JP2017059649A - Hermetic sealing cap and manufacturing method therefor, electronic component housing package and manufacturing method therefor - Google Patents

Hermetic sealing cap and manufacturing method therefor, electronic component housing package and manufacturing method therefor Download PDF

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JP2017059649A
JP2017059649A JP2015182444A JP2015182444A JP2017059649A JP 2017059649 A JP2017059649 A JP 2017059649A JP 2015182444 A JP2015182444 A JP 2015182444A JP 2015182444 A JP2015182444 A JP 2015182444A JP 2017059649 A JP2017059649 A JP 2017059649A
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sealing
electronic component
sealing material
cap
discontinuous
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和也 長友
Kazuya Nagatomo
和也 長友
賢 浅田
Masaru Asada
賢 浅田
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Proterial Ltd
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Hitachi Metals Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a hermetic sealing cap that is not only inexpensive but also easily realizes high vacuum or inert gas atmosphere in the electronic component housing package by making gas hard to remain therein, and to provide a manufacturing method therefor, an electronic component housing package using the hermetic sealing cap, and a manufacturing method therefor.SOLUTION: A hermetic sealing cap includes an annular sealing material part having a discontinuous part at one or more positions on the surface of a metal plate. An electronic component housing package has a first sealing part where a junction structure of the hermetic sealing cap and an electronic component housing member internally housing an electronic component are joined annularly while having the discontinuous part, and a second sealing part which is joined to embed the discontinuous part.SELECTED DRAWING: Figure 1

Description

本発明は、気密封止用キャップおよびその製造方法、電子部品収納パッケージおよびその製造方法に関する。   The present invention relates to a hermetic sealing cap and a manufacturing method thereof, an electronic component storage package, and a manufacturing method thereof.

従来、例えば、携帯電話の雑音除去などに用いられる表面弾性波(SAW:Surface Acoustic Wave)フィルタや、水晶振動子および発振器などの電子部品の気密封止に用いる表面実装型デバイス(SMD:Surface Mount Device)パッケージなど、内部に電子部品が収納された電子部品収納パッケージが多用されている。こうした電子部品収納パッケージは、内部に電子部品が収納されたセラミック製ケース(電子部品収納部材)に対し、蓋材(気密封止用キャップ)が封止材により接合されることにより、内部が気密封止されている。   Conventionally, for example, a surface acoustic wave (SAW) filter used for noise removal of a mobile phone, a surface mount device (SMD: Surface Mount) used for hermetic sealing of electronic components such as a crystal resonator and an oscillator. An electronic component storage package in which an electronic component is stored inside, such as a device) package, is often used. In such an electronic component storage package, a lid member (airtight sealing cap) is bonded to a ceramic case (electronic component storage member) in which an electronic component is stored. It is hermetically sealed.

例えば、特許文献1に開示される気密封止用キャップは、基材には金属よりも低熱膨張のセラミック板が用いられ、そのセラミック板の表面上には低融点ガラスペースト(封止材)を塗布して表面を硬化させた封止材部が設けられている。かかる封止材部は、同質の低融点ガラスペーストを用いた2層構造を有し、環状(四角形)に配置された第一封止材部(下層)の表面上に、4つの角部が不連続となるように全体的に環状(四角形)に配置された第二封止材部(上層)が形成されている。かかる2層構造の封止材部は、セラミック板の表面上に第一封止材部となる低融点ガラスペーストを塗布し、続いて前記第一封止材部の表面上に第二封止材部となる同質の低融点ガラスペーストを4つの角部が不連続となるように塗布した後、低融点ガラスペーストの融点よりも低い温度で表面のみを乾燥させて硬化させる方法で形成されている。なお、表面のみを硬化させた前記封止材部は、加熱によりガス化し易いガラスペーストの溶媒や有機バインダなどが内部に残留している。   For example, in the hermetic sealing cap disclosed in Patent Document 1, a ceramic plate having a lower thermal expansion than metal is used as a base material, and a low-melting glass paste (sealing material) is provided on the surface of the ceramic plate. A sealing material portion that is coated and hardened is provided. Such a sealing material portion has a two-layer structure using a low-melting-point glass paste of the same quality, and four corners are formed on the surface of the first sealing material portion (lower layer) arranged in a ring (square). A second sealing material portion (upper layer) is formed so as to be discontinuous and arranged in a ring shape (square shape) as a whole. Such a two-layer sealing material part is obtained by applying a low-melting-point glass paste to be the first sealing material part on the surface of the ceramic plate, and subsequently applying a second sealing on the surface of the first sealing material part. After applying the same low melting point glass paste as the material part so that the four corners are discontinuous, only the surface is dried and cured at a temperature lower than the melting point of the low melting point glass paste. Yes. In addition, the glass paste solvent, organic binder, etc. which are easy to gasify by heating remain in the sealing material part which hardened only the surface inside.

特許文献1に開示される電子部品収納パッケージは、上述した2層構造の封止材部を有する気密封止用キャップと、内部に電子部品が収納された電子部品収納部材とが接合され、気密封止されたものである。その接合過程において、4つの角部が不連続となるように構成された前記第二封止材部により、電子部品収納パッケージの内部と外部とを連通する不連続部が形成される。かかる不連続部を有する接合構造によれば、前記封止材部を加熱した際にガラスペーストの溶媒や有機バインダなどが内部でガス化しても、不連続部を通じてガスを外部に排出することができる。あるいは、内部でガスが膨張しても、不連続部を通じてガスが外部に排出され、残留ガスの噴出に起因するリーク不良が抑制される。   In the electronic component storage package disclosed in Patent Document 1, the above-described hermetic sealing cap having the two-layer sealing material portion and the electronic component storage member in which the electronic component is stored are joined. It is hermetically sealed. In the joining process, a discontinuous portion that connects the inside and the outside of the electronic component storage package is formed by the second sealing material portion configured so that the four corner portions are discontinuous. According to the joining structure having such a discontinuous portion, even when the solvent of the glass paste or the organic binder is gasified inside when the sealing material portion is heated, the gas can be discharged to the outside through the discontinuous portion. it can. Or even if gas expand | swells inside, gas will be discharged | emitted outside through a discontinuous part and the leak defect resulting from ejection of residual gas will be suppressed.

特開2005−26974号公報JP 2005-26974 A

近年、電子部品収納パッケージを用いる電子機器の更なる小型化や高性能化が進んでいる。これにともない、電子部品収納パッケージやこれに用いる気密封止用キャップには、安価であることのみならず、その内部に残留する水分量やガス量をより低減し、高真空化することが求められている。あるいは用途によっては、電子部品収納パッケージの内部を不活性ガス雰囲気にすることが求められている。   In recent years, electronic devices using electronic component storage packages have been further reduced in size and performance. As a result, electronic component storage packages and hermetic sealing caps used therefor are required not only to be inexpensive, but also to reduce the amount of moisture and gas remaining in the interior and to increase the vacuum. It has been. Or depending on a use, it is calculated | required that the inside of an electronic component storage package shall be inert gas atmosphere.

