JP2018205199A - Foreign matter inspection device and method - Google Patents

Foreign matter inspection device and method Download PDF

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JP2018205199A
JP2018205199A JP2017112414A JP2017112414A JP2018205199A JP 2018205199 A JP2018205199 A JP 2018205199A JP 2017112414 A JP2017112414 A JP 2017112414A JP 2017112414 A JP2017112414 A JP 2017112414A JP 2018205199 A JP2018205199 A JP 2018205199A
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image
foreign matter
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container
illumination
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JP6761377B2 (en
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望 桐生
Nozomi Kiryu
望 桐生
片根 忠弘
Tadahiro Katane
忠弘 片根
隆之 堤
Takayuki Tsutsumi
隆之 堤
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Hitachi Industry and Control Solutions Co Ltd
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Abstract

To provide a foreign matter inspection device capable of accurately detecting a foreign matter even in a nebula solution such as an eye drop.SOLUTION: A foreign matter inspection device is configured so that, for inspecting a foreign matter which is precipitated on a liquid bottom in an analyte in an inspection object container 105, a spin pedestal base 103 is provided on a bottom of the inspection object container 105, and an image of a bottom of the analyte reflected on a mirror 104 is imaged with a camera 102. Using illumination 101, light is radiated from an obliquely upper side of the analyte in the inspection object container 105, and by the camera 102, a first image of a bottom face of the inspection object container 105 is acquired. Then, by a spin of the spin pedestal base 103, the analyte is rotated, after the rotation, light is radiated from the illumination 101 again for acquiring a second image of the bottom face of the inspection object container 105. An image processing part 106 performs difference processing of the first and second images of the analyte acquired, then, by the difference image, a foreign matter which is precipitated on a bottom face of the inspection object container 105 is accurately detected.SELECTED DRAWING: Figure 1

Description

本発明は異物検査装置に係り、アンプル、バイアル等の透明容器中に充填された白濁溶液などの液体中の異物を検査する技術に関するものである。   The present invention relates to a foreign matter inspection apparatus, and relates to a technique for inspecting foreign matter in a liquid such as a cloudy solution filled in a transparent container such as an ampoule or a vial.

従来、透明容器中に充填された液体中の異物を検査する場合、例えば特許文献1に示すような異物自動検査装置を用いて、透明容器を回転させてから静止させた後、カメラ、センサ等で透明容器内の慣性回転する液体中に浮遊する異物を検出するといった異物検査が行われている。   Conventionally, when inspecting a foreign substance in a liquid filled in a transparent container, for example, using a foreign substance automatic inspection apparatus as shown in Patent Document 1, after rotating the transparent container and making it stand still, a camera, a sensor, etc. Thus, foreign matter inspection is performed such as detecting foreign matter floating in the inertially rotating liquid in the transparent container.

特開2010−210315号公報JP 2010-210315 A

上記の特許文献1では、透明容器自体の傷と区別しながら液体中に浮遊する異物検出を可能としているが、点眼薬のような白濁溶液の場合、通常の液中異物検査で透明や白色の沈殿異物を巻き上げて精度よく検出することは困難という課題があった。   In the above-mentioned Patent Document 1, foreign substances floating in the liquid can be detected while distinguishing from the scratches on the transparent container itself. There is a problem that it is difficult to accurately detect the precipitated foreign matter by rolling it up.

本発明は、上記の課題を解決し、点眼薬のような白濁溶液のような場合であっても異物を精度よく検出可能とする異物検査装置及び方法を提供することにある。   An object of the present invention is to solve the above-described problems and provide a foreign substance inspection apparatus and method capable of accurately detecting a foreign substance even in the case of a cloudy solution such as eye drops.

本発明においては、上記の目的を達成するため、検査対象容器の被検体内の異物を検査する異物検査装置であって、検査対象容器の被検体を回転させる台座と、台座の下部に設置したミラーと、ミラーに映った検査対象容器の被検体の底を撮影するカメラと、カメラの映像信号を処理する画像処理部と、検査対象容器の被検体に光を照射する照明とを備え、照明により光を照射して被検体の第一の画像を撮影し、その後台座により被検体を回転させ、回転後に、照明の再照射により被検体の第二の画像を撮影し、画像処理部は、第一の画像と第二の画像を比較して異物の有無を検査する構成の異物検査装置を提供する。   In the present invention, in order to achieve the above object, a foreign matter inspection apparatus for inspecting a foreign matter in a subject of a container to be examined, the base for rotating the subject of the subject to be examined, and a lower part of the base A mirror, a camera that images the bottom of the subject of the examination target container reflected on the mirror, an image processing unit that processes a video signal of the camera, and an illumination that irradiates the subject of the examination target container with light. The first image of the subject is photographed by irradiating light, and then the subject is rotated by the pedestal, and after the rotation, the second image of the subject is photographed by re-illumination of the illumination. Provided is a foreign matter inspection apparatus configured to inspect the presence or absence of foreign matter by comparing a first image and a second image.

