JP2017078653A - Optical analysis method, program, optical analysis system and chip incorporating light guide passage - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a display method and the like for obtaining information about an invisible portion in a chip incorporating light guide passages.SOLUTION: The display method is used in an optical analysis system including a chip incorporating light guide passages and a measurement instrument. The chip incorporating light guide passages comprises: a first light introduction part into which light from the outside of the chip incorporating light guide passages is introduced; a light lead-out part from which light is emitted to the outside of the chip incorporating light guide passages; a first light guide passage extending from the first light introduction part through a measurement target to the light lead-out part; a light absorption part adjacent to the first light guide passage and for absorbing light; a second light introduction part which is different from the first light introduction part, and into which light from the outside of the chip incorporating light guide passages is introduced; and a second light guide passage extending from the second light introduction part to a part of the first light guide passage. The measurement instrument comprises: a light reception part for receiving light from the light lead-out part; a display part for displaying optical information received by the light reception part; and a control part for controlling the display part. The display method includes an inspection light display step in which the control part controls the display part so as to display the optical information passing through the second light guide passage and received by the light reception part.SELECTED DRAWING: Figure 1

Description

  The present invention relates to an optical analysis method, a program, an optical analysis system, and a chip with a built-in light guide, and particularly relates to a chip with a built-in light guide that includes an illumination optical system that illuminates an invisible portion inside the chip with a built-in light guide.

  In general, the sensitivity of emission analysis utilizing the emission phenomenon of substances, molecules, and atoms is very high. Further, an analysis using light emitted from the measurement object and light emitted from the measurement object is also performed. Examples of such optical analysis include an absorbance method and a laser induced fluorescence (LIF).

  In recent years, there has been a demand for downsizing of such an optical measuring instrument and optical measuring apparatus to a portable level and higher performance of measurement.

  Here, when the light measurement device is downsized, the distance between the light source for irradiating the measurement target with light and the detector for monitoring the observation light from the measurement target is reduced within the device. A light guide that constitutes the irradiation optical system that guides the irradiation light from the light source to the measurement target, and a light guide path that constitutes the observation light collection optical system that guides the observation light from the measurement target to the detector include a condensing lens, There are optical elements such as optical filters. Therefore, the influence of stray light that can be noise in measurement, such as reflected light and scattered light generated when light travels through the light guide path in the apparatus, becomes more prominent as the apparatus is downsized. Such stray light is also generated on the inner wall of the apparatus housing.

  In order to suppress the influence of stray light as much as possible and to realize the miniaturization of the optical measuring apparatus, the inventors have configured an optical system and a monolithic housing using a resin containing at least a part of a pigment. A vessel (Patent Document 1) was proposed. This relates to LIF devices.

  Specifically, it has the following features. (1) A part of the light guide path constituting the irradiation optical system and the light guide path constituting the observation light collecting optical system is filled with a resin transparent to the irradiation light and the observation light. (2) A resin is further provided so as to surround the transparent resin constituting these light guide paths. This resin contains a pigment. (3) The pigment has the property of absorbing stray light. The pigment content is set to an amount that absorbs at least all the stray light. (4) The resin materials of the transparent resin and the pigment-containing resin are the same.

  With the above configuration, for example, the following operations and effects can be achieved. First, by using the same resin material for the transparent resin and the pigment-containing resin, light reflection and scattering are suppressed at the interface where both resins contact. Further, the stray light incident on the pigment-containing resin is absorbed by the pigment. Therefore, there is almost no return to the transparent resin constituting the light guide. Furthermore, stray light does not leak from the pigment-containing resin to the outside. Therefore, the complicated multiple reflection of stray light hardly occurs. As a result, the observation light collecting optical system does not need to cope with complicated multiple reflections and is simplified, and as a result, the measuring instrument is miniaturized.

  Such a structure in which each component (optical element) is embedded in a resin and a structure surrounded by a resin containing a light-absorbing pigment can be applied not only to an optical measuring apparatus but also, for example, μTAS (micro synthesis It can also be applied to optical chips for analysis systems (Micro Total Analysis System).

