JP2017050410A - Processing apparatus, production system and program for use in processing apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To achieve on-demand production without deteriorating the production tact, regardless of presence or absence of the code symbol of a substrate.SOLUTION: In a production system (1) where an inspection device (10) and a mounting device (20) in the production line of a substrate (W) are managed by means of a host computer (30), the inspection device is provided with an imaging unit (11) for acquiring an inspection image by imaging the substrate, a storage unit (12) for storing multiple image patterns corresponding to the types of the substrate, a determination unit (13) for determining a specific image pattern matching to the inspection image from the multiple image patterns, and a notification unit (15) for notifying the host computer of the specific image pattern. The host computer is provided with a database (31) where each of the multiple image patterns is associated with a production program, and the mounting device is provided with a reception unit (21) to which a production program associated with the specific image pattern is downloaded from the host computer.SELECTED DRAWING: Figure 2

Description

  The present invention relates to a processing apparatus, a production system, and a program used in a processing apparatus that support on-demand production.

  In recent years, demand for on-demand production has increased to cope with inventory reduction and sudden production changes. Conventional on-demand production is known in which production programs are switched based on code symbols (barcode or two-dimensional code) attached to a substrate (for example, see Patent Document 1). In the production system described in Patent Document 1, a board code symbol is read by the mounting apparatus, and a production program corresponding to the board ID obtained from the code symbol is downloaded from the host computer to the mounting apparatus. Thus, by reading the board ID, the production program for the mounting apparatus is automatically switched according to the type of board.

JP-A-4-56398

  However, although the production system described in Patent Document 1 supports on-demand production, the production program cannot be switched depending on the type of board unless a code symbol is attached to the board. Therefore, it is necessary to secure a printing space for the code symbol on the substrate, the substrate becomes larger by the printing space, and a printing operation of the code symbol has occurred in the previous process. In addition, every time the type of board changes in the mounting apparatus, the code symbol must be read by the mounting apparatus, and there is a problem that the production tact of the board deteriorates by the amount of the reading operation.

  The present invention has been made in view of such points, and a processing apparatus, a production system, and a program used in the processing apparatus that can realize on-demand production without deteriorating production tact regardless of the presence or absence of a code symbol on a board. The purpose is to provide.

  A processing apparatus according to the present invention is a processing apparatus arranged together with other processing apparatuses on a substrate production line, and an imaging unit that captures an image of the substrate and obtains a captured image, and a plurality of types according to the type of the substrate A storage unit that stores an image pattern; and a determination unit that determines a specific image pattern that matches the captured image from the plurality of image patterns, and a production program associated with the specific image pattern It is made to use for the processing apparatus of.

  According to this configuration, a specific image pattern that matches a captured image of the substrate is determined from among a plurality of image patterns, and a production program associated with the specific image pattern is used for another processing apparatus. Since the specific image pattern corresponds to the type of substrate, a production program corresponding to the type of substrate is applied to other processing apparatuses. Therefore, the production program can be automatically switched according to the type of substrate, and it is possible to appropriately cope with on-demand production. Since the code symbol reading work on the board does not occur, the production tact can be improved. Further, it is not necessary to provide a space for code symbols on the substrate.

  In the processing apparatus, the image processing apparatus includes a notification unit that notifies the specific image pattern to a host computer that associates and manages a production program with each of the plurality of image patterns, and by notification of the specific image pattern by the notification unit, A production program associated with the specific image pattern is downloaded from the host computer to the other processing device. According to this configuration, it is possible to automatically switch the production program of another processing apparatus by downloading an appropriate production program from the host computer to another processing apparatus according to the type of substrate.

  In the processing apparatus, the processing apparatus is an inspection apparatus that inspects the substrate by an inspection program, and the other processing apparatus is a mounting apparatus that mounts components on the substrate by a production program. According to this configuration, the production program of the subsequent mounting apparatus can be switched using the inspection of the substrate by the inspection apparatus.

  In the processing apparatus, the imaging unit acquires an inspection image used for the inspection of the substrate as the captured image. According to this configuration, it is possible to switch the production program of the subsequent mounting apparatus using the inspection image from the inspection apparatus.

