4 stores therein the identified failure associating information and a scheduled time for processing in association with each other. The failure identification means 5 identifies a faulty module on the basis of the failure associating information. The secondary failure determination means 6 determines secondary failures in modules other than the faulty module.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a failure analysis technique, and more particularly to a technique for performing analysis while suppressing the influence of a secondary failure.

  An information processing apparatus having a failure analysis function for analyzing a failure location and presenting a replacement part when a failure occurs in each module constituting the apparatus is used. An information processing apparatus having such a function collects a log of each module every time a failure occurs, and points out a module that may have a failure based on analysis of the collected log. When a failure occurs in a module that causes a secondary failure such as a power supply or a clock generation circuit, there is a high possibility that the failure will occur in another module in which no failure has occurred. In such a case, no fault actually occurs and only a secondary failure occurs, and a normally usable module is also pointed out as a replacement part. Therefore, module replacement of modules that do not need to be replaced can occur. For this reason, it is desirable that there is a technique for pointing out parts that need to be replaced while suppressing replacement of parts that can operate normally, and related techniques have been developed.

  Patent Document 1 relates to a failure impact analysis apparatus that identifies a range of parts that are affected by a failure when a failure occurs. The failure influence analysis apparatus of the patent document stores data representing other parts that depend on when the parts operate as dependence data. Moreover, the failure influence analysis apparatus of Patent Document 1 has a function of analyzing the influence of a failed part on the processing capability of other parts.

JP 2011-113122 A

  However, the technique of Patent Document 1 is not sufficient in the following points. In the technique of Patent Document 1, when a faulted part exists, a range in which the fault of the part can affect is specified, and the influence on the processing capability of other parts is analyzed. However, the failure influence analysis apparatus of Patent Document 1 does not have a function of determining a normal part from among the affected parts. For this reason, the technique of Patent Document 1 is not sufficient as a technique for suppressing replacement of a component in which only a secondary failure has occurred.

  In order to solve the above problems, an object of the present invention is to provide a failure detection device capable of detecting a failure by excluding a module in which only a secondary failure has occurred when a failure occurs. It is said.

  In order to solve the above problems, a failure detection apparatus according to the present invention includes a failure related information table storage unit, a failure detection unit, a failure information identification unit, a failure related information storage unit, a failure identification unit, and a subsidiary failure. Judgment means is provided. The failure-related information table storage unit stores, as failure association information, information that associates another module that causes a failure for each failure that occurs in each of a plurality of modules that constitute the apparatus. The failure detection means detects a module in which a failure has occurred among the plurality of modules. The fault information specifying unit specifies fault association information corresponding to the detected fault when the fault detecting unit detects the fault. The failure related information storage means stores the failure association information specified by the failure information specification means in association with the time at which the failure association information is processed. The failure identifying unit identifies a module in which a failure has actually occurred as a failure module based on the failure association information stored in the failure related information storage unit. The secondary failure determination means subordinates failures of modules other than the failure module included in the failure association information in which the time associated with the failure association information specifying the failed module and the time within a preset time are associated. Is determined to be a serious failure.

  The failure detection method of the present invention stores, as failure association information, information that associates another module that causes a failure for each failure that occurs in each of a plurality of modules constituting the apparatus. The failure detection method of the present invention detects a module in which a failure has occurred among a plurality of modules. When detecting a failure, the failure detection method of the present invention specifies failure association information corresponding to the detected failure. The failure detection method of the present invention stores the identified failure association information and the time when the failure association information is processed in association with each other. In the failure detection method of the present invention, the module in which a failure has actually occurred is identified as a failure module based on the stored failure association information. According to the failure detection method of the present invention, a failure associated with a module other than the failure module included in the failure association information associated with the time associated with the failure association information specifying the failed module and the time within a preset time is subordinated. Is determined to be a failure.

  According to the present invention, when a failure occurs, it is possible to detect a failure by excluding a module in which only a secondary failure has occurred.

It is a figure which shows the outline | summary of a structure of the 1st Embodiment of this invention. It is a figure which shows the outline | summary of a structure of the 2nd Embodiment of this invention. It is a figure which shows the example of the failure correlation information table of the 2nd Embodiment of this invention. It is a figure which shows the example of a data structure of the failure analysis result memory | storage part of the 2nd Embodiment of this invention. It is a figure which shows the example of a data structure of the failure correlation information storage part of the 2nd Embodiment of this invention. It is a figure which shows the outline | summary of the operation | movement flow of the 2nd Embodiment of this invention.

