JP2017161782A - Tilt stage and microscope - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a tilt stage and microscope that make it unnecessary to fix a sample stand with a large-scaled device, reduce costs, and change and hold a tilt angle of the sample stand with an easy operation.SOLUTION: A tilt stage 11 is provided that comprises: a base part 9; a sample stand 16 that is supported in the base part 9 so as to enable a tilt angle to be changed, and has a loading surface 15 on which a sample A is loaded; fixation means 17 that releasably fixes the sample stand 16 to the base part 9 at an arbitrary tilt angle; and urging means 18 that is arranged between the base part 9 and the sample stand 16, and urges the sample stand 16 in a direction of horizontally returning the loading surface 15.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an inclined stage and a microscope.

Conventionally, a tilt stage for adjusting the tilt angle of the mounted specimen with respect to the objective lens is known (see, for example, Patent Document 1).
This tilt stage adjusts the tilt angle of the sample stage by sliding a spherical surface provided on the back surface of the sample stage on which the sample is mounted with respect to the annular base part, and is defined by the spherical surface and the base part. By reducing the pressure in the sealed space, the spherical surface is adsorbed to the base portion, and the sample stage is held in an inclined state.

JP 2010-250009 A JP 2007-57519 A

However, the tilt stage of Patent Document 1 generates a weight by the air pressure at the portion where the hemispherical surface slides and maintains the tilt angle of the sample surface, but adjusts the pressure reduction state of the air pressure in the sealed space. Since the pressure reducing mechanism is provided, there is an inconvenience that the apparatus becomes large and expensive.
The stage of Patent Document 2 maintains the inclination angle of the specimen table by balancing the base part of the specimen table with the biasing force of the tension spring and the pushing force of the micrometer, and the head part of the micrometer is directed outward. It protrudes like a protrusion and occupies space, and the apparatus becomes large, and it becomes expensive because of a precise mechanism. Furthermore, in order to change the tilt angle, a biaxial micrometer operation is required, and there is a disadvantage that the angle cannot be determined quickly and freely.

  The present invention has been made in view of the above-described circumstances, and it is not necessary to fix the specimen table with a large-scale apparatus, reduce the manufacturing cost of the apparatus, and change the inclination angle of the specimen table with a simple operation. An object of the present invention is to provide a tilt stage and a microscope that can be held.

In order to achieve the above object, the present invention provides the following means.
One embodiment of the present invention includes a base part, a specimen stage supported by the base part so that the inclination angle can be changed, and a mounting surface on which the specimen is mounted, and an arbitrary inclination angle of the specimen stage with respect to the base part A tilting stage comprising: a fixing means for releasably fixing; and an urging means that is disposed between the base portion and the sample table and urges the sample table in a direction to return the mounting surface to a horizontal position. provide.

According to this aspect, when the sample is mounted on the mounting surface of the sample stage and the sample is collected and observed with an objective lens arranged vertically above, for example, when the sample is to be observed from a different angle Operates the fixing means to release the fixed state of the sample table with respect to the base portion, and swings the sample table with respect to the base portion to change the tilt angle. In this case, the urging means placed between the base and the sample table urges the sample table in the direction to return the mounting surface to the horizontal, so it is fixed when the weight balance of the sample is poor. Even if the fixed state by the means is released, it is possible to prevent the specimen table from swinging rapidly. Thereby, it is possible to prevent the specimen from being damaged due to the collision of the specimen table.
In this case, even if the fixed state is released, the sample table does not swing suddenly, so there is no need to fix the sample table with a large-scale device as in the prior art, and the structure is simplified because it is not large. The manufacturing cost of the device can be reduced.

In the said aspect, it is preferable that the said fixing means is a free pan head.
By doing in this way, the handle | steering-wheel handle of a free pan head can be turned, and the fixation of a sample stand with respect to a base part can be performed easily.

In the above aspect, the urging means maintains the mounting surface substantially horizontal when the fixed state by the fixing means is released and the moment about the horizontal axis applied to the sample stage is equal to or less than a predetermined threshold value. It may be energized to do.
In this way, when the moment about the horizontal axis related to the sample table is equal to or less than a predetermined threshold, the weight balance of the sample is good, and when the fixed state by the fixing unit is released, the sample table is moved by the biasing unit. The mounting surface is maintained substantially horizontal.