  The processing apparatus includes an inspection unit that inspects the substrate using an inspection program associated with the specific image pattern. According to this configuration, the substrate can be inspected by switching the inspection program of the inspection apparatus according to the type of the substrate.

  In the processing apparatus, the inspection unit starts an inspection from an inspection start location of the substrate using an inspection program associated with the specific image pattern. According to this configuration, the inspection can be started at a location where the board is imaged when the production program for the mounting apparatus is determined.

  In the processing apparatus, the imaging unit captures the inspection start position of the substrate in an arbitrary inspection program to obtain the inspection image, and the determination unit does not match an image pattern with the inspection image of the arbitrary inspection program. In this case, the inspection start position of the substrate in another inspection program is imaged to obtain the inspection image, and the determination unit is configured to detect the specific image pattern that matches the inspection image until the specific image pattern is found. The matching process is repeated for the inspection image picked up at the inspection start position of the substrate. According to this configuration, when an image pattern that matches an inspection image of an arbitrary inspection program is not found, the matching process is repeated with inspection images of other inspection programs. Therefore, an inspection program and a production program corresponding to the type of substrate can be determined.

  The production system of the present invention is a production system in which an inspection apparatus and a mounting apparatus arranged in a board production line are managed by a host computer, and the inspection apparatus captures the board and obtains an inspection image. An imaging unit that performs storage, a storage unit that stores a plurality of image patterns according to the type of the substrate, a determination unit that determines a specific image pattern that matches the inspection image from the plurality of image patterns, and a host computer A notification unit for notifying the specific image pattern, a database in which a production program is associated with each of the plurality of image patterns is provided in the host computer, and the specific image pattern is provided in the mounting apparatus. A receiving unit for downloading a production program associated with the host computer from the host computer. To.

  According to this configuration, a specific image pattern that matches the captured image of the substrate is determined from a plurality of image patterns in the inspection apparatus, and a production program associated with the specific image pattern is downloaded from the host computer to the mounting apparatus. The Since the specific image pattern corresponds to the type of substrate, a production program corresponding to the type of substrate is applied to the mounting apparatus. Therefore, the production program can be automatically switched according to the type of substrate, and it is possible to appropriately cope with on-demand production. Since the code symbol reading work on the board does not occur, the production tact can be improved. Further, it is not necessary to provide a space for code symbols on the substrate.

  The program according to the present invention is a program used in a processing apparatus arranged together with other processing apparatuses on a substrate production line, the step of capturing an image of the substrate and acquiring a captured image, and the type of the substrate Determining a specific image pattern that matches the captured image from a plurality of image patterns, and causing the subsequent processing device to use a production program associated with the specific image pattern. It is made to perform. According to this configuration, by installing the program in the processing apparatus, on-demand production can be realized without deteriorating the production tact regardless of the presence or absence of the code symbol on the substrate.

  According to the present invention, by determining a specific image pattern that matches a captured image of a substrate from a plurality of image patterns, a production program associated with the specific image pattern is used in another processing apparatus. Since the specific image pattern corresponds to the type of substrate, a production program corresponding to the type of substrate can be applied to another processing apparatus. Thereby, it is possible to automatically switch the production program of another processing apparatus according to the type of the substrate, and to appropriately cope with the on-demand production without deteriorating the production tact regardless of the presence or absence of the code symbol of the substrate. .

It is a mimetic diagram of a production system concerning this embodiment. It is a block diagram of the production system concerning this embodiment. It is explanatory drawing of the matching process of the image pattern which concerns on this Embodiment. It is a sequence diagram which shows operation | movement of the production system which concerns on this Embodiment.

  Hereinafter, the production system according to the present embodiment will be described with reference to the accompanying drawings. FIG. 1 is a schematic diagram of a production system according to the present embodiment. In addition, although this embodiment demonstrates the example which comprised the production line with the inspection apparatus and the some mounting apparatus, the production system which concerns on this Embodiment is only an example, and can be changed suitably.