ところで、特許文献1に開示される2層構造の封止材部は、第一封止材部と第二封止材部とが同質であるため、第一封止材部のガラスペーストが溶融して生成された第一封止材と、第二封止材部のガラスペーストが溶融して生成された第二封止材とが、とても馴染みやすい。したがって、封止材部の2層化は製造コストを増加させるが、第一封止材部および第二封止材部のガラスペーストが溶融した際、第二封止材部により形成されていた不連続部が、内部が高圧にならない程度の時間的余裕を持って短時間で閉塞し、残留ガスの噴出が抑制される利点もある。そうだとしても、不連続部が短時間で閉塞されるため、ガラスペーストの溶媒や有機バインダなどに起因するガスが電子部品収納パッケージの内部に残留しやすい。そのため、残留ガスによる真空度の低下が、あるいは残留ガス自体が、電子部品の諸特性に影響を及ぼす可能性がある。   By the way, since the 1st sealing material part and the 2nd sealing material part are homogeneous in the sealing material part of 2 layer structure disclosed by patent document 1, the glass paste of a 1st sealing material part melt | dissolved. The first sealing material generated in this way and the second sealing material generated by melting the glass paste of the second sealing material part are very familiar. Therefore, although the two-layered sealing material portion increases the manufacturing cost, it was formed by the second sealing material portion when the glass paste of the first sealing material portion and the second sealing material portion was melted. There is also an advantage that the discontinuous portion is closed in a short time with a time margin that the inside does not become high pressure, and the ejection of the residual gas is suppressed. Even so, since the discontinuous portion is closed in a short time, the gas caused by the solvent of the glass paste, the organic binder or the like tends to remain inside the electronic component storage package. For this reason, a decrease in the degree of vacuum due to the residual gas or the residual gas itself may affect various characteristics of the electronic component.

本発明の目的は、安価であって、電子部品収納パッケージの内部にガスが残留し難く高真空化しやすい、あるいは内部を不活性ガス雰囲気化しやすい、気密封止用キャップおよびその製造方法を提供し、その気密封止用キャップを用いた電子部品収納パッケージおよびその製造方法を提供することである。   An object of the present invention is to provide a hermetic sealing cap that is inexpensive and does not easily cause gas to remain in an electronic component storage package, and that can easily be evacuated, or in which an interior is easily brought into an inert gas atmosphere, and a method for manufacturing the same. Another object is to provide an electronic component storage package using the hermetic sealing cap and a manufacturing method thereof.

本発明者は、封止材を用いた気密封止用キャップと電子部品収納部材との接合構造について検討し、接合の過程で電子部品収納パッケージの内部と外部を連通させるとともに、短時間で閉塞し難い不連続部を有する接合構造を形成することにより、上述した課題が解決できることを見出し、本発明に想到した。   The present inventor has examined the bonding structure between the hermetic sealing cap using the sealing material and the electronic component storage member, and communicated the inside and outside of the electronic component storage package in the process of bonding and closed the plug in a short time. The present inventors have found that the above-described problems can be solved by forming a joining structure having discontinuous portions that are difficult to achieve, and have arrived at the present invention.

すなわち、本発明の気密封止用キャップは、金属板の表面上に一ヶ所以上の不連続部を有する環状の封止材部を備える気密封止用キャップである。
前記不連続部における金属板の表面は、前記封止材部の溶融により生成された封止材に対する濡れ性が、金属板の他の表面よりも低い領域を有することが好ましい。
That is, the hermetic sealing cap of the present invention is a hermetic sealing cap provided with an annular sealing member having one or more discontinuous portions on the surface of the metal plate.
It is preferable that the surface of the metal plate in the discontinuous portion has a region where wettability with respect to the sealing material generated by melting the sealing material portion is lower than the other surface of the metal plate.

本発明の気密封止用キャップは、金属板の表面上に一ヶ所以上の不連続部を有する環状の封止材を配置し、加熱により前記封止材を溶融した後に凝固することにより、前記金属板の表面上に一ヶ所以上の不連続部を有する環状の封止材部を形成する製造方法により作製することができる。   The hermetic sealing cap of the present invention is arranged by disposing an annular sealing material having one or more discontinuous portions on the surface of a metal plate, and solidifying after melting the sealing material by heating. It can be produced by a production method for forming an annular sealing material portion having one or more discontinuous portions on the surface of the metal plate.

上述した本発明の気密封止用キャップを用いて、内部に電子部品が収納された電子部品収納パッケージを得ることができる。
すなわち、本発明の電子部品収納パッケージは、上述した本発明のいずれかの気密封止用キャップと、内部に電子部品が収納された電子部品収納部材とが接合された電子部品収納パッケージであって、気密封止用キャップと電子部品収納部材との接合構造は、前記不連続部を有しつつ環状に接合された第一封止部と、前記不連続部を埋設するように接合された第二封止部とを有することを特徴とする。
Using the above-described hermetic sealing cap of the present invention, an electronic component storage package in which electronic components are stored can be obtained.
That is, the electronic component storage package of the present invention is an electronic component storage package in which the above-described hermetic sealing cap of the present invention and an electronic component storage member in which the electronic component is stored are joined. The sealing structure of the hermetic sealing cap and the electronic component housing member includes a first sealing portion that is annularly joined while having the discontinuous portion, and a first sealing portion that is joined so as to embed the discontinuous portion. It has two sealing parts.

本発明の電子部品収納パッケージは、気密封止用キャップと、内部に電子部品が収納された電子部品収納部材とが接合された電子部品収納パッケージの製造方法であって、金属板と第一封止材を準備し、前記第一封止材を用いて前記金属板の表面上に一ヶ所以上の不連続部を有する環状の第一封止材部を形成する気密封止用キャップ形成工程と、内部に電子部品が収納された電子部品収納部材に対して前記気密封止用キャップを配置した後に前記第一封止材部を溶融させた後に凝固させて、一ヶ所以上の不連続部を有する環状の第一封止部を形成する第一封止工程と、第二封止材を用いて前記不連続部を埋設して第二封止部を形成することにより気密封止用キャップと電子部品収納部材とを封止する第二封止工程とを含む、製造方法により作製することができる。   An electronic component storage package according to the present invention is a method for manufacturing an electronic component storage package in which an airtight sealing cap and an electronic component storage member in which an electronic component is stored are joined. An airtight sealing cap forming step of preparing a stopper and forming an annular first sealing material portion having one or more discontinuous portions on the surface of the metal plate using the first sealing material; Then, after disposing the hermetic sealing cap on the electronic component housing member in which the electronic component is housed, the first sealing material portion is melted and then solidified to form one or more discontinuous portions. A first sealing step for forming an annular first sealing portion, and an airtight sealing cap by embedding the discontinuous portion using a second sealing material to form a second sealing portion. Including a second sealing step for sealing the electronic component housing member. It can be.

本発明によれば、気密封止用キャップと電子部品収納部材との接合の過程で、電子部品収納パッケージの内部と外部を連通させるとともに、短時間で閉塞し難い不連続部を有する接合構造を形成することができる。かかる不連続部を有する接合構造を使用し、電子部品収納パッケージの内部を高真空化する処理、あるいは不活性ガス雰囲気化する処理を行うことができる。   According to the present invention, in the process of joining the hermetic sealing cap and the electronic component storage member, the inside and the outside of the electronic component storage package communicate with each other, and the bonding structure having a discontinuous portion that is difficult to close in a short time. Can be formed. By using such a joint structure having discontinuous portions, it is possible to perform a process for increasing the vacuum inside the electronic component storage package or a process for creating an inert gas atmosphere.

本発明の気密封止用キャップの構成例であって、電子部品収納部材との接合面側の平面図である。It is a structural example of the cap for airtight sealing of this invention, Comprising: It is a top view by the side of a joint surface with an electronic component storage member. 図1に示す線分AAに沿った断面図である。It is sectional drawing along line AA shown in FIG. 図2に示す金属板の替りに、基材5、中間層7および密着層6を用いた金属板を用いた気密封止用キャップの構成例を示す断面図であるIt is sectional drawing which shows the structural example of the cap for airtight sealing using the metal plate using the base material 5, the intermediate | middle layer 7, and the contact | adherence layer 6 instead of the metal plate shown in FIG. 本発明の気密封止用キャップと電子部品収納部材とを接合した構成例を示す斜視図である。It is a perspective view which shows the structural example which joined the cap for airtight sealing of this invention, and the electronic component storage member. 図4に示す不連続部10を第二封止材を用いて埋設し、最終的な気密封止を行った構成例を示す斜視図である。It is a perspective view which shows the structural example which embedded the discontinuous part 10 shown in FIG. 4 using the 2nd sealing material, and performed final airtight sealing.