In the above aspect, the urging means may be a plurality of elastic members arranged at intervals in the circumferential direction at a position surrounding the swing center of the sample table.
By doing so, the elastic force generated by each elastic member is applied to both sides across the swing center of the sample table, so that the sample table does not swing suddenly in any direction around the swing center. To be supported.

Further, in the above aspect, the urging means may be a cylindrical elastic member disposed over the entire circumference at a position surrounding the center of swinging of the sample table.
By doing so, the elastic force generated by the elastic member is applied to both sides across the swing center of the sample table, so that the sample table does not swing suddenly in any direction around the swing center. Supported by In addition, a cylindrical elastic member surrounding the entire circumference can serve as a barrier to prevent liquid and dust from flowing into the elastic member.

Moreover, in the said aspect, the translucent part which can permeate | transmit light to an up-down direction may be provided in the said sample stand and the said base part, and the said fixing means may be arrange | positioned on the outer side of the said translucent part.
In this way, the specimen can be observed through transmission by arranging the specimen at a position that coincides with the translucent portion of the specimen stage.
Moreover, the other aspect of this invention provides a microscope provided with one of the said inclination stages.

  According to the present invention, it is not necessary to fix the specimen table with a large-scale device, and it is possible to reduce the cost and change and hold the inclination angle of the specimen table with a simple operation.

It is a front view showing a microscope concerning one embodiment of the present invention. It is a longitudinal cross-sectional view which shows the inclination stage which concerns on one Embodiment of this invention with which the microscope of FIG. 1 was equipped. It is a top view which shows the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the 1st modification of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the state which inclined the sample stand of the inclination stage of FIG. It is a perspective view which shows the slit provided in the elastic member in order to change the handle position of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the 2nd modification of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the state which inclined the sample stand of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the 3rd modification of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the 4th modification of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the state which inclined the sample stand of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the 5th modification of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the state which inclined the sample stand of the inclination stage of FIG. It is a longitudinal cross-sectional view which shows the 6th modification of the inclination stage of FIG.

Hereinafter, an inclined stage 11 and a microscope 1 according to an embodiment of the present invention will be described with reference to the drawings.
As shown in FIG. 1, the microscope 1 according to the present embodiment includes a stage 2 on which a specimen A is mounted, a portal frame 3 arranged so as to span the stage 2, and a portal frame 3. The objective lens 4 that collects the light from the lower specimen A, the focusing mechanism 5 for finely adjusting the vertical position of the objective lens 4, and the light condensed by the objective lens 4 are observed. And a lens barrel 7 having an eyepiece 6 for the purpose.

  Various intermediate lens barrels and various units can be separately mounted between the lens barrel 7 and the portal frame 3. For example, a system such as an epi-illumination tube or an LSM scanner can be added on.

  The stage 2 is mounted on a Z stage 8 for moving the specimen A up and down, an X stage 9 and a Y stage 10 for moving the specimen A in two horizontal directions, and an uppermost stage, for example, the X stage 9. The inclined stage 11 is provided. The X stage 9, the Y stage 10, and the Z stage 8 have a known structure, and can be operated by rotating the handles 12, 13, and 14, respectively. Instead of the manual X stage 9 and Y stage 10, an electric XY stage may be adopted.

  As shown in FIG. 2, the tilt stage 11 according to the present embodiment has a flat sample stage 16 having a mounting surface 15 on which the specimen A is mounted, and the specimen stage 16 with respect to the X stage (base part) 9. And a free pan head (fixing means) 17 that can be supported at an arbitrary swinging position, and a biasing means 18 that biases the sample stage 16 in a substantially horizontal direction. ing.