また、上記の目的を達成するため、本発明においては、検査対象容器の被検体内の異物を検査する異物検査方法であって、照明により光を照射して、検査対象容器の被検体を回転可能な台座の下に設置したミラーに映る検査対象容器の被検体の底の第一の画像を撮影し、その後被検体を回転させ、回転後に、照明の再照射により検査対象容器の被検体の底の第二の画像を撮影し、画像処理部で第一の画像と第二の画像を比較して、異物の有無を検査する異物検査方法を提供する。   In order to achieve the above object, according to the present invention, there is provided a foreign matter inspection method for inspecting a foreign matter in a subject of a container to be examined, wherein the subject in the subject container is rotated by irradiating light with illumination. Take a first image of the bottom of the subject in the examination container reflected in a mirror placed under a possible pedestal, then rotate the subject and, after rotation, re-illuminate the subject in the examination container Provided is a foreign matter inspection method for taking a second image at the bottom and comparing the first image and the second image by an image processing unit to inspect for the presence or absence of foreign matter.

本発明により、点眼薬のような白濁溶液の場合であっても、異物を精度よく検出できる。   According to the present invention, foreign matter can be detected with high accuracy even in the case of a cloudy solution such as eye drops.

実施例1に係る異物検査装置の概略構成の一例を示す図である。It is a figure which shows an example of schematic structure of the foreign material inspection apparatus which concerns on Example 1. FIG. 実施例1に係る異物検査装置の動作タイミングの一例を示す模式図である。6 is a schematic diagram illustrating an example of operation timing of the foreign matter inspection apparatus according to Embodiment 1. FIG. 実施例1に係る異物検査装置の画像処理部を説明するための図である。FIG. 3 is a diagram for explaining an image processing unit of the foreign matter inspection apparatus according to the first embodiment. 実施例1に係る異物検査装置の動作のフローチャートの一例を示す図である。It is a figure which shows an example of the flowchart of operation | movement of the foreign material inspection apparatus which concerns on Example 1. FIG. 実施例1、2に係る異物検査装置の検査ロータの構成の一例を示す図である。It is a figure which shows an example of a structure of the test | inspection rotor of the foreign material inspection apparatus which concerns on Example 1,2. 実施例2に係る異物検査装置の概略構成の一例を示す図である。It is a figure which shows an example of schematic structure of the foreign material inspection apparatus which concerns on Example 2. FIG. 実施例2に係る異物検査装置の動作タイミングの一例を示す模式図である。FIG. 10 is a schematic diagram illustrating an example of operation timing of the foreign matter inspection apparatus according to the second embodiment. 実施例2に係る異物検査装置の画像処理部を説明するための図である。FIG. 10 is a diagram for explaining an image processing unit of the foreign matter inspection apparatus according to the second embodiment. 実施例2に係る異物検査装置の動作のフローチャートの一例を示す図である。FIG. 10 is a diagram illustrating an example of a flowchart of an operation of the foreign matter inspection apparatus according to the second embodiment. 実施例1、2に係る異物検査装置の個別スピンモータの一例を示す模式図である。It is a schematic diagram which shows an example of the individual spin motor of the foreign material inspection apparatus which concerns on Example 1,2.

以下、本発明の実施の形態を図面に従い順次説明する。   Hereinafter, embodiments of the present invention will be sequentially described with reference to the drawings.

実施例1は、検査対象容器の被検体内の異物を検査する異物検査装置であって、検査対象容器の被検体を回転させる台座と、台座の下部に設置したミラーと、ミラーに映った検査対象容器の被検体の底を撮影するカメラと、カメラの映像信号を処理する画像処理部と、検査対象容器の被検体に光を照射する照明とを備え、照明により光を照射して被検体の第一の画像を撮影し、その後台座により被検体を回転させ、回転後に、照明の再照射により被検体の第二の画像を撮影し、画像処理部は、第一の画像と第二の画像を比較して異物の有無を検査する構成の異物検査装置及び方法の実施例である。   Example 1 is a foreign substance inspection apparatus that inspects a foreign substance in a subject of a container to be examined, a pedestal that rotates the subject of the container to be examined, a mirror installed at a lower part of the pedestal, and an examination reflected on the mirror A camera that images the bottom of the subject in the target container, an image processing unit that processes a video signal of the camera, and an illumination that irradiates light to the subject in the examination target container. The first image is taken, and then the subject is rotated by the pedestal, and after the rotation, the second image of the subject is taken by re-irradiation of the illumination. It is an Example of the foreign material inspection apparatus and method of the structure which compares the image and test | inspects the presence or absence of a foreign material.