(First embodiment)
A first embodiment of the present invention will be described in detail with reference to the drawings. FIG. 1 shows an outline of the configuration of the failure detection apparatus according to the present embodiment. The failure detection apparatus according to the present embodiment includes failure related information table storage means 1, failure detection means 2, failure information identification means 3, failure related information storage means 4, failure identification means 5, and secondary failure determination means. 6 is provided. The failure related information table storage unit 1 stores, as failure association information, information that associates another module that causes a failure for each failure that occurs in each of a plurality of modules that constitute the apparatus. The failure detection unit 2 detects a module in which a failure has occurred among the plurality of modules. The fault information specifying unit 3 specifies fault association information corresponding to the detected fault when the fault detecting unit 2 detects the fault. The failure related information storage unit 4 stores the failure association information identified by the failure information identification unit 3 in association with the time at which the failure association information is processed. The failure identification unit 5 identifies a module in which a failure has actually occurred as a failure module based on the failure association information stored in the failure related information storage unit 4. The secondary fault determination means 6 subordinates faults of modules other than the faulty module included in the fault correlation information in which the time associated with the fault correlation information specifying the faulty module and the time within a preset time are associated. Is determined to be a failure.

  The failure detection device according to the present embodiment stores, as failure association information, information associated with another module that causes a failure for each failure that occurs in each of a plurality of modules constituting the device in the failure related information table storage unit 1. is doing. The fault information specifying unit 3 specifies fault association information corresponding to the detected fault when the fault detecting unit 2 detects the fault. In addition, the secondary failure determination means 6 detects the failures of modules other than the failure module included in the failure association information in which the time associated with the identified failure association information and the time within the preset time are associated. Is determined to be a serious failure. In this way, among the causes of failures that are affected by other modules, failures that occur within a preset time can be identified as secondary failures, so that they can be distinguished from modules that have actually failed. It becomes possible. As a result, by using the failure detection apparatus of this embodiment, when a failure occurs, it is possible to detect a failure by excluding a module in which only a secondary failure has occurred.

(Second Embodiment)
A second embodiment of the present invention will be described in detail with reference to the drawings. FIG. 2 shows an outline of the configuration of the information processing apparatus according to this embodiment. The information processing apparatus according to the present embodiment has a function of identifying a module in which a failure has occurred in the failure detection apparatus when a failure has occurred.

  The information processing apparatus according to this embodiment includes a functional module 11, a functional module 12, a power supply module 13, a power supply module 14, a clock module 15, a clock module 16, and a failure detection device 17. The modules are connected to each other and between the failure detection devices 17 through a bus.

  The function module 11 and the function module 12 have a function of executing each process based on the use of the information processing apparatus. Each functional module includes, for example, a CPU (Central Processing Unit), a memory, a hard disk drive, and the like. The CPU executes a computer program to process input data and output a result.

  The function module 11 and the function module 12 each have a failure detection function. The fault detection function of each functional module monitors the presence / absence of a fault in its own module. When the functional module 11 and the functional module 12 detect a failure in the own module, the functional module 11 and the functional module 12 send information indicating that the failure has been detected to the failure detection device 17 as failure notification information.

  The power supply module 13 supplies power to the functional module 11. The power supply module 14 supplies power to the functional module 11 and the functional module 12. The power supply module 13 and the power supply module 14 are supplied with power from outside the information processing apparatus 10 and supply power to each functional module. The power supply module 13 and the power supply module 14 may use a secondary battery or the like. Each power supply module has a failure detection function. When the power supply module 13 and the power supply module 14 detect a failure of the own module, the power supply module 13 and the power supply module 14 send information indicating that the failure has been detected to the failure detection device 17 as failure notification information.

  The clock module 15 and the clock module 16 generate a clock having a preset frequency and output the generated clock. The clock module 15 and the clock module 16 are configured by a semiconductor device having a clock generation function. The frequency of the generated clock is set in advance based on the operating frequency of the functional module. The clock module 15 outputs the generated clock to the functional module 11 and the functional module 12. The clock module 16 outputs the generated clock to the functional module 12. Each clock module has a failure detection function. When detecting the failure of the own module, the clock module 15 and the clock module 16 send information indicating that the failure has been detected to the failure detection device 17 as failure notification information.