  The free pan head 17 includes a sphere 19 provided on a support 9 a fixed to the upper surface of the X stage 9 by screwing or the like, and a pair of slides arranged at positions sandwiching the sphere 19 and fixed to the sample table 16. A moving member 20 and a handle 21 for adjusting the interval between the sliding members 20 are provided. The sliding member 20 is provided with, for example, a conical recess 22, and the sphere 19 is sandwiched with the sphere 19 in contact with the inner surface of the recess 22.

  The spherical body 19 and the support column 9a may be configured integrally, or may be configured separately and fixed to each other by screwing or the like. Moreover, the material of the spherical body 19 and the support | pillar 9a can employ | adopt arbitrary materials which have required rigidity, such as a metal and resin. Further, the recess 22 provided in the sliding member 20 is not limited to a conical shape, and may be a recess having a spherical inner surface complementary to the outer surface of the sphere 19 or a V-groove. Grease may be applied between the sliding member 20 and the sphere 19.

  When the handle 21 is rotated in one direction, for example, counterclockwise, the distance between the pair of sliding members 20 is widened, and the contact pressure between the inner surface of the recess 22 and the outer surface of the sphere 19 is reduced. Thus, the free movement of the sliding member 20 with respect to the sphere 19 is allowed. As a result, the inclination angle of the sample stage 16 with respect to the X stage 9 can be freely changed.

  On the other hand, when the handle 21 is rotated in the other direction, for example, clockwise, the distance between the pair of sliding members 20 is reduced, and the contact pressure between the inner surface of the recess 22 and the outer surface of the sphere 19 is increased. The frictional force between them increases, and the sliding member 20 is fixed to the sphere 19. Thereby, the sample stage 16 can be fixed to the X stage 9 at an arbitrary inclination angle position.

  As shown in FIG. 3, the biasing means 18 is, for example, three compression coil springs (elastic members), and surrounds the sphere 19 of the free camera platform 17 between the X stage 9 and the sample table 16. It is arrange | positioned in three places at equal intervals in the direction. Each compression coil spring 18 is inserted in a compressed state between the X stage 9 and the sample table 16, and always generates an urging force in a direction to widen the distance between the X stage 9 and the sample table 16.

  That is, by arranging the three compression coil springs 18 at equal intervals in the circumferential direction, any one of the compression coil springs 18 is arranged around all the horizontal axes passing through the center (swing center) of the sphere 19 of the free pan head 17. A moment in the direction opposite to that of the other compression coil springs 18 is generated.

The operation of the microscope 1 and the tilt stage 11 according to this embodiment configured as described above will be described below.
In order to observe the specimen A using the microscope 1 according to the present embodiment, as shown in FIG. 1, the specimen A such as a small animal is fixed to the mounting surface 15 of the specimen stage 16 of the inclined stage 11 with a belt or the like. The X stage 9, the Y stage 10, and the Z stage 8 are actuated by operating the handles 12, 13, and 14 to adjust the observation position of the specimen A with respect to the optical axis of the objective lens 4.

Next, the focusing mechanism 5 is operated to finely adjust the vertical position of the objective lens 4.
In this state, in order to adjust the angle of the observation position of the specimen A with respect to the optical axis of the objective lens 4, the handle 21 of the free pan head 17 is rotated to release the fixed state of the sphere 19 and the sliding member 20. Then, the handle 21 is swung around the center of the sphere 19. Thereby, the sample stage 16 can be tilted while sliding the pair of sliding members 20 with respect to the sphere 19.

  Then, in a state where the handle 21 is tilted in a desired direction to a desired tilt angle, the handle 19 is rotated and the sphere 19 is tightened by the pair of sliding members 20, so that the sample stage 16 is moved to the X stage 9 at that position. Can be fixed against. Thereby, the specimen A fixed on the specimen stage 16 can be arranged at a desired inclination angle with respect to the optical axis of the objective lens 4, and observation at a desired observation angle can be performed.

  In this case, according to the tilt stage 11 according to the present embodiment, since the three compression coil springs 18 are arranged between the X stage 9 and the sample table 16, the sample A mounted on the sample table 16 is Even when the weight balance is bad, the rotation of the handle 21 of the free pan head 17 can prevent the sample pan 16 from being tilted sharply when the fixed state of the free pan head 17 is released. it can. As a result, the specimen A can be protected from an impact caused by the collision of the specimen stage 16, dropping from the specimen stage 16, and the like.