図1は本実施例に係る異物検査装置の概略構成の一例を示す図であり、同図の(a)は装置の横視図を、(b)は上から見た図を示している。同図において101は照明、102は底視異物検査用のカメラ、103はガラスなどの透明なスピン台座、104はミラー、105は検査対象容器である。スピン台座103に載置された検査対象容器105には、照明制御部107によって制御された照明101からの光が照射される。そして、ミラー104で反射された検査対象容器105の底面の映像がカメラ102よって撮像され、その映像信号が画像処理部106に送られ処理される。画像処理部106と照明制御部107は、例えば異物検査装置を制御するコンピュータの中央処理部(CPU)のプログラム実行などで実現することができる。   FIG. 1 is a diagram showing an example of a schematic configuration of a foreign substance inspection apparatus according to the present embodiment, where (a) shows a side view of the apparatus and (b) shows a view seen from above. In the figure, 101 is an illumination, 102 is a camera for inspecting bottom foreign matter, 103 is a transparent spin base such as glass, 104 is a mirror, and 105 is a container to be inspected. The inspection target container 105 placed on the spin pedestal 103 is irradiated with light from the illumination 101 controlled by the illumination control unit 107. Then, an image of the bottom surface of the inspection target container 105 reflected by the mirror 104 is captured by the camera 102, and the image signal is sent to the image processing unit 106 and processed. The image processing unit 106 and the illumination control unit 107 can be realized, for example, by executing a program of a central processing unit (CPU) of a computer that controls the foreign substance inspection apparatus.

本実施例の底視異物検査装置においては、検査対象容器105の底面に沈殿している重量系異物を精度よく検査するため、好適には高輝度の照明101を使う。また、検査対象容器105中に充填された液体の液面よりも下に照明101を置く必要があり、更に照明101の角度は斜めにする必要があるため、照明101は照明高さ可変機構108に取付けられている。   In the bottom foreign object inspection apparatus of the present embodiment, a high-intensity illumination 101 is preferably used in order to accurately inspect heavy-weight foreign substances that have settled on the bottom surface of the inspection target container 105. In addition, since the illumination 101 needs to be placed below the liquid level of the liquid filled in the inspection target container 105, and the angle of the illumination 101 needs to be inclined, the illumination 101 has a variable illumination height mechanism 108. Installed on.

図2に本実施例に係る底視異物検査装置の動作タイミングの一例を示した。同図において、201は容器(底面の映像1枚目撮影時)、202は容器(スピン正回転時)、203は容器(スピン逆回転時)、204は容器(底面の映像2枚目撮影時)、205は異物である。また、同図のタイミングチャートの縦軸はスピン回転数を示し、横軸を示す。   FIG. 2 shows an example of the operation timing of the bottom vision foreign matter inspection apparatus according to the present embodiment. In the figure, 201 is a container (when the first image of the bottom image is taken), 202 is a container (when the spin is rotating forward), 203 is a container (when the spin is rotating backward), 204 is a container (when the second image of the bottom image is taken) ) And 205 are foreign matters. Further, the vertical axis of the timing chart of FIG.

この動作タイミングに示したように、照明101を発光させ、カメラ102により検査対象容器105の底面の映像1枚目を撮影する。1枚目の撮影の映像を容器(底面の映像1枚目撮影時)201として示した。その後、スピン台座103のスピン回転数を可変し、容器105をスピンさせる。その結果、容器(スピン正回転時)202、容器(スピン逆回転時)203として示した。容器(スピン逆回転時)203は、先のスピン正回転と同じ角度のスピン逆回転がなされるので、容器(底面の映像2枚目撮影時)204は、容器(底面の映像1枚目撮影時)201と同じ角度、同じ位置に戻っている。   As shown in this operation timing, the illumination 101 is caused to emit light, and the first image of the bottom surface of the inspection target container 105 is captured by the camera 102. An image of the first image is shown as a container 201 (when the first image of the bottom image is imaged) 201. Thereafter, the spin rotation speed of the spin pedestal 103 is varied, and the container 105 is spun. As a result, it was shown as a container (at the time of spin normal rotation) 202 and a container (at the time of spin reverse rotation) 203. Since the container (during reverse rotation of the spin) 203 is rotated in reverse spin at the same angle as the previous spin normal rotation, the container (during the second image of the bottom image) 204 is taken of the container (image of the first image of the bottom surface). Hour) It returns to the same angle and position as 201.