  As shown in FIG. 1, the production system 1 according to the present embodiment is a production line for a substrate W on which an inspection apparatus 10 and a plurality of mounting apparatuses 20 are arranged. Components are mounted on each subsequent mounting device 20. The inspection apparatus 10 inspects the print quality of the substrate W from the positional deviation and appearance of the solder printed on the substrate W by image processing. The plurality of mounting apparatuses 20 form a conveyance path for the substrate W together with the inspection apparatus 10, and various components are mounted in stages on the substrate W that is sequentially conveyed from the inspection apparatus 10. The operations of the inspection apparatus 10 and the mounting apparatus 20 are managed by the host computer 30.

  In recent years, on-demand production is required in such a production system 1. In on-demand production, it is necessary to switch the production program of the mounting apparatus 20 every time the type of the substrate W changes. Usually, the mounting apparatus 20 is stopped and the production program is switched manually, or the production program is automatically switched according to the code symbol (bar code, two-dimensional code) attached to the substrate W. When the production program is switched manually, the production tact deteriorates as much as the mounting apparatus 20 is stopped, and when the production program is automatically switched, the production tact deteriorates as much as the code symbol is read by the mounting apparatus 20. Become.

  Further, the code symbol is not necessarily attached to the substrate W, and it is not possible to perform on-demand production while automatically changing the production program for the substrate W to which the code symbol is not attached. Therefore, in the present embodiment, the type of the substrate W is specified from the inspection image of the inspection device 10 and the subsequent mounting apparatus 20 uses a production program corresponding to the type of the substrate W. As a result, the production program of the mounting apparatus 20 is automatically switched according to the type of the substrate W, enabling on-demand production with improved production tact regardless of the presence or absence of the code symbol of the substrate W.

  Hereinafter, the production system according to the present embodiment will be described in detail with reference to FIG. FIG. 2 is a block diagram of the production system according to the present embodiment. Note that the block diagram of the production system shown in FIG. 2 is simplified to explain the present invention, and the configuration normally provided in the inspection apparatus, the mounting apparatus, and the host computer is provided.

  As illustrated in FIG. 2, the inspection apparatus 10 includes an imaging unit 11 that captures an image of the substrate W and obtains an inspection image (captured image), and a storage unit 12 that stores a plurality of image patterns according to the type of the substrate W. And a determination unit 13 that determines a specific image pattern that matches the inspection image from the plurality of image patterns. The imaging unit 11 captures an inspection start location of the substrate W used in the inspection program of the inspection apparatus 10 and acquires an inspection image. At this time, since the inspection apparatus 10 does not recognize the type of the substrate W, the imaging unit 11 first images the inspection start location of the substrate W in an arbitrary inspection program.

  The storage unit 12 stores, as a plurality of image patterns, image patterns of inspection start locations of the substrate W in each inspection program prepared for each type of substrate W. The determination unit 13 searches for a specific image pattern that matches an inspection image at an inspection start location of an arbitrary inspection program from among a plurality of image patterns in the storage unit 12. When a specific image pattern is not found, the imaging unit 11 is caused to image an inspection start location of another inspection program, and the determination unit 13 matches the inspection image at the inspection start location of the other inspection program. Explore.

  Note that the determination unit 13 compares the feature location in the inspection image with the feature location of the image pattern, and determines a specific image pattern when pattern matching is performed at a predetermined or higher matching rate. For example, an electrode pad provided on the substrate W is used as the characteristic portion of the inspection image and the image pattern. Since the specific image pattern corresponds to the type of the substrate W, the determination unit 13 determines the specific image pattern, so that the type of the substrate W is specified even for the substrate W to which no code symbol is attached. It is possible to do. Therefore, an inspection program for the inspection apparatus 10 and a production program for the mounting apparatus 20 can be determined according to the type of the substrate W by a specific image pattern.

  In addition, the inspection apparatus 10 includes an inspection unit 14 that inspects the substrate W using an inspection program associated with a specific image pattern, and a notification unit 15 that notifies the host computer 30 of the specific image pattern. Yes. The inspection unit 14 starts inspection of the substrate W from the inspection image at the inspection start location used for determining the image pattern, using an inspection program associated with a specific image pattern. Thereby, the board | substrate W can be test | inspected by switching the test | inspection program of the test | inspection apparatus 10 according to the kind of board | substrate W. FIG. Further, the inspection can be started at a location where the substrate W is imaged when the production program for the mounting apparatus 20 is determined.

