JP2019002746A5 - - Google Patents
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- JP2019002746A5 JP2019002746A5 JP2017116208A JP2017116208A JP2019002746A5 JP 2019002746 A5 JP2019002746 A5 JP 2019002746A5 JP 2017116208 A JP2017116208 A JP 2017116208A JP 2017116208 A JP2017116208 A JP 2017116208A JP 2019002746 A5 JP2019002746 A5 JP 2019002746A5
- Authority
- JP
- Japan
- Prior art keywords
- inspection apparatus
- gripping portions
- electrical contact
- bridging
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000005259 measurement Methods 0.000 claims description 5
- 230000001629 suppression Effects 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 11
- 230000001808 coupling Effects 0.000 claims 2
- 238000010168 coupling process Methods 0.000 claims 2
- 238000005859 coupling reaction Methods 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- 239000000463 material Substances 0.000 claims 1
Description
開示された発明の1つは、測定対象物と接触することで測定対象物と電気的に接続される電気的接点(51)と、
電気的接点と電気的に接続された導電部(52)と、
電気的接点と導電部の設けられる複数の把持部(31,32,33)と、
複数の把持部の電気的接点の相対位置を変動可能に、複数の把持部を連結する第1連結部(41,42,43)と、
複数の把持部の導電部と電気的に接続可能に、複数の把持部にノイズ対策素子(74)を連結する第2連結部(70,110,130)と、を有し、
第2連結部は、複数の把持部の導電部を架橋する、ノイズ対策素子の搭載された架橋部(70)を有し、
架橋部は、架橋する複数の把持部の相対位置の変動に対応して弾性変形可能であり、
架橋部の中央は端よりも複数の把持部の相対位置の変動に応じて弾性変形し易く、
ノイズ対策素子は架橋部の端に設けられている。
One of the disclosed inventions is an electrical contact (51) electrically connected to a measurement object by contacting the measurement object;
A conductive portion (52) electrically connected to the electrical contact;
A plurality of grips (31, 32, 33) provided with electrical contacts and conductive parts;
A first connecting part (41, 42, 43) for connecting the plurality of gripping parts so that the relative positions of the electrical contacts of the plurality of gripping parts can be varied;
Connectable plurality of electrically conductive portions of the grip portion, possess a second connecting portion for connecting the noise suppression element (74) to the plurality of gripping portion (70,110,130), and
The second connecting portion has a bridging portion (70) on which a noise countermeasure element is mounted, bridging the conductive portions of the plurality of gripping portions,
The bridging portion is elastically deformable in response to fluctuations in the relative positions of the plurality of gripping portions to be cross-linked,
The center of the bridging part is easier to elastically deform according to the change in the relative position of the plurality of gripping parts than the end,
The noise countermeasure element is provided at the end of the bridging portion .
Claims (11)
前記電気的接点と電気的に接続された導電部(52)と、
前記電気的接点と前記導電部の設けられる複数の把持部(31,32,33)と、
複数の前記把持部の前記電気的接点の相対位置を変動可能に、複数の前記把持部を連結する第1連結部(41,42,43)と、
複数の前記把持部の前記導電部と電気的に接続可能に、複数の前記把持部にノイズ対策素子(74)を連結する第2連結部(70,110,130)と、を有し、
前記第2連結部は、複数の前記把持部の前記導電部を架橋する、前記ノイズ対策素子の搭載された架橋部(70)を有し、
前記架橋部は、架橋する複数の前記把持部の相対位置の変動に対応して弾性変形可能であり、
前記架橋部の中央は端よりも複数の前記把持部の相対位置の変動に応じて弾性変形し易く、
前記ノイズ対策素子は前記架橋部の端に設けられている検査装置。 An electrical contact (51) electrically connected to the measurement object by contact with the measurement object;
A conductive portion (52) electrically connected to the electrical contact;
A plurality of grip portions (31, 32, 33) provided with the electrical contact and the conductive portion;
A first connecting portion (41, 42, 43) for connecting the plurality of gripping portions so that the relative positions of the electrical contacts of the plurality of gripping portions can be varied;
The conductive portion and to be electrically connected to a plurality of said holding part, possess a second connecting portion for connecting the noise suppression element (74) to a plurality of said gripping portion (70,110,130), and
The second connecting portion includes a bridging portion (70) on which the noise countermeasure element is mounted, which bridges the conductive portions of the plurality of gripping portions,
The bridging portion is elastically deformable in response to fluctuations in the relative positions of the plurality of gripping portions to be bridging,
The center of the bridging portion is more easily elastically deformed according to the change in the relative position of the plurality of gripping portions than the end,
The noise suppression element is an inspection apparatus provided at an end of the bridging portion .
