JP2017058267A - Reflection type component analysis device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an optical unit that allows reflection light and reference light to be inexpensively guided without use of an optical fiber in a reflection type component analysis device.SOLUTION: A component analysis device comprises: a measurement unit 2 that loads an analysis object; an illumination unit 10 that irradiates irradiation light; a main body that becomes an irradiation optical path; a light reception unit 26 that receives reflection light and reference light; a reflection light optical path pipe 13 that optically guides the reflection light; a reference light optical path pipe 16 that optically guides the reference light; an optical path switch unit 5 that connects to the reflection light optical path pipe or the reference light optical path pipe, and switches the light to be guided to the reflection light or the reference light to guide the light to the light reception unit; and an analysis unit that analyzes a component to be contained in the analysis object. The reflection light optical path pipe and the reference light optical path pipe are disposed in the main body, and the reference light optical path pipe is provided at a position between the reflection light optical path pipe and the illumination unit. In between the reflection light optical path pipe and the illumination unit, a reference light reflector 14 is provided that causes the reference light to be reflected toward an opening part on a main body side of the reference light optical path pipe.SELECTED DRAWING: Figure 4

Description

The present invention relates to a reflection-type component analyzer that determines the component of an analysis object by measuring the amount of reflected light from the analysis object such as grain.

Conventionally, in a reflection-type component analyzer, in order to receive reflected light from an analysis object and obtain a component of the analysis object, the amount of the reflected light and irradiation light irradiated toward the analysis object The absorbance is obtained by measuring the amount of reference light.

For example, the component analyzer described in Patent Document 1 uses an optical fiber to measure each light quantity of reflected light and reference light (reference light) with a single light receiving unit. It is guided to. According to this method, it is possible to easily guide the reflected light and the reference light by using an optical fiber. However, since the optical fiber is used, not only the component cost increases, but also the apparatus There is a problem that the production cost becomes high, such as high mounting accuracy is required at the time of assembly, and a dedicated jig is required.

JP 2000-292344 A

Therefore, an object of the present invention is to provide an optical unit capable of guiding reflected light and reference light at low cost without using an optical fiber in a reflection type component analyzing apparatus.

In order to achieve the above object, the present invention provides a measurement unit for placing an analysis object, an illumination unit for irradiating the analysis object placed on the measurement unit, and an illumination unit for irradiating the irradiation light. A main body serving as an irradiation light path that guides the light to the measurement unit, a reflected light reflected from the analysis object, and a light receiving unit that receives the reference light that is the irradiation light that is not reflected by the analysis object; and the reflected light Positioned between a reflected light path tube that guides light toward the light receiving unit, a reference light path tube that guides the reference light toward the light receiving unit, and the light receiving unit, the reflected light path tube, and the reference light path tube And a light that is formed of a rotatable disk and that is connected to the reflected light path tube or the reference light path tube by rotating any of the plurality of light paths provided by rotating the disk. An optical path switching unit that switches the reflected light or the reference light to the light receiving unit And an analysis unit that analyzes a component contained in the analysis object based on the amount of light received by the light receiving unit, wherein the reflected light path tube is disposed in the main body and has an analysis object at one end. An opening for receiving the reflected light reflected from the light is provided, an opening opened toward the optical path switching unit is provided at the other end, and the reflected light reflects the reflected light toward the optical path switching unit. A reflector is provided, and the reference optical path tube is disposed in the main body at a position between the reflective optical path tube and the illumination unit, and the reference light is incident on one end in the main body. A body-side opening that opens is provided, and an opening that opens toward the optical path switching unit is provided at the other end. Between the reflected light path tube and the illuminating unit, the reference light is transmitted to the reference light path tube. Reference light reflector for reflecting toward the main body side opening Provided, it was a technical take steps stuff that.

According to a second aspect of the present invention, the optical path switching unit includes a first optical path that linearly guides the reflected light to the light receiving unit, and a plurality of reflectors bending the optical path by a plurality of reflectors. A second optical path for guiding light to the light receiving portion is provided, and the reflecting surfaces of the plurality of reflectors are conical surfaces.