本発明の気密封止用キャップ(以下、「キャップ」という。)は、電子部品収納パッケージ(以下、「パッケージ」という。)に用いられ、内部に電子部品が収納された電子部品収納部材(以下、「ケース」という。)と接合される。本発明における重要な特徴は、金属板の表面上に一ヶ所以上の不連続部を有する環状の封止材部を備えるキャップである。すなわち、その環状の封止部材は、一つの連続した環状ではなく、一ヶ所以上の不連続部を有する。   The hermetic sealing cap (hereinafter referred to as “cap”) of the present invention is used in an electronic component storage package (hereinafter referred to as “package”), and an electronic component storage member (hereinafter referred to as “electronic component storage member”) in which the electronic component is stored. , Referred to as “case”). An important feature of the present invention is a cap including an annular sealing material portion having one or more discontinuous portions on the surface of the metal plate. That is, the annular sealing member does not have one continuous annular shape but has one or more discontinuous portions.

以下、本発明のキャップおよびその製造方法について、図1、図2、および図3を参照して説明する。
図1に示すキャップ1は、角形の金属板2と、かかる金属板2の表面上に4辺に沿うように形成された角形環状の封止材部3とで構成される。この環状の封止材部3は、対向する長辺上に1つずつ、合計2つの不連続部4を有する。これにより、環状の封止部材3は一つの連続した環状とはならない。かかる不連続部4は、図2に示すように金属板2の表面上に封止材部3が形成されていないため、後述するようにキャップ1を用いてパッケージを製造する際にパッケージの内部と外部を連通し、最終的にパッケージの気密封止性の向上や高真空化など、重要な効果を奏する。
Hereinafter, the cap of the present invention and the manufacturing method thereof will be described with reference to FIG. 1, FIG. 2, and FIG.
A cap 1 shown in FIG. 1 includes a rectangular metal plate 2 and a rectangular annular sealing material portion 3 formed along the four sides on the surface of the metal plate 2. This annular sealing material portion 3 has a total of two discontinuous portions 4, one on the opposing long side. Thereby, the annular sealing member 3 does not become one continuous annular shape. As shown in FIG. 2, the discontinuous portion 4 has no sealing material portion 3 formed on the surface of the metal plate 2, so that when the package is manufactured using the cap 1 as described later, And the outside communicate with each other, and finally there are important effects such as improvement of hermetic sealing of the package and high vacuum.

金属板2は、圧延薄板などの所定の厚さを有する金属材料を用い、プレス加工、レーザー加工、ウォータージェット加工などにより、図1に示す所定の形状に形成される。尚、本発明のキャップの形状はこの形状に限定されない。金属板2に用いる金属材料としては、Fe−Ni系合金、Fe−Ni−Co系合金、Fe−Cr系合金、またはFe−Ni−Cr系合金などが使用できる。詳しくは、10〜48質量%のNiを含むFe−Ni系合金や、10〜45質量%のNiおよび10〜25質量%のCoを含むFe−Ni−Co系合金や、2〜20質量%のCrを含むFe−Cr系合金が使用できる。また、35〜50質量%のNiを含む、Fe−42質量%Ni−6質量%Cr系合金や、Fe−42質量%Ni−4%Cr系合金や、Fe−47質量%Ni−6質量%Cr系合金なども使用できる。なお、金属板2は、上述したFe、Ni、Cr、Coの元素の他、例えば、Ti、Si、Mn、Cu、Al、C、P、S、N、Oなどの元素を、本発明の作用効果を阻害しない限り含むことができる。   The metal plate 2 is formed into a predetermined shape shown in FIG. 1 using a metal material having a predetermined thickness, such as a rolled thin plate, by press processing, laser processing, water jet processing, or the like. In addition, the shape of the cap of this invention is not limited to this shape. As a metal material used for the metal plate 2, an Fe—Ni alloy, an Fe—Ni—Co alloy, an Fe—Cr alloy, an Fe—Ni—Cr alloy, or the like can be used. Specifically, the Fe-Ni-based alloy containing 10 to 48 mass% Ni, the Fe-Ni-Co-based alloy containing 10 to 45 mass% Ni and 10 to 25 mass% Co, or 2 to 20 mass%. Fe-Cr alloy containing Cr can be used. Moreover, Fe-42 mass% Ni-6 mass% Cr type alloy containing 35-50 mass% Ni, Fe-42 mass% Ni-4% Cr type alloy, Fe-47 mass% Ni-6 mass % Cr alloy can also be used. In addition to the elements of Fe, Ni, Cr, and Co described above, the metal plate 2 is made of, for example, elements such as Ti, Si, Mn, Cu, Al, C, P, S, N, and O according to the present invention. It can be included as long as the effect is not inhibited.

キャップ1は、ケースに対し、封止材のリフロー処理、シーム溶接、またはレーザー溶接などにより、封止材を介して接合される。かかる接合の過程において、キャップ1およびケースは加熱により膨張し、両者の熱膨張差に起因して熱応力が発生する。キャップ1とケースの熱膨張差が大きいほど熱応力が大きくなるため、接合部にクラックなどが発生しやすくなる。また、気密封止されたパッケージが熱サイクルの変化を受けると、残留応力に起因して接合部が破損に至る可能性もある。したがって、金属板2は、ケースの材質(例えばセラミック)と同程度の熱膨張係数を有することが好ましい。ケースの材質がセラミックである場合、金属板2の40℃から400℃における熱膨張係数が12×10−6/℃以下であることが好ましい。 The cap 1 is joined to the case via the sealing material by reflow processing of the sealing material, seam welding, laser welding, or the like. In the process of joining, the cap 1 and the case are expanded by heating, and thermal stress is generated due to a difference in thermal expansion between the cap 1 and the case. Since the thermal stress increases as the difference in thermal expansion between the cap 1 and the case increases, cracks and the like are likely to occur at the joint. Further, when the hermetically sealed package is subjected to a change in thermal cycle, the joint may be damaged due to residual stress. Therefore, the metal plate 2 preferably has a thermal expansion coefficient comparable to that of the case material (for example, ceramic). When the material of the case is ceramic, it is preferable that the thermal expansion coefficient of the metal plate 2 at 40 ° C. to 400 ° C. is 12 × 10 −6 / ° C. or less.

本発明においてキャップに用いる金属板2は、環状の封止材部3を形成する前の表面が被覆されていてもよい。例えば、図3に示す金属板2(便宜上、図1と同じ符号を用いる。)は、図2に示す金属板2と同様な金属材料を用いて形成された基材5の表面上に中間層7を有し、その中間層7の表面上に密着層6を有する。金属板2の最表面の密着層6は、金属板2の表面上に例えばリフロー処理により封止材を固着して環状の封止材部3を形成する際、かかる封止材が溶融して固着するときに適度な濡れ拡がり性と高い密着性を金属板に付与する層である。かかる密着層6を有する金属板2は、環状の封止材部3の剥離強度が高くなるので好ましい。   The metal plate 2 used for the cap in the present invention may be coated on the surface before the annular sealing material portion 3 is formed. For example, the metal plate 2 shown in FIG. 3 (for the sake of convenience, the same reference numeral as in FIG. 1) is used as an intermediate layer on the surface of the base material 5 formed using the same metal material as the metal plate 2 shown in FIG. 7 and an adhesion layer 6 on the surface of the intermediate layer 7. The adhesion layer 6 on the outermost surface of the metal plate 2 is melted when the sealing material is fixed on the surface of the metal plate 2 by, for example, reflow treatment to form the annular sealing material portion 3. It is a layer that imparts appropriate wet spread and high adhesion to the metal plate when it is fixed. The metal plate 2 having the adhesion layer 6 is preferable because the peel strength of the annular sealing material portion 3 is increased.