その後、先ほどと同様に、照明101を発光させ、カメラ12により検査対象容器105の底面の映像2枚目を撮影する。この2枚目の撮影の映像を容器(底面の映像2枚目撮影時)204として示した。これらの容器201、204の撮影された画像は、図示を省略した記憶装置に順次保存する。本実施例の構成におけるおおよその処理時間は、1枚目撮像から容器(スピン正回転)202まで、容器(スピン正回転)202から容器(スピン逆回転)203まで、容器(スピン逆回転)203から2枚目撮像まで、それぞれ約20msとした。   Thereafter, as in the previous case, the illumination 101 is caused to emit light, and the second image of the bottom surface of the inspection target container 105 is captured by the camera 12. The image of the second image is shown as a container 204 (when the second image of the bottom image is imaged) 204. The captured images of these containers 201 and 204 are sequentially stored in a storage device (not shown). The approximate processing time in the configuration of the present embodiment is from the first imaging to the container (spin forward rotation) 202, from the container (spin forward rotation) 202 to the container (spin reverse rotation) 203, and from the container (spin reverse rotation) 203. From the first to the second image pickup, each time was about 20 ms.

本実施例の底視異物検査装置の構成・動作のポイントは、次の4点である。
(1)透明異物を見えやすくする為に、照明高さ可変機構108を使い、検査対象容器105内の被検体の片側から光を斜めに照射して容器底面の異物の影205を作り、この異物の影205の移動を検出している。
(2)ガラスなどの透明なスピン台座104を使用することで、検査対象容器105の底全体の視野を確保し、死角を少なくしている。
(3)検査対象容器105を回転させる前に1枚目を撮影し、正回転、戻し回転後に再度2枚目を撮影する。そして差分検査を行うことで、検査精度を上げている。
(4)最初の撮影とスピン後の撮影は、同じ角度(同じ位置の映像)で行っている。
There are the following four points in the configuration / operation of the bottom-sight foreign object inspection apparatus of the present embodiment.
(1) In order to make transparent foreign objects easy to see, the illumination height variable mechanism 108 is used to irradiate light obliquely from one side of the subject in the inspection target container 105 to create a foreign object shadow 205 on the bottom surface of the container. The movement of the foreign object shadow 205 is detected.
(2) By using a transparent spin pedestal 104 such as glass, the field of view of the entire bottom of the container to be inspected 105 is secured and the blind spot is reduced.
(3) The first image is photographed before rotating the container to be inspected 105, and the second image is photographed again after normal rotation and return rotation. And the inspection accuracy is raised by performing the differential inspection.
(4) The first shooting and the shooting after spinning are performed at the same angle (video at the same position).

図3に示すように、本実施例の画像処理部106は、上記の差分検査のため、一連の処理終了後、検査対象容器105の底面の撮影画像1枚目と撮影画像2枚目の差分処理を行う。同図において、301は、撮影画像1枚目と撮影画像2枚目の差分処理結果の画像であり、画像処理部106はこの差分画像301に差がある場合は、異物が混入されていると判断する。   As shown in FIG. 3, the image processing unit 106 of the present embodiment performs the difference inspection between the first photographed image and the second photographed image on the bottom surface of the inspection target container 105 after the series of processing is completed due to the above-described difference inspection. Process. In this figure, 301 is an image of the difference processing result of the first photographed image and the second photographed image, and the image processing unit 106 indicates that a foreign object is mixed if there is a difference between the difference images 301. to decide.

本実施例においては、このような差分処理を行うことで、差分画像301により異物の僅かな移動を捕らえ、容器の傷、塵埃を捕らえない差分方式を実現している。   In the present embodiment, by performing such difference processing, a difference method is realized in which slight movement of the foreign matter is captured by the difference image 301 and scratches and dust on the container are not captured.