  In addition, the optical analyzer used in the LOT (Labo on Tablet) system for optical measurement by attaching a microchip to the display surface of a portable terminal device proposed by the present inventors, and the microchip included in the optical analysis processor (See, for example, Patent Document 2).

Japanese Patent No. 5665811 JP 2015-158384 A

  However, since the housing of the microchip described above is surrounded by a pigment-containing resin and the inside of the housing cannot be visually observed, it can be confirmed whether the microchip is manufactured as designed, It is difficult to align the chip with a predetermined position on the display surface of the portable terminal device.

  Therefore, an object of the present invention is to provide a display method or the like that makes it easy to obtain information on a portion that cannot be viewed in a light guide built-in chip (microchip) that incorporates a light guide.

  A first aspect of the present invention is a display method in an optical analysis system including a chip with a built-in light guide and a measuring device, wherein the chip with a built-in light guide has a first light introduction that allows light to enter from outside the chip with a built-in light guide. A light deriving unit that emits light to the outside of the chip having a built-in light guide, a first light guide that reaches the light deriving unit from the first light introduction unit via the measurement target, and the first light guide A light-absorbing part that absorbs light adjacent to the first light introduction part, a second light introduction part that receives light from the outside of the light guide path built-in chip, and the first light introduction part from the second light introduction part. A second light guiding path that reaches a part of the optical path, wherein the measuring device receives a light from the light deriving unit, a display unit that displays optical information received by the light receiving unit, and the display unit. A control unit for controlling the display, and the control unit controls the display unit to pass through the second light guide path. Thus, the display method includes an inspection light display step of displaying optical information received by the light receiving unit.

  A second aspect of the present invention is the display method according to the first aspect, wherein the second light guide path is a light guide path that reaches from the second light introduction section to the light extraction section, and the light guide path built-in chip. Adjusting the relative positional relationship between the measuring device and the measuring device, and the control unit controls the display unit to display optical information received by the light receiving unit through the second light guide path And a post-adjustment display step.

  A third aspect of the present invention is the display method according to the first or second aspect, wherein the measuring device further includes a light emitting unit that emits light, and the control unit also controls the light emitting unit. In addition, before the inspection light display step, the control unit further includes an inspection light emission step of controlling the light emitting unit to emit light so that light enters the second light introducing unit.

  A fourth aspect of the present invention is the display method according to the third aspect, wherein in the inspection light emission step, the control unit controls the light emission unit to cause the light deriving unit to emit light.

  According to a fifth aspect of the present invention, there is provided a program for causing a computer further provided with a measuring device including a light receiving unit and a display unit to function as the control unit according to any one of the first to fourth aspects.

  According to a sixth aspect of the present invention, a first light introducing unit that receives light from the outside, a light deriving unit that emits light to the outside, and the first light introducing unit that reaches the light deriving unit via a measurement target. A light guide built-in chip comprising a first light guide and a light absorbing part that absorbs light adjacent to the first light guide, and is different from the first light introduction part, and second light that enters from the outside A light guide built-in chip including an introduction part and a second light guide that reaches from the second light introduction part to a part of the first light guide.

  A seventh aspect of the present invention is the light guide built-in chip according to the sixth aspect, wherein the second light guide is a light guide that reaches from the second light introduction section to the light extraction section.

  An eighth aspect of the present invention is the light guide built-in chip according to the sixth or seventh aspect, wherein the second light guide is made of an optical fiber and connected to an external light source.

  A ninth aspect of the present invention is an optical analysis system comprising a light guide built-in chip and a measuring device, wherein the light guide built-in chip includes a first light introducing unit into which light enters from outside the light guide built-in chip; A light deriving unit that emits light to the outside of the chip with a built-in light guide, a first light guide that reaches the light deriving unit from the first light introducing unit via a measurement target, and adjacent to the first light guiding unit Absorbing part that absorbs light, different from the first light introducing part, a second light introducing part from which light enters from the outside of the light guide built-in chip, and the first light guiding part entering from the second light introducing part A second light guide that reaches a part of the light guide, and the measuring instrument includes a light emitting unit that emits light to the first light introducing unit or the second light introducing unit, and a light receiving unit that receives light from the light deriving unit And a display unit that displays optical information received by the light receiving unit.