複数の前記把持部の前記一端とは反対側の他端それぞれが前記第1連結部に連結される請求項1に記載の検査装置。 The electrical contact is provided at one end of the grip portion,
The inspection apparatus according to claim 1, wherein each of the other ends opposite to the one ends of the plurality of gripping portions is connected to the first connecting portion.
前記第1連結部と前記把持部それぞれの形成材料は弾性体である請求項2に記載の検査装置。 Each of the other ends of the plurality of gripping portions and the first connecting portion are integrally connected,
The inspection apparatus according to claim 2, wherein the forming material of each of the first connection part and the grip part is an elastic body.
前記自由端部の延設方向に、前記自由端部は前記固定端部に対して移動可能となっている請求項4または請求項5に記載の検査装置。 The grip portion has a free end (30a) where the electrical contact is provided at the one end, and a fixed end (30b) where the first connection is connected to the other end,
6. The inspection apparatus according to claim 4, wherein the free end portion is movable with respect to the fixed end portion in the extending direction of the free end portion.
前記スプリングは前記接触端子の延長方向に弾性変形可能である請求項2〜7いずれか1項に記載の検査装置。 The electrical contact has a contact terminal (53) that contacts the measurement object, and a spring (54) connected to the contact terminal,
The inspection device according to claim 2, wherein the spring is elastically deformable in an extending direction of the contact terminal.
前記ノイズ対策素子の少なくとも一部が前記横穴に設けられている請求項1〜8いずれか1項に記載の検査装置。 The grip part is formed with a lateral hole (30d) in which an end of the bridging part is provided,
Inspection apparatus according to any one of claims 1 to 8, provided on at least part of the lateral hole of the noise protection device.
前記端子部は複数の端子接点(56b)を有する請求項1〜10いずれか1項に記載の検査装置。 A conductive terminal portion (56) fixed to the electrical contact;
The said terminal part is an inspection apparatus of any one of Claims 1-10 which have several terminal contact (56b).
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017116208A JP6743768B2 (en) | 2017-06-13 | 2017-06-13 | Inspection equipment |
PCT/JP2018/012263 WO2018230085A1 (en) | 2017-06-13 | 2018-03-27 | Inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017116208A JP6743768B2 (en) | 2017-06-13 | 2017-06-13 | Inspection equipment |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2019002746A JP2019002746A (en) | 2019-01-10 |
JP2019002746A5 true JP2019002746A5 (en) | 2019-09-12 |
JP6743768B2 JP6743768B2 (en) | 2020-08-19 |
Family
ID=64659624
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017116208A Active JP6743768B2 (en) | 2017-06-13 | 2017-06-13 | Inspection equipment |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP6743768B2 (en) |
WO (1) | WO2018230085A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6891819B2 (en) * | 2018-01-09 | 2021-06-18 | 株式会社Soken | Inspection equipment |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5884569U (en) * | 1981-12-01 | 1983-06-08 | 株式会社精工舎 | tester measuring stick |
JPS6095562U (en) * | 1983-12-07 | 1985-06-29 | 大阪ヒユーズ株式会社 | One-handed terminal bar for measuring electrical circuits |
JPH0415067U (en) * | 1990-05-28 | 1992-02-06 | ||
JPH08226934A (en) * | 1995-02-22 | 1996-09-03 | Nippon Telegr & Teleph Corp <Ntt> | Probe |
JPH10104268A (en) * | 1996-09-25 | 1998-04-24 | Nippon Dempa Kogyo Co Ltd | Test bar |
US6276956B1 (en) * | 1999-04-12 | 2001-08-21 | Sencore, Inc. | Dual point test probe for surface mount type circuit board connections |
JP2004170360A (en) * | 2002-11-22 | 2004-06-17 | Kanto Tsusoku Kiki Kk | Stack-type probe and contact |
-
2017
- 2017-06-13 JP JP2017116208A patent/JP6743768B2/en active Active
-
2018
- 2018-03-27 WO PCT/JP2018/012263 patent/WO2018230085A1/en active Application Filing
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