密着層6としては、例えば、封止材にAu−Sn系合金、Sn−Ag系合金、Sn−Cu系合金、Sn−Zn系合金、Sn−In系合金、Sn−Bi系合金などのSnを含有する金属材料を使用する場合は、Au層、Au−Co系合金層、Pd層、Ag層などが使用できる。これら各層は、電解や無電解などのめっき処理、物理蒸着(PVD:Physical Vapor Deposition)や化学蒸着(CVD:Chemical Vapor Deposition)などの蒸着処理のほか、クラッド圧延などの圧接処理などにより形成できる。また、密着層6は、例えば、封止材にV−P−O系、Pb−B−O−F系、Pb−B−O系、Bi−B−O系、あるいはSn−P−O系などのガラス材料を使用する場合は、Cr、Fe、Zn、Al、Ti、Mg、Ca、Siなどの基材5に含まれる元素に起因する酸化被膜層が使用できる。かかる酸化被膜層は、例えば、基材5の材質が2〜8質量%のCrとFeとを含むFe−Cr系合金や、35〜50質量%のNiを含むFe―Ni―Cr系合金である場合、かかる基材5を1150℃以下の温度範囲の選択酸化性雰囲気で熱処理することにより、Crを含む強固な酸化被膜層として形成することができる。同様に、基材5がFe−Ni系合金やFe−Ni−Co系合金であっても、Feを含む酸化被膜層として形成することができる。   As the adhesion layer 6, for example, Sn—Sn—Au—Sn alloy, Sn—Ag alloy, Sn—Cu alloy, Sn—Zn alloy, Sn—In alloy, Sn—Bi alloy or the like is used as the sealing material. In the case of using a metal material containing Ni, an Au layer, an Au—Co alloy layer, a Pd layer, an Ag layer, or the like can be used. Each of these layers can be formed by plating treatment such as electrolysis and electroless, vapor deposition treatment such as physical vapor deposition (PVD) and chemical vapor deposition (CVD), and pressure treatment such as clad rolling. In addition, the adhesion layer 6 is made of, for example, a VPO system, a Pb—B—O—F system, a Pb—B—O system, a Bi—B—O system, or a Sn—PO system. When a glass material such as, for example, is used, an oxide film layer derived from an element contained in the base material 5 such as Cr, Fe, Zn, Al, Ti, Mg, Ca, and Si can be used. Such an oxide film layer is made of, for example, an Fe—Cr alloy containing 2 to 8% by mass of Cr and Fe or a Fe—Ni—Cr alloy containing 35 to 50% by mass of Ni. In some cases, the substrate 5 can be formed as a strong oxide film layer containing Cr by heat treatment in a selective oxidizing atmosphere in a temperature range of 1150 ° C. or lower. Similarly, even if the substrate 5 is an Fe—Ni alloy or an Fe—Ni—Co alloy, it can be formed as an oxide film layer containing Fe.

ここでいう選択酸化性雰囲気とは、Crを含む強固な酸化被膜層として形成する場合、Crを含む基材5のCr以外の例えばFeやNiなどの元素よりも、Crが優先的に酸化される酸化性雰囲気を意図する。好ましい選択酸化性雰囲気は、かかる雰囲気中の露点よりも10〜40℃高い温度に制御されたウェット水素雰囲気である。なお、選択酸化性雰囲気による熱処理以外にも、実用上の都合に合わせてめっき処理や蒸着処理などにより、上述した各種元素に係る酸化被膜層を形成できる。   The selective oxidizing atmosphere here means that when formed as a strong oxide film layer containing Cr, Cr is preferentially oxidized over elements such as Fe and Ni other than Cr of the base material 5 containing Cr. Intended for an oxidizing atmosphere. A preferred selective oxidizing atmosphere is a wet hydrogen atmosphere controlled at a temperature 10 to 40 ° C. higher than the dew point in the atmosphere. In addition to the heat treatment in the selective oxidizing atmosphere, the oxide film layers related to the various elements described above can be formed by plating treatment or vapor deposition treatment according to practical convenience.

また、密着層6を有する金属板2は、密着層6と基材5の間に、中間層7を有することができる。例えば、高性能であるものの高価なAu層を密着層6とする場合などでは、低コスト化の観点から、密着層6の厚さをより薄くすることがある。こうした場合は、雰囲気により基材5の表面が腐食されやすいので、中間層7を有すると有効である。また、密着層6を例えばめっき処理により基材5の表面上に形成する場合、めっき液が基材5の表面を腐食することがある。こうした場合も、予め中間層7を有することにより、基材5の表面の腐食が防止される。かかる中間層7は、例えば、Ni層、1〜30質量%のPを含むNi−P系合金層、Al層、Cr層、Ti層、あるいはAl合金層、Cr合金層、Ti合金などが使用できる。これら各層は、電解や無電解などのめっき処理、PVDやCVDなどの蒸着処理のほか、クラッド圧延などの圧接処理などにより形成できる。   Further, the metal plate 2 having the adhesion layer 6 can have an intermediate layer 7 between the adhesion layer 6 and the substrate 5. For example, when the high-performance but expensive Au layer is used as the adhesion layer 6, the thickness of the adhesion layer 6 may be reduced from the viewpoint of cost reduction. In such a case, since the surface of the base material 5 is easily corroded by the atmosphere, it is effective to have the intermediate layer 7. Further, when the adhesion layer 6 is formed on the surface of the substrate 5 by, for example, plating, the plating solution may corrode the surface of the substrate 5. Even in such a case, by having the intermediate layer 7 in advance, corrosion of the surface of the substrate 5 is prevented. The intermediate layer 7 is, for example, a Ni layer, a Ni—P alloy layer containing 1 to 30% by mass of P, an Al layer, a Cr layer, a Ti layer, or an Al alloy layer, a Cr alloy layer, a Ti alloy, or the like. it can. Each of these layers can be formed by plating treatment such as electrolysis or electroless, vapor deposition treatment such as PVD or CVD, or pressure contact treatment such as clad rolling.

本発明において環状の封止材部3は、図1に示すように、封止材部3を形成するための封止材を金属板2の表面上に配置した後、かかる封止材を加熱により溶融あるいは軟化させることにより金属板2の表面上に固着することができる。   In the present invention, as shown in FIG. 1, the annular sealing material portion 3 is configured such that after the sealing material for forming the sealing material portion 3 is disposed on the surface of the metal plate 2, the sealing material is heated. It can be fixed on the surface of the metal plate 2 by melting or softening.

環状の封止材部3に用いる封止材の材質は、例えば、低融点の金属材料や、軟化点が低いガラス材料あるいは樹脂材料が好ましい。融点や軟化点が低い封止材は、例えば加熱により溶融あるいは軟化してキャップ1とケースを接合する際に、キャップ1、ケース、およびケース内部に収納された電子部品への熱負荷を低減することができる。また、かかる封止材は、溶融後に凝固し、あるいは軟化後に硬化し、気密封止後のパッケージ内部の状態を維持するために重要であることから、良好な耐食性を有するとともに、凝固後あるいは硬化後の組織が緻密な構造であることが好ましい。   The material of the sealing material used for the annular sealing material portion 3 is preferably, for example, a low melting point metal material, a glass material or a resin material having a low softening point. A sealing material having a low melting point and softening point reduces the thermal load on the cap 1, the case, and the electronic components housed in the case when the cap 1 and the case are joined by melting or softening by heating, for example. be able to. In addition, such a sealing material is solidified after melting or hardened after softening, and is important for maintaining the state inside the package after hermetic sealing. It is preferable that the subsequent structure has a dense structure.