  According to each aspect of the present invention, it is possible to obtain light information reflecting the state of the irradiated region by irradiating light to a portion that cannot be seen, such as the inside of a light guide built-in chip or a contact surface with a measuring device. . This makes it easy to align the light guide built-in chip and the measuring device.

  In addition, since it is possible to obtain information on the light guide path that cannot be visually observed from the outside based on whether or not light can be derived and the derived light information, it is also possible to check whether the light is manufactured as designed. For example, it is possible to irradiate light at a predetermined location in the light guide path of the chip with a built-in light guide path, and to inspect the light guide path in the irradiated region for defects such as depressions.

  In order to perform high-accuracy measurement, alignment of the position of the light outlet and the position of the built-in camera so that the light emitted from the light outlet reaches the built-in camera of the portable terminal device sufficiently. Need to be done precisely. In this case, conventionally, an operator arbitrarily moves a light guide path built-in chip (microchip) to find a position where light is detected by a built-in camera. Further, when light is detected by the built-in camera, adjustment is made so that the image of the light detected by the built-in camera becomes a predetermined one.

  However, the housing of the light guide built-in chip is surrounded by the pigment-containing resin, and the inside of the housing and the contact surface with the measuring device cannot be visually observed. Moreover, the light emitted from the light derivation unit has a relatively small intensity. For this reason, it is difficult to detect with the built-in camera if the positions are not aligned to some extent. After all, at the beginning of the alignment step, it depends on the operator's intuition (prediction), and it is possible to align the chip with a built-in light guide (microchip) to a predetermined position on the display surface of the portable terminal device. It was difficult.

  According to the second aspect and the seventh aspect of the present invention, the light guide part or the inner wall of the light guide near the light guide part can be displayed on the display part. In addition, the intensity of light emitted from the light lead-out part increases. Therefore, the alignment of the light guide path built-in chip becomes easy.

  According to the third aspect of the present invention, the alignment of the light guide built-in chip and the measuring device can be facilitated without using an external light source.

  According to the 4th viewpoint of this invention, the shape of a light derivation | leading-out part can be displayed more clearly and position alignment of a light guide built-in chip | tip and a measuring instrument can be made still easier.

  According to the 8th viewpoint of this invention, it becomes possible to expand the choice of the illumination optical system which illuminates the site | parts which cannot be visually observed, such as the inside of a light guide built-in chip, a measurement apparatus installation surface. For example, the use of an external light source that emits light having a different intensity or wavelength than the light emitted from the light emitting unit included in the measuring instrument increases the degree of freedom in selecting illumination light.

1 is an example (Example 1) of a configuration of a chip with a built-in light guide according to the present invention. 6 is an example (Example 2) of a configuration of a chip with a built-in light guide according to the present invention. 6 is an example (Example 3) of a configuration of a chip with a built-in light guide according to the present invention. 6 is an example (Example 4) of a configuration of a light guide path built-in chip according to the present invention. It is the photograph of the state which installed the chip with a built-in light guide on the display surface of a measuring instrument.

Embodiments of the present invention will be described below with reference to the drawings. The embodiments of the present invention are not limited to the following examples.

  FIG. 1 to FIG. 4 are diagrams showing a light guide built-in chip 3 installed on a measuring instrument 1, which is a configuration example of the optical analysis system of the present invention.

  For example, a tablet PC or a smartphone may be used as the measuring device 1. The measuring device 1 includes a touch panel display 5, a central processing unit (CPU), a storage device (memory), and a camera 7 (an example of a “light receiving unit” described in the claims of the present application). In addition, the measuring device 1 includes an image display unit 9 (see FIG. 5 to be described later) for displaying an image received by the camera 7 on a part of the display 5 and a first light emitting unit for emitting light to irradiate the measurement target. 11 and the second light emitting unit 13 that emits light for illuminating the light guide path are programmed. The image display unit 9, the first light-emitting unit 11, and the second light-emitting unit 13 on the display 5 are operated so as to be able to switch display on / off, light wavelength, light intensity, etc., as necessary. You may provide the display operation input part 15 (refer FIG. 5 mentioned later) for controlling.