  The failure detection device 17 further includes a diagnosis unit 20, a failure association table storage unit 31, a failure association information storage unit 32, and a failure analysis result storage unit 33.

  The diagnosis unit 20 further includes a failure analysis unit 21, a failure association information processing unit 22, and a failure analysis result processing unit 23. The diagnosis unit 20 of the present embodiment is configured by a semiconductor device. The failure analysis unit 21, the failure association information processing unit 22, and the failure analysis result processing unit 23 may be formed in the same semiconductor device, or different semiconductor devices may be used. Further, the diagnosis unit 20 may be configured to perform each process by executing a computer program in a general-purpose processor such as a CPU.

  The failure analysis unit 21 identifies the failure location based on the log data of each module. The log of each module is composed of data such as processing capability, output presence / absence, and output status. The failure analysis unit 21 stores a reference for each failure that occurs in each module, and compares the log with the reference to identify the location and type of failure occurring in each module. The failure analysis unit 21 outputs information such as the specified failure location to the failure analysis result processing unit 23. Further, the failure analysis unit 21 identifies the failure factor with reference to the failure association table. The failure analysis unit 21 outputs information on the identified failure factor to the failure association information processing unit 22.

  The failure association information processing unit 22 stores the failure factor information input from the failure analysis unit 21 in the failure association information storage unit 32. Further, the failure association information processing unit 22 determines an item of a secondary failure among the failure factors. The function of the failure analysis unit 21 of the present embodiment corresponds to the failure detection unit 2, the failure related information specifying unit 3 and the failure specifying unit 5 of the first embodiment.

  The failure association information processing unit 22 determines that a failure that has occurred within a preset reference time is a secondary failure, and excludes it from the location where the failure has occurred. The reference time for determining a secondary failure is stored in advance as a secondary failure determination time. The secondary failure determination time may be different for each module, and may be configured to be changeable based on an input from an operator or the like. The function of the failure association information processing unit 22 of the present embodiment corresponds to the secondary failure determination unit 6 of the first embodiment.

  The failure analysis result processing unit 23 stores the failure location information input from the failure analysis unit 21 in the failure analysis result storage unit 33.

  The failure association table storage unit 31 stores, as a failure association table, information on modules that can be the cause of failure for each failure factor that occurs in each module. FIG. 3 shows an example of the configuration of the failure association table of this embodiment.

  In FIG. 3, the functional module 11 and the functional module 12 are shown as a functional module A and a functional module B. In FIG. 3, the power supply module 13 and the power supply module 14 are shown as a power supply module A and a power supply module B. In FIG. 3, the clock module 15 and the clock module 16 are shown as a clock module A and a clock module B.

  As shown in FIG. 3, the failure association table associates information about whether each module can be a cause of failure for each module. For example, the failure association table holds information as “valid” when each module causes a failure, and “invalid” when a failure causes. For example, since the power supply module and the clock module are not affected by the failure of other modules, only the own module becomes the cause of the failure. Therefore, in the power supply module and the clock module, only the own module is set to “valid”.

  Further, the failure association table of FIG. 3 holds information as “Attribution” when each module can be a cause of failure, and “Unassigned” when it is not a cause of failure.

  The failure analysis unit 21 determines which failure factor the generated failure corresponds to based on the analysis result of the log of each module. The failure analysis unit 21 stores in advance data on the relationship between the log analysis result and the failure factor of each module. The function of the failure association table storage unit 31 of the present embodiment corresponds to the failure association information table storage unit 1 of the first embodiment.

  The failure association information storage unit 32 has a function of storing failure association information. The failure association information storage unit 32 stores failure related information corresponding to the failure location. The failure association information storage unit 32 stores the failure factor information input from the failure association information processing unit 22 in the failure association information storage unit 32 in association with the storage time.

  FIG. 4 shows an example of the configuration of the fault association information of this embodiment. The failure association information is associated with a time when the failure association information is stored and a flag indicating whether the failure association information is valid.

  The failure association information storage unit 32 according to the present embodiment corresponds to the failure association information storage unit 4 according to the first embodiment.

  The failure analysis result storage unit 33 stores the failure analysis result input from the failure analysis unit 21, that is, the information on the failure location. FIG. 5 is a diagram illustrating an example of a configuration of a failure analysis result stored in the failure analysis result storage unit 33. As shown in FIG. 5, information on failure analysis results is sequentially stored in each storage area of the failure analysis result storage unit 33.