図4に以上説明した実施例1に係る底視異物検査装置の動作のフローチャートを示す。同図に示すように、本フローチャートに基づく動作は以下のとおりである。
ステップ401: 照明発光、1枚目撮像を行う。
ステップ402: 台座スピン正回転を行う。
ステップ403: 台座スピン逆回転を行う。
ステップ404: 照明発光、2枚目撮像を行う。
ステップ405: 1枚目と2枚目の差分処理を行う。
ステップ406: 差分画像の異物検出処理を行う。
FIG. 4 shows a flowchart of the operation of the bottom foreign object inspection apparatus according to the first embodiment described above. As shown in the figure, the operation based on this flowchart is as follows.
Step 401: Illumination light emission, first image capturing is performed.
Step 402: Pedestal spin forward rotation is performed.
Step 403: The base spin reverse rotation is performed.
Step 404: Illumination emission and second image capturing are performed.
Step 405: Difference processing between the first and second sheets is performed.
Step 406: Foreign matter detection processing of the difference image is performed.

図5に実施例1に係る異物検査装置の検査ロータの構成の一例を示す。同図に明らかなように、本実施例に係る異物検査装置のスピン台座103が複数設置された検査ロータ501に、スターホイル502により供給口に導入された検査対象容器105は、検査ロータ501が回転し、検査対象容器105を搬送し、上述したステップ401-404に基づき、検査ロータ501のスピン台座103でスピンをさせながら、供給口付近に設置された光源101と底視異物検査用のカメラ102により、撮像が行われる。検査ロータ501の一番最初、すなわち供給口付近に本実施例の底視異物検査のカメラ102を配置することにより、検査対象容器105の底にある異物をスピンで浮かす前に検査することができる。   FIG. 5 shows an example of the configuration of the inspection rotor of the foreign matter inspection apparatus according to the first embodiment. As can be seen from the drawing, the inspection rotor 501 is introduced into the inspection rotor 501 in which a plurality of the spin pedestals 103 of the foreign object inspection apparatus according to the present embodiment are installed, and the inspection wheel 501 is introduced into the supply port by the star wheel 502. Rotating, transporting the inspection object container 105, and spinning on the spin pedestal 103 of the inspection rotor 501 based on the above-described steps 401-404, the light source 101 installed in the vicinity of the supply port, and a camera for inspecting the bottom vision foreign matter In step 102, imaging is performed. By disposing the bottom-view foreign matter inspection camera 102 of this embodiment near the beginning of the inspection rotor 501, that is, in the vicinity of the supply port, the foreign matter on the bottom of the container 105 to be inspected can be inspected before floating. .

先に説明したように、最初の撮影とスピン後の撮影は、同じ角度で同じ位置の映像が必要である。搬送中にスピン台座103を回しながら、一連の撮影処理を行い、精度よく位置を再現させるため好適には、図10にその一例を示したような個別のスピンモータ504を使用することができる。同図において、503はミラー104に固定された回転軸、505はスピンモータ504の角度検出器であり、スピンモータ504と角度検出器505は、図示を省略したモータ制御部により、図4の動作フローチャートを実現するように制御される。   As described above, the first shooting and the shooting after spinning require images at the same angle and the same position. In order to perform a series of photographing processes while rotating the spin pedestal 103 during conveyance and to reproduce the position with high accuracy, an individual spin motor 504 as an example shown in FIG. 10 can be preferably used. In the figure, 503 is a rotating shaft fixed to the mirror 104, 505 is an angle detector of the spin motor 504, and the spin motor 504 and the angle detector 505 are operated by the motor control unit not shown in FIG. Control is performed to implement the flowchart.

本実施例の構成によれば、点眼薬のような白濁溶液の場合であっても、容器底面に沈殿している重量系異物などを精度よく検出できる。   According to the configuration of the present embodiment, even in the case of a cloudy solution such as an eye drop, it is possible to accurately detect a heavy foreign substance that has precipitated on the bottom surface of the container.

次に実施例2の異物検査装置及び方法を、図6−図9を用いて説明する。本実施例の説明においては、上述した実施例1と共通部分の説明は省略し、実施例1との差異点を中心に説明する。   Next, a foreign substance inspection apparatus and method according to the second embodiment will be described with reference to FIGS. In the description of the present embodiment, the description of the common parts with the above-described first embodiment will be omitted, and the description will focus on differences from the first embodiment.