低融点の好ましい金属材料は、例えば、15〜80質量%のSnを含むAu−Sn系合金、Snを50質量%以上含むSn−Ag系合金、Sn−Cu系合金、Sn−Zn系合金や、Snが50質量%未満であるSn−In系合金、あるいはSn−Bi系合金などである。Au−Su系合金は、融点が250℃〜400℃程度と比較的低いため上述した熱負荷を比較的小さくでき、さらに優れた耐食性を有する。また、Au−Su系合金以外の上述した各合金も、融点が比較的低いので好ましい。なお、低融点の金属材料は、上述した各合金に含有されない他の元素、例えば、Ag、Cu、Zn、Al、In、Bi、Ti、Ag、Cu、Ge、Sb、Mg、Cr、Coなどを、本発明の作用効果を阻害しない限り含んでいてもよい。   Preferred metal materials having a low melting point include, for example, an Au—Sn alloy containing 15 to 80% by mass of Sn, an Sn—Ag alloy containing 50% by mass or more of Sn, an Sn—Cu alloy, an Sn—Zn alloy, and the like. , Sn—In alloy or Sn—Bi alloy whose Sn is less than 50% by mass. Since the Au—Su alloy has a relatively low melting point of about 250 ° C. to 400 ° C., the above-described heat load can be made relatively small, and further has excellent corrosion resistance. In addition, the above-described alloys other than the Au—Su alloy are also preferable because of their relatively low melting points. Note that the low melting point metal material includes other elements not contained in the above-described alloys, such as Ag, Cu, Zn, Al, In, Bi, Ti, Ag, Cu, Ge, Sb, Mg, Cr, Co, and the like. May be included as long as the effects of the present invention are not impaired.

軟化点が低く好ましいガラス材料は、例えば、V−P−TeO−FeなどのV−P−O系ガラスなどである。V−P−O系ガラスは、軟化点が300℃〜450℃程度と比較的低いため上述した熱負荷を比較的小さくでき、さらに優れた耐食性を有する。V−P−O系ガラス以外の上述した各ガラス材料も、軟化点が300℃〜500℃程度と比較的低いので好ましい。 Preferred glass material low softening point, for example, a V-P-O based glass, such as V 2 O 5 -P 2 O 5 -TeO-Fe 2 O 3. Since the VPO glass has a relatively low softening point of about 300 ° C. to 450 ° C., the above-described heat load can be made relatively small, and further has excellent corrosion resistance. Each glass material described above other than the VPO glass is also preferable because the softening point is relatively low at about 300 ° C to 500 ° C.

軟化点が低く好ましい樹脂材料は、例えば、エポキシ樹脂、フェノール樹脂、尿素樹脂、不飽和ポリエステル樹脂、ポリウレタン樹脂、あるいは熱硬化型ポリイミド樹脂などである。一般的な樹脂材料は、軟化点が50℃〜300℃程度であり、上述した低融点の金属材料や軟化点が低いガラス材料よりも低く、上述した熱負荷の低減には好適である。また、エポキシ樹脂は、樹脂系の中では耐熱温度が250℃〜300℃程度で比較的高く耐熱性があること、熱膨張係数がセラミックと同程度であることなど、好適である。   Preferred resin materials having a low softening point include, for example, epoxy resins, phenol resins, urea resins, unsaturated polyester resins, polyurethane resins, thermosetting polyimide resins, and the like. A general resin material has a softening point of about 50 ° C. to 300 ° C., which is lower than the low melting point metal material and the glass material having a low softening point, and is suitable for the reduction of the heat load described above. In addition, the epoxy resin is suitable because it has a heat resistance of about 250 ° C. to 300 ° C. and a relatively high heat resistance in the resin system, and has a thermal expansion coefficient comparable to that of ceramic.

環状の封止材部3に用いる封止材は、ペースト状のもの、はんだワッシャなど固形状のもの、あるいはめっき処理や蒸着処理などにより形成される膜状のものなどが使用できる。金属板2の表面上に環状の封止材部3を形成する際の封止材の配置方法は、例えば、マスクを用いたスクリーン印刷法、ディスペンサーを用いた塗布法、マスクを用いた振込整列法、あるいは吸着治具を用いた吸着整列法などが適用できる他、めっき処理や蒸着処理といった層形成法なども適用できる。また、かかる封止材は、環状の封止材部3を金属板2の表面上に形成する過程において一ヶ所以上の不連続部4を確実に形成させるために、配置する封止材の厚みや幅などの形状や配置間隔を適切に調整することが好ましい。   As the sealing material used for the annular sealing material portion 3, a paste-like material, a solid material such as a solder washer, or a film-like material formed by plating or vapor deposition can be used. The sealing material arrangement method when forming the annular sealing material part 3 on the surface of the metal plate 2 is, for example, a screen printing method using a mask, a coating method using a dispenser, or a transfer alignment using a mask. In addition to the method or the adsorption alignment method using an adsorption jig, a layer forming method such as plating or vapor deposition can be applied. In addition, such a sealing material has a thickness of the sealing material to be arranged in order to reliably form one or more discontinuous portions 4 in the process of forming the annular sealing material portion 3 on the surface of the metal plate 2. It is preferable to appropriately adjust the shape such as the width and the arrangement interval.

本発明において不連続部4は、環状の封止材部3が不連続になっている箇所として、金属板2の表面上に一ヶ所以上設けられる。かかる不連続部4は、キャップ1とケースを接合してパッケージを製造する過程でパッケージの内部と外部を連通し、最終的にはパッケージの気密封止性の向上や高真空化などに寄与する重要な構成である。かかる不連続部4が設けられる金属板2の表面上は、金属板2の他の表面上よりも、溶融あるいは軟化した封止材に対する濡れ性が低い領域8(図3参照)を有していることが好ましい。かかる領域8は、環状の封止材部3を金属板2の表面上に形成する過程において溶融あるいは軟化した封止材の過剰な濡れ拡がりを抑制し、隣接配置した封止材の濡れ拡がりによる合体を阻止し、一ヶ所以上の不連続部4を有する環状の封止材部3を確実に形成することができる。また、かかる領域8は、酸化雰囲気中でのレーザー照射や、濡れ拡がり防止材の塗布などにより形成できる。   In the present invention, at least one discontinuous portion 4 is provided on the surface of the metal plate 2 as a portion where the annular sealing material portion 3 is discontinuous. The discontinuous portion 4 communicates the inside and outside of the package in the process of manufacturing the package by joining the cap 1 and the case, and ultimately contributes to improving the hermetic sealing performance of the package and increasing the vacuum. This is an important configuration. The surface of the metal plate 2 provided with the discontinuous portion 4 has a region 8 (see FIG. 3) having a lower wettability with respect to the molten or softened sealing material than on the other surface of the metal plate 2. Preferably it is. Such a region 8 suppresses excessive wetting and spreading of the sealing material that has been melted or softened in the process of forming the annular sealing material portion 3 on the surface of the metal plate 2, and is due to the wetting and spreading of the sealing material that is disposed adjacently. It is possible to prevent the coalescence and to reliably form the annular sealing material portion 3 having one or more discontinuous portions 4. The region 8 can be formed by laser irradiation in an oxidizing atmosphere, application of a wetting and spreading preventing material, or the like.