  The notification unit 15 notifies the host computer 30 of a specific image pattern so that the host computer 30 recognizes the production program for the mounting apparatus 20. The host computer 30 is provided with a database 31 in which a production program is associated with each of a plurality of image patterns. By notifying the host computer 30 of a specific image pattern from the notification unit 15, a production program associated with the specific image pattern is determined for the mounting apparatus 20. Note that the notification unit 15 may notify the image data as a specific image pattern, or may notify the text data indicating the specific image pattern to reduce the communication amount.

  The mounting apparatus 20 includes a receiving unit 21 that downloads a production program associated with a specific image pattern from the host computer 30 and a mounting unit 22 that mounts components on the substrate W based on the production program. The receiving unit 21 downloads a production program from the host computer 30 in response to an instruction from the host computer 30. In this case, since the specific image pattern notified from the inspection apparatus 10 to the host computer 30 changes according to the type of the substrate W put into the production line, the production program of the mounting apparatus 20 is automatically set according to the type of the substrate W. Can be switched automatically.

  The mounting unit 22 mounts a component picked up from a feeder (not shown) on the inspected substrate W transported from the inspection apparatus 10 at a desired mounting position based on a production program. The production program is different for each type of substrate W, and each production program includes data regarding the mounting position of the component on the substrate W, the type of component, the type of feeder, and the like. As described above, the production system 1 specifies the type of the substrate W from the inspection image of the inspection apparatus 10 and causes the subsequent mounting apparatus 20 to use the production program corresponding to the type of the substrate W to Enables on-demand production.

  Each unit of the above-described inspection device 10, each mounting device 20, and the host computer 30 includes a processor that executes various processes, a memory, and the like. The memory is composed of one or a plurality of storage media such as a ROM (Read Only Memory) and a RAM (Random Access Memory) depending on the application. The memory stores programs and various parameters used by the inspection apparatus 10, each mounting apparatus 20, and the host computer 30.

  Hereinafter, with reference to FIG. 3, the image pattern matching processing by the inspection apparatus will be described. FIG. 3 is an explanatory diagram of the image pattern matching processing according to the present embodiment. In the description of FIG. 3, the reference numerals of FIG. 2 are used as appropriate.

  As illustrated in FIG. 3A, when the substrate W is loaded into the inspection apparatus 10 on the production line, the imaging unit 11 captures an image of the substrate W. At this time, since the inspection apparatus 10 does not recognize the type of the substrate W, the inspection image 41 is acquired by imaging the inspection start location of the substrate W set in the arbitrary inspection program by the imaging unit 11. Then, an image pattern 42 that matches the inspection image 41 is searched from among the plurality of image patterns 42 in the storage unit 12. The search for the image pattern 42 is performed on the inspection images 41 captured at the inspection start locations of all inspection programs until an image pattern 42 matching the inspection image 41 is found.

  If an image pattern 42 matching the inspection image 41 is found, the inspection apparatus 10 can recognize the type of the substrate W corresponding to the image pattern 42. Therefore, the inspection apparatus 10 can start the inspection with the inspection program corresponding to the type of the substrate W, and the subsequent mounting apparatus 20 can download the production program corresponding to the type of the substrate W. If a specific image pattern 42 that matches the inspection image 41 is not found even if the search for the image pattern 42 is repeated with different inspection images 41, it is determined that the substrate W is defective and is notified to the host computer 30. Is done.

  Specifically, as shown in FIG. 3B, when the substrate Wa is carried into the inspection apparatus 10, the inspection start location of the inspection program A is first imaged regardless of the type of the substrate W. Since the inspection program A is a program for the substrate Wa, an inspection image 41a that is an inspection start location of the substrate Wa is captured. Therefore, the image pattern 42a matching the inspection image 41a is found from the plurality of image patterns 42a-42c in the storage unit 12. Thereby, the inspection apparatus 10 starts the inspection with the inspection program A corresponding to the substrate Wa, and the subsequent mounting apparatus 20 uses the production program A corresponding to the substrate Wa.