  The failure association table storage unit 31, the failure association information storage unit 32, and the failure analysis result storage unit 33 of the present embodiment are configured using a nonvolatile semiconductor storage device. The failure association table storage unit 31, the failure association information storage unit 32, and the failure analysis result storage unit 33 may be regions on the same semiconductor storage device, or may be configured using different semiconductor storage devices. Good. In addition, the failure association table storage unit 31, the failure association information storage unit 32, and the failure analysis result storage unit 33 are configured by other storage devices such as a hard disk drive or a combination thereof in place of the nonvolatile semiconductor storage device. May be. Further, part or all of the failure association table storage unit 31, the failure association information storage unit 32, and the failure analysis result storage unit 33 may be formed on the same semiconductor device as the diagnosis unit 20.

  An operation for identifying a module in which a secondary failure has occurred when a failure has been detected in the information processing apparatus of the present embodiment and identifying a module in which a failure has occurred will be described. FIG. 6 shows an operation flow when a faulty module is identified when a fault is detected in the information processing apparatus.

  When a failure occurs in any of the modules constituting the information processing apparatus, failure notification information is input to the diagnosis unit 20 from the module in which the failure is detected by the own module (step S11).

  When the failure notification information is input to the diagnosis unit 20, the failure analysis unit 21 of the diagnosis unit 20 acquires a log of each module (step S12). When the log is acquired from each module, the failure analysis unit 21 analyzes the failure location based on the log data (step S13).

  When the failure location is analyzed, the failure analysis unit 21 sends the failure location analysis result to the failure analysis result processing unit 23 as a failure analysis result. When receiving the failure analysis result, the failure analysis result processing unit 23 stores the failure analysis result in the failure analysis result storage unit 33.

  Further, the failure analysis unit 21 refers to the failure association table storage unit 31 and identifies a corresponding failure factor based on the result of the failure analysis (step S14). When the failure factor corresponding to the analysis result is specified, the failure analysis unit 21 sends the failure factor information to the failure association information processing unit 22. Upon receiving the failure factor information, the failure association information processing unit 22 stores the received failure factor information in the failure association information storage unit 32 in association with the time at which the processing is performed, for example, the time at which the storage process is performed. (Step S15).

  When the failure cause information is stored in the failure association information storage unit 32 and there is failure notification information whose log analysis is not yet processed (Yes in step S16), the failure analysis unit 21 performs step S12. The operation from is performed again.

  When the analysis and the like of the log corresponding to the failure notification information input to the diagnosis unit 20 are all completed (No in step S16), the failure association information processing unit 22 uses the failure association information stored in the failure association information storage unit 32. Determine if there is a secondary failure.

  When the determination of the secondary failure is started, the failure association information processing unit 22 identifies the location where the failure actually occurs. When a failure factor that actually causes a failure is identified, the failure association information processing unit 22 extracts a failure factor associated with a time within a preset time difference from the associated time. When the failure factor within the time for which the time difference is set is extracted, the failure association information processing unit 22 determines that the extracted range is the secondary failure range (step S17).

  When determining the range of the secondary failure, the failure association information processing unit 22 sets “invalid” for the flag associated with the failure factor within the determined range (step S18). When the flag is set to “invalid”, a failure that has occurred in the module set as belonging among the failure factors with the flag being “invalid” is considered to be due to a secondary failure.

  When the determination of the secondary failure is completed, the failure analysis unit 21 notifies the operator or the like by outputting the information of the module included in the failure cause with the flag valid to the display device or the like (step S19).

  Next, the operation when determining the range of the secondary failure when a failure occurs in the power supply module 14 of the information processing apparatus 10 will be described using a more specific example. In the following description, an example will be described in which a failure occurs in the power supply 4 and a malfunction occurs in the operation of the function module 11 and the function module 12 receiving power supply.

  When the functional module 11 detects an abnormality in the operation of its own module, the functional module 11 outputs failure notification information to the diagnosis unit 20.

  When the failure notification information is input, the failure analysis unit 21 of the diagnosis unit 20 acquires log data from each module. The failure analysis unit 21 acquires logs from the functional module 11, the functional module 12, the power supply module 13, the power supply module 14, the clock module 15, and the clock module 16.

  When the log of each module is acquired, the failure analysis unit 21 analyzes the log data and identifies the failure location.