  1 includes a first light introduction unit 17, a first air chamber 19, a measurement target introduction unit 21, a second air chamber 23, a light derivation unit 25, a second light introduction unit 27, and light absorption. Part 29 is provided. Here, a light guide path of light that passes through the measurement target in the measurement target introduction section 21 from the first light introduction section 17 and reaches the light derivation section 25 is referred to as a first light guide path 31. The first light guide 31 is made of a transparent silicone resin, and is surrounded by a light absorbing portion 29 made of a pigment-containing silicone resin. The first air chamber 19 and the second air chamber 23 are provided in order to align the optical axis with the measurement target and the light outlet 25 using the difference in refractive index between the atmosphere and the silicone resin, and the second light introduction The unit 27 is provided adjacent to the light deriving unit 25.

  At the time of measurement in the optical analysis system of the present invention, light from the first light emitting unit 11 of the measuring instrument 1 is introduced into the light guide path built-in chip 3 through the first light introducing unit 17 and irradiated to the measurement target. Light from the measurement target is guided from the light guide built-in chip 3 to the light receiving unit 7 of the measuring device 1 through the light deriving unit 25. Based on the received light, the measuring device 1 performs light analysis in the calculation unit.

  The light guide path built-in chip 3 is surrounded by the light absorbing portion 29 as shown in FIG. 1, and the light guide path and the air chamber inside thereof cannot be visually observed. Further, since the surface having the light deriving portion 25 of the light guide path built-in chip 3 is placed in contact with the display 5 surface of the measuring device 1, the surface having the light deriving portion 25 cannot be seen at the time of measurement.

  Therefore, conventionally, it has been difficult to install the light guide built-in chip at a predetermined position on the measuring device. In order to perform measurement with an optical analysis system consisting of a chip with a built-in light guide and a measuring device, the chip with a built-in light guide is placed so that the first light introducing part is located on the first light emitting part and the light leading part is located on the camera. Must be installed on the measuring device. If the shape of the chip with a built-in light guide and the installation position on the measuring device are known in advance, there will be no significant shift, but the light from the light derivation unit will reach the camera sufficiently for accurate measurement. As described above, it is necessary to precisely align the position of the light derivation unit and the position of the camera.

  Conventionally, alignment is performed while light is emitted from a relatively wide area of the display, light is guided to the light introducing portion of the chip with a built-in light guide, and light emitted from the light deriving portion is received by the camera. However, since the light guide is surrounded by the black pigment silicone resin, the camera can detect only the light emitted from the light outlet. Therefore, when the position of the light deriving unit (the position of light emitted from the light deriving unit) does not correspond to the position of the camera, the camera cannot receive light. That is, even if a camera is used, precise alignment between the camera and the light outlet is impossible. In addition, since the light from the light derivation unit is observation light emitted from the measurement target as a result of the light from the display introduced from the light introduction unit being irradiated onto the measurement target, the light intensity is relatively small. If there is no alignment, it is difficult to detect with a camera. Therefore, in the conventional optical analysis system, detecting light from the light derivation unit with a camera depends on the operator's intuition (prediction), making alignment difficult and time consuming.

  When positioning the chip 3 with a built-in light guide in the optical analysis system of the present invention, the second light emitting unit 13 of the measuring device 1 is turned on, and the vicinity of the light deriving unit 25 of the chip 3 with a built-in light guide is passed through the second light introducing unit 27. Illuminate. The second light emitting unit 13 is set in the vicinity of the camera 7 and the light deriving unit 25. Then, the reflected light of the illumination light enters the camera 7 and the light guide part 25 or the inner wall of the light guide near the light guide part 25 is displayed on the image display part 9.