According to a third aspect of the present invention, the optical path switching unit includes a first optical path that linearly guides the reference light to the light receiving unit, and a plurality of reflectors bending the optical path by a plurality of reflectors. A second optical path for guiding light to the light receiving portion, and the reflecting surfaces of the plurality of reflectors are conical surfaces.

According to a fourth aspect of the present invention, the number of the plurality of reflectors is two, and the second optical path is bent twice.

The invention according to claim 5 is characterized in that the reference optical path tube is arranged at a position overlapping the reflected optical path tube with respect to the traveling direction of the irradiation light directed toward the analysis object.

According to a sixth aspect of the present invention, the optical path switching unit is provided with a third optical path for guiding the reference light to the light receiving unit by bending the optical path a plurality of times, and in the third optical path, The technical means of providing a reference plate through which the reference light passes was taken.

According to the present invention, the measuring unit for placing the analysis object, the illumination unit for irradiating the irradiation light, the main body having the irradiation light path inside, and the light reception for receiving the reflected light and the reference light reflected from the analysis object. And a reflection optical path tube for guiding the reflected light toward the light receiving unit, a reference optical path tube for guiding the reference light toward the light receiving unit, and a rotatable disk, and rotating the disk Thus, any one of a plurality of optical paths provided on the disc is connected to a reflected light path tube or a reference light path tube, and light to be guided is switched to reflected light or the reference light and guided to the light receiving unit. The reflected light path tube is disposed in the main body, and is provided with an opening through which reflected light reflected from the analysis object is incident at one end and directed toward the optical path switching unit at the other end. An opening is provided, and the reflected light is directed inside the optical path switching unit. And the reference light path tube is disposed in the main body at a position between the reflected light path tube and the illumination unit so that the reference light is incident on one end. A main body side opening that opens in the main body, an opening that opens toward the optical path switching unit is provided at the other end, and the reference light is passed between the reflected light path tube and the illumination unit. Since the reference light reflector that reflects toward the main body side opening of the reference light path tube is provided, reflected light is guided toward the light receiving portion by the reflected light path tube, and the reference light path tube The reference light is guided toward the light receiving unit by the reference light reflector. Therefore, the reflected light and the reference light can be received by the light receiving unit without using a light guide component such as an optical fiber, so that the component cost can be reduced and the assembly of the device is facilitated. Become.

According to the second aspect of the present invention, the optical path switching unit guides the reflected light linearly to the light receiving unit and guides the reference light to the light receiving unit by bending the optical path a plurality of times. A second optical path is provided, and a plurality of reflectors are provided on the second optical path, and the reference light is guided to the light receiving unit by bending the optical path of the reference light by the plurality of reflectors. And, since the reflecting surface of the plurality of reflectors is a conical surface, when the disk of the optical path switching unit is rotated and the second optical path and the reference optical path tube are aligned and connected, Even if the connection position (angle) is deviated, the angle at which the reference light is reflected by the reflector can always be kept constant. For this reason, it is possible to prevent a decrease in measurement accuracy caused by the deviation, without using high-precision driving means such as a stepping motor that rotates the disk of the optical path switching unit, There is an effect that the cost can be reduced.

According to the third aspect of the present invention, the optical path switching unit guides the reference light linearly to the light receiving unit and the reflected light to the light receiving unit by bending the optical path a plurality of times. A second optical path is provided, and a plurality of reflectors are provided on the second optical path, and the reference light is guided to the light receiving unit by bending the optical path of the reference light by the plurality of reflectors. And since the reflecting surface of the plurality of reflectors is a conical surface, when the disk of the optical path switching unit is rotated and the second optical path and the reflected optical path tube are aligned and connected, Even if the connection position (angle) is deviated, the angle at which the reflected light is reflected by the reflector can always be kept constant. For this reason, it is possible to prevent a decrease in measurement accuracy caused by the deviation, without using high-precision driving means such as a stepping motor that rotates the disk of the optical path switching unit, There is an effect that the cost can be reduced.