As a result, according to the present embodiment, there is no need to fix the sample table 16 with a large-scale device such as a suction means, and there is an advantage that the manufacturing cost of the device can be reduced by simplifying the structure.
In addition, according to the present embodiment, the fixed state can be released, the sample table 16 can be tilted, and the sample table 16 can be fixed while the handle 21 of the free camera platform 17 is being held. There is also an advantage that the operation can be easily performed.

  In the present embodiment, three compression coil springs 18 are exemplified as the elastic member, but two or four or more compression coil springs may be employed instead. Further, although the compression coil springs 18 are arranged at equal intervals in the circumferential direction, the intervals may be changed instead.

  In the present embodiment, instead of the compression coil spring 18, as shown in FIGS. 4 and 5, an elastic member (biasing means) 23 made of a cylindrical elastic material surrounding the sphere 19 may be adopted. Good. By doing in this way, the elastic member 23 can be functioned as a barrier surrounding the sphere 19, and the inflow of liquid or dust into the sphere 19 can be prevented. When the sample table 16 is tilted, it may be elastically deformed so that a part of the cylindrical elastic member 23 in the circumferential direction is crushed. It is not limited to a cylindrical shape, and any other cylindrical elastic member may be adopted.

  Further, a rotating member 31 supported by a bearing 30 so as to be rotatable around an axis perpendicular to the mounting surface 15 may be provided on the back surface of the specimen table 16, and the pair of sliding members 20 may be fixed to the rotating member 31. In this way, the position of the handle 21 of the free platform 17 can be changed around the axis with respect to the sample table 16. Since the handle 21 of the free platform 17 protrudes outside the sample table 16, the handle 21 may become an obstacle when the sample table 16 is inclined in the direction of the handle 21. By changing the position 21, there is an advantage that such inconvenience can be eliminated and a sufficient inclination angle can be secured in all directions.

  In addition, when changing the position of the handle 21, it may be changed while changing the position where the flexible cylindrical elastic member 23 is partially turned up, or a slit extending in the circumferential direction as shown in FIG. It is also possible to cause the handle 21 to pass through 24 and change the penetrating position of the handle 21 in the slit 24. In the case of a structure in which the elastic member 23 is partially turned up, the handle 21 may be removed from the base after the tilt angle of the sample table 16 is fixed to a desired angle by rotating the handle 21. Thereby, the partial turning-up of the elastic member 23 can be prevented, and a more reliable seal structure can be configured.

  Further, as shown in FIGS. 7 and 8, the handle 21 of the free platform 17 may be bent inside the elastic member 23 and protrude from the mounting surface 15 of the sample table 16. In this case, at the bent portion, the rotational force applied to the handle 21 by power transmission means such as a bevel gear (not shown) may be transmitted to the sliding member 20. By doing so, it is possible to prevent the handle 21 from getting in the way when the sample table 16 is tilted while suppressing the amount of protrusion of the handle 21 outward from the sample table 16.

  Further, in this embodiment, the sphere 19 of the free pan head 17 is fixed to the X stage 9 and the pair of sliding members 20 are fixed to the back surface of the specimen table 16. Instead, this is shown in FIG. As described above, the sphere 19 may be fixed to the back surface of the specimen table 16 and the pair of sliding members 20 may be fixed to the X stage 9. Further, as shown in FIG. 9, a pair of sliding members 20 or spheres 19 may be fixed to a base member 25 fixed to the X stage 9 by screwing or the like. In this case, the support 9 a is fixed to the sample table 16 instead of the X stage 9.

Further, when a large inclination angle of the specimen table 16 is ensured, a gap may be formed between the elastic member 23 and the X stage 9, so that a cylindrical elastic member is used as shown in FIGS. 10 and 11. A cylindrical barrier member 26 disposed on the radially inner side of the member 23 may be provided on the X stage 9 side. Thereby, formation of the clearance gap at the time of inclination can be suppressed, and penetration | invasion of a liquid, dust, etc. can be suppressed more reliably.
Examples of the elastic member 23 include those made of sponge or urethane rubber. Also, a metal or resin bellows may be employed.