  FIG. 5 is a photograph showing a state where the light guide built-in chip 3 is installed on the display 5 surface of the measuring device 1. A rectangular area surrounded by a line on the lower right of the display 5 is an image display unit 9 that displays an image received by the camera. (a) shows when the first light emitting unit 11 is turned on and the second light emitting unit 13 is turned off, and (b) shows when the first light emitting unit 11 is turned on and when the second light emitting unit 13 is turned on. When the second light emitting unit 13 is turned off in (a), only the measurement light introduced from the first light introducing unit 17 and reaching the light deriving unit 25 is displayed. When the second light emitting unit 13 is turned on in (b), the surface of the light guide built-in chip 3 having the light deriving unit 25 or the inner wall of the light guide near the light deriving unit 25 is illuminated, and in addition to the measurement light, the light deriving unit 25 Is also displayed. The hexagonal region is the light guide part 25 or the light guide path inner wall in the vicinity of the light guide part 25. In this way, the second light emitting unit 13 is turned on and the light deriving unit 25 is illuminated, so that the positioning of the light guide built-in chip 3 is facilitated.

  Note that the second light emitting unit 13 is turned off because it is not necessary during measurement.

  The light guide path built-in chip 103 shown in FIG. 2 includes, in addition to the components of the light guide path built-in chip 3 in FIG. 1, the second light guide path 109 that reaches the light outlet section 25 from the third air chamber 105 and the second light introduction section 107. The second light introducing unit 107 may be provided not in the vicinity of the light deriving unit 25 and the camera 7, but in a remote position. 2 is programmed so that the second light emitting unit 111 is positioned not under the camera but under the second light introducing unit 107.

  In the optical analysis system of the present invention shown in FIG. 2, the light from the second light emitting unit 111 is introduced into the light guide built-in chip 103 from the second light introducing unit 107, passes through the second light guide 109, and the light. The derivation unit 25 is reached. By illuminating the light derivation unit 25 with the light from the second light emitting unit 111, the positioning of the light guide path built-in chip 103 is facilitated, as in the optical analysis system of FIG. As in FIG. 1, the second light emitting unit 111 is turned off during measurement.

  A light guide built-in chip 203 shown in FIG. 3 further includes a second light guide 205 made of an optical fiber in addition to the components of the light guide built-in chip 3 in FIG. The light guided to the optical fiber is, for example, an external light source. Instead of the external light source, it is also possible to provide the display with a second light emitting unit, guide the light emitted from the second light emitting unit 205 to the second light guide 205, and use this light as illumination light. Similar to the optical analysis system of FIG. 1, the light guide 25 can be illuminated, so that the positioning of the light guide built-in chip 203 is facilitated. It is necessary to guide the light to illuminate the light guide 25 only when positioning the light guide built-in chip 203, and during measurement, the second light guide 205 is not guided.

  The light guide path built-in chip 303 shown in FIG. 4 further includes a second light guide path 307 reaching the measurement target introduction section 21 from the second light introduction section 305 in addition to the components of the light guide path built-in chip 3 in FIG. 4 is programmed so that the second light emitting unit 309 is located not in the vicinity of the camera 7 but under the second light introducing unit 305.

  The measurement in the optical analysis system of the present invention shown in FIG. 4 can be performed in the same manner as in FIG. The difference between FIG. 1 and FIG. 4 is where the second light guide path 307 reaches from the second light introduction unit 305. That is, the light deriving unit 25 is illuminated in FIG. 1, but the measurement target introducing unit 21 in the first light guide 31 is illuminated in FIG.

  According to the optical analysis system of FIG. 4, the second light emitting unit 309 is turned on and the measurement target introduction unit 21 is illuminated to investigate whether there is a structural defect in the light guide near the measurement target introduction unit 21. can do. Here, like the measurement object introducing unit 21 in FIG. 4, the illuminated area is referred to as an inspection area. Further, the light from the second light emitting unit 309 that enters from the second light introducing unit 305 and irradiates the inspection region is referred to as inspection light (an example of “inspection light” described in the claims of the present application). If the light guide path between the measurement target introducing unit 21 and the light deriving unit 25 is depressed and blocked, the inspection light does not reach the light deriving unit 25 and is not received by the camera 7.

  The inspection region is not limited to the vicinity of the measurement target introduction unit 21, and may be an arbitrary region in the first light guide 31. Also, a plurality of inspection areas may be set, and a plurality of second light introducing sections 305, second light guide paths 307, and second light emitting sections 309 may be provided according to the number of inspection areas.