According to the fourth aspect of the present invention, since the number of the plurality of reflectors is two, only the reference light is bent twice in the second optical path, and the reference light is shared by the light receiving unit common to the reflected light. It can receive light. Therefore, it is not necessary to make the optical part of the apparatus complicated, and the structure can be simplified, so that the apparatus can be downsized.

According to the fifth aspect of the present invention, since the reference optical path tube is arranged at a position overlapping the reflected optical path tube with respect to the traveling direction of the irradiation light directed toward the analysis object, the two optical path tubes block the reference optical path tube. It is possible to minimize the amount of irradiation light to the analysis target. Therefore, it is possible to irradiate the analysis object with a sufficient amount of irradiation light for measurement. Further, even if a part of the reflected light from the analysis object enters the irradiation optical path, the reflected light is blocked by the reflected optical path tube, so that it is effective to prevent the reflected light from entering the reference optical path tube.

According to the sixth aspect of the present invention, the optical path switching unit is provided with a third optical path for guiding the reference light to the light receiving unit by bending the optical path a plurality of times, and the third optical path includes the third optical path. Since the reference plate through which the reference light passes is provided, it is possible to measure the reference light used when the component analyzer is calibrated by simply guiding the reference light to the light receiving unit through this third optical path. Therefore, the reference light can be measured without complicating the assembly of the apparatus and without increasing the size of the apparatus.

According to the invention of claim 2, the optical path switching unit includes a first optical path for linearly guiding the reflected light to the light receiving unit, and bending the reference light by bending the optical path a plurality of times. A second optical path that guides light to the light receiving unit, and a plurality of reflectors are provided in the second optical path, and the light receiving unit is configured by bending the plurality of optical paths of the reference light by the plurality of reflectors. The reference light is guided, and the reflecting surfaces of the plurality of reflectors are conical surfaces, so when the disk is rotated and the second optical path and the reference optical path are connected, Even if the connection position (angle) is deviated, the angle at which the reference light is reflected can always be kept constant. For this reason, it is possible to prevent a decrease in measurement accuracy caused by this deviation and reduce component costs without using a high-precision driving means such as a stepping motor for rotating the optical path switching unit. There is an effect.

Further, according to the invention described in claim 3, since the number of the plurality of reflectors is two, the reference light is bent twice in the second optical path, and the light receiving unit common to the reflected light is used. Reference light can be received, and the apparatus can be downsized.

According to the fourth aspect of the present invention, the optical path switching unit is provided with a third optical path that guides the reference light to the light receiving unit by bending the optical path a plurality of times. Since the reference plate through which the reference light passes is provided, the reference light used for calibration of the component analyzer can be measured without complicating the assembly of the device and without increasing the size of the device. did.

It is a perspective view of the component analyzer of this invention. It is a perspective view of the component analyzer of this invention. It is a top view of the component analyzer of this invention. It is an AA line schematic sectional drawing of FIG. It is a BB schematic sectional drawing of FIG. It is a figure for demonstrating the state which connected the reference optical path to the 2nd optical path. It is a figure for demonstrating the state which connected the reference optical path to the 3rd optical path. It is a figure for demonstrating a reflected light path and a reference light path. It is a figure which shows the disc seen from the direction of the arrow X of FIG. It is a figure which shows the disc seen from the direction of the arrow Y of FIG. It is a figure which shows the disc seen from the direction of the arrow Z of FIG. It is a perspective view of a disc.

Embodiments of the present invention will be described with reference to the drawings. 1 and 2 are perspective views of a reflection type component analyzer 1 according to an embodiment of the present invention. FIG. 1 shows a state in which an analysis object is placed on the measurement unit 2. The component analyzer performs measurements by filling a container 3 having a transparent bottom surface for measurement with grains such as rice and wheat. When the analysis object is a grain, the component to be measured is protein or the like. FIG. 2 shows a state where no analysis object is placed.