  When the failure location is specified, the failure analysis unit 21 sends information on the failure analysis result to the failure analysis result processing unit 23. When the failure analysis result information is received, the failure analysis result processing unit 23 stores the received failure analysis result information in the area 1 of the failure analysis result storage unit 33.

  Further, when the failure analysis unit 21 receives a request for analyzing a failure location, the failure analysis unit 21 refers to the failure association table and identifies a failure factor. At this time, it is assumed that the failure factor corresponds to the failure factor 1 of the functional module A in FIG. In the function module A failure factor 1, the power supply module A, the power supply module B, and the clock module A corresponding to the power supply module 13, the power supply module 14, and the clock module 15 belong to each other. In addition, in the functional module A failure factor 1, the clock module 16 corresponding to the clock module 16 is in an unassigned state.

  When the failure factor is specified, the failure analysis unit 21 sends information on the failure factor to the failure association information processing unit 22. Upon receiving the failure factor information, the failure association information processing unit 22 stores the received failure factor information as failure association information 1 in the failure association information storage unit 32 in association with the storage time 1. In addition, the failure association information processing unit 22 sets the failure association information 1 flag to “valid” in the received failure cause information.

  When the functional module 12 detects an operation abnormality of its own module, the functional module 12 outputs failure notification information to the diagnosis unit 20. When the failure notification information is received, the failure analysis unit 21 of the diagnosis unit 20 acquires log data from each module. The failure analysis unit 21 of the diagnosis unit 20 acquires logs from the function module 11, the function module 12, the power supply module 13, the power supply module 14, the clock module 15, and the clock module 16.

  When acquiring the log of each module, the failure analysis unit 21 analyzes the failure location based on the log data.

  When the failure location is specified, the failure analysis unit 21 sends information on the failure analysis result to the failure analysis result processing unit 23. When receiving the failure analysis result information, the failure analysis result processing unit 23 stores the received failure analysis result information in the area 2 of the failure analysis result storage unit 33.

  Further, when the failure analysis unit 21 receives a request for analyzing a failure location, the failure analysis unit 21 refers to the failure association table and identifies a failure factor. At this time, it is assumed that the failure factor corresponds to the failure factor 2 of the functional module B in FIG. In the functional module B failure factor 2, the power supply module B, the clock module A, and the clock module B corresponding to the power supply module 14, the clock module 15, and the clock module B are assigned. In addition, in the functional module B failure factor 2, the power module A corresponding to the power module 13 is in an unassigned state.

  When the failure factor is specified, the failure analysis unit 21 sends information on the failure factor to the failure association information processing unit 22. Upon receiving the failure factor information, the failure association information processing unit 22 stores the received failure factor information as failure association information 2 in the failure association information storage unit 32 in association with the save time 2. In addition, the failure association information processing unit 22 sets the failure association information 2 flag to “valid” in the received failure cause information.

  When the power supply module 14 detects a failure of its own module, it outputs failure notification information to the diagnosis unit 20. When the failure notification information is received, the failure analysis unit 21 of the diagnosis unit 20 acquires log data from each module. The failure analysis unit 21 acquires logs from the functional module 11, the functional module 12, the power supply module 13, the power supply module 14, the clock module 15, and the clock module 16.

  When acquiring the log of each module, the failure analysis unit 21 analyzes the failure location based on the log data.

  When the failure location is specified, the failure analysis unit 21 sends information on the failure analysis result to the failure analysis result processing unit 23. When receiving the failure analysis result information, the failure analysis result processing unit 23 stores the received failure analysis result information in the area 2 of the failure analysis result storage unit 33.

  Further, when the failure analysis unit 21 receives a request for analyzing a failure location, the failure analysis unit 21 refers to the failure association table and identifies a failure factor. At this time, it is assumed that the failure factor corresponds to the failure factor 1 of the power supply module A in FIG. In the power module A failure factor 1, the power module B corresponding to the power module 14 belongs. Further, in the power module A failure factor 1, the power module B, the clock module A, and the clock module B corresponding to the power module 13, the clock module 15, and the clock module 16 are in an unassigned state.

  When the failure factor is specified, the failure analysis unit 21 sends information on the failure factor to the failure association information processing unit 22. Upon receiving the failure factor information, the failure association information processing unit 22 stores the received failure factor information as failure association information 3 in the failure association information storage unit 32 in association with the storage time 3. Further, the failure association information processing unit 22 sets the flag of the failure association information 3 to “valid” for the received failure cause information.

