JP2018521312A5 - - Google Patents

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Publication number
JP2018521312A5
JP2018521312A5 JP2017562066A JP2017562066A JP2018521312A5 JP 2018521312 A5 JP2018521312 A5 JP 2018521312A5 JP 2017562066 A JP2017562066 A JP 2017562066A JP 2017562066 A JP2017562066 A JP 2017562066A JP 2018521312 A5 JP2018521312 A5 JP 2018521312A5
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JP
Japan
Prior art keywords
sensing
particle
sensor
space
sensing system
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2017562066A
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English (en)
Japanese (ja)
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JP2018521312A (ja
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Publication date
Application filed filed Critical
Priority claimed from PCT/EP2016/062580 external-priority patent/WO2016198321A1/en
Publication of JP2018521312A publication Critical patent/JP2018521312A/ja
Publication of JP2018521312A5 publication Critical patent/JP2018521312A5/ja
Pending legal-status Critical Current

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JP2017562066A 2015-06-12 2016-06-03 粒子センサ及び粒子感知方法 Pending JP2018521312A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15171840.0 2015-06-12
EP15171840 2015-06-12
PCT/EP2016/062580 WO2016198321A1 (en) 2015-06-12 2016-06-03 Particle sensor and particle sensing method

Publications (2)

Publication Number Publication Date
JP2018521312A JP2018521312A (ja) 2018-08-02
JP2018521312A5 true JP2018521312A5 (cg-RX-API-DMAC7.html) 2019-06-27

Family

ID=53397908

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017562066A Pending JP2018521312A (ja) 2015-06-12 2016-06-03 粒子センサ及び粒子感知方法

Country Status (5)

Country Link
US (1) US10520413B2 (cg-RX-API-DMAC7.html)
EP (1) EP3308135A1 (cg-RX-API-DMAC7.html)
JP (1) JP2018521312A (cg-RX-API-DMAC7.html)
CN (1) CN107743580A (cg-RX-API-DMAC7.html)
WO (1) WO2016198321A1 (cg-RX-API-DMAC7.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2906928A4 (en) 2012-10-15 2016-11-09 Nanocellect Biomedical Inc SYSTEMS, DEVICES AND METHOD FOR SORTING PARTICLES
AT519716B1 (de) * 2017-03-14 2019-01-15 Mat Center Leoben Forschung Gmbh Partikelsensor und Verfahren zur Messung von Partikelkonzentrationen
JP2020523601A (ja) * 2017-06-21 2020-08-06 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 粒子センサ及び粒子感知方法
GB201715014D0 (en) * 2017-09-18 2017-11-01 Cambridge Entpr Ltd Particulate matter detection
US10948392B2 (en) * 2017-11-14 2021-03-16 Aerodyne Microsystems Inc., a Delaware Corporation Airborne particle detection system with thermophoretic scanning
EP3791155A1 (en) * 2018-05-11 2021-03-17 Teknologian Tutkimuskeskus VTT Oy Particle sensor
CN117030553B (zh) * 2023-10-09 2024-03-08 乌镇实验室 一种粉体颗粒的粒径测量和筛分收集方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE249036T1 (de) * 1993-06-07 2003-09-15 Colloidal Dynamics Pty Ltd Messung der teilchengrösse und -ladung in mehrkomponenten-kolloiden
JP3393817B2 (ja) * 1998-10-16 2003-04-07 株式会社堀場製作所 粒径分布測定装置
US6666905B2 (en) 1998-10-16 2003-12-23 Midwest Research Institute Thermoelectric particle precipitator and method using same for collecting particles from fluid streams
US7168292B2 (en) * 2003-05-15 2007-01-30 The Regents Of The University Of California Apparatus for particulate matter analysis
US20070039463A1 (en) * 2003-10-02 2007-02-22 Gert Desmet Method and device for size-separating particles present in a fluid
US20110197571A1 (en) * 2008-02-27 2011-08-18 Volvo Technology Corporation Method and arrangement for detecting particles
JP5026593B2 (ja) * 2008-07-01 2012-09-12 新日本製鐵株式会社 降下粉塵量推定方法、降下粉塵量推定装置、及び降下粉塵量推定プログラム
US8631685B2 (en) * 2008-10-15 2014-01-21 Massachusetts Institute Of Technology Method and apparatus for extended time and varying environment measurements of single particles in microfluidic channels
JP2011256796A (ja) * 2010-06-09 2011-12-22 Toyota Motor Corp Ｐｍ量検出システム
US8806915B2 (en) * 2011-08-08 2014-08-19 University Of California Microfabricated particulate matter monitor
US20130235357A1 (en) * 2012-03-12 2013-09-12 Kla-Tencor Corporation System and Method for Particle Control Near A Reticle
CN103411864B (zh) * 2013-08-05 2015-12-30 深迪半导体(上海)有限公司 基于结构共振测量气体悬浮颗粒浓度的mems传感器

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