4 is a schematic cross-sectional view taken along the line AA in FIG. 3, and FIG. 5 is a schematic cross-sectional view taken along the line BB in FIG. An illumination unit 10 that irradiates light toward the upper measurement unit 2 is disposed below the main body 4. The illuminating unit 10 is preferably an illuminating unit such as a halogen lamp that is used in an ordinary spectroscopic analyzer. The measuring unit 2 includes a reflection optical path tube 13 through which reflected light of the analysis object passes in the vicinity of the center, and an irradiation light path 11 through which the light irradiating the analysis object passes around the reflection light path tube 13 is arranged. It is. In the main body 4, there is an irradiation light path 11 that guides the irradiation light from the irradiation unit 10 to the measurement unit 4. FIG. 8 is a view for explaining the structures of the reflected light path tube 13 and the reference light path tube 15a. A support plate 17 is provided in the irradiation light path 11, and the irradiation light irradiated from the illumination unit 10 passes through the opening 17 a of the support plate 17. The reflected light path tube 13 is provided with a reflected light reflector 16, and the reflected light is reflected in the direction indicated by the arrow in FIG. 4 and guided to the optical path switching unit 5. One end of the reflected light path tube 13 has an opening connected to the measuring unit 2 and receives reflected light, and the other end is connected to the cover 5 a of the optical path switching unit 5. A disc 5b is disposed in the cover 5a. The reflected light path tube 13 is formed by a pipe 13a and a pipe 13b, and an opening 19a is provided at one end and an opening 19b is provided at the other end.

FIG. 4 shows a state in which the reflection optical path tube 13 is connected to the first optical path 22 of the disk 5b. The connection here means a state in which the opening of the reflection optical path tube 13 and the opening of the first optical path 22 overlap each other in position. FIG. 9 is a diagram showing the disk 5b as viewed from the direction of the arrow X in FIG. The first optical path 22 is formed by a first through hole 21, and the first through hole 21 penetrates the disk 5 b in the same direction as the pipe 13 b of the reflective optical path tube 13. The disc 5 b is connected to the rotating shaft 8 b and rotates by driving the motor 8. FIG. 12 is a perspective view of the disk 5b. As the motor 8, a stepping motor or the like that can control the angle at the time of stop is used, and the positions of the first through hole 21 and the second through hole 23 at the time of stop can be controlled. In addition, the light receiving unit 6 is disposed at a position facing the reflection optical path tube 13 with the optical path switching unit 5 interposed therebetween, and the analysis is performed through the pipe 13b of the reflection optical path tube 13 and the first optical path 22 linearly. The reflected light from the object enters the light receiving unit 6 through the incident window 25 and is received by the sensor 26 disposed therein. A silicon photodiode or the like can be used for the sensor 26. In addition, it is desirable to change the sensor 26 suitably according to the wavelength range of the reflected light to receive.

FIG. 6 is a schematic cross-sectional view taken along the line AA in FIG. 3. FIG. 6 shows a state in which the reference optical path tube 15a is connected to the second optical path 24 of the disk 5b. The connection here means a state in which the opening of the reference optical path tube 15a and the opening of the second optical path 24 overlap each other. FIG. 10 is a diagram showing the disk 5b viewed from the direction of the arrow Y in FIG. Part of the light emitted from the illumination unit 10 is reflected as reference light in the direction indicated by the arrow by the reference light reflector 14 and passes through the reference light path tube 15a formed by a pipe. One end of the reference light path tube 15a is opened in the main body 4, and a main body side opening 15b is provided. The other end is provided with an opening 15 c and is connected to the cover 5 a of the optical path switching unit 5. The second optical path 24 is formed by the second through hole 23, the first reflector 31, and the second reflector 32, and the second through hole 23 is in the same direction as the reference optical path tube 15a. It penetrates the disk 5b. The first reflector 31 can be formed from a single plate. The side surface of the plate is a reflecting surface 31a, and the opposite slope is a conical surface. In addition, a second reflector 32 is disposed at a position facing the first reflector 31. Like the first reflector 31, the second reflector 32 has a reflecting surface 32a having a conical shape. It is a surface. As shown in FIG. 8, the pipe 13b that forms the reflected light path tube 13 and the pipe that forms the reference light path tube 15a are arranged at positions that overlap with the traveling direction of the irradiation light toward the analysis target. . For this reason, the shadow of the pipe 15a generated by the irradiation light is transferred to the pipe 13b, and the pipe 15a does not block the irradiation light irradiated to the measuring unit 2 alone. Therefore, even if the reflection light path tube 13 and the reference light path tube 15a are provided in the irradiation light path 11, the amount of irradiation light blocked by these light paths can be minimized.