  When the analysis of the log for each piece of failure notification information is completed and the failure association information is stored, the failure association information processing unit 22 determines that the power supply module 14 of the failure association information 3 is “valid” and thus the power supply module 14 Is determined to have failed. Since the power supply module 14 is not affected by the failure of another module, the failure association information processing unit 22 can determine that an actual failure has occurred in the power supply module 14. If it is determined that a failure has occurred in the power supply module 14, the failure association information processing unit 22 reads the data of each area of the failure association information storage unit 32, stores the time stored in each area, and the failure association information 3. The time difference from time 3 is compared.

  When the time difference between the time 3 and the time between the area 1 and the area 2 is within the reference time for determining the secondary failure, the failure association information processing unit 22 indicates that the failure in the area 1 and the area 2 is a secondary failure. Judge. When determining that the failure in area 1 and area 2 is a secondary failure, the failure association information processing unit 22 sets the flags of area 1 and area 2 in the failure association information storage unit 32 to “invalid”. By setting the flag to invalid, the module belonging to the failure association information 1 and the failure association information 2 corresponds to a secondary failure and is treated as a module in which no failure has occurred.

  Next, an example in which a secondary failure is determined when a failure of another pattern occurs in the information processing apparatus according to the present embodiment will be described. Hereinafter, a case where a failure has occurred in the functional module 11 and the clock module 16 and a secondary failure has occurred in the functional module 12 will be described as an example.

  When the functional module 11 detects an abnormality in the operation of its own module, the functional module 11 outputs failure notification information to the diagnosis unit 20.

  When the failure notification information is input, the failure analysis unit 21 of the diagnosis unit 20 acquires log data from each module. The failure analysis unit 21 acquires logs from the functional module 11, the functional module 12, the power supply module 13, the power supply module 14, the clock module 15, and the clock module 16.

  When the log of each module is acquired, the failure analysis unit 21 analyzes the log data and identifies the failure location.

  When the failure location is specified, the failure analysis unit 21 sends information on the failure analysis result to the failure analysis result processing unit 23. When the failure analysis result information is received, the failure analysis result processing unit 23 stores the received failure analysis result information in the area 4 of the failure analysis result storage unit 33.

  Further, when the failure analysis unit 21 receives a request for analyzing a failure location, the failure analysis unit 21 refers to the failure association table and identifies a failure factor. At this time, it is assumed that the failure factor corresponds to the failure factor 3 of the functional module A in FIG. In the functional module A failure factor 3, the power module B and the clock module A corresponding to the power module 14 and the clock module 15 belong to each other. Further, in the functional module A failure factor 3, the power module A and the clock module 16 corresponding to the power module 13 and the clock module 16 are in an unassigned state.

  When the failure factor is specified, the failure analysis unit 21 sends information on the failure factor to the failure association information processing unit 22. Upon receiving the failure factor information, the failure association information processing unit 22 stores the received failure factor information as failure association information 4 in the failure association information storage unit 32 in association with the time 4 to be stored. Further, the failure association information processing unit 22 sets the flag of the failure association information 4 to “valid” in the received failure factor information.

  When the functional module 12 detects an operation abnormality of its own module, the functional module 12 outputs failure notification information to the diagnosis unit 20. When the failure notification information is received, the failure analysis unit 21 of the diagnosis unit 20 acquires log data from each module. The failure analysis unit 21 of the diagnosis unit 20 acquires logs from the function module 11, the function module 12, the power supply module 13, the power supply module 14, the clock module 15, and the clock module 16.

  When acquiring the log of each module, the failure analysis unit 21 analyzes the failure location based on the log data.

  When the failure location is specified, the failure analysis unit 21 sends information on the failure analysis result to the failure analysis result processing unit 23. When receiving the failure analysis result information, the failure analysis result processing unit 23 stores the received failure analysis result information in the area 5 of the failure analysis result storage unit 33.

  Further, when the failure analysis unit 21 receives a request for analyzing a failure location, the failure analysis unit 21 refers to the failure association table and identifies a failure factor. At this time, it is assumed that the failure factor corresponds to the failure factor 2 of the functional module B in FIG. In the functional module B failure factor 2, the power supply module B, the clock module A, and the clock module B corresponding to the power supply module 14, the clock module 15, and the clock module B are assigned. In addition, in the functional module B failure factor 2, the power module A corresponding to the power module 13 is in an unassigned state.