図6は本実施例の異物検査装置の概略構成の一例を示す。図6の(a)、(b)はそれぞれその横視図と上から見た図である。本実施例の異物検査装置には、第1の照明高さ可変機構と、第1のカメラを用いる図1の実施例1の構成に加え、第2の照明高さ可変機構109と第2のカメラ110を追加し、検査対象容器105の両側から交互に照明101、110を発光させる。   FIG. 6 shows an example of a schematic configuration of the foreign matter inspection apparatus of the present embodiment. FIGS. 6A and 6B are a side view and a view from above, respectively. In the foreign matter inspection apparatus of the present embodiment, in addition to the configuration of the first embodiment shown in FIG. 1 using the first illumination height variable mechanism and the first camera, the second illumination height variable mechanism 109 and the second illumination height mechanism 109 A camera 110 is added, and the lights 101 and 110 are alternately emitted from both sides of the inspection target container 105.

図7は、実施例2に係る底視異物検査装置の動作タイミングの一例を示す。同図に示すように、まず実施例1同様、照明101を発光させカメラ102により、検査対象容器105の底面の映像1枚目を撮影する。1枚目の撮影の映像を容器(底面の映像1枚目撮影時)701として示した。707は異物の影である。その後、第2の照明110を発光させカメラ102により、検査対象容器105の底面の映像2枚目を撮影する。2枚目の撮影の映像を容器(底面の映像1枚目撮影時)702として示した。   FIG. 7 illustrates an example of operation timing of the bottom-sight foreign object inspection apparatus according to the second embodiment. As shown in the figure, first, as in the first embodiment, the illumination 101 is emitted and the camera 102 takes the first image of the bottom surface of the container 105 to be inspected. The image of the first image is shown as a container 701 (when the first image of the bottom image is imaged) 701. Reference numeral 707 denotes a foreign object shadow. Thereafter, the second illumination 110 is caused to emit light, and a second image of the bottom surface of the inspection target container 105 is captured by the camera 102. The image of the second image is shown as a container 702 (when the first image of the bottom image is imaged) 702.

次に、実施例1と同様、検査対象容器105をスキンさせる。その結果、容器(スピン正回転時)703、容器(スピン逆回転時)704として示した。容器(スピン逆回転時)704は、先のスピン正回転と同じ角度のスピン逆回転がなされるので、容器(スピン逆回転時)704は、容器(底面の映像1枚目撮影時)701と同じ角度、同じ位置に戻っている。そして、照明101を再発光させカメラ102により、検査対象容器105の底面の映像3枚目を撮影する。3枚目の撮影の映像を容器(底面の映像3枚目撮影時)705として示した。その後、第2の照明110を発光させ底視異物検査用のカメラ102により、検査対象容器105の底面の映像4枚目を撮影する。4枚目の撮影の映像を容器(底面の映像4枚目撮影時)706として示した。   Next, as in the first embodiment, the inspection target container 105 is skinned. As a result, it was shown as a container (during spin rotation) 703 and a container (during spin reverse rotation) 704. The container (during reverse rotation of the spin) 704 performs reverse rotation of the spin at the same angle as the previous spin normal rotation, so the container (during reverse rotation of the spin) 704 becomes the container (during the first image of the bottom image) 701 Returning to the same angle and position. Then, the illumination 101 is re-emitted and the third image of the bottom surface of the inspection target container 105 is captured by the camera 102. The image of the third image is shown as a container (when the third image of the bottom image is imaged) 705. Thereafter, the second illumination 110 is caused to emit light, and a fourth image of the bottom surface of the inspection target container 105 is captured by the camera 102 for inspecting the foreign object in the bottom view. The image of the fourth image is shown as a container (when the fourth image of the bottom image is imaged) 706.

続いて図8に示すように、本実施例の画像処理部106は、差分検査のため、検査対象容器105の底面の撮影画像1枚目と撮影画像3枚目の差分処理、及び撮影画像2枚目と撮影画像4枚目との差分処理を行う。同図において、801は、撮影画像1枚目と撮影画像3枚目の差分処理結果、802は撮影画像2枚目と撮影画像4枚目の差分処理結果の画像であり、画像処理部106はこの差分画像801、802に差がある場合は、異物が混入されていると判断する。   Subsequently, as shown in FIG. 8, the image processing unit 106 according to the present exemplary embodiment performs difference processing for the first captured image and the third captured image on the bottom surface of the inspection target container 105 and the captured image 2 for the difference inspection. Difference processing is performed between the first image and the fourth captured image. In the figure, 801 is the difference processing result of the first captured image and the third captured image, 802 is the image of the difference processing result of the second captured image and the fourth captured image, and the image processing unit 106 If there is a difference between the difference images 801 and 802, it is determined that a foreign object is mixed.