  As shown in FIG. 3C, when the substrate Wc is loaded into the inspection apparatus 10, the inspection start location of the inspection program A is first imaged as described above. Since the inspection program A is a program for the substrate Wa, the inspection image 41x is picked up at the inspection start location of the substrate Wa regardless of the substrate Wc. In other words, the inspection image 41x is obtained by imaging the substrate Wc at the inspection start location for the substrate Wa, and is not obtained by imaging the substrate Wc at the inspection start location for the substrate Wc. Therefore, even if the plurality of image patterns 42a to 42c in the storage unit 12 are searched, the image pattern 42 that matches the inspection image 41x cannot be found.

  Subsequently, the captured image 41y is captured at the inspection start position of the inspection program B on the substrate Wc. The inspection image 41y is obtained by imaging the substrate Wc at the inspection start location for the substrate Wb, and is not obtained by imaging the substrate Wc at the inspection start location for the substrate Wc. Therefore, even if the plurality of image patterns 42a to 42c in the storage unit 12 are searched, the image pattern 42 that matches the inspection image 41y cannot be found.

  Further, the inspection start location of the inspection program C is imaged on the substrate Wc. Since the inspection program C is a program for the substrate Wc, an inspection image 41c that is an inspection start location of the substrate Wc is captured. Therefore, an image pattern 42c that matches the inspection image 41c is found from the plurality of image patterns 42a to 42c in the storage unit 12. Thereby, the inspection apparatus 10 starts the inspection with the inspection program C corresponding to the substrate Wc, and the subsequent mounting apparatus 20 uses the production program C corresponding to the substrate Wc.

  Next, the operation of the production system will be described as shown in FIG. FIG. 4 is a sequence diagram showing the operation of the production system according to the present embodiment. The sequence diagram shown in FIG. 4 shows an example of the operation of the production system and is not limited to this content.

  As shown in FIG. 4, when the substrate W is carried into the inspection apparatus 10, the above-described image pattern matching process is performed (step S01). In the image pattern matching process, when the imaging unit 11 captures an inspection start position of the substrate W in an arbitrary inspection program and acquires an inspection image, the determination unit 13 does not match the image pattern with the inspection image of the arbitrary inspection program In addition, the imaging unit 11 captures an inspection start location of the substrate W in another inspection program, and an inspection image is acquired. The determination unit 13 repeats the matching process on the inspection images captured at the inspection start locations of the substrate W in all inspection programs until a specific image pattern that matches the inspection image is found. When an image pattern matching the inspection image is found, an inspection program for this inspection image is set in the inspection apparatus 10.

  Next, a specific image pattern matching the inspection image is notified from the inspection apparatus 10 to the host computer 30 (step S02). In this case, image data of a specific image pattern may be notified from the inspection apparatus 10 to the host computer 30, or text data indicating the specific image pattern may be notified. Next, the production program associated with the specific image pattern is determined in the database 31 in the host computer 30, and a download command for the production program is notified from the host computer 30 to the subsequent mounting apparatus 20 (step S03). ).

  Next, the mounting apparatus 20 downloads the production program from the host computer 30, and the production program associated with the specific image pattern is set in the mounting apparatus 20 (step S04). Thereby, in the mounting apparatus 20, a production program corresponding to the type of the substrate W is automatically set without performing image processing or the like for recognizing the type of the substrate W. On the other hand, in the inspection apparatus 10, after the notification of the specific image pattern, the inspection for the substrate W is performed using the inspection program (step S05). The inspected substrate W is transferred from the inspection apparatus 10 to the mounting apparatus 20 (step S06), and the mounting process is performed on the substrate W using the production program in the mounting apparatus 20 (step S07).

  In parallel with the mounting process by the mounting apparatus 20, the inspection apparatus 10 performs an image pattern matching process on the next substrate W, and repeats the above steps S01 to 07. As described above, a specific image pattern corresponding to the type of the substrate W is notified from the inspection apparatus 10 to the host computer 30, so that the host computer 30 uses the production program to be used by the mounting apparatus 20 according to the type of the substrate W. It has been switched automatically. Therefore, even if production of another substrate W is suddenly introduced during production of the substrate W, the production program of the mounting apparatus 20 is automatically switched according to the type of the substrate W, and it is possible to flexibly cope with production changes. It has become.