Next, the reference light that has been guided and passed through the reference light path tube 15a will be described. As shown in FIG. 6, the reference light passes through the second optical path 24, is reflected for the first time in the vertical direction by the reflecting surface 31a of the first reflector 31, and is reflected by the second reflector 32 after this reflection. The light is reflected from the surface 32a for the second time in the vertical direction, and enters the light receiving unit 6 through the incident window 25 in a state where the optical path is in the same direction as the pipe 13b of the reflected light path tube 12, and is received by the sensor 26 disposed therein. Received light.

In the present invention, since there is one sensor that receives light, the reflected light and the reference light are not measured simultaneously. In normal measurement, reflected light and reference light are measured in order. However, depending on the measurement conditions, the reflected light may be measured continuously, or the reference light may be measured only at the beginning or only at the end. In addition, it is preferable that the light receiving unit 6 is used as a spectroscope, and the reflected light and the irradiated light incident from the incident window 25 are respectively separated, and the amount of light of each separated light is measured to obtain the absorbance. By the way, in the present invention, the first optical path and the second optical path may be interchanged, and the reference light may be linearly guided to the light receiving unit, and the reflected light may be bent multiple times and guided to the light receiving unit.

The reflected light and the reference light received and measured by the light receiving unit 6 are sent to the analysis unit 7 for information on the amount of light, and the analysis unit 7 analyzes the components contained in the analysis object. A general analyzer can be used for the analysis unit 7. A general analysis method may be used for the analysis in the analysis unit 7.

In the present invention, in addition to the first optical path and the second optical path, a third optical path can be disposed in the optical path switching unit 5. FIG. 7 is a schematic cross-sectional view taken along the line AA in FIG. 3. FIG. 7 shows a state where the reference optical path tube 15a is connected to the third optical path 28 of the disk 5b. The connection here means a state in which the opening of the reference optical path tube 15a and the opening of the third optical path 28 are overlapped by rotation of the disk 5b. FIG. 11 is a diagram showing the disk 5b viewed from the direction of the arrow Z in FIG. The third optical path can be used when measuring reference light used when the component analyzer 1 is calibrated.

The reference light uses the reference light, and among the reference light that has passed through the reference light path tube 15a, the light that has passed through the third optical path 28 becomes the reference light. A part of the irradiation light emitted upward from the illumination unit 10 is reflected in the direction indicated by the arrow by the reference light reflector 14 as a reference light for calibration, and passes through the reference light path tube 15a formed by a pipe. To do. The third optical path 28 is formed by the third through hole 27, the first reflector 31, and the second reflector 32, and the third through hole 27 is a disc in the same direction as the reference optical path 15a. It penetrates 5b. The first reflector 31 can be formed from a single plate. The side surface of the plate is a reflecting surface 31a, and the opposite slope is a conical surface. In addition, a second reflector 32 is disposed at a position facing the first reflector 31. Like the first reflector 31, the second reflector 32 has a reflecting surface 32a having a conical shape. It is a surface.

A filter serving as a reference plate 29 is attached to the third through hole 27, and the reference light passing through the third optical path 28 passes through the reference plate 29. When the measurement value of the component analyzer 1 is calibrated, the amount of reference light that has passed through the reference plate 29 is used.

In the present invention, the two reflectors provided in the second optical path 24 and the third optical path 28 are configured to use a common conical surface of the reflector. However, a configuration may be adopted in which reflectors are provided separately for the second optical path 24 and the third optical path 28.

Next, the reference light that has been guided and passed through the reference light path tube 15a will be described. As shown in FIG. 7, the reference light passes through the third optical path 28, is reflected for the first time in the vertical direction by the reflecting surface 31a of the first reflector 31, and is reflected by the second reflector 32 after the reflection. The light is reflected a second time in the vertical direction by the surface 32a, enters the light receiving unit 6 from the incident window 25 in a state where the optical path is in the same direction as the reflected light path tube 13, and is received by the sensor 26 disposed therein. . The received reference light is used when the information on the amount of light is sent to the analyzer 7 and the component analyzer is calibrated by the analyzer. A general method can be used for this calibration method.