  Further, instead of giving the cylindrical elastic member 23 a role of a barrier, as shown in FIGS. 12 and 13, for example, a cylindrical shape is formed so as to surround an elastic member composed of three compression coil springs 18. For example, a telescopic barrier member 27 that expands and contracts in accordance with the gap between the specimen table 16 and the X stage 9 may be used in combination. Thereby, the urging of the specimen table 16 by the elastic member 18 and the prevention of the inflow of liquid, dust and the like near the sphere 19 can be more reliably performed.

  In the present embodiment, the sphere 19 and the sliding member 20 are arranged near the center of the sample table 16 and the sample A is mounted near the center of the sample table 16, but instead, As shown in FIG. 14, a window part (translucent part) 28 made of an optically transparent material is provided in the vicinity of the center of the sample stage 16 and the X stage 9, and the sphere 19 and the slide of the free platform 17. The member 20 may be disposed at a position away from the window portion 28.

In this manner, the specimen A is irradiated with light transmitted from below vertically through the window 28 in a state where the specimen stage 16 is inclined and the specimen A is inclined at a desired angle. There is an advantage that the transmitted light transmitted through can be observed.
As the window portion 28, a through hole may be adopted in addition to an optically transparent material.

In the present embodiment, the microscope 1 having the portal frame 3 is exemplified, but the present invention is not limited to this, and the microscope 1 can be applied to an upright or inverted microscope having any structure.
Moreover, although the free pan head 17 was illustrated as a fixing means, the thing of another arbitrary structures may be employ | adopted. Further, the shape of the sample table 16 in plan view is not limited to a rectangle, and a sample having an arbitrary shape such as a circle or an ellipse may be adopted according to the sample A.

Further, although the belt is exemplified as the means for fixing the specimen A to the specimen stage 16, other arbitrary fixing means may be adopted.
In addition, the sample table 16 is urged in the direction in which the mounting surface 15 becomes substantially horizontal by the urging force of the elastic members 18 and 23. However, the moment around the center of the sphere 19 is a weight balance with a predetermined value or less. In some cases, an urging force that maintains the mounting surface 15 at a substantially horizontal position may be generated.
In this way, the sample stage 16 can be arranged substantially horizontally by simply loosening the handle 21 of the free platform 17 when changing the inclination angle of the sample stage 16 or exchanging the specimen A. And workability can be improved.

1 Microscope 9 X stage (base part)
11 Inclined stage 16 Specimen 17 Free pan head (fixing means)
18 Compression coil spring (elastic member, biasing means)
23 Elastic member (biasing means)
28 Window part (translucent part)
A specimen

Claims (7)

A base part;
A sample stage that is supported by the base portion so that the inclination angle can be changed and has a mounting surface on which the sample is mounted;
Fixing means for releasably fixing the sample stage with respect to the base portion at an arbitrary inclination angle;
An inclined stage comprising: an urging unit that is arranged between the base portion and the sample table and urges the sample table in a direction to return the mounting surface to a horizontal position.   2. The tilt stage according to claim 1, wherein the fixing means is a free pan head.   The urging means urges the mounting surface to be maintained substantially horizontal when the fixed state by the fixing means is released and a moment about a horizontal axis applied to the sample stage is equal to or less than a predetermined threshold value. The tilt stage according to claim 1 or claim 2.   The tilting stage according to any one of claims 1 to 3, wherein a plurality of the biasing means are elastic members arranged at intervals in the circumferential direction at a position surrounding the swing center of the sample stage.   The tilting stage according to any one of claims 1 to 3, wherein the biasing means is a cylindrical elastic member disposed over the entire circumference at a position surrounding the swing center of the sample stage. A translucent part capable of transmitting light in the vertical direction is provided on the sample stage and the base part,
The tilt stage according to claim 2, wherein the fixing means is disposed outside the light transmitting portion. A microscope comprising the tilt stage according to any one of claims 1 to 6.

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