  As described above, in the production system 1 according to the present embodiment, the specific image pattern that matches the captured image of the substrate W is determined from the plurality of image patterns in the inspection apparatus 10 and is associated with the specific image pattern. The produced production program is downloaded from the host computer 30 to the mounting apparatus 20. Since the specific image pattern corresponds to the type of the substrate W, a production program corresponding to the type of the substrate W is applied to the mounting apparatus 20. Therefore, the production program can be automatically switched according to the type of the substrate W, and the on-demand production can be appropriately handled. Since there is no need to read code symbols on the substrate W, production tact can be improved. Further, it is not necessary to provide a space for code symbols on the substrate W.

  In addition, this invention is not limited to the said embodiment, It can change and implement variously. In the above-described embodiment, the size, shape, and the like illustrated in the accompanying drawings are not limited to this, and can be appropriately changed within a range in which the effect of the present invention is exhibited. In addition, various modifications can be made without departing from the scope of the object of the present invention.

  For example, in the present embodiment, the inspection apparatus 10 has been described as an example of the processing apparatus, but the present invention is not limited to this configuration. The processing device may be the first mounting device 20 among the plurality of mounting devices 20. In this case, since the mounting apparatus 20 is provided with an imaging unit that images the BOC mark on the substrate W, the imaging unit may be used to capture the substrate W and acquire a captured image. For example, a specific image pattern that matches the captured image is determined by the first mounting apparatus 20, and a production program associated with the specific image pattern is used by all the mounting apparatuses 20.

  In the present embodiment, the mounting apparatus 20 has been described as an example of another subsequent processing apparatus, but the present invention is not limited to this configuration. The other processing device may be a reflow device arranged subsequent to the mounting device 20. In this case, the production program of the reflow apparatus includes data relating to the feed rate of the substrate W and the temperature in the furnace.

  Moreover, in this Embodiment, although it was set as the structure which manages the inspection apparatus 10 and the mounting apparatus 20 with the host computer 30 as the production system 1, it is not limited to this structure. The production system 1 may not include the host computer 30. In this case, the inspection apparatus 10 may be provided with a database in which a plurality of image patterns and production programs are associated, and the production program may be downloaded from the inspection apparatus 10 to the mounting apparatus 20.

  In the present embodiment, the host computer 30 determines the production program to be downloaded to the mounting apparatus 20, but the present invention is not limited to this configuration. A database in which a plurality of image patterns and production programs are associated with each other may be provided in the inspection apparatus 10 and a production program to be downloaded to the mounting apparatus 20 by the inspection apparatus 10 may be determined. In this case, since image data is not notified from the inspection apparatus 10, the amount of communication can be reduced.

  In the present embodiment, the database 31 has a configuration in which a plurality of image patterns and production programs are associated. However, other information may be associated with the plurality of image patterns. For example, destination information may be associated with a plurality of image patterns together with the production program. When the destination information is associated with the image pattern, it is preferable that the image of the power supply component is included in the image pattern.

  In the present embodiment, the configuration in which the mounting apparatus 20 downloads the production program from the host computer 30 has been described. However, the present invention is not limited to this configuration. The mounting apparatus 20 may be configured to store a plurality of production programs in advance and use the production programs by enabling some production programs. In this case, the mounting apparatus 20 may validate the production program according to an instruction from the host computer 30 or may validate the production program according to an instruction from the inspection apparatus 10.

  In the present embodiment, the configuration in which the substrate W to which the symbol code is not added is input to the production system 1 has been described, but the present invention is not limited to this configuration. The production system 1 may be loaded with a substrate W to which a symbol code is attached. Even with such a configuration, since the symbol code recognition process by the mounting apparatus 20 can be omitted, the production tact can be improved. Usually, a specific image pattern that matches the captured image is determined from a plurality of image patterns. However, if the specific image pattern cannot be determined, the symbol code is complementarily recognized and the production program is selected. It can be easily considered.

  In this embodiment, when the mounting apparatus 20 downloads a production program from the host computer 30, the host computer 30 grasps the status of the number of substrates W produced, and the production program is executed at the next production program switching timing. You may download it. Further, the production program may be downloaded after the substrate W is stopped by the inspection apparatus 10 and the production of the entire production line is finished.