The present invention is not limited to the above-described embodiment, and it goes without saying that the configuration can be appropriately changed without departing from the scope of the invention.

The component analyzer of the present invention is not limited to grains such as rice grains, and can be measured as long as it reflects light from granular materials such as resin pellets and vegetables and citrus fruits. It is.

DESCRIPTION OF SYMBOLS 1 Component analyzer 2 Measurement part 2a Transparent plate 3 Container 4 Main body 5 Optical path switching part 5a Cover 5b Disc 6 Light receiving part 7 Analysis part 8 Motor 8b Rotating shaft 10 Illumination part 11 Irradiation light path 13 Reflection light path pipe 13a Pipe 13b Pipe 14 reference Light reflector (mirror) 15a Reference light path tube 16 Reflected light reflector (mirror) 17 Support plate 18 Block 21 First through hole 22 First optical path 23 Second through hole 24 Second optical path 25 Incident window 26 Sensor 27 Third through Hole 28 Third optical path 29 Reference plate 31 First reflector 31a Reflective surface 32 Second reflector 32a Reflective surface 41 Reflected light 42 Reference light

Claims (6)

A measurement unit for placing the analysis object, an illumination unit for irradiating the analysis object placed on the measurement unit with irradiation light, and a main body serving as an irradiation light path for guiding the irradiation light to the measurement unit A light receiving unit that receives reflected light reflected from the analysis object and reference light that is the irradiation light that is not reflected by the analysis object, and a reflected light path that guides the reflected light toward the light receiving unit A tube, a reference light path tube that guides the reference light toward the light receiving unit, and a position between the light receiving unit, the reflected light path tube, and the reference light path tube, and is formed of a rotatable disk. By rotating the disk, one of a plurality of optical paths provided on the disk is connected to the reflected light path tube or the reference light path tube, and the light to be guided is switched to the reflected light or the reference light. An optical path switching unit for guiding light to the light receiving unit, and an amount of light received by the light receiving unit. An analysis unit for analyzing a component contained in the analysis object, wherein the reflected light path tube is disposed in the main body, and an opening through which reflected light reflected from the analysis object enters at one end The other end is provided with an opening that opens toward the optical path switching unit, and a reflected light reflector that reflects the reflected light toward the optical path switching unit is provided therein, and the reference optical path The tube is disposed in the main body, and is disposed at a position between the reflected light path tube and the illumination unit, and is provided with a main body side opening that opens in the main body so that the reference light is incident on one end thereof. An opening that opens toward the optical path switching unit is provided at the other end, and the reference light is reflected toward the main body side opening of the reference optical path tube between the reflected optical path tube and the illumination unit. Component analysis characterized by providing a reference light reflector Location. The optical path switching unit linearly guides the reflected light to the light receiving unit, and second guides the reference light to the light receiving unit by bending the optical path by a plurality of reflectors. The component analysis apparatus according to claim 1, wherein an optical path is provided, and a reflecting surface of the plurality of reflectors is a conical surface. The optical path switching unit linearly guides the reference light to the light receiving unit, and secondly guides the reflected light to the light receiving unit by bending the optical path by a plurality of reflectors. The component analyzing apparatus according to claim 2, wherein an optical path is provided, and a reflecting surface of the plurality of reflectors is a conical surface. The component analyzer according to claim 2 or 3, wherein the number of the plurality of reflectors is two, and the second optical path is bent twice. 5. The component analyzer according to claim 1, wherein the reference optical path tube is disposed at a position overlapping the reflected optical path tube with respect to a traveling direction of irradiation light toward the analysis target. The optical path switching unit is provided with a third optical path for guiding the reference light to the light receiving unit by bending the optical path multiple times, and a reference plate through which the reference light passes is provided in the third optical path. 6. The component measuring apparatus according to claim 1, wherein the component measuring apparatus is provided.

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