  When the failure factor is specified, the failure analysis unit 21 sends information on the failure factor to the failure association information processing unit 22. Upon receipt of the failure factor information, the failure association information processing unit 22 stores the received failure factor information as failure association information 5 in the failure association information storage unit 32 in association with the save time 5. Further, the failure association information processing unit 22 sets the flag of the failure association information 5 to “valid” for the received failure cause information.

  When the clock module 16 detects a failure of its own module, the clock module 16 outputs failure notification information to the diagnosis unit 20. When the failure notification information is received, the failure analysis unit 21 of the diagnosis unit 20 acquires log data from each module. The failure analysis unit 21 acquires logs from the functional module 11, the functional module 12, the power supply module 13, the power supply module 14, the clock module 15, and the clock module 16.

  When acquiring the log of each module, the failure analysis unit 21 analyzes the failure location based on the log data.

  When the failure location is specified, the failure analysis unit 21 sends information on the failure analysis result to the failure analysis result processing unit 23. When receiving the failure analysis result information, the failure analysis result processing unit 23 stores the received failure analysis result information in the area 6 of the failure analysis result storage unit 33.

  Further, when the failure analysis unit 21 receives a request for analyzing a failure location, the failure analysis unit 21 refers to the failure association table and identifies a failure factor. At this time, the failure factor corresponds to the failure factor 1 of the clock module B in FIG. In the clock module B failure factor 1, the clock module B corresponding to the clock module 16 is enabled. Further, in the clock module B failure factor 1, the power supply module A, the power supply module B, and the clock module A corresponding to the power supply module 13, the power supply module 14, and the clock module 15 are disabled.

  When the failure factor is specified, the failure analysis unit 21 sends information on the failure factor to the failure association information processing unit 22. Upon receiving the failure factor information, the failure association information processing unit 22 stores the received failure factor information as failure association information 6 in the failure association information storage unit 32 in association with the storage time 6. Further, the failure association information processing unit 22 sets the flag of the failure association information 6 to “valid” in the received failure cause information.

  When the analysis of the log for each failure notification information is completed and the failure association information is stored, the failure association information processing unit 22 determines that the clock module 16 of the failure association information 6 is “valid” and thus the power supply module 14. Is determined to have failed. Since the clock module 16 is not affected by the failure of other modules, the failure association information processing unit 22 can determine that an actual failure has occurred in the clock module 16. If it is determined that a failure has occurred in the clock module 16, the failure association information processing unit 22 calculates the time when the data of each area of the failure association information storage unit 32 is read and stored and the time 6 of the failure association information 6. Compare time differences.

  When the time difference between the time 6 and the time between the area 4 and the area 5 is within the reference time for determining the secondary failure, the failure association information processing unit 22 indicates that the failure in the area 4 and the area 5 is a secondary failure. Judge. When determining that the failure in the areas 4 and 5 is a secondary failure, the failure association information processing unit 22 sets the flags of the area 4 and the area 5 in the failure association information storage unit 32 to “invalid”. By setting the flag to invalid, the module belonging to the failure association information 4 and the failure association information 5 corresponds to a secondary failure and is handled as a module in which no failure has occurred.

  The information processing apparatus according to the present embodiment outputs failure notification information indicating that a failure has been detected to the failure detection device 17 when each module constituting the device detects a failure that has occurred in its own module. When failure notification information is input, the failure analysis unit 21 of the failure detection device 17 acquires a log from each module and analyzes the failure location. Further, the failure detection device 17 holds failure association information in which, for each failure that occurs in each of a plurality of modules constituting the device, information on other modules that cause the failure is associated. Further, based on the failure analysis performed in the failure analysis unit 21, the failure association information corresponding to the failure that has occurred is identified and associated with the time information. When a module is identified as having actually failed based on the failure association information, the failure occurring in another module included in the failure association information within the reference time is regarded as a secondary failure. Yes. As described above, by determining the secondary failure, it is possible to suppress the replacement of the module in which the failure has not occurred. As a result, when a failure occurs, the information processing apparatus according to the present embodiment can detect a failure by excluding a module in which only a secondary failure has occurred.