上述した本発明の気密封止用キャップ(キャップ1)は、例えば、はんだワッシャなどの固形状の封止材を使用する場合は、図1に示すような金属板2の対向する長辺に沿って1つずつ、合計2つの不連続部4が金属板2の表面上に形成されるように配置する。その後、かかる固形状の封止材を加熱により溶融させた後に凝固させることで、図1に示すような環状の封止材部3に一ヶ所以上の不連続部4を有するキャップ1を製造することができる。   The hermetic sealing cap (cap 1) of the present invention described above, for example, along a long side facing the metal plate 2 as shown in FIG. 1 when a solid sealing material such as a solder washer is used. The discontinuous portions 4 are arranged so that a total of two discontinuous portions 4 are formed on the surface of the metal plate 2. Then, the cap 1 which has one or more discontinuous parts 4 in the cyclic | annular sealing material part 3 as shown in FIG. 1 is manufactured by making it solidify after melting this solid sealing material by heating. be able to.

また、例えば、Au−Sn系合金やV−P−O系ガラスやエポキシ樹脂などのペースト状の封止材を使用する場合は、メタルマスクを用いて図1に示すような環状の封止材部3に対応する表面のみを露出した金属板2の表面上にかかるペースト状の封止材を印刷あるいは塗布する。その後、かかるペースト状の封止材を加熱により溶融あるいは軟化させた後に凝固あるいは硬化(樹脂系の場合は仮硬化)させることで、図1に示すような環状の封止材部3に一ヶ所以上の不連続部4を有するキャップ1を製造することができる。   Further, for example, when using a paste-like sealing material such as Au—Sn alloy, V—P—O glass or epoxy resin, an annular sealing material as shown in FIG. 1 using a metal mask. The paste-like sealing material is printed or applied on the surface of the metal plate 2 where only the surface corresponding to the portion 3 is exposed. Thereafter, the paste-like sealing material is melted or softened by heating and then solidified or cured (temporarily cured in the case of a resin system), so that it is provided in one place on the annular sealing material portion 3 as shown in FIG. The cap 1 having the above discontinuous portion 4 can be manufactured.

なお、Au−Sn系合金などの低融点の金属材料系の封止材を使用する場合は、封止材の密着性を劣化させる表面酸化被膜が形成され難いAu層などの密着層6を有する金属板2の適用が好ましく、250℃〜400℃の真空あるいは不活性ガス雰囲気中で加熱することが好ましい。また、V−P−O系ガラスなどの軟化点が低いガラス系の封止材を使用する場合は、封止材の密着性を高めるCrを含む酸化被膜などの密着層6を有する金属板2の適用が好ましく、300℃〜450℃の真空、不活性ガス、あるいは大気雰囲気中で加熱することが好ましい。また、エポキシ樹脂などの樹脂系の封止材を使用する場合は、封止材の密着性を高める表面粗さが大きい表面(粗面)を有する金属板2の適用が好ましく、軟化点よりも低温の真空、不活性ガス、あるいは大気雰囲気中で加熱することが好ましい。   In the case of using a low-melting-point metal material-based sealing material such as an Au—Sn alloy, the adhesive layer 6 such as an Au layer is difficult to form a surface oxide film that deteriorates the adhesion of the sealing material. Application of the metal plate 2 is preferable, and heating in a vacuum of 250 ° C. to 400 ° C. or in an inert gas atmosphere is preferable. Moreover, when using the glass-type sealing material with a low softening point, such as VPO-type glass, the metal plate 2 which has contact | adherence layers 6, such as an oxide film containing Cr which improves the adhesiveness of a sealing material. Is preferable, and it is preferable to heat in a vacuum of 300 ° C. to 450 ° C., an inert gas, or an air atmosphere. Moreover, when using resin-type sealing materials, such as an epoxy resin, application of the metal plate 2 which has the surface (rough surface) with a large surface roughness which raises the adhesiveness of a sealing material is preferable, and it is rather than a softening point. It is preferable to heat in a low temperature vacuum, inert gas, or air atmosphere.

本発明において、環状の封止材部3に有する不連続部4が形成される金属板2の表面の領域8(図3参照)は、環状の封止材部3を構成する封止材が溶融あるいは軟化した際の濡れ性が、良過ぎず悪過ぎない適切な状態となる表面性状であることが好ましい。濡れ性が良過ぎずとは、不連続部4において対向する封止材部3の両端が互いに濡れ拡がる際に、領域8の上で互いに接触することなく不連続部4を保持することができることを意図する。また、濡れ性が悪過ぎずとは、キャップ1とケースを接合して領域8で不連続となる不連続部10(図4参照)を形成し、その後に不連続部10を埋設して第二封止材部12(図5参照)を形成する際に、第二封止材部12を構成するための封止材が領域8の上で溶融あるいは軟化して適度に密着することができることを意図する。なお、溶融した封止材に対する前記領域8の濡れ性が良過ぎると、不連続部4が所望の寸法よりも小さく形成されたり、閉塞してしまう可能性がある。また、前記領域8の濡れ性が悪過ぎると、最終的に不連続部4を埋設する際に密着性が得られず、パッケージの気密性を損なう可能性がある。つまり、金属板2の表面の領域8は、不連続部4を有する環状の封止部材3が溶融凝固されることにより、キャップ1とケースを接合した際に不連続部10が確実に形成でき、その後に不連続部10が確実に埋設できる表面性状を有することが好ましい。   In the present invention, the region 8 (see FIG. 3) on the surface of the metal plate 2 where the discontinuous portion 4 included in the annular sealing material portion 3 is formed is the sealing material constituting the annular sealing material portion 3. It is preferable that the surface property is an appropriate state in which the wettability when melted or softened is neither too good nor too bad. “Wettability is not too good” means that the discontinuous portions 4 can be held without contacting each other on the region 8 when both ends of the opposing sealing material portions 3 in the discontinuous portions 4 spread out. Intended. Further, if the wettability is not too bad, the cap 1 and the case are joined to form a discontinuous portion 10 (see FIG. 4) that becomes discontinuous in the region 8, and then the discontinuous portion 10 is buried and the discontinuous portion 10 is buried. When forming the two sealing material portions 12 (see FIG. 5), the sealing material for constituting the second sealing material portion 12 can be melted or softened on the region 8 and can be appropriately adhered. Intended. In addition, when the wettability of the said area | region 8 with respect to the fuse | melting sealing material is too good, the discontinuous part 4 may be formed smaller than a desired dimension, or it may block | close. Further, if the wettability of the region 8 is too bad, the adhesiveness cannot be obtained when the discontinuous portion 4 is finally buried, and the airtightness of the package may be impaired. That is, in the region 8 on the surface of the metal plate 2, the annular sealing member 3 having the discontinuous portion 4 is melted and solidified, so that the discontinuous portion 10 can be reliably formed when the cap 1 and the case are joined. It is preferable that the discontinuous portion 10 has a surface property that can be reliably embedded thereafter.