本実施例の底視異物検査を行う異物検査装置においては、このような差分処理を行うことで、差分画像801、802により異物の僅かな移動を捕らえ、容器の傷、塵埃を捕らえない差分方式を実現している。   In the foreign matter inspection apparatus that performs the bottom-view foreign matter inspection of the present embodiment, by performing such a difference process, the difference image 801, 802 catches slight movement of the foreign matter, and the difference method does not catch the container scratches and dust. Is realized.

図9に本実施例に係る異物検査装置の動作のフローチャートの一例を示した。
同図に示すように、本フローチャートに基づく動作は以下のとおりである。
ステップ901: 第1の照明発光、1枚目撮像を行う。
ステップ902: 第2の照明発光、2枚目撮像を行う。
ステップ903: 台座スピン正回転を行う。
ステップ904: 台座スピン逆回転を行う。
ステップ905: 第1の照明発光、3枚目撮像を行う。
ステップ906: 第2の照明発光、4枚目撮像を行う。
ステップ907: 1枚目と3枚目の差分処理を行う。
ステップ908: 2枚目と4枚目の差分処理を行う。
ステップ909: 差分画像の異物検出処理を行う。
FIG. 9 shows an example of a flowchart of the operation of the foreign substance inspection apparatus according to the present embodiment.
As shown in the figure, the operation based on this flowchart is as follows.
Step 901: Perform first illumination emission and first image pickup.
Step 902: Second illumination emission and second image capturing are performed.
Step 903: Pedestal spin forward rotation is performed.
Step 904: The pedestal spin is reversely rotated.
Step 905: First illumination light emission and third image capturing are performed.
Step 906: Second illumination light emission and fourth image pickup are performed.
Step 907: Difference processing is performed on the first and third sheets.
Step 908: Difference processing is performed on the second and fourth sheets.
Step 909: Perform a foreign object detection process on the difference image.

本実施例の一連の動作処理フローを行うことで、検査対象容器の両側で発光して撮影することにより底面の異物の僅かな移動を捕らえ、容器の傷、塵埃を捕らえない差分方式を実現することができる。   By performing a series of operation processing flows of the present embodiment, a difference method is realized in which slight movement of foreign matter on the bottom surface is captured by capturing and photographing light on both sides of the container to be inspected, and the container does not capture scratches and dust. be able to.

なお、本発明は上記した実施例に限定されるものではなく、様々な変形例が含まれる。例えば、上記した実施例は本発明を分かりやすく説明するために詳細に説明したものであり、必ずしも説明した全ての構成を備えるものに限定されるものではない。また、ある実施例の構成の一部を他の実施例の構成に置き換えることが可能であり、また、ある実施例の構成に他の実施例の構成を加えることも可能である。また、各実施例の構成の一部について、他の構成の追加・削除・置換をすることが可能である。   In addition, this invention is not limited to an above-described Example, Various modifications are included. For example, the above-described embodiments have been described in detail for easy understanding of the present invention, and are not necessarily limited to those having all the configurations described. Further, a part of the configuration of one embodiment can be replaced with the configuration of another embodiment, and the configuration of another embodiment can be added to the configuration of one embodiment. Further, it is possible to add, delete, and replace other configurations for a part of the configuration of each embodiment.

101,110 照明
102 カメラ
103 スピン台座
104 ミラー
105 検査対象容器
106 画像処理部
107 照明制御部
108,109 照明高さ可変機構
201-204,701-706 容器
205 異物の影
301,801-802 差分画像
501 検査ロータ
502 スターホイル
503 駆動軸
504 スピンモータ
505 角度検出器
101,110 lighting
102 Camera
103 Spin base
104 mirror
105 Container to be inspected
106 Image processor
107 Lighting control unit
108,109 Variable illumination height mechanism
201-204,701-706 Container
205 Foreign object shadow
301,801-802 Difference image
501 Inspection rotor
502 Starfoil
503 Drive shaft
504 Spin motor
505 angle detector

Claims (8)