  In the second embodiment, a configuration in which two function modules, two power supply modules, and two clock modules are provided is described as an example. However, each module may be a single module or three or more modules. Further, the connection relationship between the modules may be a connection relationship other than the second embodiment. For example, the power supply module 14 may be connected only to the functional module 12.

  The processing in the failure analysis unit 21, the failure association information processing unit 22, and the failure analysis result processing unit 23 of the second embodiment may be performed by executing a computer program in a processor such as a CPU. A computer program for performing such processing can be recorded on a recording medium and distributed. As the recording medium, for example, a magnetic tape such as a data recording magnetic tape or a hard disk can be used. As the recording medium, an optical disk such as a CD-ROM (Compact Disc Read Only Memory) or a DVD (Digital Versatile Disc), or a magneto-optical disk may be used. A nonvolatile semiconductor memory device may be used as a recording medium.

DESCRIPTION OF SYMBOLS 1 Failure related information table storage means 2 Failure detection means 3 Failure related information identification means 4 Failure related information storage means 5 Failure identification means 6 Secondary failure determination means 11 Functional module 12 Functional module 13 Power supply module 14 Power supply module 15 Clock module 16 Clock Module 17 Failure detection device 20 Diagnosis unit 21 Failure analysis unit 22 Failure association information processing unit 23 Failure analysis result processing unit 31 Failure association table storage unit 32 Failure association information storage unit 33 Failure analysis result storage unit

Claims (10)

For each failure that occurs in each of a plurality of modules constituting the device, a failure related information table storage unit that stores information associating other modules that cause the failure as failure association information;
Fault detection means for detecting the module in which a fault has occurred among the plurality of modules;
Fault information specifying means for specifying the fault association information corresponding to the detected fault when the fault detection means detects a fault;
Fault-related information storage means for storing the fault association information specified by the fault information specifying means and the time for processing the fault correlation information in association with each other;
Based on the fault association information stored in the fault related information storage means, fault specifying means for specifying the module in which a fault has actually occurred as a fault module;
A failure of a module other than the failure module included in the failure association information associated with a time associated with the failure association information that identifies the failed module and a time within a preset time is regarded as a secondary failure. A failure detection apparatus comprising: a secondary failure determination means for determining. Log acquisition means for acquiring a log from each of the modules;
The failure detection apparatus according to claim 1, further comprising failure analysis means for analyzing a derivation location of a failure based on the log acquired by the log acquisition means. The failure related information storage means stores the failure association information in the order specified by the failure information specifying means,
The secondary failure determination means determines a failure of a module other than the failed module included in the failure association information stored in an area corresponding to the preset time as a secondary failure. The failure detection device according to claim 1, wherein: Further comprising information output means for outputting module information included in the fault association information specified by the fault specifying means;
4. The failure detection apparatus according to claim 1, wherein the information output unit does not output information on a module for which the secondary failure determination unit has determined that the failure is a secondary failure.   The failure according to any one of claims 1 to 4, wherein the failure association information is generated for each module in association with information on whether another module induces a secondary failure or not. Detection device. At least one information processing module having means for processing input data and outputting results;
At least one power supply module having means for supplying power to the information processing module;
At least one clock module having means for outputting a clock to the information processing module;
The failure detection device according to claim 1,
The failure detection apparatus handles the information processing module, the power supply module, and the clock module as the plurality of modules. For each failure that occurs in each of a plurality of modules constituting the device, information that associates other modules that cause the failure is stored as failure association information.
Detecting the failed module among the plurality of modules;
When a failure is detected, the failure association information corresponding to the detected failure is identified,
Storing the identified failure association information and the time at which the failure association information was processed in association with each other;
Based on the stored fault association information, the module in which a fault has actually occurred is identified as a fault module,
A failure of a module other than the failure module included in the failure association information associated with the time associated with the failure association information specifying the failed module and a time within a preset time is regarded as a secondary failure. A failure detection method characterized by determining. Get logs from each of the modules,
8. The failure detection method according to claim 7, wherein a failure derivation location is analyzed based on the acquired log. Storing the fault association information in the order in which faults are identified;
8. The failure of a module other than the failed module included in the failure association information stored in an area corresponding to the preset time is determined as a secondary failure. 8. The fault detection method according to 8. Set to not output the information of the module that has been determined that the failure is a secondary failure,
10. The failure detection method according to claim 7, wherein information on a module included in the failure association information that specifies a failure is output.

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