JP2018537149A5 - - Google Patents
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- JP2018537149A5 JP2018537149A5 JP2018520108A JP2018520108A JP2018537149A5 JP 2018537149 A5 JP2018537149 A5 JP 2018537149A5 JP 2018520108 A JP2018520108 A JP 2018520108A JP 2018520108 A JP2018520108 A JP 2018520108A JP 2018537149 A5 JP2018537149 A5 JP 2018537149A5
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- JP
- Japan
- Prior art keywords
- radiation
- ray
- pulse signal
- electrical pulse
- amplitude
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000005855 radiation Effects 0.000 claims 86
- 230000003595 spectral effect Effects 0.000 claims 7
- 238000001514 detection method Methods 0.000 claims 3
- 238000000034 method Methods 0.000 claims 3
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP15190530.4 | 2015-10-20 | ||
| EP15190530 | 2015-10-20 | ||
| PCT/EP2016/074325 WO2017067817A1 (en) | 2015-10-20 | 2016-10-11 | Polarization correction for direct conversion x-ray detectors |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018537149A JP2018537149A (ja) | 2018-12-20 |
| JP2018537149A5 true JP2018537149A5 (OSRAM) | 2019-11-21 |
| JP6797909B2 JP6797909B2 (ja) | 2020-12-09 |
Family
ID=54337193
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018520108A Active JP6797909B2 (ja) | 2015-10-20 | 2016-10-11 | 直接変換ｘ線検出器のための偏光補正 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10725188B2 (OSRAM) |
| EP (1) | EP3365706B1 (OSRAM) |
| JP (1) | JP6797909B2 (OSRAM) |
| CN (1) | CN108139494B (OSRAM) |
| WO (1) | WO2017067817A1 (OSRAM) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11076823B2 (en) * | 2017-06-28 | 2021-08-03 | Canon Medical Systems Corporation | X-ray CT apparatus including a photon-counting detector and circuitry configured to set a control parameter corresponding to a position of each detecting element in the photon-counting detector |
| CN109211946B (zh) * | 2018-08-29 | 2021-08-27 | 苏州瑞迈斯医疗科技有限公司 | 校正X-ray探测器中的探测通道的方法 |
| US11071514B2 (en) * | 2018-11-16 | 2021-07-27 | Varex Imaging Corporation | Imaging system with energy sensing and method for operation |
| CN111493904B (zh) * | 2019-01-30 | 2023-03-10 | 群创光电股份有限公司 | 放射线感测装置 |
| WO2020228935A1 (en) | 2019-05-13 | 2020-11-19 | Direct Conversion Ab | Method of reading out data in a radiation detector, radiation detector and imaging apparatus |
| CN112859147B (zh) * | 2019-09-26 | 2023-09-22 | 中国计量科学研究院 | 一种用于形成校准偏振度的环境的校准系统 |
| IT202000011950A1 (it) * | 2020-05-21 | 2021-11-21 | Sacmi | Metodo e dispositivo per ispezionare un oggetto |
| CN112346026B (zh) * | 2020-10-21 | 2022-11-25 | 中国辐射防护研究院 | 一种测距传感器耐总剂量辐射性能测试系统及方法 |
| EP4012460B1 (de) * | 2020-12-08 | 2025-11-19 | Siemens Healthineers AG | Verfahren zum betrieb eines strahlungsdetektors sowie strahlungsdetektor |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0224351A1 (en) | 1985-11-22 | 1987-06-03 | Mobil Oil Corporation | A gamma-ray logging system |
| US7652258B2 (en) | 2007-01-08 | 2010-01-26 | Orbotech Medical Solutions Ltd. | Method, apparatus, and system of reducing polarization in radiation detectors |
| US8159286B2 (en) * | 2007-10-08 | 2012-04-17 | General Electric Company | System and method for time-to-voltage conversion with lock-out logic |
| WO2010015951A1 (en) * | 2008-08-04 | 2010-02-11 | Koninklijke Philips Electronics N.V. | Data acquisition |
| US20100078558A1 (en) | 2008-09-26 | 2010-04-01 | Michael Prokesch | Infra-red light stimulated cdZnTe spectroscopic semiconductor x-ray and gamma-ray radiation detector |
| JP2011085479A (ja) * | 2009-10-15 | 2011-04-28 | Tele Systems:Kk | 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法 |
| DE102010015422B4 (de) * | 2010-04-19 | 2013-04-18 | Siemens Aktiengesellschaft | Röntgendetektor mit einer direkt konvertierenden Halbleiterschicht und Kalibrierverfahren für einen solchen Röntgendetektor |
| WO2013008198A2 (en) | 2011-07-12 | 2013-01-17 | Koninklijke Philips Electronics N.V. | Imaging system detector calibration |
| WO2013057645A2 (en) * | 2011-10-19 | 2013-04-25 | Koninklijke Philips Electronics N.V. | Photon counting detector |
| WO2013061186A1 (en) * | 2011-10-26 | 2013-05-02 | Koninklijke Philips Electronics N.V. | Radiographic apparatus for detecting photons with offset correction |
| US8824635B2 (en) * | 2011-10-27 | 2014-09-02 | General Electric Company | Detector modules for imaging systems and methods of manufacturing |
| EP2751593B1 (en) * | 2011-12-19 | 2019-10-16 | Koninklijke Philips N.V. | X-ray detector |
| CN103424768A (zh) | 2012-05-25 | 2013-12-04 | 同方威视技术股份有限公司 | 一种用于探测器系统的增益稳定装置及其控制方法 |
| JP6310471B2 (ja) | 2012-11-09 | 2018-04-11 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 検出器結晶のためのサブバンド赤外照射 |
| JP6388608B2 (ja) | 2013-03-01 | 2018-09-12 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 検出器、検出方法、投影データ生成システム、投影データ生成方法及びコンピュータプログラム |
| JP2014228464A (ja) * | 2013-05-24 | 2014-12-08 | 株式会社日立製作所 | 放射線計測装置および放射線計測方法 |
| EP3132287B1 (en) | 2014-12-11 | 2017-09-27 | Koninklijke Philips N.V. | X-ray detector, imaging apparatus and calibration method |
| WO2017046002A1 (en) | 2015-09-18 | 2017-03-23 | Koninklijke Philips N.V. | Correcting photon counts in a photon counting x-ray radiation detection system |
-
2016
- 2016-10-11 CN CN201680061282.3A patent/CN108139494B/zh active Active
- 2016-10-11 US US15/762,160 patent/US10725188B2/en active Active
- 2016-10-11 JP JP2018520108A patent/JP6797909B2/ja active Active
- 2016-10-11 WO PCT/EP2016/074325 patent/WO2017067817A1/en not_active Ceased
- 2016-10-11 EP EP16781373.2A patent/EP3365706B1/en active Active
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