DESCRIPTION OF SYMBOLS 1 ... Measuring apparatus, 3 ... Chip with a built-in light guide path, 5 ... Touch-panel display, 7 ... Camera, 9 ... Image display part, 11 ... 1st light emission part, ... Second light emitting unit, 15 ... display operation input unit, 17 ..., first light introducing unit, 19 ... first air chamber, 21 ... measuring object introducing unit, 23 ... second Air chamber, 25... Light derivation section, 27... Second light introduction section, 29... Light absorption section, 31... First light guide, 101. Optical path built-in chip, 105 ... third air chamber, 107 ... second light introducing section, 109 ... second light guide path, 111 ... second light emitting section, 201 ... measuring instrument, 203 ... Chip with built-in light guide, 205 ... Second light guide, 301 ... Measurement device, 303 ... Chip with built-in light guide, 305 ... Second light introduction part, 307 ... Second guide Optical path, 309 ... 2nd light emission part

Claims (9)

A display method in an optical analysis system including a chip with a built-in light guide and a measuring device,
The light guide built-in chip,
A first light introduction part into which light enters from the outside of the light guide path built-in chip;
A light derivation unit for emitting light to the outside of the light guide path built-in chip;
A first light guide that reaches the light derivation unit from the first light introduction unit via a measurement target;
A light absorber that absorbs light adjacent to the first light guide;
Different from the first light introduction part, a second light introduction part into which light enters from the outside of the light guide path built-in chip,
A second light guide that reaches from the second light introduction part to a part of the first light guide,
The measuring instrument is
A light receiving unit for receiving light from the light deriving unit;
A display unit for displaying optical information received by the light receiving unit;
A control unit for controlling the display unit,
The display method includes an inspection light display step in which the control unit controls the display unit to display optical information received by the light receiving unit through the second light guide. The second light guide path is a light guide path reaching the light lead-out section from the second light introduction section,
A position adjusting step for adjusting a relative positional relationship between the light guide built-in chip and the measuring device;
2. The display method according to claim 1, further comprising a post-adjustment display step in which the control unit controls the display unit to display optical information received by the light receiving unit through the second light guide. The measuring device further includes a light emitting unit that emits light,
The control unit also controls the light emitting unit,
3. The inspection light emission step according to claim 1, further comprising an inspection light emission step in which the control unit controls the light emission unit to emit light so that light enters the second light introduction unit before the inspection light display step. Display method.   The display method according to claim 3, wherein in the inspection light emitting step, the control unit controls the light emitting unit to cause the light deriving unit to emit light.   The program for functioning as a said control part in any one of Claim 1 to 4 with which the computer further provided with the measuring apparatus provided with a light-receiving part and a display part is provided. A first light introduction unit for receiving light from the outside, a light deriving unit for emitting light to the outside, a first light guide path reaching the light deriving unit from the first light introduction unit via a measurement object, and the first A light guide built-in chip comprising a light absorbing portion that absorbs light adjacent to the light guide,
Different from the first light introduction part, a second light introduction part into which light enters from the outside,
A light guide built-in chip including a second light guide that reaches from the second light introduction part to a part of the first light guide.   The light guide built-in chip according to claim 6, wherein the second light guide is a light guide that reaches from the second light introduction unit to the light extraction unit.   The light guide built-in chip according to claim 6 or 7, wherein the second light guide is made of an optical fiber and connected to an external light source. An optical analysis system comprising a chip with a built-in light guide and a measuring device,
The light guide built-in chip,
A first light introduction part into which light enters from the outside of the light guide path built-in chip;
A light derivation unit for emitting light to the outside of the light guide path built-in chip;
A first light guide that reaches the light derivation unit from the first light introduction unit via a measurement target;
A light absorber that absorbs light adjacent to the first light guide;
Different from the first light introduction part, a second light introduction part into which light enters from the outside of the light guide path built-in chip,
A second light guide that enters from the second light introduction part and reaches a part of the first light guide,
The measuring instrument is
A light emitting unit for emitting light to the first light introducing unit or the second light introducing unit;
A light receiving unit for receiving light from the light deriving unit;
An optical analysis system comprising: a display unit that displays optical information received by the light receiving unit.