  In the present embodiment, the inspection unit 14 may use an inspection program stored in the inspection apparatus 10 itself, or may use an inspection program downloaded from the host computer 30.

  In the present embodiment, the imaging unit 11 is configured to capture the inspection start location of the substrate W in the inspection program and acquire the inspection image, but is not limited to this configuration. The imaging unit 11 may acquire an inspection image by imaging other than the inspection start location of the substrate W. For example, the imaging unit 11 may acquire an inspection image by imaging the inspection end location of the substrate W.

  In the present embodiment, the inspection image is illustrated as an example of the captured image. However, the present invention is not limited to this configuration. You may make it switch the production program of the subsequent mounting apparatus 20 using picked-up images other than the test | inspection image used for a test | inspection with the test | inspection apparatus 10. FIG.

  As described above, the present invention has the effect that on-demand production can be realized without deteriorating the production tact regardless of the presence or absence of the code symbol on the board. The present invention is useful for a processing apparatus, a production system, and a program used in a processing apparatus corresponding to demand production.

1 Production System 10 Inspection Equipment (Processing Equipment)
DESCRIPTION OF SYMBOLS 11 Imaging part 12 Storage part 13 Determination part 14 Inspection part 15 Notification part 20 Mounting apparatus (other processing apparatus)
21 receiving unit 22 mounting unit 30 host computer 31 database 41 inspection image 42 image pattern

Claims (9)

A processing device arranged together with other processing devices in a substrate production line,
An imaging unit that images the substrate and obtains a captured image;
A storage unit storing a plurality of image patterns according to the type of the substrate;
A determination unit that determines a specific image pattern that matches the captured image from the plurality of image patterns;
A processing apparatus, characterized in that a production program associated with the specific image pattern is used by another subsequent processing apparatus. A notification unit that notifies the specific image pattern to a host computer that manages a production program in association with each of the plurality of image patterns;
The processing apparatus according to claim 1, wherein a notification of the specific image pattern by the notification unit causes the production program associated with the specific image pattern to be downloaded from the host computer to the other processing apparatus. .   The said processing apparatus is an inspection apparatus which inspects the said board | substrate with an inspection program, The said other processing apparatus is a mounting apparatus which mounts components in the said board | substrate by a production program. 2. The processing apparatus according to 2.   The processing apparatus according to claim 3, wherein the imaging unit acquires an inspection image used for inspection of the substrate as the captured image.   The processing apparatus according to claim 3, further comprising an inspection unit that inspects the substrate using an inspection program associated with the specific image pattern.   The processing apparatus according to claim 5, wherein the inspection unit starts an inspection from an inspection start position of the substrate by using an inspection program associated with the specific image pattern. The imaging unit captures the inspection start location of the substrate in an arbitrary inspection program to acquire the inspection image, and when the determination unit does not match the inspection image of the arbitrary inspection program, another inspection Capture the inspection start location of the substrate in the program to obtain the inspection image,
The determination unit repeats a matching process on the inspection images picked up at inspection start locations of the substrate in all inspection programs until a specific image pattern matching the inspection image is found. The processing apparatus in any one of Claims 4-6. A production system in which an inspection device and a mounting device arranged in a board production line are managed by a host computer,
The inspection apparatus includes an imaging unit that captures the substrate and obtains an inspection image, a storage unit that stores a plurality of image patterns according to the type of the substrate, and matching the inspection image from the plurality of image patterns A determination unit for determining a specific image pattern to be performed, and a notification unit for notifying the host computer of the specific image pattern,
The host computer is provided with a database that associates a production program with each of the plurality of image patterns,
The production system, wherein the mounting apparatus is provided with a receiving unit that downloads a production program associated with the specific image pattern from the host computer. A program used in a processing apparatus arranged together with other processing apparatuses in a substrate production line,
Capturing the captured image by imaging the substrate;
Determining a specific image pattern that matches the captured image from a plurality of image patterns according to the type of the substrate;
A program causing the processing apparatus to execute a step of causing a subsequent processing apparatus to use a production program associated with the specific image pattern.

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