かかる領域8の表面性状を適切な状態にする処理は、Au−Sn系合金などの低融点の金属材料系の封止材を使用する場合は、酸化雰囲気中で、金属板2の表面にYVOを媒体とするレーザー光を照射し、表面酸化層を形成することが好ましい。例えば、金属板2がAu層などの密着層6とNi層などの中間層7を有する場合は、酸化性雰囲気中で前記レーザー光の照射により密着層6を除去し、露出した中間層7に表面酸化層を形成することができる。その際、前記レーザー光を照射する出力や時間や範囲や、前記酸化性雰囲中の酸化濃度などの条件を適切にすることにより、領域8は所望の表面性状を有することができる。 The treatment for bringing the surface property of the region 8 into an appropriate state is performed when YVO is applied to the surface of the metal plate 2 in an oxidizing atmosphere when a low melting point metal material type sealing material such as an Au—Sn alloy is used. It is preferable to form a surface oxide layer by irradiating a laser beam having 4 as a medium. For example, when the metal plate 2 has an adhesion layer 6 such as an Au layer and an intermediate layer 7 such as a Ni layer, the adhesion layer 6 is removed by irradiation with the laser light in an oxidizing atmosphere, and the exposed intermediate layer 7 is formed. A surface oxide layer can be formed. At this time, the region 8 can have a desired surface property by appropriately adjusting the conditions such as the output, time, and range of the laser light irradiation and the oxidation concentration in the oxidizing atmosphere.

また、V−P−O系ガラスなどの軟化点が低いガラス系の封止材を使用する場合は、金属板2の前記領域8に対応する表面上に、例えばシロキサンを主成分として適切な添加剤を含むガラス付着防止材を塗布することが好ましい。ガラス付着防止材に含まれるシロキサンは領域8の濡れ性を低下させるため、軟化して濡れ拡がった低融点ガラスの領域8への侵入を抑制し、適切な添加剤は前記シロキサンの作用を適度に弱めるため、領域8の濡れ性を適切に制御することができる。なお、ガラス付着防止材は、上述したシロキサンに限らず、これと同等の特性を有するものが主成分であってもよい。   In addition, when a glass-based sealing material having a low softening point such as VPO glass is used, an appropriate addition of, for example, siloxane as a main component on the surface corresponding to the region 8 of the metal plate 2. It is preferable to apply a glass adhesion preventing material containing an agent. Since the siloxane contained in the glass adhesion preventing material lowers the wettability of the region 8, the softening and wetting and spreading of the low-melting-point glass into the region 8 is suppressed, and an appropriate additive moderately reduces the action of the siloxane. In order to weaken, the wettability of the area | region 8 can be controlled appropriately. In addition, the glass adhesion preventing material is not limited to the above-described siloxane, and the main component may be one having the same characteristics as this.

また、エポキシ樹脂などの樹脂系の封止材を使用する場合は、金属板2の領域8に対応する表面上に、樹脂付着防止材を塗布することが好ましい。かかる樹脂付着防止材は、例えばシリコーン系やフッ素系のものが好ましいが、これと同等の特性を有するものも使用できる。また、樹脂付着防止材に適切な添加剤を含むことにより、領域8の濡れ性を適切に制御することができる。   Moreover, when using resin-type sealing materials, such as an epoxy resin, it is preferable to apply | coat a resin adhesion prevention material on the surface corresponding to the area | region 8 of the metal plate 2. FIG. Such a resin adhesion preventing material is preferably, for example, a silicone-based or fluorine-based material, but a material having equivalent characteristics can also be used. Moreover, the wettability of the area | region 8 can be appropriately controlled by including an appropriate additive in the resin adhesion preventing material.

次に、上述したキャップ1を用いた本発明のパッケージおよびその製造方法について、図4と図5を参照して説明する。
図5に示す気密封止後のパッケージ13は、角形のキャップ1と、内部に電子部品(図示せず)が収納されたケース9とが、封止材を用いた接合により形成されている。図4に示す気密封止前のパッケージ13aにおいて、角形環状の第一封止部11は、キャップ1を構成する金属板2の表面上の角形環状の封止材部3をケース9の接合面上に重ね合わせた状態で、角形環状の封止材部3を構成する封止材を溶融あるいは軟化させた後に凝固あるいは硬化(樹脂系の場合は仮硬化)させることにより形成することができる(第一封止工程)。この際に、キャップ1を構成する角形環状の封止材部3に有する不連続部4は、溶融あるいは軟化した封止材の濡れ拡がりが領域8(図3参照)により抑制されて保持され、封止材により埋設されない不連続部10として形成される。かかる不連続部10は、パッケージ13aの内部と外部を連通するため、かかる構成を形成するキャップ1とケース9の接合時にガスが発生しても内部への残留が実質的になくなる。
Next, the package of the present invention using the cap 1 described above and the manufacturing method thereof will be described with reference to FIGS.
The hermetically sealed package 13 shown in FIG. 5 includes a square cap 1 and a case 9 in which an electronic component (not shown) is accommodated by bonding using a sealing material. In the package 13 a before airtight sealing shown in FIG. 4, the rectangular annular first sealing portion 11 is formed by connecting the rectangular annular sealing material portion 3 on the surface of the metal plate 2 constituting the cap 1 to the bonding surface of the case 9. It can be formed by melting or softening the sealing material constituting the rectangular annular sealing material part 3 in a state of being overlaid, and then solidifying or curing (preliminarily curing in the case of a resin system) ( First sealing step). At this time, the discontinuous portion 4 included in the rectangular annular sealing material portion 3 constituting the cap 1 is held by the area 8 (see FIG. 3) in which wetting and spreading of the molten or softened sealing material is suppressed, It is formed as a discontinuous portion 10 that is not embedded by the sealing material. Since the discontinuous portion 10 communicates between the inside and the outside of the package 13a, even if gas is generated when the cap 1 and the case 9 forming such a structure are joined, the residue does not substantially remain inside.

また、かかる不連続部10は、最終的に図5に示すパッケージ13を形成する際に埋設される。具体的には、最終的にパッケージ13aの内部を気密封止する過程で、上述したように図4に示す第一封止部11に有する不連続部10が、新たな封止材を用いて埋設され、図5に示す第二封止部12が形成される(第二封止工程)。したがって、第二封止部12に用いる封止材は、加熱により溶融あるいは軟化した際に、第一封止部11を構成する封止材と好適に馴染み易い、例えば第一封止部11を構成する封止材と同等の材質であることが好ましい。なお、同様の効果を奏するいずれの封止材も使用できる。また、第二封止部12を構成する封止材の形態は、溶媒を含むペースト状の封止材も使用できるが、溶媒を含まない固形状であることが好ましい。固形状の封止材は、加熱により溶融あるいは軟化した際に溶媒に起因するガスが発生し難い。そのため、外部に連通する不連続部10によりガスが排出されることに加えて、パッケージ13aの内部(最終的にはパッケージ13の内部)へのガスの残留が一層抑制される。   Further, the discontinuous portion 10 is buried when the package 13 shown in FIG. 5 is finally formed. Specifically, in the process of finally hermetically sealing the inside of the package 13a, the discontinuous part 10 included in the first sealing part 11 shown in FIG. 4 as described above uses a new sealing material. The second sealing part 12 shown in FIG. 5 is formed (second sealing step). Therefore, when the sealing material used for the second sealing portion 12 is melted or softened by heating, the sealing material constituting the first sealing portion 11 is preferably easily adapted to, for example, the first sealing portion 11. It is preferable that the material is the same as the constituent sealing material. Any sealing material that exhibits the same effect can be used. Moreover, although the paste-form sealing material containing a solvent can also be used for the form of the sealing material which comprises the 2nd sealing part 12, it is preferable that it is a solid form which does not contain a solvent. The solid sealing material hardly generates a gas due to the solvent when melted or softened by heating. Therefore, in addition to the gas being discharged by the discontinuous portion 10 communicating with the outside, the remaining of the gas inside the package 13a (finally inside the package 13) is further suppressed.