検査対象容器の被検体内の異物を検査する異物検査装置であって、
前記検査対象容器の前記被検体を回転させる台座と、
前記台座の下部に設置したミラーと、
前記ミラーに映った前記検査対象容器の被検体の底を撮影するカメラと、
前記カメラの映像信号を処理する画像処理部と、
前記検査対象容器の被検体に光を照射する照明と、を備え、
前記照明により光を照射して前記被検体の第一の画像を撮影し、
その後前記台座により前記被検体を回転させ、
回転後に、前記照明の再照射により前記被検体の第二の画像を撮影し、
前記画像処理部は、前記第一の画像と前記第二の画像を比較して、前記異物の有無を検査する、
ことを特徴とする異物検査装置。
A foreign matter inspection apparatus for inspecting foreign matter in a subject of a container to be examined,
A pedestal for rotating the subject of the examination object container;
A mirror installed at the bottom of the pedestal;
A camera for photographing the bottom of the subject of the examination object container reflected on the mirror;
An image processing unit for processing a video signal of the camera;
Illumination for irradiating light on the subject of the examination object container,
Taking a first image of the subject by irradiating light with the illumination,
Then rotate the subject by the pedestal,
After rotation, take a second image of the subject by re-illuminating the illumination,
The image processing unit compares the first image with the second image to inspect for the presence of the foreign matter.
Foreign matter inspection apparatus characterized by the above.
請求項1に記載の異物検査装置であって、
前記カメラは、前記第一の画像、前記第二の画像として、前記検査対象容器の被検体の底の前記異物の影を撮影する、
ことを特徴とする異物検査装置。
The foreign matter inspection apparatus according to claim 1,
The camera shoots the shadow of the foreign matter on the bottom of the subject of the examination target container as the first image and the second image,
Foreign matter inspection apparatus characterized by the above.
請求項2に記載の異物検査装置であって、
前記台座を複数載置可能な検査ロータを備え、
前記カメラは前記検査ロータの一番最初に配置される、
ことを特徴とする異物検査装置。
The foreign matter inspection apparatus according to claim 2,
An inspection rotor capable of mounting a plurality of the pedestals;
The camera is placed at the very beginning of the inspection rotor;
Foreign matter inspection apparatus characterized by the above.
請求項2に記載の異物検査装置であって、
前記照明を上下方向に移動可能な照明高さ移動機構を備える、
ことを特徴とする異物検査装置。
The foreign matter inspection apparatus according to claim 2,
An illumination height moving mechanism capable of moving the illumination vertically;
Foreign matter inspection apparatus characterized by the above.
請求項2に記載の異物検査装置であって、
前記照明は、前記検査対象容器の被検体の両側から切り替えて光を照射する、
ことを特徴とする異物検査装置。
The foreign matter inspection apparatus according to claim 2,
The illumination is switched from both sides of the subject of the examination object to irradiate light,
Foreign matter inspection apparatus characterized by the above.
検査対象容器の被検体内の異物を検査する異物検査方法であって、
照明により光を照射して、前記検査対象容器の前記被検体を回転可能な台座の下に設置したミラーに映る前記検査対象容器の被検体の底の第一の画像を撮影し、
その後前記被検体を回転し、回転後に前記照明の再照射により前記検査対象容器の被検体の底の第二の画像を撮影し、
画像処理部で前記第一の画像と前記第二の画像を比較して、前記異物の有無を検査する、
ことを特徴とする異物検査方法。
A foreign matter inspection method for inspecting foreign matter in a subject of a container to be examined,
Irradiate light with illumination, and take a first image of the bottom of the subject of the examination target container reflected in a mirror installed under a rotatable pedestal of the subject of the examination target container,
Thereafter, the subject is rotated, and after rotation, a second image of the bottom of the subject in the examination container is taken by re-irradiation of the illumination,
Compare the first image and the second image in an image processing unit to inspect for the presence of the foreign matter,
A foreign matter inspection method characterized by the above.
請求項6に記載の異物検査方法であって、
前記第一の画像と前記第二の画像として、前記検査対象容器の被検体の底の前記異物の影を撮影する、
ことを特徴とする異物検査方法。
The foreign matter inspection method according to claim 6,
As the first image and the second image, the shadow of the foreign matter on the bottom of the subject of the examination container is photographed,
A foreign matter inspection method characterized by the above.
請求項7に記載の異物検査方法であって、
前記照明は、前記検査対象容器の被検体の両側から切り替えて光を照射し、
前記第一の画像と第二の画像とは別に第三の画像と第四の画像を撮影し、
前記画像処理部は、前記第一の画像、前記第二の画像、前記第三の画像、前記第四の画像を使って前記異物の有無を検査する、
ことを特徴とする異物検査方法。
The foreign matter inspection method according to claim 7,
The illumination is irradiated with light by switching from both sides of the subject of the examination container,
Shooting a third image and a fourth image separately from the first image and the second image,
The image processing unit inspects the presence or absence of the foreign matter using the first image, the second image, the third image, and the fourth image.
A foreign matter inspection method characterized by the above.
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