前記第一封止工程と前記第二封止工程との間において、つまり、キャップ1とケース9との接合における最終的な気密封止前(図4参照)に、パッケージ13aの内部と外部を連通する不連続部10を利用し、所望のレベルの高真空化や、アルゴンガスなどの不活性ガス雰囲気化や、酸素ガスなどの活性ガス雰囲気化などの処理を実施することができる。同様に、かかる不連続部10を利用し、キャップ1とケース9を接合した後の気密封止前のパッケージ13aの内部の外観検査を実施でき、後工程への不良品流出を抑制することができる。   Between the first sealing step and the second sealing step, that is, before the final hermetic sealing in the joining of the cap 1 and the case 9 (see FIG. 4), the inside and the outside of the package 13a are By using the discontinuous portion 10 that communicates, it is possible to perform a process such as a high vacuum at a desired level, an inert gas atmosphere such as argon gas, or an active gas atmosphere such as oxygen gas. Similarly, using the discontinuous portion 10, it is possible to carry out an appearance inspection of the inside of the package 13 a before airtight sealing after joining the cap 1 and the case 9, and to suppress the outflow of defective products to the subsequent process. it can.

また、上述したようにキャップ1の金属板2の表面の領域8の表面性状を適切な状態にする処理を行うことにより、キャップ1とケ−ス9の接合において角形環状の封止材部3が加熱により溶融あるいは軟化した際に不連続部4が埋設される現象が容易に抑制され、その結果、パッケージ13aにおいて不連続部10を容易に形成することができる。また、キャップ1とケース9との接合により、たとえ不連続部10が閉塞するようなことがあったとしても、前記領域8が適切な表面性状であれば、かかる不連続部10の閉塞に要する時間を十分に長くすることができる。そのため、不連続部が短時間で閉塞しやすい特許文献1に開示される2重構造の封止材部とは異なり、封止材の溶融あるいは軟化により発生するガスのパッケージ13aの内部(最終的にはパッケージ13の内部)への残留を抑制しやすい。   In addition, as described above, by performing the process of bringing the surface property of the region 8 on the surface of the metal plate 2 of the cap 1 into an appropriate state, the rectangular annular sealing material portion 3 is joined at the joint between the cap 1 and the case 9. The phenomenon that the discontinuous portion 4 is embedded when the material is melted or softened by heating is easily suppressed, and as a result, the discontinuous portion 10 can be easily formed in the package 13a. Further, even if the discontinuous portion 10 may be blocked due to the joining of the cap 1 and the case 9, it is necessary to close the discontinuous portion 10 as long as the region 8 has an appropriate surface property. The time can be long enough. Therefore, unlike the double-layer sealing material portion disclosed in Patent Document 1 in which the discontinuous portion easily closes in a short time, the inside of the gas package 13a generated by melting or softening of the sealing material (final) It is easy to suppress the residue in the inside of the package 13.

以上述べたように、金属板2の表面上に不連続部4を有して形成された環状の封止材部3を有する本発明のキャップ1は、内部に電子部品が収納されたケース9との接合により、不連続部10を含む環状に接合された第一封止部11を有する接合構造を形成することができる。かかる不連続部10を有する接合構造を使用し、パッケージ13の内部の高真空化、不活性ガス雰囲気化、活性ガス雰囲気化などの処理や、図4に示すパッケージ13aの内部の外観検査を実施することができる。   As described above, the cap 1 of the present invention having the annular sealing material portion 3 formed with the discontinuous portion 4 on the surface of the metal plate 2 has a case 9 in which an electronic component is housed. The joining structure which has the 1st sealing part 11 joined cyclically | annularly including the discontinuous part 10 can be formed by joining. Using the joining structure having such a discontinuous portion 10, the inside of the package 13 is subjected to processing such as high vacuum, inert gas atmosphere, and active gas atmosphere, and the appearance inspection inside the package 13a shown in FIG. can do.

1.キャップ、2.金属板、3.封止材部、4.不連続部、5.基材、6.密着層、7.中間層、8.領域9.ケース、10.不連続部、11.第一封止部、12.第二封止部、13.パッケージ、13a.パッケージ 1. Cap, 2. 2. metal plate; 3. Sealing material part Discontinuity, 5. Base material, 6. 6. adhesion layer; Intermediate layer, 8. Region 9. Case, 10 Discontinuities, 11. First sealing portion, 12. Second sealing portion, 13. Package, 13a. package

Claims (5)

金属板の表面上に一ヶ所以上の不連続部を有する環状の封止材部を備える、気密封止用キャップ。   An airtight sealing cap comprising an annular sealing material portion having one or more discontinuous portions on the surface of a metal plate. 前記不連続部における前記金属板の表面は、前記封止材部の溶融により生成される封止材に対する濡れ性が、前記金属板の他の表面よりも低い領域を有する、請求項1に記載の気密封止用キャップ。   The surface of the said metal plate in the said discontinuous part has an area | region where the wettability with respect to the sealing material produced | generated by the fusion | melting of the said sealing material part is lower than the other surface of the said metal plate. Cap for hermetic sealing. 金属板の表面上に一ヶ所以上の不連続部を有する環状の封止材を配置し、加熱により前記封止材を溶融させた後に凝固させることにより、前記金属板の表面上に一ヶ所以上の不連続部を有する環状の封止材部を形成する、気密封止用キャップの製造方法。   Arranging an annular sealing material having one or more discontinuous portions on the surface of the metal plate, melting the sealing material by heating and then solidifying it, thereby providing one or more locations on the surface of the metal plate The manufacturing method of the cap for airtight sealing which forms the cyclic | annular sealing material part which has a discontinuous part. 請求項1または2に記載の気密封止用キャップと、内部に電子部品が収納された電子部品収納部材とが接合された電子部品収納パッケージであって、
前記気密封止用キャップと電子部品収納部材との接合構造は、前記不連続部を有しつつ環状に接合された第一封止部と、前記不連続部を埋設するように接合された第二封止部とを有する、電子部品収納パッケージ。
An electronic component storage package in which the hermetic sealing cap according to claim 1 and an electronic component storage member in which an electronic component is stored is joined.
The sealing structure of the hermetic sealing cap and the electronic component housing member includes a first sealing portion that is annularly joined while having the discontinuous portion, and a first sealing portion that is joined so as to embed the discontinuous portion. An electronic component storage package having two sealing portions.
気密封止用キャップと、内部に電子部品が収納された電子部品収納部材とが接合された電子部品収納パッケージの製造方法であって、
金属板と第一封止材を準備し、前記第一封止材を用いて前記金属板の表面上に一ヶ所以上の不連続部を有する環状の第一封止材部を形成する気密封止用キャップ形成工程と、
内部に電子部品が収納された電子部品収納部材に対して前記気密封止用キャップを配置した後に前記第一封止材部を溶融させた後に凝固させて、一ヶ所以上の不連続部を有する環状の第一封止部を形成する第一封止工程と、
第二封止材を用いて前記不連続部を埋設して第二封止部を形成することにより前記気密封止用キャップと電子部品収納部材とを封止する第二封止工程とを含む、電子部品収納パッケージの製造方法。
A manufacturing method of an electronic component storage package in which an airtight sealing cap and an electronic component storage member in which an electronic component is stored are joined,
Air-sealing for preparing a metal plate and a first sealing material and forming an annular first sealing material portion having one or more discontinuous portions on the surface of the metal plate using the first sealing material A stop cap forming step;
After disposing the hermetic sealing cap with respect to the electronic component storage member in which the electronic component is stored, the first sealing material portion is melted and then solidified to have one or more discontinuous portions. A first sealing step for forming an annular first sealing portion;
A second sealing step of sealing the hermetic sealing cap and the electronic component housing member by embedding the discontinuous portion using a second sealing material to form a second sealing portion. , Manufacturing method of electronic component storage package.
JP2015182444A 2015-09-16 2015-09-16 Hermetic sealing cap and manufacturing method therefor, electronic component housing package and manufacturing method therefor Pending JP2017059649A (en)

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